JPH01143257A - Electrostatic shielding film - Google Patents

Electrostatic shielding film

Info

Publication number
JPH01143257A
JPH01143257A JP62301246A JP30124687A JPH01143257A JP H01143257 A JPH01143257 A JP H01143257A JP 62301246 A JP62301246 A JP 62301246A JP 30124687 A JP30124687 A JP 30124687A JP H01143257 A JPH01143257 A JP H01143257A
Authority
JP
Japan
Prior art keywords
film
thin film
insulating
electrically conductive
shielding film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62301246A
Other languages
Japanese (ja)
Inventor
Takeshi Fukada
武 深田
Mitsunori Sakama
坂間 光範
Nobumitsu Amachi
伸充 天知
Naoya Sakamoto
直哉 坂本
Mitsufumi Kodama
光文 小玉
Shunpei Yamazaki
舜平 山崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Semiconductor Energy Laboratory Co Ltd
Original Assignee
Semiconductor Energy Laboratory Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Semiconductor Energy Laboratory Co Ltd filed Critical Semiconductor Energy Laboratory Co Ltd
Priority to JP62301246A priority Critical patent/JPH01143257A/en
Publication of JPH01143257A publication Critical patent/JPH01143257A/en
Pending legal-status Critical Current

Links

Landscapes

  • Solid State Image Pick-Up Elements (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Thin Film Transistor (AREA)

Abstract

PURPOSE:To reduce the influence of electrical noise by superimposing a conductive film and an insulating film on an insulating substrate and providing the conductive film with a specific potential. CONSTITUTION:An insulating substrate 11 includes an electrically conductive film 12 and an insulating thin film 13 superimposed thereon in order, the insulating thin film 13 having a thin film element 14 formed thereon. The electrically conducive film 12 is made at an earth potential or a specific potential, so that it serves as a shielding member for the thin film element 14, the member being located in close vicinity of the element. The effect of the shielding is further improved by superimposed an insulating layer 15 and an electrically conductive thin film 16 on the thin film element 14 and to sandwich the thin film element 14 between the electrically conductive thin films 12, 16.

Description

【発明の詳細な説明】 [技術分野〕 密着型イメージセンサ、TPTなど微弱な電気信号を扱
う素子の電気雑音を少なくする静電遮蔽膜およびその膜
を用いた電子デバイスの構造に関する。
DETAILED DESCRIPTION OF THE INVENTION [Technical Field] The present invention relates to an electrostatic shielding film that reduces electrical noise in elements that handle weak electrical signals, such as contact image sensors and TPTs, and the structure of electronic devices using the film.

〔従来の技術] 従来技術を実例を示しながら説明する。[Conventional technology] The prior art will be explained using an example.

第1図はアモルファスシリコンを用いたTPTで絶縁基
板(1)上にゲート電極(2)、絶縁膜(3)、アモル
ファスシリコ71層(4)、アモルファスシリコンn’
Ji(5)、電気導電膜(6)が積層されている。
Figure 1 shows a TPT using amorphous silicon, with an insulating substrate (1), a gate electrode (2), an insulating film (3), an amorphous silicon 71 layer (4), and an amorphous silicon n'
Ji (5) and an electrically conductive film (6) are laminated.

このTPT素子を平面上にならべて例えば液晶の駆動に
用いたりする。
These TPT elements are arranged on a plane and used, for example, to drive a liquid crystal.

アモルファスシリコンTPTの場合、ON抵抗が非常に
高いので、微電流のスイッチング素子に使う場合非常に
電気雑音に弱い。
Since amorphous silicon TPT has a very high ON resistance, it is very susceptible to electrical noise when used in a microcurrent switching element.

第2図はアモルファスシリコンを用いたイメージセンサ
で絶縁基板(7)上に電気導電膜(8)、アモルファス
シリコ71層(9)、透光性電気導電膜00)からなる
ショットキダイオードタイプのイメージセンサである。
Figure 2 shows an image sensor using amorphous silicon, which is a Schottky diode type image sensor consisting of an electrically conductive film (8), an amorphous silicon 71 layer (9), and a transparent electrically conductive film (00) on an insulating substrate (7). It is.

通常このタイプのイメージセンサは暗電流が数ピコアン
ペア(PA)Lかないためやはり非常に電気雑音に弱い
Usually, this type of image sensor has a dark current of only a few picoamperes (PA) L, so it is very susceptible to electrical noise.

他にも一般的に薄膜素子の場合端どの素子が電気雑音の
影響をうけやすい。
Additionally, in the case of thin film devices, which end of the device is generally more susceptible to the effects of electrical noise.

〔発明の構成] 本発明は従来のグランドシールドを薄膜素子の近傍にお
くことで電気雑音の影響を小さくすることができる構造
である。
[Structure of the Invention] The present invention is a structure in which the influence of electrical noise can be reduced by placing a conventional ground shield near a thin film element.

