JPH0142606B2 - - Google Patents

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Publication number
JPH0142606B2
JPH0142606B2 JP58092750A JP9275083A JPH0142606B2 JP H0142606 B2 JPH0142606 B2 JP H0142606B2 JP 58092750 A JP58092750 A JP 58092750A JP 9275083 A JP9275083 A JP 9275083A JP H0142606 B2 JPH0142606 B2 JP H0142606B2
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JP
Japan
Prior art keywords
component
varistor
parts
voltage
porcelain
Prior art date
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Expired
Application number
JP58092750A
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Japanese (ja)
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JPS59218702A (en
Inventor
Masaru Masuyama
Susumu Hirooka
Nobutate Yamaoka
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Taiyo Yuden Co Ltd
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Taiyo Yuden Co Ltd
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Priority to JP58092750A priority Critical patent/JPS59218702A/en
Publication of JPS59218702A publication Critical patent/JPS59218702A/en
Publication of JPH0142606B2 publication Critical patent/JPH0142606B2/ja
Granted legal-status Critical Current

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Description

【発明の詳細な説明】[Detailed description of the invention]

本発明はSr(1-x)CaxTiO3を主成分とする電圧非
直線抵抗体(以下バリスタと称する)を得るため
の磁器組成物に関する。 電子機器で発生する異常電圧、ノイズ等を吸収
もしくは除去するために、種々のバリスタが使用
されているが、特願昭56−71425号に示されてい
るSr(1-x)CaxTiO3を主成分とするバリスタは、バ
リスタ機能のみならず、コンデンサ機能も有する
ので、グロー放電、アーク放電、異常電圧、ノイ
ズ等の吸収又はバイパスを良好に達成することが
出来る。またこのバリスタは従来のSrTiO3を主
成分とするバリスタよりも温度特性が優れている
という特長を有している。しかし、近年サージ電
圧及び/又は電流の印加による特性の劣化が更に
少ないバリスタが要求されている。また、バリス
タ電圧の温度変化率の小さいバリスタが要求され
ている。 そこで、本発明の目的は、サージの印加によつ
て、バリスタ電圧、非直線係数、バリスタ電圧の
温度特性の劣化の少なく且つバリスタ電圧の温度
変化率の小さい電圧非直線磁器組成物を提供する
ことにある。 上記目的を達成するための本願の第1番目の発
明は、Sr(1-x)CaxTiO3(但しxは0.01〜0.5の範囲
の値)(以下第1成分と呼ぶ)100モル部と、
Nb2O5、Ta2O5、WO3、La2O3、CeO2、Nd2O3
Y2O3、Sm2O3、Pr6O11、及びDy2O3の内の少な
くとも1種の金属酸化物(以下第2成分と呼ぶ)
0.01〜3.00モル部と、Na2O(以下第3成分と呼
ぶ)0.02〜2.50モル部と、Al2O3(以下第4成分と
呼ぶ)0.01〜1.50モル部とを含む電圧非直線磁器
組成物に係わるものである。 上記発明によれば、バリスタ電圧の温度変化率
を小さくすることが可能な第1成分(主成分)と
主として磁器の半導体化に寄与する第2成分と
に、第3成分としてNa2O3を0.02〜2.50モル部の
範囲で加え、且つAl2O3を0.01〜1.50モル部の範
囲で加えることにより、サージの印加によるバリ
スタ電圧の温度特性の変化を大幅に減少させるこ
とが可能になり、且つバリスタ電圧の温度変化率
を小さくすることが可能になる。また、Al2O3
非直線係数αの増大に寄与する。 本願の第2番目の発明は、第1番目の組成物に
更に、非直線係数の改善に寄与する成分として
Ag2O、CuO、MnO2、及びSiO2の内の1種又は
複数種の酸化物(以下第5成分と呼ぶ)を0.01〜
3.00モル部の範囲で加えた組成物に係わるもので
ある。これにより大きな非直線係数を有し、且つ
サージ劣化が防止されたバリスタを提供すること
が可能になる。 以下、本発明に係わる実施例について述べる。 実施例 1 Sr(1-x)CaxTiO3(第1成分)のxが第1表の第
1成分の欄の値になるように、純度99.0%以上の
SrCO3、CaCO3及びTiO2をそれぞれ秤量配合し、
ボールミルで10時間撹拌し、これを乾燥し、次に
粉砕した。しかる後、上記粉砕したものを1200℃
で2時間焼成し、再び粉砕した。これにより、x
が第1表に示す如く種々異なる第1成分が得られ
る。 次に、上述の如くして得られた第1成分100モ
ル部(一定)に対し、純度99.0%のNb2O5
Ta2O5、WO3、La2O3、CeO2、Nd2O3、Pr6O11
Dy2O3、Y2O3及びSm2O3から選択された1種以
上の金属酸化物(第2成分)の粉末と、純度97.0
%のNa2OとNaFとから選択された1種以上の
Na化合物(第3成分)の粉末と、Al2O3(第4成
分)とを第1表に示す比率となるように秤量し
た。 次に各原料粉末を乳鉢に投入して20時間撹拌
(乾式)を行なつた。次いで、第1表に示すバリ
スタ原料に対し10〜15重量%のポリビニールアル
コールを有機結合剤として混入して造粒し、この
造粒された混合物を成型圧約1500Kg/cm2で円板に
成形した。 これらの円板をN2(95容積%)+H2(5容積%)
の還元雰囲気(非酸化性雰囲気)で約1350℃、4
時間の焼成を行い、直径10mm、厚さ0.8mmの半導
体磁器を得た。次に空気中(酸化性雰囲気中)に
おいて、1000〜1200℃の温度範囲で3時間の熱処
理(再酸化処理)を行つた。この結果、Na2O、
NaFがNa2Oに夫々変換した外は、出発原料と同
じ組成の磁器が得られた。従つて、第1表におい
て、焼成後の第1成分と第2成分と第4成分の記
載は省略され、Na化合物に対応して焼成後に得
られるNa2Oのみが記載されている。 次に、上記磁器の特性を調べるために第1図に
示す如く磁器1の両主面に公知の銀ペーストを塗
布し、800℃で焼付けることによつて銀電極2,
3を形成し、バリスタ4を完成させた。 次にバリスタの特性評価を行うために、バリス
タ電圧V1、非直線係数α、V1の温度変化率ΔV1
静電容量C、サージ電圧印加によるV1及びαの
変化率ΔV1p及びΔαp、及びサージ電圧印加後に
おけるV1の温度変化率ΔV1Tを測定したところ、
第2に示す結果が得られた。 各測定方法を更に詳しく説明すると、バリスタ
電圧V1は第2図に示す回路を使用して測定した。
即ち、直流定電流源6にバリスタ4を接続し、ま
た直流定電流源6とバリスタ4との間に電流計8
