JPH01220185A - Disk defect detection method - Google Patents
Disk defect detection methodInfo
- Publication number
- JPH01220185A JPH01220185A JP4496788A JP4496788A JPH01220185A JP H01220185 A JPH01220185 A JP H01220185A JP 4496788 A JP4496788 A JP 4496788A JP 4496788 A JP4496788 A JP 4496788A JP H01220185 A JPH01220185 A JP H01220185A
- Authority
- JP
- Japan
- Prior art keywords
- defect detection
- detection method
- defects
- disk
- diagram showing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000007547 defect Effects 0.000 title claims description 35
- 238000001514 detection method Methods 0.000 title claims description 14
- 238000010586 diagram Methods 0.000 description 12
- 238000000034 method Methods 0.000 description 4
- 230000002159 abnormal effect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000002950 deficient Effects 0.000 description 1
Landscapes
- Recording Or Reproducing By Magnetic Means (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、ハードディスク・フロッピーディスクなどの
、電気的欠陥の検出方式に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method for detecting electrical defects in hard disks, floppy disks, etc.
従来のディスク欠陥検出方式は、検出したいト。 Conventional disk defect detection methods are based on the number of defects that you want to detect.
ラックで第２図に示すように、５回転を行い４つの欠陥
を検出する方式が一般的であった。As shown in FIG. 2, a common method was to rotate the rack five times and detect four defects.
４つの欠陥とは、
ａ） ミッシングパルス
トラック平均振幅の６０％以下のパルスｂ） エキスト
ラパルス
消去後の振幅が、トラック平均振幅の３０％以上のパル
ス。The four defects are: a) Missing pulse pulse whose track average amplitude is 60% or less; b) Pulse whose amplitude after extra pulse cancellation is 30% or more of the track average amplitude.
Ｃ） ポジティブモジュレーシ黛ン
トラック平均振幅に対して１２５％以上の正の振幅変調
異常箇所。C) An abnormal location where the positive amplitude modulation is 125% or more with respect to the average amplitude of the positive modulation track.
ｄ） ネガティブモジュレーション
トラック平均振幅に対して７５％以下の負の振幅変調異
常箇所と定義されていた。d) Negative modulation It was defined as an abnormal location of negative amplitude modulation of 75% or less of the average amplitude of the track.
しかし、前述の従来技術では、４種類の欠陥検出を行う
のに１トラツクで最低５回転しなければならず、ディス
クの欠陥検出に多大な時間を必要としていた。又、従来
の欠陥検出方式では、トラック平均振幅に対して正のパ
ルス（以下スパイクパルス）という欠陥が検出不可能で
、スパイクパルスを検出しようとする七、そのトラック
で、もう１回転を必要とし、さらに時間がかかってしま
う。However, in the above-mentioned conventional technology, in order to detect four types of defects, one track must rotate at least five times, and a large amount of time is required to detect defects in the disk. In addition, with conventional defect detection methods, it is impossible to detect defects that are positive pulses (hereinafter referred to as spike pulses) with respect to the average amplitude of the track. , it takes even more time.
そこで本発明は、このような問題点を解決するもので、
ディスク欠陥検出において、高速にかつ従来の欠陥に加
え、スパイクパルスの検出を可能とする欠陥検出方式を
提供する事を、目的とする。Therefore, the present invention aims to solve these problems.
The object of the present invention is to provide a defect detection method that can detect spike pulses in addition to conventional defects at high speed in disk defect detection.
本発明のディスク欠陥検出方式は、ディスクの電気的欠
陥検出において、ある周波数で書き込み、その読ろ出し
波形の振幅値を連続した関数と考え、その関数の微分波
形により欠陥を判断する事を特徴とする。The disk defect detection method of the present invention is characterized in that when detecting electrical defects on a disk, writing is performed at a certain frequency, the amplitude value of the read waveform is considered as a continuous function, and defects are determined based on the differential waveform of that function. shall be.
以下、本発明について実施例に基づいて詳細に説明する
。本発明による欠陥検出方式の動作チャートを、Ｉｒ１
図に示す。まず１回転めで最高周波数で書き込みを行う
。次の２回転めで読み出しを行う。この読み出し波形を
次の手順により欠陥かどうかを判断する。Hereinafter, the present invention will be described in detail based on examples. The operation chart of the defect detection method according to the present invention is shown as Ir1
As shown in the figure. First, writing is performed at the highest frequency in the first rotation. Readout is performed in the next second rotation. It is determined whether or not this read waveform is defective by the following procedure.
１） 各ビットの振幅値の連続信号を作る。1) Create a continuous signal of the amplitude value of each bit.
２） ａ）の微分波形を作る。2) Create the differential waveform of a).
