JPH01961A - electrophotographic photoreceptor - Google Patents

electrophotographic photoreceptor

Info

Publication number
JPH01961A
JPH01961A JP62-155477A JP15547787A JPH01961A JP H01961 A JPH01961 A JP H01961A JP 15547787 A JP15547787 A JP 15547787A JP H01961 A JPH01961 A JP H01961A
Authority
JP
Japan
Prior art keywords
film
photoreceptor
corona
silicon
electrophotographic photoreceptor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62-155477A
Other languages
Japanese (ja)
Other versions
JPS64961A (en
Inventor
邦裕 玉橋
文紀 石川
重春 小沼
政利 若木
俊之 大野
充夫 近崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP62-155477A priority Critical patent/JPH01961A/en
Publication of JPS64961A publication Critical patent/JPS64961A/en
Publication of JPH01961A publication Critical patent/JPH01961A/en
Pending legal-status Critical Current

Links

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 でも良好な画像を形成させるに好適な表面保護層。[Detailed description of the invention] A surface protective layer suitable for forming good images.

即ち水素とふっ素を含むアモルファスカーボン(以下a
−C:F:Hという)膜において、F/C量を規定する
ことにより高耐湿性及び高硬度を兼備した電子写真感光
体に関する。
That is, amorphous carbon containing hydrogen and fluorine (hereinafter referred to as a)
The present invention relates to an electrophotographic photoreceptor that has both high moisture resistance and high hardness by specifying the amount of F/C in a film (referred to as -C:F:H).

〔従来の技術〕[Conventional technology]

従来から電子写真用感光体として、S e 、 CdS
Conventionally, S e and CdS have been used as electrophotographic photoreceptors.
.

AszSea等の無機光導電材もしくはPVK−TNF
等に代表される様な有機光導電材が用いられている。こ
れらの材料は電子写真特性には極めス て優れた特性を有するものの、機械的特性においいは必
ずしも必要とする仕様を満足しているとは言い難い。こ
れに対しアモルファスシリコン系感光体は光導電性及び
機械的特性の両面において優れた特性を備えている。し
かし、唯一の欠点は耐湿性に劣ることである。この理由
はコロナ帯電時に生ずるオゾンにより感光体表面に親水
性のS i Ox(x=1〜2)が生成するためである
。表面が高硬度故にファーブラシ、磁気ブラシ等によっ
ても除去できずコロナ帯電をくり返すたびに表面のS 
i Ox生成量が増大する。従って、耐湿性を向上させ
るにはSiOxの生成量を最小限に押えることが必要と
なる。そこで表面を非Si化する方法が考えられる。こ
の観点に立脚し、特開昭61−94056にみられる様
にアモルファス・カーボンを用いる方法がある。しかし
、アモルファス・カーボン(a−Co r  A−C’
:’)I)はコロナ帯電時に生成するオゾンによりC=
0なるカルボニル基を形成し易く、水に濡れ易くなる。
Inorganic photoconductive material such as AszSea or PVK-TNF
Organic photoconductive materials, such as those typified by, are used. Although these materials have extremely excellent electrophotographic properties, it cannot be said that their mechanical properties necessarily satisfy the required specifications. In contrast, amorphous silicon photoreceptors have excellent properties in both photoconductivity and mechanical properties. However, the only drawback is poor moisture resistance. The reason for this is that hydrophilic SiOx (x=1 to 2) is generated on the surface of the photoreceptor due to ozone generated during corona charging. Due to the high hardness of the surface, it cannot be removed even with fur brushes, magnetic brushes, etc., and the S on the surface increases with repeated corona charging.
i Ox production increases. Therefore, in order to improve moisture resistance, it is necessary to minimize the amount of SiOx produced. Therefore, a method of making the surface non-Si may be considered. Based on this point of view, there is a method using amorphous carbon as seen in Japanese Patent Application Laid-Open No. 61-94056. However, amorphous carbon (a-Cor A-C'
:') I) C= due to ozone generated during corona charging
It is easy to form a carbonyl group of 0, making it easy to get wet with water.

