JPH0193004A - Transparent conductive glass substrate and its manufacture - Google Patents
Transparent conductive glass substrate and its manufactureInfo
- Publication number
- JPH0193004A JPH0193004A JP24586587A JP24586587A JPH0193004A JP H0193004 A JPH0193004 A JP H0193004A JP 24586587 A JP24586587 A JP 24586587A JP 24586587 A JP24586587 A JP 24586587A JP H0193004 A JPH0193004 A JP H0193004A
- Authority
- JP
- Japan
- Prior art keywords
- glass substrate
- transparent conductive
- ion exchange
- glass
- temperature
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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- Non-Insulated Conductors (AREA)
- Manufacturing Of Electric Cables (AREA)
- Laminated Bodies (AREA)
- Surface Treatment Of Glass (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
Description
【発明の詳細な説明】
[産業上の利用分野]
本発明は太陽電池や表示デバイスの透明電極などに用い
られる透明導電性ガラス基板およびその製造方法に関す
るものである。DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to a transparent conductive glass substrate used for solar cells, transparent electrodes of display devices, etc., and a method for manufacturing the same.
[従来の技術]
透明導電性ガラス基板は直接製品の表面に設けられるこ
とが多いので、所定の物理的強度が必要とされる。特に
屋外で使用される大面積太陽電池用透明導電性ガラス基
板に対しては雪等の外的衝撃からの保護の為、ガラス基
板の強化が望まれている。[Prior Art] Transparent conductive glass substrates are often provided directly on the surface of products, and therefore require a certain level of physical strength. In particular, for transparent conductive glass substrates for large-area solar cells used outdoors, it is desired to strengthen the glass substrates in order to protect them from external impacts such as snow.
ガラス基板の強化法には、風冷強化に代表される物理的
強化法とイオン交換処理による化学的強化法が知られて
いるが、太陽電池用のガラス基板等の比較的板厚の薄い
ガラス基板に対しては、物理的強化法が困難であるとこ
ろから後者の化学的強化法が優れている。化学的強化法
として、代表的なNa”−=K”のイオン交換法はガラ
スの転移温度以下の比較的低い温度域で、ガラス中のN
a+イオンをそれよりもイオン半径の大きいに3イオン
と置換し、ガラス表面に圧縮歪を発生させる方法である
が、かかる圧縮歪はガラスの歪点以上の温度では緩和さ
れてしまう。Physical strengthening methods such as air-cooling strengthening and chemical strengthening methods using ion exchange treatment are known methods for strengthening glass substrates, but relatively thin glass such as glass substrates for solar cells For substrates, the latter chemical strengthening method is superior since physical strengthening is difficult. As a chemical strengthening method, the typical Na"-=K" ion exchange method is a relatively low temperature range below the transition temperature of glass.
In this method, a+ ions are replaced with 3 ions having a larger ionic radius to generate compressive strain on the glass surface, but such compressive strain is relaxed at temperatures above the strain point of the glass.
一方、酸化錫を主成分とする透明導電膜が形成された透
明導電性ガラス基体の製造方法としては、低抵抗化、成
膜スピード、量産性、低コスト化などの点から化学的気
相蒸着法(CVD法)、特に高温下、例えば、400〜
600℃、特に好ましくは500〜600℃程度の温度
下でのCVD法が最適である。かかる特に好ましい温度
は、透明導電性ガラス基板として通常に使用されるソー
ダライムシリケートガラスの場合、その徐冷点以上の温
度となる。従ってCVD法による成膜時のガラスの温度
下ではNa”−K“のイオン交換法によりガラス基板の
表面に形成された圧縮歪は上記した様に緩和されてしま
うので、歪点よりさらに高温の徐冷点以上の温度、即ち
約500℃以上で通常処理される酸化錫のCVD法によ
る成膜プロセスには、上記したNa”−=に+のイオン
交換法は適さないという問題があった。On the other hand, as a manufacturing method for a transparent conductive glass substrate on which a transparent conductive film containing tin oxide as the main component is formed, chemical vapor deposition is a method for manufacturing transparent conductive glass substrates on which a transparent conductive film mainly composed of tin oxide is formed. (CVD method), especially at high temperatures, e.g.