を接続し、バリスタ4に並列に電圧計9を接続
し、バリスタ4だけを20℃の温度に保たれた恒温
槽20に入れてバリスタ4に1mAの電流I1を流
し、その時の電圧を測定してバリスタ電圧(V1
とした。また非直線係数αは第2図の装置を使用
し、バリスタ電圧V1の他にバリスタ4に10mA
の電流I10を流した時の印加電圧V10を測定し、次
式によつて決定した。 α=log(I10/I1)/log(V10/V1)=1/log(V10
/V1) また温度変化率ΔV1は、第2図の装置において
恒温槽20を−40℃〜+125℃の範囲で変化させ、
各温度T(℃)においてバリスタ4に1mAを流
した時のバリスタ電圧V1Tを測定し、20℃のV1
対しどの程度変化したかを次式で求めることによ
つて決定した。なお、各表には前記温度範囲の中
のΔV1の最大値のみを示した。 ΔV1=V1T−V1/V1×100/T(℃)−20(℃)(%/℃
) 次に、過電圧の鋭いパルス即ちサージ電圧が印
加された時に、バリスタ4の各特性がどのように
変化するかを模擬的に調べるために、第3図に示
すように、2kVの直流定電圧源10に並列に電圧
計11を接続し、電源10に5Ωの抵抗12と単
極双投スイツチ13の接点13aとを介して
2.5μFのコンデンサ14を接続し、かつスイツチ
13の接点13bにバリスタ4を接続し、5秒間
隔でコンデンサ14の充電エネルギをバリスタ4
に印加することを5回繰返し、その後バリスタ電
圧V1p及び非直線係数αpを第2図の回路で測定
し、次式でバリスタ電圧の変化率ΔV1p(%)及
びαの変化率Δαp(%)を求めた。 ΔV1p=V1p−V1/V1×100(%) Δαp=αp−α/α×100(%) また第3図の回路でサージ電圧及び電流を印加
した後のバリスタ4のバリスタ電圧の温度変化率
をΔV1Tを第2図の装置で前記ΔV1と同様に求め
た。また各試料の静電容量C(nF)は、1kHzで測
定した。また、比較するためにNa2O及びAl2O3
を含まない従来のSr(1-x)CaxTiO3系バリスタの中
でも各特性の優れた試料即ちSr0.60Ca0.40TiO3100
モル部に対しNb2O5を0.50モル部とBi2O33.00モ
ル部から成る半導体磁器バリスタの特性を上述し
た各測定法に基づいて測定した結果、V1は28.5
(V)、αは27.3、ΔV1は−0.1(%/℃)、Cは140
(nF)、ΔV1pは−29.4%、Δαpは−36.3%、ΔV1T
は−0.25(%/℃)であつた。 更に、Al2O3の効果を調べるために、 第1成分 100モル部 第2成分 0.01〜3.00モル部 第3成分 0.02〜2.50モル部 から成る種々の組成の磁器組成物を作りその特性
を測定したところ、V1は10.0〜47.2(V)、αは
18.0〜24.9、ΔV1は0.01〜0.02(%/℃)、Cは90〜
166(nF)、ΔV1pは0.2〜1.0(%)、Δαpは0.3〜1.0
(%)、ΔV1Tは0.01〜0.02(%/℃)であつた。
The present invention relates to a ceramic composition for obtaining a voltage nonlinear resistor (hereinafter referred to as a varistor) containing Sr (1-x) Ca x TiO 3 as a main component. Various varistors are used to absorb or eliminate abnormal voltages, noise, etc. generated in electronic equipment, and Sr (1-x) Ca x TiO 3 as shown in Japanese Patent Application No. 1987-71425. A varistor having as a main component not only has a varistor function but also a capacitor function, so it can satisfactorily absorb or bypass glow discharge, arc discharge, abnormal voltage, noise, etc. This varistor also has the advantage of superior temperature characteristics than conventional varistors whose main component is SrTiO 3 . However, in recent years, there has been a demand for varistors whose characteristics are less likely to deteriorate due to the application of surge voltage and/or current. Additionally, a varistor with a small temperature change rate of varistor voltage is required. SUMMARY OF THE INVENTION Accordingly, an object of the present invention is to provide a voltage nonlinear ceramic composition that exhibits less deterioration of varistor voltage, nonlinear coefficient, and temperature characteristics of varistor voltage due to the application of a surge, and a small rate of temperature change of varistor voltage. It is in. The first invention of the present application to achieve the above object is based on 100 mole parts of Sr (1-x) Ca x TiO 3 (where x is a value in the range of 0.01 to 0.5) (hereinafter referred to as the first component). ,
Nb2O5 , Ta2O5 , WO3 , La2O3 , CeO2 , Nd2O3 ,
At least one metal oxide of Y 2 O 3 , Sm 2 O 3 , Pr 6 O 11 , and Dy 2 O 3 (hereinafter referred to as the second component)
