JPH0148499B2 - - Google Patents

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Publication number
JPH0148499B2
JPH0148499B2 JP3088083A JP3088083A JPH0148499B2 JP H0148499 B2 JPH0148499 B2 JP H0148499B2 JP 3088083 A JP3088083 A JP 3088083A JP 3088083 A JP3088083 A JP 3088083A JP H0148499 B2 JPH0148499 B2 JP H0148499B2
Authority
JP
Japan
Prior art keywords
tube
molten metal
particle
counter electrode
particulate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP3088083A
Other languages
Japanese (ja)
Other versions
JPS59157542A (en
Inventor
Akihiro Ono
Masao Saeki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP3088083A priority Critical patent/JPS59157542A/en
Publication of JPS59157542A publication Critical patent/JPS59157542A/en
Publication of JPH0148499B2 publication Critical patent/JPH0148499B2/ja
Granted legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/73Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches

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  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Plasma & Fusion (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Description

【発明の詳細な説明】 本発明は、溶融金属表面と対電極間に高電圧を
かけてスパークなどの電気的放電を行わせ、溶融
金属の成分組成を代表する超微粒子を蒸発させ、
これを離れた場所に設定してあるプラズマ発光分
光分析装置に不活性ガス流で搬送し、溶融金属中
の各種成分含有率をオンラインリアルタイムで分
析することを目的とする溶融金属の直接発光分光
分析装置に関するものである。
Detailed Description of the Invention The present invention involves applying a high voltage between the molten metal surface and a counter electrode to cause electrical discharge such as a spark to evaporate ultrafine particles representative of the composition of the molten metal.
This is a direct emission spectrometry analysis of molten metal that aims to transport the molten metal using an inert gas flow to a plasma emission spectrometer set up at a remote location and analyze the content of various components in the molten metal in real time online. It is related to the device.

金属製造業における製造工程管理には、サンプ
リングして固化させたブロツク試料を対象とする
スパーク発光分光分析が多用されている。しか
し、近年とくに鉄鋼業に見られるようにより迅速
な製造工程管理あるいは多段精錬製鋼法などの新
製造プロセスの操業管理のために、溶銑や溶鋼の
ような溶融金属を直接対象とするオンラインリア
ルタイムの分析手法の開発が強く要請されてい
る。これまで、溶融金属をArガスを用いた特殊
な噴霧器によつて微粉化して発光分光分析する方
法(BISRA Annual Report:78(1966)、65、78
(1967)、35(1968))など各種の手法により研究開
発が試みられてきた。しかし、これらの方法はこ
れまで実際に製造現場で実用されたことはなく、
いずれも実験室規模で試みられたに過ぎない。
Spark emission spectroscopic analysis of sampled and solidified block samples is often used for manufacturing process control in the metal manufacturing industry. However, in recent years, especially in the steel industry, online real-time analysis that directly targets molten metals such as hot metal and molten steel has become necessary for faster manufacturing process control or operational management of new manufacturing processes such as multi-stage refining steelmaking methods. There is a strong need to develop a method. Until now, a method has been used to pulverize molten metal using a special atomizer using Ar gas and perform emission spectroscopic analysis (BISRA Annual Report: 78 (1966), 65, 78
(1967), 35 (1968)), research and development have been attempted using various methods. However, these methods have never been actually put into practical use at manufacturing sites.
All of these have only been attempted on a laboratory scale.

実際の製造現場で実用可能な溶融金属の直接分
析装置の実現をはかるには、先ず、その製造現場
は高温、振動、ダストなど測定環境が非常に悪い
点を考慮しなければならない。このような劣悪な
測定環境下ではトラブルが起る分光、検出器等の
精密測定機器は溶融金属の存在場所から離して設
置し、溶融金属は電気的放電などによつて微粉化
して搬送するなどの方法が有望になる。本発明
は、溶融金属を0.1μm以下で粒度分布域が狭い超
微粒子を安定して発生させる方法、搬送管内壁へ
の微粒子の付着残留を防止して数10mの長距離を
効率よく搬送する方法及び分析装置への導入方法
等を中心に研究開発を進め、簡単・迅速に高い精
度・感度で分析でき、実用的な新規分析装置を提
供するにいたつたものである。
In order to create a direct analysis device for molten metal that can be put to practical use at actual manufacturing sites, it must first be taken into account that the manufacturing site has a very poor measurement environment, including high temperatures, vibrations, and dust. Precision measuring instruments such as spectrometers and detectors, which can cause problems in such poor measurement environments, should be installed away from the location where the molten metal is present, and the molten metal should be pulverized by electrical discharge and transported. method is promising. The present invention provides a method for stably generating ultrafine particles of 0.1 μm or less and a narrow particle size distribution range from molten metal, and a method for efficiently transporting molten metal over long distances of several tens of meters by preventing the particles from adhering and remaining on the inner wall of the transport pipe. We have conducted research and development focusing on methods for introducing this into analytical equipment, etc., and have now provided a practical new analytical equipment that can perform analysis easily, quickly, and with high accuracy and sensitivity.