CVD at a temperature of about 600°C, particularly preferably about 500 to 600°C, is optimal. In the case of soda lime silicate glass, which is commonly used as a transparent conductive glass substrate, this particularly preferred temperature is a temperature equal to or higher than its annealing point. Therefore, at the temperature of the glass during film formation by the CVD method, the compressive strain formed on the surface of the glass substrate by the Na"-K" ion exchange method is relaxed as described above. There is a problem in that the above-mentioned Na''-=+ ion exchange method is not suitable for a tin oxide CVD film forming process which is usually performed at a temperature above the annealing point, that is, about 500° C. or above.
[発明の解決しようとする問題点]
本発明の目的は、CVD法による酸化錫の成膜温度、通
常はガラスの徐冷点以上の温度においても圧縮応力歪が
緩和され難いガラス基板を用いた透明導電性ガラス基板
及びその製造方法を提供することにある。[Problems to be Solved by the Invention] An object of the present invention is to use a glass substrate in which compressive stress strain is difficult to be relaxed even at a temperature at which a film of tin oxide is formed by a CVD method, which is usually a temperature higher than the annealing point of glass. An object of the present invention is to provide a transparent conductive glass substrate and a method for manufacturing the same.
[問題点を解決するための手段]
本発明は前述の問題点を解決するべくなされたものであ
り、その第1の発明は、ナトリウムを含有するガラス基
板面に化学的気相蒸着法により酸化錫を主成分とする透
明導電膜が形成された透明導電性ガラス基板に於いて、
上記ナトリウムを含有するガラス基板が上記透明導電膜
の形成に先立って該ガラス基板の徐冷点以上の温度でN
a3−Li3のイオン交換強化処理されたものであるこ
とを特徴とする化学強化された透明導電性ガラス基板を
提供するものであり、その第2の発明は、ナトリウムを
含有するガラス基板を該ガラス基板の徐冷点以上の温度
でNa”−Li“のイオン交換強化処理し、次いで、該
ガラス基板面に化学的気相蒸着法により酸化錫を主成分
とする透明導電膜を形成することを特徴とする透明導電
性ガラス基板の製造方法を提供するものである。[Means for Solving the Problems] The present invention has been made to solve the above-mentioned problems, and the first invention is to apply oxidation to the surface of a glass substrate containing sodium by chemical vapor deposition. In a transparent conductive glass substrate on which a transparent conductive film mainly composed of tin is formed,
The sodium-containing glass substrate is heated to a temperature higher than the annealing point of the glass substrate prior to the formation of the transparent conductive film.
A second invention provides a chemically strengthened transparent conductive glass substrate characterized by being subjected to ion exchange strengthening treatment of a3-Li3. A Na"-Li" ion exchange strengthening treatment is performed at a temperature above the annealing point of the substrate, and then a transparent conductive film containing tin oxide as a main component is formed on the surface of the glass substrate by chemical vapor deposition. The present invention provides a method for manufacturing a transparent conductive glass substrate.
以下、本発明を更に詳細に説明する。The present invention will be explained in more detail below.
本発明において使用されるナトリウムを含有するガラス
基板としては、絶縁性で、化学的、物理的耐久性が高く
、かつ光学的特性の良好なイオン交換強化に適する透明
性ガラス板、例えばソーダライムシリケートガラス、は
うけい酸ガラス、アルミノはうけい酸ガラスなどが使用
できる。特に価格、入手の容易さから、基本組成が5i
(h (65〜75wt%) 、Na2O(10〜20
wt%)、Ca0(5〜15wt%) 、A1203(
0,5〜4 wt%)、Mg0(0,5〜4 wt%)
、Fe203(<2wt%)であるソーダライムシリ
ケートガラス基板が最適である。又、ガラス基板の厚さ
は特に限定されないが、光の透過率の低下、強度低下、
取扱いの不便さが起こらない様に、0.5mm〜6mm
が適当である。The sodium-containing glass substrate used in the present invention is a transparent glass plate that is insulating, has high chemical and physical durability, and has good optical properties and is suitable for ion exchange strengthening, such as soda lime silicate. Glass, silicate glass, alumino silicate glass, etc. can be used. In particular, the basic composition is 5i due to the price and ease of acquisition.
(h (65-75 wt%), Na2O (10-20
wt%), Ca0 (5-15 wt%), A1203 (
0.5-4 wt%), Mg0 (0.5-4 wt%)
, Fe203 (<2 wt%) soda lime silicate glass substrates are optimal. In addition, the thickness of the glass substrate is not particularly limited, but it may cause a decrease in light transmittance, a decrease in strength,
0.5mm to 6mm to avoid inconvenience in handling.
is appropriate.
