JPH01308043A - Boat replacing device for semiconductor wafer - Google Patents

Boat replacing device for semiconductor wafer

Info

Publication number
JPH01308043A
JPH01308043A JP63139659A JP13965988A JPH01308043A JP H01308043 A JPH01308043 A JP H01308043A JP 63139659 A JP63139659 A JP 63139659A JP 13965988 A JP13965988 A JP 13965988A JP H01308043 A JPH01308043 A JP H01308043A
Authority
JP
Japan
Prior art keywords
boat
wafer
heat treatment
wafers
saucer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63139659A
Other languages
Japanese (ja)
Inventor
Masaaki Sadamori
貞森 将昭
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP63139659A priority Critical patent/JPH01308043A/en
Publication of JPH01308043A publication Critical patent/JPH01308043A/en
Pending legal-status Critical Current

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  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、半導体ウェハの熱処理ボートを使用した立
替手段に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a replenishment means using a heat treatment boat for semiconductor wafers.

〔従来の技術〕[Conventional technology]

第3因は従来より広範囲に用いられて来た熱処理ボート
で石英ガラス等の耐熱別科で構成され、通常は受皿上に
保存されて汚染防止が図られている。使用時は石英管等
の熱処理管にF、f4して拡散、醒化、CVD、シンタ
ー等、ウェハプロセスに必要な高熱処理が行なわれる。
The third factor is a heat treatment boat that has been widely used in the past, and is made of heat-resistant material such as quartz glass, and is usually stored on a saucer to prevent contamination. When in use, a heat treatment tube such as a quartz tube is heated with F, F4, and high heat treatments necessary for wafer processing, such as diffusion, aqueousization, CVD, and sintering, are performed.

同図に於て、(1)はウェハで(2)は熱処理ボート、
(3)は石英管、(5ハエ石英カラス製の受皿でみる。
In the figure, (1) is the wafer, (2) is the heat treatment boat,
(3) is viewed using a quartz tube and a (5-flies) quartz crow saucer.

次に従来ボートの作用について説明する。第4−A図及
び第、i−8図は熱処理ボート(2〕のウエノ1支持棒
(2a)及び(2b)と溝(2C)、(2d)及び(2
e)の詳細を示し、ウェハ(1)は溝(2c) 、(2
d)及び(2e)に支持されるが、熱処理中に極力ウェ
ハ(1)が傾斜しない棒に比較的狭い溝幅に仕上げられ
ている。即ち、溝幅カ広いとウェハ(1)が傾斜して隣
接ウェハと接触したり、逆に大きく離反してウェハ相互
の間隔がはらつく結果、−様な熱処理や拡散、酸化等の
効果が得られないのである。近辺ウェハの大口径化が進
み、ウェハの口径は8乃至10インチになるとウェハの
わずかな傾きでも大きくウェハ相互の間隔に影響するこ
とは明白である。
Next, the operation of the conventional boat will be explained. Figures 4-A and 1-8 show the Ueno 1 support rods (2a) and (2b) of the heat treatment boat (2) and the grooves (2C), (2d) and (2).
e), the wafer (1) has grooves (2c), (2
d) and (2e), the wafer (1) is finished with a relatively narrow groove width on a rod that does not tilt as much as possible during heat treatment. In other words, if the groove width is wide, the wafer (1) will tilt and come into contact with the adjacent wafer, or conversely, the wafer (1) will separate greatly and the distance between the wafers will fluctuate, resulting in negative effects such as heat treatment, diffusion, and oxidation. It cannot be done. It is clear that as the diameter of neighboring wafers becomes larger and the diameter of the wafers reaches 8 to 10 inches, even a slight tilt of the wafers will greatly affect the distance between the wafers.

しかし乍ら、溝が狭く仕上げられると逆にウェハ、即ち
大部分はシリコンで構成されるが、これの熱膨会率とh
英ボートとのそれは差か大きくてシリコンより成るウェ
ハの方が大きいため、熱処理中に於て、ウェハを溝が圧
迫し締め付ける現象が生じる。
However, if the groove is finished narrowly, the thermal expansion coefficient of the wafer, which is mostly made of silicon, and h
There is a big difference between this and the British boat, as the wafer made of silicon is larger, so the grooves compress and tighten the wafer during heat treatment.

