JPH0321703U - - Google Patents
Info
- Publication number
- JPH0321703U JPH0321703U JP8258789U JP8258789U JPH0321703U JP H0321703 U JPH0321703 U JP H0321703U JP 8258789 U JP8258789 U JP 8258789U JP 8258789 U JP8258789 U JP 8258789U JP H0321703 U JPH0321703 U JP H0321703U
- Authority
- JP
- Japan
- Prior art keywords
- scale
- main scale
- free
- measuring
- chamfering
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000003754 machining Methods 0.000 claims description 3
- 239000000523 sample Substances 0.000 claims description 3
Landscapes
- Length-Measuring Instruments Using Mechanical Means (AREA)
Description
第１図および第２図は本考案の実施例にかかる
加工面取りの測定器の正面図および背面図、第３
図および第４図は本考案の実施例にかかる加工面
取りの測定器における深さ測定用触子のナイフエ
ツジ形状の例を示す拡大断面図、第５図および第
６図は本考案の実施例にかかる加工面取りの測定
器を用いて面取り量および穴深さを測定する場合
の状態を示す断面図である。
１……本尺、１ａ……遊尺摺動方向端部、２…
…遊尺、３〜６……長さ測定用触子、７……深さ
測定用触子、９，１０……傾斜面、Ｗ……測定対
象物、Ｐ……面取り面。
1 and 2 are a front view and a back view of a machining chamfer measuring instrument according to an embodiment of the present invention, and a third
4 and 4 are enlarged cross-sectional views showing examples of the knife edge shape of the depth measuring probe in the machined chamfer measuring instrument according to the embodiment of the present invention, and FIGS. 5 and 6 are according to the embodiment of the present invention. FIG. 3 is a cross-sectional view showing a state in which the amount of chamfering and the hole depth are measured using such a measuring device for chamfering. 1...Main scale, 1a...Sliding direction end of free scale, 2...
...Free length, 3-6...Toucher for measuring length, 7...Toucher for measuring depth, 9, 10...Slanted surface, W...Object to be measured, P...Chamfered surface.
Claims (1)
された遊尺と、前記本尺と遊尺とに相互に対をな
す如く設けられた長さ測定用触子と、前記遊尺に
対して一端が固定され、前記本尺の遊尺摺動方向
端部に対して進退自在とされた深さ測定用触子と
を備えてなる加工面取りの測定器であつて、前記
深さ測定用触子の側面には、測定対象物の面取り
角度と等しい角度の傾斜面が形成されていること
を特徴とする加工面取りの測定器。 A long and slender main scale, a free scale slidably supported with respect to the main scale, a length measuring feeler provided on the main scale and the free scale so as to form a pair with each other, and the free scale. A measuring device for machining chamfering, comprising a depth measuring probe having one end fixed to the main scale and movable back and forth with respect to the free sliding direction end of the main scale, A measuring instrument for machining chamfering, characterized in that a side surface of the measuring probe is formed with an inclined surface having an angle equal to the chamfering angle of the object to be measured.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8258789U JPH0321703U (en) | 1989-07-12 | 1989-07-12 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8258789U JPH0321703U (en) | 1989-07-12 | 1989-07-12 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0321703U true JPH0321703U (en) | 1991-03-05 |
Family
ID=31629539
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8258789U Pending JPH0321703U (en) | 1989-07-12 | 1989-07-12 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0321703U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20180000196U (en) * | 2016-07-08 | 2018-01-17 | 국방기술품질원 | Venier calipers |
-
1989
- 1989-07-12 JP JP8258789U patent/JPH0321703U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20180000196U (en) * | 2016-07-08 | 2018-01-17 | 국방기술품질원 | Venier calipers |