JPH01246733A - Contact for vacuum circuit breaker, manufacture thereof and vacuum breaker - Google Patents

Contact for vacuum circuit breaker, manufacture thereof and vacuum breaker

Info

Publication number
JPH01246733A
JPH01246733A JP63074146A JP7414688A JPH01246733A JP H01246733 A JPH01246733 A JP H01246733A JP 63074146 A JP63074146 A JP 63074146A JP 7414688 A JP7414688 A JP 7414688A JP H01246733 A JPH01246733 A JP H01246733A
Authority
JP
Japan
Prior art keywords
contact
vacuum circuit
circuit breaker
vacuum
materials
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP63074146A
Other languages
Japanese (ja)
Other versions
JP2555409B2 (en
Inventor
Ryuji Watanabe
隆二 渡辺
Hisashi Ando
寿 安藤
Kiyoji Iwashita
岩下 喜代次
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP63074146A priority Critical patent/JP2555409B2/en
Publication of JPH01246733A publication Critical patent/JPH01246733A/en
Application granted granted Critical
Publication of JP2555409B2 publication Critical patent/JP2555409B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01HELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
    • H01H1/00Contacts
    • H01H1/02Contacts characterised by the material thereof
    • H01H1/0203Contacts characterised by the material thereof specially adapted for vacuum switches

Landscapes

  • High-Tension Arc-Extinguishing Switches Without Spraying Means (AREA)
  • Contacts (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、高耐電圧性及び耐溶着性に優れた真空遮断器
用接点並びにその製造方法及び真空遮断器に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a contact for a vacuum circuit breaker having high voltage resistance and excellent welding resistance, a method for manufacturing the same, and a vacuum circuit breaker.

〔従来の技術〕[Conventional technology]

真空遮断器用電極接点としては、従来から種々の材料が
開発されてきている。主な材料として、代表されるもの
にはCuをベースとした溶解合金(Cu−Pb、Cu−
B1.Cu−Co−B1Pbなど)、あるいは特開昭5
4−73284号のような粉末冶金的に作られるW C
−A gや特公昭45−35101号に開示されるよう
なCr −Cu系溶浸合金が知られている。
Various materials have been developed for electrode contacts for vacuum circuit breakers. Typical main materials include Cu-based molten alloys (Cu-Pb, Cu-
B1. Cu-Co-B1Pb, etc.) or JP-A-5
W C made by powder metallurgy such as No. 4-73284
-Ag and Cr-Cu based infiltration alloys as disclosed in Japanese Patent Publication No. 45-35101 are known.

以上の背景で、最近、真空遮断器は益々高電圧化、大電
流遮断の要望が高まりつつあり、現在は後者のCr−C
u系、あるいはその改良材が非常に多く提案されつつあ
る。特にこのCr −Cu材は原料が安く、I2造法も
簡単であるところから需要も伸びている。
Against this background, recently there has been an increasing demand for vacuum circuit breakers to be able to provide higher voltage and large current interruption, and currently the latter type of Cr-C
A large number of U-based materials or improved materials thereof are being proposed. In particular, the demand for this Cr-Cu material is increasing because its raw materials are cheap and the I2 manufacturing method is simple.

ところが、近年になり原子力や核融合などの大出力発電
設備が普及されるようになってから、更に大容量の電源
遮断器が必要となってきている。
However, in recent years, as high-output power generation equipment such as nuclear power and nuclear fusion has become widespread, power circuit breakers with even higher capacity have become necessary.

従来であると、高電圧用としてはガス遮断器が使われて
いたが、将来は小型で大電流遮断が可能で、しかも無騒
音、メンテナンスフリーな真空遮断器が適用されると考
えられる。このためには上記したような従来の電極接点
材料では耐電圧及び耐溶着特性の点で限界が出始めてい
る。
Traditionally, gas circuit breakers have been used for high voltage applications, but vacuum circuit breakers are expected to be used in the future as they are compact, can interrupt large currents, are noiseless, and are maintenance-free. For this purpose, conventional electrode contact materials such as those described above are beginning to reach their limits in terms of withstand voltage and welding resistance.

