JPH0127366B2 - - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a surface reference device that causes a light beam to pass very close to a surface to be measured to form a light beam scanning surface that serves as a reference.

Conventionally, when leveling a floor surface, such as when leveling a concrete floor, a level is used to draw a horizontal reference line, and a wire is stretched based on this horizontal reference line, or a survey is carried out using a transistor. ing. However, although these methods can be applied to measure the height of the floor surface, it is difficult to measure slight irregularities on the wall surface or slight curvature of the ceiling surface, and they cannot be easily applied to the surface to be measured. There was a desire to create a measuring instrument that could measure unevenness and curvature.

The present invention has been made with the aim of realizing such a request.The mounting surface of this reference device is held in contact with the surface to be measured, and the light beam emitted from this reference device is held slightly away from the surface to be measured. The device is configured so that the unevenness or curved state of the surface to be measured can be detected from the position and shape of the irradiation line formed by the convex portion of the surface to be measured that the light beam hits. It is.

FIG. 1 is a longitudinal cross-sectional view of one embodiment of the present invention, in which 1 is a housing, 2 is a light beam generator, which is a helium or neon gas laser (hereinafter simply referred to as a laser), and 2a
is a support member, 2b is an optical axis adjustment screw of laser 2, and 3
is an offset optical system that offsets the laser beam L by a predetermined distance from the original optical axis, and in this example, it is composed of two reflecting mirrors 3a and 3b arranged in parallel. Reference numeral 4 denotes a rotational drive device which rotates the offset optical system 3 about the original incident optical axis and rotates the offset laser beam _L1 around the original incident optical axis. Hollow rotating shaft 4a accommodated in a hollow shaft
, a conductive disk 4b, a magnetic pole 4c, and a bearing 4d. Reference numeral 5 denotes a light reflector having a right-angled conical reflecting surface 5a, which is attached to protrude from the housing 1 with a connecting member 6 so that the axis of the right-angled conical reflecting surface 5a coincides with the optical axis of the laser beam L. The offset laser beam L ₁ passes through an annular transparent light 1 a formed in the housing 1 and is reflected by a right-angled conical reflecting surface 5 a at 90°.
As the offset optical system 3 rotates, this laser beam _L2 scans within a plane perpendicular to the optical axis of the laser beam _L1 . The bottom surface 5b of the light reflector 5 is formed parallel to the scanning plane of this laser beam _L2 , and constitutes the mounting reference surface S of this reference device.

When the bottom surface 5b of the light reflector 5 of the light beam plane reference device configured in this way is held pressed against the surface to be measured 7 and the rotation drive device 4 is energized, the laser beam L ₂ is directed to the mounting reference surface. A conventional method that scans 360 degrees in a parallel plane slightly away from S, strikes a convex part of the surface to be measured 7, and draws a pattern of irradiation lines on the wall surface according to the position and shape of the convex part. The laser beam on the surface to be measured 7 is determined based on the position and pattern of the irradiation line.
The distribution state of unevenness on the scanning surface of _L2 can be visually recognized.

Such a surface to be measured 7 is a wall surface on which a panel material is attached to the wall surface of a structure via a mounting member whose height is adjustable, and the mounting member is adjustable from the surface side of the panel material. If possible, adjust the height of the panel material while observing the irradiation ray pattern drawn on the wall by moving the mounting position of this flat reference device as appropriate to avoid errors of several millimeters. You can quickly adjust the plane within the plane.

In addition to this wall surface adjustment, it is also possible to adjust the unevenness of a floor surface that has a height adjustment mechanism, check the flatness or curved finished surface when plastering walls and floors, and make sure that the center part is slightly higher. A similar effect can be obtained by applying this method to checks when hanging a curved ceiling.

FIG. 2 is a longitudinal cross-sectional view of another embodiment of the present invention, in which the light beam generator 2 is composed of a high-intensity light source 8 such as a xenon lamp, and an optical system (forming the light beam L) consisting of a collimator, a focusing lens, etc. The offset optical system 3 is composed of a prism having two parallel reflecting surfaces inclined at 45 degrees with respect to the optical axis of the light beam L, and the light reflector 5 is a right-angled conical reflector. It is composed of a prism having a surface 5a, and 5d is the bottom surface 5b of the prism 5.
8a and 9a are supporting members, 8
b, 9b are optical axis adjustment screws.

The light beam plane reference device configured in this manner does not create a "shadow" caused by the member for supporting the light reflector 5 as in the embodiment of FIG. 1, and further increases the brightness of the light beam _L2 . This has the advantage of making it easier to handle, such as making it easier to visually recognize the radiation.

