JPH02105111U - - Google Patents

Info

Publication number
JPH02105111U
JPH02105111U JP11981689U JP11981689U JPH02105111U JP H02105111 U JPH02105111 U JP H02105111U JP 11981689 U JP11981689 U JP 11981689U JP 11981689 U JP11981689 U JP 11981689U JP H02105111 U JPH02105111 U JP H02105111U
Authority
JP
Japan
Prior art keywords
head
interference
image signal
head surface
objective lens
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11981689U
Other languages
Japanese (ja)
Other versions
JPH0733128Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP11981689U priority Critical patent/JPH0733128Y2/en
Publication of JPH02105111U publication Critical patent/JPH02105111U/ja
Application granted granted Critical
Publication of JPH0733128Y2 publication Critical patent/JPH0733128Y2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本考案にかかるヘツド姿勢計測装置を
利用した磁気ヘツド自動組み立て装置の例を示す
ブロツク図、第2図は本考案に適用可能なオート
フオーカス装置の例を説明するための特性線図、
第3図は同上オートフオーカス装置の別の特性線
図、第4図は同上特性の一部のデータを0にする
ことを示す線図、第5図は上記オートフオーカス
装置の動作を示すフローチヤート、第6図は上記
磁気ヘツド自動組み立て装置の動作を示すフロー
チヤート、第7図はテレビカメラを通して得られ
るヘツド面の画像の例を示す正面図、第8図は本
考案に適用可能な顕微鏡光学系の例を示す光学配
置図、第9図は同上顕微鏡光学系を用いたヘツド
姿勢計測動作の例を示すフローチヤート、第10
図はヘツド姿勢計測の原理を概略的に示す説明図
、第11図はヘツドの異なる姿勢での上記計測原
理を示す説明図、第12図は本考案の前提として
考えたヘツド姿勢計測に用いることができる顕微
鏡光学系の例を示す光学配置図である。 1,2……ヘツド、4……顕微鏡、5……テレ
ビカメラ、17……干渉縞、41……干渉対物レ
ンズ。
Fig. 1 is a block diagram showing an example of an automatic magnetic head assembly device using the head attitude measuring device according to the present invention, and Fig. 2 shows characteristic lines for explaining an example of an autofocus device applicable to the present invention. figure,
Fig. 3 is another characteristic diagram of the above autofocus device, Fig. 4 is a line diagram showing that some data of the above characteristics are set to 0, and Fig. 5 shows the operation of the above autofocus device. Flowchart: FIG. 6 is a flowchart showing the operation of the automatic magnetic head assembly device; FIG. 7 is a front view showing an example of an image of the head surface obtained through a television camera; FIG. FIG. 9 is an optical layout diagram showing an example of the microscope optical system; FIG. 9 is a flowchart showing an example of head attitude measurement operation using the same microscope optical system; FIG.
Figure 11 is an explanatory diagram schematically showing the principle of head posture measurement, Figure 11 is an explanatory diagram showing the above measurement principle in different head postures, and Figure 12 is used for head posture measurement, which is the premise of the present invention. FIG. 2 is an optical layout diagram showing an example of a microscope optical system that can perform the following. 1, 2...Head, 4...Microscope, 5...TV camera, 17...Interference fringes, 41...Interference objective lens.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 干渉対物レンズを有する顕微鏡を通して画像信
号を得るテレビカメラを用い、上記干渉対物レン
ズの光軸上にあるヘツド面の画像信号と上記干渉
対物レンズによりヘツド面に発生した干渉縞の画
像信号とを上記テレビカメラから画像処理装置に
入力し、上記ヘツド面及び干渉縞の画像信号を画
像処理することによりヘツドの姿勢を計測するヘ
ツド姿勢計測装置であつて、上記テレビカメラと
ヘツド面との間隔は、少なくともヘツド面への合
焦位置から干渉縞への合焦位置までの範囲におい
て上記干渉対物レンズの光軸上で変更可能であり
、テレビカメラを通じて入力される上記ヘツド面
の画像信号と干渉縞の画像信号とを画像処理して
ヘツドの姿勢を計測することを特徴とするヘツド
姿勢計測装置。
Using a television camera that obtains an image signal through a microscope having an interference objective lens, the image signal of the head surface located on the optical axis of the interference objective lens and the image signal of interference fringes generated on the head surface by the interference objective lens are recorded as described above. A head attitude measuring device that measures the attitude of the head by inputting it from a television camera to an image processing device and processing image signals of the head surface and interference fringes, wherein the distance between the television camera and the head surface is: The optical axis of the interference objective lens can be changed at least in the range from the focus position on the head surface to the focus position on the interference fringes, and the image signal of the head surface input through the television camera and the interference fringe can be changed. A head attitude measuring device characterized in that the head attitude is measured by performing image processing on an image signal.
JP11981689U 1988-10-20 1989-10-13 Head posture measuring device Expired - Fee Related JPH0733128Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11981689U JPH0733128Y2 (en) 1988-10-20 1989-10-13 Head posture measuring device

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP63-137162 1988-10-20
JP13716288 1988-10-20
JP11981689U JPH0733128Y2 (en) 1988-10-20 1989-10-13 Head posture measuring device

Publications (2)

Publication Number Publication Date
JPH02105111U true JPH02105111U (en) 1990-08-21
JPH0733128Y2 JPH0733128Y2 (en) 1995-07-31

Family

ID=31718884

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11981689U Expired - Fee Related JPH0733128Y2 (en) 1988-10-20 1989-10-13 Head posture measuring device

Country Status (1)

Country Link
JP (1) JPH0733128Y2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04177108A (en) * 1990-11-13 1992-06-24 Canon Inc How to measure the pose of an object

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04177108A (en) * 1990-11-13 1992-06-24 Canon Inc How to measure the pose of an object

Also Published As

Publication number Publication date
JPH0733128Y2 (en) 1995-07-31

Similar Documents

Publication Publication Date Title
JP3202185B2 (en) Vision Sensor and Vision Processing Technique for Automatic Weld Line Tracking in Arc Welding Process
JPH02105111U (en)
JPH0255211U (en)
JP2575848B2 (en) Image processing method
JPS63217214A (en) Three-dimensional position measuring instrument
JPH0493704A (en) Motion analyzer
JPS6021911U (en) Surface roughness measuring device
JP2529688Y2 (en) Position measurement device
JPS607047U (en) Microlens spherical aberration measuring device
JPH05329793A (en) Visual sensor
JPS6425713U (en)
JPS5960639U (en) Optical path length adjustment device for distance measurement sensor
JP2526543B2 (en) Object height measuring device
JPH0117896Y2 (en)
JPS5949904U (en) distance measuring device
JPH04203914A (en) Image-sensing device
JPS62114310U (en)
JPS5881727U (en) Magnetic head mounting angle inspection device
JPS61121066U (en)
JPH09113224A (en) Mark for measuring three-dimensional position posture and method and device for measuring three-dimensional position posture
JPS6056015U (en) distance measuring device
JPS59114404A (en) How to measure magnetic head shape and mounting orientation
JPS6189148U (en)
JPS5823936B2 (en) Semiconductor pellet bonding pad position detection device
JPS5838119U (en) image sensor

Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees