JPH0131661B2 - - Google Patents
Info
- Publication number
- JPH0131661B2 JPH0131661B2 JP57172434A JP17243482A JPH0131661B2 JP H0131661 B2 JPH0131661 B2 JP H0131661B2 JP 57172434 A JP57172434 A JP 57172434A JP 17243482 A JP17243482 A JP 17243482A JP H0131661 B2 JPH0131661 B2 JP H0131661B2
- Authority
- JP
- Japan
- Prior art keywords
- collision
- ion
- ion detector
- magnetic field
- convergence
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 150000002500 ions Chemical class 0.000 claims description 30
- 238000004458 analytical method Methods 0.000 claims description 11
- 230000005684 electric field Effects 0.000 claims description 10
- 238000010494 dissociation reaction Methods 0.000 claims description 8
- 230000005593 dissociations Effects 0.000 claims description 8
- 238000010884 ion-beam technique Methods 0.000 claims description 7
- 230000009977 dual effect Effects 0.000 claims description 5
- 238000004949 mass spectrometry Methods 0.000 claims description 4
- 238000001514 detection method Methods 0.000 claims description 2
- 238000005259 measurement Methods 0.000 claims description 2
- 238000001819 mass spectrum Methods 0.000 description 2
- 230000005596 ionic collisions Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/28—Static spectrometers
- H01J49/32—Static spectrometers using double focusing
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Description
【発明の詳細な説明】
本発明は衝突解離装置を備えた逆配置二重収束
型質量分析装置に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an inverted dual focus mass spectrometer equipped with a collision dissociation device.
イオンを磁場で質量分析した後電場でエネルギ
ー分析する逆配置二重束型質量分析装置では、磁
場と電場との中間位置に質量スペクトル像が形成
されるので、磁場と電場との間にイオン検出器を
位置させると単収束型質量分析計としても使用で
き、またその位置に衝突室を位置させると、イオ
ンの衝突解離を起させることもでき、生じたイオ
ンを電場に入射させてエネルギー分析を行うこと
によりイオンの種類の判別或は近接した質量の2
種イオンを識別する情報を得ることができる。 In an inverted double-flux mass spectrometer that performs mass analysis of ions using a magnetic field and then energy analysis using an electric field, a mass spectrum image is formed at an intermediate position between the magnetic and electric fields, so ions are detected between the magnetic and electric fields. By positioning the instrument, it can be used as a single-focusing mass spectrometer, and by positioning a collision chamber at that position, it is also possible to cause collisional dissociation of ions, and the resulting ions are introduced into an electric field for energy analysis. By performing
Information identifying the species ion can be obtained.
逆配置二重収束型質量分析装置は上述したよう
に3通りの用法間の切換えが可能であるが、従来
これら3通りの用法間の切換えが一動作で簡単に
行えるものはなかつた。本発明はこれら3通りの
用法間の切換えが簡単にできる機構を提供するも
のである。 As described above, the inverted dual focus mass spectrometer is capable of switching between the three usages, but there has never been a device that can easily switch between these three usages in one operation. The present invention provides a mechanism that allows easy switching between these three usage methods.
本発明は質量分析用磁場とエネルギー分析用電
場との中間位置において、イオンビームと直角の
方向に摺動可能に、イオン検出器と衝突室との一
体結合構成を配置し、この一体結合構成の摺動を
真空器壁外から操作可能にした逆配置二重収束型
質量分析装置を提供するものである。以下実施例
によつて本発明を説明する。 The present invention arranges an integrally coupled configuration of an ion detector and a collision chamber so as to be able to slide in a direction perpendicular to the ion beam at an intermediate position between a magnetic field for mass analysis and an electric field for energy analysis. The present invention provides an inverted dual focus mass spectrometer in which sliding can be operated from outside the wall of the vacuum chamber. The present invention will be explained below with reference to Examples.