第3図は本発明の構成を示す。FIG. 3 shows the configuration of the present invention.

同図 (A)は絶縁基板01)上に電気導電膜02)、
絶縁薄膜面を順次積層し絶縁薄膜面の上に薄膜素子04
)を形成する。電気導電膜Q2)をアース電位又は特定
の電位にすることで薄膜素子04)に近接したシールド
とすることができる。
Figure (A) shows an electrically conductive film 02) on an insulating substrate 01),
Insulating thin film surfaces are sequentially laminated and a thin film element 04 is placed on top of the insulating thin film surface.
) to form. By setting the electrically conductive film Q2) to a ground potential or a specific potential, it can be used as a shield close to the thin film element 04).

又、同図(B)は薄膜素子側の上に絶縁層05)電気導
電薄膜06)を積層し薄膜素子04)を電気導電薄膜0
2)、06)で挾む形になりさらにシールド効果をあげ
ることができる。
In addition, in the same figure (B), an insulating layer 05) and an electrically conductive thin film 06) are laminated on the thin film element side, and a thin film element 04) is laminated on the electrically conductive thin film 0.
2) and 06) can be sandwiched together to further increase the shielding effect.

〔実施例〕〔Example〕

第4図に本発明の実施例を示す。 FIG. 4 shows an embodiment of the present invention.

本実施例は本発明の静電遮蔽膜をイメージセンサ−に応
用した一例である。
This example is an example in which the electrostatic shielding film of the present invention is applied to an image sensor.

ガラス基板07)上に公知のスパッタリング法で電気導
電膜として5nOz08)を1μ−成膜、次に公知の熱
CVD法で5iOz09)を1μs成膜、その上に公知
のプラズマCVD法でa−3t(至)n層■層n層をそ
れぞれ0.1.1.  Olo、1μs成膜、その上に
絶縁層としてエポキシ樹脂(23)を公知のスクリーン
印刷法で成膜、次に電気導電膜としてA ffi (2
4)を公知のスパッタ法で形成し、こうしてシールド構
造型ミー3iイメージセンサを完成した。
A 1μ film of 5nOz08) was formed as an electrically conductive film on a glass substrate 07) by a known sputtering method, then a 1 μs film of 5iOz09) was formed by a known thermal CVD method, and a-3t film was formed on top of that by a known plasma CVD method. (to) n layer ■ layer n layer each 0.1.1. Olo, 1 μs film formation, epoxy resin (23) as an insulating layer was formed on it by a known screen printing method, and then Affi (23) was formed as an electrically conductive film.
4) was formed by a known sputtering method, thus completing a shield structure type Mi3i image sensor.

本実施例のイメージセンサ−の耐電気雑音性が如何に優
れているかを実証するために、本発明の性電遮蔽膜を用
いないイメージセンサ−との比較を行った。
In order to demonstrate how excellent the electrical noise resistance of the image sensor of this example is, a comparison was made with an image sensor that does not use the electrostatic shielding film of the present invention.

この2つのサンプルにたいして、同じ原稿(真っ黒な原
稿)の読み取りをさせた時の読み取り信号を第5図(A
)(B)に示す。
Figure 5 (A) shows the reading signal when these two samples read the same original (pure black original).
) (B).

同図(A)は本発明の遮蔽膜を用いなかった場合のイメ
ージセンサ−の読み取り信号で、8本/4すのイメージ
センサ−のビット毎の信号出力を示しており、駆動用の
スイッチングノイズ、静電気等の為に各信号がばらつい
ている様子が良く分る。
Figure (A) shows the read signal of the image sensor when the shielding film of the present invention is not used, and shows the signal output for each bit of the 8/4 image sensor, and it shows the switching noise for driving. , it can be clearly seen that each signal varies due to static electricity, etc.

−力木発明の遮蔽膜を用いたイメージセンサ−の場合は
同図(B)にしめすようにビット毎の各信号がほぼ一定
であり、ばらつきがみられない。
In the case of the image sensor using the shielding film of Rikiki's invention, the signals for each bit are almost constant, and no variations are observed, as shown in FIG.

このように、本発明の遮蔽膜をもちいることにより数ナ
ノアンペア(nA)から数ピコアンペア(pA)とうい
う非常に微弱な信号を扱う薄膜機能素子に対するシール
ド効果を上げることができ簡単に電気雑音に強い薄膜応
用製品を実用化することが可能となった。
As described above, by using the shielding film of the present invention, it is possible to improve the shielding effect for thin film functional elements that handle extremely weak signals of several nanoamperes (nA) to several picoamperes (pA), and easily eliminate electrical noise. It has become possible to commercialize thin film applied products that are resistant to

〔効果] 数A〜数pAの微弱信号を扱う薄膜素子に対するシール
ド効果をあげることができ簡単に電気雑音に強い薄膜応
用製品を実用化することが可能となった。
[Effect] A shielding effect can be achieved for thin film elements that handle weak signals of several A to several pA, and it has become possible to easily put into practical use thin film applied products that are resistant to electrical noise.

