JPH0116053Y2 - - Google Patents

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Publication number
JPH0116053Y2
JPH0116053Y2 JP1982016551U JP1655182U JPH0116053Y2 JP H0116053 Y2 JPH0116053 Y2 JP H0116053Y2 JP 1982016551 U JP1982016551 U JP 1982016551U JP 1655182 U JP1655182 U JP 1655182U JP H0116053 Y2 JPH0116053 Y2 JP H0116053Y2
Authority
JP
Japan
Prior art keywords
inspection
guide sleeve
pin
printed circuit
circuit board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1982016551U
Other languages
Japanese (ja)
Other versions
JPS58119766U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1655182U priority Critical patent/JPS58119766U/en
Publication of JPS58119766U publication Critical patent/JPS58119766U/en
Application granted granted Critical
Publication of JPH0116053Y2 publication Critical patent/JPH0116053Y2/ja
Granted legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)

Description

【考案の詳細な説明】 本考案はプリント基板検査装置の改良に係り、
特に配線済のプリント基板の反り等を考慮し検査
の信頼度を向上し得るプリント基板検査装置を得
ることを主目的とし、更にその様な装置を低コス
トで実現することを副次的な目的とするものであ
る。
[Detailed description of the invention] This invention relates to the improvement of printed circuit board inspection equipment.
The main purpose is to obtain a printed circuit board inspection device that can improve the reliability of inspection by taking into account the warping of printed circuit boards that have already been wired, and the secondary purpose is to realize such a device at a low cost. That is.

この種の検査装置は、限定的なものではない
が、配線完了後プリント基板上に設けられている
複数のテストパターンに対応して設けられる検査
ピンを同時に導電的に接触せしめ、プリント基板
を動作状態として一時に入出力信号のテストを行
うものである。
This type of inspection device is not limited to this type, but after wiring is completed, test pins provided corresponding to multiple test patterns provided on the printed circuit board are brought into conductive contact at the same time, and the printed circuit board is operated. As a state, input/output signals are tested at one time.

この装置はプリントパターン上のテストポイン
トの分布に応じて配置される検査ピンユニツト群
を備える。この検査ピンユニツトは第1図に図示
せる如き構成のものである。
This device includes a group of test pin units arranged according to the distribution of test points on the printed pattern. This test pin unit has a structure as shown in FIG.

この検査ピンユニツトは尖頭検査ピン1をその
軸方向に案内する有鍔の案内スリーブ2と、この
スリーブを検査基台3の所定個所、即ちプリント
基板のテストポイントに対応する位置に設けられ
た透孔4に固設するための固定スリーブ5、及び
前記案内スリーブ2の無鍔端部側に設けられたネ
ジ部6と、上記検査ピン1の他端の係止部7との
間に懸架されるコイルバネ8とを備え、検査時
に、検査ピン1をコイルバネの付勢力でプリント
基板に圧接する構成となつている。
This test pin unit includes a flange-shaped guide sleeve 2 that guides the pointed test pin 1 in its axial direction, and a transparent guide sleeve 2 that guides the pointed test pin 1 at a predetermined location on the test base 3, that is, a position corresponding to the test point on the printed circuit board. A fixing sleeve 5 for fixing to the hole 4, a threaded portion 6 provided on the unflangeed end side of the guide sleeve 2, and a locking portion 7 at the other end of the inspection pin 1 are suspended between. A coil spring 8 is provided, and the inspection pin 1 is pressed against the printed circuit board by the biasing force of the coil spring during inspection.

この様な検査ユニツトを備える検査装置は特に
プリント基板に反りがない様な場合には良好に機
能する。
An inspection apparatus equipped with such an inspection unit functions particularly well when the printed circuit board does not appear to be warped.

