JPH0125005B2 - - Google Patents
Info
- Publication number
- JPH0125005B2 JPH0125005B2 JP57144456A JP14445682A JPH0125005B2 JP H0125005 B2 JPH0125005 B2 JP H0125005B2 JP 57144456 A JP57144456 A JP 57144456A JP 14445682 A JP14445682 A JP 14445682A JP H0125005 B2 JPH0125005 B2 JP H0125005B2
- Authority
- JP
- Japan
- Prior art keywords
- thickness
- notch
- signal
- radiation
- detection section
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
- G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
Description
【発明の詳細な説明】
〔発明の技術分野〕
本発明は、鋼板の板端部の板厚を的確に測定し
て最適な圧延制御を行う放射線厚み測定装置に関
する。DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to a radiation thickness measuring device that accurately measures the thickness of the edge of a steel plate and performs optimal rolling control.
一般に、圧延鋼板は第1図に示すようなクラウ
ン形状のものが多い。従来、かかるクラウン形状
の圧延鋼板1を作る場合、鋼板中央部の板厚を測
定して作る手段と、板端部の板厚を測定して作る
手段とがある。前者の手段は、第1図に示すよう
に紙面と直交する方向に搬送されている鋼板中央
部を挾むようにCフレーム2の上下両端部に放射
線源3と、放射線検出器4とを対向配置し、これ
らの放射線源3および放射線検出器4からなる厚
み検出部によつて鋼板中央部の板厚CHを測定
し、この板厚信号を圧延機にフイードバツクして
所要板厚の圧延鋼板1を作つている。しかし、圧
延鋼板1の公称板厚は、板端部の厚さで規定され
ているので、板端部の厚さが薄く作られることを
避けるために、予め圧延すべき鋼板と等しい鋼板
を模擬的に設置してその鋼板中央部の板厚を測定
するとともにこの板厚にクラウン形状から得られ
る板厚を上乗せして中央部板厚の設定値とし、こ
の設定値と実際に圧延ラインによつて搬送されて
くる鋼板の中央部測定板厚とから圧延すべき鋼板
の中央部板厚を定め、さらにクラウン形状から板
端部の板厚を予測して圧延機により圧延すること
により、最終的に公称板厚の満足する圧延鋼板1
を作り出している。しかし、この手段では中央部
板厚に更にある板厚を上乗せしているので、常に
上乗せした厚さ分だけ材料が無駄となる欠点があ
る。
Generally, many rolled steel plates have a crown shape as shown in FIG. Conventionally, when making such a crown-shaped rolled steel plate 1, there are two methods: one is to measure the thickness of the central part of the steel plate, and the other is to measure the thickness of the edge of the steel plate. The former means, as shown in FIG. 1, has a radiation source 3 and a radiation detector 4 disposed facing each other at both the upper and lower ends of the C frame 2 so as to sandwich the central portion of the steel plate that is being conveyed in a direction perpendicular to the plane of the paper. , the thickness CH at the center of the steel plate is measured by the thickness detection section consisting of the radiation source 3 and the radiation detector 4, and this plate thickness signal is fed back to the rolling mill to produce the rolled steel plate 1 of the required thickness. It's on. However, the nominal thickness of the rolled steel plate 1 is determined by the thickness of the edge of the plate, so in order to avoid making the edge of the plate thin, a steel plate that is equal to the steel plate to be rolled is prepared in advance. At the same time, the thickness of the central part of the steel plate is measured by adding the thickness obtained from the crown shape to this thickness to obtain the set value of the central part thickness. The thickness of the center part of the steel plate to be rolled is determined based on the measured thickness of the center part of the steel plate being conveyed, and then the thickness of the edge part of the plate is predicted from the crown shape and rolled by a rolling mill. Rolled steel plate 1 with a nominal thickness that satisfies
is creating. However, with this method, a certain thickness is added to the thickness of the central portion, so there is a drawback that material corresponding to the added thickness is always wasted.
