JPH01224295A - Gas source molecular beam crystal growing apparatus - Google Patents

Gas source molecular beam crystal growing apparatus

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Publication number
JPH01224295A
JPH01224295A JP5020388A JP5020388A JPH01224295A JP H01224295 A JPH01224295 A JP H01224295A JP 5020388 A JP5020388 A JP 5020388A JP 5020388 A JP5020388 A JP 5020388A JP H01224295 A JPH01224295 A JP H01224295A
Authority
JP
Japan
Prior art keywords
gas
molecular beam
section
crystal growth
beam source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5020388A
Other languages
Japanese (ja)
Inventor
Junji Saito
齊藤 淳二
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
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Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP5020388A priority Critical patent/JPH01224295A/en
Publication of JPH01224295A publication Critical patent/JPH01224295A/en
Pending legal-status Critical Current

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  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)

Abstract

PURPOSE:To provide the title apparatus so designed that plural gases differing in decomposition temperature from each other made up of a metal hydride gas and an organometallic gas are put to mixed reaction followed by emission, thereby reducing contamination of impurities such as carbon into a crystal growth layer. CONSTITUTION:Firstly, the temperatures of a preheating section A, a thermal cracking section C and a low-temperature heating section B are brought to 300-400 deg.C, 800-900 deg.C, and 400-500 deg.C, respectively. Then, an AsH3 gas via the inlet of a main gas introduction tube 20 is heated at the section A and enters the section C where said gas is decomposed into As and hydrogen followed by entering the section B. In the section B, a triethylgallium gas intro duced via the inlet of a sub-gas introduction tube 21 is decomposed into Ga and ethyl group, said ethyl group is allowed to react with the As to form triethylarsenic, which is then emitted. From this molecular beam source cell, As molecule, Ga molecule, ethyl group and triethylarsenic are emitted, among them, the triethylarsenic little liberates carbon on the substrate, therefore, facili tating high-purity crystal growth of low carbon impurity concentration.

Description

【発明の詳細な説明】 [概要] ガスソース分子線結晶成長装置のうち、ガスを供給する
分子線源セルの新規な構成に関し、結晶成長層への炭素
などの不純物の混入を低減させることを目的とし、 分子線源セルの主ガス導入管に副ガス導入管を接続し、
主ガス導入管を複数の加熱帯に分割して、前記接続部よ
り原料ガスソースに近い側に配置した第1加熱帯を高温
度に加熱し、前記接続部より被成長基板に近い側に配置
した第2加熱帯を低温度に加熱して、金属水素化物ガス
を主ガス導入管より導入し、有機金属ガスを副ガス導入
管より導入して、分解温度の異なる複数のガスを混合反
応させて放射するように構成した分子線源セルを具備し
てなることを特徴とする。
[Detailed Description of the Invention] [Summary] Regarding a new configuration of a molecular beam source cell that supplies gas in a gas source molecular beam crystal growth apparatus, the present invention aims to reduce the incorporation of impurities such as carbon into the crystal growth layer. For the purpose, connect the auxiliary gas introduction pipe to the main gas introduction pipe of the molecular beam source cell,
The main gas introduction pipe is divided into a plurality of heating zones, and the first heating zone, which is located closer to the raw material gas source than the connection part, is heated to a high temperature and is placed closer to the growth substrate than the connection part. The second heating zone is heated to a low temperature, metal hydride gas is introduced through the main gas introduction pipe, organometallic gas is introduced through the auxiliary gas introduction pipe, and a plurality of gases with different decomposition temperatures are mixed and reacted. It is characterized by comprising a molecular beam source cell configured to emit light.

[産業上の利用分野] 本発明はガスソース分子線結晶成長装置に係り、特に結
晶成長室にガスを供給する分子線源セルの新規な構成に
関する。
[Industrial Application Field] The present invention relates to a gas source molecular beam crystal growth apparatus, and particularly to a novel configuration of a molecular beam source cell that supplies gas to a crystal growth chamber.

結晶基板に沿って半導体膜をエピタキシャル成長するエ
ピタキシー法(結晶成長法)は半導体製造の基礎技術で
あり、その注目技術として、最近、ガスソース分子線エ
ピタキシー法が開発されている。
The epitaxy method (crystal growth method) in which a semiconductor film is epitaxially grown along a crystal substrate is a basic technology for semiconductor manufacturing, and gas source molecular beam epitaxy has recently been developed as a notable technology.