しかし乍ら、紙エポキシ製のプリント基板等で
は、部品挿入後自動半田付装置によつて半田付配
線が完了すると、一般に配線パターン面側が収縮
し、極端な場合にはプリント基板Pに第2図の如
き反りが生じることを避け得ない。そしてこの反
りは、基板エポキシの繊維分布、基板形状に依存
し一様ではない。
However, with paper epoxy printed circuit boards, etc., when the soldering wiring is completed by an automatic soldering device after parts are inserted, the wiring pattern side generally shrinks, and in extreme cases, the printed circuit board P will shrink as shown in Figure 2. It is unavoidable that warpage like this will occur. This warpage depends on the fiber distribution of the substrate epoxy and the shape of the substrate and is not uniform.

この様なプリント基板9を第3図に模式的に示
す様にその両端部で固定して、所定個所に検査ピ
ンユニツトu……uを配した検査装置Aで検査す
る場合を考えると、個々の検査ピンユニツトu…
の検査ピンに加わる応力は、そのユニツトの位置
によつて異なるから、プリント基板9の中央部分
と周辺部分では検査ピンのテストポイントへの接
触力が著しく異なるために、特に中央部において
十分な接触圧が確保されず接触の信頼度がバラツ
キ、検査の信頼性が大巾に低下してしまうという
欠点を避け得ない。
If we consider the case where such a printed circuit board 9 is fixed at both ends as schematically shown in FIG. Inspection pin unit u...
Since the stress applied to the test pins varies depending on the position of the unit, the contact force of the test pins to the test points differs significantly between the central and peripheral parts of the printed circuit board 9. The unavoidable disadvantage is that the pressure is not secured, the reliability of contact varies, and the reliability of inspection is greatly reduced.

この様な欠点を除くために、各ユニツトの位置
に応じて予め第3図に示図せる如く検査ピン1,
1…1の検査基台Aに対する突出量をl1からl2の
範囲で調整しておくことが考えられる。
In order to eliminate such defects, test pins 1,
It is conceivable to adjust the amount of protrusion of 1...1 with respect to the inspection base A in the range of l1 to l2 .

その一例としては、第1図中に一点鎖線で図示
せる如く、案内スリーブ2の鍔部9と検査基台3
との間に必要な突出量を確保するための中間スリ
ーブ10(或いは台座)を介挿することが考えら
れる。
As an example, as shown by the dashed line in FIG. 1, the flange 9 of the guide sleeve 2 and the inspection base 3
It is conceivable to insert an intermediate sleeve 10 (or a pedestal) to ensure the necessary amount of protrusion between the two.

しかし乍ら、検査ピンユニツトの配置に応じて
個別に必要な中間スリーブ10を見つけて個々の
検査ピンの突出量を確保することは、非能率であ
るだけでなく異長の数多くの中間スリーブを用意
しなければならずコスト高を余儀なくされる。
However, it is not only inefficient to find the necessary intermediate sleeve 10 individually according to the arrangement of the inspection pin unit to ensure the protrusion amount of each inspection pin, but also to prepare a large number of intermediate sleeves of different lengths. have to do so, resulting in higher costs.

本考案は斯る点に鑑みなされたものである。以
下本考案の詳細を、第5図の実施例を参照しつつ
説明する。
The present invention was developed in view of this point. The details of the present invention will be explained below with reference to the embodiment shown in FIG.

この実施例では、その内周で尖頭の検査ピン1
1をその軸方向に摺動自在に案内する有鍔筒状の
案内スリーブ12の外周に一様にネジ溝22を切
削している。前記案内スリーブ12の外周は、検
査基台13の透孔14に嵌入固定した固定スリー
ブ15の内周に沿いその軸方向に摺動自在に嵌合
される。一端を検査ピン11の円筒端側に設けた
係止部材17に係止固着したコイルバネ18の他
端は、上記案内スリーブ15の外周に設けたネジ
溝22に螺合し、検査ピン11を尖頭側に付勢し
得る様に固定する。
In this embodiment, the inspection pin 1 is pointed at its inner periphery.
A threaded groove 22 is uniformly cut on the outer periphery of a flanged cylindrical guide sleeve 12 that guides the guide sleeve 1 slidably in the axial direction. The outer periphery of the guide sleeve 12 is fitted so as to be slidable in the axial direction along the inner periphery of a fixed sleeve 15 that is fitted and fixed in the through hole 14 of the inspection base 13. One end of the coil spring 18 is locked and fixed to a locking member 17 provided on the cylindrical end side of the inspection pin 11. The other end of the coil spring 18 is screwed into a threaded groove 22 provided on the outer periphery of the guide sleeve 15, and the inspection pin 11 is held in a sharp position. Fix it so that it can be biased toward the head.