FIG. 3 is a longitudinal cross-sectional view of still another embodiment of the present invention, in which a light beam generator 2 is arranged horizontally with respect to the mounting reference plane S, and the light beam L is deflected by a reflecting mirror 10 and driven to rotate. A through hole 11 is formed in the hollow rotating shaft 4a by making it incident on the axis center line of the hollow rotating shaft 4a of the device 4 and deflecting it by 90 degrees with a reflecting mirror (light reflector) 5 disposed at the other end of the hollow rotating shaft 4a. A disk 4e configured to emit a light beam L ₂ from the rotary drive device 4 and having an armature winding formed by printed wiring;
A disk motor configured with a drive coil 4f is applied. Note that 12 is a level adjustment screw that supports the housing 1 at three points, and is used to hold the reference surface scanned by the light beam L ₂ on the surface to be measured 7 in a state slightly inclined with respect to the mounting reference surface S. It is.

The light beam plane reference device configured in this way can tilt the mounting reference surface S, which is supported in contact with the surface to be measured 7, in a desired direction with respect to the plane scanned by the light beam L. There is an advantage that flatness can be checked more easily by holding the reference device on the surface 7 to be measured while changing the direction in which it is inclined. By placing the light beam generator 2 horizontally, the distance between the level adjustment screws 12 can be widened, and the height of the reference device can be lowered, which has the advantage of making it easier to handle.

FIG. 4 is a longitudinal sectional view of another embodiment of the present invention, in which the optical system is simplified by applying a semiconductor laser to the light beam generator 2 and mounting it offset to the rotation axis 4g of the rotation drive device 4. It has a simple configuration and has a built-in power supply, making it cordless.

In the figure, 2 is a semiconductor laser, 13 is a mounting member, 14 is a slip ring for power supply, 15 is a brush, 16 is a power source for the semiconductor laser and the driving device 4, and the housing 1 includes a window 1b for adjusting the optical axis and a lid. 1c, and is provided with a protective lid 1d.

Note that the laser beam L ₁ emitted from the semiconductor laser
Since the one currently in practical use is infrared light,
To detect the position of the laser beam _L2 , it is necessary to use a photodetector equipped with an infrared photodetector.

In the above embodiments, the light reflector 5 is arranged at a position protruding from the housing 1, but the configuration is not limited to this. A through hole _or window that is arranged so as to be on the same plane as or in contact with the inner surface of the outer panel of the housing 1, and formed so that the light beam _L2 passes through the housing 1. It goes without saying that a structure in which the light is ejected from the inlet may also be used.

Furthermore, in the above embodiment, the light beam L 2 is deflected by 90 degrees with a light reflector, and the light beam L ₂ is scanned over a single plane. ₂ may be configured to scan a conical surface whose center line is the original optical axis.

As explained above, the present invention includes a light beam generator and a conical or flat reflective surface that is disposed at a position protruding from a housing or in contact with a housing surface and deflects an incident light beam by a predetermined angle. an offset optical system that makes a light beam offset a predetermined distance from the original optical axis enter the fixed conical light reflector; or a rotation drive device that rotates the planar light reflector. Equipped with
The device is characterized by a structure in which the light beam deflected by the light reflector is directed, so that conditions such as slight irregularities and curvature of the surface to be measured can be directly seen as a pattern of the light beam's irradiation line. effective.

[Brief explanation of drawings]

1 to 4 are longitudinal cross-sectional views of one embodiment of the present invention, respectively. Explanation of symbols, 1... Housing, 1a, 1b, 11...
...Through hole, 2...Light beam generator, 2a, 8a,
9a... Support member, 2b, 8b, 9b... Optical axis adjustment screw, 3... Offset optical system, 3a, 3b,
10...Reflector, 4...Rotary drive device, 4a...
Hollow rotating shaft, 5... Light reflector, 5a... Right-angled conical reflecting surface, 5b... Bottom surface, 6... Connecting member, 7...
Surface to be measured, 8... High-intensity light source, 9... Collimator, 12... Level adjustment screw.

Claims (1)

[Scope of Claims] 1. A light beam generator and a light beam having a conical reflecting surface or a flat reflecting surface that is disposed at a position projecting from the housing or in contact with the housing surface and deflecting the incident light beam by a predetermined angle. a reflector; and an offset optical system that makes a light beam offset a predetermined distance from the original optical axis enter the fixed conical light reflector, or a rotational drive device that rotates the planar light reflector. , a light beam surface reference device configured to rotate a light beam deflected by the light reflector; 2. The light beam according to claim 1, comprising a rotary drive device having a hollow rotating shaft in which a coaxial through hole is formed, and configured to cause the light beam to pass through the hollow rotating shaft and enter the light reflector. Surface reference device.