しかし、このガスソース分子線エピタキシー法は化合物
ガスを熱分解させてエピタキシャル成長する方法である
から、結晶成長層へ不純物が混入し易く、その不純物混
入を出来るだけ少なくすることが要望されている。
However, since this gas source molecular beam epitaxy method is a method of epitaxial growth by thermally decomposing a compound gas, impurities are likely to be mixed into the crystal growth layer, and it is desired to reduce the mixing of impurities as much as possible.

[従来の技術] さて、ガスソース分子線エピタキシー法は、従来の分子
線エピタキシー(MBE)法における金属ソース源に代
ってガスソース源を用いるもので、例えば、GaAs 
(ガリウム砒素)層やAlGaAs (アルミガリウム
砒素)層を成長する場合、■族分子線源材料としてトリ
メチルガリウム(TMG ;Ga (CH3)3)、)
リエチルガリウム(TEG;Ga(C2H5)3)、)
リメチルアルミニウム(TMA ;Al (CH3) 
s ) 、  )リエチルアルミニウム(TEA ;A
t (C2H5) s )などのガスを用い、■族分子
線源材料としてアルシン(AsHa)などが用いられて
いる。
[Prior Art] Now, gas source molecular beam epitaxy uses a gas source instead of the metal source in conventional molecular beam epitaxy (MBE).
When growing a (gallium arsenide) layer or an AlGaAs (aluminum gallium arsenide) layer, trimethyl gallium (TMG; Ga (CH3)3), ) is used as a group ■ molecular beam source material.
ethyl gallium (TEG; Ga(C2H5)3), )
Remethylaluminum (TMA; Al (CH3)
s),) ethylaluminum (TEA;A
A gas such as t (C2H5) s ) is used, and arsine (AsHa) or the like is used as a group Ⅰ molecular beam source material.

このガスソース分子線結晶成長法は従来のMBE法より
も表面欠陥が低減できること、速い成長速度が容易に得
られることなどの利点があり、且つ、分子線領域でのガ
ス使用であるために、成長過程はMOCVD (有機金
属熱分解)法よりもMBE法に近く、ガス流の開閉によ
って非常に急峻なヘテロ界面が容易に形成でき、更に、
成長容器内の清浄な超高真空雰囲気を大気に曝すことな
くソースの交換ができて、工業生産上大きな利点がある
とされているものである。
This gas source molecular beam crystal growth method has advantages over the conventional MBE method, such as being able to reduce surface defects and easily achieving a high growth rate, and because it uses gas in the molecular beam region, The growth process is closer to the MBE method than to the MOCVD (metal-organic pyrolysis) method, and a very steep hetero-interface can be easily formed by opening and closing the gas flow.
This method is said to have a great advantage in industrial production because the source can be replaced without exposing the clean ultra-high vacuum atmosphere inside the growth container to the atmosphere.

第3図はそのガスソース分子線結晶成長をおこなう従来
の結晶成長装置を示しており、■は結晶成長室、2は基
板(被成長基板;ウェハー)、3は基板ホルダー、4は
ヒータ、5は分子線源セル。
Figure 3 shows a conventional crystal growth apparatus that performs gas source molecular beam crystal growth. is a molecular beam source cell.

6はバルブ、7は液体窒素シュラウド、8はゲートバル
ブである。図示のように、基板2は基板ホルダー3に保
持され、ヒータ4で加熱されて、例えば、基板2がGa
As基板の場合には600〜700℃に加熱される。且
つ、分子線源セルは複数個が設けられ、複数の分子線源
セルがウェハー2に対向して配置されている。
6 is a valve, 7 is a liquid nitrogen shroud, and 8 is a gate valve. As shown in the figure, the substrate 2 is held by a substrate holder 3 and heated by a heater 4, so that, for example, the substrate 2 is made of Ga.
In the case of an As substrate, it is heated to 600 to 700°C. Further, a plurality of molecular beam source cells are provided, and the plurality of molecular beam source cells are arranged facing the wafer 2.

