JPH0145017B2 - - Google Patents
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- Publication number
- JPH0145017B2 JPH0145017B2 JP58108456A JP10845683A JPH0145017B2 JP H0145017 B2 JPH0145017 B2 JP H0145017B2 JP 58108456 A JP58108456 A JP 58108456A JP 10845683 A JP10845683 A JP 10845683A JP H0145017 B2 JPH0145017 B2 JP H0145017B2
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- Prior art keywords
- measured
- laser
- fluid state
- analysis
- focal length
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
- G01N21/718—Laser microanalysis, i.e. with formation of sample plasma
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- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Plasma & Fusion (AREA)
- Optics & Photonics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Description
【発明の詳細な説明】
本発明は溶銑、溶鋼、スラグ、ガラス、半導体
などをはじめとする各種の流動状態にある金属ま
たは絶縁物の多成分元素を、これらに接触するこ
となくレーザーにより連続的にオンライン分析す
る方法に関する。
溶融物の分析には従来
(1) 試料をるつぼ等の閉容器内に静置して分析す
る。
(2) 試料を溶融物の流れから採取して分析する。
(3) 励起源や測定系の一部を溶融物の流れの中に
浸漬して分析する。
のいずれか、もしくはこれらを組み合わせた方法
が用いられてきた。閉容器内に試料を静置して分
析する方法は製造工程の分析に直ちに適用するこ
とが困難であり、また試料を流れから取り出した
り、溶融物の流れ中に分析具を浸漬する方法は被
測定物の流れを乱したり、汚染するという短所を
有していた。
本発明は従来法のこのような問題点を解決し、
流動状態にある金属や絶縁物に接触することなく
その成分分析をオンラインで実施しようとするも
ので、流動状態の被測定溶融物に大出力パルスレ
ーザー光を照射し、その時得られる発光スペクト
ルを分光することにより、被測定物に励起源、測
定系を接触させずに、連続的にオンライン分析す
ることを目的としている。
なおこのレーザー発光分析を溶融物に適用した
例はこれまでいくつかあるが、いずれも試料をる
つぼ等の閉容器内に静置することを前提にしてお
り、溶融物が流動状態にあつてその表面が上下動
するような製造工程におけるオンライン分析に関
するものではない。
本発明は被測定物が溶融状態で連続して流れて
くるような製造工程におけるオンライン分析に関
するものであり、レーザー発光分光分析を基本手
法としている。レーザー発光分光分析は、被測定
物表面に強力なパルス状のレーザー光を集光して
被測定物表面層を瞬時に蒸発させ、レーザー光で
さらに励起して発光させ、その光を分光すること
によつて成分分析を行うもので、被測定物にレー
ザー系、分光器系を接触させる必要がない。
ところでこの分析手法を実際に現場分析に適用
するに当つては、被測定物の上下動の影響が最大
の問題となる。本発明者らはこの問題点を解明す
るために第１図に示す装置を用いて、その調査を
行つた。レーザーとしては、パルス幅15nsec、出
力2J、波長1.06μｍの赤外線パルスレーザーを用
いた。
第１図について説明するとレーザー発振器１よ
り発生したレーザー光は、プリズム２で下方に曲
げられ、集光レンズ３により被測定物４の表面に
集光されるようになつている。被測定物４として
ここではFe−0.3％Mn合金を用い、この合金をタ
ンマン炉５により溶解した。この時被測定物４の
表面に酸化膜が生成される事が予想されたので、
アルゴンガス導入部６よりアルゴンガスを吹き込
み、アルゴンガス排出部７より系外に放出させ、
酸化膜の生成を抑制した。レーザー光によつて生
じた光は凹面鏡８、平面鏡９ａ，９ｂからなる光
導入系により分光器１０に導いた。分光器１０の
内部では、通常の方法により波長分離し、271.4n
ｍのFeスペクトル、293.3nｍのMnスペクトルの
強度を二つの光検出器１１により測定した、被測
定物４とレーザー分光器光学系の距離を変えるた
めにタンマン炉５をリフト１２の上に載せ、溶解
炉全体を上下させた。この際アルゴンガスの流れ
が乱れぬよう、光導入系とタンマン炉５の間にす
り合せ１３を設けた。レーザーの集光レンズ３と
してはそれぞれ焦点距離20、50、100、150、200
cmの５種類を取りかえて用いた。なお集光レンズ
３を交換した場合には、被測定物表面がその焦点
にある時に発生する光が分光器入口スリツト１４
に結像するように凹面鏡８の半径を選び、平面鏡
９ａ，９ｂの角度を調整した。第２図に焦点距離
100cmの集光レンズを用いた時の被測定物４の上
下動によるFe、Mnスペクトル強度およびその比
の変化を示す。被測定物表面が集光レンズ３の焦
点からずれるに従つて、スペクトル強度が次第に
減少しているが、分析に使用するスペクトル強度
の比は、被測定物表面が集光レンズ３の焦点より
上下５cmほどずれても変化しない。同様の測定を
集光レンズ３を換えて行つた結果をまとめると第
３図のようになり、集光レンズ３と被測定物表面
の間の距離ｌが、集光レンズ３の焦点距離ｆに対
し
0.95f≦ｌ≦1.05f ………(1)
であれば、スペクトル強度比は不変であり、被測
定物の上下動にかかわらず、安定した分析値が得
られることが判明した。
次に被測定物４として絶縁物系のSiO2・Al2O3
を用い、Si（288.2nｍ）、Al（309.3nｍ）の線スペ
クトルについて、第２図と同様の測定を行つた。
その結果を第４図に示す。この場合にも、被測定
物表面が集光レンズ３の焦点より５cmずれても、
スペクトル強度比はほぼ一定となつている。さら
に、集光レンズ３を換えて行つた測定結果も第３
図とほぼ同様であり、上記(1)式が満たされれば、
被測定物表面の上下動の影響を受けないことが明
らかとなつた。
本発明はこのような知見に基づくもので、その
要旨とするところは流動状態の金属または絶縁物
のレーザー連続分析方法において、流動状態を予
め観測しておき、流動状態の被測定物表面に該表
面の垂直方向からレーザー光を集光照射する集光
レンズの焦点距離ｆと、該集光レンズと被測定物
間の距離ｌとの関係が常に、
0.95f≦ｌ≦1.05f
の範囲内になるように焦点距離ｆおよび距離ｌを
選定し、または流動状態の表面位置制御を行い、
前記流動物表面に照射した大出力パルスレーザー
の放出光を分光分析することを特徴とする流動状
態の金属または絶縁物のレーザー連続分析方法で
ある。
本発明は、被測定物が連続して流れており、そ
の表面の上下動が避けがたい製造工程において
も、上記(1)式を満たすような場所にレーザー分光
器系を設置し、適切な焦点距離を持つた集光レン
ズ３を選定することにより、安定したレーザー発