現在、具体的に提案されている高耐電圧材料には、粉末
冶金的に作られるC r −Cu−セラミックス系とし
て種々の材料が開示されている。例えば、特開昭61−
148726号、同61−253730号、同51−1
16981号、同59−58723号、同60−131
723号、同60−197840号、同52−1203
71号、同55−143731号、同60−89020
号及び同60−180026号などは耐溶着性、あるい
はセラミックス粉末の種類によっては裁断サージを低く
できるなど、比較的有望な材料とみられる。しかし、上
記材料はいずれもCuを含んだものから成るため、耐電
圧に限界がある。つまり、Cr−Cu−セラミックス系
の材料はCr −Cu系に対し幾分かの改良は望めるも
のの、Cuが含まれている限りは、Cu分量に支配され
た耐電圧特性になってしまっていた。
Currently, various materials of the Cr-Cu-ceramic type made by powder metallurgy are disclosed as high voltage withstand materials specifically proposed. For example, JP-A-61-
No. 148726, No. 61-253730, No. 51-1
No. 16981, No. 59-58723, No. 60-131
No. 723, No. 60-197840, No. 52-1203
No. 71, No. 55-143731, No. 60-89020
No. 60-180026 and No. 60-180026 are considered to be relatively promising materials due to their welding resistance and the ability to reduce cutting surge depending on the type of ceramic powder. However, since all of the above materials contain Cu, there is a limit to their withstand voltage. In other words, although Cr-Cu-ceramic materials can be expected to have some improvement over Cr-Cu materials, as long as they contain Cu, their withstand voltage characteristics are controlled by the amount of Cu. .

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

従来の電極材料では、耐溶着性を持たせるために、それ
自身が脆く剥離しゃすいCrを分散させ。
In conventional electrode materials, Cr, which is brittle and easily peels off, is dispersed in order to provide welding resistance.

または骨格としていた。しかし、大電流遮断を繰り返す
と、それでも電接面の溶着は避けられなかった。これを
強制剥離させると電接部の面荒れが進行し電界集中の原
因となる無数の突起物が形成され、この結果、徐々に耐
電圧性を劣化させてしまう傾向にあった。
Or it was used as a skeleton. However, even with repeated interruptions of large currents, welding of the electrically connected surfaces was still unavoidable. When this is forcibly peeled off, the surface of the electrically connected portion progresses to roughness, and countless protrusions are formed that cause electric field concentration, which tends to gradually deteriorate the voltage resistance.

また、Cr −Cu系に各種セラミックスを含む材料が
開示されているが、たしかにセラミックスを僅かでも添
加されたものは耐溶着性は向上する傾向にある。しかし
、従来材料は必ず、多かれ少なかれ、Cuが含まれたも
のであった。このCuは融点がそれほど高くないため、
繰返しの遮断アーク熱によって面荒れを助長するもので
あった。
Furthermore, materials containing various types of ceramics in the Cr-Cu system have been disclosed, and it is true that materials to which even a small amount of ceramics are added tend to have improved welding resistance. However, conventional materials always contained more or less Cu. Since this Cu does not have a very high melting point,
Repeated interrupted arc heat promoted surface roughness.

従って、Cuを含む限りは、既述の如く、Cu自体も耐
電圧が良くないことからして、より高耐電圧、大電流化
を図る上では限界しこきていた。
Therefore, as long as Cu is included, as mentioned above, Cu itself does not have good withstand voltage, so there is a limit to achieving higher withstand voltage and larger current.

一方、単にセラミックスを含有させれば良いというもの
ではない。すなわち、真空遮断器にあっては常に大電流
を通電したり、その遮断を繰返している。このため、電
接部分の導電性は常に良好なものでなければ接触抵抗が
増大し、発熱の原因となり、これも面荒れのおおきな要
因となってしまうからである。
On the other hand, it is not enough to simply include ceramics. That is, in a vacuum circuit breaker, a large current is constantly applied and the current is repeatedly interrupted. Therefore, unless the electrical conductivity of the electrically connected portion is always good, the contact resistance will increase, causing heat generation, which will also be a major cause of surface roughness.

