JPH02107773A - Formation of carbon-based coating film - Google Patents
Formation of carbon-based coating filmInfo
- Publication number
- JPH02107773A JPH02107773A JP26196788A JP26196788A JPH02107773A JP H02107773 A JPH02107773 A JP H02107773A JP 26196788 A JP26196788 A JP 26196788A JP 26196788 A JP26196788 A JP 26196788A JP H02107773 A JPH02107773 A JP H02107773A
- Authority
- JP
- Japan
- Prior art keywords
- bond
- gas
- film
- carbon
- coating film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 229910052799 carbon Inorganic materials 0.000 title claims abstract description 37
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 title claims abstract description 36
- 239000011248 coating agent Substances 0.000 title abstract description 11
- 238000000576 coating method Methods 0.000 title abstract description 11
- 230000015572 biosynthetic process Effects 0.000 title description 2
- 239000007789 gas Substances 0.000 claims abstract description 55
- 229910052757 nitrogen Inorganic materials 0.000 claims abstract description 29
- 238000006243 chemical reaction Methods 0.000 claims abstract description 9
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 54
- 229910052739 hydrogen Inorganic materials 0.000 claims description 16
- 239000001257 hydrogen Substances 0.000 claims description 16
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 14
- 238000004519 manufacturing process Methods 0.000 claims description 6
- 125000001153 fluoro group Chemical group F* 0.000 claims 1
- 229910052731 fluorine Inorganic materials 0.000 abstract description 21
- 230000001681 protective effect Effects 0.000 abstract description 19
- 239000000758 substrate Substances 0.000 abstract description 12
- 230000005611 electricity Effects 0.000 abstract description 9
- 230000003068 static effect Effects 0.000 abstract description 9
- GETQZCLCWQTVFV-UHFFFAOYSA-N trimethylamine Chemical compound CN(C)C GETQZCLCWQTVFV-UHFFFAOYSA-N 0.000 abstract description 3
- ZMANZCXQSJIPKH-UHFFFAOYSA-N Triethylamine Chemical compound CCN(CC)CC ZMANZCXQSJIPKH-UHFFFAOYSA-N 0.000 abstract 1
- 239000008246 gaseous mixture Substances 0.000 abstract 1
- 239000000203 mixture Substances 0.000 abstract 1
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 20
- 239000011737 fluorine Substances 0.000 description 20
- 238000000034 method Methods 0.000 description 14
- 239000010410 layer Substances 0.000 description 13
- 239000002131 composite material Substances 0.000 description 9
- 108091008695 photoreceptors Proteins 0.000 description 9
- 238000010438 heat treatment Methods 0.000 description 7
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 7
- 238000002834 transmittance Methods 0.000 description 5
- 230000007423 decrease Effects 0.000 description 4
- VGGSQFUCUMXWEO-UHFFFAOYSA-N Ethene Chemical compound C=C VGGSQFUCUMXWEO-UHFFFAOYSA-N 0.000 description 3
- 239000004642 Polyimide Substances 0.000 description 3
- 229910021417 amorphous silicon Inorganic materials 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 239000012535 impurity Substances 0.000 description 3
- 229920001721 polyimide Polymers 0.000 description 3
- 239000011241 protective layer Substances 0.000 description 3
- 239000002994 raw material Substances 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 239000005977 Ethylene Substances 0.000 description 2
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 description 2
- 238000005299 abrasion Methods 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 230000001276 controlling effect Effects 0.000 description 2
- 229910003460 diamond Inorganic materials 0.000 description 2
- 239000010432 diamond Substances 0.000 description 2
- 239000000428 dust Substances 0.000 description 2
- 230000005284 excitation Effects 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 229910052736 halogen Inorganic materials 0.000 description 2
- 150000002367 halogens Chemical class 0.000 description 2
- 150000002431 hydrogen Chemical class 0.000 description 2
- 230000031700 light absorption Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 239000004033 plastic Substances 0.000 description 2
- 229920003023 plastic Polymers 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- 229910052711 selenium Inorganic materials 0.000 description 2
- 239000011669 selenium Substances 0.000 description 2
- 239000007779 soft material Substances 0.000 description 2
- TXEYQDLBPFQVAA-UHFFFAOYSA-N tetrafluoromethane Chemical compound FC(F)(F)F TXEYQDLBPFQVAA-UHFFFAOYSA-N 0.000 description 2
- 239000004215 Carbon black (E152) Substances 0.000 description 1
- 101150063042 NR0B1 gene Proteins 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 150000007513 acids Chemical class 0.000 description 1
- -1 alkalis Substances 0.000 description 1
- 238000009835 boiling Methods 0.000 description 1
- 239000012159 carrier gas Substances 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000007872 degassing Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000010891 electric arc Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000010292 electrical insulation Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 229930195733 hydrocarbon Natural products 0.000 description 1
- 150000002430 hydrocarbons Chemical class 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 230000003472 neutralizing effect Effects 0.000 description 1
- 238000010899 nucleation Methods 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 239000003960 organic solvent Substances 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 238000001259 photo etching Methods 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 230000002040 relaxant effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 238000002791 soaking Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
Landscapes
- Photoreceptors In Electrophotography (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
Description
【発明の詳細な説明】
「発明の利用分野」
本発明は、炭素を主成分とする被膜のプラズマCVD中
による作製方法を提供するものであり、その出発材料の
気体として、C−F結合を有する第1の気体およびC−
N結合を有する第2の気体を少なくとも含み、かつプラ
ズマCVD中に−50〜−2000Vのバイアスを被形
成面を有する複合体上に印加しつつ、プラズマCVDを
行う方法に関するものである。DETAILED DESCRIPTION OF THE INVENTION Field of Application of the Invention The present invention provides a method for producing a film containing carbon as a main component during plasma CVD. a first gas having and C-
The present invention relates to a method of performing plasma CVD while applying a bias of -50 to -2000 V to a composite body including at least a second gas having an N bond and having a surface to be formed during plasma CVD.
