JPH0177258U - - Google Patents
Info
- Publication number
- JPH0177258U JPH0177258U JP1987172644U JP17264487U JPH0177258U JP H0177258 U JPH0177258 U JP H0177258U JP 1987172644 U JP1987172644 U JP 1987172644U JP 17264487 U JP17264487 U JP 17264487U JP H0177258 U JPH0177258 U JP H0177258U
- Authority
- JP
- Japan
- Prior art keywords
- slit
- convergence point
- electromagnet
- variable
- beam convergence
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 150000002500 ions Chemical class 0.000 claims 3
- 238000010586 diagram Methods 0.000 description 2
- 238000010884 ion-beam technique Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Landscapes
- Electron Tubes For Measurement (AREA)
Description
第1図は従来の電磁石を微動する質量分析計を
示す図、第2図は従来の電磁石を固定し、その代
りにハウジング全体を可動にする方式を示す図、
第3図は本案の電磁石、ハウジングを固定にし、
その代りに可変スリツトを可動させる方式を示す
図、第4図は本案の可変スリツト可動機構を示す
図である。
1……イオン源、2……イオンビーム、3……
電磁石、4……微動機構、5……可変スリツト、
6……検知器、7……分析管、8……ハウジング
、10……可動フランジ、11A,11B……O
リング、12……コロ状ベアリング、13……ガ
イドワク。
Figure 1 shows a conventional mass spectrometer that moves an electromagnet slightly; Figure 2 shows a conventional system in which the electromagnet is fixed and the entire housing is movable;
Figure 3 shows the proposed electromagnet, with the housing fixed,
A diagram showing a method of moving the variable slit instead, and FIG. 4 is a diagram showing the variable slit moving mechanism of the present invention. 1...Ion source, 2...Ion beam, 3...
Electromagnet, 4... fine movement mechanism, 5... variable slit,
6...Detector, 7...Analysis tube, 8...Housing, 10...Movable flange, 11A, 11B...O
Ring, 12... Rolled bearing, 13... Guide work.
Claims (1)
下で磁場を印加してイオンの質量差で分析する電
磁石と、ビームの収束点付近に設置して、開き巾
を可変にするスリツトとイオンを検知する検知器
を備えた質量分析計において、上記可変スリツト
が、ビームの進行方向に並行に微動できる機構を
有し、ビームの収束点にスリツトを移動できるこ
とを特徴とする質量分析計。 An ion source that ionizes and accelerates the sample, an electromagnet that applies a magnetic field under vacuum and analyzes the ions based on their mass difference, and a slit with a variable opening width installed near the beam convergence point to detect ions. 1. A mass spectrometer equipped with a detector, characterized in that the variable slit has a mechanism that allows it to move slightly in parallel to the beam traveling direction, and the slit can be moved to a beam convergence point.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987172644U JPH0177258U (en) | 1987-11-13 | 1987-11-13 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987172644U JPH0177258U (en) | 1987-11-13 | 1987-11-13 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0177258U true JPH0177258U (en) | 1989-05-24 |
Family
ID=31464602
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1987172644U Pending JPH0177258U (en) | 1987-11-13 | 1987-11-13 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0177258U (en) |
-
1987
- 1987-11-13 JP JP1987172644U patent/JPH0177258U/ja active Pending
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