本発明の目的は、上記したような従来材料の耐溶着性を
改善し、それと同時に優れた耐電圧性と電流遮断性能を
発揮させることができる真空遮断器用接点を提供するこ
とにある。また、そのような接点の製造方法及び真空遮
断器を提供することを目的としている。
An object of the present invention is to provide a contact for a vacuum circuit breaker that can improve the welding resistance of conventional materials as described above and at the same time exhibit excellent voltage resistance and current interrupting performance. It is also an object of the present invention to provide a method for manufacturing such a contact and a vacuum circuit breaker.

〔課題を解決するための手段〕[Means to solve the problem]

上記目的を達成するため、本発明に係る真空遮断器用接
点は、銅より融点の高い金属間化合物と導電性セラミッ
クスから成るものである。そして、真空遮断器は前記接
点を備え、たものである6導電性のセラミックスの量は
1〜20重量%の範囲とするのがよい。また、導電性セ
ラミックスとしてはTi、Zr、Mo又はWのボライド
、カーバイド、ナイトライド又はシリサイドが挙げられ
、金属間化合物としてはNiAl又はN i、A Qが
挙げられる。すなわち、NiAu−TiB2.NiAl
−TiN、NiAl−TiC等の複合材料である。
In order to achieve the above object, the vacuum circuit breaker contact according to the present invention is made of an intermetallic compound having a higher melting point than copper and conductive ceramics. The vacuum circuit breaker is provided with the above-mentioned contacts, and the amount of the conductive ceramic is preferably in the range of 1 to 20% by weight. Furthermore, examples of conductive ceramics include borides, carbides, nitrides, and silicides of Ti, Zr, Mo, or W, and examples of intermetallic compounds include NiAl, Ni, and AQ. That is, NiAu-TiB2. NiAl
- Composite materials such as TiN, NiAl-TiC, etc.

前記金属間化合物を具体的に示すと、 NiA Q 、 Ni、A Qの他に、N i2A Q
 3 y F e A Q HF e A Q 2 *
 F e z A Q s + F e A Q 3 
s COA I2 tCozA Q、、 Cr、A Q
tl、 Cr、A Q9. CrA Q、等がある。こ
れらの融点は、いずれもCuやAgより高<Mo、W、
Ta等よりも低いものであり。
Specifically, the intermetallic compounds include NiAQ, Ni, AQ, and Ni2AQ.
3 y F e A Q HF e A Q 2 *
F e z A Q s + F e A Q 3
s COA I2 tCozA Q,, Cr,A Q
tl, Cr, A Q9. There are CrAQ, etc. All of these melting points are higher than Cu and Ag<Mo, W,
It is lower than Ta etc.

これらを一種又は二種以上混合させて用いる。また、前
記導電性セラミックスを具体的に示すと、TiB2.Z
rBz+ HfB2.VB2.NbBzeT a B 
2 # Cr B z HM o B 21 W2 B
 HT x N pZ rN、HfN、VN、NbN、
TaN、Cr2N、Mo、N、WN、Ti Si、、Z
rSi、。
One or a mixture of two or more of these may be used. In addition, specific examples of the conductive ceramics include TiB2. Z
rBz+ HfB2. VB2. NbBzeT a B
2 # Cr B z HM o B 21 W2 B
HT x N pZ rN, HfN, VN, NbN,
TaN, Cr2N, Mo, N, WN, TiSi,,Z
rSi,.

HfSi、、VSi2.NbSi2.TaSi2゜Cr
Si2.MoSi、、wsi、’ric、ZrC。
HfSi,,VSi2. NbSi2. TaSi2゜Cr
Si2. MoSi,,wsi,'ric,ZrC.