その点、前述した後者の手段は、第2図のよう
に放射線源3および放射線検出器4からなる厚み
検出部により板端部の板厚を測定して圧延制御系
にフイードバツクするので、材料の無駄の少ない
圧延鋼板1を作ることができる。しかし、このよ
うな厚み測定手段をとつた場合には次のような問
題が生ずる。つまり、第3図のように鋼板1の板
端部に切欠き部5が存在している場合、放射線検
出器4は板厚測定ラインL1上において放射線源
3からの放射線量を直接受けるためその出力が測
定範囲を越えてしまうため放射線検出器4の出力
をそのまま圧延制御用信号として使用できない欠
点がある。 In this regard, the latter method described above measures the thickness of the plate at the edge of the plate using a thickness detecting section consisting of a radiation source 3 and a radiation detector 4 as shown in Fig. 2, and provides feedback to the rolling control system. A rolled steel plate 1 with less waste can be produced. However, when such a thickness measuring means is used, the following problems occur. In other words, when the notch 5 exists at the end of the steel plate 1 as shown in FIG. 3, the radiation detector 4 directly receives the radiation dose from the radiation source 3 on the plate thickness measurement line L1. There is a drawback that the output of the radiation detector 4 cannot be directly used as a rolling control signal because the output exceeds the measurement range.
本発明は上記実情にかんがみてなされたもの
で、被測定物の幅方向端部に切欠き部が存在して
いる場合でもそれに影響されずに厚み検出部で検
出した板端部の板厚信号を圧延制御用信号として
使用できる放射線厚み測定装置を提供することに
ある。
The present invention has been made in view of the above-mentioned circumstances, and even if there is a notch at the end of the width direction of the object to be measured, the thickness signal at the end of the board is detected by the thickness detection unit without being affected by the notch. An object of the present invention is to provide a radiation thickness measuring device that can use the following as a signal for rolling control.
すなわち、本発明は、厚み検出部の外に、被測
定物の幅方向端部における切欠き部を検知する切
欠き検知部を設け、この切欠き検知部によつて切
欠き部を速やかに検知して厚み検出部からの板厚
信号を保持して出力させ、被測定物の切欠き部が
通過した後に前記板厚信号の保持を解除するよう
に構成した圧延制御等に使用する放射線厚み測定
装置である。
That is, in the present invention, a notch detection section for detecting a notch in the widthwise end of the object to be measured is provided in addition to the thickness detection section, and the notch can be quickly detected by this notch detection section. A radiation thickness measurement device used for rolling control, etc., configured to hold and output a plate thickness signal from a thickness detection unit and release the holding of the plate thickness signal after the notch of the object to be measured passes. It is a device.
次に、本発明の一実施例について第4図ないし
第6図を参照して説明する。なお、第4図は厚み
検出部および切欠き検知部として作用する板端検
知部の配置関係を示し、第5図は厚み検出部およ
び板端検知部における被測定物の測定ラインを示
し、第6図は装置全体の構成を示す図である。即
ち、この装置は、被測定物10の幅方向端部をそ
の目的に応じて検出する検出系20と、この検出
系20から出力された信号を処理する信号処理系
30とからなる。この検出系20は、第4図に示
すように例えばCフレーム21の下枠部21aの
端部側から胴部側方向に距離L2を隔てて放射線
源22と光源23と配置し、一方、Cフレーム2
1の上枠部21bには放射線源22および光源2
3に対応させて放射線量を検出する例えば電離箱
等の放射線検出器24および光の有無から被測定
物10の端部有無を検知する板端検知部25がそ
れぞれ配置されている。この板端検知部25は被
測定物10の端部幅方向に例えば複数のフオト・
ダイオードを配列したリニアアレイセンサ等を使
用する。なお、前記厚み検出部は放射線源22と
放射線検出器24とをもつて構成され、また板端
検知部は光源23と板端検知部25とをもつて構
成される。
Next, an embodiment of the present invention will be described with reference to FIGS. 4 to 6. Furthermore, Fig. 4 shows the arrangement of the thickness detection part and the plate edge detection part which acts as the notch detection part, and Fig. 5 shows the measurement line of the object to be measured in the thickness detection part and the plate edge detection part. FIG. 6 is a diagram showing the configuration of the entire device. That is, this apparatus includes a detection system 20 that detects the width direction end portion of the object to be measured 10 according to its purpose, and a signal processing system 30 that processes the signal output from this detection system 20. As shown in FIG. 4, in this detection system 20, a radiation source 22 and a light source 23 are arranged, for example, at a distance L 2 from the end side of the lower frame portion 21a of the C frame 21 toward the body side. C frame 2
A radiation source 22 and a light source 2 are installed in the upper frame portion 21b of 1.