「従来の技術」
ガラス、金属、プラスチックス、樹脂等の比較的柔らか
い材料の表面を、それら柔らかい材料よりも硬い膜でコ
ーティングすることは、摩耗、ひっかき等の機械的スト
レスに対して有効である。``Prior art'' Coating the surface of relatively soft materials such as glass, metals, plastics, and resins with a film that is harder than those soft materials is effective against mechanical stresses such as abrasion and scratches. .
そのような膜としては、AhCh、TiN、BN、WC
,SiC。Such films include AhCh, TiN, BN, WC.
, SiC.
5iJ4+5lOz等の無機膜および、本発明人の出願
による「炭素被膜を有する複合体」 (昭和56年特許
願第146930号)が知られている。しかしながら、
上記既知の保護膜は、既して電気的に高い抵抗率をもち
、静電気が発生しやすく、雰囲気中のゴミやチリをその
表面に吸着しやすい性質があった。Inorganic films such as 5iJ4+51Oz and "composite with carbon film" filed by the present inventor (Patent Application No. 146930, filed in 1982) are known. however,
The above-mentioned known protective films already have high electrical resistivity, tend to generate static electricity, and tend to attract dirt and dust in the atmosphere to their surfaces.
また、電子写真プロセスに用いられる感光体等のように
積極的に電界をかけ、静電気を利用するような複合材料
に用いた場合などは、電気抵抗の高い保護膜に電荷が蓄
積されてしまい、期待される性能が長期にわたり発揮で
きない問題があった。In addition, when used in composite materials that actively apply an electric field and utilize static electricity, such as photoreceptors used in electrophotographic processes, charges accumulate on the protective film with high electrical resistance. There was a problem that the expected performance could not be achieved for a long period of time.
そのような問題を解決する方法として前記既知膜中に導
電性物質を添加する方法が考えられる。One possible way to solve such problems is to add a conductive substance to the known film.
この場合、添加された導電性物質が光の吸収中心となり
、前記既知の保護膜中での光の吸収が発生して、赤外お
よび可視域での透光性を必要とする応用に適用できなく
なる。In this case, the added conductive substance becomes a light absorption center, and light absorption occurs in the above-mentioned known protective film, making it unsuitable for applications requiring transparency in the infrared and visible ranges. It disappears.
従来かかる方法を実施するため、C2H,とNF:+、
N11ffとの反応を用いて窒素が添加された炭素を主
成分とするプラズマCVD法がある。しかしこの場合、
成膜された膜中には弗素および窒素が添加されるが、こ
れらはN−F結合またはN−)1結合を有しつつも、主
成分である炭素とC−F結合、C−N結合を十分安定し
で構成させることができない。そのためにこの表面に長
時間摩擦を与えた場合、また静電複写機用感光ドラムの
保護層として用いる場合、窒素(N)および弗素(F)
が脱気し、電気抵抗の増加という不良および信頼性の低
下がおきてしまった。このため電気抵抗が、初期におい
ても、また105〜107回もその表面に摩擦を与えて
も、また加熱処理をしても、lXl06〜5X10”Ω
cmの所定の値を安定に有し、かつ、いかなる1元雰囲
気でも安定な物性を有する炭素を主成分とする被膜の作
製方法が求められていた。Conventionally, in order to carry out such a method, C2H, and NF:+,
There is a plasma CVD method that uses carbon as a main component to which nitrogen is added using a reaction with N11ff. But in this case,
Fluorine and nitrogen are added to the formed film, but although they have N-F bonds or N-)1 bonds, they also have C-F bonds and C-N bonds with carbon, which is the main component. cannot be constructed in a sufficiently stable manner. Therefore, when this surface is subjected to long-term friction, or when used as a protective layer for photosensitive drums for electrostatic copying machines, nitrogen (N) and fluorine (F)
degassing, resulting in defects such as increased electrical resistance and decreased reliability. Therefore, the electrical resistance is 1X106~5X10''Ω even at the initial stage, even when friction is applied to the surface 105 to 107 times, and even after heat treatment.
There has been a need for a method for producing a film whose main component is carbon, which stably has a predetermined value of cm and has stable physical properties in any one-component atmosphere.
「発明の構成」
本発明の目的は、以上述べた問題を解決し、保護膜とし
ての耐機械ストレス、静電気に由来する問題点、透明性
を同時に満足ことである。"Structure of the Invention" An object of the present invention is to solve the above-mentioned problems and simultaneously satisfy mechanical stress resistance as a protective film, problems arising from static electricity, and transparency.
そのため、炭素を主成分とする被膜にハロゲン元素であ
る弗素とV価の不純物である窒素、さらに必要に応じて
架橋体としての水素とを0.1〜50原子%添加し、該
C−F結合を有する弗素とC−N結合を有する窒素もし
くはこれらに加えて水素が添加された炭素を主成分とす
る被膜を基体表面に形成する。これに際し、プラズマC
VD法に用いる出発材料としての気体中に、予めC−F
結合を有する第1の気体と、C−N結合を予め有する第
2の気体とを用いる場合、またはこれら第1および第2
の気体と水素またはC−N結合を有する第3の気体とを
用いて成膜するとともに、この成膜中に被形成面を有す
る基体に対し、−50〜−2000Vの自己または外部
からの直流バイアス電圧を印加しつつ実施することを特
徴としている。Therefore, 0.1 to 50 at. A film whose main components are fluorine having a bond, nitrogen having a C--N bond, or carbon to which hydrogen is added in addition to these is formed on the surface of the substrate. At this time, plasma C
C-F is added in advance to the gas as the starting material used in the VD method.
When using a first gas having a bond and a second gas having a C-N bond in advance, or when these first and second gases are used,
and a third gas having a hydrogen or C-N bond, and during film formation, a self- or external direct current of -50 to -2000 V is applied to the substrate having the surface to be formed. It is characterized in that it is carried out while applying a bias voltage.