本発明に於ける強化ガラス基板は、500〜650℃の
温度のLi0を含む溶融塩浴中に浸漬させることによっ
て得られる。かかる溶融塩浴のリチウム塩の組成として
は硝酸塩や硫酸塩等が良いが、ヘイズの少ない良質の透
明ガラス基板を得るには特に硫酸リチウムが好ましい。The tempered glass substrate in the present invention is obtained by immersing it in a molten salt bath containing Li0 at a temperature of 500 to 650°C. The composition of the lithium salt in such a molten salt bath is preferably a nitrate or a sulfate, but lithium sulfate is particularly preferred in order to obtain a high-quality transparent glass substrate with little haze.
又、硫酸リチウム塩単体では融点が860℃であり、ガ
ラス基板の徐冷点(約500〜560°C)と比べて高
温であるので、他の塩との混合による共融系にすること
で融点を下げることも有効である。この際に用いる塩と
しては、亜鉛やカリウムなどの塩、特に上記リチウム塩
として硫酸リチウム塩を用いる場合には、硫酸亜鉛や硫
酸カリウムが好適である。かかる塩は硫酸リチウムに対
しモル濃度(%)で5〜40%添加するのが好ましい。In addition, the melting point of lithium sulfate alone is 860°C, which is higher than the annealing point of the glass substrate (approximately 500 to 560°C), so it is possible to create a eutectic system by mixing it with other salts. Lowering the melting point is also effective. The salt used in this case is preferably a salt such as zinc or potassium, and particularly when a lithium sulfate salt is used as the lithium salt, zinc sulfate or potassium sulfate is preferable. The salt is preferably added in a molar concentration (%) of 5 to 40% relative to lithium sulfate.
次にNa+→Li0のイオン交換による強化機構につい
て概要を説明する。リチウムイオンな含む溶融塩浴中に
ガラス基板を浸漬するとガラス中のナトリウムイオンは
浴中のリチウムイオンと置換される。リチウムイオンは
ナトリウムイオンに比べてイオン半径が小さい為にイオ
ン交換とともにガラス基板表面の交換層には一時的に引
張り応力が発生する。しかし処理温度がガラスの徐冷点
以上であると、この応力はガラスの粘性流動によって緩
和されるため、歪の発生しない状態で基板表面層のナト
リウムイオンがリチウムイオンに置換され、その後ガラ
ス基板を冷却すると、表面のリチウムイオンの多い層の
冷却収縮が内部のナトリウムイオンの多い層より−も小
さい為に、基板の表面層に圧縮応力が生ずる。この時に
発生する圧縮応力値は10〜50にg/mm”程度で、
歪点以下の温度で処理されるNa”−に0イオン交換強
化によって表面層に生ずる圧縮応力値30〜80にg/
mm”よりも小さいが、表面のイオン交換層がNa”−
K”イオン交換の場合より厚いので充分な実用強度が得
られる。又、本発明に於ける徐冷点以上でのイオン交換
処理で得られた圧縮歪は徐冷点近傍で再熱処理を受けて
も、歪点以下で処理されたNa”−に+イオン交換によ
る圧縮歪に比べて、圧縮歪の応力緩和程度が大巾に小さ
いので本発明の目的に応じた強化ガラス基板を提供でき
る。Next, the strengthening mechanism by ion exchange of Na+→Li0 will be outlined. When a glass substrate is immersed in a molten salt bath containing lithium ions, the sodium ions in the glass are replaced by the lithium ions in the bath. Since lithium ions have a smaller ionic radius than sodium ions, tensile stress is temporarily generated in the exchange layer on the surface of the glass substrate during ion exchange. However, when the processing temperature is higher than the annealing point of the glass, this stress is alleviated by the viscous flow of the glass, so the sodium ions in the substrate surface layer are replaced with lithium ions without distortion, and the glass substrate is then replaced with lithium ions. When cooled, compressive stress is generated in the surface layer of the substrate because the cooling shrinkage of the surface layer containing many lithium ions is smaller than that of the inner layer containing many sodium ions. The compressive stress value generated at this time is about 10 to 50 g/mm.
