JPH01295176A - Measuring machine - Google Patents
Measuring machineInfo
- Publication number
- JPH01295176A JPH01295176A JP63125587A JP12558788A JPH01295176A JP H01295176 A JPH01295176 A JP H01295176A JP 63125587 A JP63125587 A JP 63125587A JP 12558788 A JP12558788 A JP 12558788A JP H01295176 A JPH01295176 A JP H01295176A
- Authority
- JP
- Japan
- Prior art keywords
- turntable
- terminal
- workpiece
- chuck
- charging
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007600 charging Methods 0.000 claims abstract description 44
- 238000000926 separation method Methods 0.000 claims abstract description 13
- 238000005259 measurement Methods 0.000 claims description 36
- 239000004020 conductor Substances 0.000 claims description 2
- 125000004122 cyclic group Chemical group 0.000 claims description 2
- 230000005611 electricity Effects 0.000 abstract 1
- 239000003990 capacitor Substances 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 238000000034 method Methods 0.000 description 2
- 230000000630 rising effect Effects 0.000 description 2
- 230000002411 adverse Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
Description
【発明の詳細な説明】
■)・・・産業上の利用分野
本発明は、ワーク(主に、チップコンデンサー、小形積
層コンデンサー等)の容量、IR値等を高速自動、連続
的に測定する測定機に係り、多数の測定器ユニットを連
続回転(間欠回転ではない)するターンテーブルに放射
線状に備え、該ターンテーブルに連係してワーク供給装
置、1以上の測定装置、充電装置(充電ゾーン)及び分
離用ターンテーブル等を備えて、ターンテーブルが1回
転する間に、ワークの供給、測定、充電及び分離用テー
ブルへのワーク受渡し等を全て高速自動的かつ連続的に
行うようにしたことを特長とするものである。DETAILED DESCRIPTION OF THE INVENTION ■)...Industrial Application Field The present invention is a measurement system that continuously measures the capacitance, IR value, etc. of a workpiece (mainly chip capacitors, small multilayer capacitors, etc.) at high speed and automatically. In relation to the machine, a large number of measuring instrument units are arranged radially on a turntable that rotates continuously (not intermittently), and in conjunction with the turntable, a work supply device, one or more measuring devices, and a charging device (charging zone) are installed. and a separation turntable, etc., so that workpiece supply, measurement, charging, workpiece transfer to the separation table, etc. are all performed at high speed automatically and continuously during one rotation of the turntable. This is a feature.
■)・・・従来の技術とその課題
従来広く行われている測定方式は、
(1)・・・適宜の測定装置または充電装置の端子間に
適宜手段にてワークを1個宛供給し、端子を圧接して測
定、充電を行うものであり、従って、下記のような欠点
があった。■)... Conventional technology and its problems The measurement method that has been widely used in the past is: (1)... A single workpiece is supplied between the terminals of an appropriate measuring device or charging device by an appropriate means, Measurement and charging are carried out by press-contacting the terminals, and therefore there are the following drawbacks.
(i)、測定、充電毎に、何回もワークに端子を加圧接
触することとなって、ワークの損傷、加圧による悪影響
が生じる。(i) The terminal is brought into contact with the workpiece under pressure many times during each measurement and charging, resulting in damage to the workpiece and adverse effects due to the pressurization.
(ii ) 、ワークが極めて小さいためその供給配置
を1個毎に均等精密に行うのが困難であり、よって、測
定、充電値にバラつきを生じる。(ii) Since the workpieces are extremely small, it is difficult to uniformly and precisely supply them to each workpiece, resulting in variations in measurement and charging values.
(iii ) 、所定回数の測定、充電を行うのに時間
がかかって生産効率が悪く、装置も複雑大形で高価とな
る。(iii) It takes time to carry out measurements and charging a predetermined number of times, resulting in poor production efficiency, and the device is also complex, large and expensive.
(2)・・・また、上記方式をより効率的に行うべく、
1度に10個位のワークを測定装置、充電装置に整列配
置して、順々にまたは同時に測定、充電を行うことを繰
り返す方式も行われているが、装置が大げさで複雑、高
価となる上に、自動機として構成しにくく、また、自動
化したとしてもあくまで間欠的動作であり、よって、生
産効率を高めにくい欠点があった。(2)...Also, in order to perform the above method more efficiently,
There is also a method in which about 10 workpieces are arranged in a measuring device and a charging device at a time, and the measurement and charging are repeated one after another or simultaneously, but the device is bulky, complicated, and expensive. Moreover, it is difficult to configure as an automatic machine, and even if it is automated, it only operates intermittently, making it difficult to increase production efficiency.