光分光分析をはじめて可能にしたものである。焦
点距離100〜200cmの集光レンズを用いれば、被測
定物表面の10〜20cmの上下動を許容することがで
き、通常の製造工程において上下動の変動幅がこ
のような範囲内に限定される場所を見い出すこと
や、被測定物の表面変動をこの範囲内に制御する
ことにより、本発明を容易に実施することができ
る。この制御は例えば製造工程を改良し、上記(1)
式が常に成立するような樋等を特別に用意し、こ
れを制御することでも良く、また溶解炉の傾斜を
制御して、そこから流出する被測定物流が上記(1)
式を満たすようにすることでも良い。
本発明を実施するに当つては、まず装置を設置
する場所における被測定物表面の上下動の変動範
囲を適当な方法により測定する。この時の変動幅
の10倍以上の長さの焦点距離を持つ集光レンズを
用意すれば、(1)式が常に成立し、被測定物と集光
レンズとの距離の制御は不要となる。また、条件
に応じて、被測定物表面の上下動の変動範囲が集
光レンズの焦点距離の10分の１以下となるような
表面位置制御方法を講ずる。
次いで、この被測定物表面から放出された光が
分光器入口スリツトに結像するように光導入系を
調整する。レーザーとしては赤外線パルスレーザ
ーが適しているが、可視光の得られるルビーレー
ザーも使用することができる。レーザー照射によ
つて放出された光の分光や特定スペクトルの強度
の測定は公知の手法による。
なお被測定物表面に酸化膜等の別の物質が存在
する時は、これをアルゴンガスや窒素ガスを吹き
付けて除去するか、または被測定物と分離する適
当な障害物等を設け、レーザー光を被測定物に直
接照射できるようにする。
実施例
第５図は本発明の実施に係る装置の側面図を示
したものである。被測定物４は溶鉱炉の出銑樋を
流れる銑鉄である。銑鉄の表面には通常スラグが
載つているが、スキマーによりこれを除去した直
後の位置にレーザー分光器を設置した。レーザー
としてはパルス幅15nsec、出力2Jの赤外線パルス
レーザーを用いた。レーザー発振器１と分光器１
０は分析台１５上に固定した。レーザー光はプリ
ズム２で被測定物方向に垂直に曲げ、集光レンズ
３で収束した。この分析地点における銑鉄表面の
上下動は最大で10cmと計測されたので、集光レン
ズ３としては焦点距離がその10倍以上すなわち
100cm以上のものを用いれば良いが、光導入系等
が銑鉄の輻射熱を過度に受けないように、焦点距
離170cmのレンズを用いた。レーザー照射によつ
て放出された光は凹面鏡８、平面鏡９ａ，９ｂか
らなる光導入系で分光器入口スリツト１４に結像
するようにした。この光導入系がガス、粉塵で汚
染されないようアルゴンガス導入部６よりアルゴ
ンガスを吹き込んだが、さらに安全を期するため
に、光導入系下部にアルゴン吹き付け管１６を取
り付け、アルゴンガス追加導入部１７よりさらに
アルゴンガスを吹き込んだ。分光器１０は焦点距
離200cmで、2400l／mmの回折格子で分光し、光電
子増倍管１８によりスペクトル強度を求めた。分
析した元素、スペクトル線の波長、分析結果を第
１表に示す。この表には従来法により試料を採取
し、るつぼ内に静置して分析した結果も併せて示
したが、本発明による分析結果は従来法と良く一
致している。
本発明方法によつて、流動状態の金属または絶
縁物をレーザーを用いて精度よくオンライン分析
することが可能となり、オンラインの工程管理や
品質管理の精度を著しく高めることが可能となつ
た。
【表】DETAILED DESCRIPTION OF THE INVENTION The present invention continuously collects multi-component elements of metals or insulators in various fluid states, including hot metal, molten steel, slag, glass, semiconductors, etc., using a laser without coming into contact with them. on how to analyze online. Conventional methods for analyzing molten materials: (1) The sample is placed in a closed container such as a crucible and analyzed. (2) A sample is taken from the melt stream and analyzed. (3) Part of the excitation source and measurement system is immersed in the melt flow for analysis. Either method or a combination of these methods have been used. The method of analysis by leaving the sample still in a closed container is difficult to immediately apply to analysis in the manufacturing process, and the method of removing the sample from the flow or immersing the analytical tool in the flow of molten material is difficult to apply. This has the disadvantage of disturbing the flow of the object to be measured and causing contamination. The present invention solves these problems of the conventional method,
This method attempts to analyze the components of metals and insulators in a fluid state online without coming into contact with them.The molten material to be measured in a fluid state is irradiated with high-power pulsed laser light, and the emission spectrum obtained at that time is analyzed by spectroscopy. By doing so, the aim is to perform continuous online analysis without bringing the excitation source or measurement system into contact with the object to be measured. There have been several examples of applying this laser emission analysis to molten materials, but all of them are based on the premise that the sample is placed in a closed container such as a crucible, and the molten