JPH0138516Y2 - - Google Patents

Description

[Detailed Description of the Invention] The present invention relates to a test piece supply device for loading a test piece on a test piece supply stage into a material testing device using a manipulator.

When testing materials such as steel plates, a predetermined test piece is created and the test piece is attached to a material testing device to perform the material test, but when processing a large number of test pieces, it is necessary to increase testing efficiency. For this purpose, a large number of test pieces are placed on a test piece supply stand, and the test pieces are gripped by the fingers of a manipulator such as a robot and fed one by one to the material testing equipment from this test piece supply stand. ing.

In the conventional test piece feeding device,
As shown in the figure, when adjusting the attitude of the test piece A, the attitude of the test piece A is not adjusted when the test piece A is gripped by the finger part 1 of the manipulator on the test piece supply stand. If the test piece A is tilted as shown, when installing the test piece A into the material testing device, loosen the finger part 1 a little as shown in Figure 2, and then connect the fixed chuck 21 and the movable side The posture was adjusted by abutting the gripping parts A1, A1 at both ends of the test piece A against the abutting parts 21a and 22a provided on the chuck 22, respectively.

However, in such a conventional test piece feeding device, since the test piece A is brought into contact with the fixed side chuck 21 and the movable side chuck 22, which are part of the material testing device which is a precision machine, it is difficult to loosen the finger part A. However, it was still being held, and there was a risk that force would be applied from the lateral direction, causing strain on the material testing device, and that test piece A could become deformed. In addition, since the specimen A slides sideways while being gripped by the finger part 1, there is a risk that the finger part 1 will wear out and cause problems in durability. There was a problem that this could occur.

The present invention was developed by focusing on these conventional problems, and is a test specimen feeding device that solves the above problems by adjusting the posture of the specimen before the finger section grips the specimen. is intended to provide.

In order to achieve this purpose, in the present invention, a pair of clamping fingers, which hold the test piece between them, are attached to the finger portion of the manipulator to grip both ends of the test piece. A pair of reference gauges are provided in the finger portion, and when the test specimen is gripped, a reference gauge is provided on which the side end surface of the intermediate portion of the test specimen comes into contact while the gripping fingers are open to adjust the posture. This is a test piece supply device, and the test piece is brought into contact with a reference gauge before the finger part grips the test piece again, the posture is adjusted, and then the test piece is gripped by the finger part.

Hereinafter, one embodiment of the present invention will be described based on the drawings.

3 to 7 show an embodiment of the present invention, in which the test piece supply device 3 has a rotary base 32 rotatably supported on a fixed base 31 via a vertical shaft 33, An arm holding part 34 is supported by the base 32 so as to be movable up and down, and an arm part 35 which is movable in a substantially horizontal direction is supported by the arm holding part 34.
A finger portion 4 is provided at the tip of the arm portion 35.

Around the test piece supply device 3, as shown in FIG. A residual material pallet 6 is placed between the test piece supply device 3 and the test piece supply device 3.

The material testing apparatus 2 has a fixed chuck 21 and a movable chuck 22 as in the conventional example, and is of a type in which the test piece A is set vertically.

The test piece supply table 5 has a base 51 equipped with a well-known plate separation device 52 that uses magnetic force, and the test pieces A are stacked almost horizontally and separated one by one from the top by the plate separation device 52. It has been placed.
Test pieces A for replenishment are stacked almost horizontally beside the base 51.

As shown in FIGS. 5 and 6, the finger section 4 is rotatably supported as a whole by a central shaft 41 on the arm section 35, and the tip of the finger section 4 has a test piece A in between. A pair of clamping fingers 7, 7 are provided corresponding to both ends of the test piece A, one set 7a and the other set 7b.

One clamping finger 7 has an intermediate portion pivoted to the tip of the finger body 42 via a pivot pin 71, a clamping element 72 provided at the tip, and a drive connecting pin 73 provided at the rear end. drive arm member 7
4 are connected to each other, and the clamping member 72 is provided with a buffer pad 72a so as not to damage the specimen A when the specimen A is clamped. The other end of the drive arm member 74 is connected to a reciprocating rod 77 of a drive cylinder 76 via a drive pin 75.

The clamping elements 72, 72 of one set of clamping fingers 7, 7 face each other, and can be opened and closed to clamp the test piece A between the buffer pads 72a, 72a.

Each pair of clamping fingers 7, 7 is disposed corresponding to the gripping portion A1 at both ends of the test piece A, and a reference gauge 8 is fixed to the finger body 42 between the pairs. As shown in FIG. 7, the reference gauge 8 has a
While the clamping fingers 7, 7 are open, the test piece A
A reference surface 81 is formed at a position where the side end surface A3 of the intermediate portion A2 comes into contact and the position is adjusted. The middle portion A2 of the test piece A is formed with high accuracy in order to perform a material test on the test piece A, and includes a gauge section for measuring elongation.