上記案内スリーブ12の鍔19と検査基台13
との間には、ナツト20をスリーブ外周のネジ溝
22に螺合して設け、このナツト20の位置に応
じて案内スリーブ12の検査基台13に対する相
対位置、即ち突出量を微調可変自在としている。
The collar 19 of the guide sleeve 12 and the inspection base 13
A nut 20 is screwed into a threaded groove 22 on the outer periphery of the sleeve, and the relative position of the guide sleeve 12 with respect to the inspection base 13, that is, the amount of protrusion, can be finely adjusted according to the position of the nut 20. There is.

特にこのナツト20と固定スリーブ15との係
合関係を、ナツトが軸方向にのみ拘束され、ナツ
ト20を移動不能とし、回転方向にのみ自由に動
き得る様に構成しておけば、検査ピン11に対し
て付勢力が作用していないプリント基板検査時以
外においても、各検査ユニツトの軸方向の不用意
なづれを防止し得る。
In particular, if the engagement relationship between the nut 20 and the fixed sleeve 15 is configured such that the nut is restricted only in the axial direction, the nut 20 is immovable, and can freely move only in the rotational direction, the inspection pin 11 Inadvertent displacement of each inspection unit in the axial direction can be prevented even when no urging force is applied to the printed circuit board during inspection.

この様な構成の検査ピンユニツトを検査基台上
の所定の位置、即ちプリント基板上でテストポイ
ント(パターン)が配置された位置に穿設される
透孔14に固定し、且つプリント基板の反り形状
に合わせて各検査ピンユニツトのナツト20を、
指等で鍔19を回転しないように保持しながら案
内スリーブ外周のネジ溝に螺合調整することによ
つて案内スリーブの検査基台からの高さを決めて
おけば、検査時、各検査ユニツトの検査ピンは等
しい圧力でテストポイントに当接するので、均一
な接触圧が確保され検査の信頼性が向上する。
又、真空吸引或はプレス装置によつてプリント基
板の反りを少くしつつ検査する等の方法に比し
て、低コストで且つ高信頼度の検査装置を実現し
得るものである。また、案内スリーブの検査基台
からの高さの調整とは独立して、コイルバネのば
ねとして作用する部分の長さを変更することによ
り、検査ピンの押し込み量に対するテストポイン
トに当接する圧力を調整することができ、最適の
当接力を容易に設定できる。
The test pin unit having such a configuration is fixed to a predetermined position on the test base, that is, to the through hole 14 drilled at the position where the test point (pattern) is arranged on the printed circuit board, and Adjust the nut 20 of each inspection pin unit according to the
If you determine the height of the guide sleeve from the inspection base by holding the flange 19 so that it does not rotate with your fingers, etc. and screwing it into the thread groove on the outer periphery of the guide sleeve, you can easily adjust the height of each inspection unit during inspection. The test pins contact the test points with equal pressure, ensuring uniform contact pressure and improving test reliability.
Furthermore, compared to methods such as using a vacuum suction or press device to inspect the printed circuit board while minimizing warpage, it is possible to realize a lower cost and more reliable inspection device. In addition, independent of adjusting the height of the guide sleeve from the inspection base, by changing the length of the part of the coil spring that acts as a spring, the pressure that contacts the test point relative to the amount of pushing of the inspection pin can be adjusted. The optimum contact force can be easily set.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの種検査ユニツトの要部断面図、第
2図はプリント基板の半田付後の反り具合を示す
模式図、第3図はプリント基板の検査の模様を示
す模式図、第4図は本考案の検査装置の側面図、
第5図は本考案装置に用いられる検査ピンユニツ
トの要部側面図である。 u…検査ピンユニツト、11…検査ピン、12
…案内スリーブ、13…検査基台、18…コイル
バネ、20…ナツト。
Fig. 1 is a sectional view of the main parts of this type of inspection unit, Fig. 2 is a schematic diagram showing the degree of warpage of a printed circuit board after soldering, Fig. 3 is a schematic diagram showing the pattern of inspection of a printed circuit board, and Fig. 4 is a side view of the inspection device of the present invention,
FIG. 5 is a side view of the main part of the inspection pin unit used in the device of the present invention. u...Inspection pin unit, 11...Inspection pin, 12
...Guide sleeve, 13...Inspection base, 18...Coil spring, 20...Nut.