material is in a fluid state. It is not concerned with on-line analysis in manufacturing processes where surfaces move up and down. The present invention relates to on-line analysis in a manufacturing process in which an object to be measured continuously flows in a molten state, and uses laser emission spectrometry as a basic method. Laser emission spectroscopy involves focusing a powerful pulsed laser beam onto the surface of an object to be measured, instantly evaporating the surface layer of the object, and then exciting it further with the laser beam to emit light, which is then analyzed into spectra. This method performs component analysis using a method that eliminates the need for a laser system or spectrometer system to come into contact with the object to be measured. However, when this analysis method is actually applied to on-site analysis, the biggest problem is the influence of vertical movement of the object to be measured. In order to solve this problem, the present inventors conducted an investigation using the apparatus shown in FIG. As the laser, an infrared pulsed laser with a pulse width of 15 nsec, an output of 2 J, and a wavelength of 1.06 μm was used. Referring to FIG. 1, laser light generated by a laser oscillator 1 is bent downward by a prism 2, and is focused onto the surface of an object to be measured 4 by a condenser lens 3. Here, an Fe-0.3%Mn alloy was used as the object to be measured 4, and this alloy was melted in a Tammann furnace 5. At this time, it was expected that an oxide film would be formed on the surface of the object to be measured 4, so
Blowing argon gas from the argon gas introduction part 6 and releasing it from the argon gas discharge part 7 to the outside of the system,
Suppressed the formation of oxide film. Light generated by the laser beam was guided to a spectroscope 10 by a light introduction system consisting of a concave mirror 8 and plane mirrors 9a and 9b. Inside the spectrometer 10, wavelength separation is performed using a normal method, and 271.4n
The intensity of the Fe spectrum at m and the Mn spectrum at 293.3 nm were measured by two photodetectors 11.The Tammann furnace 5 was placed on the lift 12 in order to change the distance between the object to be measured 4 and the laser spectrometer optical system. The entire melting furnace was raised and lowered. At this time, a grating 13 was provided between the light introduction system and the Tammann furnace 5 so that the flow of argon gas was not disturbed. The focal length of the laser condensing lens 3 is 20, 50, 100, 150, and 200, respectively.
Five different types of cm were used. Note that when the condensing lens 3 is replaced, the light generated when the surface of the object to be measured is at its focal point is transferred to the spectrometer entrance slit 14.
The radius of the concave mirror 8 was selected so that an image was formed, and the angles of the plane mirrors 9a and 9b were adjusted. Figure 2 shows the focal length