0.01 to 3.00 mol parts, 0.02 to 2.50 mol parts of Na 2 O (hereinafter referred to as the third component), and 0.01 to 1.50 mol parts of Al 2 O 3 (hereinafter referred to as the fourth component). It is related to things. According to the above invention, Na 2 O 3 is added as a third component to the first component (main component) that can reduce the temperature change rate of the varistor voltage and the second component that mainly contributes to making porcelain a semiconductor. By adding Al 2 O 3 in a range of 0.02 to 2.50 mol parts, and adding Al 2 O 3 in a range of 0.01 to 1.50 mol parts, it becomes possible to significantly reduce changes in the temperature characteristics of the varistor voltage due to the application of surges. Moreover, it becomes possible to reduce the rate of change of the varistor voltage with temperature. Furthermore, Al 2 O 3 contributes to an increase in the nonlinear coefficient α. The second invention of the present application further includes a component that contributes to improving the nonlinear coefficient in the first composition.
One or more oxides of Ag 2 O, CuO, MnO 2 and SiO 2 (hereinafter referred to as the fifth component) from 0.01 to
This relates to compositions containing 3.00 mole parts. This makes it possible to provide a varistor that has a large nonlinear coefficient and is prevented from deteriorating due to surges. Examples related to the present invention will be described below. Example 1 Sr (1-x) Ca x TiO 3 (first component) with a purity of 99.0% or more so that x is the value in the first component column of Table 1.
SrCO 3 , CaCO 3 and TiO 2 were weighed and blended,
Stirred in a ball mill for 10 hours, it was dried and then ground. After that, the above pulverized material was heated to 1200℃.
The mixture was baked for 2 hours and ground again. This gives x
As shown in Table 1, various different first components are obtained. Next, to 100 mole parts (constant) of the first component obtained as described above, Nb 2 O 5 with a purity of 99.0%,
Ta 2 O 5 , WO 3 , La 2 O 3 , CeO 2 , Nd 2 O 3 , Pr 6 O 11 ,
A powder of one or more metal oxides (second component) selected from Dy 2 O 3 , Y 2 O 3 and Sm 2 O 3 and a purity of 97.0.
% of Na 2 O and NaF.
The powder of Na compound (third component) and Al 2 O 3 (fourth component) were weighed so as to have the ratio shown in Table 1. Next, each raw material powder was put into a mortar and stirred (dry type) for 20 hours. Next, 10 to 15% by weight of polyvinyl alcohol is mixed as an organic binder into the varistor raw materials shown in Table 1 and granulated, and this granulated mixture is molded into a disk at a molding pressure of about 1500 kg/ cm2 . did. These disks were heated with N 2 (95% by volume) + H 2 (5% by volume)
Approximately 1350℃ in a reducing atmosphere (non-oxidizing atmosphere), 4
After firing for several hours, semiconductor porcelain with a diameter of 10 mm and a thickness of 0.8 mm was obtained. Next, heat treatment (reoxidation treatment) was performed in air (in an oxidizing atmosphere) at a temperature range of 1000 to 1200°C for 3 hours. As a result, Na 2 O,
Porcelain with the same composition as the starting material was obtained, except that NaF was converted to Na 2 O, respectively. Therefore, in Table 1, the description of the first component, second component, and fourth component after firing is omitted, and only Na 2 O obtained after firing is listed corresponding to the Na compound. Next, in order to investigate the characteristics of the above-mentioned porcelain, a known silver paste was applied to both main surfaces of the porcelain 1 as shown in FIG.
3 was formed, and Barista 4 was completed. Next, in order to evaluate the characteristics of the varistor, the varistor voltage V 1 , the nonlinear coefficient α, the temperature change rate of V 1 ΔV 1 ,
When measuring the capacitance C, the rate of change of V 1 and α due to the application of the surge voltage ΔV 1 p and Δαp, and the rate of temperature change of V 1 after the application of the surge voltage ΔV 1T ,