そのため、ワークを高速自動、完全連続動で、かつ、1
個1個を均等精密に測定し得るような測定機の開発が強
く要望されてきたものである。Therefore, the workpiece can be moved automatically at high speed, completely continuously, and
There has been a strong demand for the development of a measuring machine that can measure each piece with uniform precision.
■)・・・本発明の構成
本発明は上記従来の課題を解決し、また従来の要望を満
足させ得る測定機を発明したものである。(2) Structure of the present invention The present invention solves the above-mentioned problems of the conventional art and has invented a measuring instrument that can satisfy the conventional demands.
(1)・・・即ち、本発明は、ワークを導線を兼ねたス
プリングの弾発力で開閉自在に挾持するチャックと、端
子を結線してなる測定器ユニットを、連続回転する円板
形ターンテーブルに放射状に等間隔に多数個備え、
該ターンテーブルにおける、チャック回動軌跡上の設定
位置にワーク供給装置を、端子回動軌跡上の1以上の設
定位置に測定装置を、端子回動軌跡上の設定角度範囲に
充電装置を夫々備え、
また、ターンテーブルのチャック回動軌跡下における最
後位測定装置とワーク供給装置間の設定位置に、ターン
テーブルと同期回転する分離用ターンテーブルを備えて
構成した測定機である。(1)...That is, the present invention provides a measuring instrument unit consisting of a chuck that can freely open and close a workpiece by the elastic force of a spring that also serves as a conducting wire, and a terminal connected to a continuously rotating disc-shaped turntable. A table is equipped with a large number of pieces arranged radially at equal intervals, and on the turntable, a work supply device is placed at a set position on the chuck rotation trajectory, a measuring device is placed at one or more set positions on the terminal rotation trajectory, and a workpiece feeding device is provided at a set position on the chuck rotation trajectory, and a measuring device is placed at one or more set positions on the terminal rotation trajectory. A charging device is provided in each of the above setting angle ranges, and a separation turntable that rotates in synchronization with the turntable is provided at a setting position between the rearmost measuring device and the workpiece supply device under the chuck rotation trajectory of the turntable. This is the configured measuring device.
(2)・・・次に、本発明の構成をその実施例(図面)
につき説明すると、ワークW(主にチップコンデンサー
)を導線を兼ねたスプリング1bの弾発力で開閉自在に
挾持するチャック1aと、端子1cを結線してなる測定
器ユニット1を、連続回転する円板形のターンテーブル
2の回転軸2aを中心とした放射線上に放射状に等間隔
に多数個備え、
該ターンテーブル2における、チャック回動軌跡2b上
の設定位置にワーク供給袋M3を、端子回動軌跡2c上
の1以上の設定位置に測定装置を4.4′を、端子回動
軌跡2c上の設定角度範囲に充電装置5を夫々備え、
また、ターンテーブル2のチャック回動軌跡2b下方に
おける最後位測定装置(図示、4′)とワーク供給装置
3間の設定位置に、ターンテーブル2と同期回転する分
離用ターンテーブル6を備えて、測定機を構成したもの
である。(2)...Next, the configuration of the present invention will be explained as an example (drawing).
To explain this, a chuck 1a that clamps a work W (mainly a chip capacitor) so that it can be opened and closed by the elastic force of a spring 1b that also serves as a conductor, and a measuring instrument unit 1 that is connected to a terminal 1c, are connected in a continuously rotating circle. A plurality of workpiece supply bags M3 are provided radially at equal intervals on a radial line centered on the rotation axis 2a of a plate-shaped turntable 2, and a work supply bag M3 is placed at a set position on the chuck rotation locus 2b of the turntable 2. A measuring device 4.4' is provided at one or more set positions on the movement locus 2c, and a charging device 5 is provided at a set angle range on the terminal rotation locus 2c. The measuring machine is provided with a separation turntable 6 that rotates synchronously with the turntable 2 at a set position between the rearmost measuring device (4' in the figure) and the work supply device 3.