この様な現象は半導体の材料特性上極めて好ましくなく
、まず結晶に対して欠陥を増大して電気的特性を損うほ
か、不純物のドーピング、酸化皮膜の形成に際してマス
ク効果となり、結果的に電気的特性、外観特性等の不具
合を招くものである。
Such a phenomenon is extremely unfavorable due to the material properties of semiconductors, and first of all, it increases defects in the crystal and impairs electrical characteristics.It also causes a masking effect when doping impurities and forming an oxide film, resulting in electrical This leads to defects in characteristics, appearance characteristics, etc.

ところで溝幅を緩やかにすると前述したウェハが傾く問
題の他に、ボート上のウェハを一括して把持してビンセ
ットを使わない合理的立替が不利になる。これは第5図
に示す様に一括把持具(4)の溝(4a)にウェハ(1
)が入りにくいからである。尚、(4b)はウェハを拘
えた際の1時固定板、(4C)はそれの出入口たるスリ
ットであり、ボート(2)上のウェハ(2)の上方にか
ぶせて掴み取ったり、逆にボート(2)上に載置するの
に有効なものである。
By the way, if the groove width is made gentler, in addition to the above-mentioned problem of the wafers being tilted, it becomes disadvantageous to hold the wafers on the boat all at once and to rationally transfer the wafers without using a bin set. As shown in Figure 5, the wafer (1
) is difficult to enter. In addition, (4b) is the temporary fixing plate when holding the wafer, and (4C) is the slit that is the entrance and exit of the plate. It is useful for mounting on the boat (2).

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

従って、従来の半導体ウェハのボート立替装置は、溝形
状に不可抗力的な面か存在して特にウェハのボートに接
する近辺では電気的、外観的特性不良が多いなど課題が
多かった。又、溝幅が比較的広いときはウェハの傾斜に
より一括立替えが出来ないと言う課題があった。
Therefore, the conventional semiconductor wafer boat reversing device has many problems, such as the existence of irresistible surfaces in the groove shape, and many defects in electrical and external characteristics, especially in the vicinity of the wafer in contact with the boat. Furthermore, when the groove width is relatively wide, there is a problem in that it is not possible to replace the wafer all at once due to the inclination of the wafer.

この発明は上記課題を解消せんとするもので、ウェハの
保持溝による電気的、外観的特性を損なわす、しかも−
括立替えが簡単な半導体ウェハのボート立替装置を得る
ことが目的である。
This invention aims to solve the above-mentioned problem, and the electrical and external characteristics of the wafer holding groove are impaired, and -
The purpose of the present invention is to obtain a semiconductor wafer boat transfer device that allows easy bulk transfer.

〔課題を解決するための手段〕[Means to solve the problem]

この発明に係る半導体ウェハのボート立替装置は、ウェ
ハの外周部両端と底部とを夫々保持する〜字状溝を有す
る少なくとも3本の棒状体からなるボート、このボート
を載に、シ、上記ボートの下部開口に対向するり9口が
底部に形成された受皿、及びこの受皿のり日日に対向し
、上記ボートのV字状溝と一致してV字状溝か形成され
、上記受皿のtJiJ口を貫通して上記ウェハを上方へ
押し上げる押し上げ手段を備えたものである。
A semiconductor wafer boat refurbishing device according to the present invention includes a boat consisting of at least three rod-shaped bodies each having a ~-shaped groove that holds both ends and a bottom of a wafer, and a boat on which the boat is placed. A saucer with nine openings formed on the bottom facing the lower opening of the saucer, and a V-shaped groove facing the saucer and coinciding with the V-shaped groove of the boat; The device is equipped with a pushing means for penetrating the opening and pushing the wafer upward.

