JPH01219656A - Inspecting method of mounted printed circuit board - Google Patents

Inspecting method of mounted printed circuit board

Info

Publication number
JPH01219656A
JPH01219656A JP63046257A JP4625788A JPH01219656A JP H01219656 A JPH01219656 A JP H01219656A JP 63046257 A JP63046257 A JP 63046257A JP 4625788 A JP4625788 A JP 4625788A JP H01219656 A JPH01219656 A JP H01219656A
Authority
JP
Japan
Prior art keywords
printed circuit
circuit board
inspection
land
height
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP63046257A
Other languages
Japanese (ja)
Other versions
JPH0778472B2 (en
Inventor
Kenichi Kaita
健一 戒田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP63046257A priority Critical patent/JPH0778472B2/en
Publication of JPH01219656A publication Critical patent/JPH01219656A/en
Publication of JPH0778472B2 publication Critical patent/JPH0778472B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N21/95684Patterns showing highly reflecting parts, e.g. metallic elements

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To facilitate the automation of an inspecting apparatus, by measuring either height or luminance along the periphery of a land part of a printed circuit board whereon components are mounted, so as to inspect or determine the miss of a solder bridge or a lack of component. CONSTITUTION:On a substrate, electrodes 1, 2 of a chip component 5 are soldered to land parts 3, 4, and a circuit pattern 2 is already subjected to a resist treatment. Inspection tracks 7, 8 are prescribed beforehand along the vicinity of the periphery of the lands 3, 4. The positions and shapes of the tracks 7, 8 are memorized beforehand in an automatic inspecting machine, and the automatic inspecting machine measures sequentially the height or luminance of the tracks 7, 8 along them.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は、実装済プリント基板の検査方法に関するもの
で、特にノ・ンダブリッジの検査・判定をコンピュータ
等で自動化する上での検査方法に関するものである。
[Detailed Description of the Invention] Industrial Application Field The present invention relates to a method for inspecting a mounted printed circuit board, and in particular to an inspection method for automating the inspection and determination of non-conductor bridges using a computer or the like. be.

従来の技術 従来、実装済プリント基板の検査において、特にハンダ
ブリッジの検査に関してはほとんど人間の目に頼ってい
る。
BACKGROUND OF THE INVENTION Conventionally, inspection of mounted printed circuit boards, especially inspection of solder bridges, has mostly relied on the human eye.

発明が解決しようとする課題 しかし、近年のプリント基板の小型化、部品の小型化、
実装密度の高集積化、および部品挿入機の高速化等に伴
い、今まで以上の正確さ、スピード等が要求されるよう
になり、目視検査では対応できなくなりつつある。また
、ノλンダブリッジの検査は、どこにノ・ンダブリッジ
が発生するか予想をつけにくいため、検査手法が一般的
に複雑になりマイクロコンピュータ等で検査可能な簡単
な検査手法がないという問題点がある。
Problems that the invention aims to solveHowever, in recent years, the miniaturization of printed circuit boards, miniaturization of parts,
As packaging density increases and component insertion machines become faster, greater accuracy and speed are required than ever before, and visual inspection is no longer sufficient. In addition, in the inspection of NO-λ bridges, it is difficult to predict where NO-ND bridges will occur, so the inspection method is generally complicated, and there is a problem that there is no simple inspection method that can be tested with a microcomputer, etc. There is.

本発明はかかる問題点に鑑み、・・ンダプリノジの検査
と同時に部品の欠落も検査可能で、かつ簡単なアルゴリ
ズムであるため、マイクロコンピュータや電気回路で実
現可能な検査手法を提供することを目的とするものであ
る。
In view of these problems, the present invention aims to provide an inspection method that can be used to inspect missing parts at the same time as inspecting Nadapurinoji, and because it uses a simple algorithm, it can be realized using a microcomputer or an electric circuit. It is something to do.

課題を解決するための手段 本発明は、部品実装後のプリント基板におけるランドの
周辺に沿って、高さまたは輝度の少なくとも一方を順次
測定し、その測定値の変化を予じめ定められた変化と比
較し、その差異の有無により・・ンダプリノジおよび部
品の欠落を判定する実装源プリント基板の検査方法であ
る。
Means for Solving the Problems The present invention sequentially measures at least one of height or brightness along the periphery of a land on a printed circuit board after components are mounted, and calculates changes in the measured value according to a predetermined change. This is an inspection method for the mounting source printed circuit board that determines whether there are any gaps or missing parts by comparing the differences between the two.