第1図、第2図に示す本発明実施例装置によ
り、本発明の詳細について説明する。本発明装置
は、大別すると微粒子生成プローブ1、スパーク
放電装置18、微粒子搬送管22、搬送ガス分配
装置24及びプラズマ励起源を有する発光分光分
析装置37から構成される。微粒子生成プローブ
1は、溶融金属13と対電極8間に高電圧をかけ
てスパーク放電を行わせ、溶融金属を局部的に更
に高温の過熱状態に保ち、金属の組成を代表する
微粒子を煙状に蒸発させる働きをする部分であ
る。対電極8は、先端をとがらせた2〜5mmφ程
度の小径の丸棒が適切であり、材質は蒸発消耗の
少ない高融点金属であるタングステンなどが適し
ている。先端を円錐状にとがらせた形状は、微粒
子を常時一定速度で蒸発させる上で重要である。
対電極8先端部と溶融金属13表面との間隙を5
mmとしてスパーク放電を飛ばすと約100mmφの範
囲内でパルス放電が繰り返され、放電カラム14
も安定して形成され、微粒子の蒸発量も常時安定
し、良好な分析結果が得られる。湯面レベルが多
少変動しても常に対電極先端からの放電カラム1
4が形成され、微粒子の蒸発量の変動もごくわず
かに抑えることができた。電極間間隙を5mmに設
定した場合、±2mmの湯面の変動が起つても微粒
子の生成量の変動は5%以内に抑制できた。しか
し、対電極先端を丸棒の断面としたり、微粒子導
入管3のパイプ断面を直接電極先端として用いた
場合は、安定した放電カラムが形成されず、とく
に湯面の変動が起つた場合は放電カラムが移動
し、微粒子の蒸発量の再現性が得られなくなり、
分析精度を極端に低下させた。このような理由か
ら、微粒子導入管3は対電極8の電導体としては
用いるが、スパーク放電用の対電極はこの導入管
3の先端に固設するようにした。この固設の方法
はいくつかあるが、第2図及び第3図に示すよう
に微粒子導入管3の下端に円筒状の電極ホルダー
6を溶接などによつて接続し、電極ホルダー6の
中心部に対電極8を垂直に挿入し、微粒子導入口
7を開けるようにしてビス9などで固定する方法
が適当である。
The details of the present invention will be explained using an embodiment of the present invention shown in FIGS. 1 and 2. The apparatus of the present invention is broadly divided into a particle generation probe 1, a spark discharge device 18, a particle transport tube 22, a carrier gas distribution device 24, and an optical emission spectrometer 37 having a plasma excitation source. The particle generation probe 1 applies a high voltage between the molten metal 13 and the counter electrode 8 to generate a spark discharge, locally keeps the molten metal in a superheated state at a higher temperature, and generates particles representative of the composition of the metal in the form of smoke. This is the part that evaporates the water. The counter electrode 8 is suitably a round bar with a small diameter of about 2 to 5 mm with a pointed tip, and the suitable material is tungsten, which is a high melting point metal with little evaporation consumption. The conical shape of the tip is important for evaporating fine particles at a constant rate.
The gap between the tip of the counter electrode 8 and the surface of the molten metal 13 is 5
When a spark discharge is emitted as mm, pulse discharge is repeated within a range of approximately 100 mmφ, and the discharge column 14
are formed stably, the amount of evaporation of fine particles is always stable, and good analytical results can be obtained. Discharge column 1 always flows from the tip of the counter electrode even if the hot water level changes slightly.
4 was formed, and fluctuations in the amount of evaporation of fine particles could be suppressed to a very small extent. When the gap between the electrodes was set to 5 mm, even if the hot water level varied by ±2 mm, the variation in the amount of fine particles produced could be suppressed to within 5%. However, if the tip of the counter electrode is a cross section of a round bar or the cross section of the pipe of the particle introduction tube 3 is directly used as the tip of the electrode, a stable discharge column will not be formed, and especially if the melt level fluctuates, the discharge The column moves and the reproducibility of the evaporation amount of fine particles becomes impossible.
Analysis accuracy was extremely reduced. For these reasons, the particle introduction tube 3 is used as a conductor for the counter electrode 8, but the counter electrode for spark discharge is fixed at the tip of the introduction tube 3. There are several methods for this fixing, but as shown in FIGS. 2 and 3, a cylindrical electrode holder 6 is connected to the lower end of the particle introduction tube 3 by welding or the like, and the central part of the electrode holder 6 is A suitable method is to insert the counter electrode 8 vertically into the electrode, open the particle introduction port 7, and fix it with screws 9 or the like.