HfC,NbC,TaC,Cr3G2.Mo2C。HfC, NbC, TaC, Cr3G2. Mo2C.

WCのいずれか一種以上よりなるものである。It is composed of one or more types of WC.

真空遮断器用接点の製造方法としては、金属間化合物及
び導電性セラミックスの粉末を混合して成形した後、焼
結し1次いで減圧して脱ガスする工程よりなり、前記各
工程のいずれか一種以上の工程を経た後、熱間静水圧加
圧(HIP)、冷間静水圧加圧(CIP)、又はホット
プレス(HP)等の加圧処理をして高密度化する工程を
含む製造方法がある。
The method for manufacturing contacts for vacuum circuit breakers includes the steps of mixing powders of intermetallic compounds and conductive ceramics, molding, sintering, and then depressurizing and degassing, and one or more of the above steps. After passing through the steps, the manufacturing method includes a step of densifying the material by applying pressure treatment such as hot isostatic pressing (HIP), cold isostatic pressing (CIP), or hot pressing (HP). be.

〔作用〕[Effect]

複合材において、NiAlのような金属間化合物は、と
くに優れた良導電性を有し、しかも高融点物質であり、
1600℃台の高い融点を持つ。
In composite materials, intermetallic compounds such as NiAl have particularly good electrical conductivity and are high melting point substances,
It has a high melting point of around 1600℃.

したがって、耐熱性が良好で、従来のCuやAgベース
材に比ベアーク熱によって接点fiJ1の溶融が少なく
、溶着も起こりにくい。また、NiAl化合物は電気抵
抗も低く、導電率に換算すると約15〜20IAC8%
(100IAC8%は電気抵抗値に換算すると1.7X
10−’Ω・■)を有し、接点材料としてそのままでも
利用できるものである。
Therefore, it has good heat resistance, and the contact fiJ1 is less likely to melt due to bare arc heat than conventional Cu or Ag base materials, and welding is less likely to occur. NiAl compounds also have low electrical resistance, approximately 15 to 20 IAC8% when converted to electrical conductivity.
(100IAC8% is 1.7X when converted to electrical resistance value
10-'Ω·■), and can be used as is as a contact material.

更に、NiA1等の金属間化合物の粒子の周囲に分散さ
れた各種導電性セラミックスは、それ自身が導体であっ
て、なおかつN i A 1などの金属間化合物よりも
高い融点を有している。このため。
Further, various conductive ceramics dispersed around particles of intermetallic compounds such as NiA1 are themselves conductors and have a higher melting point than intermetallic compounds such as NiA1. For this reason.

アーク熱による接点溶着を防ぐことができるばかりでな
く、電接面の荒れを少なくし、常に滑らかな面を維持さ
せることができる。従って、電界集中の原因となる突起
物の発生も少ないため耐電圧性が高く、安定している。
Not only can it prevent contact welding due to arc heat, but it can also reduce roughness of the electrical contact surface and maintain a smooth surface at all times. Therefore, since there are few protrusions that cause electric field concentration, the voltage resistance is high and stable.

また、接点材料をなす構成物質がいずれも導電性を有し
、W、Mo、Ta程に熱電子放射性が大きくないので絶
縁回復特性が良く、大電流遮断性能も優れるという大き
なメリットも有する。
In addition, all of the constituent materials forming the contact material have electrical conductivity, and their thermionic emission is not as large as that of W, Mo, and Ta, so they have great advantages in that they have good insulation recovery characteristics and excellent large current interrupting performance.

