JPH01167601U - - Google Patents

Info

Publication number
JPH01167601U
JPH01167601U JP6391288U JP6391288U JPH01167601U JP H01167601 U JPH01167601 U JP H01167601U JP 6391288 U JP6391288 U JP 6391288U JP 6391288 U JP6391288 U JP 6391288U JP H01167601 U JPH01167601 U JP H01167601U
Authority
JP
Japan
Prior art keywords
micrometer
anvil
spindle
recess
center
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6391288U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP6391288U priority Critical patent/JPH01167601U/ja
Publication of JPH01167601U publication Critical patent/JPH01167601U/ja
Pending legal-status Critical Current

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Landscapes

  • Length-Measuring Instruments Using Mechanical Means (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本考案のマイクロメータの正面図、第
2図は被測定部材の斜視図、第3図はアンビルと
スピンドルとの間に測定子を介在させたマイクロ
メータの正面図、第4図は第3図の実施例で使用
する測定子の斜視図である。 1……アンビル、2……スピンドル、3……被
測定部材、4……凹所、5……突部、6……測定
子。
Fig. 1 is a front view of the micrometer of the present invention, Fig. 2 is a perspective view of the member to be measured, Fig. 3 is a front view of the micrometer with a probe interposed between the anvil and the spindle, and Fig. 4. 3 is a perspective view of the probe used in the embodiment of FIG. 3. FIG. DESCRIPTION OF SYMBOLS 1... Anvil, 2... Spindle, 3... Member to be measured, 4... Recess, 5... Protrusion, 6... Measuring head.

Claims (1)

【実用新案登録請求の範囲】 (1) マイクロメータのアンビルとスピンドルの
各対向面のうち、少なくとも一方の中央に凹所を
形成したことを特徴とするマイクロメータ。 (2) マイクロメータのアンビルとスピンドル間
に設ける測定子において、測定子の両面を平行な
平面に形成するとともに、その一方の平面中央に
凹所を形成したことを特徴とするマイクロメータ
用測定子。
[Claims for Utility Model Registration] (1) A micrometer characterized in that a recess is formed in the center of at least one of the opposing surfaces of the anvil and spindle of the micrometer. (2) A measuring tip for a micrometer, which is provided between an anvil and a spindle of a micrometer, and is characterized in that both surfaces of the measuring tip are formed into parallel planes, and a recess is formed in the center of one of the planes. .
JP6391288U 1988-05-14 1988-05-14 Pending JPH01167601U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6391288U JPH01167601U (en) 1988-05-14 1988-05-14

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6391288U JPH01167601U (en) 1988-05-14 1988-05-14

Publications (1)

Publication Number Publication Date
JPH01167601U true JPH01167601U (en) 1989-11-24

Family

ID=31289398

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6391288U Pending JPH01167601U (en) 1988-05-14 1988-05-14

Country Status (1)

Country Link
JP (1) JPH01167601U (en)

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