JPH02105235A - Fault information collector - Google Patents

Abstract

PURPOSE:To reduce the quantity of collection of fault information, to prevent the capacity of fault analysis from being lowered, and to localize a faulty part by providing first and second storage parts and a diagnostic device to judge the coincidence/noncoincidence of the fault information. CONSTITUTION:The diagnostic device 6 collects and registers the fault information from the first error register 22B of a first error detecting means 22 in a transmission equipment 2 and the error register 42B of a second error detecting means 41 in a reception equipment 4. The device 6, in the case of receiving a fault report from the equipment 2 or 4, fetches a first fault OD1 from the register 22B of the means 22 and a second fault OD2 from the register 42B of the means 41, and judges the coincidence/noncoincidence between both bits of fault information. When the coincidence is obtained as a result of comparison, either the fault information is registered on the first storage area 61, and when it is not obtained, both bits of the fault information are registered on the second storage area 62. In such a manner, it is possible to reduce the quantity of information in fault information and also, to prevent the capacity of fault analysis from being lowered, and to locate the faulty part.

Description

[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a processing device that transfers data using data with an error correction code added to an inter-device interface, and particularly relates to a processing device that transmits fault information when an error is detected in the data. The present invention relates to a failure information collection device configured to efficiently collect information.

[Conventional technology]

Conventionally, information processing devices have attempted to improve reliability by transferring data using error correction codes such as 1-bit error correction and 2-bit error detection. Particularly in large-capacity storage devices, the effect of employing the above-mentioned error correction code is remarkable. Therefore, recently, reliability has been improved by adopting error correction codes not only inside the storage device but also at the interface between the storage device and the central processing unit. be.

When transmitting information under test using an error correction code to an interface between devices in this way, the receiving device performs error detection and error correction, while the transmitting device only performs error detection for the purpose of isolation. There are many things that I did. This is because it is more important to prevent performance degradation due to transfer time delays in the error correction circuit than to improve reliability obtained by performing error correction in the transmitting device.

In the device-to-device interface as described above, a fault information collection device is provided in order to isolate the faulty device when a fault occurs. Such a failure information collection device takes in transmitted data to which check bits have been added, performs an error check on the data, and performs a first error detection function that temporarily stores this as failure information when an error is detected. A second device is configured to take in the data transferred from the transmitting device, perform an error check on the data, and temporarily store this as failure information when an error is detected. A diagnostic device that collects fault information from the first error detecting means of the transmitting device and the second error detecting means of the receiving device and registers the information. It is composed of.

According to such a fault information collection device, it is possible to collect fault information from both the sending device and the receiving device, register this fault information in the storage area of the diagnostic device, and analyze the fault.

[Problem to be solved by the invention]

According to the fault information collection device described above, in order to isolate the faulty device, it is necessary to collect fault information on both the sending side and the receiving side. This has the disadvantage that the area becomes large. Furthermore, the fault information collected by the fault information collecting device is often the same for both the transmitting device and the receiving device, and there is also the disadvantage that the effectiveness is low despite the large amount of information collected.

The present invention has been made to solve the above-mentioned problems, and an object of the present invention is to provide a failure information collection device that can effectively collect failure information.

[Means to solve the problem]

The failure information collection device according to the present invention takes in transmitted data to which check bits have been added, performs an error check on the data, and stores it temporarily as failure information when an error is detected. A transmitting device is equipped with error detection means (1), and the data transferred from the transmitting device is taken in, an error check is performed on the data, and when an error is detected, it is temporarily stored as failure information. The fault information is collected from the receiving device equipped with the second error detecting means in the transmitting device, the first error detecting device of the transmitting device, and the second error detecting device of the receiving device, respectively. In a fault information collection device comprising a diagnostic device to be registered, the diagnostic device takes in fault information from the first error detecting means and fault information from the second error detecting means, and collects these fault information. When the fault information matches, one of the above fault information is registered in the first storage area, and when the fault information does not match, both of the above fault information are registered in the second storage area. This is what I did.

According to the present invention, when the fault information from the sending device and the receiving device match, only one fault information is stored in a predetermined storage area, and otherwise it is stored in another storage area. As a result, the amount of failure information collected can be reduced, and failure analysis ability does not deteriorate. Further, according to the present invention, by storing fault information in sections, it is possible to localize the fault location.

〔Example〕 Next, the present invention will be explained with reference to the drawings.

1 and 2 are for detailed explanation of the present invention.

FIG. 1 is a block diagram showing an embodiment of a failure information collection device according to the present invention.

The embodiment shown in FIG. 1 is constructed as follows. That is, the sending device 2 takes in the memory 21 for writing data with an error correction code added thereto, the data sent from this memory 21 with the check bit added, and performs an error check on the data. The first error detecting means 22 is configured to include a first error detecting means 22 that can temporarily store an error as failure information when an error is detected. The first error detection means 22 takes in data RD and check pins CB from the memory 21 and verifies the first error detection time! 2
2A, and a first error register 22B that stores and holds failure information such as syndrome information SY, error address EA, etc. from the first error detection circuit 22A.

The receiving device 4 takes in data 3, which is the information to be inspected, transferred from the transmitting device 2, performs an error check on the data 3, and when an error is detected, temporarily stores it as fault information. The data error correction circuit 42 corrects data errors using a data correction signal DC from the second error detection means 41. The second error detection means 41 is
Data R of the data to be inspected from the sending device 2
A second error detection circuit 42A takes in D and check bit CB, verifies it, and outputs a data correction signal DCk and syndrome information SY2, and a syndrome t[sY2, error address EA, etc. from the second error detection circuit 42A. and a second error register 42B that stores and holds failure information.