コロナ帯電に対してはアモルファス・カーボン膜より強
い結合力が存在する元素を含む膜が必要となる。
For corona charging, a film containing elements with stronger bonding force than an amorphous carbon film is required.

一方、C−F結合を用いる特許がUSP4,582,7
69にみられるが、単にa−C:F:H膜を用いた場合
はbζろいろな組成比(F/C)の膜が考えられる。F
/Cが少ないとa−c(or a−C:H)膜と同様に
コロナ帯電時に生成するオゾンによりC=0が形成され
、水に濡れ易くなる。従って、適正なF/Cを規定しな
いと画像流れ防止の再現性 ゛に乏しくなり、実用に供
し得ない。
On the other hand, the patent using C-F bond is USP 4,582,7
As shown in No. 69, when simply using an a-C:F:H film, films with various bζ composition ratios (F/C) can be considered. F
When /C is small, C=0 is formed due to ozone generated during corona charging, similar to an a-c (or a-C:H) film, and it becomes easy to wet with water. Therefore, unless an appropriate F/C is specified, the reproducibility of preventing image blurring will be poor and it cannot be put to practical use.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

従来技術はコロナによるSiOx生成という高湿下では
悪作用を及ぼす反応物に対し、十分な対応がされていな
かった。本発明の目的は、表面をC,F、Hの化合物で
保護することでコロナによる酸化を防止し且つ、高耐湿
性とした電子写真感光体を提供することにある。
The conventional technology has not sufficiently dealt with the reaction product, which has an adverse effect under high humidity, such as the formation of SiOx by corona. An object of the present invention is to provide an electrophotographic photoreceptor whose surface is protected with a compound of C, F, and H, thereby preventing oxidation due to corona and having high moisture resistance.

〔問題点を解決するための手段〕[Means for solving problems]

感光体表面に形成されたa−C: F: H膜はコロナ
帯電時にも酸化され難いので、高湿下でも表面を高はつ
水性に維持できるので、ぼけない画像を出せる。
Since the a-C:F:H film formed on the surface of the photoreceptor is not easily oxidized even during corona charging, the surface can be maintained highly water-repellent even under high humidity, and images without blurring can be produced.

更にF/Cの原子比を0.4 以上、2以下としたこと
により、高耐湿性及び耐コロナ性を大幅に向上できた。
Further, by setting the F/C atomic ratio to 0.4 or more and 2 or less, high humidity resistance and corona resistance were significantly improved.

本発明において、前記表面保護膜中にシリコンを30原
子%以下含有することは非常に望ましく。
In the present invention, it is highly desirable that the surface protective film contains 30 atomic % or less of silicon.

これにより硬さが増し耐久性が向上する。シリコン量は
5〜20JI子%の範囲が特に望ましい。
This increases hardness and improves durability. The silicon content is particularly preferably in the range of 5 to 20 JI%.

〔作用〕[Effect]

け 表面をはつ水性にする手段として、史←−恰÷←←÷を
貴CF aプラズマ処理法がある。しかし。
As a means of making the surface water repellent, there is a CFa plasma treatment method. but.

この方法を本材料に適応すると表面がエツチングされる
。そこで、本発明ではCFaプラズマ中にH2を添加し
、プラズマ中で分解しているC、 FとHを結合させた
。感光体表面に高はつ水性のa−C:F:H膜を作製す
ることにより、ぼけない感光体をつくり出すことができ
る。
When this method is applied to this material, the surface is etched. Therefore, in the present invention, H2 was added to the CFa plasma to combine C, F, and H decomposed in the plasma. By producing a highly water-repellent a-C:F:H film on the surface of the photoreceptor, it is possible to create a photoreceptor that does not blur.

