JPH0175879U - - Google Patents
Info
- Publication number
- JPH0175879U JPH0175879U JP1987171677U JP17167787U JPH0175879U JP H0175879 U JPH0175879 U JP H0175879U JP 1987171677 U JP1987171677 U JP 1987171677U JP 17167787 U JP17167787 U JP 17167787U JP H0175879 U JPH0175879 U JP H0175879U
- Authority
- JP
- Japan
- Prior art keywords
- optical semiconductor
- control block
- temperature control
- semiconductor element
- semicircular groove
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 claims description 6
- 239000004065 semiconductor Substances 0.000 claims description 6
- 230000002093 peripheral effect Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Description
第１図は本考案の実施例１を示す構成図、第２
図は本考案の実施例２を示す構成図、第３図は従
来の温度特性検査治具を示す構成図、第４図は試
料の外観図である。
１……光半導体コリメータ、２……Ｖ溝温度制
御ブロツク、３……半円溝温度制御ブロツク、４
……上下動クランプ、５……スライド放熱板、６
……熱変換器、８……バネ圧調整ネジ、９……平
衝バネ、１０……放熱板、１１……ベース。
Fig. 1 is a configuration diagram showing the first embodiment of the present invention;
The figure is a block diagram showing a second embodiment of the present invention, FIG. 3 is a block diagram showing a conventional temperature characteristic testing jig, and FIG. 4 is an external view of a sample. 1... Optical semiconductor collimator, 2... V-groove temperature control block, 3... Semicircular groove temperature control block, 4
... Vertical movement clamp, 5 ... Slide heat sink, 6
... Heat converter, 8 ... Spring pressure adjustment screw, 9 ... Flat spring, 10 ... Heat sink, 11 ... Base.
Claims (1)
度制御ブロツクと、光半導体素子を半円溝に受け
入れて該光半導体素子の外周面に面接触する半円
溝温度制御ブロツクと、前記Ｖ溝温度制御ブロツ
クと半円溝温度制御ブロツクとを光半導体素子に
圧接するクランプとを有することを特徴とする光
半導体素子の温度特性検査治具。 a V-groove temperature control block provided with a V-groove for receiving an optical semiconductor element; a semicircular groove temperature control block for receiving an optical semiconductor element in the semicircular groove and making surface contact with the outer peripheral surface of the optical semiconductor element; 1. A jig for inspecting temperature characteristics of an optical semiconductor device, comprising a control block and a clamp for pressing a semicircular groove temperature control block against the optical semiconductor device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987171677U JPH0175879U (en) | 1987-11-10 | 1987-11-10 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987171677U JPH0175879U (en) | 1987-11-10 | 1987-11-10 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0175879U true JPH0175879U (en) | 1989-05-23 |
Family
ID=31463692
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1987171677U Pending JPH0175879U (en) | 1987-11-10 | 1987-11-10 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0175879U (en) |
-
1987
- 1987-11-10 JP JP1987171677U patent/JPH0175879U/ja active Pending
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