JPH012316A - Plasma CVD equipment - Google Patents
Plasma CVD equipmentInfo
- Publication number
- JPH012316A JPH012316A JP62-156517A JP15651787A JPH012316A JP H012316 A JPH012316 A JP H012316A JP 15651787 A JP15651787 A JP 15651787A JP H012316 A JPH012316 A JP H012316A
- Authority
- JP
- Japan
- Prior art keywords
- valve
- reaction gas
- airtight container
- plasma cvd
- pressure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】 [発明の目的] (産業上の利用分野) 本発明はプラズマCVD装置に関する。[Detailed description of the invention] [Purpose of the invention] (Industrial application field) The present invention relates to a plasma CVD apparatus.
(従来の技術)
半導体装置の製造工程における薄膜形成では一般にプラ
ズマCVD法が適用されている。プラズマCVD法には
高周波放電によるプラズマ反応を応用したものと、マイ
クロ波放電によるプラズマ反応を応用したものがあるが
、安定性の面から前者が適用されている。第1図は上記
前者の製造装置の一例で、気密容器(1)を有し、その
両側部(2a) 、(2b)はトンネル(3)と気密に
連結されている。上記両側部(2a) 、(2b)は開
閉自在になり、開の時には気密容器(1)がトンネル(
3)の一部を構成する。したがって、これら両者の底部
には案内レール(図示せず)が敷設されている。また、
気密容器(1)の内部には電極部(4)がガス供給管(
5a)、(5b)によって吊下されている。この電極部
(4)は第2図に示すように仕切部(6)によって相隣
接する二の空間部(7a) 、 (7b)を形成する本
体(8)と、これら空間部を閉塞し複数の流路(9)を
穿設した中間拡散板(loa) 、 (10b) (図
示せず)と、これら中間拡散板に絶縁体(11a) 、
(1lb) (図示せず)を介して取付けられ上記流路
(9)より密に穿設された流路(12)を有しかつ電極
となる拡散板(13a) 、 (13b) (図示せず
)とで構成されている。上記図示せぬ案内レールにはカ
ート(14)が載架されている。このカート(14)に
は拡散板(13a) 、 (13b)に所定の間隔をお
いて対峙するようにホルダー(15a) 、 (15b
)が相対向して立設されている。これらホルダーには矩
形状に切欠された取付部(lea) 、 (16b)が
形成され、裏板(17)を介して基板(18)が取付具
(■9)によって保持されている。一方、ガス供給管(
5a) 、(5b)はそれぞれ空間部(7a) 、(7
b)に嵌入されているとともに、開閉弁(20)に共通
に接続されている。この開閉弁には他の配管系をとうし
て3個の流量調節器(21)、(22)、(23)が並
列に接続され、これらにはそれぞれ3種の反応ガス供給
器(24) 、 (25) 、 (2B)が接続されて
いる。なお、拡散板(13a) 、 (13b)は高周
波電源(図示せず)に接続され、また気密容器(1)に
は別の配管系をとうして高性能な真空ポンプ(30)が
接続されている。(Prior Art) Plasma CVD is generally applied to thin film formation in the manufacturing process of semiconductor devices. There are two types of plasma CVD methods: one that applies a plasma reaction using high-frequency discharge and the other that uses a plasma reaction that uses microwave discharge. The former is used from the standpoint of stability. FIG. 1 shows an example of the former manufacturing apparatus, which has an airtight container (1), both sides (2a) and (2b) of which are airtightly connected to a tunnel (3). The above-mentioned both sides (2a) and (2b) can be opened and closed freely, and when opened, the airtight container (1) is moved into the tunnel (
3). Therefore, guide rails (not shown) are laid at the bottoms of both. Also,
Inside the airtight container (1), an electrode part (4) is connected to a gas supply pipe (
5a) and (5b). As shown in FIG. 2, this electrode part (4) has a main body (8) that forms two adjacent spaces (7a) and (7b) by a partition part (6), and a plurality of parts that close these spaces and Intermediate diffusion plates (LOA), (10b) (not shown) in which flow paths (9) are bored, and insulators (11a),
Diffusion plates (13a) and (13b) (not shown), which are attached through (1lb) (not shown) and have flow paths (12) more densely drilled than the flow path (9), and serve as electrodes. It consists of A cart (14) is mounted on the guide rail (not shown). This cart (14) has holders (15a) and (15b) facing the diffusion plates (13a) and (13b) at a predetermined distance.