〔実施例〕〔Example〕

実施例(1) 基板に結晶Si板及びガラス板(コーニング7059)
を用い、ラジオ波(13,56MHz)放電装置内にお
いて成膜した。反応ガスはCF4、+H2混合ガステガ
ス比(X=H2/(CF4+Hz))をOから1.0 
まで変化させた。なお、反応ガス圧はITorr、放電
電圧50W、基板温度200℃で基板はアース側電極上
とした。第1図にガス比(X)と成膜速度の関係を示す
。本図から判る様にX<0.1 では負の成膜速度で基
板がエツチングされる。しかし、X≧0.1 では正の
成膜速度で基板上に成膜される。X≧0.1 で作製し
たa−C:F:H膜に関してコロナ照射時間と水との接
触角の関係を第2図に示す。コロナ照射は川口電機製静
電記録器(SSV−II)を用い+5.5KV、室温(
23℃)、50〜60%RH中で行った0図から判る様
にいずれのガス比で作製してもコロナ照射時間と共に接
触角が低下するが、ガス混合比が大きくなると共に減少
率が大きくなることがわかる。そこで、a−C:F:H
膜を表面保護層とする積層感光体を作製し、印刷実験を
行った。印刷に用いたプリンタは半導体レーザ(780
nm)を用いている。画像評価として印字濃度を測定し
た。なお、印刷は25℃、80%RHの高湿下で行った
Example (1) Crystalline Si plate and glass plate (Corning 7059) as substrates
The film was formed using a radio wave (13,56 MHz) discharge device. The reaction gas is CF4, +H2 mixed gas ratio (X=H2/(CF4+Hz)) from O to 1.0.
changed to. The reaction gas pressure was ITorr, the discharge voltage was 50 W, the substrate temperature was 200° C., and the substrate was placed on the ground electrode. FIG. 1 shows the relationship between gas ratio (X) and film formation rate. As can be seen from this figure, when X<0.1, the substrate is etched at a negative film formation rate. However, when X≧0.1, the film is formed on the substrate at a positive film formation rate. FIG. 2 shows the relationship between the corona irradiation time and the contact angle with water for the a-C:F:H film prepared with X≧0.1. Corona irradiation was performed using an electrostatic recorder (SSV-II) manufactured by Kawaguchi Electric at +5.5 KV and room temperature (
As can be seen from Figure 0, which was performed at 23℃) and 50 to 60% RH, the contact angle decreases with corona irradiation time no matter which gas ratio is used, but the rate of decrease increases as the gas mixture ratio increases. I know what will happen. Therefore, a-C:F:H
A laminated photoreceptor with a film as a surface protective layer was prepared and a printing experiment was conducted. The printer used for printing is a semiconductor laser (780
nm) is used. Print density was measured as image evaluation. Note that printing was performed at 25° C. and 80% RH under high humidity.

実験に用いた感光体膜構造は第3図に示す通りで、AQ
トドラム上a−SiC:H(0,5μm)/a−Si 
 :H(B)(30μm)/a−8iGe(0,5μm
)を積層した後、表面保護層としてa−C:F:H膜を
0.5μmM暦した。くり返し印刷した結果を第4図に
示す。いずれの場合も。
The photoreceptor film structure used in the experiment is as shown in Figure 3.
a-SiC on top drum: H (0.5 μm)/a-Si
:H(B)(30μm)/a-8iGe(0.5μm
) was laminated, and then a 0.5 μmM a-C:F:H film was applied as a surface protective layer. The results of repeated printing are shown in FIG. In either case.

コロナ照射5h毎に印刷した結果である。本図から判る
様にガス比が0.1〜0.5 で作製したドラムはコロ
ナ照射15h後でも印字濃度の低下はない。しかし、ガ
ス比が0.7以上で作製したドラムはコロナ照射15h
後には画像流れが生じ印字濃度が0.8程度に低下した
。そこで、次に種種のガス比で作製したa−C:F:H
膜のF/C比を光電子分光法(xps)にて分析した。
This is the result of printing every 5 hours of corona irradiation. As can be seen from this figure, there was no decrease in print density even after 15 hours of corona irradiation in the drums manufactured with a gas ratio of 0.1 to 0.5. However, drums made with a gas ratio of 0.7 or higher were irradiated with corona for 15 hours.
Afterwards, image blurring occurred and the print density decreased to about 0.8. Therefore, next, a-C:F:H was prepared with various gas ratios.
The F/C ratio of the film was analyzed using photoelectron spectroscopy (XPS).

結果を第5図に示す。F/Cはガス比に対し放物線的に
減少する。第4及び5図から画像流れが発生しないF/
Cは0.4以上2.0以下であることが判る。
The results are shown in Figure 5. F/C decreases parabolically with respect to gas ratio. From Figures 4 and 5, F/
It can be seen that C is 0.4 or more and 2.0 or less.