Compressive stress values of 30-80 g/
mm", but the ion exchange layer on the surface is Na"-
Since it is thicker than in the case of K'' ion exchange, sufficient practical strength can be obtained.In addition, the compressive strain obtained by the ion exchange treatment above the annealing point in the present invention is reheated near the annealing point. Also, since the degree of stress relaxation of compressive strain is much smaller than that of compressive strain caused by Na''-+ ion exchange treated below the strain point, it is possible to provide a tempered glass substrate meeting the purpose of the present invention.
本発明において酸化錫透明導電膜を成膜する方法として
は、ガラス基板表面に錫化合物の蒸気を接触させて熱分
解酸化反応等により、酸化錫を堆積させて酸化錫膜を形
成するCVD法が適用される。In the present invention, the method for forming the tin oxide transparent conductive film is a CVD method in which the glass substrate surface is brought into contact with the vapor of a tin compound and tin oxide is deposited by a thermal decomposition oxidation reaction or the like to form a tin oxide film. Applicable.
かかる酸化錫透明導電膜をCVD法により形成する際の
出発原料である錫化合物としては、優れた光学的性能、
化学的耐久性、物理的耐久性及び低抵抗を得ることがで
きる錫化合物が選ばれる。例えば、テトラメチル錫、テ
トラエチル錫等のアルキル錫化合物、四塩化錫、二塩化
錫等の塩化錫化合物、2メチル錫ジクロライド、モノブ
チル錫トリクロライド等のアルキル塩化錫化合物、ジブ
チル錫ジアセテート等のアルキル錫アセテート化合物な
どが好ましいものとして挙げられるが、勿論これらに限
定されるものではない。かかる錫化合物はそれ単独で用
いてもよいし、又、2種以上の混合物として使用しても
よい。又錫化合物を溶媒に溶かして溶液として使用して
もよい。溶液として使用する場合の溶媒としては、錫化
合物と相溶性があり、かつ溶液として高い蒸気圧を保ち
つつ分解温度を低下さない性質を有する有機溶媒、例え
ば、メタノール、エタノール、イソプロパツールなどの
アルコール類あるいはシクロヘキサン、ヘキサンなどの
炭化水素類、メチルエチルケトン、酢酸メチル、酢酸エ
チル等を1種又は2種以上の混合物として用いるのがよ
い。The tin compound that is the starting material when forming such a tin oxide transparent conductive film by the CVD method has excellent optical performance,
A tin compound is chosen that can provide chemical durability, physical durability and low resistance. For example, alkyltin compounds such as tetramethyltin and tetraethyltin, tin chloride compounds such as tin tetrachloride and tin dichloride, alkyltin chloride compounds such as 2methyltin dichloride and monobutyltin trichloride, and alkyltin compounds such as dibutyltin diacetate. Preferred examples include tin acetate compounds, but the present invention is not limited thereto. Such tin compounds may be used alone or as a mixture of two or more. Alternatively, the tin compound may be dissolved in a solvent and used as a solution. When used as a solution, organic solvents that are compatible with the tin compound and have the property of not lowering the decomposition temperature while maintaining a high vapor pressure as a solution, such as methanol, ethanol, isopropanol, etc. It is preferable to use alcohols or hydrocarbons such as cyclohexane and hexane, methyl ethyl ketone, methyl acetate, ethyl acetate, etc., or a mixture of two or more thereof.
酸化錫に導電性を付与するために酸化錫にドープされる
成分としては、CVD法による場合、フッ素又はアンチ
モンが最適である。このドーピング原料としては、フッ
素の場合、ブロモトリフロロメタン(CFJr)、クロ
ロジフロロメタン(CHF2C1)、ヨードペンタフロ
ロエタン(C,FsI)、トリフロロ酢酸等の有機フッ
化化合物、フッ化水素、六フッ化イオウ(SF6) 、
ニフッ化錫(SnFz)などのフッ素含有化合物が好ま
しいものとして挙げられ、又、アンチモンの場合には、
5bC13,5bC1s、トリブトキシアンチモン、ア
ンチモンアセチルアセトネートなどのアンチモン化合物
が挙げられるが、勿論これらに限定されるものではない
。When using the CVD method, fluorine or antimony is optimal as a component to be doped into tin oxide in order to impart conductivity to the tin oxide. In the case of fluorine, the doping raw materials include organic fluoride compounds such as bromotrifluoromethane (CFJr), chlorodifluoromethane (CHF2C1), iodopentafluoroethane (C, FsI), trifluoroacetic acid, hydrogen fluoride, Sulfur fluoride (SF6),
Fluorine-containing compounds such as tin difluoride (SnFz) are preferred, and in the case of antimony,
Examples include antimony compounds such as 5bC13, 5bC1s, tributoxyantimony, and antimony acetylacetonate, but are of course not limited to these.
