JPH01162122U - - Google Patents

Info

Publication number
JPH01162122U
JPH01162122U JP5710088U JP5710088U JPH01162122U JP H01162122 U JPH01162122 U JP H01162122U JP 5710088 U JP5710088 U JP 5710088U JP 5710088 U JP5710088 U JP 5710088U JP H01162122 U JPH01162122 U JP H01162122U
Authority
JP
Japan
Prior art keywords
optical disk
standard sample
film
sample pieces
same circumference
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5710088U
Other languages
Japanese (ja)
Other versions
JP2505761Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP5710088U priority Critical patent/JP2505761Y2/en
Publication of JPH01162122U publication Critical patent/JPH01162122U/ja
Application granted granted Critical
Publication of JP2505761Y2 publication Critical patent/JP2505761Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図および第2図は本考案の光デイスク検査
装置校正用基準板の一実施例を示す構成図および
断面図、第3図は標準試料片S0〜S11の形成
例を示す断面図、第4図は本考案の基準板を光デ
イスク検査装置に装着した状態の一例を示す構成
図である。 S0〜S11……標準試料片、1……基板部、
2……クランプ部、31……ガラス基板、32…
…反射膜または透過膜、33……反射防止膜、4
……クランプ機構、5……光学ヘツド。
1 and 2 are a configuration diagram and a cross-sectional view showing an embodiment of the reference plate for calibrating an optical disk inspection device of the present invention, and FIG. 3 is a cross-sectional view showing an example of the formation of standard sample pieces S0 to S11. FIG. 4 is a configuration diagram showing an example of a state in which the reference plate of the present invention is attached to an optical disk inspection apparatus. S0 to S11...Standard sample piece, 1...Substrate part,
2... Clamp part, 31... Glass substrate, 32...
...Reflection film or transmission film, 33...Antireflection film, 4
...Clamp mechanism, 5...Optical head.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 通常の光デイスクと等しい板厚を有するガラス
基板の一方の面に誘電体多層膜よりなる反射膜ま
たは透過膜が形成されるとともに他方の面に反射
防止膜が形成され所定の基準値に値付けされた複
数の標準試料片と、光デイスクのクランプ機構に
より共通にクランプされるクランプ部を有し前記
複数の標準試料片を同一円周上に配置するととも
にこれら複数の標準試料片をその反射膜面の位置
およびクランプ面からの高さが前記クランプ機構
にクランプされる通常の光デイスクの記録膜面と
一致するように保持する基板部とを具備してなる
光デイスク検査装置校正用基準板。
A reflective film or a transparent film made of a dielectric multilayer film is formed on one side of a glass substrate having the same thickness as a normal optical disk, and an anti-reflection film is formed on the other side, and the price is set to a predetermined standard value. The plurality of standard sample pieces are arranged on the same circumference, and the plurality of standard sample pieces are arranged on the same circumference, and the plurality of standard sample pieces are arranged on the same circumference. 1. A reference plate for calibrating an optical disk inspection device, comprising a substrate portion that is held so that the position of the surface and the height from the clamping surface match the recording film surface of a normal optical disk clamped by the clamp mechanism.
JP5710088U 1988-04-27 1988-04-27 Optical disk inspection device calibration reference plate Expired - Lifetime JP2505761Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5710088U JP2505761Y2 (en) 1988-04-27 1988-04-27 Optical disk inspection device calibration reference plate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5710088U JP2505761Y2 (en) 1988-04-27 1988-04-27 Optical disk inspection device calibration reference plate

Publications (2)

Publication Number Publication Date
JPH01162122U true JPH01162122U (en) 1989-11-10
JP2505761Y2 JP2505761Y2 (en) 1996-07-31

Family

ID=31282955

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5710088U Expired - Lifetime JP2505761Y2 (en) 1988-04-27 1988-04-27 Optical disk inspection device calibration reference plate

Country Status (1)

Country Link
JP (1) JP2505761Y2 (en)

Also Published As

Publication number Publication date
JP2505761Y2 (en) 1996-07-31

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