一方、a−C:F:H膜中のCF n (n =1 t
2.3)結合を検討した。X=O,l  で作製した膜
を光電子分光法(xps)で分析した一例を第6図に示
す。結合エネルギ285eV近傍にみられるスペクトル
をピーク分割すると図の如<、C−C及びC−Fn(n
=1.2.3)結合が存在していることが判る。
On the other hand, CF n (n = 1 t
2.3) Considered binding. FIG. 6 shows an example of a film prepared with X=O,l analyzed by photoelectron spectroscopy (XPS). When the spectrum seen near the binding energy of 285 eV is divided into peaks, as shown in the figure, C-C and C-Fn(n
=1.2.3) It can be seen that a bond exists.

これらの結合のうち、最良の結合はCFzである。即ち
、C−Fzは二次元的鎖状構造をとり、一方C−Fsは
C−C結合の終点を意味している。
Among these bonds, the best bond is CFz. That is, C-Fz has a two-dimensional chain structure, while C-Fs means the end point of the C-C bond.

C−F zの時C−C結合がダイヤモンド結合状態をと
り得る確率が高くなる。従って、a−C:F:H膜の表
面硬度が高くなる。
When C-F z, the probability that the C-C bond can take the diamond bond state increases. Therefore, the surface hardness of the a-C:F:H film increases.

実施例(2) 今度は基板マイクロ波(2,45GHz) 放!装置内
において実施例(1)と同様の実験を行った。
Example (2) This time, the substrate microwave (2.45 GHz) is emitted! An experiment similar to Example (1) was conducted in the apparatus.

マイクロ波放電出力は160W、試料のセット位置はキ
ャビティより1301下方とし、試料が直接放電圏にさ
らされるのを防いだ、実施例1と同様にX≧0.1 で
成膜モードとなっている。この膜も実施例1と同様にa
−C:F:H膜となっていることがXPS分析で判明し
た。この膜を表面保護層とする感光ドラムの画像評価で
もF/C≧0.4で実施例1と同効果が得られた。
The microwave discharge output was 160 W, and the sample was set at a position 1301 below the cavity to prevent the sample from being directly exposed to the discharge sphere. As in Example 1, the film formation mode was set at X≧0.1. . This film also had a
-C:F:H film was found by XPS analysis. In image evaluation of a photosensitive drum using this film as a surface protective layer, the same effect as in Example 1 was obtained with F/C≧0.4.

実施例(3) 次に反応ガスにHを含むフッ化水素カーボンガスを用い
た。実施例はCHF aガスである。この場合、実施例
(1)及び(2)のいずれの放電装置を用いてもガス比
(Y = Hz/ (Hz+ CHF a) )がY=
0から正の成膜速度で、膜が成膜される。結果は第7図
に示す、なお、この膜を表面保護層とした電子写真感光
体の画像評価でもF/C≧0゜4で実施例1と同効果が
得られた。
Example (3) Next, hydrogen fluoride carbon gas containing H was used as a reaction gas. An example is CHFa gas. In this case, no matter which discharge device of Example (1) or (2) is used, the gas ratio (Y = Hz/ (Hz + CHF a)) is Y =
The film is deposited at a deposition rate ranging from 0 to positive. The results are shown in FIG. 7. Furthermore, in the image evaluation of an electrophotographic photoreceptor using this film as a surface protective layer, the same effect as in Example 1 was obtained when F/C≧0°4.

実施例1,2.3から成膜時のフッ素源としてFを含む
フロン系のガスを用いればその種類に依存せず膜中のF
/C量を規定することで画像流れ防止を画ることかでき
ることが判明した。従って、F/C量を0.4 以上に
保ったa−C:F:H系の膿ではこの膜にP、N、O,
B等を最大10at%までドーピングしても本発明の効
果の妨害にはならない。又、結合水素としての水素量は
通常0.5〜1oat%程度含まれているが、この水素
は1本発明の効果に好影響を与えても害にはならなJ。
From Examples 1 and 2.3, if a fluorocarbon-based gas containing F is used as a fluorine source during film formation, F in the film can be reduced regardless of the type of fluorine.
It has been found that image deletion can be prevented by specifying the amount of /C. Therefore, in a-C:F:H system pus with an F/C content of 0.4 or more, this membrane contains P, N, O,
Even if B or the like is doped up to a maximum of 10 at %, the effects of the present invention will not be interfered with. Further, the amount of hydrogen as bonded hydrogen is usually about 0.5 to 1 oat%, and even if this hydrogen has a positive effect on the effects of the present invention, it will not cause any harm.