Claims (1)

【実用新案登録請求の範囲】 内周面で尖頭検査ピンを軸方向に案内する有鍔
筒状案内スリーブの外周にネジ溝を設け、この案
内スリーブを検査基台の直角方向に摺動自在に取
付け、前記検査ピンの他端と前記案内スリーブの
他端との間にコイルバネを介挿して、上記検査ピ
ン尖頭方向の付勢力を付与するべく構成した検査
ピンユニツトを、検査基台上に配するプリント基
板検査装置において、 前記尖頭検査ピンの突出量を調整すべく、前記
案内スリーブの外周の前記ネジ溝に螺合するナツ
トを、前記検査基台上面に配し、前記コイルバネ
の付勢力を調整すべく、該コイルバネを前記ネジ
溝に螺合せしめるように構成したことを特徴とす
るプリント基板検査装置。
[Claim for Utility Model Registration] A threaded groove is provided on the outer periphery of a flanged cylindrical guide sleeve that guides the pointed inspection pin in the axial direction on the inner circumferential surface, and this guide sleeve can freely slide in the direction perpendicular to the inspection base. An inspection pin unit configured to attach to the inspection pin and insert a coil spring between the other end of the inspection pin and the other end of the guide sleeve to apply a biasing force in the direction of the tip of the inspection pin is placed on an inspection base. In the printed circuit board inspection apparatus, a nut is disposed on the upper surface of the inspection base to be screwed into the thread groove on the outer periphery of the guide sleeve in order to adjust the protrusion amount of the pointed inspection pin, and A printed circuit board inspection device characterized in that the coil spring is screwed into the thread groove to adjust the force.
JP1655182U 1982-02-08 1982-02-08 Printed circuit board inspection equipment Granted JPS58119766U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1655182U JPS58119766U (en) 1982-02-08 1982-02-08 Printed circuit board inspection equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1655182U JPS58119766U (en) 1982-02-08 1982-02-08 Printed circuit board inspection equipment

Publications (2)

Publication Number Publication Date
JPS58119766U JPS58119766U (en) 1983-08-15
JPH0116053Y2 true JPH0116053Y2 (en) 1989-05-12

Family

ID=30028913

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1655182U Granted JPS58119766U (en) 1982-02-08 1982-02-08 Printed circuit board inspection equipment

Country Status (1)

Country Link
JP (1) JPS58119766U (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004046739A1 (en) * 2002-11-19 2004-06-03 Nhk Spring Co., Ltd. Electric probe system
JP6058325B2 (en) * 2012-09-12 2017-01-11 日置電機株式会社 Substrate inspection apparatus and substrate inspection method

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49132456U (en) * 1973-03-14 1974-11-14
JPS5397468A (en) * 1977-02-05 1978-08-25 Dairitsu Sangiyou Kk Checker pin for inspection and measurement of printed circuit boards

Also Published As

Publication number Publication date
JPS58119766U (en) 1983-08-15

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