第1図は本発明の一実施例の全体を示す。Iは
イオン源、Mは質量分析用磁場を形成する電磁石
の磁極、Eはエネルギー分析用電場を形成する電
極で、S1は磁場Mと電場Eとの間に配置された
中間スリツト、S2は二重収束型質量分析装置の
出射スリツトである。中間スリツトS1上には磁
場Mによる質量スペクトル像が形成される。Dは
二重収束用イオン検出器、D1は単収束質量分析
モード用のイオン検出器で、Cが衝突室である。
イオン検出器D1と衝突室Cとは一体的に結合さ
れていて、図示矢印のようにイオンビームと直角
の方向に摺動できるようになつている。衝突室C
及びイオン検出器D1が共にイオンビームの通路
から退避させてあるときは装置は二重収束型質量
分析装置として用いられる。イオン検出器D1を
イオンビーム通路に進出させると装置は単収束型
質量分析装置として用いられる。衝突室Cをイオ
ンビーム通路に位置させると、イオンの衝突解離
を利用した分析モードとなる。 FIG. 1 shows an entire embodiment of the present invention. I is the ion source, M is the magnetic pole of the electromagnet that forms the magnetic field for mass analysis, E is the electrode that forms the electric field for energy analysis, S1 is the intermediate slit placed between the magnetic field M and the electric field E, and S2 is the two This is the exit slit of a heavy convergence mass spectrometer. A mass spectrum image is formed by the magnetic field M on the intermediate slit S1. D is an ion detector for double focus, D1 is an ion detector for single focus mass spectrometry mode, and C is a collision chamber.
The ion detector D1 and the collision chamber C are integrally connected and can slide in a direction perpendicular to the ion beam as shown by the arrow in the figure. Collision chamber C
When both the ion detector D1 and the ion detector D1 are removed from the path of the ion beam, the device is used as a dual focus mass spectrometer. When the ion detector D1 is advanced into the ion beam path, the device is used as a single focusing mass spectrometer. When the collision chamber C is located in the ion beam path, an analysis mode using collisional dissociation of ions is established.
第2図はイオン検出器D1と衝突室Cとの一体
結合構成の詳細を示す。イオン衝突室Cは前後に
イオンビームの通過する開口nを有する箱で外部
からHeのような衝突ガスが供給される。このガ
スは質量分析装置の真空器壁Wの外からガス供給
管Tを通して行われる。衝突室Cは矢印方向に移
動せしめられるので、ガス供給管Tはこの移動に
応じられるように螺旋に巻いてある。イオン検出
器D1はこの実施例では電子増倍管でその外筒が
真空器壁Wを貫通しており、真空器壁Wとの間に
OリングPを介在させて気密を保持して矢印方向
に摺動可能であり、自身が衝突室Cとイオン検出
器D1の一体結合構成の矢印方向の移動のガイド
となつている。 FIG. 2 shows the details of the integrated structure of the ion detector D1 and the collision chamber C. The ion collision chamber C is a box having an opening n at the front and back through which the ion beam passes, and a collision gas such as He is supplied from the outside. This gas is supplied through a gas supply pipe T from outside the vacuum vessel wall W of the mass spectrometer. Since the collision chamber C is moved in the direction of the arrow, the gas supply pipe T is spirally wound to accommodate this movement. In this embodiment, the ion detector D1 is an electron multiplier whose outer tube penetrates the vacuum chamber wall W, and an O-ring P is interposed between the tube and the vacuum chamber wall W to maintain airtightness. It is movable in the direction of the arrow, and serves as a guide for the movement of the integral combination of the collision chamber C and the ion detector D1 in the direction of the arrow.
衝突解離を行う場合、衝突室Cを前後の開口h
が中間スリツトS1と一直線に並ぶように位置さ
せる。磁場Mで質量による分散が行われてスリツ
トS1を通つた特定質量のイオンが衝突室Cに飛
び込み外から供給されているガス分子と衝突して
衝突解離が起り、生成したイオンが電場Eによつ
てエネルギー分析される。なお衝突室Cへのガス
供給管は第3図に示すようにイオン検出器D1の
外筒内を通し、真空外に可撓部分を設けてもよ
い。また衝突室とイオン検出器との一体構成をベ
ローにより真空器壁Wに気密かつ可動的に取付
け、別に設けたガイドに沿つて摺動させるように
してもよい。 When performing collision dissociation, the collision chamber C is opened at the front and rear openings h.
is positioned so that it is aligned with the intermediate slit S1. Ions of a specific mass that are dispersed by mass in the magnetic field M and pass through the slit S1 enter the collision chamber C and collide with gas molecules supplied from outside, causing collisional dissociation. The energy will be analyzed. Note that the gas supply pipe to the collision chamber C may be passed through the outer cylinder of the ion detector D1 , as shown in FIG. 3, and a flexible portion may be provided outside the vacuum. Alternatively, the integral structure of the collision chamber and the ion detector may be airtightly and movably attached to the wall W of the vacuum chamber using a bellows, and may be slid along a separately provided guide.