上記した錫化合物は液状体として、あるいは溶液として
気化室において加熱され、蒸気とされ、同伴ガスとして
N2ガス、アルゴンなどの不活性ガスを用いてガラス基
板面へ適用される。The above-mentioned tin compound is heated as a liquid or solution in a vaporization chamber to form a vapor, and is applied to the surface of a glass substrate using an inert gas such as N2 gas or argon as an accompanying gas.
又、上記ドーピング原料が溶液の場合には気化室におい
て加熱し、気化して必要に応じて上記した様な同伴ガス
を用いてガラス基板面に適用される。When the doping raw material is a solution, it is heated in a vaporization chamber, vaporized, and applied to the glass substrate surface using the accompanying gas as described above, if necessary.
錫化合物とドーピング原料の蒸気は、酸素ガスとともに
、同伴ガスを利用しインジェクターを通してガラス基板
面へ適用され、熱分解によりフッ素又はアンチモンがド
ープされた酸化錫透明導電膜が形成される。この様にC
VD法により膜を成形する際、ガラス基板は、熱分解反
応によって光学的特性、化学的特性、電気的特性が向上
する様に、ガラス基板をガラスの軟化点以下の温度に加
熱するのが適当である。この様に加熱されたガラス基板
面と、錫化合物とドーピング原料の蒸気が接触すると、
熱分解反応によってガラス基体の表面に酸化錫透明導電
膜が形成される。The tin compound and the vapor of the doping raw material are applied to the glass substrate surface through an injector using entrained gas together with oxygen gas, and a tin oxide transparent conductive film doped with fluorine or antimony is formed by thermal decomposition. Like this C
When forming a film by the VD method, it is appropriate to heat the glass substrate to a temperature below the softening point of the glass so that the optical properties, chemical properties, and electrical properties of the glass substrate are improved by a thermal decomposition reaction. It is. When the heated glass substrate surface contacts the tin compound and the vapor of the doping raw material,
A tin oxide transparent conductive film is formed on the surface of the glass substrate by the thermal decomposition reaction.
CVD法はプロセス制御も容易であり、良質の導電性を
有する被膜が得られるので、酸化錫膜の製法として極め
て有用である。The CVD method is extremely useful as a method for producing tin oxide films because the process is easy to control and a film with good conductivity can be obtained.
なお、本発明におけるガラス基板はアルカリ金属元素を
含んでいるので、ガラスの表面からアルカリ金属が溶出
してその上面に形成される透明導電膜へ悪影響を及ぼさ
ないように、酸化ケイ素膜、酸化アルミニウム膜、酸化
ジルコニウ゛ム膜などのアルカリバリヤーコートをガラ
ス基板面に施してもよい。この場合、ガラス基板のNa
+→Li+のイオン交換はアルカリバリヤーコートに先
立って行なう。In addition, since the glass substrate in the present invention contains an alkali metal element, silicon oxide film and aluminum oxide film are used to prevent the alkali metal from eluting from the surface of the glass and having an adverse effect on the transparent conductive film formed on the top surface. An alkaline barrier coat such as a zirconium oxide film or a zirconium oxide film may be applied to the surface of the glass substrate. In this case, Na of the glass substrate
The +→Li+ ion exchange is performed prior to the alkali barrier coating.
[実施例] 以下、本発明の詳細な説明する。[Example] The present invention will be explained in detail below.
板厚3mmのソーダライムシリケートガラス基板(ガラ
ス基板の基本組成Sing +72.5w、t%、A
1xO+ : 1.5wt%、FezL: 0.2wt
%、Cab: 7.6wt%、MgO: 4.0wt%
、NaJ: 13.9wt%)を用意し、20〜28メ
ツシユの電融ムライトを30cmの高さから落下させ基
板表面に20μm深さのキズを与えてから、モル比でL
i25O,80、K2S0420からなる 550℃の
溶融塩浴中に10分間浸漬してイオン交換処理した後、
該溶融塩浴からとり出し、常温に達するまで放置し、サ
ンプル1を得た。Soda lime silicate glass substrate with a plate thickness of 3 mm (basic composition of the glass substrate Sing +72.5w, t%, A
1xO+: 1.5wt%, FezL: 0.2wt
%, Cab: 7.6wt%, MgO: 4.0wt%
, NaJ: 13.9 wt%) was prepared, and 20 to 28 meshes of fused mullite were dropped from a height of 30 cm to create a scratch with a depth of 20 μm on the substrate surface.
After ion exchange treatment by immersion in a 550°C molten salt bath consisting of i25O,80 and K2S0420 for 10 minutes,
It was taken out from the molten salt bath and left to stand until it reached room temperature, yielding Sample 1.
同様に、溶融塩組成、処理温度、処理時間を表1、表2
に示すように様々に変えてサンプル2〜サンプル21を
得た。Similarly, molten salt composition, processing temperature, and processing time are shown in Tables 1 and 2.
Samples 2 to 21 were obtained with various changes as shown in FIG.
サンプル1〜18について、加傷曲げ強度(ガラス基板
にイオン交換強化処理する場合には、イオン交換処理前
にガラス基板に上記加傷処理を施し、次いでイオン交換
処理した後の曲げ強度(Kg/mm2)を意味する)を
測定した値を表1に示す。なお、イオン交換強化処理を
施していない上記ガラス基板に上述の加傷処理を施した
後の加傷曲げ強度は15にg/mm”である。For Samples 1 to 18, the scratched bending strength (when the glass substrate is subjected to ion exchange strengthening treatment, the glass substrate is subjected to the above scratching treatment before the ion exchange treatment, and then the bending strength after the ion exchange treatment (Kg/ Table 1 shows the measured values of mm2). Note that the damage bending strength after the above-mentioned damage treatment is applied to the glass substrate which has not been subjected to the ion exchange strengthening treatment is 15 g/mm''.
表1
表1から明らかなように、イオン交換強化処理を施こす
ことによって、イオン交換強化処理をしない同板厚のガ
ラス板(加傷曲げ強度15にg/mm2) の数倍の
強度のガラス板(サンプル18では加傷曲げ強度45K
g/mm2) が得られていることが認められる。Table 1 As is clear from Table 1, by applying ion exchange strengthening treatment, the strength of the glass is several times that of a glass plate of the same thickness without ion exchange strengthening treatment (damaged bending strength 15 g/mm2). Plate (sample 18 has a bending strength of 45K)
g/mm2) was obtained.
サンプル7〜12.19〜21について、イオン交換強
化処理によって生じた基板表面の圧縮応力層の深さ(μ
m)を測定した値を表2に示す。For Samples 7-12.19-21, the depth of the compressive stress layer (μ
Table 2 shows the measured values of m).
表2
次にサンプル1〜21と同様のソーダライムシリケート
ガラス基板に上述の加傷処理を施した後、460℃の硝
酸カリウム溶融塩浴中に 120分間浸漬してN a
” −+ K ”のイオン交換処理した後、該溶融塩浴
からとり出し常温に達するまで放置し、サンプルAを得
た。サンプルAのこの時点の加傷曲げ強度は72 (K
g/mm”)であった。Table 2 Next, soda lime silicate glass substrates similar to Samples 1 to 21 were subjected to the scratching treatment described above, and then immersed in a potassium nitrate molten salt bath at 460°C for 120 minutes to remove Na.
After the "-+K" ion exchange treatment, the sample was taken out from the molten salt bath and left to stand until it reached room temperature to obtain Sample A. The bending strength of sample A at this point is 72 (K
g/mm”).
又、サンプル1〜21と同様のソーダライムシリケート
ガラス板であって、加傷処理した後イオン交換処理を施
さない基板をサンプルBとする。Sample B is a soda lime silicate glass plate similar to Samples 1 to 21, but not subjected to ion exchange treatment after being scratched.