３） ｍ分波形の振幅が設定値を越えた場合、電気的
欠陥箇所と判断する。そして最後の３回転めで消去を行
う。従来の欠陥及びスパイクパルスが、本発明のディス
ク欠陥検出方式により、欠陥と判断される様子を第３図
に示す。3) If the amplitude of the m-minute waveform exceeds the set value, it is determined that there is an electrical defect. Then, erase is performed in the final third rotation. FIG. 3 shows how conventional defects and spike pulses are determined to be defects by the disk defect detection method of the present invention.
以上が本発明のディスク欠陥検出方式であり、検出した
いトラックで、３回転する事により欠陥を検出する。The above is the disk defect detection method of the present invention, and a defect is detected by rotating the disk three times on the track to be detected.
以上述べたように、本発明はディスクの電気的欠陥検出
において、ある周波数で四き込み、その読み出し波形の
振幅値を連続した関数と考え、その関数の微分波形によ
り欠陥を判断するという、検出方式により、高速にかつ
従来の欠陥に加え、スパイクパルスの検出を可能とする
欠陥検出方式を、提供できるという効果がある。As described above, in detecting electrical defects in a disk, the present invention detects a defect by reading at a certain frequency, considering the amplitude value of the read waveform as a continuous function, and determining a defect based on the differential waveform of that function. This method has the effect of providing a defect detection method that can detect spike pulses in addition to conventional defects at high speed.
第１図は、本発明のディスク欠陥検出方式の動作チャー
トを示す図。
第２図は、従来のディスク欠陥検出方式の動作チャート
を示す図。
第３図（ａ）〜（ｉ）は、本発明の欠陥検出方式により
、欠陥と判断される様子を示す図である。
（ａ）・・・ミッシングパルスの読み出し波形を示す図
。
（ｂ）・・・ミッシングパルスの振幅値の連続信号を示
す図。
（ｃ）・・・ｂの微分波形を示す図。
（ｄ）・・・ホジティブモジュレーシ３ンの読み出し波
形を示す図。
（ｅ）・・・ホジティブモジュレーシｇ７の振幅値の連
続信号を示す図。
（ｆ）・・・ｅの微分波形を示す図。
＜ｇ＞・・・スパイクパルスの読み出し波形を示す図。
（ｈ）・・・スパイクパルスの振幅値の連続信号を示す
図。
（ｉ）・・・（ｈ）の微分波形を示す図。
以 上
出願人 セイコーエプソン株式会社
代理人 弁理士 最 上 務 他１名＼−FIG. 1 is a diagram showing an operation chart of the disk defect detection method of the present invention. FIG. 2 is a diagram showing an operation chart of a conventional disk defect detection method. FIGS. 3(a) to 3(i) are diagrams showing how a defect is determined by the defect detection method of the present invention. (a)...A diagram showing a readout waveform of a missing pulse. (b)...A diagram showing a continuous signal of the amplitude value of a missing pulse. (c)...A diagram showing the differential waveform of b. (d)...A diagram showing a readout waveform of positive modulation 3. (e)...A diagram showing a continuous signal of amplitude values of positive modulation g7. (f)...A diagram showing the differential waveform of e. <g>... A diagram showing a readout waveform of a spike pulse. (h)... A diagram showing a continuous signal of amplitude values of spike pulses. A diagram showing differential waveforms of (i)...(h). Applicant Seiko Epson Co., Ltd. Agent Patent Attorney Tsutomu Mogami and 1 other person
Claims (1)
き込み、その読み出し波形の振幅値を連続した関数と考
え、その関数の微分波形により欠陥を判断する事を特徴
とする、ディスク欠陥検出方式。In detecting electrical defects on disks, a disk defect detection method is characterized in that writing is performed at a certain frequency, the amplitude value of the read waveform is considered as a continuous function, and defects are determined based on the differential waveform of that function.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4496788A JPH01220185A (en) | 1988-02-26 | 1988-02-26 | Disk defect detection method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4496788A JPH01220185A (en) | 1988-02-26 | 1988-02-26 | Disk defect detection method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH01220185A true JPH01220185A (en) | 1989-09-01 |
Family
ID=12706249
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4496788A Pending JPH01220185A (en) | 1988-02-26 | 1988-02-26 | Disk defect detection method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01220185A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102290078A (en) * | 2010-06-09 | 2011-12-21 | 昭和电工株式会社 | Magnetic recording medium inspection method and manufacture method, control method of magnetic recording reproducing apparatus and magnetic recording reproducing apparatus |
-
1988
- 1988-02-26 JP JP4496788A patent/JPH01220185A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102290078A (en) * | 2010-06-09 | 2011-12-21 | 昭和电工株式会社 | Magnetic recording medium inspection method and manufacture method, control method of magnetic recording reproducing apparatus and magnetic recording reproducing apparatus |
| CN102290078B (en) * | 2010-06-09 | 2015-03-25 | 昭和电工株式会社 | Magnetic recording medium inspection method and manufacture method, control method of magnetic recording reproducing apparatus and magnetic recording reproducing apparatus |
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