本発明による複合体に用いるC−F結合を有する炭素の
原料として、CF4.CzF6.C+Fa、C11F3
.CHzFz。CF4. CzF6. C+Fa, C11F3
.. CHzFz.
C113Fより選ばれた少なくとも1種の気体を用いる
。At least one gas selected from C113F is used.
またC−N結合を有する第2の気体としては、N (C
113) 3 、 N (Czlls) 3 、 II
N (C2115) 2. HzN (CII3) 、
IIN (CzL) 211□N(C2115)より
選ばれた第2の気体を用いる。さらにこれらに加えてC
−11結合を有する第3の気体を用いる。即ち既に記し
たC−N結合を有する第1または第2の気体またはこれ
に加えて、C2)14.CI+4(:2H2,C311
a、CzH6より選ばれた少なくとも1種または水素(
11□)であって、これら第1、第2、第3の気体は0
.001〜l Q torrの圧力で気体として提供し
、これらを用いて炭素を主成分とする被膜をプラズマC
VD法で生せしめる。Further, as the second gas having a C-N bond, N (C
113) 3, N (Czlls) 3, II
N (C2115) 2. HzN (CII3),
A second gas selected from IIN (CzL) 211□N (C2115) is used. In addition to these, C
A third gas having -11 bonds is used. That is, C2)14. CI+4(:2H2,C311
a, at least one selected from CzH6 or hydrogen (
11□), and these first, second, and third gases are 0
.. 001~l Q torr as a gas, and use these to form a film containing carbon as the main component.
Produced using the VD method.
本発明による被膜は、以上述べたような原料物質、すな
わちC−F結合を有する炭素原料物質とCN結合を有す
る窒素の原料物質とを同時にプラズマ反応室に導入し、
この時第1の気体と第2の気体との流量を調整すること
によって、被膜中へのC−F結合量およびC−N結合を
有する窒素の添加量を制御することができる。The film according to the present invention can be produced by simultaneously introducing the above-mentioned raw materials, that is, a carbon raw material having a C-F bond and a nitrogen raw material having a CN bond, into a plasma reaction chamber.
At this time, by adjusting the flow rates of the first gas and the second gas, the amount of C--F bonding and the amount of nitrogen having C--N bonding added into the film can be controlled.
本発明方法で作られたC−F結合およびC−N結合の添
加量は、導電率(逆数は比抵抗)、透過率、硬度の違い
として観測される。以下に第1の気体と第2の気体の流
量を変えた時の導電率の変化の実験結果を示す。The added amounts of C--F bonds and C--N bonds created by the method of the present invention are observed as differences in electrical conductivity (reciprocal is specific resistance), transmittance, and hardness. The experimental results of changes in electrical conductivity when the flow rates of the first gas and the second gas are changed are shown below.
第1の気体として弗化炭素、例えばC2F4を用いた。Carbon fluoride, for example C2F4, was used as the first gas.
また第2の気体として、トリメチルアミン(N(CH:
+)z)を用いた。In addition, as a second gas, trimethylamine (N(CH:
+)z) was used.
この気体は、−124°Cにて固体、沸点3.2〜3,
8°C1密度0.6709.300Kにおいて2000
m)Igのペーパープレッシアを有する気体である。This gas is solid at -124°C, boiling point 3.2-3,
2000 at 8°C1 density 0.6709.300K
m) It is a gas having a paper pressure of Ig.
さらに第3の気体としてエチレン(C2114)を用い
た。CzFbの流量11005CC、エチレンの流量1
1005ecとし、ざらにN(Ctl+)zの流量を可
変とした。反応圧力0.1torr 、投入電力密度0
.08W/cm2(50W)とした。第1図に示すよう
にN(C1h)xの量が増すに従い、比抵抗が低くなっ
ている。また、第2因にバイアス電圧とピンカース硬度
との関係を示す。図面において、N(CI+3):lの
’tLfflが増すに従い、ピンカース硬度が小さくな
り、また同じくバイアス電圧を太き(すると大きくなる
。硬度が低下するということは、すなわち、内部応力が
低下することを意味する。Furthermore, ethylene (C2114) was used as a third gas. CzFb flow rate 11005CC, ethylene flow rate 1
1005ec, and the flow rate of N(Ctl+)z was roughly varied. Reaction pressure 0.1 torr, input power density 0
.. 08W/cm2 (50W). As shown in FIG. 1, as the amount of N(C1h)x increases, the specific resistance decreases. Furthermore, the second factor is the relationship between bias voltage and Pinkers hardness. In the drawing, as the 'tLffl of N(CI+3):l increases, the Pinkers hardness decreases, and the bias voltage also increases (as a result, it increases.A decrease in hardness means a decrease in internal stress). means.
以上述べたように、比較的広い範囲にわたって被膜の比
抵抗、硬さ、透過率等を変えることができる。すなわち
種々の応用に要求される最適特性が比較的安価に容易に
得ることができる。As described above, the specific resistance, hardness, transmittance, etc. of the coating can be changed over a relatively wide range. That is, the optimum characteristics required for various applications can be easily obtained at relatively low cost.
またC−F結合とC−N結合またはC−F結合とC−N
結合とC−1!結合を有して弗素と窒素と水素が添加さ
れた炭素を主成分とする被膜は、内部応力が小さいとい
う特徴がある。これは、通常炭素中に存在する未結合手
(ダングリングボンド)には、弗素がターミネートされ
、未結合手の引力を緩和することにより内部応力を低減
させるが、未結合手すべてに弗素または水素がターミネ
ートされるわけではなく、多少の未結合手が膜中に残っ
ており、これが内部応力の原因の1つと考えられる。こ
こに水素よりも反応性の高い弗素が初期気体の状態でC
−F結合を有し、さらに電気的導電性を示すための窒素
も初期気体の状態でC−N結合を有する。Also, a C-F bond and a C-N bond or a C-F bond and a C-N
Bond and C-1! A film whose main component is carbon to which fluorine, nitrogen, and hydrogen are added in a bonded state is characterized by low internal stress. This is because the dangling bonds that normally exist in carbon are terminated with fluorine, reducing the internal stress by relaxing the attractive force of the dangling bonds, but all dangling bonds are terminated with fluorine or hydrogen. is not terminated, and some dangling bonds remain in the film, which is thought to be one of the causes of internal stress. Here, fluorine, which is more reactive than hydrogen, forms C in the initial gas state.