(3)・・・測定器ユニット1は、例えば、開閉摺動自
在に備えた一対のプランジャ端子1dを加圧と電気接続
を兼ねたスプリング1bで受けてなるチャック1aと、
離隔して備えた端子1cを結線して設けたものであり、
プランジャ端子1d先端間にワークWの左右端子部を弾
力的にチャックするものである、
(4)・・・ワーク供給装置3は、適宜のフィダー等か
らワークWをターンテーブル2の各測定器ユニット1の
チャックlaに、1個宛整列(表裏、前後、極性等)供
給するものである。(3)...The measuring instrument unit 1 includes, for example, a chuck 1a formed by a pair of plunger terminals 1d that are slidably opened and closed and supported by a spring 1b that also serves as pressurization and electrical connection;
It is provided by connecting terminals 1c provided at a distance,
The left and right terminal portions of the workpiece W are elastically chucked between the tips of the plunger terminals 1d. One chuck la is supplied with alignment (front and back, front and rear, polarity, etc.) of each piece.
(5)・・・測定装置は、容量測定、IR測定等充電後
)等を行う適宜の測定装置4.4′を用い、その測定端
子4aが、下降してターンテーブル2の端子1cに接触
→端子1c、lc相互間寸法lをターンテーブル2と同
期移動(その間に測定)→上昇→原位置復帰→再び下降
してターンテーブル2の端子1cに接触のサイクル動を
ターンテーブルの回転と同期して行うものである。(5)...The measurement device uses an appropriate measurement device 4.4' that performs capacitance measurement, IR measurement, etc. (after charging), and its measurement terminal 4a descends and contacts the terminal 1c of the turntable 2. → Move the dimension l between terminals 1c and lc in synchronization with turntable 2 (measured during that time) → Raise → Return to original position → Lower again and synchronize the cycle movement of contacting terminal 1c of turntable 2 with the rotation of the turntable This is done by doing so.
(6)・・・充電装置5は、適宜の充電装置を端子回動
軌跡2c上の設定角度α°範囲間備えて、所定の時間及
び電圧の充電を行う充電ゾーン5aを形成したものであ
り、その充電端子が回転するターンテーブル2の各測定
器ユニット1の端子ICに摺動接触するものである。(6)...The charging device 5 is equipped with a suitable charging device within a set angle α° range on the terminal rotation locus 2c, and forms a charging zone 5a in which charging is performed for a predetermined time and voltage. , the charging terminal is in sliding contact with the terminal IC of each measuring instrument unit 1 of the rotating turntable 2.
(7)・・・また、分離用ターンテーブル6は、円板周
辺に沿ってシャッター付のワーク受取孔6aを等間隔に
備えたものであり、該受取孔6aの回動軌跡6bの一部
とターンテーブル2のチャック回動軌跡2bの一部を重
合して備え、ターンテーブル2と同期回転して、各チャ
ックlaが開いて釈放落下するワークWを各受取孔6a
に1個宛受取るものであり、
また、該分離用ターンテーブル6の受取孔回動軌跡6b
下方の設定角度β°の範囲に、所定測定値毎にワークW
を分離する複数のシュート7を受取孔6aと等間隔に備
え、受取孔6aが該当測定値のシュート7上にくるとシ
ャッターを開いてワークWをシュート7に落下するよう
にしたものである。(7)...Furthermore, the separation turntable 6 is provided with work receiving holes 6a with shutters at equal intervals along the periphery of the disc, and a part of the rotation locus 6b of the receiving holes 6a. and a part of the chuck rotation locus 2b of the turntable 2 are overlapped with each other, and each chuck la opens and releases a falling workpiece W by rotating in synchronization with the turntable 2 to each receiving hole 6a.
The receiving hole rotation locus 6b of the separating turntable 6 is
The workpiece W is set at each predetermined measurement value within the range of the downward setting angle β°.
A plurality of chutes 7 are provided at equal intervals to the receiving hole 6a, and when the receiving hole 6a comes over the chute 7 corresponding to the measured value, the shutter is opened and the workpiece W is dropped into the chute 7.