) are erected facing each other. These holders are formed with rectangularly cut mounting portions (lea) and (16b), and the substrate (18) is held by a mounting tool (■9) via a back plate (17). On the other hand, the gas supply pipe (
5a) and (5b) are space parts (7a) and (7
b) and is commonly connected to the on-off valve (20). Three flow rate regulators (21), (22), and (23) are connected in parallel to this on-off valve via other piping systems, and each of these has three types of reaction gas supply devices (24). , (25) and (2B) are connected. The diffusion plates (13a) and (13b) are connected to a high frequency power source (not shown), and a high-performance vacuum pump (30) is connected to the airtight container (1) through another piping system. ing.
以上の構成で、基板(18)を保持したカート(14)
が気密容器(1)内に入り、両側部(2a) 、(2b
)が閉じられた後気密容器(1)は真空ポンプ(30)
によってlo−4乃至10 Torr程度に減圧される
。次に開閉弁(20)が開かれ所定の混合比にされた3
種の補助ガスを気密容器(1)内を0.4Torr程度
になるまで供給した後、拡散板(13a) 、 (13
b)に高周波電流を所定時間印加して基板(18)に薄
膜形成する。上記印加中はガス供給管(5a) 、 (
5b)から所定量反応ガスを供給するとともに、真空ポ
ンプを作動して上記供給されたガス量を排気する。With the above configuration, the cart (14) holding the board (18)
enters the airtight container (1), and both sides (2a) and (2b
) is closed, the airtight container (1) is moved to a vacuum pump (30)
The pressure is reduced to about lo-4 to 10 Torr. Next, the on-off valve (20) was opened and the predetermined mixture ratio was set to 3.
After supplying seed auxiliary gas to the inside of the airtight container (1) until the pressure reaches about 0.4 Torr, the diffusion plates (13a), (13
b) A high frequency current is applied for a predetermined period of time to form a thin film on the substrate (18). During the above application, the gas supply pipe (5a), (
A predetermined amount of reaction gas is supplied from step 5b), and the vacuum pump is operated to exhaust the supplied gas amount.
(発明が解決しようとする問題点)
基板に薄膜が形成されるとともに、基板以外にも膜が形
成される。この膜のうち、流路(9)、(12)に形成
された膜が次の様な障害を引起こしていた。すなわち、
拡散板等は定位置に固定されているため、生産が進むに
つれて膜は徐々に堆積し剥がれやすい状態となっている
。したがって、上記のように高真空時に導入された反応
ガスは急速度で流路(9) 、 (12)を通過するの
で、上記堆積状態にある膜がその勢いで脱落し、対峙し
ている基板(18)にごみとして付着する。この付着し
た基板はいうまでもなく不良品として排除されていた。(Problems to be Solved by the Invention) A thin film is formed on a substrate, and a film is also formed on a surface other than the substrate. Among these films, the films formed in the channels (9) and (12) caused the following problems. That is,
Since the diffuser plate and the like are fixed in place, the film gradually accumulates as production progresses, making it easy to peel off. Therefore, as mentioned above, the reactant gas introduced in a high vacuum passes through the channels (9) and (12) at a rapid rate, so that the film in the deposited state falls off with its momentum, and the opposing substrate (18) as dust. Needless to say, this adhered substrate was rejected as a defective product.
本発明は上記の事情に鑑みてなされたもので、流路に形
成された膜が脱落しないように反応ガスを供給する装置
を提供することを目的とする。The present invention has been made in view of the above circumstances, and an object of the present invention is to provide an apparatus for supplying a reaction gas so that a film formed in a flow path does not fall off.