微粒子導入管3は鋼や銅製の内径2〜3mmφ程
度の小径の管を用いるが、上部は耐熱絶縁材を介
して冷却筒2頂部に固定保持される。微粒子導入
管3の外側にはアルミナやマグネシアなどの耐熱
絶縁管4が被覆されるが、その外周には同心円状
にわずかな間隙5ができるように冷却筒2内部に
は穴があけられており、この間隙5の上部はAr
などの不活性ガス供給管15が取りつけられ、下
部はガス吹き出し口10につながつている。冷却
筒2自体は、溶融金属の輻射熱による加熱を防止
するために空冷あるいは水冷によつて冷却できる
機構を備えている。又、冷却筒2の下部周囲には
窒化ホウ素などの絶縁耐火材でできた円筒11が
取り付けられており、下端を溶融金属13中に浸
漬して内部に小空間室12を形成している。上記
の微粒子導入管3の下端に対電極8を取り付けた
電極ホルダー6は、この小空間室12につきでて
おり、対電極8の先端部は溶融金属表面13に垂
直に対向し、5〜10mmの範囲で一定間隔をもつて
設定され、対電極先端部のわずか上部に微粒子導
入口7が下向きに開口している。ガス吹き出し口
10は小空間室12の頂部に位置し、微粒子導入
口7よりも上部位置にある方が蒸発した微粒子の
効率的導入に適している。
The particulate introduction pipe 3 is made of steel or copper and has a small inner diameter of about 2 to 3 mmφ, and the upper part is fixedly held at the top of the cooling cylinder 2 via a heat-resistant insulating material. The outside of the particulate introduction tube 3 is coated with a heat-resistant insulating tube 4 made of alumina, magnesia, etc., and holes are drilled inside the cooling tube 2 so that a small gap 5 is formed concentrically around the outer circumference. , the upper part of this gap 5 is Ar
An inert gas supply pipe 15 such as the like is attached, and the lower part is connected to the gas outlet 10. The cooling cylinder 2 itself is equipped with a mechanism capable of being cooled by air cooling or water cooling in order to prevent heating of the molten metal by radiant heat. Further, a cylinder 11 made of an insulating refractory material such as boron nitride is attached around the lower part of the cooling cylinder 2, and the lower end is immersed in the molten metal 13 to form a small space chamber 12 inside. An electrode holder 6 with a counter electrode 8 attached to the lower end of the particle introduction tube 3 is protruded from this small space chamber 12, and the tip of the counter electrode 8 is perpendicularly opposed to the molten metal surface 13, and is 5 to 10 mm The microparticle inlets 7 are set at regular intervals within the range of , and a particle inlet 7 opens downward slightly above the tip of the counter electrode. The gas outlet 10 is located at the top of the small space chamber 12, and its position above the particle introduction port 7 is more suitable for efficient introduction of evaporated particles.

対電極8先端部と溶融金属13表面間に高電圧
をかけてスパーク放電を飛ばし、蒸発生成した溶
融金属の超微粒子は、Arガス吹き出し口10か
ら吐出したArガス流に乗つて、対電極8先端直
上に位置する微粒子導入口7に迅速に運び込まれ
る。小空間室12は直径30mmφ、高さ30mm以下の
小容積であり、蒸発微粒子の拡散は起りにくく、
生成すると同時に効率よく導入口7へ導入され
る。吹き込まれる不活性ガスは、小空間室12内
の大気を追い出してスパーク放電が起り易い雰囲
気をつくるためと、生成した微粒子を分析計へ搬
送するために必要となる。ガスの種類は、生成す
る微粒子の粒径や量に影響し、Ar、He、Ar―
H2などが用いられるが、通常はArガスが適当で
ある。生成した微粒子の拡散を防ぐために放電を
行う空間室12を極力小さくする必要があるが、
そのために通常10〜20/minで吹き込まれる
Arガスによつて溶融金属表面が冷却されるへい
害が起り易くなる。微粒子を伴なつて導入管3を
通過するArガス温度は数100度に達するが、本発
明のArガスの吹き込みは導入管3の外壁に作つ
た間隙5を通つて供給されるために、熱交換作用
によつて予熱されてから吹き込まれるので、溶融
金属表面の冷却は防止できる。又、蒸発生成した
超微粒子は管内壁の温度が低いと即座に内壁に付
着する性質をもち、微粒子の定量的な搬送が困難
になる。あるいは、微粒子搬送管22を数10mの
ように長尺とした場合に起り易くなる管内などに
付着残留する微粒子を洗浄する目的で断続的に高
圧をかけてArガスを高速で吹き込む必要がある。
これらの目的から、冷却筒2内に設ける微粒子導
入管3は冷却筒2に直接接触して冷却されず、ま
たArガス吹き込み間隙5は極力狭くするととも
にガスが導入管3外壁に効率よく接触するように
微粒子導入管3の外側に狭い間隙をもつて同心円
状に2重管構造とすることが必要である。
A high voltage is applied between the tip of the counter electrode 8 and the surface of the molten metal 13 to cause a spark discharge, and the evaporated ultrafine particles of the molten metal are carried by the Ar gas flow discharged from the Ar gas outlet 10 to the counter electrode 8. The particles are quickly transported to the particle introduction port 7 located directly above the tip. The small space chamber 12 has a small volume with a diameter of 30 mmφ and a height of 30 mm or less, and the diffusion of evaporated particles is difficult to occur.
It is efficiently introduced into the introduction port 7 at the same time as it is generated. The inert gas blown into the small space chamber 12 is necessary to expel the atmosphere in the small space chamber 12 to create an atmosphere where spark discharge is likely to occur, and to transport the generated particulates to the analyzer. The type of gas affects the particle size and amount of fine particles generated, and Ar, He, Ar-
Although H 2 etc. are used, Ar gas is usually suitable. In order to prevent the generated fine particles from spreading, it is necessary to make the space chamber 12 in which the discharge occurs as small as possible,
For this purpose, it is usually blown at a rate of 10 to 20/min.
The molten metal surface is likely to be damaged by being cooled by the Ar gas. The temperature of the Ar gas passing through the introduction tube 3 accompanied by fine particles reaches several 100 degrees, but since the Ar gas of the present invention is supplied through the gap 5 made on the outer wall of the introduction tube 3, the heat is reduced. Since the molten metal is preheated by the exchange action before being blown in, cooling of the molten metal surface can be prevented. Further, the evaporated ultrafine particles have the property of immediately adhering to the inner wall of the tube when the temperature of the inner wall is low, making it difficult to quantitatively transport the fine particles. Alternatively, it is necessary to intermittently apply high pressure and blow Ar gas at high speed in order to clean the particulates that adhere and remain inside the pipe, which tends to occur when the particulate transport pipe 22 is made long, such as several tens of meters.
For these purposes, the particulate introduction pipe 3 provided in the cooling cylinder 2 is not cooled by directly contacting the cooling cylinder 2, and the Ar gas injection gap 5 is made as narrow as possible so that the gas efficiently contacts the outer wall of the introduction pipe 3. As such, it is necessary to have a concentric double pipe structure with a narrow gap outside the particle introduction pipe 3.