A radiation detector 24, such as an ionization chamber, for detecting the radiation dose, and a plate end detection section 25, for detecting the presence or absence of the end of the object to be measured 10 from the presence or absence of light, are respectively disposed corresponding to the radiation dose. This plate edge detection section 25 has a plurality of photo sensors, for example, in the width direction of the edge of the object to be measured 10.
Use a linear array sensor with diodes arranged. Note that the thickness detection section includes a radiation source 22 and a radiation detector 24, and the board edge detection section includes a light source 23 and a board edge detection section 25.
従つて、厚み検出部および板端検知部を以上の
ような配置構成とし、かつ板端検知部25を構成
するリニアアレイセンサのある位置の素子を特定
すれば(後述する判定レベル)、第5図に示すよ
うに厚み検出部は板厚測定ラインL1上の板厚を
測定でき、板端検知部は板端有無測定ラインL3
上での板端有無を検知することが可能となる。よ
つて、被測定物10の板端部に切欠き部11が存
在している場合、時間的には板端検知部でa点を
検知した後、厚み検出部がb点に達することにな
る。c点、d点の到達時間は上記とは全く逆とな
る。 Therefore, if the thickness detection section and the plate edge detection section are arranged as described above, and the element at a certain position of the linear array sensor constituting the plate edge detection section 25 is specified (determination level described later), the fifth As shown in the figure, the thickness detection unit can measure the thickness of the plate on the plate thickness measurement line L1, and the plate edge detection unit can measure the plate thickness on the plate edge presence/absence measurement line L3.
It becomes possible to detect the presence or absence of a board edge at the top. Therefore, when the notch 11 exists at the edge of the plate of the object to be measured 10, the thickness detection unit will reach point b after the plate edge detection unit detects point a. . The arrival times for points c and d are completely opposite to those described above.
次に、信号処理系30は、放射線検出器24で
検出した板厚検出信号と予め定めた板端の板厚測
定ラインL1上に相応する板厚設定信号との偏差
をもつて板厚信号として出力する信号処理部31
と、この信号処理部31の板厚信号を記憶して出
力する記憶出力部32と、切欠き部11の大きさ
(深さ)に対応した判定レベルを設定する設定回
路33と、板端検知部25からの出力レベルが判
定レベルを越えたとき記憶出力部32に記憶保持
信号を与え、前記出力レベルが判定レベル以下に
なつたとき記憶出力部32に記憶保持を解除する
信号を与える比較回路34とを備えている。35
は警報部であつて、これは比較回路34から記憶
保持信号を受けた後、所定時間内にその記憶保持
の解除がないときに警報信号ALを出力する機能
をもつている。 Next, the signal processing system 30 generates a plate thickness signal based on the deviation between the plate thickness detection signal detected by the radiation detector 24 and the plate thickness setting signal corresponding to the predetermined plate edge thickness measurement line L1. Signal processing unit 31 to output
, a storage output unit 32 that stores and outputs the plate thickness signal from the signal processing unit 31, a setting circuit 33 that sets a determination level corresponding to the size (depth) of the notch 11, and a plate edge detection circuit. A comparator circuit that provides a memory retention signal to the memory output unit 32 when the output level from the unit 25 exceeds the determination level, and provides a signal to release the memory retention to the memory output unit 32 when the output level falls below the determination level. It is equipped with 34. 35
is an alarm section which has a function of outputting an alarm signal AL if the memory retention is not released within a predetermined time after receiving the memory retention signal from the comparator circuit 34.