The second result was obtained. To explain each measurement method in more detail, the varistor voltage V1 was measured using the circuit shown in FIG.
That is, the varistor 4 is connected to the DC constant current source 6, and the ammeter 8 is connected between the DC constant current source 6 and the varistor 4.
Connect the voltmeter 9 in parallel to the varistor 4, place only the varistor 4 in a constant temperature oven 20 kept at a temperature of 20°C, apply a current of 1 mA to the varistor 4, and measure the voltage at that time. Varistor voltage (V 1 )
And so. In addition, the nonlinear coefficient α is determined by using the device shown in Fig. 2, and in addition to the varistor voltage V 1 , the varistor 4 is set at 10 mA.
The applied voltage V 10 was measured when a current I 10 of was applied, and was determined by the following formula. α=log(I 10 /I 1 )/log(V 10 /V 1 )=1/log(V 10
/V 1 ) Also, the temperature change rate ΔV 1 is determined by changing the constant temperature chamber 20 in the range of -40°C to +125°C in the apparatus shown in FIG.
The varistor voltage V 1T was measured when 1 mA was applied to the varistor 4 at each temperature T (° C.), and the amount of change from V 1 at 20° C. was determined by calculating the following equation. Note that each table shows only the maximum value of ΔV 1 within the above temperature range. ΔV 1 = V 1T −V 1 /V 1 ×100/T(℃)−20(℃)(%/℃
) Next, in order to simulate how the characteristics of the varistor 4 change when a sharp pulse of overvoltage, that is, a surge voltage, is applied, a constant DC voltage of 2 kV was applied as shown in Figure 3. A voltmeter 11 is connected in parallel to the power source 10, and a voltmeter 11 is connected to the power source 10 through a 5Ω resistor 12 and a contact 13a of a single-pole double-throw switch 13.
A 2.5μF capacitor 14 is connected, and a varistor 4 is connected to the contact 13b of the switch 13, and the charging energy of the capacitor 14 is transferred to the varistor 4 at 5 second intervals.
5 times, then measure the varistor voltage V 1 p and the nonlinear coefficient αp using the circuit shown in Figure 2, and calculate the rate of change ΔV 1 p (%) of the varistor voltage and the rate of change Δαp of α using the following equations. (%) was calculated. ΔV 1 p=V 1 p−V 1 /V 1 ×100(%) Δαp=αp−α/α×100(%) Also, the varistor of varistor 4 after applying surge voltage and current in the circuit shown in Figure 3 The temperature change rate of voltage ΔV 1T was determined using the apparatus shown in FIG. 2 in the same manner as ΔV 1 described above. Further, the capacitance C (nF) of each sample was measured at 1kHz. Also, for comparison, Na 2 O and Al 2 O 3
Among the conventional Sr (1 - x) Ca x TiO 3- based varistors that do not contain
As a result of measuring the characteristics of a semiconductor ceramic varistor consisting of 0.50 molar parts of Nb 2 O 5 and 3.00 molar parts of Bi 2 O 3 based on the above-mentioned measurement methods, V 1 is 28.5.
(V), α is 27.3, ΔV 1 is -0.1 (%/℃), C is 140
(nF), ΔV 1 p is −29.4%, Δαp is −36.3%, ΔV 1T
was -0.25 (%/°C). Furthermore, in order to investigate the effect of Al 2 O 3 , we made porcelain compositions of various compositions consisting of 100 mol parts of the first component, 0.01 to 3.00 mol parts of the second component, and 0.02 to 2.50 mol parts of the third component, and measured their characteristics. As a result, V 1 is 10.0 to 47.2 (V), and α is
18.0~24.9, ΔV 1 is 0.01~0.02 (%/℃), C is 90~
166 (nF), ΔV 1 p is 0.2-1.0 (%), Δαp is 0.3-1.0
(%) and ΔV 1T were 0.01 to 0.02 (%/°C).

