JPH0197262U - - Google Patents

Info

Publication number
JPH0197262U
JPH0197262U JP19269087U JP19269087U JPH0197262U JP H0197262 U JPH0197262 U JP H0197262U JP 19269087 U JP19269087 U JP 19269087U JP 19269087 U JP19269087 U JP 19269087U JP H0197262 U JPH0197262 U JP H0197262U
Authority
JP
Japan
Prior art keywords
qfp
measurement probe
probe assembly
members
tapered
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP19269087U
Other languages
Japanese (ja)
Other versions
JPH0533973Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP19269087U priority Critical patent/JPH0533973Y2/ja
Publication of JPH0197262U publication Critical patent/JPH0197262U/ja
Application granted granted Critical
Publication of JPH0533973Y2 publication Critical patent/JPH0533973Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

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  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案によるQFP用測定プローブ組
立体の一実施例の一部を示す斜視図、第2図は第
1図に示したQFP用測定プローブ組立体の一側
面の櫛形部材を示す正面図、第3図は第1図に示
したQFP用測定プローブ組立体の測定プローブ
を隣接するリード間に挿入した状態で示す部分拡
大斜視図である。 10……矩形板部材、12……櫛形部材、14
……背部、16……歯部、18……測定プローブ
、20……テーパ状ヘツド部材、22……導体部
材、24……導体小片、26……リード線、28
……接続部、30……電気ケーブル、32……測
定器、34……リード。
FIG. 1 is a perspective view showing a part of an embodiment of the QFP measurement probe assembly according to the present invention, and FIG. 2 is a front view showing a comb-shaped member on one side of the QFP measurement probe assembly shown in FIG. 3 is a partially enlarged perspective view showing the measurement probe of the QFP measurement probe assembly shown in FIG. 1 inserted between adjacent leads. 10... Rectangular plate member, 12... Comb-shaped member, 14
... Back part, 16 ... Teeth, 18 ... Measurement probe, 20 ... Tapered head member, 22 ... Conductor member, 24 ... Conductor piece, 26 ... Lead wire, 28
... Connection part, 30 ... Electric cable, 32 ... Measuring device, 34 ... Lead.

Claims (1)