作  用 前記した方法によれば、マイクロコンピュータや電気回
路で実装源プリント基板上のハンダブリッジや部品の欠
落を検査・判定することが可能になシ、検査装置の自動
化が容易に可能になるものである。
According to the method described above, it is possible to inspect and determine whether solder bridges or missing parts on the mounting source printed circuit board are present using a microcomputer or an electric circuit, and automation of the inspection equipment is easily possible. It is.

実施例 以下、本発明の目的を達成するための実施例を図面に従
って説明する。
Embodiments Hereinafter, embodiments for achieving the objects of the present invention will be described with reference to the drawings.

第1図は電子部品が正常に実装されたプリント基板の拡
大図であり、3,4はチップ部品5の電極1,2が半田
付けされているランド部分、6はレジスト処理された回
路パターンである。7,8は前記ランド3,4の外周近
傍に沿って予じめ規定された検査線路であり、この検査
線路7,8の位置および形状は予じめ自動検査機に覚え
込ませてあり、自動検査機はこの検査線路7.8に沿っ
て、その高さあるいは輝度(反射率)を順次測定するよ
う構成されている。
Figure 1 is an enlarged view of a printed circuit board on which electronic components are normally mounted. 3 and 4 are land parts to which electrodes 1 and 2 of chip component 5 are soldered, and 6 is a resist-treated circuit pattern. be. Reference numerals 7 and 8 are inspection lines predefined along the vicinity of the outer periphery of the lands 3 and 4, and the positions and shapes of the inspection lines 7 and 8 are memorized in advance in the automatic inspection machine. The automatic inspection machine is configured to sequentially measure the height or brightness (reflectance) along this inspection line 7.8.

第2図は、第1図の検査線路7に沿って自動検査機によ
り高さを測定した検査結果であシ、ランド3の外周部分
を検査線路7に沿って点11.12゜13.14.11
の経路で走査した時の高さの変化を表している。すなわ
ち、点12と13の間にはチップ部品5の存在を示す部
分Aが、点14と11の間には回路パターン6の存在を
示す部分Bが検出され、点11と122点13と14の
間にはなにも存在しないことを示している。この第2図
に示す波形は、正常な部品実装時の波形として、予じめ
検査機に記憶されてあシ、この記憶された波形と検査結
果の波形を比較し、その差異の有無により正常な部品実
装が行われているか否かが判断されるものである。
FIG. 2 shows the inspection results obtained by measuring the height using an automatic inspection machine along the inspection track 7 shown in FIG. .11
It represents the change in height when scanning along the path. That is, a portion A indicating the presence of the chip component 5 is detected between points 12 and 13, a portion B indicating the presence of the circuit pattern 6 is detected between points 14 and 11, and points 11 and 122 and points 13 and 14 are detected. It shows that there is nothing in between. The waveform shown in Figure 2 is stored in advance in the inspection machine as a waveform during normal component mounting.The stored waveform is compared with the waveform of the inspection result, and the presence or absence of a difference is determined to be normal. It is determined whether or not component mounting is being carried out.

第3図は基板上にチップ部品5がハンダブリッジ18を
伴って実装された所を表している。なお、15.16は
前記ランド3.4に近接して配置された他のランド部で
あシ、17はそのランド部15.16間に実装された第
2のチップ部品である。
FIG. 3 shows the chip component 5 mounted on the board together with the solder bridge 18. Note that 15.16 is another land portion disposed close to the land 3.4, and 17 is a second chip component mounted between the land portions 15.16.