〔作用〕[Effect]

この発明に於ける7字形溝ではその溝の稜の箇所iこウ
ェハのエツジの部分が点接触してウェハ保持が行なわれ
る。この場合、ウェハは左右端部まで保持しないとウェ
ハを立位に保持出来ないが、左右端部まで熱処理ボート
の棒状体が位置すると一括把持操作が出来ない。この為
に受皿を貫通してウェハの下部より押し上げ装置をセッ
トすることによりウェハを熱処理ボートより離脱せしめ
て一括把持が行なわれる。尚、熱処理ボートは受皿上に
載置したまま上記操作を行うので、熱処理ボートをされ
って汚染することが無い。
In the 7-shaped groove according to the present invention, the edge of the wafer is brought into point contact with the ridge of the groove to hold the wafer. In this case, the wafers cannot be held in an upright position unless the wafers are held up to the left and right ends, but if the rod-like body of the heat treatment boat is positioned up to the left and right ends, the collective gripping operation is not possible. For this purpose, the wafers are removed from the heat treatment boat by penetrating the tray and setting a push-up device from below the wafers, and the wafers are collectively gripped. Incidentally, since the above operation is performed while the heat treatment boat is placed on the saucer, the heat treatment boat is not contaminated by being contaminated.

〔発明の実施例〕[Embodiments of the invention]

以下、本発明の一実施例を説明する3、第1図は本発明
の一実施例を示す斜視図で、熱処理後のウェハ(1)を
次工程運搬用のウェハキャリヤ(6)に立替える迄の一
連の過程を説明する。
Hereinafter, an embodiment of the present invention will be described. 3. Figure 1 is a perspective view showing an embodiment of the present invention, in which a wafer (1) after heat treatment is transferred to a wafer carrier (6) for transportation to the next process. The series of processes up to this point will be explained.

ます熱処理後のウェハ(1)は熱処理ボートwに載置さ
れた状態で、受皿■に載置される。受皿鵜の下部には4
本の位置決めビン(SOa)があり、この受皿β1を押
し上げ装置(7)上にセットして位置決めビン(50a
)と同じく4個の位置決め大(7a)と合わせる。
The wafer (1) after the heat treatment is placed on the heat treatment boat w and placed on the saucer (2). There are 4 at the bottom of the saucer.
There is a book positioning bin (SOa), and this tray β1 is set on the pushing device (7) and the book positioning bin (50a) is placed on the book positioning bin (SOa).
) and the same four positioning larges (7a).

この段階で受皿−の底入(sob)と押し上げアタッチ
メント(7b)とが合致する。尚、都し上げアタッチメ
ント(7b)にはウェハ(1)の保持溝(7C)が円弧
状に形成されていて、そのピッチは熱処理ボート翰の各
V字形溝(20C)、 (20d)、(2oh)及び(
20i)ノピッチとあらかじめ合わせてあり、更に一括
把持具(4)及びウェハキャリヤ(6)の溝(4a)及
び(6a)とも合致する様にしてあり、例えばV16イ
ンチが汎用性がある。
At this stage, the bottom of the saucer (sob) and the push-up attachment (7b) match. In addition, the holding groove (7C) for the wafer (1) is formed in the lifting attachment (7b) in an arc shape, and the pitch thereof is equal to the pitch of each V-shaped groove (20C), (20d), (20d), ( 2oh) and (
20i) It is pre-adjusted to the pitch, and is also made to match the grooves (4a) and (6a) of the bulk gripper (4) and the wafer carrier (6), for example, V16 inch is versatile.

次に熱処理ボート四を微動させて各7字形溝(20C)
Next, slightly move the heat treatment boat 4 to create each 7-shaped groove (20C).
.

(20d) 、 (2oh)及び(20i)のピッチと
押し上げアタッチメントの保持溝(7C)とを合わせて
、押し上は装置t (7)を作動させると内蔵している
エヤーシリンダーのプランジャ(7d)が上昇してウェ
ハ(1)を−括して押し上げアタッチメント(7C)上
に載置して、熱処理ボート■より離脱せしめる。
When the pitches of (20d), (2oh) and (20i) are aligned with the holding groove (7C) of the push-up attachment, and the device t (7) is activated, the built-in air cylinder plunger (7d) is pushed up. The wafer (1) is lifted up, placed on the push-up attachment (7C), and removed from the heat treatment boat (2).