(8)・・・なお、測定装置の種類(容量、IR値など
)及び測定回数、また充電装置の種類、設置数及び充電
ゾーンの範囲等は、何れも実施例に限定されず、任意で
ある。(8)...The type of measuring device (capacity, IR value, etc.) and number of measurements, as well as the type of charging device, number of installations, range of charging zone, etc. are not limited to the examples and can be determined arbitrarily. be.
■)・・・作用
(1)・・・設定速度で連続回転するターンテーブル2
の各測定器ユニット1のチャック1aに対し、ワーク供
給装置3からワークWが1個宛供給され、チャック1a
のプランジャ端子16間にスプリング1cの弾発力で次
々とチャックされる。■)...Effect (1)...Turntable 2 that rotates continuously at a set speed
One workpiece W is supplied from the workpiece supply device 3 to the chuck 1a of each measuring instrument unit 1, and the chuck 1a
are chucked one after another between the plunger terminals 16 by the elastic force of the spring 1c.
(2)・・・ワークWをチャックした各測定器ユニット
lが1次測定装置4(例、容量測定)の位置に回動する
と、該測定装置4の測定端子4aが下降して端子1cに
接触し、測定器ユニット1対1の端子間寸法2だけ、接
触したままターンテーブル2の回転と同期移動し、その
間接触状態を維持して測定を行い、次いで離隔上昇し、
原位置に復帰し、再び次位の測定器ユニット1の端子1
cに下降接触するサイクル動作を繰り返して、次々とワ
ークの測定を行う。(2)...When each measuring device unit l that chucks the workpiece W rotates to the position of the primary measuring device 4 (e.g., capacity measurement), the measuring terminal 4a of the measuring device 4 descends and connects to the terminal 1c. The measuring instrument unit moves synchronously with the rotation of the turntable 2 by the distance 2 between the terminals of the measuring unit 1 to 1, maintains the contact state during that time, performs measurement, and then separates and rises.
Returns to the original position and connects terminal 1 of the next measuring instrument unit 1 again.
The cycle of descending into contact with c is repeated, and the workpieces are measured one after another.
(3)・・・続いて、上記各測定器ユニット1が充電装
置5の位置に回動すると、該装置5の充電端子(ばね片
状、ブラシ状等)が端子1cに摺動接触し、充電ゾーン
5aの通過中に所定時間及び所定電圧の充電が行われる
。(3)...Subsequently, when each measuring instrument unit 1 is rotated to the position of the charging device 5, the charging terminal (spring piece shape, brush shape, etc.) of the device 5 slides into contact with the terminal 1c, Charging is performed for a predetermined time and at a predetermined voltage while passing through the charging zone 5a.
(4)・・・次で、充電済ワークをチャックした各測定
器ユニット1が2次測定装置4′ (例、IR測定等の
位置に回動して、上記(2)項記載と同じく測定端子4
aがサイクル動を繰り返して、ワークWの測定が行われ
る。(4)...Next, each measuring instrument unit 1 that has chucked the charged workpiece is rotated to the secondary measuring device 4' (for example, the position for IR measurement, etc.), and the measurement is performed in the same manner as described in (2) above. terminal 4
The workpiece W is measured by repeating the cycle motion.
(5)・・・次に、上記測定器の各測定器ユニット1の
チャック1aが、ターンテーブル2と同期回転する分離
用ターンテーブル6の受取孔6a位置にくると、チャッ
ク1aが開いてワークWを受取孔6a中に釈放落下する
。(5)...Next, when the chuck 1a of each measuring instrument unit 1 of the above-mentioned measuring instrument comes to the receiving hole 6a position of the separation turntable 6 which rotates in synchronization with the turntable 2, the chuck 1a opens and the workpiece is removed. The W is released and falls into the receiving hole 6a.
(6)・・・ワークWを次々と各受取孔6aに受取った
分離用ターンテーブル6が回転して、シュート7位置に
くると、該当測定値シュート位置でシャッターが開き、
よって、ワークWは測定値毎のシュートに分離されて落
下送給される。(6) When the separation turntable 6 that has received the workpieces W one after another into each receiving hole 6a rotates and comes to the chute 7 position, the shutter opens at the corresponding measured value chute position,
Therefore, the workpiece W is separated into chutes for each measurement value and is fed down.