なお、ボライドやナイトライドそれ自体は仕事関係の低
い物質であるので、これらの導電性セラミックスを重量
比で約10%とすると、熱電子放射が多くなり遮断性能
はその分だけ低下する。ただし、この現象と合わせて裁
断サージも下がる傾向にあるので、導電性セラミックス
の含有量を適量選ぶことによって1種々のVCB (真
空遮断器)の電極特性を発揮させることができる。つま
り、通常は高耐電圧・大電流と、低サージ化は互いに相
反する性質を持つことが知られているように。
Note that since borides and nitrides themselves are substances with low work-related properties, if the weight ratio of these conductive ceramics is about 10%, thermionic emission increases and the blocking performance decreases accordingly. However, along with this phenomenon, the cutting surge also tends to decrease, so by selecting an appropriate amount of conductive ceramics, it is possible to exhibit the electrode characteristics of a variety of VCBs (vacuum circuit breakers). In other words, it is known that high withstand voltage and large current and low surge are usually contradictory to each other.

従来は両者の特性を同時に高度に満足させるような電極
材はなかった。ところが1本発明材によれば、高融点金
属間化合物と導電性セラミックス量比を適宜選ぶことに
よって広範囲の電極特性を引き出すことができることに
なる。
Until now, there has been no electrode material that simultaneously satisfies both characteristics to a high degree. However, according to the material of the present invention, a wide range of electrode characteristics can be brought out by appropriately selecting the ratio of high melting point intermetallic compound to conductive ceramic.

以上を纏めてみると、VCB電極としては、導電性セラ
ミックスが1〜10重量%のもので高耐電圧・耐溶着性
を発揮し、10〜20重量%で低サージ性を発揮するも
のである。従って、導電性セラミックスの含有量は1〜
20重量%の範囲とする。
To summarize the above, VCB electrodes with conductive ceramics of 1 to 10% by weight exhibit high withstand voltage and welding resistance, and 10 to 20% by weight of conductive ceramics to exhibit low surge properties. . Therefore, the content of conductive ceramics is 1~
The range is 20% by weight.

次に1本発明に係り真空遮断器用接点の製造方法は・H
IP処理等の加圧処理工程を含むため、金属間化合物及
び導電性セラミックスとも共有結合性の物質であること
から、通常の金属粉末のような自己焼結性に乏しい物質
に対しても、高密度化し得る。
Next, the method for manufacturing a vacuum circuit breaker contact according to the present invention is:
Because it includes a pressure treatment process such as IP treatment, it is a material that has covalent bonds with intermetallic compounds and conductive ceramics, so it is highly effective even for materials with poor self-sintering properties such as ordinary metal powder. Can be densified.

〔実施例〕〔Example〕

以下本発明の実施例を示す。 Examples of the present invention will be shown below.

実施例1 高周波真空溶解したNiA1合金(化合物組成;Ni−
31,5wt%Al)を粉砕し、   200mesh
の粉末を得た。第1図に示す工程により、このNiAl
粉とTiB、粉を自動乳鉢を用いて30分混合し1次に
、この混合粉末を油圧プレスを用いて直径50−1厚さ
30mnの寸法に金型成形した0次いでこの成形体を若
干還元性を持たせるために(A r + 4 v o 
1%H,)の混合ガス雰囲気中で1400℃で1時間の
仮焼結を行なった。更にこの成形体を軟鋼性をカプセル
に温度300℃。
Example 1 High-frequency vacuum melted NiA1 alloy (compound composition; Ni-
31.5wt%Al) was crushed into 200mesh
powder was obtained. By the process shown in Fig. 1, this NiAl
The powder, TiB, and powder were mixed for 30 minutes using an automatic mortar, and then the mixed powder was molded into a mold with a diameter of 50 mm and a thickness of 30 mm using a hydraulic press.The molded body was then slightly reduced. In order to have sex (A r + 4 v o
Temporary sintering was performed at 1400° C. for 1 hour in a mixed gas atmosphere of 1% H, ). Furthermore, this molded body is encapsulated with mild steel at a temperature of 300°C.

圧力10−2〜l O−’torrで脱気しながら減圧
封入し、このカプセルを温度1400℃、圧力2000
 kg/cdの条件下でHIP処理した。この結果、上
記仮焼結体はカプセル毎1強制圧縮され、理論密度に対
し98〜99%の緻密な複合材料が得られた。
The capsule was sealed under reduced pressure while degassing at a pressure of 10-2 to 1 O-'torr, and the capsule was heated at a temperature of 1400°C and a pressure of 2000°C.
HIP treatment was performed under the condition of kg/cd. As a result, each capsule of the pre-sintered body was forcibly compressed, and a dense composite material having a density of 98 to 99% of the theoretical density was obtained.