It shows changes in Fe and Mn spectral intensities and their ratios due to vertical movement of the object to be measured 4 when using a 100 cm condensing lens. The spectral intensity gradually decreases as the surface of the object to be measured shifts from the focal point of the condenser lens 3, but the ratio of spectral intensities used for analysis is as follows: There is no change even if it is shifted by about 5 cm. The results of similar measurements performed by changing the condenser lens 3 are summarized as shown in Figure 3, where the distance l between the condenser lens 3 and the surface of the object to be measured is equal to the focal length f of the condenser lens 3. On the other hand, it was found that if 0.95f≦l≦1.05f (1), the spectral intensity ratio remains unchanged, and stable analytical values can be obtained regardless of the vertical movement of the object to be measured. Next, as the object to be measured 4, insulator-based SiO 2 Al 2 O 3
The same measurements as shown in Fig. 2 were carried out on the line spectra of Si (288.2 nm) and Al (309.3 nm).
The results are shown in FIG. In this case as well, even if the surface of the object to be measured deviates from the focus of the condenser lens 3 by 5 cm,
The spectral intensity ratio remains almost constant. Furthermore, the measurement results obtained by changing the condenser lens 3 are also shown in the third table.
It is almost the same as the figure, and if the above equation (1) is satisfied,
It has become clear that this method is not affected by vertical movement of the surface of the object to be measured. The present invention is based on such findings, and its gist is that in a method for continuous laser analysis of metals or insulators in a fluid state, the fluid state is observed in advance and the surface of the object to be measured in the fluid state is measured. The relationship between the focal length f of the condenser lens that condenses and irradiates laser light from the vertical direction of the surface and the distance l between the condenser lens and the object to be measured is always within the range of 0.95f≦l≦1.05f. Select the focal length f and distance l, or control the surface position in the fluid state, so that
This continuous laser analysis method for metals or insulators in a fluid state is characterized by spectroscopically analyzing the emitted light of a high-power pulsed laser irradiated onto the surface of the fluid. The present invention enables the laser spectrometer system to be installed at a location that satisfies the above equation (1) even in the manufacturing process where the object to be measured is continuously flowing and vertical movement of its surface is unavoidable. By selecting a condensing lens 3 with a certain focal length, stable laser emission spectroscopic analysis is made possible for the first time. If a condensing lens with a focal length of 100 to 200 cm is used, vertical movement of 10 to 20 cm on the surface of the object to be measured can be tolerated, and the fluctuation range of vertical movement is limited to this range in normal manufacturing processes. The present invention can be easily implemented by finding a location where the surface of the object to be measured falls within this range and by controlling surface variations of the object to be measured within this range. This control can improve the manufacturing process, for example, and
It is also possible to specially prepare and control a gutter etc. so that the formula always holds true, or by controlling the slope of the melting furnace so that the flow to be measured flowing out from it can be controlled as described in (1) above.