第4図(a)、 (b)は従来の分子線源セルの断面図
を示し、同図(aJは高温分解ガス用、同図(b)は低
温分解ガス用である。第4図(a)に示す高温分解ガス
用分子線源セルは、例えば、V族ガスのアルシン(As
)13  ;金属水素化物ガス)などに用いられ、80
0〜900℃に加熱されて、AsとH2とに分解してA
sを基板に向かって放射するセルである。図中、11は
ガス導入管、 12はTa Cタンタル)製のヒータ。
FIGS. 4(a) and 4(b) show cross-sectional views of conventional molecular beam source cells. The molecular beam source cell for high-temperature decomposition gas shown in a) uses, for example, arsine (As), a group V gas.
) 13; metal hydride gas), etc., and 80
When heated to 0 to 900℃, it decomposes into As and H2, forming A.
This is a cell that emits s toward the substrate. In the figure, 11 is a gas introduction pipe, and 12 is a heater made of Ta (Tantalum).

13は真空フランジ、14は熱遮蔽板、15はPBN 
(焼結窒化硼素)板で、PBN15を有する出口部分に
高温に加熱されてガスを分解する熱クラッキング部Cが
設けられている。
13 is a vacuum flange, 14 is a heat shield plate, 15 is PBN
A (sintered boron nitride) plate is provided with a thermal cracking section C that is heated to a high temperature and decomposes gas at the outlet portion having PBN15.

また、第4図(b)に示す低温分解ガス用分子線源セル
は、■族ガスの分解し易いTMGやTMAなどの有機金
属ガスなどに用いられ、セル内は凝縮しない程度の50
〜60℃に加熱されて放射するセルである。図中の記号
は第4図(a)と同一部位に同一記号が付けであるが、
この低温分解ガス用熱りラブキング部Cが設けられてい
ない。なお、これらの分子線源セルはガス導入管11が
直径174インチ。
In addition, the molecular beam source cell for low-temperature decomposition gases shown in Figure 4(b) is used for organometallic gases such as TMG and TMA, which are easily decomposed group gases.
It is a cell that is heated to ~60°C and emits radiation. The symbols in the figure are the same parts as in Figure 4(a), but
This hot rubbing section C for low-temperature decomposition gas is not provided. Note that the gas introduction pipe 11 of these molecular beam source cells has a diameter of 174 inches.

長さ約30csの石英製で、ガス導入管11の先端とウ
ェハー2との間隔が比較的に短く構成されている。
It is made of quartz and has a length of about 30 cs, and the distance between the tip of the gas introduction tube 11 and the wafer 2 is relatively short.

[発明が解決しようとする課題] ところが、上記のようなガスソース分子線エピタキシャ
ル成長装置を用いて、例えば、GaAs層やAlGaA
s層を成長する場合には、GaソースとしてTMGやT
ECを用い、Asソースとしてアルシンを用いており、
且つ、■属元素のアルシンは約900℃に加熱した高温
用分子線源セル(第4図(a))から放出し、■属元素
のTMGは約50〜60℃の低温用分子線源セル(第4
図(b))から放出されるが、これはアルシンが600
〜700℃に加熱したGaAs基板上で分解されないた
め、予め分子線源セル内で加熱分解させて単体のAs分
子として放射するものである。
[Problems to be Solved by the Invention] However, using the gas source molecular beam epitaxial growth apparatus as described above, it is difficult to grow, for example, a GaAs layer or an AlGaA layer.
When growing the s-layer, TMG or T is used as a Ga source.
EC is used and arsine is used as the As source.
In addition, arsine, a group II element, is emitted from a high-temperature molecular beam source cell heated to about 900°C (Fig. 4 (a)), and TMG, a group II element, is emitted from a low-temperature molecular beam source cell heated to about 50 to 60°C. (4th
Figure (b)), which is released from arsine at 600
Since it is not decomposed on a GaAs substrate heated to ~700°C, it is thermally decomposed in advance in a molecular beam source cell and emitted as a single As molecule.

一方、TMGは低温度で熱分解できるから、分子線源セ
ル内では熱分解させず、分子線源セルの管壁に原料ガス
が付着しない程度(50〜60℃)に加熱して、加熱し
たGaAs基板上で分解して被着させている。
On the other hand, since TMG can be thermally decomposed at low temperatures, it was not thermally decomposed in the molecular beam source cell, but was heated to a temperature (50 to 60°C) that would prevent the source gas from adhering to the tube wall of the molecular beam source cell. It is disassembled and deposited on a GaAs substrate.

