JPH01143257A - Electrostatic shielding film - Google Patents
Electrostatic shielding filmInfo
- Publication number
- JPH01143257A JPH01143257A JP62301246A JP30124687A JPH01143257A JP H01143257 A JPH01143257 A JP H01143257A JP 62301246 A JP62301246 A JP 62301246A JP 30124687 A JP30124687 A JP 30124687A JP H01143257 A JPH01143257 A JP H01143257A
- Authority
- JP
- Japan
- Prior art keywords
- film
- thin film
- insulating
- electrically conductive
- shielding film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000758 substrate Substances 0.000 claims abstract description 7
- 239000010408 film Substances 0.000 abstract description 26
- 239000010409 thin film Substances 0.000 abstract description 22
- 230000000694 effects Effects 0.000 abstract description 6
- 229910021417 amorphous silicon Inorganic materials 0.000 description 6
- 238000000034 method Methods 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 238000002230 thermal chemical vapour deposition Methods 0.000 description 1
Landscapes
- Solid State Image Pick-Up Elements (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Thin Film Transistor (AREA)
Abstract
Description
【発明の詳細な説明】
[技術分野〕
密着型イメージセンサ、TPTなど微弱な電気信号を扱
う素子の電気雑音を少なくする静電遮蔽膜およびその膜
を用いた電子デバイスの構造に関する。DETAILED DESCRIPTION OF THE INVENTION [Technical Field] The present invention relates to an electrostatic shielding film that reduces electrical noise in elements that handle weak electrical signals, such as contact image sensors and TPTs, and the structure of electronic devices using the film.
〔従来の技術] 従来技術を実例を示しながら説明する。[Conventional technology] The prior art will be explained using an example.
第1図はアモルファスシリコンを用いたTPTで絶縁基
板(1)上にゲート電極(2)、絶縁膜(3)、アモル
ファスシリコ71層(4)、アモルファスシリコンn’
Ji(5)、電気導電膜(6)が積層されている。Figure 1 shows a TPT using amorphous silicon, with an insulating substrate (1), a gate electrode (2), an insulating film (3), an amorphous silicon 71 layer (4), and an amorphous silicon n'
Ji (5) and an electrically conductive film (6) are laminated.
このTPT素子を平面上にならべて例えば液晶の駆動に
用いたりする。These TPT elements are arranged on a plane and used, for example, to drive a liquid crystal.
アモルファスシリコンTPTの場合、ON抵抗が非常に
高いので、微電流のスイッチング素子に使う場合非常に
電気雑音に弱い。Since amorphous silicon TPT has a very high ON resistance, it is very susceptible to electrical noise when used in a microcurrent switching element.
第2図はアモルファスシリコンを用いたイメージセンサ
で絶縁基板(7)上に電気導電膜(8)、アモルファス
シリコ71層(9)、透光性電気導電膜00)からなる
ショットキダイオードタイプのイメージセンサである。Figure 2 shows an image sensor using amorphous silicon, which is a Schottky diode type image sensor consisting of an electrically conductive film (8), an amorphous silicon 71 layer (9), and a transparent electrically conductive film (00) on an insulating substrate (7). It is.
通常このタイプのイメージセンサは暗電流が数ピコアン
ペア(PA)Lかないためやはり非常に電気雑音に弱い
。Usually, this type of image sensor has a dark current of only a few picoamperes (PA) L, so it is very susceptible to electrical noise.
他にも一般的に薄膜素子の場合端どの素子が電気雑音の
影響をうけやすい。Additionally, in the case of thin film devices, which end of the device is generally more susceptible to the effects of electrical noise.
〔発明の構成]
本発明は従来のグランドシールドを薄膜素子の近傍にお
くことで電気雑音の影響を小さくすることができる構造
である。[Structure of the Invention] The present invention is a structure in which the influence of electrical noise can be reduced by placing a conventional ground shield near a thin film element.
第3図は本発明の構成を示す。FIG. 3 shows the configuration of the present invention.
同図 (A)は絶縁基板01)上に電気導電膜02)、
絶縁薄膜面を順次積層し絶縁薄膜面の上に薄膜素子04
)を形成する。電気導電膜Q2)をアース電位又は特定
の電位にすることで薄膜素子04)に近接したシールド
とすることができる。Figure (A) shows an electrically conductive film 02) on an insulating substrate 01),
Insulating thin film surfaces are sequentially laminated and a thin film element 04 is placed on top of the insulating thin film surface.
) to form. By setting the electrically conductive film Q2) to a ground potential or a specific potential, it can be used as a shield close to the thin film element 04).
又、同図(B)は薄膜素子側の上に絶縁層05)電気導
電薄膜06)を積層し薄膜素子04)を電気導電薄膜0
2)、06)で挾む形になりさらにシールド効果をあげ
ることができる。In addition, in the same figure (B), an insulating layer 05) and an electrically conductive thin film 06) are laminated on the thin film element side, and a thin film element 04) is laminated on the electrically conductive thin film 0.
2) and 06) can be sandwiched together to further increase the shielding effect.
