JPH0195604U - - Google Patents

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Publication number
JPH0195604U
JPH0195604U JP19131787U JP19131787U JPH0195604U JP H0195604 U JPH0195604 U JP H0195604U JP 19131787 U JP19131787 U JP 19131787U JP 19131787 U JP19131787 U JP 19131787U JP H0195604 U JPH0195604 U JP H0195604U
Authority
JP
Japan
Prior art keywords
optical system
interference method
measuring
fringe scanning
surface shape
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19131787U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP19131787U priority Critical patent/JPH0195604U/ja
Publication of JPH0195604U publication Critical patent/JPH0195604U/ja
Pending legal-status Critical Current

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Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例の非球面形状測定時
の構成図、第2図は球面形状測定時の構成図、第
3図は従来の縞走査シエアリング干渉方式の表面
形状測定の説明図、第4図は従来の非球面と球面
の表面形状測定の説明図である。 1……レーザ発振器、2……ビームエクスパン
ダー、4,9……ビームスプリツター、5……対
物レンズ、6,53,58……ミラー、7,52
……電歪素子、10……結像レンズ、11……T
Vカメラ、61……画像処理プロセツサ、12…
…被測定物、51……1/2波長板、54……偏
光ビームスプリツター、55,56……1/4波
長板、57……偏光板、59……シヤツター、6
0……微動機構。
Fig. 1 is a block diagram when measuring an aspherical surface shape according to an embodiment of the present invention, Fig. 2 is a block diagram when measuring a spherical shape, and Fig. 3 is an explanatory diagram of surface shape measurement using the conventional fringe scanning shearing interference method. , FIG. 4 is an explanatory diagram of conventional surface shape measurement of aspherical and spherical surfaces. 1... Laser oscillator, 2... Beam expander, 4, 9... Beam splitter, 5... Objective lens, 6, 53, 58... Mirror, 7, 52
...Electrostrictive element, 10...Imaging lens, 11...T
V camera, 61... Image processing processor, 12...
...Object to be measured, 51...1/2 wavelength plate, 54...Polarizing beam splitter, 55, 56...1/4 wavelength plate, 57...Polarizing plate, 59...Shutter, 6
0... Fine movement mechanism.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 被測定物の光学表面形状を、縞走査シエアリン
グ干渉方式で測定するための第1の光学系と、縞
走査トワイマン・グリーン干渉方式で測定するた
めの第2の光学系と、上記第1の光学系と上記第
2の光学系を切り換えるためのシヤツター及び偏
光素子と、縞走査トワイマン・グリーン干渉方式
における測定用光量と参照用光量とを調整する手
段とを有する事を特徴とする光学表面の形状測定
装置。
a first optical system for measuring the optical surface shape of the object to be measured using a fringe scanning shearing interference method; a second optical system for measuring the optical surface shape of the object using a fringe scanning Twyman-Green interference method; and the first optical system. A shape of an optical surface characterized by having a shutter and a polarizing element for switching between the optical system and the second optical system, and means for adjusting the measurement light amount and the reference light amount in the fringe scanning Twyman-Green interference method. measuring device.
JP19131787U 1987-12-18 1987-12-18 Pending JPH0195604U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19131787U JPH0195604U (en) 1987-12-18 1987-12-18

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19131787U JPH0195604U (en) 1987-12-18 1987-12-18

Publications (1)

Publication Number Publication Date
JPH0195604U true JPH0195604U (en) 1989-06-23

Family

ID=31482236

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19131787U Pending JPH0195604U (en) 1987-12-18 1987-12-18

Country Status (1)

Country Link
JP (1) JPH0195604U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011107139A (en) * 2009-11-20 2011-06-02 Mitsutoyo Corp Apparatus and method for measuring surface shape of object and part kit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011107139A (en) * 2009-11-20 2011-06-02 Mitsutoyo Corp Apparatus and method for measuring surface shape of object and part kit

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