Nitrogen has a -F bond, and nitrogen, which exhibits electrical conductivity, also has a C-N bond in its initial gas state.
このCとNは元素周期表で隣に位置するため単にプラズ
マ中では十分に分解し、それぞれが独立した気体の場合
、安定して炭素と結合することができない。しかしN(
CI+3):lを用いると、N−C結合はすでに有し、
このCthのHとC−F結合を有するFとは互いに結合
してIIFを生じ、残った炭素同士がsp’結合を作り
やすくなる。その結果、初めて価電子制御がなされた炭
素を主成分とする被膜を作り得る。Since C and N are located next to each other in the periodic table of elements, they simply decompose sufficiently in plasma, and if they are independent gases, they cannot stably combine with carbon. However, N(
CI+3): When using l, the N-C bond already has,
The H of Cth and F having a C--F bond combine with each other to form IIF, and the remaining carbons tend to form sp' bonds. As a result, for the first time, it is possible to create a film whose main component is carbon with controlled valence electrons.
弗素と窒素または、弗素と窒素と水素が添加された炭素
を主成分とする被膜は、耐熱性の点においても優れてい
る。A film containing fluorine and nitrogen, or carbon to which fluorine, nitrogen, and hydrogen are added as a main component, is also excellent in terms of heat resistance.
弗素と窒素または弗素と窒素と水素が添加された炭素を
主成分とする被膜は、堆積的の基板の温度が室温から4
50 ’C以下の好ましくは室温〜150°Cの低温で
成膜できることも特徴の1つである。Films mainly composed of fluorine and nitrogen or carbon to which fluorine, nitrogen, and hydrogen are added can be deposited at a substrate temperature ranging from room temperature to 4.
Another feature is that the film can be formed at a low temperature of 50'C or less, preferably room temperature to 150C.
従って、複合体の基体として、プラスチックス、有機感
光樹脂等の有機物、セレン半導体等、高温にできないも
のでも構成することができる。Therefore, the substrate of the composite can be made of materials that cannot be heated to high temperatures, such as plastics, organic materials such as organic photosensitive resins, and selenium semiconductors.
以下図面に従って作製方法を述べる。The manufacturing method will be described below according to the drawings.
第3図は本発明に用いた弗素と窒素または弗素と窒素と
水素が添加された炭素を主成分とする被膜を形成するだ
めのプラズマCVD装置の概要を示す。FIG. 3 shows an outline of a plasma CVD apparatus used in the present invention for forming a film mainly composed of carbon to which fluorine and nitrogen or fluorine, nitrogen, and hydrogen are added.
図面において、ドーピング系(1)において、キャリア
ガスである水素を(2)より、C−F結合を有する第1
の反応性気体である炭化水素気体例えばC2F4を(3
)より、C−N結合を有する気体例えばN(C1h)3
を(4)より、C−11結合を有する気体、例えばC2
114を(5)より、バルブ(6)、流量計(7)をへ
て反応系(8)中にノズル(9)より導入される。この
ノズルに至る前に、反応性気体の励起用にマイクロ波エ
ネルギを00)で加えて予め活性化させることは有効で
ある。In the drawing, in the doping system (1), hydrogen as a carrier gas is transferred from (2) to the first doping system having a C-F bond.
A hydrocarbon gas that is a reactive gas such as C2F4 (3
), a gas having a C-N bond, for example, N(C1h)3
From (4), a gas having a C-11 bond, for example C2
114 is introduced from the nozzle (9) into the reaction system (8) through the valve (6) and the flow meter (7). It is effective to preactivate the reactive gas by applying microwave energy at 00) for excitation of the reactive gas before reaching this nozzle.
反応系(8)には第1の電極(11)、第2の電極(1
2)を設けた。この場合(第1の電極面積/第2の電極
面積)く1の条件を満たすようにした。一対の電極(1
1) 、 (12)間には高周波電源(13)、マツチ
ングトランス(14)、直流バイアス電源(15)より
電気エネルギが加えられ、プラズマが発生する。排気系
(16)は圧力調整バルブ(17)、ターボ分子ポンプ
(18)、ロータリーポンプ09)をへて不要気体を排
気する。反応性気体には、反応空間Q■における圧力が
0.001〜10torr代表的には0.01〜Ito
rrの下で高周波もしくは直流によるエネルギにより0
.05〜IKWのエネルギが加えられる。The reaction system (8) includes a first electrode (11) and a second electrode (1
2) was established. In this case, condition 1 (first electrode area/second electrode area) was satisfied. A pair of electrodes (1
Electrical energy is applied between 1) and (12) from a high frequency power supply (13), a matching transformer (14), and a DC bias power supply (15) to generate plasma. The exhaust system (16) exhausts unnecessary gas through a pressure regulating valve (17), a turbo molecular pump (18), and a rotary pump 09). For the reactive gas, the pressure in the reaction space Q is 0.001 to 10 torr, typically 0.01 to Ito
0 due to energy from high frequency or direct current under rr
.. Energy of 05 to IKW is added.
特に励起源が1GHz以上、例えば2.45Gtlzの
周波数にあっては、C−H結合より水素を分離し、さら
に周波数源が0.1〜50M11z例えば]、33.5
6Ml1の周波数にあってはC−C結合、C−C結合を
分解し、−C−C−結合を作り、炭素の不対結合手同志
を互いに衝突させて共有結合させ、安定なダイヤモンド
構造を局部的に有した構造とさせ得る。In particular, when the excitation source has a frequency of 1 GHz or more, for example 2.45 Gtlz, hydrogen is separated from the C-H bond, and the frequency source is 0.1 to 50 M11z, for example], 33.5
At the frequency of 6Ml1, C-C bonds and C-C bonds are decomposed to create -C-C- bonds, and the unpaired bonds of carbon collide with each other to covalently bond, creating a stable diamond structure. It may have a locally formed structure.