本発明装置は上述したように、単収束イオン検
出用のイオン検出器と衝突室とを一体的に結合
し、この一体的結合構成を真空器壁の外から摺動
させるようにしたから、2重収束、単収束、衝突
解離の3種の測定の切換え操作が一操作で行わ
れ、また衝突室とイオン検出器とが一体的に結合
されて摺動するので、真空器壁の衝突室、イオン
検出器収納スペースをコンパクトに設計すること
ができる。 As described above, in the device of the present invention, the ion detector for singly focused ion detection and the collision chamber are integrally connected, and this integrally connected structure is slid from the outside of the vacuum chamber wall. Switching between the three types of measurement: multiple convergence, single convergence, and collisional dissociation is performed in one operation, and since the collision chamber and ion detector are integrated and slide, the collision chamber on the wall of the vacuum chamber, The ion detector storage space can be designed compactly.
第1図は本発明の一実施例装置の平面図、第2
図は同実施例の要部拡大平面断面図、第3図は同
じく要部の他の一実施例の平面断面図である。
I……イオン源、M……質量分析用磁場、S1
……中間スリツト、E……エネルギー分析用電
場、S2……出射スリツト、D……二重収束用イ
オン検出器、D1……単収束用イオン検出器、C
……衝突室、T……衝突ガス供給管、W……真空
器壁。
FIG. 1 is a plan view of an apparatus according to an embodiment of the present invention, and FIG.
The figure is an enlarged plan sectional view of the main part of the same embodiment, and FIG. 3 is a plan sectional view of another embodiment of the main part. I...Ion source, M...Magnetic field for mass spectrometry, S1
...Intermediate slit, E...Electric field for energy analysis, S2...Exit slit, D...Double focusing ion detector, D1 ...Single focusing ion detector, C
...Collision chamber, T...Collision gas supply pipe, W...Vacuum chamber wall.
Claims (1)
用電場の順の配置を有し、上記質量分析用磁場と
エネルギー分析用電場との中間位置において、イ
オンビーム通路に出入自在に単収束イオン用イオ
ン検出器と衝突解離用の衝突室の一体結合構成体
を設け、この構成体を真空器壁外から摺動可動に
して、単収束、二重収束、衝突解離の3種の測定
モードの切換えを可能とした二重収束型質量分析
装置。1. An ion source, a magnetic field for mass spectrometry, and an electric field for energy analysis are arranged in this order, and an ion detection device for single focused ions can be moved in and out of the ion beam path at an intermediate position between the magnetic field for mass spectrometry and the electric field for energy analysis. A structure is provided that integrates the vacuum chamber and a collision chamber for collision dissociation, and this structure is slidable from outside the vacuum chamber wall, making it possible to switch between three measurement modes: single convergence, double convergence, and collision dissociation. A dual convergence mass spectrometer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57172434A JPS5960855A (en) | 1982-09-29 | 1982-09-29 | Double convergence mass spectrometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57172434A JPS5960855A (en) | 1982-09-29 | 1982-09-29 | Double convergence mass spectrometer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5960855A JPS5960855A (en) | 1984-04-06 |
| JPH0131661B2 true JPH0131661B2 (en) | 1989-06-27 |
Family
ID=15941903
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57172434A Granted JPS5960855A (en) | 1982-09-29 | 1982-09-29 | Double convergence mass spectrometer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5960855A (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0342615Y2 (en) * | 1984-10-19 | 1991-09-06 | ||
| JP2647102B2 (en) * | 1987-11-18 | 1997-08-27 | 日本原子力研究所 | Particle beam measurement device |
-
1982
- 1982-09-29 JP JP57172434A patent/JPS5960855A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5960855A (en) | 1984-04-06 |
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