【表】【table】

【表】【table】

【表】【table】

【表】 上記第1表及び第2表から明らかなように、 第1成分 100モル部 第2成分 0.01〜3.00モル部 第3成分(Na2O) 0.02〜2.50モル部 第4成分(Al2O3) 0.01〜1.50モル部 にすることにより、特性の良いバリスタを提供す
ることが出来る。即ち、第3成分(Na2O)と第
4成分(Al2O3)とを添加することにより、これ
等を含まないバリスタに比較し、ΔV1pを従来の
バリスタの−29.4%から−0.4〜−0.8%に改善す
ることが出来る。またΔαpも従来の−36.3%から
−0.3〜−0.8%に改善することが出来る。また、
ΔV1T炉の絶対値も従来の0.25%/℃から0〜0.01
に改善することが出来る。また、第4成分
(Al2O3)を添加すれば、これを添加しない第1
〜第3成分のバリスタに比較しΔV1の絶対値を小
さくすることが出来る。又、αを大にすることが
出来る。なお、第3成分(Na2O)が2.50モル部
を超える範囲ではΔV1p及びΔαpの絶対値が10%
を超え、且つΔV1Tの絶対値が0.15%/℃を超え
る。一方第3成分(Na2O)が0.02モル部より少
ないと、サージ電圧印加による特性改善効果がな
い。従つて、サー電圧又は電流に耐え得るバリス
タを提供するためのNa2Oの好ましい範囲は0.02
〜2.50モル部であり、より好ましい範囲は0.5〜
1.50モル部である。また、Al2O3(第4成分)が
1.5モル部を超えると、ΔV1p、Δαp、ΔV1Tの絶
対値が大きくなり、0.01モル部未満ではその添加
効果が少ない。従つてAl2O3の好ましい範囲は
0.01〜1.5モル部である。また、第2成分が3.00モ
ル部を超えると、焼結が不完全(未焼結)となつ
たり、各種の特性が悪くなる。一方、第2成分が
0.01モル部よりも少ない範囲では半導体化が良好
になされないために、αが小さく、またサージ電
圧の印加後の特性の劣化が大きい。従つて、第2
成分の好ましい範囲は0.01〜3.00モル部である。 第1成分はxが0.50を超えるとΔV1p及びΔαp
の絶対値が12%を超える。一方xが0.01より小さ
いと、温度特性ΔV1の絶対値が0.03%/℃以上に
なる。従つて第1成分のxの好ましい範囲は0.01
〜0.50である。 実施例 2 実施例1で示した第1〜第4成分から成るバリ
スタに、Ag2O、CuO、MnO及びSiO2から選択さ
れた1種以上の酸化物(第5成分)を添加したバ
リスタを実施例1と同一の方法で作製し、同一方
法で特性を測定した。即ち、第3表に示すように
第1成分を100重量一定としてここに第1〜第5
成分を添加したバリスタを作り、その特性を測定
したところ、第4表の結果が得られた。
[Table] As is clear from Tables 1 and 2 above, 1st component 100 mol parts 2nd component 0.01 to 3.00 mol parts 3rd component (Na 2 O) 0.02 to 2.50 mol parts 4th component (Al 2 O3) By setting the amount to 0.01 to 1.50 mol parts, a varistor with good characteristics can be provided. That is, by adding the third component (Na 2 O) and the fourth component (Al 2 O 3 ), compared to a varistor that does not contain these components, ΔV 1 p is reduced from -29.4% of the conventional varistor. It can be improved to 0.4 to -0.8%. Furthermore, Δαp can be improved from -36.3% in the conventional case to -0.3 to -0.8%. Also,
The absolute value of ΔV 1T furnace has also been reduced from 0.25%/℃ to 0-0.01
can be improved. Also, if the fourth component (Al 2 O 3 ) is added, the first component without this addition can be
~Compared to the third component varistor, the absolute value of ΔV 1 can be made smaller. Also, α can be increased. In addition, in the range where the third component (Na 2 O) exceeds 2.50 mol parts, the absolute values of ΔV 1 p and Δαp are 10%.
, and the absolute value of ΔV 1T exceeds 0.15%/℃. On the other hand, if the third component (Na 2 O) is less than 0.02 mole part, there is no effect of improving the characteristics by applying a surge voltage. Therefore, the preferred range of Na 2 O to provide a varistor that can withstand the current or voltage is 0.02
~2.50 mole parts, and a more preferable range is 0.5~2.50 mole parts
It is 1.50 mole parts. Also, Al 2 O 3 (fourth component)
If it exceeds 1.5 mole part, the absolute values of ΔV 1 p, Δαp, and ΔV 1T will become large, and if it is less than 0.01 mole part, the effect of its addition will be small. Therefore, the preferred range of Al 2 O 3 is
It is 0.01 to 1.5 mole part. Furthermore, if the second component exceeds 3.00 mole parts, sintering may be incomplete (unsintered) or various properties may deteriorate. On the other hand, the second component
If the amount is less than 0.01 mole part, semiconductor formation is not performed well, so that α is small and the characteristics deteriorate significantly after application of a surge voltage. Therefore, the second
The preferred range of components is 0.01 to 3.00 mole parts. The first component is ΔV 1 p and Δαp when x exceeds 0.50.
The absolute value of exceeds 12%. On the other hand, when x is smaller than 0.01, the absolute value of the temperature characteristic ΔV 1 becomes 0.03%/°C or more. Therefore, the preferred range of x for the first component is 0.01
~0.50. Example 2 A varistor consisting of the first to fourth components shown in Example 1 was added with one or more oxides (fifth component) selected from Ag 2 O, CuO, MnO, and SiO 2 . It was produced in the same manner as in Example 1, and its characteristics were measured in the same manner. That is, as shown in Table 3, assuming that the weight of the first component is constant at 100, the first to fifth components are
When a varistor containing the ingredients was made and its characteristics were measured, the results shown in Table 4 were obtained.