直流バイアスは+200〜−1800Vを実験では加え
る。In experiments, a DC bias of +200 to -1800V is applied.
なぜなら、直流バイアスが零のときは自己バイアスが一
200ν (第2の電極を接地レベルとして)を有して
いるためである。This is because when the DC bias is zero, the self-bias has a value of 1200ν (with the second electrode at ground level).
基板に対してはバイアス電圧が−50〜−2000V好
ましくは−100〜−1000Vにおいて、ビッカース
硬度も大きくさせることができることがわかった。この
バイアス電圧は、単に13.56MIIzの周波数の筒
周波電圧を加え、被形成面を有する基板が直流的に接地
されていたり、また一対の電極の形状異方性を与えるこ
とによる自己バイアスを加えない場合、炭素を主成分と
する被膜ができてもビッカース硬度は300Kg/mm
2以下と、いわゆるDLC(ダイヤモンド状炭素)とし
て成膜することができない。特に電気伝導度を制御する
材料として窒素を用いた場合、このバイアス電圧は成膜
された炭素を主成分とする被膜に安定で高い信頼性を有
せしめるために、きわめて重要な要件である。It has been found that the Vickers hardness can also be increased when the bias voltage for the substrate is -50 to -2000V, preferably -100 to -1000V. This bias voltage is simply applied by applying a cylindrical frequency voltage with a frequency of 13.56 MIIz, and if the substrate having the surface to be formed is DC-grounded, or by adding a self-bias by giving shape anisotropy to the pair of electrodes. If not, the Vickers hardness is 300 kg/mm even if a film containing carbon as the main component is formed.
2 or less, it is impossible to form a film as so-called DLC (diamond-like carbon). Particularly when nitrogen is used as a material for controlling electrical conductivity, this bias voltage is an extremely important requirement in order to ensure that the deposited film containing carbon as its main component is stable and highly reliable.
以上のようにして、プラズマにより被形成面上にC−C
結合を多数形成し7たアモルファス構造または微結晶構
造を有するアモルファス構造のC−F結合を有する弗素
とC−N結合を有する窒素またはこれらに加えてC−1
1結合を有する水素を含んだ炭素を生成させた。この電
磁エネルギは50w〜IKWを供給し、単位面積あたり
0,03〜3W/cfflのプラズマエネルギを加えた
。この弗素と窒素とを予め結合した炭素の透過率は第4
図に示すように600nm以上の波長域では95%以上
の透過であり、400nmでも50%以上透過のほぼ透
明な膜が得られた。また、膜の内部応力は弗素と窒素を
含まない膜に比べて1710以下と非常に小さなもので
あった。酸やアルカリ、有機溶剤等の薬品に室温にて1
時間浸しておいても、その表面を400倍の光学顕微鏡
で観察する限りでは変化は見られず、また、500“C
に加熱した恒温槽(空気)中に1時間放置したものの、
表面に変化が見られず、化学的、熱的に安定な膜を得る
ことができた。As described above, C-C is formed on the surface to be formed by plasma.
Fluorine having a C-F bond and nitrogen having a C-N bond, or in addition to these, C-1
A hydrogen-containing carbon having one bond was produced. This electromagnetic energy was supplied at 50 W to IKW, and plasma energy of 0.03 to 3 W/cffl per unit area was added. The transmittance of carbon in which fluorine and nitrogen are combined in advance is 4th.
As shown in the figure, a nearly transparent film was obtained that had a transmission of 95% or more in a wavelength range of 600 nm or more, and a transmission of 50% or more even at 400 nm. Furthermore, the internal stress of the film was very small, at 1710 or less, compared to a film containing no fluorine or nitrogen. 1 to chemicals such as acids, alkalis, and organic solvents at room temperature.
Even after soaking for hours, no change was observed when observing the surface with an optical microscope at 400x magnification.
Although it was left in a constant temperature bath (air) heated to 1 hour,
No changes were observed on the surface, and a chemically and thermally stable film could be obtained.
特にこの炭素を主成分とする被膜を用いた感光ドラムと
して、これに紙を105〜106枚(A4版)こすって
も、その電気抵抗、透過率に変化がないというきわめて
安定な膜であることがわかった。In particular, as a photosensitive drum using a coating mainly composed of carbon, it is an extremely stable film that does not change its electrical resistance or transmittance even when 105 to 106 sheets of paper (A4 size) are rubbed on it. I understand.
以上述べた作製方法はあくまで一例であり、従来より良
く知られているグロー放電プラズマであっても、アーク
放電プラズマであっても、また、ECR(電子サイクロ
トロン共鳴)を用いたプラズマであってもよい。The above-mentioned production method is just an example, and even if it is a well-known glow discharge plasma, an arc discharge plasma, or a plasma using ECR (electron cyclotron resonance), good.
以下実施例に従って本発明を応用した複合体に一ついて
さらに詳しく述べる。Hereinafter, one composite to which the present invention is applied will be described in more detail according to Examples.
「実施例IJ
電子写真のプロセスに用いられる感光体に、本発明によ
る複合体を応用した場合の例を以下に述べる。``Example IJ'' An example in which the composite according to the present invention is applied to a photoreceptor used in an electrophotographic process will be described below.