このことはa−C:H膜も画像流れに対して有効である
ことから明らかである。
This is clear from the fact that the aC:H film is also effective against image deletion.

実施例(4) a−C:F:H膜にSiを添加し、Si量とコロナ照射
による接触角の変化を調べた0画像評価から接触角の下
限を45°とするとコロナ照射15h後でも40〜45
°以上を保っているSi量は第8図曲線aから30at
%以下であることが判る。これはSiがコロナ照射によ
りSin。
Example (4) Si was added to the a-C:F:H film, and changes in the contact angle due to the amount of Si and corona irradiation were investigated. Based on the zero image evaluation, if the lower limit of the contact angle was set to 45°, even after 15 hours of corona irradiation. 40-45
The amount of Si that maintains the temperature above 30at is shown by curve a in Figure 8.
% or less. This is because Si becomes Sin due to corona irradiation.

(x=0〜2)になっても高はっ水性のC−F結合の存
在とF/C≧0.4 の条件が成立している時には実質
上接触角が必要最小限の値を保つことを意味している。
(x = 0 to 2), the contact angle substantially maintains the required minimum value as long as there is a highly water-repellent C-F bond and the conditions of F/C≧0.4 are satisfied. It means that.

実施例(5) る原因を考案したところSiHが減少しSiOの生成が
増加していることがxPS分析により判明した。従って
、SiOの生成を防止すると接触角の向上が期待できる
@ S iF或いはSiCの様にSiHより結合エネル
ギの大きい結合をとる様にすることが最良である。膜作
製時において反応ガスにS i H4ガスの代わりにS
 i F4ガスを用いて作製した場合、a−C:F:H
膜中にとり込まれたSiはSiF結合成いはSiC結合
をしていることが判明した。そこで実施例(4)と同条
件でコロナ照射後の接触角とSi添加量との関係を求め
た。結果を第8図曲線すに示す。本図から判る様に実施
例(4)の場合に比べ高い接触角が得られる。この場合
、Si量は30at%まで添加できることが判る。この
様にSiを添加することで表面硬度が向上し耐久性が増
加する。
Example (5) When the cause was devised, it was found by xPS analysis that SiH decreased and SiO generation increased. Therefore, it is best to use a bond with a larger bond energy than SiH, such as @SiF or SiC, which can be expected to improve the contact angle by preventing the formation of SiO. S in place of S i H4 gas as a reaction gas during film fabrication.
i When produced using F4 gas, a-C:F:H
It has been found that the Si incorporated into the film forms SiF bonds or SiC bonds. Therefore, the relationship between the contact angle after corona irradiation and the amount of Si added was determined under the same conditions as in Example (4). The results are shown in the curve in Figure 8. As can be seen from this figure, a higher contact angle can be obtained than in Example (4). In this case, it is understood that the amount of Si can be added up to 30 at%. Adding Si in this manner improves surface hardness and increases durability.