また、長時間連続して放電を飛ばしていると対
電極8の先端部に蒸発生成した微粒子の一部が付
着してくるために、断続的に極性を逆にして放電
させ付着した微粒子を蒸発除去するなどの方法を
とる。しかし、長時間連続分析の場合には、対電
極の交換が必要になる。この交換は迅速に行なわ
なければならないが、本発明では対電極8と微粒
子導入管3を一体化してあるために、冷却筒2上
部の固定具を取りはずして上方に引きぬく簡単な
操作で迅速に交換できる利点がある。
In addition, if the discharge continues for a long time, some of the evaporated particles will adhere to the tip of the counter electrode 8, so the polarity is intermittently reversed and the discharge is performed to evaporate the attached particles. Take measures such as removing it. However, in the case of long-term continuous analysis, it is necessary to replace the counter electrode. This replacement must be done quickly, but since the counter electrode 8 and the particulate introduction tube 3 are integrated in the present invention, it can be done quickly by simply removing the fixture on the top of the cooling tube 2 and pulling it upward. It has the advantage of being interchangeable.

溶融金属13を微粒子に変換する方法は種々あ
るが、前述の引用文献のように高速のArガス流
によるスプレー作用で噴霧する方法では、生成し
た微粒子径は10〜100μm程度以上で粒径が大き
いために長距離搬送は困難であり、又粒度分布の
幅が大きいために励起発光させた際の発光強度の
変動が大きく分析精度が悪い等の問題がある。直
流アークあるいはアークカラムを水冷によるピン
チ効果で収束したプラズマアーク照射による過熱
蒸発による方法では、対電極と溶融金属表面との
電極間ギヤツプを1〜2mm程度の極めて短かい距
離に保たなければある一定量以上の微粒子の蒸発
が起らず、かつ蒸気圧の低い成分の蒸発が優先す
るいわゆる選択蒸発が起り易く、溶融金属の成分
組成を代表する微粒子を安定して生成させること
が難かしい。レーザー照射による方法は、非導電
性物質に適用できる利点をもつが、CO2レーザー
のように連続レーザーでは蒸発量が少なく、ジヤ
イアントパルスレーザーを採用せざるを得ない
が、1秒間に数10回以上での高出力での照射が不
可能なことから、これもまた正確なオンライン分
析用にはあまり適当でない。
There are various methods of converting molten metal 13 into fine particles, but in the method of atomizing by a spray action using a high-speed Ar gas flow as in the cited document mentioned above, the fine particles generated are large, with a diameter of about 10 to 100 μm or more. Therefore, it is difficult to transport them over long distances, and since the width of the particle size distribution is wide, there are problems such as large fluctuations in emission intensity when excited and emitted, resulting in poor analysis accuracy. In the method of superheated evaporation by irradiating a DC arc or an arc column with a plasma arc converged by the pinch effect of water cooling, it is necessary to maintain an extremely short gap between the counter electrode and the molten metal surface of about 1 to 2 mm. So-called selective evaporation tends to occur, in which more than a certain amount of fine particles do not evaporate and the evaporation of components with low vapor pressure takes priority, making it difficult to stably produce fine particles representative of the component composition of the molten metal. The method using laser irradiation has the advantage of being applicable to non-conductive materials, but continuous lasers such as CO 2 lasers have a small amount of evaporation, so a giant pulse laser has to be used, but the evaporation amount is several tens of times per second. This is also not very suitable for accurate on-line analysis since it is not possible to irradiate at high power for more than one time.