第5図は、本発明による炭素を主成分とした被膜を応用
した場合の感光体の構造を示す。約200μm厚さのP
ET シート(1)上に厚さ600人のAl蒸着層(2
)、中間層(3)をはさんで0.6〜1.2μmの電荷
発生層を(4)を設け、本発明による保護膜(6)、約
20μmの電荷移動N(5)を通して光(7)が入射す
ると、前記電荷発生層で吸収され、電子正孔対が生成さ
れる。予め、電荷移動層もしくは保護層を負に帯電させ
ておけば、光入射のあった領域のみ電荷発生層で生成さ
れた正孔が電荷移動層を移動し、帯電された負電荷を中
和させる。この時、電荷発生層で生成された電子は、中
間層を通ってAl蒸着層に達し、排出される。光入射の
なかった領域に残った負電荷は、その後トナーを吸着し
、転写紙に転写されて、光入射の有無に応じた像を転写
紙上に形成することとなる。FIG. 5 shows the structure of a photoreceptor to which a coating mainly composed of carbon according to the present invention is applied. Approximately 200μm thick P
ET sheet (1) with a 600-layer thick Al vapor deposited layer (2
), a charge generation layer (4) of 0.6 to 1.2 μm is provided between the intermediate layer (3), and light ( 7) is absorbed by the charge generation layer to generate electron-hole pairs. If the charge transfer layer or protective layer is negatively charged in advance, holes generated in the charge generation layer move through the charge transfer layer only in the area where light is incident, neutralizing the negative charges. . At this time, electrons generated in the charge generation layer pass through the intermediate layer, reach the Al deposited layer, and are discharged. The negative charge remaining in the area where no light was incident then adsorbs toner and is transferred to the transfer paper, forming an image on the transfer paper depending on whether or not light is incident.
ここで形成された保護層は、本発明を用いたものであり
、N(C)h):+の流■によりその比抵抗を1×10
6〜5 XIO” (Ωcm)好ましくはlXIO3〜
5X10”(Ωcm)に制御されたものである。従って
、比抵抗が低すぎる為に発生する帯電電荷の横方向の移
動がなく、光入射のあった領域の境界はぼけることなく
はっきりとしている。依って、転写された像も鮮明なも
のであった。また、比抵抗が高すぎれば、繰り返し使用
により徐々に保護膜に電荷が蓄積され、使用済のトナー
が除去されなくなり、転写紙が黒くなるという現象が起
こる。The protective layer formed here uses the present invention, and its specific resistance is reduced to 1×10 by the flow of N(C)h):+.
6 to 5 XIO” (Ωcm) preferably lXIO3 to
5 x 10" (Ωcm). Therefore, there is no lateral movement of the electrical charge that occurs due to the specific resistance being too low, and the boundary of the area where the light is incident is clear without blurring. Therefore, the transferred image was also clear.Also, if the resistivity is too high, charges will gradually accumulate on the protective film with repeated use, making it impossible to remove used toner, and the transfer paper will become black. A phenomenon occurs.
本発明による保護膜は、電荷が蓄積されない程度の比抵
抗に制御されているため、そのような現象もなく、C2
114とNF3を用いたものでは2X10’枚の複写で
像なかれがみられたが、本発明方法ではlXl0’〜l
Xl06枚(64版相当)を複写しても像なかれは観察
されず、長期に渡り良質の転写像を得ることができた。Since the protective film according to the present invention has a resistivity controlled to such an extent that no charge is accumulated, such a phenomenon does not occur, and C2
In the method using 114 and NF3, image loss was observed after 2×10' copies, but with the method of the present invention, 1×10' to 1
Even when copying XL06 sheets (equivalent to 64th edition), no image loss was observed, and high-quality transferred images could be obtained for a long period of time.
また、ここで用いた保護膜の透過率は500nm以上の
波長域で80%以上であり、400nm以上の波長域で
60%以上であった。従って、本実用例の感光体は可視
光域においても十分使用可能なものであった。Further, the transmittance of the protective film used here was 80% or more in a wavelength range of 500 nm or more, and 60% or more in a wavelength range of 400 nm or more. Therefore, the photoreceptor of this practical example was sufficiently usable even in the visible light range.
勿論、耐摩耗性、耐引っ播き等の機械的ストレスに対す
る耐久性が向上していることは言うまでもない。Of course, it goes without saying that durability against mechanical stress such as abrasion resistance and seeding resistance is improved.
更に、ここで用いた保護膜は内部応力が低減され密着性
も良いものであった。即ち、シート状怒光体を曲率半径
10mmまで曲げても、保護膜にクランクの発生は見ら
れず、また、ピーリングも生じなかった。Furthermore, the protective film used here had reduced internal stress and good adhesion. That is, even when the sheet-like phosphor was bent to a radius of curvature of 10 mm, no cranking was observed in the protective film, and no peeling occurred.
以上、本実施例では感光体としてシート状有機感光体に
ついて述べたが、ドラム状有機感光体、アモルファスシ
リコン感光体、セレン感光体についても同様に本発明に
よる保護膜を構成することができ、同様の効果が得られ
る。In this embodiment, a sheet-like organic photoreceptor has been described as a photoreceptor, but the protective film according to the present invention can be similarly constructed for a drum-shaped organic photoreceptor, an amorphous silicon photoreceptor, and a selenium photoreceptor. The effect of this can be obtained.
「実施例2」 代表的なサーマルプリントヘッド構造を第6図に示す。"Example 2" A typical thermal print head structure is shown in FIG.
絶縁基板(1)上にグレーズ(2)を形成し、グレーズ
(2)と同時に発熱体部にあたる部分に突起したグレー
ズ(3)を形成し1、次に基板用)上に発熱体(4)と
電気導電体(5)とを順次積層し、その後公知のフォト
リソグラフィー技術を用いて、突起したグレーズの上に
発熱体素子部(21)を形成し、最後に本発明による弗
素と窒素または弗素と窒素と水素をC−F結合、C−N
結合を有して含んだ炭素を主成分とする被膜を保護膜(
6)として形成した。A glaze (2) is formed on an insulating substrate (1), a protruding glaze (3) is formed on the part corresponding to the heating element at the same time as the glaze (2), and then a heating element (4) is formed on the insulating substrate (1). and an electric conductor (5) are sequentially laminated, and then a heating element portion (21) is formed on the protruding glaze using a known photolithography technique, and finally, fluorine and nitrogen or fluorine according to the present invention are laminated. and nitrogen and hydrogen into a C-F bond, C-N
A protective film is a film whose main component is carbon that contains bonds.