(7)・・・上記(1)〜(6)項の作用は、連続回転
するターンテーブル2の各測定器ユニット1に対し次々
と行われるワークWの供給に引続いて、全て連続的に行
われ、よって、ターンテーブル2が1回転する間に各ワ
ークWは1個1個、均等精密に測定、充電、測定され、
測定値に従って分類されるものである。(7)...The effects of the above (1) to (6) are all carried out continuously following the supply of workpieces W to each measuring instrument unit 1 of the continuously rotating turntable 2. Therefore, each workpiece W is uniformly and accurately measured, charged, and measured one by one during one rotation of the turntable 2.
They are classified according to their measured values.
■)・・・効果
(1)・・・連続回転する1台のターンテーブル上でワ
ークの測定、充電、そして分類等を、全て高速自動かつ
連続的に行い得るものであるから、1個1個のチップの
測定が精密均等に行われる極めて秀れた特長がある。■)...Effects (1)...Measurement, charging, and sorting of workpieces can all be performed automatically and continuously at high speed on a single continuously rotating turntable, so each workpiece can be It has an extremely excellent feature of precisely and evenly measuring individual chips.
(2)・・・よって、ワークの測定等を従来方式に比し
数倍する高速度で高精度に行い得る利点があり、また、
測定機全体を簡潔に、コンパクトに構成し得る。(2)...Therefore, there is an advantage that workpiece measurements can be performed with high accuracy and at a speed several times higher than that of conventional methods.
The entire measuring device can be configured simply and compactly.
(3)・・・各測定器ユニットは、ターンテーブルに放
射状に多数個設置したものであっても、個々に独立した
構成をなしているものであり、該ユニットにワークを供
給して当初にチャックしたままの状態で、ターンテーブ
ルと共に1回転する間に測定、充電、分離等の全操作を
行うものであるので、ワークを安定的に保持したままで
測定その他を行い得て、ワーク毎にハラつきのない、高
精度、高均質の測定等を実現し得る。(3)...Each measuring instrument unit has an independent configuration, even if a large number of them are installed radially on the turntable, and the workpiece is supplied to the unit and initially Since all operations such as measurement, charging, and separation are performed during one rotation with the turntable while the workpiece is still chucked, it is possible to perform measurements and other operations while holding the workpiece stably, and it is possible to It is possible to achieve high precision, high uniformity measurements, etc. without any disturbance.
(4)・・・測定装置の測定端子は、前記の如く、下降
接触→同期移動→離隔上昇→復元のサイクル動を、ター
ンテーブルの回転速度と同期して行うようにしたので、
測定端子と測定器ユニットの端子の接触は、いわば静止
位置における下降接触→設定時間接触維持→離隔上昇の
作用と、同等の条件で行われることとなり、よって、均
等で安定的な測定が可能となった。(4)...As mentioned above, the measuring terminal of the measuring device performs the cyclic movement of descending contact → synchronous movement → separating and rising → restoring in synchronization with the rotational speed of the turntable.
The contact between the measurement terminal and the terminal of the measuring instrument unit is made under the same conditions as descending contact at a stationary position → maintaining contact for a set time → separating and rising. Therefore, even and stable measurements are possible. became.
なお、測定のための測定端子と測定器ユニットの端子の
接触を、摺動接触で行うと、ノイズ発生や接触不良、不
均等の恐れがあるが、この点、本発明は上記方式によっ
てその恐れを無くし得た。Note that if the measuring terminal for measurement and the terminal of the measuring instrument unit are brought into contact by sliding contact, there is a risk of noise generation, poor contact, or uneven contact. I was able to eliminate it.
(5)・・・IR測定等ためのワークの充電は、目的と
する測定値を得るために、所定時間の充電及び所定電圧
の充電が必要とされるが、本発明は連続回転するターン
テーブルの回転速度との関係において、設定角度範囲の
充電ゾーンを適宜設定して充電装置を備えることによっ
て、所期の目的に対応し得る特長がある。(5)...Charging a workpiece for IR measurement etc. requires charging for a predetermined time and charging to a predetermined voltage in order to obtain the desired measurement value, but the present invention uses a continuously rotating turntable. In relation to the rotational speed, by appropriately setting a charging zone within a set angle range and providing a charging device, there is an advantage that the intended purpose can be met.
