JPH0129266B2 - - Google Patents

Info

Publication number
JPH0129266B2
JPH0129266B2 JP56202106A JP20210681A JPH0129266B2 JP H0129266 B2 JPH0129266 B2 JP H0129266B2 JP 56202106 A JP56202106 A JP 56202106A JP 20210681 A JP20210681 A JP 20210681A JP H0129266 B2 JPH0129266 B2 JP H0129266B2
Authority
JP
Japan
Prior art keywords
test
pattern
adapter
printed wiring
wiring board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56202106A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58103671A (ja
Inventor
Akio Sano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP56202106A priority Critical patent/JPS58103671A/ja
Publication of JPS58103671A publication Critical patent/JPS58103671A/ja
Publication of JPH0129266B2 publication Critical patent/JPH0129266B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP56202106A 1981-12-15 1981-12-15 パタ−ンチエツカ−の制御方法 Granted JPS58103671A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56202106A JPS58103671A (ja) 1981-12-15 1981-12-15 パタ−ンチエツカ−の制御方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56202106A JPS58103671A (ja) 1981-12-15 1981-12-15 パタ−ンチエツカ−の制御方法

Publications (2)

Publication Number Publication Date
JPS58103671A JPS58103671A (ja) 1983-06-20
JPH0129266B2 true JPH0129266B2 (2) 1989-06-08

Family

ID=16452058

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56202106A Granted JPS58103671A (ja) 1981-12-15 1981-12-15 パタ−ンチエツカ−の制御方法

Country Status (1)

Country Link
JP (1) JPS58103671A (2)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61259597A (ja) * 1985-05-13 1986-11-17 株式会社日立製作所 プリント基板の配線方法
JP5276774B2 (ja) * 2005-11-29 2013-08-28 株式会社日本マイクロニクス 検査方法及び装置

Also Published As

Publication number Publication date
JPS58103671A (ja) 1983-06-20

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