It is also possible to satisfy the formula. In carrying out the present invention, first, the range of variation in the vertical movement of the surface of the object to be measured at the location where the device is installed is measured by an appropriate method. If you prepare a condensing lens with a focal length that is at least 10 times longer than the fluctuation width at this time, equation (1) will always hold, and there will be no need to control the distance between the object to be measured and the condensing lens. . Also, depending on the conditions, a surface position control method is adopted so that the range of variation in vertical movement of the surface of the object to be measured is one-tenth or less of the focal length of the condenser lens. Next, the light introduction system is adjusted so that the light emitted from the surface of the object to be measured is focused on the spectrometer entrance slit. An infrared pulsed laser is suitable as the laser, but a ruby laser that emits visible light can also be used. The spectroscopy of the light emitted by laser irradiation and the measurement of the intensity of a specific spectrum are performed using known methods. If there is another substance such as an oxide film on the surface of the object to be measured, remove it by spraying argon gas or nitrogen gas, or install an appropriate obstacle to separate it from the object to be measured, and then remove the laser beam. to directly irradiate the object to be measured. Embodiment FIG. 5 shows a side view of an apparatus according to the embodiment of the present invention. The object to be measured 4 is pig iron flowing through a tap pipe of a blast furnace. There is usually slag on the surface of the pig iron, but a laser spectrometer was installed immediately after slag was removed using a skimmer. The laser used was an infrared pulsed laser with a pulse width of 15 ns and an output of 2 J. Laser oscillator 1 and spectrometer 1
0 was fixed on the analysis table 15. The laser beam was bent perpendicularly to the direction of the object to be measured by a prism 2 and converged by a condenser lens 3. Since the vertical movement of the pig iron surface at this analysis point was measured to be a maximum of 10 cm, the focal length of the condenser lens 3 should be at least 10 times that amount, i.e.
Although it is sufficient to use a lens of 100 cm or more, a lens with a focal length of 170 cm was used to prevent the light introduction system from receiving too much radiant heat from the pig iron. The light emitted by laser irradiation was imaged on the spectrometer entrance slit 14 by a light introduction system consisting of a concave mirror 8 and plane mirrors 9a and 9b. Argon gas was blown from the argon gas introduction part 6 to prevent the light introduction system from being contaminated with gas and dust, but for further safety, an argon blowing pipe 16 was attached to the lower part of the light introduction system, and an argon gas additional introduction part 17 More argon gas was blown into it. The spectrometer 10 had a focal length of 200 cm, used a 2400 l/mm diffraction grating to perform spectroscopy, and used a photomultiplier tube 18 to determine the spectral intensity. Table 1 shows the analyzed elements, wavelengths of spectral lines, and analysis results. This table also shows the results of samples taken by the conventional method and analyzed after being placed in a crucible, and the analysis results according to the present invention are in good agreement with the conventional method. By the method of the present invention, it has become possible to accurately conduct on-line analysis of metals or insulators in a fluid state using a laser, and it has become possible to significantly improve the precision of on-line process control and quality control. 【table】
第１図は被測定物表面の上下動の影響を調査し
たレーザー分光分析装置の模式的側面図、第２図
はFe−0.3％Mnの表面の上下動によるスペクトル
強度の変化を示すグラフ、第３図はスペクトル強
度比が一定となる範囲を示すグラフ、第４図は
SiO2−Al2O3の表面の上下動によるスペクトル強
度の変化を示すグラフ、第５図は溶銑樋上におけ
る本発明を実施する装置例の側面図を示す。
１……レーザー発振器、２……プリズム、３…
…集光レンズ、４……被測定物、５……タンマン
炉、６……アルゴンガス導入部、７……アルゴン
ガス排出部、８……凹面鏡、９ａ，９ｂ……平面
鏡、１０……分光器、１１……光検出器、１２…
…リフト、１３……すり合せ、１４……分光器入
口スリツト、１５………分析台、１６……アルゴ
ン吹き付け管、１７……アルゴンガス追加導入
部、１８……光電子増倍管。
Figure 1 is a schematic side view of a laser spectrometer that investigated the effect of vertical movement on the surface of the object to be measured. Figure 2 is a graph showing changes in spectral intensity due to vertical movement of the surface of Fe-0.3%Mn. Figure 3 is a graph showing the range where the spectral intensity ratio is constant, and Figure 4 is a graph showing the range where the spectral intensity ratio is constant.
