JPH0187268U - - Google Patents

Info

Publication number
JPH0187268U
JPH0187268U JP18259587U JP18259587U JPH0187268U JP H0187268 U JPH0187268 U JP H0187268U JP 18259587 U JP18259587 U JP 18259587U JP 18259587 U JP18259587 U JP 18259587U JP H0187268 U JPH0187268 U JP H0187268U
Authority
JP
Japan
Prior art keywords
substrate
measuring means
microscope
inspecting
probes
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18259587U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP18259587U priority Critical patent/JPH0187268U/ja
Publication of JPH0187268U publication Critical patent/JPH0187268U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例の基板検査装置の要
部構成を示す説明図である。 1……電極端子、2……測定装置、3……測定
装置のプローブ、4……顕微鏡、5……顕微鏡の
視野、6……表示装置。
FIG. 1 is an explanatory diagram showing the main part configuration of a board inspection apparatus according to an embodiment of the present invention. DESCRIPTION OF SYMBOLS 1... Electrode terminal, 2... Measuring device, 3... Probe of the measuring device, 4... Microscope, 5... Field of view of the microscope, 6... Display device.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 基板上に形成された電気回路の電気的な特性を
検査するための測定手段と、前記基板上の電極端
子および前記測定手段のプローブを目視するため
の顕微鏡と、前記顕微鏡の視野内に前記測定手段
の測定結果を表示する表示手段とを備えたことを
特徴とする基板検査装置。
a measuring means for inspecting the electrical characteristics of an electric circuit formed on a substrate; a microscope for visually observing the electrode terminals on the substrate and the probes of the measuring means; 1. A board inspection device comprising: display means for displaying measurement results of the means.
JP18259587U 1987-11-30 1987-11-30 Pending JPH0187268U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18259587U JPH0187268U (en) 1987-11-30 1987-11-30

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18259587U JPH0187268U (en) 1987-11-30 1987-11-30

Publications (1)

Publication Number Publication Date
JPH0187268U true JPH0187268U (en) 1989-06-08

Family

ID=31474042

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18259587U Pending JPH0187268U (en) 1987-11-30 1987-11-30

Country Status (1)

Country Link
JP (1) JPH0187268U (en)

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