【表】【table】

【表】【table】

【表】【table】

【表】【table】

【表】【table】

【表】 上記第3表及び第4表から明らかなように第5
成分を0.01〜3.00モル部付加することにより、サ
ージ電圧印加後の特性劣化がきわめて小さく、且
つαの高いバリスタが得られる。尚第5成分が
3.00モル部を超えると、サージエネルギー印加後
の特性劣化が大きくなり、ΔV1p及びΔαpの絶対
値が10%を超える。またΔV1Tも絶対値で0.10%
を超える。一方、第5成分が0.01モル部より少な
いと、αの改善がない。従つて、第5成分の好ま
しい範囲は0.01〜3.00モル部である。 実施例 3 第3成分(Na2O)の添加を出発原料に対して
行わずに焼成後に行つても差支えないことを確め
るために、Sr0.70Ca0.30TiO3(第1成分)100モル
部と、Nb2O5(第2成分)0.50モル部とAl2O3(第
4成分)0.1モル部との粉末を乳鉢に投入して20
時間撹拌(乾式)を行なつた。次いで、このバリ
スタ原料に対し10〜15重量%のポリビニールアル
コールを有機結合剤として混入して造粒し、この
造粒された混合物を成型圧約1500Kg/cm2で円板に
成形した。 次にこの円板をN2(95容積%)+H2(5容積%)
の還元雰囲気(非酸化性雰囲気)で約1350℃、4
時間の焼成を行い、直径10mm、厚さ0.8mmの半導
体磁器とした。次にこの半導体磁器の一方の主面
にNaFペーストを0.90mg/cm2の割合で塗布し、大
気中(酸化性雰囲気)で900℃〜1100℃、2時間
の熱処理を施し、NaFペーストに基づいてNa2O
を半導体磁器中に熱拡散させ、しかる後実施例1
と同一方法でバリスタを作り同一方法で特性を測
定したところ、V1は24.6V、αは23.8、ΔV1は0
%/℃、Cは139nF、ΔV1pは−0.5%、Δαpは−
0.5%、ΔV1Tは0%/℃であつた。 実施例 4 実施例3の磁器の代りに、 Sr0.8Ca0.2TiO3(第1成分) 100モル部、 Ta2O5(第2成分) 0.5モル部 Al2O3(第4成分) 1.0モル部 の磁器を作り、実施例3のNaFペーストの代り
にNa2Oペーストを1.40mg/cm2の割合で上記磁器
に塗布し、実施例3と同様に拡散させ、しかる後
実施例1と同一方法でバリスタを作り、特性を測
定したところ、V1は15.1V、αは22.9、ΔV1は+
0.01%/℃、Cは142nF、ΔV1pは−0.8%、Δαp
は−0.9%、ΔV1Tは+0.01%/℃であつた。 実施例 5 実施例3の磁器の代りに、 Sr0.99Ca0.01TiO3(第1成分) 100モル部 La2O5(第2成分) 0.1モル部 Al2O3(第4成分) 0.01モル部 SiO2(第5成分) 0.5モル部 の磁器を作り、この磁器にNaFペーストを1.80
mg/cm2の割合で塗布し、大気中1000〜1200℃で拡
散させ、この磁器によつてバリスタを実施例1と
同様に作り、特性を測定したところ、V1
49.3V、αは29.9、ΔV1は−0.01%/℃、Cは
72nF、ΔV1pは−0.5%、Δαpは−0.6%、ΔV1T
−0.01%/℃であつた。 実施例 6 実施例3の磁器の代りに、 Sr0.60Ca0.40TiO3(第1成分) 100モル部、 Nb2O5(第2成分) 1.00モル部、 Al2O3(第4成分) 0.5モル部、 MnO2(第5成分) 0.10モル部、 の磁器を作り、この磁器にNa2Oペーストを1.50
mg/cm2の割合で塗布し、大気中1000〜1200℃で拡
散させ、この磁器で実施例1と同様にバリスタを
作り、特性を測定したところ、V1は30.1V、αは
36.9、ΔV1は+0.01%/℃、Cは118nF、ΔV1pは
−0.4%、Δαpは−0.4%、ΔV1Tは+0.01%/℃で
あつた。 この結果から明らかなように、出発原料にNa
化合物を添加せずに半導体磁器に熱拡散によつて
Na2Oを含有させても、耐サージバリスタを提供
することが出来る。 変形例 上記実施例及びその他の実験によつて次のこと
が確認されている。 (a) 還元性雰囲気中での加熱温度は、好ましくは
1300〜1500℃の範囲であり、1350〜1450℃の範
囲がより好ましい。更にこの処理時間は2〜8
時間が好ましい。 (b) 酸化処理は850℃〜1350℃で1〜5時間行う
ことが好ましい。 (c) 第2成分第5成分の出発原料を、実施例では
焼成後の磁器の各成分に相当するものにしてい
るが、最終的に金属酸化物を得ることが出来れ
ば、本発明の目的が達成されるので、出発原料
を金属酸化物とせずに、金属元素、炭酸塩、水
酸化物、硝酸塩、シユウ酸塩としてもよい。 (d) 本発明に係わるバリスタの性質を損わない範
囲で、特性改良物質を更に付加しても差支えな
い。 (e) 有機結合剤の好ましい範囲は、第1〜第4又
は第1〜第5成分、第1、第2、の合計重量に
対して5〜20重量%、より好ましい範囲は10〜
15重量%である。 (f) 還元性雰囲気の代りに中性雰囲気として焼成
してもよいこと。 (g) 加圧成形を500Kg/cm2〜2000Kg/cm2の範囲の
適当な値で行つてもよい。
[Table] As is clear from Tables 3 and 4 above, the fifth
By adding 0.01 to 3.00 mole parts of the component, a varistor with extremely small characteristic deterioration after application of a surge voltage and with a high α can be obtained. Furthermore, the fifth component is
If it exceeds 3.00 mol parts, the characteristics deteriorate significantly after application of surge energy, and the absolute values of ΔV 1 p and Δαp exceed 10%. Also, ΔV 1T is 0.10% in absolute value.
Exceed. On the other hand, if the fifth component is less than 0.01 part by mole, there is no improvement in α. Therefore, the preferred range of the fifth component is 0.01 to 3.00 parts by mole. Example 3 In order to confirm that there is no problem in adding the third component (Na 2 O) after calcination without adding it to the starting material, 100 mol of Sr 0.70 Ca 0.30 TiO 3 (first component) was added. Powders of 0.50 mol parts of Nb 2 O 5 (second component) and 0.1 mol parts of Al 2 O 3 (fourth component) were put into a mortar and 20
Stirring (dry type) was performed for hours. Next, 10 to 15% by weight of polyvinyl alcohol was mixed as an organic binder into this varistor raw material and granulated, and the granulated mixture was molded into a disk at a molding pressure of about 1500 kg/cm 2 . Next, this disk was heated with N 2 (95 volume%) + H 2 (5 volume%)
Approximately 1350℃ in a reducing atmosphere (non-oxidizing atmosphere), 4