第4図は、第3図の様に実装された場合の検査結果でち
ゃ、新たに点13と14の間にハンダブリッジ18が存
在することを示す区間Cが発生しており、点13と14
の間にハンダブリッジが存在していることがわかる。ま
念、第2図と第4図において、点12から区間Aが発生
をするまでの距離りを計測することによりチップ部品5
の位置のずれも検知できるものである。
FIG. 4 shows that in the inspection results when the device is mounted as shown in FIG. 14
It can be seen that there is a solder bridge between them. Just to be sure, in Figures 2 and 4, by measuring the distance from point 12 to the point where section A occurs, the chip component 5 is
It is also possible to detect a shift in the position of the

第5図は、第3図と同じ検査経路7で走査した時の輝度
変化を表して込る。高さ変化では検出不可能なハンダブ
リッジが存在する場合は、輝度情報も考慮して計測すれ
ば見逃しがなくなることを示している。なぜなら、銅箔
部の外側を走査した場合、プリント基板面よりもハンダ
面の方が反射率が大きく輝度が高くなるためである。第
5図で説明すると、点13と14の間にハンダブリッジ
18が存在していることを示す区間りが生じている。な
お、点12と13の間の輝度が高くなっているのはチッ
プ部品6の電極部1の反射率が大きいためである。
FIG. 5 shows changes in brightness when scanning is performed along the same inspection path 7 as in FIG. 3. This shows that if there is a solder bridge that cannot be detected based on height changes, it is possible to avoid missing it by taking measurements that also take luminance information into account. This is because when scanning the outside of the copper foil portion, the solder surface has a higher reflectance and higher brightness than the printed circuit board surface. Referring to FIG. 5, there is a gap between points 13 and 14 indicating that a solder bridge 18 exists. Note that the reason why the brightness between points 12 and 13 is high is because the reflectance of the electrode portion 1 of the chip component 6 is high.

第6図はプリント基板上にチップ部品6がずれて実装さ
れた場合を示している。
FIG. 6 shows a case where the chip component 6 is mounted on the printed circuit board in a shifted manner.

第7図は、第6図の様に実装された場合の検査結果であ
シ、第6図に示す様にランド3の外周部分を検査線路7
に沿って点11.12,13゜14.11の経路で走査
した時の高さ変化を表している。ハンダブリッジは存在
していないが、点12と13の間の高さが第2図の点1
2と13間の高さに比較して異常に低くなってお勺、部
品が欠落していることを示している。
FIG. 7 shows the inspection results when mounted as shown in FIG. 6. As shown in FIG.
It shows the change in height when scanning along the path of points 11, 12, 13° and 14.11. Although there is no solder bridge, the height between points 12 and 13 is the same as point 1 in Figure 2.
It is abnormally low compared to the height between 2 and 13, indicating that some parts are missing.

なお、以上の実施例ではランド部分は長方形になってb
るが、本発明は任意の形をしたランド部でも外接長方形
として走査することが可能であり、ランド部分の形によ
らないものである。
In addition, in the above embodiment, the land portion is rectangular and b
However, in the present invention, even a land portion having an arbitrary shape can be scanned as a circumscribed rectangle, regardless of the shape of the land portion.