6).
通常用いられる保護膜は窒化珪素膜等の無機膜であり、
その膜厚は5μmと大きいものであるが、本実施例で用
いた保護膜(6)は実施例1で形成した保護膜と同様の
特性を有し、N(C1h)zの流量を制御することによ
り、ビッカース硬度2000kg/mm2以上の硬い膜
を形成することができる。そのため、膜厚1μm程度の
被膜で実用に際しては十分である。The protective film usually used is an inorganic film such as a silicon nitride film.
Although the film thickness is as large as 5 μm, the protective film (6) used in this example has the same characteristics as the protective film formed in Example 1, and controls the flow rate of N(C1h)z. By this, a hard film with a Vickers hardness of 2000 kg/mm 2 or more can be formed. Therefore, a coating with a thickness of about 1 μm is sufficient for practical use.
また、本実施例で用いた保護膜は、内部応力が109d
yn/cm”以下と小さく密着性も良好であり、500
°Cにおいて1時間(空気中)の耐熱試験でも良好であ
ることを確認した。Furthermore, the internal stress of the protective film used in this example was 109d.
It has a small size of less than yn/cm" and has good adhesion, and has a
It was confirmed that the heat resistance test for 1 hour (in air) at °C was also good.
さらに、1010Ωcm程度の比抵抗は静電気対策に好
都合であり、傷の発生原因となるゴミや塵を低減でき、
静電気の電子回路に及ぼす影響も低減することができた
。Furthermore, the specific resistance of about 1010 Ωcm is convenient for static electricity countermeasures, reducing dirt and dust that can cause scratches.
The effect of static electricity on electronic circuits was also reduced.
本応用例では既知の発熱体(4)を用いたが、本発明に
よるC−F結合とC−N結合とを含む炭素を主成分とす
る被膜を発熱体として用いることも可能である。即ち、
弗素と窒素の濃度が高くなるような成膜条件で被膜を作
成して、被膜の比抵抗を10’〜104Ωcmにすれば
、この被膜を発熱体として用いることができる。In this application example, a known heating element (4) is used, but it is also possible to use a film mainly composed of carbon containing C--F bonds and C--N bonds according to the present invention as the heating element. That is,
If a film is formed under film-forming conditions that increase the concentration of fluorine and nitrogen, and the specific resistance of the film is set to 10' to 104 Ωcm, this film can be used as a heating element.
「実施例3」
本実施例は、密着型イメージセンサに本発明の炭素を主
成分とする被膜を適用し、第7図に示す構造の炭素を主
成分とする被膜を形成したものである。``Example 3'' In this example, the film containing carbon as the main component of the present invention was applied to a contact type image sensor, and a film containing carbon as the main component having the structure shown in FIG. 7 was formed.
第7図に示すように、透明ガラス基板(33)上に電極
及びアモルファスシリコンを公知のプラズマCVD法を
用いて積層させ、フォトエツチング法により電極及びア
モルファスシリコンの層を加工することにより光センサ
素子(34)を形成させた後、透光性ポリイミド(35
)を公知のスピンナー法で塗布し密着型イメージセンサ
を作製した。その後、上記イメージセンサの透光性ポリ
イミド(35)上に実施例1で述べた方法により、保護
膜(36)を2.0μmの厚さに形成した。As shown in FIG. 7, electrodes and amorphous silicon are laminated on a transparent glass substrate (33) using a known plasma CVD method, and the electrodes and amorphous silicon layer are processed using a photoetching method to form a photosensor element. After forming (34), transparent polyimide (35
) was applied using a known spinner method to fabricate a contact image sensor. Thereafter, a protective film (36) with a thickness of 2.0 μm was formed on the transparent polyimide (35) of the image sensor by the method described in Example 1.
前記保護膜のピンカース硬度を測定したところ2500
Kg/mm2であり、また比抵抗ばlXl0”0cmで
あった。形成された炭素被膜は、被形成面上と表面とに
ダイヤモンド類似の硬さと静電気対策にとって適度な電
気絶縁性とを有しているため、原稿面上の凹凸やホチキ
スの金具等により上記の層に傷が付くこともなく、また
原稿と保護膜との間の摩擦により静電気が生じても、静
電気の蓄積を防ぐことができた。また光センサー素子へ
の電気的影響を抑えると共に、透光性ポリイミド中の不
純物が混入することを防止できた。The Pinkers hardness of the protective film was measured and was 2500.
Kg/mm2, and the specific resistance was 1X10"0 cm.The formed carbon film had a hardness similar to that of diamond on the surface on which it was formed and on the surface, and an appropriate electrical insulation property as a countermeasure against static electricity. This prevents the above layer from being scratched by irregularities on the document surface or stapler metal fittings, and prevents static electricity from accumulating even if static electricity is generated due to friction between the document and the protective film. In addition, it was possible to suppress the electrical influence on the optical sensor element and to prevent the contamination of impurities in the translucent polyimide.
「効果J
以上述べたように、本発明はC−F結合とC−N結合ま
たはこれらに加えてC−11結合を有する炭素を主成分
とする被膜を有する複合体であり、該被膜は弗素の添加
量により排水性表面とし、窒素の添加量によって比抵抗
を制御することにより、容易にしかも安価に該被膜の排
水性または親水性の程度、硬度、透光性、比抵抗を変化
させることができ、加えて該被膜の内部応力は小さく、
密着性の良いものである。"Effect J" As stated above, the present invention is a composite having a film mainly composed of carbon having a C-F bond, a C-N bond, or a C-11 bond in addition to these, and the film contains fluorine. The degree of drainage or hydrophilicity, hardness, translucency, and resistivity of the film can be easily and inexpensively changed by making the surface water-drainable by adjusting the amount of nitrogen added and by controlling the resistivity by changing the amount of nitrogen added. In addition, the internal stress of the coating is small.