しかし、このように、GaAs基板上で熱分解させると
、Ga分子を分離したメチル基(CH3)やエチル基(
C2H!5)がそのまま蒸発せずに、その基が分解して
遊離した炭素が結晶成長層に混入し、不純物となって結
晶成長層の純度を低下させる欠点がある。例えば、甚だ
しい場合には炭素(C)濃度が1011?/−程度に達
してアクセプタ(p型)として働(。
However, when thermally decomposed on a GaAs substrate, methyl groups (CH3) and ethyl groups (CH3) and ethyl groups (
C2H! There is a drawback that 5) does not evaporate as it is, but its groups decompose and liberated carbon mixes into the crystal growth layer, becoming an impurity and reducing the purity of the crystal growth layer. For example, in extreme cases, the carbon (C) concentration may be 1011? /- level and acts as an acceptor (p type) (.

本発明はこのような結晶成長層への炭素などの不純物の
混入を低減させることを目的とした分子線源セルを具備
したガスソース分子線結晶成長装置を提案するものであ
る。
The present invention proposes a gas source molecular beam crystal growth apparatus equipped with a molecular beam source cell for the purpose of reducing the incorporation of impurities such as carbon into the crystal growth layer.

[課題を解決するための手段] その目的は、分子線源セルの主ガス導入管に副ガス導入
管を接続し、主ガス導入管を複数の加熱帯に分割して、
前記接続部より原料ガスソースに近い側に配置した第1
加熱帯を高温度に加熱し、前記接続部より被成長基板に
近い側に配置した第2加熱帯を低温度に加熱して、金属
水素化物ガスを主ガス導入管より導入し、有機金属ガス
を副ガス導入管より導入して、分解温度の異なる複数の
ガスを混合反応させて放射するように構成した分子線源
セルを具備しているガスソース分子線結晶成長装置によ
って達成される。
[Means for solving the problem] The purpose is to connect an auxiliary gas introduction pipe to the main gas introduction pipe of the molecular beam source cell, divide the main gas introduction pipe into a plurality of heating zones,
a first disposed closer to the raw material gas source than the connection portion;
A heating zone is heated to a high temperature, a second heating zone located closer to the growth substrate than the connection part is heated to a lower temperature, a metal hydride gas is introduced from the main gas introduction pipe, and an organometallic gas is introduced. This is achieved by a gas source molecular beam crystal growth apparatus equipped with a molecular beam source cell configured to introduce a plurality of gases with different decomposition temperatures through an auxiliary gas introduction pipe, cause a mixture reaction, and radiate the mixture.

[作用] 即ち、本発明は、金属水素化物ガスを分解する高温分解
ガス用分子線源セルと有機金属ガスを分解する低温分解
ガス用分子線源セルとを併合した構造の分子源セルに構
成し、セル内で有機金属ガスを金属分子とメチル基また
はエチル基とに分解させ、更に、このメチル基またはエ
チル基と金属水素化物ガスから分解した金属分子と反応
させ、その金属化合物として放射する。そうすると、基
板上で炭素が遊離し難く、炭素の混入を減少させること
ができる。
[Function] That is, the present invention has a molecular beam source cell having a structure that combines a molecular beam source cell for high-temperature decomposition gas that decomposes metal hydride gas and a molecular beam source cell for low-temperature decomposition gas that decomposes organometallic gas. Then, the organometallic gas is decomposed into metal molecules and methyl or ethyl groups in the cell, and then this methyl or ethyl group is reacted with the metal molecules decomposed from the metal hydride gas, and the metal compound is emitted. . This makes it difficult for carbon to be liberated on the substrate, making it possible to reduce the amount of carbon mixed in.

なお、メチル基またはエチル基とAsとが反応し易いこ
とは文献によって実験的に証明されていて、Japan
ese Journal of Applied Ph
ysics 26(3)+1987、 pp419〜4
22に記載されている。
In addition, it has been experimentally proven in the literature that methyl groups or ethyl groups react easily with As, and
ese Journal of Applied Ph.
ysics 26(3)+1987, pp419-4
It is described in 22.