[発明の構成]
(問題点を解決するための手段)
反応ガスを導入する空間部を有しこの導入された反応ガ
スを上記空間部外へ拡散する拡散孔を形成した電極部と
成膜処理を施す基板を上記拡散孔に対峙させて取着する
ホルダーと上記空間部に反応ガスを開閉バルブを介して
供給するガス供給装置と上記電極部とホルダーとを収容
する気密容器とこの気密容器内を減圧する減圧装置と上
記電極部に放電を生じさせる電源部とを備えたプラズマ
CVD装置において、上記開閉バルブとガス供給装置間
の配管から分岐し調圧用バルブを介して上記気密容器内
に反応ガスを供給する手段と、上記開閉バルブと調圧用
バルブのどちらか一方を開閉する制御部とを儲けた構成
にしたものである。[Structure of the Invention] (Means for Solving the Problems) An electrode portion having a space for introducing a reaction gas and forming a diffusion hole for diffusing the introduced reaction gas outside the space, and a film forming process. A holder for attaching a substrate to be subjected to the reaction so as to face the diffusion hole, a gas supply device for supplying a reaction gas to the space via an on-off valve, an airtight container for housing the electrode section and the holder, and an airtight container for accommodating the electrode section and the holder. In a plasma CVD apparatus equipped with a pressure reducing device that reduces the pressure of the gas and a power source that generates discharge in the electrode section, a plasma CVD device that branches from the piping between the opening/closing valve and the gas supply device and enters the airtight container via a pressure regulating valve. This configuration is advantageous in that it includes a means for supplying a reaction gas and a control section that opens and closes either the opening/closing valve or the pressure regulating valve.
(作用)
高真空時におけるガスの供給が基板表面と関係のない部
所に供給され、供給後の調圧された状態で定量的にガス
を流路から供給するようにしたので、流路におけるガス
の勢いは弱まり膜を脱落させることがなくなった。(Function) Gas is supplied to parts unrelated to the substrate surface during high vacuum, and the gas is quantitatively supplied from the flow channel in a pressure-regulated state after supply, so that The force of the gas weakened and the film no longer fell off.
(実施例) 以下、実施例を示す図面に基づいて本発明を説明する。(Example) EMBODIMENT OF THE INVENTION Hereinafter, this invention will be explained based on drawing which shows an Example.
なお、第2図と共通する部分には同一符号を付して説明
は省略する。すなわち、第1図に示すように、従来の装
置である第2図と異なる点は、ホルダー(15a) 、
(15b)の裏面側に一対の調圧用の供給ノズル(3
5a) 、 (35b)を反応ガスが裏板(17)の近
傍に吹き出すように設けたことにある。Note that parts common to those in FIG. 2 are denoted by the same reference numerals, and explanations thereof will be omitted. That is, as shown in FIG. 1, the difference from the conventional device shown in FIG. 2 is that the holder (15a),
(15b) has a pair of supply nozzles (3
5a) and (35b) are provided so that the reaction gas is blown out near the back plate (17).
これら供給ノズルは開閉弁(20)と流量調節器(21
)、 (22) 、 (23)との間の配管系から分岐
した分岐管(3B)に共通に接続されている。分岐管(
36)の中途部には電磁弁(37)が接続されている。These supply nozzles include an on-off valve (20) and a flow rate regulator (21).
), (22), and (23) are commonly connected to a branch pipe (3B) branched from the piping system between them. Branch pipe (
A solenoid valve (37) is connected to the middle part of 36).
この電磁弁(37)は気密容器(1)内に設けられ、設
定された所定圧を電気信号に変換された信号を入力して
制御信号を出力する制御部(39)によって開閉動作さ
れるようになっている。一方、開閉弁(20)は電磁弁
(37)が閉のときにおける成膜形成時のみ開動作され
るようになりでいる。This solenoid valve (37) is provided in the airtight container (1), and is opened and closed by a control unit (39) that inputs a signal converted from a set predetermined pressure into an electric signal and outputs a control signal. It has become. On the other hand, the on-off valve (20) is opened only during film formation when the solenoid valve (37) is closed.
次に、上記構成による薄膜形成について説明する。真空
ポンプ(30)によって10 乃至10”−5TOR
R程度に減圧するまでの過程は上記従来例と同様である
が、この圧力に減圧後、制御部(39)からの信号で電
磁弁(37)が開き反応ガスが供給ノズル(35a)
。Next, thin film formation using the above configuration will be explained. 10 to 10”-5TOR by vacuum pump (30)
The process until the pressure is reduced to about R is the same as in the conventional example, but after the pressure is reduced to this pressure, the solenoid valve (37) is opened in response to a signal from the control section (39), and the reaction gas is supplied to the supply nozzle (35a).
.