第4図に本発明の実施例を示す。 FIG. 4 shows an embodiment of the present invention.
本実施例は本発明の静電遮蔽膜をイメージセンサ−に応
用した一例である。This example is an example in which the electrostatic shielding film of the present invention is applied to an image sensor.
ガラス基板07)上に公知のスパッタリング法で電気導
電膜として5nOz08)を1μ−成膜、次に公知の熱
CVD法で5iOz09)を1μs成膜、その上に公知
のプラズマCVD法でa−3t(至)n層■層n層をそ
れぞれ0.1.1. Olo、1μs成膜、その上に
絶縁層としてエポキシ樹脂(23)を公知のスクリーン
印刷法で成膜、次に電気導電膜としてA ffi (2
4)を公知のスパッタ法で形成し、こうしてシールド構
造型ミー3iイメージセンサを完成した。A 1μ film of 5nOz08) was formed as an electrically conductive film on a glass substrate 07) by a known sputtering method, then a 1 μs film of 5iOz09) was formed by a known thermal CVD method, and a-3t film was formed on top of that by a known plasma CVD method. (to) n layer ■ layer n layer each 0.1.1. Olo, 1 μs film formation, epoxy resin (23) as an insulating layer was formed on it by a known screen printing method, and then Affi (23) was formed as an electrically conductive film.
4) was formed by a known sputtering method, thus completing a shield structure type Mi3i image sensor.
本実施例のイメージセンサ−の耐電気雑音性が如何に優
れているかを実証するために、本発明の性電遮蔽膜を用
いないイメージセンサ−との比較を行った。In order to demonstrate how excellent the electrical noise resistance of the image sensor of this example is, a comparison was made with an image sensor that does not use the electrostatic shielding film of the present invention.
この2つのサンプルにたいして、同じ原稿(真っ黒な原
稿)の読み取りをさせた時の読み取り信号を第5図(A
)(B)に示す。Figure 5 (A) shows the reading signal when these two samples read the same original (pure black original).
) (B).
同図(A)は本発明の遮蔽膜を用いなかった場合のイメ
ージセンサ−の読み取り信号で、8本/4すのイメージ
センサ−のビット毎の信号出力を示しており、駆動用の
スイッチングノイズ、静電気等の為に各信号がばらつい
ている様子が良く分る。Figure (A) shows the read signal of the image sensor when the shielding film of the present invention is not used, and shows the signal output for each bit of the 8/4 image sensor, and it shows the switching noise for driving. , it can be clearly seen that each signal varies due to static electricity, etc.
−力木発明の遮蔽膜を用いたイメージセンサ−の場合は
同図(B)にしめすようにビット毎の各信号がほぼ一定
であり、ばらつきがみられない。In the case of the image sensor using the shielding film of Rikiki's invention, the signals for each bit are almost constant, and no variations are observed, as shown in FIG.
このように、本発明の遮蔽膜をもちいることにより数ナ
ノアンペア(nA)から数ピコアンペア(pA)とうい
う非常に微弱な信号を扱う薄膜機能素子に対するシール
ド効果を上げることができ簡単に電気雑音に強い薄膜応
用製品を実用化することが可能となった。As described above, by using the shielding film of the present invention, it is possible to improve the shielding effect for thin film functional elements that handle extremely weak signals of several nanoamperes (nA) to several picoamperes (pA), and easily eliminate electrical noise. It has become possible to commercialize thin film applied products that are resistant to
〔効果]
数A〜数pAの微弱信号を扱う薄膜素子に対するシール
ド効果をあげることができ簡単に電気雑音に強い薄膜応
用製品を実用化することが可能となった。[Effect] A shielding effect can be achieved for thin film elements that handle weak signals of several A to several pA, and it has become possible to easily put into practical use thin film applied products that are resistant to electrical noise.
従来はノイズ分を補正回路等で修正しなくてはならず、
そのため複雑な補正回路が必要であったが、本発明の遮
蔽膜によって簡単な補正回路のみで実現可能となったConventionally, noise had to be corrected using a correction circuit, etc.
For this reason, a complicated correction circuit was required, but the shielding film of the present invention has made it possible to realize it with only a simple correction circuit.