上記サンプル12(−11−ル比テL125On 60
. KzS0420、ZnS0420の620℃の溶融
塩浴中で120分間Na”−Li”のイオン交換処理し
たガラス基板)、サンプルA、サンプルBの3種類のガ
ラス基板をそれぞれ常圧CVD装置に入れ、それぞれ5
80℃(ガラス基板温度)に加熱し、ガラス基板表面に
テトラメチル錫蒸気と酸素とブロモトリフロロメタン蒸
気を含む窒素ガスをCVDノズルから吹きつけCVD法
によって約8000人の酸化錫被膜を形成した。CVD
法による酸化錫膜形成前のガラス基板と上記した様にし
て得られた透明導電性ガラス基板の加傷曲げ強度を測定
した値と、上記CVDプロセスによる酸化錫被膜形成前
後の強度比を表3に示す。Above sample 12 (-11-ratio L125On 60
.. Three types of glass substrates (KzS0420, ZnS0420 treated with Na"-Li" ion exchange treatment for 120 minutes in a 620°C molten salt bath), sample A, and sample B were placed in an atmospheric pressure CVD apparatus, and each
The glass substrate was heated to 80°C (glass substrate temperature), and nitrogen gas containing tetramethyltin vapor, oxygen, and bromotrifluoromethane vapor was sprayed onto the glass substrate surface from a CVD nozzle to form a tin oxide film of about 8,000 layers using the CVD method. . CVD
Table 3 shows the measured values of the damage bending strength of the glass substrate before the formation of the tin oxide film by the method and the transparent conductive glass substrate obtained as described above, and the strength ratio before and after the formation of the tin oxide film by the above CVD process. Shown below.
表3
表3より明らかなようにNa”−K”イオン交換強化処
理によって得られるガラス基板は、大きな曲げ強度、即
ち大きな圧縮応力値が得られるが、かかる圧縮歪はCV
D法による酸化錫被膜形成時の500〜600 ℃の加
熱処理により著しく低下してしまうのに対し、本発明の
Na”→Li1 イオン交換強化処理によって得られる
ガラス基板は、上記したCVD法による酸化錫被膜形成
時の500〜600℃の加熱処理によってはほとんど強
度が低下しないことが認められる。Table 3 As is clear from Table 3, the glass substrate obtained by the Na"-K" ion exchange strengthening treatment has a large bending strength, that is, a large compressive stress value, but the compressive strain is CV
While the heat treatment at 500 to 600 °C during the formation of a tin oxide film by method D significantly lowers the strength, the glass substrate obtained by the Na''→Li1 ion exchange strengthening treatment of the present invention does not undergo oxidation by the above-mentioned CVD method. It is recognized that the strength hardly decreases depending on the heat treatment at 500 to 600° C. during the formation of the tin film.
[発明の効果]
以上のように、本発明は、透明導電膜、特に酸化錫を主
成分とする透明導電膜をCVD法により形成する際の強
度低下が著しく小さく、透明導電膜形成後も充分な強度
を有する透明導電性強化ガラス基板が得られるという優
れた効果を有している。又、本発明によれば、板厚が小
さくても外的衝撃に充分耐える強度を有するガラス基板
が得られるので、特に太陽電池用基板として用いると大
変有利である。又、本発明に於いて、ガラス基板は徐冷
点以′上軟化点以下の高温で処理されているので、アモ
ルファスシリコン膜の形成その他の熱処理がさらに施さ
れても強度低下が少ないという優れた効果も認められる
。[Effects of the Invention] As described above, the present invention shows that the decrease in strength is extremely small when forming a transparent conductive film, especially a transparent conductive film containing tin oxide as a main component, by the CVD method, and that the strength is maintained sufficiently even after the transparent conductive film is formed. This has the excellent effect that a transparent conductive tempered glass substrate having high strength can be obtained. Further, according to the present invention, a glass substrate having sufficient strength to withstand external impact can be obtained even if the plate thickness is small, so it is very advantageous especially when used as a substrate for solar cells. Furthermore, in the present invention, since the glass substrate is treated at a high temperature above the annealing point and below the softening point, the glass substrate has an excellent property that the strength does not decrease even when an amorphous silicon film is formed and other heat treatments are further performed. The effect is also recognized.
、′自/r、、、、、、、−,'self/r,,,,,,,-
Claims (6)
蒸着法により酸化錫を主成分とする透明導電膜が形成さ
れた透明導電性ガラス基板に於て、上記ナトリウムを含
有するガラス基板が上記透明導電膜の形成に先立って該
ガラス基板の徐冷点以上の温度でNa^+→Li^+の
イオン交換強化処理されたものであることを 特徴とする化学強化された透明導電性ガラス基板。(1) In a transparent conductive glass substrate in which a transparent conductive film containing tin oxide as a main component is formed on the surface of the glass substrate containing sodium by chemical vapor deposition method, the glass substrate containing sodium is A chemically strengthened transparent conductive glass substrate characterized by being subjected to ion exchange strengthening treatment of Na^+→Li^+ at a temperature above the annealing point of the glass substrate prior to the formation of a transparent conductive film. .