本発明者らは、溶融金属を微粒子として蒸発生
成するエネルギー源の適正について詳細な研究を
続けた結果、最適な方法としてスパーク放電を選
定した。すなわち、溶融金属13中に浸漬した炭
素や高融点金属から成る棒状電極17を試料極と
して陰極とし、溶融金属13表面に先端がわずか
な間隙をもつて設置した対電極8に導通する微粒
子導入管3の上端に取り付けた端子16を陽極と
してスパーク放電装置18に結線し、両極に高電
圧をかけてスパーク放電を行い溶融金属13を微
粒子として蒸発させる。溶融金属を微粒子として
蒸発搬送し、溶融金属中の各種含有成分量を分析
するためには、含有成分を代表する微粒子を安定
して発生させることがとくに重要であるが、スパ
ーク放電における各放電定数の設定の仕方も影響
を与える。自己誘導10μH、静電容量3μF、抵抗
1Ω、電圧1000Vに設定したスパークライクのス
パーク放電と各定数を150μH、8μF、0Ω、700V
に設定したアークライクのスパーク放電(放電電
流波形からみると前者はピーク電流値200A、保
持時間30μs、後者は各々が80A、400μs)の両放
電条件で鉄鋼試料を対象に微粒子を発生させ各成
分を繰り返して分析した結果、0.50%含有するSi
の分析値の変動係数は前者が2.5%、後者が11.6
%、1.04%含有するMnは各々3.8%、12.6%、
0.30%含有するCuは各々5.1%、14.2%などの結
果が得られた。すなわち、上記のようにアークラ
イクよりもスパークライクのスパーク放電の方が
安定して溶融金属中の各成分を微粒子として蒸発
させるのに適している。放電周波数については、
50〜800Hzまでについて調べたが、200Hz以上のよ
うに単位時間当りの放電回数が多い方が分析精度
の点から有利であつた。
The present inventors continued detailed research into the suitability of an energy source for vaporizing and generating molten metal as fine particles, and as a result, they selected spark discharge as the optimal method. That is, a rod-shaped electrode 17 made of carbon or high-melting point metal immersed in molten metal 13 is used as a sample electrode and a cathode, and a particulate introduction tube is connected to a counter electrode 8 whose tip is placed on the surface of molten metal 13 with a slight gap. The terminal 16 attached to the upper end of the molten metal 13 serves as an anode and is connected to a spark discharge device 18, and a high voltage is applied to both poles to generate a spark discharge and evaporate the molten metal 13 as fine particles. In order to evaporate and transport molten metal as fine particles and analyze the amount of various components contained in the molten metal, it is especially important to stably generate fine particles that represent the contained components. How it is set also has an impact. Self-induction 10μH, capacitance 3μF, resistance
Spark-like spark discharge set to 1Ω, voltage 1000V and each constant to 150μH, 8μF, 0Ω, 700V
Fine particles were generated on a steel sample under both arc-like spark discharge conditions (as seen from the discharge current waveform, the former had a peak current of 200 A and a holding time of 30 μs, and the latter had a peak current of 80 A and 400 μs). As a result of repeated analysis, it was found that Si containing 0.50%
The coefficient of variation of the analysis value is 2.5% for the former and 11.6 for the latter.
%, 1.04% Mn content is 3.8%, 12.6%, respectively.
The results for Cu containing 0.30% were 5.1% and 14.2%, respectively. That is, as mentioned above, spark-like spark discharge is more stable than arc-like and suitable for evaporating each component in the molten metal as fine particles. Regarding the discharge frequency,
The range from 50 to 800 Hz was investigated, and it was found that a frequency with a large number of discharges per unit time, such as 200 Hz or more, was advantageous in terms of analysis accuracy.

溶融金属中の成分分析を目的とする本発明にお
いては、微粒子を単に生成する場合と異なり、蒸
発微粒子を一定流速の搬送ガスと共に常時安定し
て分析装置37へ送り込まねばならず、より効率
の良い微粒子の搬送技術が必要になる。本発明で
は、溶融金属13表面より蒸発して対電極8先端
直上方向に立ち昇つた微粒子を、周囲への拡散を
防ぎ、Arガス吹き込み管5の下端部10より吹
き出して微粒子導入管3下端の開口部7へ流れ込
むArガス流に乗せて迅速に運び去る方法をとつ
た。微粒子が発生する小空間室12は微粒子導入
管3の開口部7以外に出口がないために、Arガ
ス流に引き込まれて常時一定の希釈培率をもつて
導入管3の開口部7へ送り込まれる。対電極8先
端部と溶融金属表面で形成する放電カラム14の
放電を乱さずに、かつ微粒子を安定して同開口部
7へ送り込むためのArガス流を形成するために
は、Arガス吹き出し用管5の下端の吹き出し口
10は微粒子導入管3下端の開口部7よりもわず
かに上部に位置する必要がある。
In the present invention, which aims at component analysis in molten metal, unlike the case where fine particles are simply generated, the evaporated fine particles must be constantly and stably fed to the analyzer 37 together with the carrier gas at a constant flow rate, resulting in a more efficient method. Fine particle transport technology will be required. In the present invention, the particles evaporated from the surface of the molten metal 13 and rising directly above the tip of the counter electrode 8 are prevented from spreading to the surroundings, and are blown out from the lower end 10 of the Ar gas blowing tube 5 to the lower end of the particle introduction tube 3. A method was adopted in which the particles were carried away quickly by being carried by the Ar gas flow flowing into the opening 7. Since the small space chamber 12 in which the particles are generated has no outlet other than the opening 7 of the particle introduction tube 3, the particles are drawn into the Ar gas flow and sent to the opening 7 of the introduction tube 3 at a constant dilution factor. It will be done. In order to form an Ar gas flow to stably send fine particles to the opening 7 without disturbing the discharge of the discharge column 14 formed by the tip of the counter electrode 8 and the surface of the molten metal, it is necessary to The outlet 10 at the lower end of the tube 5 needs to be located slightly above the opening 7 at the lower end of the particle introduction tube 3.