従来はノイズ分を補正回路等で修正しなくてはならず、
そのため複雑な補正回路が必要であったが、本発明の遮
蔽膜によって簡単な補正回路のみで実現可能となった
Conventionally, noise had to be corrected using a correction circuit, etc.
For this reason, a complicated correction circuit was required, but the shielding film of the present invention has made it possible to realize it with only a simple correction circuit.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図、第2図は従来の電気雑音に弱い素子の構造を示
す。 第3図、第4図は本発明の静電遮蔽膜を応用した素子の
構造を示す。 第5回はイメージセンサ−の読み取り信号の様子をしめ
す。 ピ、ド険。 第5図
FIGS. 1 and 2 show the structure of a conventional element susceptible to electrical noise. 3 and 4 show the structure of an element to which the electrostatic shielding film of the present invention is applied. Part 5 shows the state of the read signal from the image sensor. P, very dangerous. Figure 5

Claims (1)

【特許請求の範囲】 1、絶縁基板上に導電膜と絶縁膜とを積層し導電膜をあ
る特定の電位にした静電遮蔽膜。 2、特許請求の範囲の第1項において絶縁膜上に微弱電
流を流す素子を形成した上に絶縁層、導電膜と積層し上
下の導電膜を特定の電位にした静電遮蔽膜。
[Claims] 1. An electrostatic shielding film in which a conductive film and an insulating film are laminated on an insulating substrate, and the conductive film is set to a certain potential. 2. An electrostatic shielding film according to claim 1, in which an element for flowing a weak current is formed on an insulating film, and then an insulating layer and a conductive film are laminated, and the upper and lower conductive films are set to a specific potential.
JP62301246A 1987-11-28 1987-11-28 Electrostatic shielding film Pending JPH01143257A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62301246A JPH01143257A (en) 1987-11-28 1987-11-28 Electrostatic shielding film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62301246A JPH01143257A (en) 1987-11-28 1987-11-28 Electrostatic shielding film

Publications (1)

Publication Number Publication Date
JPH01143257A true JPH01143257A (en) 1989-06-05

Family

ID=17894532

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62301246A Pending JPH01143257A (en) 1987-11-28 1987-11-28 Electrostatic shielding film

Country Status (1)

Country Link
JP (1) JPH01143257A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008090141A (en) * 2006-10-04 2008-04-17 Sony Corp Display device
JP2008209555A (en) * 2007-02-26 2008-09-11 Epson Imaging Devices Corp Electro-optical device, semiconductor device, display device and electronic equipment having the same
US7619194B2 (en) 2007-02-26 2009-11-17 Epson Imaging Devices Corporation Electro-optical device, semiconductor device, display device, and electronic apparatus having the display device
US7852440B2 (en) 2006-07-12 2010-12-14 Sony Corporation Liquid crystal display device
JP2017049568A (en) * 2015-08-31 2017-03-09 株式会社Joled Semiconductor device, display device, display device manufacturing method, and electronic apparatus

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59117267A (en) * 1982-12-24 1984-07-06 Seiko Instr & Electronics Ltd Thin film transistor
JPS60192370A (en) * 1984-03-13 1985-09-30 Seiko Instr & Electronics Ltd Thin film transistor array
JPS6143463A (en) * 1984-08-08 1986-03-03 Hitachi Ltd Semiconductor device
JPS61166162A (en) * 1985-01-18 1986-07-26 Ricoh Co Ltd Image sensor

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59117267A (en) * 1982-12-24 1984-07-06 Seiko Instr & Electronics Ltd Thin film transistor
JPS60192370A (en) * 1984-03-13 1985-09-30 Seiko Instr & Electronics Ltd Thin film transistor array
JPS6143463A (en) * 1984-08-08 1986-03-03 Hitachi Ltd Semiconductor device
JPS61166162A (en) * 1985-01-18 1986-07-26 Ricoh Co Ltd Image sensor

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7852440B2 (en) 2006-07-12 2010-12-14 Sony Corporation Liquid crystal display device
JP2008090141A (en) * 2006-10-04 2008-04-17 Sony Corp Display device
US8169572B2 (en) 2006-10-04 2012-05-01 Sony Corporation Display apparatus and electronic apparatus
JP2008209555A (en) * 2007-02-26 2008-09-11 Epson Imaging Devices Corp Electro-optical device, semiconductor device, display device and electronic equipment having the same
US7619194B2 (en) 2007-02-26 2009-11-17 Epson Imaging Devices Corporation Electro-optical device, semiconductor device, display device, and electronic apparatus having the display device
JP2017049568A (en) * 2015-08-31 2017-03-09 株式会社Joled Semiconductor device, display device, display device manufacturing method, and electronic apparatus

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