、〔発明の効果〕 本発明によれば、耐コロナ、耐湿性のある感光体を再現
性よく作製でき、具体的効果として高湿下でも高印字品
質を保ったプリンタもしくは複写機を提供できる。
[Effects of the Invention] According to the present invention, a corona-resistant and moisture-resistant photoreceptor can be produced with good reproducibility, and as a specific effect, a printer or a copying machine that maintains high printing quality even under high humidity can be provided.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は成膜速度とガス比の関係を示す特性図。 第2図は接触角とコロナ照射時間の関係を示す特性図、
第3図は感光体膜構造を示す断面図、第4図は印字濃度
とコロナ照射°時間の関係を示す特性図、第5図はF/
Cとガス比の関係を示す特性図。 第6図はC1sスペクトルを示す特性図、第7図はは成
膜速度とガス比の関係を示す特性図、第8図は接触角と
Si量の関係を示す特性図である。 1・・・AQ基板、2・・・ブロッキング層、3・・・
電荷搬域 1 凹 第2菌 o     s     to     tsコロナ層
I吋峙v’%(h) 第 4 図 ブス目; コロナ鼎四時1旬 ()L) 革 51.¥1 Oθ、/   0,3   θ、s   o、’t  
 θ、9力゛ストし 第 6 口 2’?5     ZqO2B5    280訃吉心
計工卑ルで(eV) 皐70 率8図
FIG. 1 is a characteristic diagram showing the relationship between film formation rate and gas ratio. Figure 2 is a characteristic diagram showing the relationship between contact angle and corona irradiation time.
Figure 3 is a cross-sectional view showing the photoreceptor film structure, Figure 4 is a characteristic diagram showing the relationship between print density and corona irradiation time, and Figure 5 is F/
A characteristic diagram showing the relationship between C and gas ratio. FIG. 6 is a characteristic diagram showing the C1s spectrum, FIG. 7 is a characteristic diagram showing the relationship between film formation rate and gas ratio, and FIG. 8 is a characteristic diagram showing the relationship between contact angle and Si amount. 1... AQ substrate, 2... Blocking layer, 3...
Charge transport area 1 concave 2nd bacterium os to ts corona layer I facing v'% (h) Fig. 4 ugly eye; corona 4 o'clock 1 season () L) Leather 51. ¥1 Oθ, / 0,3 θ, so, 't
θ, 9th force strikes and 6th mouth 2'? 5 ZqO2B5 280 Yoshishin Keikoberu (eV) 70 rate 8 figure

Claims (1)

【特許請求の範囲】 1、アモルファスシリコンよりなる光導電層と該光導電
層の支持体とを具備する電子写真感光体において、当該
感光体の最表面部に水素とふつ素を含むアモルファスカ
ーボン膜を有し且つ該膜中のF/Cの原子比が0.4以
上2以下であることを特徴とする電子写真感光体。 2、アモルファスシリコンよりなる光導電層と該光導電
層の支持体とを具備する電子写真感光体において、当該
感光体の最表面部に水素とふつ素とシリコンを含むアモ
ルファスカーボン膜を有し、該膜中のシリコン量が30
原子%以下、F/Cの原子比が0.4以上、2以下であ
ることを特徴とする電子写真感光体。 3、特許請求の範囲第2項において、前記水素とふつ素
とシリコンを含むアモルファスカーボン膜中にシリコン
がSi−F及び/或いはSi−Cの状態で結合している
ことを特徴とする電子写真感光体。
[Claims] 1. An electrophotographic photoreceptor comprising a photoconductive layer made of amorphous silicon and a support for the photoconductive layer, an amorphous carbon film containing hydrogen and fluorine on the outermost surface of the photoreceptor. 1. An electrophotographic photoreceptor characterized in that the film has an atomic ratio of F/C of 0.4 or more and 2 or less. 2. An electrophotographic photoreceptor comprising a photoconductive layer made of amorphous silicon and a support for the photoconductive layer, having an amorphous carbon film containing hydrogen, fluorine, and silicon on the outermost surface of the photoreceptor, The amount of silicon in the film is 30
An electrophotographic photoreceptor characterized in that the F/C atomic ratio is 0.4 or more and 2 or less. 3. Electrophotography according to claim 2, characterized in that silicon is bonded in the state of Si-F and/or Si-C in the amorphous carbon film containing hydrogen, fluorine, and silicon. Photoreceptor.
JP62-155477A 1987-06-24 electrophotographic photoreceptor Pending JPH01961A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62-155477A JPH01961A (en) 1987-06-24 electrophotographic photoreceptor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62-155477A JPH01961A (en) 1987-06-24 electrophotographic photoreceptor

Publications (2)

Publication Number Publication Date
JPS64961A JPS64961A (en) 1989-01-05
JPH01961A true JPH01961A (en) 1989-01-05

Family

ID=

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