次に、このHIP処理材の軟鋼性カプセルを皮むきし、
放電加工機を用いて直径20I(球R30付)、厚さ5
閣の一対の電極接点を採取した。
Next, the mild steel capsule of this HIP treated material is peeled,
Diameter 20I (with ball R30), thickness 5 using an electric discharge machine
A pair of electrode contacts were collected from the cabinet.

各種電極接点の遮断特性試験方法としては、第2図に示
す真空バルブを用いた。この真空バルブは、筒状のセラ
ミックス製の絶縁ケース1とステンレス製の端子板2,
3とによって容器が構成され、その内部は10−6〜1
0−”torr台の高真空に保たれている。この容器内
部には1対の電極、すなわち固定電極4と、ベローズ6
を介して動けるようにした可動電極5が設けられている
。さらに円筒状のシールド7は前記電極4.5を囲むよ
うに設けられ、このシールド7は、電極構成部材が遮断
アークにより蒸発、荒散した場合、それらが絶縁ケース
1の内壁に付着することを防止する役目を持つ。電極4
,5はCu製の補助電極板8゜9に銀ロー付けされてい
る。10.11はホルダー、12はベローズシールド、
13は排気管を示す、つまり、本実施例の電極接点は直
径20mm。
A vacuum valve shown in FIG. 2 was used to test the breaking characteristics of various electrode contacts. This vacuum valve consists of a cylindrical ceramic insulation case 1, a stainless steel terminal plate 2,
3 constitutes a container, and the inside is 10-6 to 1
It is maintained at a high vacuum of 0-"torr level. Inside this container, there are a pair of electrodes, namely a fixed electrode 4 and a bellows 6.
A movable electrode 5 is provided which is movable through the . Further, a cylindrical shield 7 is provided to surround the electrode 4.5, and this shield 7 prevents the electrode components from adhering to the inner wall of the insulating case 1 when they are evaporated or scattered due to the interruption arc. It has the role of prevention. Electrode 4
, 5 are soldered with silver to an auxiliary electrode plate 8.9 made of Cu. 10.11 is the holder, 12 is the bellows shield,
Reference numeral 13 indicates an exhaust pipe, that is, the electrode contact in this example has a diameter of 20 mm.

厚さ5mmのチップ状接点として用いられている。It is used as a chip contact with a thickness of 5 mm.

各種電気的性能試験において、耐電圧試験方法としては
、交流300Aを10回遮断後、インパルス電圧を5k
Vステツプで増加しながら印加し。
In various electrical performance tests, the withstand voltage test method is to cut off AC 300A 10 times, then increase the impulse voltage to 5k.
Apply increasing voltage in V steps.

極間が絶縁破壊に至る放電電圧値を測定することである
。遮断性能試験は、直径20IIfiの電極において、
交流電流を50OAステツプで増加しながら遮断し、遮
断が不能となる限界電流値を求めることである。更に、
裁断電流試験は、交流2〜8Aの小電流を遮断した場合
に発生する裁断電流を100回測定し、その最大値と平
均値を求めるようにした。゛第1表は以上の接点を用い
て上記vCB電極特性を測定した結果である・ 実施例1では、主に、NiA1化合物粉末とTiの各種
導電性粉末(ボライド、ナイトライド、シリサイド、カ
ーバイド)との複合材料を取り上げた。
This is to measure the discharge voltage value at which the gap between electrodes reaches dielectric breakdown. The interrupting performance test was conducted using an electrode with a diameter of 20IIfi.
The purpose is to cut off the alternating current in 50OA steps and find the limit current value at which the cutoff becomes impossible. Furthermore,
In the cutting current test, the cutting current generated when a small current of 2 to 8 A AC was interrupted was measured 100 times, and the maximum value and average value were determined.゛Table 1 shows the results of measuring the vCB electrode characteristics using the above contacts. In Example 1, NiA1 compound powder and various Ti conductive powders (boride, nitride, silicide, carbide) were mainly used. We took up composite materials with.