(35b)からのみ気密容器(1)内に供給される。こ
こで、圧力検出器(38)は予め1o−1Torrで信
号を発するように設定しておけば、この圧力に達した時
点で電磁弁(37)が閉じ、供給弁(20)が開くとと
もに、真空ポンプ(30)が作動して所定量反応ガスが
流路(9)、(12)から供給されその供給量分排気さ
れる。上記供給および排気が所定時間続けられ基板(1
8)に対し成膜が形成される。(35b) is supplied into the airtight container (1) only. Here, if the pressure detector (38) is set in advance to emit a signal at 10-1 Torr, the solenoid valve (37) will close when this pressure is reached, and the supply valve (20) will open. The vacuum pump (30) is operated to supply a predetermined amount of reaction gas from the channels (9) and (12), and exhaust the supplied amount. The above supply and exhaust are continued for a predetermined time and the substrate (1
A film is formed for 8).
なお、上記実施例では供給ノズル(35a) 、 (3
5b)の吹出口が裏板(17)の近くに成るように設け
られたが、これに限定されることなく他の部所に設置し
てもよい。In addition, in the above embodiment, the supply nozzles (35a) and (3
Although the air outlet 5b) was provided near the back plate (17), it is not limited thereto and may be installed at other locations.
[発明の効果]
高真空時から低真空時に至る調圧の間、反応ガスを拡散
板すなわち、膜が形成された流路を通して基板に直接噴
射せずに基板の膜形成に関係の無い部所に反応ガスを供
給するようにしたので、流路における膜の脱落現象はな
くなり、したがって脱落した膜がごみとして付着したま
ま、薄膜が形成された従来の問題は解消され、清浄状態
でがつ均一に成膜がなされた。[Effects of the Invention] During pressure adjustment from high vacuum to low vacuum, the reaction gas is not directly injected onto the substrate through a diffusion plate, that is, a flow path in which a film is formed, but instead is sprayed onto parts unrelated to film formation on the substrate. Since the reaction gas is supplied to the flow path, the phenomenon of film falling off in the flow path is eliminated, and the conventional problem of forming a thin film while the fallen film remains attached as dust is solved, and the film is uniformly formed in a clean state. The film was deposited on
第1図は本発明の実施例を示す構成図、第2図は従来例
を示す構成図、第3図は電極部の断面図である。
(1) ・・・気密容器
(4) ・・・電極部
(5a) 、 (5b)・・・ガス供給管(9)、(1
2)・・・流路
(15a)、(15b)・・φホルダー(20)・・・
開閉弁
(35a) 、 (35b)供給ノズル(37)・・・
電磁弁FIG. 1 is a block diagram showing an embodiment of the present invention, FIG. 2 is a block diagram showing a conventional example, and FIG. 3 is a sectional view of an electrode section. (1) ... Airtight container (4) ... Electrode part (5a), (5b) ... Gas supply pipe (9), (1
2)...Flow path (15a), (15b)...φ holder (20)...
On-off valve (35a), (35b) supply nozzle (37)...
solenoid valve
Claims (1)
ガスを上記空間部外へ拡散する拡散孔を形成した電極部
と成膜処理を施す基板を上記拡散孔に対峙させて取着す
るホルダーと上記空間部に反応ガスを開閉バルブを介し
て供給するガス供給装置と上記電極部とホルダーとを収
容する気密容器とこの気密容器内を減圧する減圧装置と
上記電極部に放電を生じさせる電源部とを備えたプラズ
マCVD装置において、上記開閉バルブとガス供給装置
間の配管から分岐し調圧用バルブを介して上記気密容器
内に反応ガスを供給する手段と、上記開閉バルブと調圧
用バルブのどちらか一方を開閉する制御部とを設けたこ
とを特徴とするプラズマCVD装置。A holder for attaching an electrode part having a space for introducing a reaction gas and a diffusion hole for diffusing the introduced reaction gas out of the space, and a substrate to be subjected to a film forming process so as to face the diffusion hole. a gas supply device that supplies reaction gas to the space via an on-off valve; an airtight container that houses the electrode section and the holder; a pressure reducing device that reduces the pressure inside the airtight container; and a power source that causes discharge in the electrode section. a plasma CVD apparatus comprising: a means for supplying a reaction gas into the airtight container via a pressure regulating valve branched from piping between the on-off valve and the gas supply device; and the on-off valve and the pressure regulating valve. A plasma CVD apparatus comprising: a control section for opening and closing either one of the above.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62-156517A JPH012316A (en) | 1987-06-25 | Plasma CVD equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62-156517A JPH012316A (en) | 1987-06-25 | Plasma CVD equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS642316A JPS642316A (en) | 1989-01-06 |
| JPH012316A true JPH012316A (en) | 1989-01-06 |
Family
ID=
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