It has good adhesion.
本発明によるハロゲン元素と窒素または水素とハロゲン
元素と窒素が添加された炭素を主成分とする被膜を応用
した複合体において、実施例に述べた通り、本発明にお
いては、C−N結合を有する気体の使用量がNll:l
、NF:lを用いる場合の約1/20で同じ比抵抗を作
ることができ、イオン化率(・活性不純物量/添加した
不純物量)も20倍も大きい。As described in the examples, in the present invention, in the composite to which a film mainly composed of carbon to which a halogen element and nitrogen or hydrogen, a halogen element, and nitrogen are added is applied, in the present invention, a film having a C-N bond is applied. The amount of gas used is Nll:l
, NF:l can be used at about 1/20th the same specific resistance, and the ionization rate (amount of active impurities/amount of added impurities) is also 20 times higher.
そして炭素を主成分とする被膜を適用しなかった場合に
比べ、該複合体の寿命および信頼性を格段に向上させる
ことができた。Moreover, compared to the case where a film containing carbon as a main component was not applied, the life span and reliability of the composite could be significantly improved.
本発明方法は第3図に示したプラズマCVD装置に限定
されることはない。重要なことは、初期状態において、
C−F結合およびC−N結合を有する気体を用いること
および負の直流バイアスを基板に自動的または人為的に
加えること、さらにこれに加えてC−11結合またはi
tを同時に添加することである。またプラズマCvD中
は0.001〜1Qtor八好第
図
ハ゛イアス電玩(V)(相数Q烙)
カ紀−Jt、(*v)
x升1図
第3図
第
図The method of the present invention is not limited to the plasma CVD apparatus shown in FIG. The important thing is that in the initial state,
By using a gas having C-F bonds and C-N bonds and by applying a negative DC bias to the substrate automatically or artificially, in addition to this, C-11 bonds or i
t is added at the same time. Also, during plasma CvD, 0.001 to 1Qtor Yayoshi Diagram Hias Electric Toy (V) (Phase Number Q Heat) Kaki-Jt, (*v) x square 1 Figure 3 Figure
Claims (2)
有する第2の気体または前記第1および第2の気体に加
えて水素またはC−H結合を有する第3の気体を混合せ
しめ、−50〜−2000Vの自己バイアスまたは外部
バイアスを印加しつつプラズマ化学反応をせしめること
により、被形成面上に窒素と弗素がC−N結合およびC
−F結合を有して添加された炭素を主成分とする被膜を
形成することを特徴とする炭素を主成分とする被膜の作
製方法。1. Mixing a first gas having a C-F bond and a second gas having a C-N bond or a third gas having hydrogen or a C-H bond in addition to the first and second gases, By causing a plasma chemical reaction while applying a self-bias or an external bias of -50 to -2000V, nitrogen and fluorine form C-N bonds and C-N bonds on the surface to be formed.
A method for producing a film mainly composed of carbon, which comprises forming a film mainly composed of carbon added with a -F bond.
する第1の気体は、CF_4,C_2F_6C_3F_
8,CHF_3,CH_2F_2,CH_3Fより選ば
れた少なくとも1種の気体、C−N結合を有する第2の
気体はN(CH_3)_3,N(C_2H_5)_3,
HN(CH_3)_2,H_2N(CH_3),NH(
C_2H_5)_2,H_2N(C_2H_5)より選
ばれた少なくとも1種の気体、また、水素(H_2)ま
たはC−H結合を有する気体は前記第1または第2の気
体であって、かつC−H結合を有する気体またはC_2
H_4,CH_4,C_2H_2,C_3H_8より選
ばれた第3の気体よりなり、圧力0.001〜10to
rrにおいて気体状態を呈する気体よりなることを特徴
とする炭素を主成分とする被膜の作製方法。2. In claim 1, the first gas having a C-F bond is CF_4, C_2F_6C_3F_
8, at least one gas selected from CHF_3, CH_2F_2, CH_3F, the second gas having a C-N bond is N(CH_3)_3, N(C_2H_5)_3,
HN(CH_3)_2, H_2N(CH_3), NH(
At least one gas selected from C_2H_5)_2, H_2N (C_2H_5), and the gas having hydrogen (H_2) or a C-H bond is the first or second gas, and the gas having a C-H bond or C_2
Consists of a third gas selected from H_4, CH_4, C_2H_2, C_3H_8, pressure 0.001 to 10 to
A method for producing a film mainly composed of carbon, characterized in that it is made of a gas that exhibits a gaseous state at rr.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP26196788A JPH0623433B2 (en) | 1988-10-17 | 1988-10-17 | Method for producing carbon-based coating |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP26196788A JPH0623433B2 (en) | 1988-10-17 | 1988-10-17 | Method for producing carbon-based coating |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH02107773A true JPH02107773A (en) | 1990-04-19 |
| JPH0623433B2 JPH0623433B2 (en) | 1994-03-30 |
Family
ID=17369145
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP26196788A Expired - Lifetime JPH0623433B2 (en) | 1988-10-17 | 1988-10-17 | Method for producing carbon-based coating |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0623433B2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04330456A (en) * | 1990-09-25 | 1992-11-18 | Semiconductor Energy Lab Co Ltd | Copying device |
| CN106906456A (en) * | 2017-01-23 | 2017-06-30 | 无锡荣坚五金工具有限公司 | A kind of preparation method of the controllable coating of the degree of cross linking |
-
1988
- 1988-10-17 JP JP26196788A patent/JPH0623433B2/en not_active Expired - Lifetime
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04330456A (en) * | 1990-09-25 | 1992-11-18 | Semiconductor Energy Lab Co Ltd | Copying device |
| CN106906456A (en) * | 2017-01-23 | 2017-06-30 | 无锡荣坚五金工具有限公司 | A kind of preparation method of the controllable coating of the degree of cross linking |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0623433B2 (en) | 1994-03-30 |
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