塩と接触させてNa^+→Li^+のイオン交換強化処
理が行なわれたものであることを特徴とする特許請求の
範囲第1項記載の透明導電性ガラス基板。(2) Claim 1, characterized in that the glass substrate is brought into contact with a molten salt at a temperature higher than its annealing point to undergo ion exchange strengthening treatment of Na^+ → Li^+. The transparent conductive glass substrate described in Section 1.
溶融塩が硫酸塩であることを特徴とする特許請求の範囲
第2項記載の透明導電性ガラス 基板。(3) The transparent conductive glass substrate according to claim 2, wherein the molten salt that undergoes the Na^+→Li^+ ion exchange strengthening treatment is a sulfate.
板の徐冷点以上の温度でNa^+→Li^+のイオン交
換強化処理し、次いで、該ガラス基板面に化学的気相蒸
着法により酸化錫を主成分とする透明導電膜を形成する
ことを特徴とする透明導電性ガラス基板の製造方法。(4) A glass substrate containing sodium is subjected to ion exchange strengthening treatment of Na^+ → Li^+ at a temperature above the annealing point of the glass substrate, and then a chemical vapor deposition method is applied to the surface of the glass substrate. A method for manufacturing a transparent conductive glass substrate, comprising forming a transparent conductive film containing tin oxide as a main component.
塩と接触させてNa^+→Li^+のイオン交換強化処
理を施すことを特徴とする特許請求の範囲第4項記載の
透明導電性ガラス基板の製造方法。(5) The transparent conductive material according to claim 4, characterized in that the glass substrate is brought into contact with a molten salt at a temperature equal to or higher than its annealing point to undergo ion exchange strengthening treatment of Na^+→Li^+. A method for manufacturing a synthetic glass substrate.
てガラス基板と接触させる溶融塩が硫酸塩で あることを特徴とする特許請求の範囲第5項記載の透明
導電性ガラス基板の製造方法。(6) The method for manufacturing a transparent conductive glass substrate according to claim 5, characterized in that the molten salt brought into contact with the glass substrate in the Na^+→Li^+ ion exchange strengthening treatment is a sulfate. .
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP24586587A JPH0193004A (en) | 1987-10-01 | 1987-10-01 | Transparent conductive glass substrate and its manufacture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP24586587A JPH0193004A (en) | 1987-10-01 | 1987-10-01 | Transparent conductive glass substrate and its manufacture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0193004A true JPH0193004A (en) | 1989-04-12 |
Family
ID=17139970
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP24586587A Pending JPH0193004A (en) | 1987-10-01 | 1987-10-01 | Transparent conductive glass substrate and its manufacture |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0193004A (en) |
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-
1987
- 1987-10-01 JP JP24586587A patent/JPH0193004A/en active Pending
Cited By (11)
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|---|---|---|---|---|
| JP2010168270A (en) * | 2008-12-26 | 2010-08-05 | Hoya Corp | Glass substrate and method for manufacturing the same |
| JP2011105598A (en) * | 2008-12-26 | 2011-06-02 | Hoya Corp | Method of manufacturing glass base material |
| JP2012254928A (en) * | 2008-12-26 | 2012-12-27 | Hoya Corp | Glass substrate for cover glass for mobile terminal device |
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| CN104724917A (en) * | 2008-12-26 | 2015-06-24 | Hoya株式会社 | Glass Substrate And Method For Manufacturing The Same |
| US9096463B2 (en) | 2008-12-26 | 2015-08-04 | Hoya Corporation | Glass substrate |
| JP2012216251A (en) * | 2011-03-31 | 2012-11-08 | Konica Minolta Advanced Layers Inc | Method for manufacturing glass substrate for magnetic information recording medium |
| US11535555B2 (en) | 2011-10-28 | 2022-12-27 | Corning Incorporated | Glass articles with infrared reflectivity and methods for making the same |
| US10116035B2 (en) | 2015-04-30 | 2018-10-30 | Corning Incorporated | Electrically conductive articles with discrete metallic silver layers and methods for making same |
| JP2020526473A (en) * | 2017-07-13 | 2020-08-31 | コーニング インコーポレイテッド | Glass-based articles with improved stress profile |
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