[実施例] 以下1図面を参照して実施例によって詳細に説明する。[Example] An embodiment will be described in detail below with reference to one drawing.

第1図は本発明にかかる分子線源セルの断面図を示して
おり、20は主ガス導入管、21は副ガス導入管、22
はTa製のヒータ、23は真空フランジ、24は熱遮蔽
板、25はPBN板で、Cは熱タラフキング部、Aは予
備加熱部、Bは低温加熱部である。
FIG. 1 shows a cross-sectional view of a molecular beam source cell according to the present invention, in which 20 is a main gas introduction pipe, 21 is a sub-gas introduction pipe, and 22 is a sectional view of a molecular beam source cell according to the present invention.
23 is a heater made of Ta, 23 is a vacuum flange, 24 is a heat shielding plate, 25 is a PBN plate, C is a hot trough king part, A is a preheating part, and B is a low temperature heating part.

ガス導入管20.21の原料ガスソースに近いガス入口
26は直径174インチの細い石英管で構成し、予備加
熱部Aでガス導入管を拡げて直径1インチ程度とし、そ
の管径の部分に熱グラフキング部C9低温加熱部Bを配
設している。なお、第1加熱帯とは予備加熱部Aおよび
熱クラブキング部Cのことを意味し、第2加熱帯とは低
温加熱部Bのことを意味している。
The gas inlet 26 of the gas inlet pipe 20, 21, which is close to the raw material gas source, is composed of a thin quartz tube with a diameter of 174 inches.The gas inlet pipe is expanded to a diameter of about 1 inch in the preheating section A, and a portion of that pipe diameter is A thermal graphing section C9 and a low temperature heating section B are provided. Note that the first heating zone means the preheating section A and the thermal clubbing section C, and the second heating zone means the low temperature heating section B.

ヒータ22は予備加熱部A、熱タラツキング部C5低温
加熱部Bに三分割され、熱タラフキング部CにはPBN
板25が配置されて、PBN板は複数の円板を一定間隔
(10鶴程度)で配置し、その各円板にはジグザクに孔
が設けてあり、その円板に当って原料ガスが効率良く分
解され、孔を通って先端27から分子が放射される。ま
た、熱遮蔽板24はTa (金属)とPBN (絶縁体
)とで構成されて、保温を目的としたものである。分子
線源セル全体の長さは30〜40cnである。
The heater 22 is divided into three parts: a preheating section A, a thermal racking section C, and a low temperature heating section B.
The PBN board has a plurality of discs arranged at regular intervals (approximately 10 cranes), each disc has holes in a zigzag pattern, and the material gas hits the discs efficiently. It is well decomposed and the molecules are emitted from the tip 27 through the pores. Further, the heat shield plate 24 is made of Ta (metal) and PBN (insulator), and is intended for heat retention. The length of the entire molecular beam source cell is 30-40 cn.

このような分子線源セルを用いて、アルシン(AsHa
)とトリエチルガリウム(TEG)を熱分解させて放射
する例を説明すると、予備加熱部Aの温度を300〜4
00℃、熱タラツキング部Cの温度を800〜900℃
、低温加熱部Bの温度を400〜500℃程度にする。
Using such a molecular beam source cell, arsine (AsHa
) and triethyl gallium (TEG) are thermally decomposed and radiated.
00℃, temperature of thermal racking part C is 800~900℃
, the temperature of the low-temperature heating section B is set to about 400 to 500°C.

そうすると、主ガス導入管20のガス入口から流入した
AsH3ガスが予備加熱部Aで加熱されて熱クランキン
グ部Cに入り、熱りランキング部CでAsと水素とに分
解されて低温加熱部Bに入る。低温加熱部Bでは副ガス
導入管21のガス入口から流入したTEGガスがGaと
エチル基に分解され、そのエチル基とAsとが反応して
トリエチル砒素となって放射される。即ち、この分子線
源セルからはAs分子、 Ga分子、エチル基(未反応
のもの)およびトリエチル砒素が放射されるが、トリエ
チル砒素は基板上で炭素を遊離することが少なく、従っ
て、炭素不純物濃度の低い高純度な結晶成長層の成長を
助長する。
Then, the AsH3 gas flowing in from the gas inlet of the main gas introduction pipe 20 is heated in the preheating section A and enters the thermal cranking section C, where it is decomposed into As and hydrogen, and is decomposed into low temperature heating section B. to go into. In the low-temperature heating section B, the TEG gas flowing in from the gas inlet of the auxiliary gas introduction pipe 21 is decomposed into Ga and ethyl groups, and the ethyl groups react with As to become triethyl arsenic, which is emitted. That is, As molecules, Ga molecules, ethyl groups (unreacted), and triethyl arsenic are emitted from this molecular beam source cell, but triethyl arsenic does not liberate much carbon on the substrate, and therefore does not contain carbon impurities. Promotes growth of a highly pure crystal growth layer with low concentration.