After firing for several hours, it was made into semiconductor porcelain with a diameter of 10 mm and a thickness of 0.8 mm. Next, NaF paste was applied to one main surface of this semiconductor porcelain at a rate of 0.90mg/ cm2 , and heat treatment was performed at 900℃ to 1100℃ for 2 hours in the air (oxidizing atmosphere). Na 2 O
was thermally diffused into semiconductor porcelain, and then Example 1
When I made a varistor using the same method and measured its characteristics using the same method, V 1 was 24.6V, α was 23.8, and ΔV 1 was 0.
%/℃, C is 139nF, ΔV 1 p is -0.5%, Δαp is -
0.5%, ΔV 1T was 0%/°C. Example 4 Instead of the porcelain of Example 3, Sr 0.8 Ca 0.2 TiO 3 (first component) 100 mole parts, Ta 2 O 5 (second component) 0.5 mole parts Al 2 O 3 (fourth component) 1.0 mole A piece of porcelain was made, and instead of the NaF paste in Example 3, Na 2 O paste was applied to the porcelain at a rate of 1.40 mg/cm 2 and diffused in the same manner as in Example 3, and then the same as in Example 1 was applied. When I made a varistor using the method and measured its characteristics, V 1 was 15.1V, α was 22.9, and ΔV 1 was +
0.01%/℃, C is 142nF, ΔV 1 p is -0.8%, Δαp
was −0.9%, and ΔV 1T was +0.01%/°C. Example 5 Instead of the porcelain of Example 3, Sr 0.99 Ca 0.01 TiO 3 (first component) 100 mole parts La 2 O 5 (second component) 0.1 mole part Al 2 O 3 (fourth component) 0.01 mole part Make porcelain with 0.5 mol part of SiO 2 (fifth component) and add 1.80 mol of NaF paste to this porcelain.
mg/cm 2 and diffused in the air at 1000-1200°C. A varistor was made from this porcelain in the same manner as in Example 1, and its characteristics were measured .
49.3V, α is 29.9, ΔV 1 is -0.01%/℃, C is
72 nF, ΔV 1 p was -0.5%, Δαp was -0.6%, and ΔV 1T was -0.01%/°C. Example 6 Instead of the porcelain of Example 3, Sr 0.60 Ca 0.40 TiO 3 (first component) 100 mole parts, Nb 2 O 5 (second component) 1.00 mole parts, Al 2 O 3 (fourth component) 0.5 Make porcelain with 0.10 molar parts of MnO 2 (fifth component), and add 1.50 molar parts of Na 2 O paste to this porcelain.
mg/cm 2 and diffused in the atmosphere at 1000-1200°C. A varistor was made from this porcelain in the same manner as in Example 1, and its characteristics were measured. V 1 was 30.1 V, α was
36.9, ΔV 1 was +0.01%/°C, C was 118 nF, ΔV 1 p was −0.4%, Δαp was −0.4%, and ΔV 1T was +0.01%/°C. As is clear from this result, Na
By thermal diffusion into semiconductor porcelain without adding compounds
Even if it contains Na 2 O, a surge-resistant varistor can be provided. Modifications The following has been confirmed by the above examples and other experiments. (a) The heating temperature in the reducing atmosphere is preferably
The temperature range is from 1300 to 1500°C, and more preferably from 1350 to 1450°C. Furthermore, this processing time is 2 to 8
time is preferable. (b) The oxidation treatment is preferably carried out at 850°C to 1350°C for 1 to 5 hours. (c) The starting materials for the second component and the fifth component correspond to the respective components of the fired porcelain in the examples, but if a metal oxide can be finally obtained, the purpose of the present invention is is achieved, the starting materials may be metal elements, carbonates, hydroxides, nitrates, and oxalates instead of metal oxides. (d) A property-improving substance may be further added to the varistor according to the present invention as long as the properties of the varistor are not impaired. (e) The preferable range of the organic binder is 5 to 20% by weight, based on the total weight of the first to fourth or first to fifth components, first and second, and the more preferable range is 10 to 20% by weight.
It is 15% by weight. (f) Firing may be performed in a neutral atmosphere instead of a reducing atmosphere. (g) Pressure molding may be carried out at any suitable value in the range of 500 Kg/cm 2 to 2000 Kg/cm 2 .