次に、以上のように構成された放射線厚み測定
装置の作用を説明する。先ず、最初に信号処理部
31に板端部の板厚測定ラインL1に対応した板
厚設定レベルを設定し、また設定回路33に切欠
き部11の大きさに対応した判定レベルを設定す
る。この状態において被測定物10が、第4図お
よび第5図のような位置関係で搬送され、かつ被
測定物10の幅方向端部に切欠き部11が無い場
合には、放射線源22から放射された放射線は被
測定物10を透過して放射線検出器24に入射さ
れる。放射線検出器24は、その入射放射線量を
電気信号に変換して信号処理部31に送出する。
この信号処理部31では、放射線検出器24から
の信号と予め定めた板厚設定信号とを比較し、第
7図に示すようその偏差に応じた信号S1を出力す
る。この信号S1は記憶出力部32を介して板厚信
号S3として外部へ出力する。このとき、板端検知
器25のリニアアレイセンサは信号処理部31又
は別の走査回路(図示せず)によつて順次走査さ
れているが、被測定物10に切欠き部11が存在
しない場合には、板端検知器25のリニアアレイ
センサからは第7図S2に示すローレベル信号S2a
が出力される。 Next, the operation of the radiation thickness measuring device configured as described above will be explained. First, a plate thickness setting level corresponding to the plate thickness measurement line L1 at the plate end is set in the signal processing section 31, and a determination level corresponding to the size of the notch 11 is set in the setting circuit 33. In this state, if the object to be measured 10 is transported in the positional relationship as shown in FIGS. The emitted radiation passes through the object to be measured 10 and enters the radiation detector 24 . The radiation detector 24 converts the incident radiation dose into an electrical signal and sends it to the signal processing section 31.
This signal processing section 31 compares the signal from the radiation detector 24 with a predetermined plate thickness setting signal, and outputs a signal S1 according to the deviation as shown in FIG. This signal S 1 is outputted to the outside via the storage output section 32 as a plate thickness signal S 3 . At this time, the linear array sensor of the plate edge detector 25 is sequentially scanned by the signal processing unit 31 or another scanning circuit (not shown), but if the notch 11 does not exist in the object to be measured 10 , a low level signal S 2 a shown in FIG. 7 S 2 is output from the linear array sensor of the plate edge detector 25.
is output.
引き続き被測定物10が搬送され、検出系20
に被測定物10の切欠き部11が到達すると、板
端検知器25の出力は、第7図S2に示すように切
欠き部11形状に合致した出力信号S2bを出力す
る。この信号S2bを受けた比較回路34は、設定
回路33の判定レベルVLと比較し、そのレベル
VLを越えた点、すなわちa点時点の放射線検出
器24の出力S1aを保持させるための信号を記憶
出力部32に送る。この結果、記憶出力部32は
a点時点の信号である第7図S3に示す信号S3bを
保持するとともに、その保持信号S3bを出力す
る。さらに、被測定物10が搬送されると、放射
線検出器24にはb点を経過した時点で放射線源
22からの放射線が減衰されることなくそのまま
入射される。このため放射線検出器24からは極
端にレベルの高い第7図S1に示す信号S1bが出力
され、信号処理部31からの偏差信号も大きくな
るが、既に記憶出力部32はa点時点の偏差信号
を保持して出力しているので、切欠き部11の影
響を受けた例えば第7図S3に示すS3b′のような信
号を出力するようなことはない。 Subsequently, the object to be measured 10 is transported, and the detection system 20
When the notch 11 of the object to be measured 10 reaches , the plate edge detector 25 outputs an output signal S 2 b that matches the shape of the notch 11 as shown in FIG. 7 S 2 . The comparator circuit 34 receiving this signal S 2 b compares it with the judgment level V L of the setting circuit 33 and determines the level.