第1図、第2図は従来の電気雑音に弱い素子の構造を示
す。
第3図、第4図は本発明の静電遮蔽膜を応用した素子の
構造を示す。
第5回はイメージセンサ−の読み取り信号の様子をしめ
す。
ピ、ド険。
第5図FIGS. 1 and 2 show the structure of a conventional element susceptible to electrical noise. 3 and 4 show the structure of an element to which the electrostatic shielding film of the present invention is applied. Part 5 shows the state of the read signal from the image sensor. P, very dangerous. Figure 5
Claims (1)
る特定の電位にした静電遮蔽膜。 2、特許請求の範囲の第1項において絶縁膜上に微弱電
流を流す素子を形成した上に絶縁層、導電膜と積層し上
下の導電膜を特定の電位にした静電遮蔽膜。[Claims] 1. An electrostatic shielding film in which a conductive film and an insulating film are laminated on an insulating substrate, and the conductive film is set to a certain potential. 2. An electrostatic shielding film according to claim 1, in which an element for flowing a weak current is formed on an insulating film, and then an insulating layer and a conductive film are laminated, and the upper and lower conductive films are set to a specific potential.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62301246A JPH01143257A (en) | 1987-11-28 | 1987-11-28 | Electrostatic shielding film |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62301246A JPH01143257A (en) | 1987-11-28 | 1987-11-28 | Electrostatic shielding film |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH01143257A true JPH01143257A (en) | 1989-06-05 |
Family
ID=17894532
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62301246A Pending JPH01143257A (en) | 1987-11-28 | 1987-11-28 | Electrostatic shielding film |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01143257A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008090141A (en) * | 2006-10-04 | 2008-04-17 | Sony Corp | Display device |
| JP2008209555A (en) * | 2007-02-26 | 2008-09-11 | Epson Imaging Devices Corp | Electro-optical device, semiconductor device, display device and electronic equipment having the same |
| US7619194B2 (en) | 2007-02-26 | 2009-11-17 | Epson Imaging Devices Corporation | Electro-optical device, semiconductor device, display device, and electronic apparatus having the display device |
| US7852440B2 (en) | 2006-07-12 | 2010-12-14 | Sony Corporation | Liquid crystal display device |
| JP2017049568A (en) * | 2015-08-31 | 2017-03-09 | 株式会社Joled | Semiconductor device, display device, display device manufacturing method, and electronic apparatus |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59117267A (en) * | 1982-12-24 | 1984-07-06 | Seiko Instr & Electronics Ltd | Thin film transistor |
| JPS60192370A (en) * | 1984-03-13 | 1985-09-30 | Seiko Instr & Electronics Ltd | Thin film transistor array |
| JPS6143463A (en) * | 1984-08-08 | 1986-03-03 | Hitachi Ltd | Semiconductor device |
| JPS61166162A (en) * | 1985-01-18 | 1986-07-26 | Ricoh Co Ltd | Image sensor |
-
1987
- 1987-11-28 JP JP62301246A patent/JPH01143257A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59117267A (en) * | 1982-12-24 | 1984-07-06 | Seiko Instr & Electronics Ltd | Thin film transistor |
| JPS60192370A (en) * | 1984-03-13 | 1985-09-30 | Seiko Instr & Electronics Ltd | Thin film transistor array |
| JPS6143463A (en) * | 1984-08-08 | 1986-03-03 | Hitachi Ltd | Semiconductor device |
| JPS61166162A (en) * | 1985-01-18 | 1986-07-26 | Ricoh Co Ltd | Image sensor |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7852440B2 (en) | 2006-07-12 | 2010-12-14 | Sony Corporation | Liquid crystal display device |
| JP2008090141A (en) * | 2006-10-04 | 2008-04-17 | Sony Corp | Display device |
| US8169572B2 (en) | 2006-10-04 | 2012-05-01 | Sony Corporation | Display apparatus and electronic apparatus |
| JP2008209555A (en) * | 2007-02-26 | 2008-09-11 | Epson Imaging Devices Corp | Electro-optical device, semiconductor device, display device and electronic equipment having the same |
| US7619194B2 (en) | 2007-02-26 | 2009-11-17 | Epson Imaging Devices Corporation | Electro-optical device, semiconductor device, display device, and electronic apparatus having the display device |
| JP2017049568A (en) * | 2015-08-31 | 2017-03-09 | 株式会社Joled | Semiconductor device, display device, display device manufacturing method, and electronic apparatus |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR950004378B1 (en) | Lcd cell and manufacturing method of situation sensing | |
| US4110616A (en) | Pyroelectric detectors | |
| JPH01143257A (en) | Electrostatic shielding film | |
| JPS5752027A (en) | Liquid-crystal display device | |
| JPH0222872A (en) | Optical sensor device | |
| JPS61189065A (en) | Image sensor | |
| JPH0752266B2 (en) | Reflective liquid crystal display device | |
| JPS62198155A (en) | Thin film image sensor | |
| JP2606637Y2 (en) | Infrared array sensor | |
| JPS59129833A (en) | liquid crystal display element | |
| JP2694711B2 (en) | Pyroelectric element and manufacturing method thereof | |
| JPS6421958A (en) | Image sensor | |
| JP2694710B2 (en) | Pyroelectric element and manufacturing method thereof | |
| JPS6214708Y2 (en) | ||
| JPS6481263A (en) | Contact type image sensor | |
| JPS5853575Y2 (en) | display device | |
| JPS63227055A (en) | Method of adjusting output of contact type image sensor | |
| JPS58184933A (en) | Liquid crystal display element | |
| JPS6422066A (en) | Thin film transistor | |
| JPS63141378A (en) | Thin film photo sensor | |
| JPS63164260A (en) | Semiconductor device | |
| JPH0833539B2 (en) | Reflective liquid crystal display device | |
| JPS60263457A (en) | Photoelectric conversion element array for hybrid integrated optical sensor | |
| JPS5543474A (en) | Thin type tn-liquid crystal display device for electronic clock | |
| JPS6459324A (en) | Active device and its manufacture |