即ち、ターンテーブルの回転速度の調節、充電ゾーンの
設定角度範囲の調節、更にはターンテーブルの径の大小
、測定器ユニ7)の設置数及び間隔の調節等によって、
如何様な充電時間、電圧にも設定可能な特長がある。That is, by adjusting the rotational speed of the turntable, adjusting the set angle range of the charging zone, and further adjusting the diameter of the turntable, the number and spacing of the measuring unit units 7), etc.
It has the advantage of being able to set any charging time and voltage.
第1図は本発明の構成概略を示す説明平面図、第2図は
測定器ユニットの構成説明図、第3図は測定装置の測定
端子の作用説明図である。
付号
W・・・ワーク(主に1、チップコンデンサー)、P・
・・端子IC1IC間寸法、α°・・・充電ゾーンの設
定角度範囲、β°・・・シュートの設定角度範囲、
1・・・測定器ユニット、1a・・・チャック、1b・
・・スプリング、1c・・・端子、ld・・・プランジ
ャ端子、2・・・ターンテーブル、2a・・・回転軸ミ
2b・・・チャック回転軌跡、2c・・・端子回動軌跡
、3・・・ワーク供給装置、4・・・測定装置(例、容
量)、4′・・・測定装置(例、rR値)、5・・・充
電装置、5a・・・充電ゾーン、6・・・分離用ターン
テーブル、6a・・・受取孔、6b・・・受取孔回動軌
跡、7・・・シュート。FIG. 1 is an explanatory plan view showing the general configuration of the present invention, FIG. 2 is an explanatory view of the configuration of a measuring instrument unit, and FIG. 3 is an explanatory view of the operation of the measuring terminal of the measuring device. Number W... Work (mainly 1, chip capacitor), P...
...Dimensions between terminals IC1IC, α°...Charging zone setting angle range, β°...Chute setting angle range, 1...Measuring instrument unit, 1a...Chuck, 1b...
...Spring, 1c...Terminal, ld...Plunger terminal, 2...Turntable, 2a...Rotating axis 2b...Chuck rotation locus, 2c...Terminal rotation locus, 3. ... Work supply device, 4... Measuring device (e.g. capacity), 4'... Measuring device (e.g. rR value), 5... Charging device, 5a... Charging zone, 6... Separation turntable, 6a... Receiving hole, 6b... Receiving hole rotation locus, 7... Chute.
Claims (6)
閉自在に挾持するチャックと、端子を結線している測定
器ユニットを、連続回転する円板形ターンテーブルに放
射状に等間隔に多数個備え、 該ターンテーブルにおける、チャック回動軌跡上の設定
位置にワーク供給装置を、端子回動軌跡上の1以上の設
定位置に測定装置を、端子回動軌跡上の設定角度範囲に
充電装置を夫々備え、また、ターンテーブルのチャック
回動軌跡下における最後位測定装置とワーク供給装置間
の設定位置に、ターンテーブルと同期回転する分離用タ
ーンテーブルを備えた、 測定機。(1) A chuck that can open and close a workpiece using the elastic force of a spring that also serves as a conductor, and a measuring instrument unit that connects terminals are arranged radially at equal intervals on a continuously rotating disc-shaped turntable. A work supply device is provided at a set position on the chuck rotation locus on the turntable, a measuring device is placed at one or more set positions on the terminal rotation locus, and a charging device is provided at a set angle range on the terminal rotation locus. and a separation turntable that rotates in synchronization with the turntable at a set position between the rearmost measuring device and the workpiece supply device under the chuck rotation locus of the turntable.
のプランジャ端子を加圧と電気接続を兼ねたスプリング
を受けてなるチャックと、離隔して、備えた端子を結線
して設けたものであり、プランジャ端子先端間にワーク
の左右端を弾力的にチャックするものである、 測定機。(2) The measuring instrument unit has a pair of plunger terminals that can be slid open and closed, connected to a chuck that receives a spring that also serves as pressurization and electrical connection, and the terminals that are separated from each other. A measuring device that elastically chucks the left and right ends of a workpiece between the plunger terminal tips.
クをターンテーブルの各測定器ユニットのチャックに、
1個宛整列供給するものである、測定機。(3) The chip supply device feeds the workpiece from an appropriate feeder, etc. to the chuck of each measuring instrument unit on the turntable.
A measuring machine that aligns and supplies one piece at a time.