表中に従来材料との比較としてCu−Co−B1Pb、
Cr−Cu合金を挙げているが1本発明材はとくに耐電
圧性が優れていることがわかる。
In the table, as a comparison with conventional materials, Cu-Co-B1Pb,
Although Cr--Cu alloys are mentioned, it can be seen that the material of the present invention is particularly excellent in voltage resistance.

すなわち、[NiAl−導電性セラミックス]複合材料
はいずれも耐電圧が100kV以上を有し、これはCu
−Go−BiPb溶解合金に対し2〜2.5倍、Cr−
Cu溶浸合金に対しても約3割増しの高耐電圧性を持つ
ことが判明した。
In other words, all [NiAl-conductive ceramics] composite materials have a withstand voltage of 100 kV or more, which is higher than that of Cu.
-2 to 2.5 times that of the Go-BiPb melted alloy, Cr-
It was found that it has a high voltage resistance that is approximately 30% higher than that of Cu infiltrated alloys.

尚、耐電圧はNiA1に1〜5wt%の導電性セラミッ
クスが入っても効果はあるが、おおよそ10vt%で最
大を示し、それ以上の量では逆に下がる傾向にある。た
だし、10〜20wt%のセラミックスが入ると裁断電
流特性が改善され、約1〜2Aの低サージ特性が得られ
ている。また、電流遮断性能を見ると、いずれとも8〜
l0KAの範囲にあり、この値も従来のCu−Go−B
iPbやCr−Cu合金に比べても全く遜色ない高い遮
断能力を有していると言える。
Although the dielectric strength is effective even if 1 to 5 wt % of conductive ceramics is added to NiA1, it reaches a maximum at approximately 10 vt %, and tends to decrease when the amount exceeds that amount. However, when 10 to 20 wt% of ceramics is added, the cutting current characteristics are improved, and low surge characteristics of approximately 1 to 2 A are obtained. Also, when looking at the current interrupting performance, all of them are 8~
It is in the range of 10KA, and this value is also in the range of conventional Cu-Go-B.
It can be said that it has a high blocking ability that is comparable to that of iPb and Cr-Cu alloys.

実施例2 第2表は他のNiとAtの化合物であるNi。Example 2 Table 2 shows other Ni and At compounds.

AIにTiボライド、Tiナイトライドを複合化したも
のや、N i A l化合物と他の導電性セラミックス
であるMo、W、Zrなどのボライド、ナイトライド、
シリサイド、カーバイドとの各種複合材料を検討した結
果である。試験方法は、実施例1と同様である。
Composites of AI with Ti boride and Ti nitride, NiAl compounds and other conductive ceramics such as Mo, W, and Zr borides, nitrides,
This is the result of examining various composite materials with silicide and carbide. The test method was the same as in Example 1.

表から明らかなように、いずれも実施例1と同様な傾向
を持ち、優れた耐電圧性、高遮断能力があり、また導電
性セラミックス量が増えると低サージ性も発揮すること
が分かった。
As is clear from the table, all of them had the same tendency as Example 1, had excellent voltage resistance and high interrupting ability, and also exhibited low surge properties as the amount of conductive ceramic increased.

〔発明の効果〕〔Effect of the invention〕

以上、本発明によれば、従来の電極接点に比べて耐電圧
特性が向上し、更に大電流遮断性能、耐溶着性能のいず
れも優れた真空遮断器用接点を得ることか出来る。また
、導電性セラミックスを20重量%近く含ませることに
よって低サージタイプの接点を得ることも出来る。
As described above, according to the present invention, it is possible to obtain a contact for a vacuum circuit breaker which has improved withstand voltage characteristics as compared to conventional electrode contacts and is also excellent in both large current interrupting performance and anti-welding performance. In addition, by including approximately 20% by weight of conductive ceramics, a low-surge type contact can be obtained.