しかる後に一括把持具(4)をその保持溝(4a)内に
押し上けられたウェハ(1)を拘え込む様にかぶせ、−
時固定板(4b)を閉じてウェハキャリヤ(6)上に相
互のn (4a)及び(6a)を合わせる。そして、−
時固定板を緩めるとウェハ(1)は−括して一括把持具
(4)からウェハキャリヤ(りに立替えられる。
After that, the batch gripper (4) is placed in the holding groove (4a) so as to hold the wafer (1) pushed up, and -
Close the fixing plate (4b) and align mutual n (4a) and (6a) on the wafer carrier (6). And -
When the fixing plate is loosened, the wafers (1) are transferred from the collective gripping tool (4) to the wafer carrier.

ウェハキャリヤ(ljJから熱処理ボート翰に立替える
には以上の操作を逆にすればよい。
To replace the wafer carrier (ljJ) with the heat treatment boat handle, the above operations can be reversed.

第2−A図♀2−B図、第2−C図及び第2−6図は本
発明に基づく熱処理ボー、トの一部を示し、第2−A図
は平面図、第2−B図は斜視図、第2−C図は正面図、
及び第z−d図は側面図である。
Figure 2-A, Figure 2-B, Figure 2-C, and Figure 2-6 show a part of the heat treatment board based on the present invention, and Figure 2-A is a plan view, and Figure 2-B is a plan view. The figure is a perspective view, Figure 2-C is a front view,
and z-d are side views.

同一に於て熱処理ボート翰の棒状体(20a)、 (2
0b)、 (2Of)及び(20g)のウェハ(1)に
当接する部分には■字形の溝(20C)、 (20d)
、 (20h)及び(20i)が堀設してあり、ウェハ
(1)は各■字形溝の内面の稜部分と点接触により保持
される。
At the same time, the rod-shaped body of the heat-treated boat (20a), (2
0b), (2Of) and (20g) have ■-shaped grooves (20C), (20d) in the parts that contact the wafer (1).
, (20h) and (20i) are provided, and the wafer (1) is held by point contact with the ridge portion of the inner surface of each ■-shaped groove.

尚、上記実施例では熱処理ボートを構成する棒状体は4
本にて説明したが、ウェハの立位に対して最少左、右、
下部の3本あれは良いことになる。
In the above example, the number of rod-shaped bodies constituting the heat treatment boat is 4.
As explained in the book, the minimum left, right,
Those three at the bottom are a good thing.

但しこの場合、押し上げアタッチメントは2分割する等
の処置が必要である。又、熱処理ボートや受皿の材料は
石英ガラスで説明したが、これに限らずシリコンカーバ
イド、多結晶シリコン、セラミック等の材料でも効果は
同じである。
However, in this case, it is necessary to take measures such as dividing the push-up attachment into two parts. Moreover, although the material of the heat treatment boat and the saucer is described as quartz glass, the same effect can be achieved with materials such as silicon carbide, polycrystalline silicon, and ceramics.

史に又、−括把持具は発明者による公知のものであるが
その他の方式による一括把持具でも良く、この−括把持
具から他のボート類へ直接立替えても良い。
Historically, the bulk gripper is known by the inventor, but other types of bulk grippers may also be used, and this bracket gripper may be directly transferred to other boats.

更に又、立替えの前又は中途及び後で77セツトを揃え
ることは何らさしつかえない。
Furthermore, there is no problem in preparing the 77 sets before, during, or after the advance payment.

更に又、ウェハを押し上げて立替える単位量は熱処理ボ
ートに載置したウェハの全量でも部分的でも本発明の趣
旨を免税しないし、押し上げる機構はエヤーシリンダに
限ら1、油圧、てこその他の手段でもウェハを汚染した
り、衝撃を与えなけれは構わない。
Furthermore, the unit amount by which the wafers are pushed up and placed on the heat treatment boat does not exempt the purpose of the present invention, whether it is the whole amount or a portion of the wafers placed on the heat treatment boat, and the mechanism for pushing up is limited to an air cylinder1, and may not be carried out by hydraulic pressure, levers, or other means. It does not matter as long as the wafer is not contaminated or subjected to shock.