A signal is sent to the storage output unit 32 to hold the output S 1 a of the radiation detector 24 at the point exceeding V L , that is, at point a. As a result, the storage output unit 32 holds the signal S 3 b shown in FIG . 7 S 3 which is the signal at point a, and outputs the held signal S 3 b. Furthermore, when the object to be measured 10 is transported, the radiation from the radiation source 22 enters the radiation detector 24 as it is without being attenuated at the time point b has passed. For this reason, the radiation detector 24 outputs the signal S 1 b shown in FIG. Since the deviation signal is held and outputted, a signal such as S3b ' shown in FIG. 7, S3 , which is affected by the notch 11, for example, is not outputted.
さらに、被測定物10が搬送されると、放射線
検出器24がc点経過を検出して切欠き無しの状
態の板厚検出を行ない、その後、板端検知器25
の信号は下降し、判定レベルVLを越えた点dは、
比較回路34で検出され、その信号は記憶保持を
解除する信号として記憶出力部32へ送られる。
この結果、記憶出力部32からは、被測定物10
に切欠き部11が存在している場合でも極端にレ
ベル変化をもつた信号S3b′を出力することなくそ
の被測定物10の板厚に近似した信号S3bを連続
的に出力することができる。 Further, when the object to be measured 10 is transported, the radiation detector 24 detects the passage of point c and detects the thickness of the plate without a notch, and then the plate edge detector 25
The signal at point d falls and exceeds the judgment level V L ,
It is detected by the comparison circuit 34, and the signal is sent to the memory output section 32 as a signal for canceling memory retention.
As a result, from the storage output unit 32, the measured object 10
Even if there is a notch 11 in the object, a signal S 3 b that approximates the thickness of the object to be measured 10 is continuously output without outputting a signal S 3 b' with an extreme level change. be able to.
また、被測定物10の切欠き部11の深さの相
違により、切欠き部11が板端有無測定ラインL
3を通過するが、板厚測定ラインL1を通過しな
い場合がある。この場合、放射線検出器24から
第8図S1のような板厚検出信号が出力され、一
方、板端検知器25のリニアアレイセンサをダイ
ナミツクにスキヤンすることにより、同センサか
ら第8図S2のような信号が出力される。このた
め、比較回路34はセンサ出力S2と設定回路33
の判定レベルVLとを比較し記憶保持のための信
号を記憶出力部32に与える。従つて、記憶出力
部32からは第8図S3に示す信号S3bが出力され
るが、この記憶保持のないときの信号S3b′とそれ
ほど差がなく、圧延制御上問題がない。 Also, due to the difference in depth of the notch 11 of the object to be measured 10, the notch 11 is located at the plate edge presence/absence measurement line L.
3, but may not pass through the plate thickness measurement line L1. In this case, the radiation detector 24 outputs a plate thickness detection signal as shown in FIG. A signal like 2 is output. Therefore, the comparison circuit 34 outputs the sensor output S 2 and the setting circuit 33.
, and a signal for memory retention is provided to the memory output section 32. Therefore, the signal S 3 b shown in FIG. 8 S 3 is output from the memory output section 32, but it is not much different from the signal S 3 b ' when no memory is retained, and there is no problem in rolling control. .
なお、上記実施例では、板端検知部は板厚検出
部と一体にCフレーム21に設けたが、例えば設
置場所や検出系本体の小形化を図る観点からCフ
レーム21以外の適宜な部材或いは場所に設けて
もよい。また、放射線源22、光源23は上枠部
21bに、放射線検出器24、板端検知器25は
下枠部21aに取付けてもよい。さらに、板端検
知部は板厚検出部の上流側と下流側とに離して2
つ設ければ、信号処理系30の動作特性が極端に
遅くても本装置の目的を確実に達成できる。ま
た、記憶出力部32に遅延回路を設け、比較回路
34の出力の立下り時点より所定時間遅らせて記
憶保持を解除するようにしてもよい。また、板端
部の板厚測定ラインL1を固定することなく、C
フレーム21等に駆動装置を装備して板端検知器
25の出力に応じてCフレーム21等を被測定物
10の幅方向に移動させる構成とすることもでき
る。このようにすれば、例えば緩かな切欠き変化
に対しては常に板端から一定の距離に追随して板
厚を測定でき、急峻な切欠き変化に対してのみ本
装置の信号処理によつて解決することができる。
その他、本発明はその要旨を逸脱しない範囲で種
種変形して実施例できる。 In the above embodiment, the plate end detection part was provided integrally with the plate thickness detection part on the C frame 21, but from the viewpoint of reducing the installation location and the size of the detection system main body, for example, an appropriate member other than the C frame 21 or It may be set up at a location. Moreover, the radiation source 22 and the light source 23 may be attached to the upper frame part 21b, and the radiation detector 24 and the plate edge detector 25 may be attached to the lower frame part 21a. Furthermore, the plate edge detection unit is separated by two parts on the upstream and downstream sides of the plate thickness detection unit.