本発明に係る製造方法によれば、自己焼結性に乏しいセ
ラミックス等を原料としても、容易に高密度化させて接
点を得ることができる。
According to the manufacturing method of the present invention, even if ceramics or the like with poor self-sintering property is used as a raw material, it is possible to easily increase the density and obtain a contact point.

更に、本発明に係る真空遮断器は、上記接点を備えてい
るため、信頼性が向上し、高電圧化、大電流遮断の要請
に応えることができる。
Furthermore, since the vacuum circuit breaker according to the present invention includes the above-mentioned contacts, reliability is improved and it is possible to meet the demands for high voltage and large current interruption.

第  1  表 第  2  表Table 1 Table 2

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の電極接点の製造方法の工程図。 第2図は本発明の真空遮断器用真空バルブの断面構成図
を示す。 4・・・固定電極(接点)、5・・・可動電極(接点)
FIG. 1 is a process diagram of the method for manufacturing an electrode contact of the present invention. FIG. 2 shows a sectional view of the vacuum valve for a vacuum circuit breaker according to the present invention. 4... Fixed electrode (contact), 5... Movable electrode (contact)
.

Claims (1)

【特許請求の範囲】 1、銅より融点の高い金属間化合物と導電性セラミック
スから成ることを特徴とする真空遮断器用接点。 2、導電性セラミックスが1〜20重量%で、残りが金
属間化合物及び不可避的不純物である請求項1記載の真
空遮断器用接点。 3、導電性セラミックスがTi、Zr、Mo又はWのボ
ライド、カーバイド、ナイトライド又はシリサイドであ
り、金属間化合物はNiAl又はNi_3Alである請
求項2記載の真空遮断器用接点。 4、金属間化合物及び導電性セラミックスの粉末を混合
して成形した後、焼結し、次いで減圧して脱ガスする工
程よりなり、前記各工程のいずれか一種以上の工程を経
た後、加圧処理して高密度化する工程を含むことを特徴
とする真空遮断器用接点の製造方法。 5、請求項1記載の真空遮断器用接点を備えた真空遮断
器。
[Claims] 1. A contact for a vacuum circuit breaker characterized by being made of an intermetallic compound with a higher melting point than copper and conductive ceramics. 2. The contact for a vacuum circuit breaker according to claim 1, wherein the conductive ceramic is 1 to 20% by weight, and the remainder is an intermetallic compound and unavoidable impurities. 3. The contact for a vacuum circuit breaker according to claim 2, wherein the conductive ceramic is a boride, carbide, nitride or silicide of Ti, Zr, Mo or W, and the intermetallic compound is NiAl or Ni_3Al. 4. The process consists of mixing and molding the intermetallic compound and conductive ceramic powder, sintering it, and then degassing it by reducing the pressure. After passing through one or more of the above steps, pressurizing 1. A method of manufacturing a contact for a vacuum circuit breaker, comprising a step of processing and densification. 5. A vacuum circuit breaker comprising the vacuum circuit breaker contact according to claim 1.
JP63074146A 1988-03-28 1988-03-28 Contact for vacuum circuit breaker, manufacturing method thereof, and vacuum circuit breaker Expired - Lifetime JP2555409B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63074146A JP2555409B2 (en) 1988-03-28 1988-03-28 Contact for vacuum circuit breaker, manufacturing method thereof, and vacuum circuit breaker

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63074146A JP2555409B2 (en) 1988-03-28 1988-03-28 Contact for vacuum circuit breaker, manufacturing method thereof, and vacuum circuit breaker

Publications (2)

Publication Number Publication Date
JPH01246733A true JPH01246733A (en) 1989-10-02
JP2555409B2 JP2555409B2 (en) 1996-11-20

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ID=13538736

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Country Link
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* Cited by examiner, † Cited by third party
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