Fault information is collected from the first error register 22B of the first error detection means 22 of the sending device 2 and the second error register 42B of the second error detection means 41 of the receiving device 4 and registered. When the diagnostic device 6 receives a fault report from the transmitting device 2 or the receiving device 4, the diagnostic device 6 transfers the first fault OD from the first error register 22B of the first error detecting device 22 to the second error detecting device. 41 second error registers 42B, determine whether these pieces of fault information match/mismatch, and if they match, one of the above-mentioned pieces of fault information is stored in the first storage area 61. and when these pieces of fault information do not match, both of the pieces of fault information described above are registered in the second storage area 62.

The operation of the embodiment configured in this way is shown in FIGS. 1 and 2.
This will be explained with reference to the figures.

Here, FIG. 2 is a flowchart shown to explain the operation of the same embodiment.

When a failure occurs in the memory 21 in the sending device 2, the first error detection circuit 22A of the first error detection means 22 and the second error detection circuit 4 of the second error detection means 41
2A detects an error (step ■). Then, in the transmitting side device 2, the syndrome information SY from the first error detection circuit 22A is detected in the first error detection means 22.
and error address EAI are stored as failure information in the first error register 22B, and in the receiving device 4, the syndrome information SY2 from the second error detection circuit 42A and the error are stored in the second error detection means 41. The address EA2 is stored in the second error register 42B as fault information (step 2). When the diagnostic device 6 receives a failure report from the transmitting device 2 or the receiving device 4, the diagnostic device 6 records the contents of the first error register 22B in the first error detection means 22 of the transmitting device 2 and the receiving device. The second error register 42 in the second error detection means 41 of 4
Collect the contents of B (step ■). Next, the diagnostic device 6 compares both pieces of collected fault information (step ■).
. In the case of this fault, since the fault information of the contents of the first error register 22B and the contents of the second error register 42B match, the diagnostic device 6 detects the contents of the first error register 22B.
Either the contents of B or the contents of the second error register 42B are stored in the first storage area 61 (step 2), and the collection process is ended.

On the other hand, in the case of a failure in the first error detection circuit 22A of the sending device 2, a failure in the second error detection circuit 42A of the receiving device 4, or a failure in the connection between the sending device 2 and the receiving device 4. In this case, either the first error detection circuit 22A1 of the first error detection means 22 or the second error detection circuit 42A of the second error detection means 41 detects an error (step 2).

Then, the sending device 2 receives the syndrome information SY from the first error detection circuit 22A, and the error address EA.
, and are stored as fault information in the first error register 22B.
Alternatively, in the receiving device 4, the syndrome information SY from the second error detection circuit 42A and the error address EAa are stored as fault information in the second error register 42B (step ①). ). When the diagnostic device 6 receives a failure report from the sending device 2 or the receiving device 4, the diagnostic device 6 records the contents of the first error register 22B of the sending device 2 and the contents of the second error register 42B of the receiving device 4. Collect the contents (Step ■). Next, the diagnostic device 6 compares both pieces of collected fault information (step 2). In this case, the first error register 2
Since the contents of 2B and the contents of the second error register 42B do not match, the diagnostic device 6 saves both the contents of the first error register 22B and the contents of the second error register 42B to the second storage area 62. (Step ■)
, ends the collection process.

The sending device 2 is a storage device (
In the memory 21), most faults detected by an error detection circuit using an error correction code are 1-bit errors in the memory element. In this case, the failure information is registered in the first storage area 61. Since a large amount of such fault information exists, it is important to reduce the amount of fault information.

〔Effect of the invention〕

As explained above, in the case where an error correction code is used in the interface between devices and both devices perform error detection, when the fault information of both devices matches, one of the fault information is registered in the first storage area. However, when there is a mismatch, by storing both pieces of fault information in the second storage area, the amount of fault information can be reduced and the fault analysis ability does not deteriorate. Further, according to the present invention, matching and
By dividing the registration area of fault information according to the result of mismatch, there is an effect that the fault location can be limited.

[Brief explanation of the drawing]

FIG. 1 is a block diagram showing an embodiment of the present invention, and FIG. 2 is a flow chart shown to explain the operation of the embodiment. 2... Sending side device, 4... Receiving side device, 6... Diagnosis device, 22... First error detection means, 41...・・・
- Second error detection means, 61...first storage area, 62...second storage area. NEC Corporation Kofu NEC Co., Ltd. Representative Patent Attorney Umeo Yamauchi

Claims (1)

[Scope of Claims] A first error detection means that takes in transmitted data to which a check bit has been added, performs an error check on the data, and temporarily stores this as fault information when an error is detected. A transmitting device that is equipped with a
a receiving side device that is provided with a second error detection means that performs an error check on the data and temporarily stores the error as failure information when an error is detected; and a first error detection device of the transmitting side device. and a diagnostic device that collects and registers fault information from the second error detecting means of the receiving device, wherein the diagnostic device detects fault information from the first error detecting device. information and failure information from the second error detection means, and when these pieces of failure information match, one of the pieces of said piece of failure information is registered in the first storage area, and when these pieces of failure information do not match, A failure information collecting device characterized in that both of the pieces of failure information are registered in a second storage area.