By providing one, the purpose of the present apparatus can be reliably achieved even if the operating characteristics of the signal processing system 30 are extremely slow. Alternatively, a delay circuit may be provided in the memory output section 32 to release the memory retention after a predetermined time delay from the falling point of the output of the comparison circuit 34. In addition, without fixing the plate thickness measurement line L1 at the plate end, C
It is also possible to adopt a configuration in which the frame 21 and the like are equipped with a drive device to move the C frame 21 and the like in the width direction of the object to be measured 10 in accordance with the output of the plate edge detector 25. In this way, for example, when there is a gradual notch change, the plate thickness can always be measured at a constant distance from the plate edge, and only when there is a steep notch change, the thickness can be measured by the signal processing of this device. It can be solved.
In addition, the present invention can be modified and implemented in various ways without departing from the gist thereof.
以上詳記したように本発明によれば、被測定物
の端部板厚を検出する厚み検出部よりも更に被測
定部幅方向端部側に板端検知部を設け、この板端
検知部で板端無しを検出後直ちに厚み検出部の出
力を保持して出力し、板端有りの検出で保持状態
を解除するようにしたので、被測定物の幅方向端
部に切欠き部が存在してもそれに影響されずに圧
延制御に使用できる信号を確実に得ることができ
る放射線厚み測定装置を提供できる。
As described in detail above, according to the present invention, a plate edge detection unit is provided further toward the widthwise end side of the measured part than the thickness detection unit that detects the edge plate thickness of the measured object, and this plate edge detection part The output of the thickness detection unit is held and output immediately after detecting that there is no plate edge, and the holding state is released when a plate edge is detected, so that a notch exists at the widthwise edge of the object to be measured. Therefore, it is possible to provide a radiation thickness measuring device that can reliably obtain a signal that can be used for rolling control without being affected by the above.
第1図は従来装置の一例を示す図、第2図およ
び第3図は従来装置の他の例を示す図、第4図な
いし第6図は本発明に係る放射線厚み測定装置の
一実施例を説明するために示したもので、第4図
の板厚および板端の検出系を示す正面図、第5図
は検出系による測定ラインを説明する上面図、第
6図は装置全体の構成を示すブロツク図、第7図
および第8図はそれぞれ本発明装置の動作を説明
するタイムチヤートである。
10……被測定物、11……切欠き部、20…
…検出系、22……放射線源、23……光源、2
4……放射線検出器、25……板端検知器、30
……信号処理系、31……信号処理部、32……
記憶出力部、33……設定回路、34……比較回
路。
FIG. 1 is a diagram showing an example of a conventional device, FIGS. 2 and 3 are diagrams showing other examples of the conventional device, and FIGS. 4 to 6 are examples of a radiation thickness measuring device according to the present invention. Figure 4 is a front view showing the plate thickness and plate edge detection system, Figure 5 is a top view explaining the measurement line by the detection system, and Figure 6 is the overall configuration of the device. 7 and 8 are time charts for explaining the operation of the apparatus of the present invention, respectively. 10...Object to be measured, 11...Notch, 20...
...Detection system, 22...Radiation source, 23...Light source, 2
4... Radiation detector, 25... Board edge detector, 30
... Signal processing system, 31 ... Signal processing section, 32 ...