微粒子導入管3に導入された微粒子はArガス
流に乗せられて、絶縁コネクター21によつて接
続される微粒子搬送管22を通つて搬送ガス分配
装置24に搬送されるが、本発明のように微粒子
を対象に分析を行う場合には、これらの内壁に微
粒子を付着残留させないことが重要な問題にな
る。微粒子導入管3は溶融金属の高熱によつて加
熱されているので微粒子は付着しにくくあまり問
題はないが、搬送管22は距離が長くなると温度
が低下して付着残留が起り易くなる。その結果、
搬送ガス中の微粒子濃度が変動したり、コンタミ
ネーシヨンとなつて正確な分析値が得られなくな
る。従つて、搬送管22はなるべく小径として搬
送ガスの流速を速くする、図面に示す如く加熱装
置23を取り付けて常時加熱しておく、あるいは
一度付着した微粒子は付着後短時間以内では容易
に剥離できるので搬送ガスを更に高速で吹き込ん
で洗浄する、方法などを採用した。
The particles introduced into the particle introduction pipe 3 are carried by the Ar gas flow and are transported to the carrier gas distribution device 24 through the particle transport pipe 22 connected by the insulating connector 21. When analyzing fine particles, it is important to prevent fine particles from adhering to and remaining on these inner walls. Since the particulate introduction pipe 3 is heated by the high heat of the molten metal, particulates are difficult to adhere to and there is no problem, but the longer the distance of the transport pipe 22, the lower the temperature and the more likely they are to remain attached. the result,
The concentration of particulates in the carrier gas fluctuates and contamination occurs, making it impossible to obtain accurate analysis values. Therefore, the diameter of the conveyor pipe 22 should be as small as possible to increase the flow rate of the carrier gas, or a heating device 23 should be attached as shown in the drawing to keep it constantly heated, or fine particles once attached can be easily peeled off within a short time after adhesion. Therefore, we adopted a method of cleaning by blowing carrier gas at a higher speed.

搬送ガス分配装置24は、搬送管22より搬送
ガスで送られてきた微粒子を一旦小空間部で拡散
させ更に均一化をはかる、プラズマトーチ29へ
導入する搬送ガスの最適流量を得るためにある一
定部分を系外に排出して搬送ガスの分配を行う、
あるいは搬送されてくる間に凝集が進んで特に粗
大化した粒子を系外に排除して微細粒子のみをプ
ラズマトーチ29へ送り込むための分粒などを行
う、ためのものである。分配装置24は、外周に
加熱装置23を取り付けた小径の円筒管で微粒子
搬送管22を側壁より挿入して管末端開口部25
を上向きに、微粒子供給管26を円筒管の上部よ
り搬送管末端開口部25と一定間隔をもつて相対
するように取り付け、円筒管底部には流量調節器
28を備えた排出管27を取り付けてある。この
3本の管はいずれも10mmφ以下の細管で、粗大粒
子及び余剰の微粒子及び搬送ガスは底部排出管2
7より系外に排出され、残りの微粒子は一定流量
の搬送ガスと共に供給管26へ導入される。
The carrier gas distribution device 24 diffuses the fine particles sent by the carrier gas from the carrier pipe 22 in a small space and further makes them uniform. part to the outside of the system to distribute the carrier gas,
Alternatively, particles that have become particularly coarse due to agglomeration progressing while being transported are removed from the system, and particle sizing is performed to send only fine particles to the plasma torch 29. The distribution device 24 is a small-diameter cylindrical tube with a heating device 23 attached to its outer periphery, and the particulate transport tube 22 is inserted from the side wall to the tube end opening 25.
A particulate supply pipe 26 is attached from the top of the cylindrical pipe so as to face the transport pipe end opening 25 at a constant distance, and a discharge pipe 27 equipped with a flow rate regulator 28 is attached to the bottom of the cylindrical pipe. be. These three pipes are all thin pipes with a diameter of 10 mm or less, and coarse particles, excess fine particles, and carrier gas are removed from the bottom discharge pipe 2.
7 to the outside of the system, and the remaining particulates are introduced into the supply pipe 26 together with a constant flow rate of carrier gas.