Next, the action will be explained. The explanation begins with gripping the test piece A on the test piece supply table 5.

The arm holder 34 of the test piece supply device 3 is in position A in FIG. 4, and the arm 35 is retracted.
In the finger portion 4, the holding fingers 7, 7 are open as shown by the dashed line in FIG. From this state, the arm portion 35 moves forward, and the holding fingers 7,
7 reaches a position where the test piece A on the base 51 of the test piece supply stand 5 is gripped.

Since the test pieces A are separated one by one by the plate separating device 52 on the base 51, one of the test pieces A just fits between the clamping fingers 7, 7. At this time, while the holding fingers 7, 7 are still open, the side end surface A3 of the intermediate portion A2 of the test piece A comes into contact with the reference surface 81 of the reference gauge 8, and the test piece A is adjusted to a predetermined posture.

Therefore, when the drive cylinder 76 is operated and the forward/backward rod 77 is moved backward, the rear end of the clamping fingers 7 is pushed by the drive arm member 74, and the rear ends of the clamping fingers 7, 7 in the pair are moved together. Since the width is widened, the tips of the clamping fingers 7, 7 become narrower, and the gripping part A1 of the specimen A is gripped between the clamping members 72, 72, and both ends of the specimen A are held by the sets 7a, 7b. be grasped.

After the position is adjusted in this manner and the test piece A is held between the finger parts 4, the arm part 35 retreats and the arm holding part 34 rotates around the vertical shaft 33, as shown in FIG. The arm part 35 moves forward and the finger part 4 rotates around the central axis 41 to reach the C position. The specimen A is carried by the finger part 4 and changed from a horizontal position to a vertical position. It is located between the fixed chuck 21 and the movable chuck 22 of the material testing device 2. Then, the fixed side chuck 21 and the movable side chuck 22 clamp the gripping parts A1, A1 of the test piece A, so that the test piece A is set in the material testing device 2, and the holding fingers 7, 7 are opened and removed from the test piece A. The arm part 35 moves back and the finger part 4 separates from the material testing device 2 and waits at position B.
The material test is performed by the material testing device 2.

When the material test is finished, the arm part 35 moves forward, and since the clamping fingers 7, 7 remain open, it becomes possible to clamp the gripping part A1 of the test piece A, and when the clamping fingers 7, 7 are closed, the gap between the clamping members 72, 72 is reached. Test piece A is held between the two. At this time, the test piece A is broken, but since there are two sets of clamping fingers 7, 7, the broken test piece A, which has become two pieces, is held together.

Thereupon, the arm portion 35 rotates while retreating and reaches the A position. Since the finger portion 4 is above the residual material pallet 6, when the holding fingers 7, 7 are opened, the test piece A falls into the residual material pallet 6. In this way, only one cycle of a series of test piece feeding operations is completed,
The arm portion 35 of the test piece supply device 3 moves forward again and repeats the above operation, supplying the test pieces A to the material testing device 2 one after another.

According to the test piece feeding device according to the present invention, since the reference gauge is provided in the finger section and the posture of the test piece is adjusted before the clamping fingers clamp the test piece, there is no need for the material testing device or the test piece. Since no force is applied, the test piece is not deformed, the material testing device is not subjected to excessive force, and accuracy is not degraded, and the accuracy of the mounting position of the test piece to the material testing device is improved. Furthermore, the finger portion and the test piece do not wear, and the clamps and buffer pads do not wear out, so durability is improved. Furthermore, since there is no need to loosen the gripping fingers, gripping errors are also eliminated.

[Brief explanation of the drawing]

Figures 1 and 2 show the conventional method of adjusting the posture of a test piece. Figure 1 is a front view before posture adjustment, Figure 2 is a front view after posture adjustment, and Figures 3 to 7 are One embodiment of the present invention is shown, FIG. 3 is a front view of the test piece supply device, FIG. 4 is a plan view showing the arrangement, and FIGS. 5 and 6 are enlarged views of the vicinity of the finger section compared to FIG. 3. Fig. 5 is a front view of the specimen supported horizontally, Fig. 6 is a partially cutaway front view of the specimen supported vertically, and Fig. 7 is a front view of the specimen supported vertically. The figure is a partial perspective view showing a state in which a test piece is in contact with a reference gauge. A... Test piece, 2... Material testing device, 3... Test piece supply device, 4... Finger portion, 7... Clamping finger, 8... Reference gauge.

Claims (1)

[Scope of utility model registration request] In a test piece supply device that uses a manipulator to load a test piece on a test piece supply stand into a material testing device, the fingers of the manipulator have a pair of fingers that hold the test piece between them in order to grip both ends of the test piece. A pair of clamping fingers are provided corresponding to both ends of the test piece, and a reference gauge is provided whose attitude is adjusted by abutting the side end surface of the middle part of the test specimen while the clamping fingers are open. Test piece feeding device.