発明の効果 以上のように本発明によれば、部品が実装されたプリン
ト基板のランド部分の周辺に沿って高さと輝度の少なく
とも一方を測定することにより、人間の目では見つけら
れない様な細いハンダブリッジまでも検査することがで
き、しかも簡単な手法であるため、自動機に最適な検査
方法を提供することができるものである。
Effects of the Invention As described above, according to the present invention, by measuring at least one of the height and brightness along the periphery of the land portion of the printed circuit board on which the component is mounted, fine lines that cannot be detected by the human eye can be measured. Since it is possible to inspect even solder bridges and is a simple method, it can provide an optimal inspection method for automatic machines.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は部品が実装されたプリント基板の要部拡大図、
第2図は本発明による同プリント基板の検査結果を示す
特性曲線図、第3図はハンダブリッジを伴って実装され
た場合のプリント基板の要部拡大図、第4図および第5
図は第3図のプリント基板の検査結果を示す特性曲線図
、第6図は基板上に部品がずれを伴って実装された場合
の要部拡大図、第7図は第6図のプリント基板の検査結
果を示す回持性曲線である。 1.2・−・・・・電極、3,4・・・・・・ランド部
分、5・・・・・チップ部品、6・・・・・・回路パタ
ーン、了、8・・・・・・検査線路、11.12,13
.14・・・・・・検査線路の点、15.16・・・・
・・ランド部分、17・・・・・・第2のチップ部品、
18・・・・・・ノ蔦ンダブリッジ。 代理人の氏名 弁理士 中 尾 敏 男 ほか1名1.
2−t   ! 7.8−検査造路 第 2 図 檜in路 □ 第4図 ++   12   13  14    I+検**
捲 □ 第 5 図 &査旅路□
Figure 1 is an enlarged view of the main parts of the printed circuit board with components mounted.
FIG. 2 is a characteristic curve diagram showing the test results of the printed circuit board according to the present invention, FIG. 3 is an enlarged view of the main parts of the printed circuit board when it is mounted with a solder bridge, and FIGS.
The figure is a characteristic curve diagram showing the inspection results of the printed circuit board in Figure 3, Figure 6 is an enlarged view of the main parts when components are mounted on the board with misalignment, and Figure 7 is the printed circuit board in Figure 6. This is a reproducibility curve showing the test results. 1.2...Electrode, 3,4...Land part, 5...Chip component, 6...Circuit pattern, End, 8...・Inspection track, 11.12,13
.. 14... Point of inspection line, 15.16...
...Land part, 17...Second chip component,
18... No Tsuta Bridge. Name of agent: Patent attorney Toshio Nakao and one other person 1.
2-t! 7.8-Inspection road No. 2 Hinoki inn road □ Fig. 4++ 12 13 14 I+Inspection**
Turn □ Figure 5 & Survey route □

Claims (2)

【特許請求の範囲】[Claims] (1)予じめ定められたランドに所定の電子部品を半田
付けする実装工程を経たプリント基板の前記ランドの周
辺に沿って順次高さを測定し、その測定された高さの変
化曲線と予じめ定められた変化曲線とを比較し、その差
異の有無によりハンダブリッジおよび部品の欠落を判定
することを特徴とする実装済プリント基板の検査方法。
(1) The height is sequentially measured along the periphery of the land of the printed circuit board that has gone through the mounting process of soldering a predetermined electronic component to a predetermined land, and the measured height change curve is A method for inspecting a mounted printed circuit board, characterized by comparing the change curve with a predetermined change curve and determining the presence or absence of a solder bridge or missing component based on the presence or absence of a difference.
(2)予じめ定められたランドに所定の電子部品を半田
付けする実装工程を経たプリント基板の前記ランドの周
辺に沿って順次輝度を測定し、その測定された輝度の変
化曲線と予じめ定められた変化曲線とを比較し、その差
異の有無により半田ブリッジおよび部品の欠落を判定す
ることを特徴とする実装済プリント基板の検査方法。
(2) The brightness is sequentially measured along the periphery of the land of the printed circuit board that has gone through the mounting process of soldering a predetermined electronic component to a predetermined land, and the measured brightness change curve is compared with the predetermined curve. 1. A method for inspecting a mounted printed circuit board, the method comprising comparing the change curve with a predetermined change curve, and determining the presence or absence of solder bridges and missing parts based on the presence or absence of a difference.
JP63046257A 1988-02-29 1988-02-29 Inspection method of mounted printed circuit board Expired - Lifetime JPH0778472B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63046257A JPH0778472B2 (en) 1988-02-29 1988-02-29 Inspection method of mounted printed circuit board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63046257A JPH0778472B2 (en) 1988-02-29 1988-02-29 Inspection method of mounted printed circuit board

Publications (2)

Publication Number Publication Date
JPH01219656A true JPH01219656A (en) 1989-09-01
JPH0778472B2 JPH0778472B2 (en) 1995-08-23

Family

ID=12742140

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63046257A Expired - Lifetime JPH0778472B2 (en) 1988-02-29 1988-02-29 Inspection method of mounted printed circuit board

Country Status (1)

Country Link
JP (1) JPH0778472B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002023171A1 (en) * 1999-03-18 2002-03-21 Fujisawa Pharmaceutical Co., Ltd. Object visual inspection method and object visual inspection apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002023171A1 (en) * 1999-03-18 2002-03-21 Fujisawa Pharmaceutical Co., Ltd. Object visual inspection method and object visual inspection apparatus

Also Published As

Publication number Publication date
JPH0778472B2 (en) 1995-08-23

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