微粒子供給管26はプラズマ励起発光分光分析
装置37に接続される。導入された微粒子は図示
する如く、微粒子供給管26、プラズマガス供給
管30、冷却ガス供給管31から成る3重管のプ
ラズマトーチ29に運び込まれ、高周波発生装置
32によつて形成される高温のArプラズマ部3
3に達して励起発光される。励起光は分光器34
で分光され、光電子増倍管等から成る検出器3
5、成分含有率算出装置36によつて各々のスペ
クトル線強度が測定され、溶融金属中の各成分含
有率を迅速に求められる。微粒子を励起発光させ
る分析装置37としては、高周波誘導結合型発光
分光分析装置が最も適していたが、そのほかの各
種アーク放電等のプラズマ励起発光分光分析装置
あるいは原子吸光分析装置などを適用できる。
The particle supply pipe 26 is connected to a plasma excitation emission spectrometer 37. As shown in the figure, the introduced particles are carried into a triple-tube plasma torch 29 consisting of a particle supply pipe 26, a plasma gas supply pipe 30, and a cooling gas supply pipe 31, and are heated to a high temperature generated by a high frequency generator 32. Ar plasma section 3
3 and is excited to emit light. The excitation light is a spectrometer 34
The detector 3 consists of a photomultiplier tube, etc.
5. The component content calculation device 36 measures the intensity of each spectral line, and the content of each component in the molten metal can be quickly determined. Although a high-frequency inductively coupled emission spectrometer is most suitable as the analyzer 37 for exciting the particles to emit light, other types of plasma-excited emission spectrometers such as arc discharge or atomic absorption spectrometers can be used.

本発明装置の分析操作について簡単に述べる。
先ず支持架台19に駆動源20をもつて取り付け
られた微粒子生成プローブ1を、Arガス吹き込
み管15にArガスを吹き込みながら溶融金属1
3表面に向つて下降させる。Arガス吹き出し口
10からArガスを吹き出させ、耐火筒11内の
大気を追いだしながら、耐火筒11下端を溶融金
属13中に浸漬し、小空間室12を密閉状とす
る。対電極8先端部と溶融金属13表面間を所定
の間隔に調節したのち、スパーク放電装置18の
操作により試料電極17と対電極8間に高電圧を
かけてスパーク放電を飛ばす。蒸発生成した微粒
子は微粒子導入管3、搬送管22、ガス分配装置
24を経てプラズマトーチ29に送り込まれ励起
発光するが、10秒間程度の積分発光強度値から各
成分含有率を測定する。分析終了後、微粒子生成
プローブ1のArガス吹込み管15からArガスを
高圧で断続的に吹き込み、微粒子搬送管22内壁
などに付着した微粒子を洗い落す。次に微粒子生
成プローブ1を溶融金属13より引き上げ、再び
分析する必要が生じた時間にプローブ1を下降さ
せて上記操作を繰り返して分析を実施する。生成
した微粒子の粒径及び粒度分布は、プラズマ中で
励起発光して分析する方法において特に定量精度
に大きな影響を与えるので重要であるが、本発明
装置で溶鋼を対象に発生させた微粒子は大略0.1μ
m以下の極めて微細粒子であり、平均粒径が
0.05μmの場合0.04〜0.06μmの範囲に約70%以上
が入るように粒度分布の幅も狭く、プラズマ発光
分光分析には最適であつた。
The analysis operation of the apparatus of the present invention will be briefly described.
First, the particle generation probe 1 attached to the support frame 19 with the drive source 20 is heated to the molten metal 1 while blowing Ar gas into the Ar gas blowing pipe 15.
3. Lower toward the surface. While blowing out Ar gas from the Ar gas outlet 10 and expelling the atmosphere inside the refractory tube 11, the lower end of the refractory tube 11 is immersed in the molten metal 13 to seal the small space chamber 12. After adjusting the distance between the tip of the counter electrode 8 and the surface of the molten metal 13 to a predetermined distance, a high voltage is applied between the sample electrode 17 and the counter electrode 8 by operating the spark discharge device 18 to generate a spark discharge. The evaporated particles are fed into the plasma torch 29 via the particle introduction tube 3, the transport tube 22, and the gas distribution device 24, and are excited to emit light. The content of each component is measured from the integrated emission intensity value for about 10 seconds. After the analysis is completed, Ar gas is intermittently blown at high pressure from the Ar gas blowing pipe 15 of the particulate generation probe 1 to wash off the particulates adhering to the inner wall of the particulate transport pipe 22, etc. Next, the particle generating probe 1 is pulled up from the molten metal 13, and when it becomes necessary to analyze again, the probe 1 is lowered and the above operation is repeated to perform the analysis. The particle size and particle size distribution of the generated fine particles are important because they have a large effect on quantitative accuracy, especially in the method of analyzing by excitation and emission in plasma, but the fine particles generated in molten steel with the device of the present invention are approximately 0.1μ
Extremely fine particles with an average particle size of less than m
In the case of 0.05 μm, the width of the particle size distribution was narrow, with approximately 70% or more falling within the range of 0.04 to 0.06 μm, making it ideal for plasma emission spectroscopy.