〔発明の効果〕〔Effect of the invention〕

以上説明した様に、この発明は熱処理ボートが■字形溝
で少なくともウェハの左右と下部の3点以Eを緩やかに
保持し、この熱処理ボートを載置する受皿の底入よりウ
ェハを一括して押し上げた後に該ウェハを一括把持して
立替える様に構成したので、ウェハの傾きを防止し、ウ
ェハのボートの溝位置での材料的欠陥を防止するので、
電気的且つ外観的特性不良を削減し、併せて立替えが容
易であると言う効果がある。
As explained above, in this invention, the heat treatment boat loosely holds at least three points E on the left, right and bottom sides of the wafer with the ■-shaped groove, and the wafers are held in bulk from the bottom of the saucer on which the heat treatment boat is placed. The structure is such that the wafers are held all at once after being pushed up, and the wafers are moved upright, which prevents the wafers from tilting and prevents material defects at the groove positions of the wafer boats.
This has the effect of reducing defects in electrical and appearance characteristics, and also facilitates replacement.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例を示す斜視図、第2−A図、
第2−B図、第2−C図及び第z−d図は本発明の熱処
理ボートの一部を示す平面図、斜視図、正面図及び側面
図、第3図は従来の熱処理ボート及び受皿を示す斜視図
、第4−A図及び第4−B図は従来の熱処理ボートの港
の状態を示す正面図及び側面図、@5図はウェハの一括
把持具を示す斜視図である。 図中、(1)はウェハ、(7)は押し上げ装置、■は熱
処理1t’−ト、(20cX20dX20hX20i)
 it V 字状溝、−ハ受皿である。 尚、図中、同一符号は同一、若しくは相当部分を示す。
Fig. 1 is a perspective view showing an embodiment of the present invention, Fig. 2-A,
2-B, 2-C, and z-d are a plan view, a perspective view, a front view, and a side view showing a part of the heat treatment boat of the present invention, and FIG. 3 is a conventional heat treatment boat and a saucer. FIGS. 4-A and 4-B are front and side views showing the state of a conventional heat treatment boat in port, and FIG. 5 is a perspective view showing a wafer batch gripping tool. In the figure, (1) is the wafer, (7) is the pushing device, and ■ is the heat treatment 1t'-to, (20cX20dX20hX20i)
It is a V-shaped groove, -c is a saucer. In the drawings, the same reference numerals indicate the same or corresponding parts.

Claims (1)

【特許請求の範囲】[Claims]  ウェハの外周部両端と底部とを夫々保持するV字状溝
を有する少なくとも3本の棒状体からなるボート、この
ボートを載置し、上記ボートの下部開口に対向する開口
が底部に形成された受皿、及びこの受皿の開口に対向し
、上記ボートのV字状溝と一致してV字状溝が形成され
、上記受皿の開口を貫通して上記ウェハを上方へ押し上
げる押し上げ手段を備えた半導体ウェハのボート立替装
置。
A boat consisting of at least three rod-like bodies each having a V-shaped groove for holding both ends of the outer periphery of the wafer and the bottom, respectively, on which the boat is placed, and an opening opposite to the lower opening of the boat is formed in the bottom. A semiconductor device comprising: a saucer; and a pushing means formed with a V-shaped groove facing the opening of the saucer and coinciding with the V-shaped groove of the boat, and pushing the wafer upward through the opening of the saucer. Wafer boat transfer equipment.
JP63139659A 1988-06-06 1988-06-06 Boat replacing device for semiconductor wafer Pending JPH01308043A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63139659A JPH01308043A (en) 1988-06-06 1988-06-06 Boat replacing device for semiconductor wafer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63139659A JPH01308043A (en) 1988-06-06 1988-06-06 Boat replacing device for semiconductor wafer

Publications (1)

Publication Number Publication Date
JPH01308043A true JPH01308043A (en) 1989-12-12

Family

ID=15250420

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63139659A Pending JPH01308043A (en) 1988-06-06 1988-06-06 Boat replacing device for semiconductor wafer

Country Status (1)

Country Link
JP (1) JPH01308043A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010141221A (en) * 2008-12-15 2010-06-24 Shin-Etsu Chemical Co Ltd Method of manufacturing silicon substrate with oxide film

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010141221A (en) * 2008-12-15 2010-06-24 Shin-Etsu Chemical Co Ltd Method of manufacturing silicon substrate with oxide film

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