A graph showing changes in spectral intensity due to vertical movement of the surface of SiO 2 --Al 2 O 3. FIG. 5 shows a side view of an example of an apparatus for implementing the present invention on a hot metal sluice. 1... Laser oscillator, 2... Prism, 3...
...Condensing lens, 4...Measurement object, 5...Tammann furnace, 6...Argon gas inlet, 7...Argon gas exhaust part, 8...Concave mirror, 9a, 9b...Plane mirror, 10...Spectroscopy Device, 11... Photodetector, 12...
... Lift, 13 ... Grinding, 14 ... Spectrometer entrance slit, 15 ... Analysis table, 16 ... Argon blowing tube, 17 ... Argon gas additional introduction part, 18 ... Photomultiplier tube.
Claims (1)
分析方法において、流動状態を予め観測してお
き、流動状態の被測定物表面に該表面の垂直方向
からレーザー光を集光照射する集光レンズの焦点
距離ｆと、該集光レンズと被測定物間の距離ｌと
の関係が常に、 0.95f≦ｌ≦1.05f の範囲内になるように焦点距離ｆおよび距離ｌを
選定し、または流動状態の表面位置制御を行い、
前記流動状態の被測定物表面に照射した大出力パ
ルスレーザーによる放出光を分光分析することを
特徴とする流動状態の金属、絶縁物のレーザー連
続分析方法。[Claims] 1. In a continuous laser analysis method for metals or insulators in a fluid state, the fluid state is observed in advance, and a focused laser beam is irradiated onto the surface of the object to be measured in a fluid state from a direction perpendicular to the surface. The focal length f and distance l are selected so that the relationship between the focal length f of the condenser lens to be measured and the distance l between the condenser lens and the object to be measured is always within the range of 0.95f≦l≦1.05f. or control the surface position of the fluid state,
A continuous laser analysis method for metals and insulators in a fluid state, characterized by spectroscopically analyzing light emitted by a high-power pulse laser irradiated onto the surface of the object to be measured in a fluid state.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10845683A JPS60347A (en) | 1983-06-16 | 1983-06-16 | Laser continuous analysis of metal and insulator in fluidized state |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10845683A JPS60347A (en) | 1983-06-16 | 1983-06-16 | Laser continuous analysis of metal and insulator in fluidized state |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60347A JPS60347A (en) | 1985-01-05 |
| JPH0145017B2 true JPH0145017B2 (en) | 1989-10-02 |
Family
ID=14485228
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10845683A Granted JPS60347A (en) | 1983-06-16 | 1983-06-16 | Laser continuous analysis of metal and insulator in fluidized state |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60347A (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6469847A (en) * | 1987-09-07 | 1989-03-15 | Aisin Seiki | Control device for automatic transmission gear |
| US6439269B1 (en) | 2000-06-28 | 2002-08-27 | Burlington Industries, Inc. | Room darkener fabric with solution dyed black yarn |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS547593A (en) * | 1977-06-20 | 1979-01-20 | Sumitomo Electric Ind Ltd | Through-under-bridg cable placing from ship |
| JPS57100323A (en) * | 1980-12-15 | 1982-06-22 | Kawasaki Steel Corp | Method for spectrochemical analysis of steel by using laser beam |
-
1983
- 1983-06-16 JP JP10845683A patent/JPS60347A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS60347A (en) | 1985-01-05 |
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