以上説明したように本発明によれば、溶融金属
試料中の含有成分をサンプリング等の操作を行わ
ず、迅速かつ精度よく直接分析することができ、
金属の精錬や製鋼プロセスの操業管理に極めて効
果が大きい。
As explained above, according to the present invention, components contained in a molten metal sample can be directly analyzed quickly and accurately without performing operations such as sampling.
It is extremely effective for operational management of metal refining and steel manufacturing processes.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明実施例装置全体の説明図、第2
図は微粒子生成プローブ先端部の説明図、第3図
は第2図X―X断面図である。 1…微粒子生成プローブ、18…スパーク放電
装置、22…微粒子搬送管、24…搬送ガス分配
装置、37…プラズマ発光分光分析装置、13…
溶融金属、8…対電極、2…冷却筒、3…微粒子
導入管、5,15…Arガス吹き込み管、11…
耐火筒、12…小空間室、17…試料電極、29
…プラズマトーチ、34…分光器。
Fig. 1 is an explanatory diagram of the entire apparatus according to the present invention;
The figure is an explanatory diagram of the tip of the particle generating probe, and FIG. 3 is a sectional view taken along line XX in FIG. DESCRIPTION OF SYMBOLS 1... Particulate generation probe, 18... Spark discharge device, 22... Particulate transport tube, 24... Carrier gas distribution device, 37... Plasma emission spectrometer, 13...
Molten metal, 8...Counter electrode, 2...Cooling tube, 3...Particle introduction tube, 5, 15...Ar gas blowing tube, 11...
Fireproof cylinder, 12... Small space chamber, 17... Sample electrode, 29
...Plasma torch, 34...Spectrometer.

Claims (1)

【特許請求の範囲】[Claims] 1 下端に、先端が円錐形状の丸棒対電極を溶融
金属表面に一定間隙をもつて対向するように垂直
に取り付け、その直上部に微粒子導入口を設け、
上端は微粒子搬送管に接続し、かつ同対電極の電
導体を兼ねる細径で縦長形状の微粒子導入管、同
微粒子導入管の外周に同心円状に設け、下端に吹
き出し口を有した不活性ガス吹き込み管を介して
同導入管を内包して保持し、周囲に冷却構造を設
けた冷却筒、及び同冷却筒の下部周囲に分析時に
は下端を溶融金属中に浸漬して内部に密閉状の小
空間室を形成するように設置した耐火筒から成る
微粒子生成プローブ;上記微粒子導入管上端部と
溶融金属中に浸漬した試料電極に接続してなるス
パーク放電装置;上記微粒子導入管と接続した微
粒子搬送管の末端部、プラズマ発光装置への微粒
子供給管及び余剰搬送不活性ガスの排出管を取り
付けた小形状容器から成る搬送ガス分配装置;同
微粒子供給管の末端部に接続し、高周波誘導結合
型プラズマ等のプラズマ励起源を有する発光装
置、分光器及び検出器等から成る発光分光分析装
置とから構成したことを特徴とする溶融金属の直
接分析装置。
1 At the lower end, a round bar counter electrode with a conical tip is attached vertically so as to face the molten metal surface with a certain gap, and a particle inlet is provided just above the counter electrode.
The upper end is connected to the particle transport tube and is a small diameter, vertically shaped particle introduction tube that also serves as a conductor for the counter electrode, and the inert gas is provided concentrically around the outer circumference of the particle introduction tube and has a blowout port at the lower end. The introduction tube is enclosed and held through the blowing tube, and a cooling cylinder is provided with a cooling structure around it, and a small hermetically sealed tube is placed inside the lower end of the cooling cylinder, the lower end of which is immersed in molten metal during analysis. A particulate generation probe consisting of a refractory cylinder installed to form a space chamber; A spark discharge device comprising the upper end of the particulate introduction pipe connected to a sample electrode immersed in molten metal; A particulate transport connected to the particulate introduction pipe A carrier gas distribution device consisting of a small container attached to the end of the tube, a particle supply tube to the plasma light emitting device, and a discharge tube for excess carrier inert gas; connected to the end of the particle supply tube, and a high frequency inductively coupled 1. A direct analysis device for molten metal, comprising a light emitting device having a plasma excitation source such as plasma, and an emission spectrometer comprising a spectrometer, a detector, etc.
JP3088083A 1983-02-28 1983-02-28 Direct analyzer of molten metal by fine particle generating plasma emission spectrochemical method Granted JPS59157542A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3088083A JPS59157542A (en) 1983-02-28 1983-02-28 Direct analyzer of molten metal by fine particle generating plasma emission spectrochemical method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3088083A JPS59157542A (en) 1983-02-28 1983-02-28 Direct analyzer of molten metal by fine particle generating plasma emission spectrochemical method

Publications (2)

Publication Number Publication Date
JPS59157542A JPS59157542A (en) 1984-09-06
JPH0148499B2 true JPH0148499B2 (en) 1989-10-19

Family

ID=12316046

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3088083A Granted JPS59157542A (en) 1983-02-28 1983-02-28 Direct analyzer of molten metal by fine particle generating plasma emission spectrochemical method

Country Status (1)

Country Link
JP (1) JPS59157542A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU208018U1 (en) * 2021-07-18 2021-11-29 Общество с ограниченной ответственностью «МЕЛТИКОНТ» Submersible Spectrum Probe

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0193821A3 (en) * 1985-03-06 1987-06-10 Allied Corporation In-situ analysis of a liquid conductive material
US4615225A (en) * 1985-03-13 1986-10-07 Allied Corporation In-situ analysis of a liquid conductive material

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU208018U1 (en) * 2021-07-18 2021-11-29 Общество с ограниченной ответственностью «МЕЛТИКОНТ» Submersible Spectrum Probe

Also Published As

Publication number Publication date
JPS59157542A (en) 1984-09-06

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