第2図は第1図に示す分子線源セルを設けた本発明にか
かるガスソース分子線結晶成長装置の例を示しており、
第3図と同一部位には同一記号を付けである。その他の
51.52は本発明の特徴とする分子線源セル、 53
.54は従来の部分線源セルを示している。
FIG. 2 shows an example of a gas source molecular beam crystal growth apparatus according to the present invention equipped with the molecular beam source cell shown in FIG.
The same parts as in FIG. 3 are given the same symbols. The other 51.52 is a molecular beam source cell that is a feature of the present invention, 53
.. 54 indicates a conventional partial source cell.

この第2図に示すガスソース分子線結晶成長装置を使用
し、51をAsH3とTEGとを導入するセル、53を
AsH3のみを導入するセル、54をTEGのみを導入
するセルとして、真空度1O−sTorr程度の結晶成
長室内でGaAs基板を600℃に加熱して、従来の分
子線源セル53.54を用いてGaAs層を成長し、ま
た、本発明にかかる分子線源セル51を用いてGaAs
層を成長した。その基板試料のGaAs層のホール測定
をおこなって、キャリア濃度を調べた結果、本発明にか
かる分子線源セルを用いると、単位体積当りの不純物濃
度を1桁ないし2桁減少させることができた。従って、
本発明にかかる分子線源セルを設けた結晶成長装置は、
高純度な結晶成長層の形成に有効である。
Using the gas source molecular beam crystal growth apparatus shown in FIG. 2, 51 is a cell into which AsH3 and TEG are introduced, 53 is a cell into which only AsH3 is introduced, and 54 is a cell into which only TEG is introduced. A GaAs substrate is heated to 600° C. in a crystal growth chamber at about -s Torr, and a GaAs layer is grown using a conventional molecular beam source cell 53, 54, and a molecular beam source cell 51 according to the present invention is used. GaAs
Grew layers. The carrier concentration was investigated by Hall measurements of the GaAs layer of the substrate sample, and the results showed that the impurity concentration per unit volume could be reduced by one to two orders of magnitude by using the molecular beam source cell according to the present invention. . Therefore,
A crystal growth apparatus equipped with a molecular beam source cell according to the present invention includes:
It is effective in forming a highly pure crystal growth layer.

上記はAsH3とTEGを熱分解させる実施例で説明し
たが、■族としてPH3(ホスフィン)。
The above was explained using an example in which AsH3 and TEG were thermally decomposed, and PH3 (phosphine) was used as the group ①.

■族としてTMG、TEA、TMA、TElなどを使用
することもでき、高純度なAlGaAs層をも成長でき
ることは勿論である。
It is also possible to use TMG, TEA, TMA, TEL, etc. as the group (2), and it goes without saying that a highly pure AlGaAs layer can also be grown.