【実用新案登録請求の範囲】 1 プリント回路基板上に設置されたQFPの電
気特性テスト、機能テスト等を行う際に用いられ
るQFP用測定プローブ組立体であつて、QFP
のチツプ本体の平面矩形よりも大き目のほぼ相似
な矩形の四辺に沿つて配置される4つの櫛形部材
12を具備し、これら櫛形部材の各々はQFPの
チツプ本体の該当側面から延びるリード34の数
の半分に相当する数の歯部16を備え、前記櫛形
部材のそれぞれの各歯部の先端には測定プローブ
18が設けられ、この測定プローブはテーパ状ヘ
ツド部材20と、このテーパ状ヘツド部材の互い
に対向する両テーパ側面に絶縁状態で適用された
一対の導体部材22とからなり、この一対の導体
部材間の距離が前記テーパ状ヘツド部材の狭窄端
部側でQFPのリードピツチ間隔よりも小さくさ
れ、前記櫛形部材のそれぞれの測定プローブがそ
れらのテーパ状ヘツド部材の両テーパ側面を互い
に向かい合わせて整列させるような態様で配置さ
れると共にその隣接する2つの測定プローブの中
心間距離がQFPのチツプ本体の該当側面での連
続する3つのリードピツチ間隔のうちの両外側の
リードピツチ間隔の中心間距離に相当するように
なつているQFP用測定プローブ組立体。 2 実用新案登録請求の範囲第1項に記載のQF
P用測定プローブ組立体において、前記4つの櫛
形部材12がQFPのチツプ本体の平面矩形より
も大き目のほぼ相似な矩形板部材10の四辺から
吊下する態様で支持されることを特徴とするQF
P用測定プローブ組立体。 3 実用新案登録請求の範囲第2項に記載のQF
P用測定プローブ組立体において、前記矩形板部
材10の上面には重りが設けられるていることを
特徴とするQFP用測定プローブ組立体。 4 実用新案登録請求の範囲第1項から第3項ま
でのいずれか1項に記載のQFP用測定プローブ
組立体において、前記テーパ状ヘツド部材20が
楔形状を呈し、その互いに向かい合つた楔面に前
記一対の導体部材22が適用されることを特徴と
するQFP用測定プローブ組立体。 5 実用新案登録請求の範囲第1項から第3項ま
でのいずれか1項に記載のQFP用測定プローブ
において、前記テーパ状ヘツド部材20が切頭円
錐形状を呈し、その直径方向で互いに向かい合う
両テーパ面部分に前記一対の導体部材22が適用
されていることを特徴とするQFP用測定プロー
ブ組立体。 6 実用新案登録請求の範囲第1項から第3項ま
でのいずれか1項に記載のQFP用測定プローブ
において、前記テーパ状ヘツド部材20が切頭楕
円錐形状を呈し、その直径方向で互いに向かい合
う両テーパ面部分に前記一対の導体部材22が適
用されていることを特徴とするQFP用測定プロ
ーブ組立体。
[Scope of Claim for Utility Model Registration] 1. A measurement probe assembly for QFP used when performing electrical characteristic tests, functional tests, etc. of QFP installed on a printed circuit board, which
It has four comb-shaped members 12 arranged along the four sides of a substantially similar rectangle larger than the planar rectangle of the QFP chip body, and each of these comb-shaped members corresponds to the number of leads 34 extending from the corresponding side of the QFP chip body. A measurement probe 18 is provided at the tip of each tooth of the comb-shaped member, and this measurement probe connects a tapered head member 20 and a tapered head member 20. It consists of a pair of conductor members 22 applied in an insulating state to both tapered side surfaces facing each other, and the distance between the pair of conductor members is smaller than the lead pitch interval of the QFP on the narrow end side of the tapered head member. , the measurement probes of each of the comb-shaped members are arranged in such a manner that both tapered side surfaces of their tapered head members are aligned facing each other, and the distance between the centers of two adjacent measurement probes is a QFP chip. A measurement probe assembly for a QFP, which corresponds to the center-to-center distance of the outer lead pitch intervals of three consecutive lead pitch intervals on the corresponding side of the main body. 2 QF stated in Paragraph 1 of Claims for Utility Model Registration
In the measurement probe assembly for P, the four comb-shaped members 12 are supported in a manner suspended from the four sides of a substantially similar rectangular plate member 10 that is larger than the planar rectangle of the QFP chip body.
Measurement probe assembly for P. 3 QF stated in Paragraph 2 of Claims for Utility Model Registration
A QFP measurement probe assembly characterized in that a weight is provided on the upper surface of the rectangular plate member 10. 4 Utility Model Registration In the QFP measurement probe assembly according to any one of claims 1 to 3, the tapered head member 20 has a wedge shape, and the wedge surfaces thereof face each other. A measurement probe assembly for QFP, characterized in that the pair of conductor members 22 is applied to the QFP measurement probe assembly. 5 Utility Model Registration In the QFP measurement probe according to any one of claims 1 to 3, the tapered head member 20 has a truncated conical shape, and has two members facing each other in the diametrical direction. A measurement probe assembly for QFP, characterized in that the pair of conductor members 22 are applied to the tapered surface portion. 6 Utility Model Registration In the QFP measurement probe according to any one of claims 1 to 3, the tapered head member 20 has a truncated elliptical cone shape and faces each other in the diametrical direction. A measurement probe assembly for QFP, characterized in that the pair of conductor members 22 are applied to both tapered surface portions.
JP19269087U 1987-12-21 1987-12-21 Expired - Lifetime JPH0533973Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19269087U JPH0533973Y2 (en) 1987-12-21 1987-12-21

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19269087U JPH0533973Y2 (en) 1987-12-21 1987-12-21

Publications (2)

Publication Number Publication Date
JPH0197262U true JPH0197262U (en) 1989-06-28
JPH0533973Y2 JPH0533973Y2 (en) 1993-08-27

Family

ID=31483530

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19269087U Expired - Lifetime JPH0533973Y2 (en) 1987-12-21 1987-12-21

Country Status (1)

Country Link
JP (1) JPH0533973Y2 (en)

Also Published As

Publication number Publication date
JPH0533973Y2 (en) 1993-08-27

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