Memory output section, 33...setting circuit, 34...comparison circuit.
Claims (1)
これら放射線発生器と放射線検出器との間で長手
方向に搬送される被測定物の幅方向端部における
板厚を検出する厚み検出部と、この厚み検出部の
前記被測定物における板厚検出の位置よりも前記
被測定物の幅方向端側の位置における前記被測定
物の切欠き部の有無を検知する切欠き検知部と、
この切欠き検知部からの切欠き有り信号を受けた
ときに前記放射線検出器からのこのときの信号を
保持しこの信号を出力しかつ前記切欠き検知部か
らの切欠き無しの信号を受けたときに前記放射線
検出器からの信号の保持を解除する記憶出力部と
を具備したことを特徴とする放射線厚み測定装
置。 2 切欠き検知部は、判別レベルを基準として被
測定物における幅方向端部の切欠き部の有無の信
号を記憶出力部に供給するように構成した特許請
求の範囲第1項記載の放射線厚み測定装置。 3 切欠き部検知部は、厚み検出部と一体に構成
した特許請求の範囲第1項記載の放射線厚み測定
装置。 4 切欠き部検知部は、厚み検出部と別体に構成
した特許請求の範囲第1項記載の放射線厚み測定
装置。 5 切欠き検出部は、厚み検出部の被測定物搬送
方向上流側及び下流側にそれぞれ配置した特許請
求の範囲第1項記載の放射線厚み測定装置。 6 記憶出力部は、切欠き検知部の被測定物幅方
向端部における切欠き部の無の信号を受け放射線
検出器の保持信号を解除する際、その解除時間を
一定時間遅延させるための遅延回路を有する特許
請求の範囲第1項記載の放射線厚み測定装置。[Scope of Claims] 1. A radiation generator and a radiation detector are disposed facing each other, and the plate thickness at the widthwise end of the object to be measured, which is conveyed in the longitudinal direction, is detected between the radiation generator and the radiation detector. a notch for detecting the presence or absence of a notch in the object to be measured at a position closer to the widthwise end of the object than the thickness detection position of the thickness detection section in the object to be measured; a detection section;
When a notch presence signal is received from the notch detection section, the current signal from the radiation detector is held and this signal is output, and when a notch presence signal is received from the notch detection section. A radiation thickness measuring device comprising: a storage output section that sometimes releases a signal from the radiation detector. 2. The radiation thickness according to claim 1, wherein the notch detection section is configured to supply a signal indicating the presence or absence of a notch at the widthwise end of the object to be measured to the storage output section based on the discrimination level. measuring device. 3. The radiation thickness measuring device according to claim 1, wherein the notch detection section is integrated with the thickness detection section. 4. The radiation thickness measuring device according to claim 1, wherein the notch detection section is configured separately from the thickness detection section. 5. The radiation thickness measuring device according to claim 1, wherein the notch detection section is disposed on the upstream side and the downstream side of the thickness detection section in the object conveyance direction, respectively. 6. The memory output section has a delay function for delaying the release time for a certain period of time when the holding signal of the radiation detector is released in response to the signal indicating the absence of the notch at the edge of the object in the width direction of the notch detection part. A radiation thickness measuring device according to claim 1, comprising a circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14445682A JPS5934106A (en) | 1982-08-20 | 1982-08-20 | Measuring device of radiation thickness |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14445682A JPS5934106A (en) | 1982-08-20 | 1982-08-20 | Measuring device of radiation thickness |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5934106A JPS5934106A (en) | 1984-02-24 |
| JPH0125005B2 true JPH0125005B2 (en) | 1989-05-16 |
Family
ID=15362668
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14445682A Granted JPS5934106A (en) | 1982-08-20 | 1982-08-20 | Measuring device of radiation thickness |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5934106A (en) |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4934350A (en) * | 1972-07-28 | 1974-03-29 |
-
1982
- 1982-08-20 JP JP14445682A patent/JPS5934106A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5934106A (en) | 1984-02-24 |
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