の測定装置を用い、その測定端子が、下降してターンテ
ーブルの端子に接触→端子相互間寸法ターンテーブルと
同期移動(その間に測定)→上昇→原位置復帰→再び下
降してターンテーブルの端子に接触のサイクル動をター
ンテーブルの回転と同期して行うものである、 測定機。(4) The measurement device uses an appropriate measurement device that performs capacitance measurement, IR measurement, etc., and its measurement terminal descends and contacts the terminal of the turntable → the dimension between the terminals moves synchronously with the turntable (during which This is a measuring device that performs a cyclic movement in synchronization with the rotation of the turntable: → rise → return to original position → lower again and contact the terminal of the turntable.
の設定角度範囲間備えて、所定の時間及び電圧の充電を
行う充電ゾーンを形成したものであり、その充電端子が
回転するターンテーブルの各測定器ユニットの端子に摺
動接触するものである、 測定機。(5) The charging device is equipped with an appropriate charging device within a set angle range on the terminal rotation locus to form a charging zone in which charging is performed for a predetermined time and voltage, and the charging terminal rotates. A measuring device that makes sliding contact with the terminals of each measuring device unit on the turntable.
ャッター付のワーク受取孔を等間隔に備えたものであり
、該受取孔の回動軌跡の一部とターンテーブルのチャッ
ク回動軌跡の一部を重合して備え、 ターンテーブルと同期回転して、各チャックが開いて釈
放落下するワークを各受取孔に1個宛受取るものであり
、 また、該分離用ターンテーブルの受取孔回動軌跡下方の
設定角度範囲に、所定測定値毎にワークを分離する複数
のシュートを受取孔と等間隔に備え、受取孔が該当測定
値シュート上にくるとシャッターを開いてワークをシュ
ートに落下するようにしたものである、 測定機。(6) The separation turntable is equipped with work receiving holes with shutters at equal intervals along the periphery of the disk, and a part of the rotation trajectory of the receiving holes and the chuck rotation trajectory of the turntable are The chuck rotates in synchronization with the turntable, and each chuck opens to receive one falling workpiece into each receiving hole. In the set angle range below the moving trajectory, multiple chutes are provided at equal intervals with the receiving hole to separate the workpiece for each predetermined measurement value, and when the receiving hole comes over the corresponding measurement value chute, the shutter is opened and the workpiece is dropped into the chute. A measuring device designed to do this.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63125587A JPH01295176A (en) | 1988-05-23 | 1988-05-23 | Measuring machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63125587A JPH01295176A (en) | 1988-05-23 | 1988-05-23 | Measuring machine |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH01295176A true JPH01295176A (en) | 1989-11-28 |
Family
ID=14913868
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63125587A Pending JPH01295176A (en) | 1988-05-23 | 1988-05-23 | Measuring machine |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01295176A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0555077U (en) * | 1991-12-24 | 1993-07-23 | シーケーディ株式会社 | Electrode device for charging, discharging, and measuring capacitor elements |
| US5410261A (en) * | 1991-07-09 | 1995-04-25 | Sumitomo Electric Industries, Ltd. | Semiconductor device testing apparatus |
| JP2003337153A (en) * | 2002-05-20 | 2003-11-28 | Murata Mfg Co Ltd | Characteristic measuring method and characteristic measuring apparatus of chip component |
| JP2007298498A (en) * | 2006-04-27 | 2007-11-15 | Kuan-Chieh Su | Method for reducing flaw when testing smd type passive element and test system |
-
1988
- 1988-05-23 JP JP63125587A patent/JPH01295176A/en active Pending
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5410261A (en) * | 1991-07-09 | 1995-04-25 | Sumitomo Electric Industries, Ltd. | Semiconductor device testing apparatus |
| US5457401A (en) * | 1991-07-09 | 1995-10-10 | Sumitomo Electric Industries, Ltd. | Semiconductor device testing apparatus |
| JPH0555077U (en) * | 1991-12-24 | 1993-07-23 | シーケーディ株式会社 | Electrode device for charging, discharging, and measuring capacitor elements |
| JP2003337153A (en) * | 2002-05-20 | 2003-11-28 | Murata Mfg Co Ltd | Characteristic measuring method and characteristic measuring apparatus of chip component |
| JP2007298498A (en) * | 2006-04-27 | 2007-11-15 | Kuan-Chieh Su | Method for reducing flaw when testing smd type passive element and test system |
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