【図面の簡単な説明】[Brief explanation of drawings]

第1図は実施例1に係わるバリスタを概略的に
示す断面図である。第2図はV1、α、ΔV1を測
定する装置の回路図である。第3図はサージ印加
装置の回路図である。 1……磁器素体、2,3……電極、4……バリ
スタ。
FIG. 1 is a cross-sectional view schematically showing a varistor according to a first embodiment. FIG. 2 is a circuit diagram of an apparatus for measuring V 1 , α, and ΔV 1 . FIG. 3 is a circuit diagram of the surge application device. 1...porcelain body, 2, 3...electrode, 4...varistor.

Claims (1)

【特許請求の範囲】 1 Sr(1-x)CaxTiO3(但しxは0.01〜0.5の範囲の
値)100モル部と、 Nb2O5、Ta2O5、WO3、La2O3、CeO2
Nd2O3、Y2O3、Sm2O3、Pr6O11、及びDy2O3
内の少なくとも1種の金属酸化物0.01〜3.00モル
部と、 Na2O0.02〜2.50モル部と、 Al2O30.01〜1.50モル部と、 を含む電圧非直線磁器組成物。 2 Sr(1-x)CaxTiO3(但しxは0.01〜0.5の範囲の
値)100モル部と、 Nb2O5、Ta2O5、WO3、La2O3、CeO2
Nd2O3、Y2O3、Sm2O3、Pr6O11、及びDy2O3
内の少なくとも1種の金属酸化物0.01〜3.00モル
部と、 Na2O0.02〜2.50モル部と、 Ag2O、CuO、MnO2、及びSiO2の内の少なく
とも1種の酸化物0.01〜3.00モル部と、 Al2O30.01〜1.50モル部と、 を含む電圧非直線磁器組成物。
[Claims] 1 100 mole parts of Sr (1-x) Ca x TiO 3 (where x is a value in the range of 0.01 to 0.5), Nb 2 O 5 , Ta 2 O 5 , WO 3 , La 2 O 3 , CeO2 ,
0.01 to 3.00 mol parts of at least one metal oxide of Nd 2 O 3 , Y 2 O 3 , Sm 2 O 3 , Pr 6 O 11 , and Dy 2 O 3 and 0.02 to 2.50 mol of Na 2 O and 0.01 to 1.50 mole parts of Al 2 O 3 . 2 100 mol parts of Sr (1-x) Ca x TiO 3 (where x is a value in the range of 0.01 to 0.5), Nb 2 O 5 , Ta 2 O 5 , WO 3 , La 2 O 3 , CeO 2 ,
0.01 to 3.00 mol parts of at least one metal oxide of Nd 2 O 3 , Y 2 O 3 , Sm 2 O 3 , Pr 6 O 11 , and Dy 2 O 3 and 0.02 to 2.50 mol of Na 2 O 0.01 to 3.00 mol parts of at least one oxide of Ag 2 O, CuO, MnO 2 and SiO 2 , and 0.01 to 1.50 mol parts of Al 2 O 3 . .
JP58092750A 1983-05-26 1983-05-26 Voltage nonlinear porcelain composition Granted JPS59218702A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58092750A JPS59218702A (en) 1983-05-26 1983-05-26 Voltage nonlinear porcelain composition

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58092750A JPS59218702A (en) 1983-05-26 1983-05-26 Voltage nonlinear porcelain composition

Publications (2)

Publication Number Publication Date
JPS59218702A JPS59218702A (en) 1984-12-10
JPH0142606B2 true JPH0142606B2 (en) 1989-09-13

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Country Link
JP (1) JPS59218702A (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0740522B2 (en) * 1985-07-02 1995-05-01 松下電器産業株式会社 Voltage-dependent nonlinear resistor porcelain composition

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JPS59218702A (en) 1984-12-10

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