[発明の効果] 以上の説明から明らかなように、本発明にかかる分子線
源セルを設けたガスソース分子線結晶成長装置によれば
、高純度な結晶成長層が得られて、半導体装置の性能向
上に顕著に貢献するものである。
[Effects of the Invention] As is clear from the above description, according to the gas source molecular beam crystal growth apparatus provided with the molecular beam source cell according to the present invention, a highly pure crystal growth layer can be obtained, and it is possible to improve the performance of semiconductor devices. This significantly contributes to improved performance.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明にかかる分子線源セルの断面図、第2図
は本発明にかかるガスソース分子線結晶成長装置を示す
図、 第3図は従来のガスソース分子線結晶成長装置を示す図
、 第4図(a)、 (b)は従来の分子線源セルの断面図
である。 図において、 Aは予備加熱部、   Bは低温加熱部、Cは熱クラッ
キング部、 1は結晶成長室、   2は基板、 3は基板ホルダー、   4はヒータ、5は分子線源セ
ル、  6はバルブ、 7は液体窒素シュラウド8はゲートバルブ、20は主ガ
ス導入管、  21は副ガス導入管、22はTa製ヒー
タ、   23は真空フランジ、24は熱遮蔽板、  
  25はPBN板、26はガス入口、    27は
ガス導入管の先端、51、52は本発明にかかる分子線
源セル、53、54は従来の分子線源セル を示している。
FIG. 1 is a cross-sectional view of a molecular beam source cell according to the present invention, FIG. 2 is a diagram showing a gas source molecular beam crystal growth apparatus according to the present invention, and FIG. 3 is a diagram showing a conventional gas source molecular beam crystal growth apparatus. Figures 4(a) and 4(b) are cross-sectional views of conventional molecular beam source cells. In the figure, A is a preheating section, B is a low temperature heating section, C is a thermal cracking section, 1 is a crystal growth chamber, 2 is a substrate, 3 is a substrate holder, 4 is a heater, 5 is a molecular beam source cell, 6 is a valve , 7 is a liquid nitrogen shroud, 8 is a gate valve, 20 is a main gas introduction pipe, 21 is a sub-gas introduction pipe, 22 is a Ta heater, 23 is a vacuum flange, 24 is a heat shield plate,
25 is a PBN plate, 26 is a gas inlet, 27 is a tip of a gas introduction tube, 51 and 52 are molecular beam source cells according to the present invention, and 53 and 54 are conventional molecular beam source cells.

Claims (1)

【特許請求の範囲】[Claims]  分子線源セルの主ガス導入管に副ガス導入管を接続し
、主ガス導入管を複数の加熱帯に分割して、前記接続部
より原料ガスソースに近い側に配置した第1加熱帯を高
温度に加熱し、前記接続部より被成長基板に近い側に配
置した第2加熱帯を低温度に加熱して、金属水素化物ガ
スを主ガス導入管より導入し、有機金属ガスを副ガス導
入管より導入して、分解温度の異なる複数のガスを混合
反応させて放射するように構成した分子線源セルを具備
してなることを特徴とするガスソース分子線結晶成長装
置。
A secondary gas introduction pipe is connected to the main gas introduction pipe of the molecular beam source cell, the main gas introduction pipe is divided into a plurality of heating zones, and a first heating zone is arranged closer to the raw material gas source than the connection part. A second heating zone placed closer to the growth substrate than the connection part is heated to a high temperature, and a metal hydride gas is introduced from the main gas introduction pipe, and an organometallic gas is introduced into the subgas. 1. A gas source molecular beam crystal growth apparatus comprising a molecular beam source cell configured to introduce a plurality of gases through an introduction tube, mix and react a plurality of gases having different decomposition temperatures, and emit radiation.
JP5020388A 1988-03-02 1988-03-02 Gas source molecular beam crystal growing apparatus Pending JPH01224295A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5020388A JPH01224295A (en) 1988-03-02 1988-03-02 Gas source molecular beam crystal growing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5020388A JPH01224295A (en) 1988-03-02 1988-03-02 Gas source molecular beam crystal growing apparatus

Publications (1)

Publication Number Publication Date
JPH01224295A true JPH01224295A (en) 1989-09-07

Family

ID=12852560

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5020388A Pending JPH01224295A (en) 1988-03-02 1988-03-02 Gas source molecular beam crystal growing apparatus

Country Status (1)

Country Link
JP (1) JPH01224295A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04228494A (en) * 1990-04-19 1992-08-18 Cselt Spa (Cent Stud E Lab Telecomun) Steam source for epitaxial deposition equipment
US5222074A (en) * 1990-06-05 1993-06-22 Matsushita Electric Industrial Co., Ltd. Thermal decomposition cell

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04228494A (en) * 1990-04-19 1992-08-18 Cselt Spa (Cent Stud E Lab Telecomun) Steam source for epitaxial deposition equipment
US5222074A (en) * 1990-06-05 1993-06-22 Matsushita Electric Industrial Co., Ltd. Thermal decomposition cell

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