JPH02120231A - Production of superconducting thin film of oxide - Google Patents
Production of superconducting thin film of oxideInfo
- Publication number
- JPH02120231A JPH02120231A JP63272209A JP27220988A JPH02120231A JP H02120231 A JPH02120231 A JP H02120231A JP 63272209 A JP63272209 A JP 63272209A JP 27220988 A JP27220988 A JP 27220988A JP H02120231 A JPH02120231 A JP H02120231A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- cuo
- film
- thin film
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000010409 thin film Substances 0.000 title claims abstract description 21
- 238000004519 manufacturing process Methods 0.000 title claims description 12
- 239000000758 substrate Substances 0.000 claims abstract description 23
- 238000000034 method Methods 0.000 claims abstract description 20
- 239000010408 film Substances 0.000 claims description 51
- 230000015572 biosynthetic process Effects 0.000 claims description 13
- 238000001659 ion-beam spectroscopy Methods 0.000 claims description 6
- 230000008569 process Effects 0.000 claims description 6
- 229910000416 bismuth oxide Inorganic materials 0.000 claims description 4
- TYIXMATWDRGMPF-UHFFFAOYSA-N dibismuth;oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Bi+3].[Bi+3] TYIXMATWDRGMPF-UHFFFAOYSA-N 0.000 claims description 4
- 239000013078 crystal Substances 0.000 abstract description 16
- WMWLMWRWZQELOS-UHFFFAOYSA-N bismuth(iii) oxide Chemical compound O=[Bi]O[Bi]=O WMWLMWRWZQELOS-UHFFFAOYSA-N 0.000 abstract description 10
- 239000002887 superconductor Substances 0.000 abstract description 9
- 230000000737 periodic effect Effects 0.000 abstract description 7
- 238000004544 sputter deposition Methods 0.000 abstract description 5
- 229910052760 oxygen Inorganic materials 0.000 description 14
- 239000001301 oxygen Substances 0.000 description 13
- QPLDLSVMHZLSFG-UHFFFAOYSA-N Copper oxide Chemical compound [Cu]=O QPLDLSVMHZLSFG-UHFFFAOYSA-N 0.000 description 10
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 7
- 150000002500 ions Chemical class 0.000 description 7
- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 description 7
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 6
- 239000000395 magnesium oxide Substances 0.000 description 6
- AXZKOIWUVFPNLO-UHFFFAOYSA-N magnesium;oxygen(2-) Chemical compound [O-2].[Mg+2] AXZKOIWUVFPNLO-UHFFFAOYSA-N 0.000 description 6
- -1 oxygen ions Chemical class 0.000 description 6
- MYMOFIZGZYHOMD-UHFFFAOYSA-N Dioxygen Chemical compound O=O MYMOFIZGZYHOMD-UHFFFAOYSA-N 0.000 description 5
- 239000011575 calcium Substances 0.000 description 5
- 229910001882 dioxygen Inorganic materials 0.000 description 5
- 239000002245 particle Substances 0.000 description 5
- 239000010949 copper Substances 0.000 description 4
- 239000007788 liquid Substances 0.000 description 4
- 238000002441 X-ray diffraction Methods 0.000 description 3
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 3
- 229910052791 calcium Inorganic materials 0.000 description 3
- 229910052802 copper Inorganic materials 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 229910052757 nitrogen Inorganic materials 0.000 description 3
- 230000003647 oxidation Effects 0.000 description 3
- 238000007254 oxidation reaction Methods 0.000 description 3
- ODINCKMPIJJUCX-UHFFFAOYSA-N Calcium oxide Chemical compound [Ca]=O ODINCKMPIJJUCX-UHFFFAOYSA-N 0.000 description 2
- 229910003808 Sr-Cu Inorganic materials 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000006872 improvement Effects 0.000 description 2
- 230000001678 irradiating effect Effects 0.000 description 2
- 230000005012 migration Effects 0.000 description 2
- 238000013508 migration Methods 0.000 description 2
- 229910052712 strontium Inorganic materials 0.000 description 2
- 230000002194 synthesizing effect Effects 0.000 description 2
- 229910014454 Ca-Cu Inorganic materials 0.000 description 1
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229910002480 Cu-O Inorganic materials 0.000 description 1
- 238000005513 bias potential Methods 0.000 description 1
- 229910052797 bismuth Inorganic materials 0.000 description 1
- 230000003139 buffering effect Effects 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000002425 crystallisation Methods 0.000 description 1
- 230000008025 crystallization Effects 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000002003 electron diffraction Methods 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000001747 exhibiting effect Effects 0.000 description 1
- 229910010272 inorganic material Inorganic materials 0.000 description 1
- 239000011147 inorganic material Substances 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 230000005389 magnetism Effects 0.000 description 1
- 238000001755 magnetron sputter deposition Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 229910002076 stabilized zirconia Inorganic materials 0.000 description 1
- CIOAGBVUUVVLOB-UHFFFAOYSA-N strontium atom Chemical compound [Sr] CIOAGBVUUVVLOB-UHFFFAOYSA-N 0.000 description 1
- VEALVRVVWBQVSL-UHFFFAOYSA-N strontium titanate Chemical compound [Sr+2].[O-][Ti]([O-])=O VEALVRVVWBQVSL-UHFFFAOYSA-N 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 229910052727 yttrium Inorganic materials 0.000 description 1
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E40/00—Technologies for an efficient electrical power generation, transmission or distribution
- Y02E40/60—Superconducting electric elements or equipment; Power systems integrating superconducting elements or equipment
Landscapes
- Inorganic Compounds Of Heavy Metals (AREA)
- Superconductors And Manufacturing Methods Therefor (AREA)
Abstract
Description
【発明の詳細な説明】
(産業上の利用分野)
本発明は酸化物超伝導薄膜の製造方法に関するものであ
る。DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a method for producing an oxide superconducting thin film.
(従来の技術)
超伝導性薄膜は、ジョセフソン接合による量子磁気干渉
素子や、超伝導LSI配線、さらに超伝導能動素子等へ
の応用上欠かせないものである。近年、1982年2月
米国ヒユーストン大学のチュー(Chu)らにより発見
された臨界温度90に級のY系酸化物超伝導体を始めと
し、無機材料研究所の前出らによる臨界温度110に級
のBi系酸化物超伝導体、さらに米国アーカンザス大学
のチェノ(Z、 Z、 Cheng)らによる臨界温度
12Oに級のTI系酸化物超伝導体と液体窒素温度を越
える臨界温度を持つ酸化物超伝導体が相次いで発見され
た。このことにより、従来液体Heを用いなければなら
なかった超伝導応用デバイスが液体窒素で実現できるこ
とになり、特にこれら酸化物超伝導体の薄膜化は液体窒
素温度以上で動くジョセフソン接合による量子磁気干渉
素子や、超伝導LSI配線、さらに超伝導能動素子等を
実現し、その応用は広く利用され得る。さて、Bi系超
超伝導体薄膜、従来基本的に次の3つの方法において製
造されてきた。(Prior Art) Superconducting thin films are indispensable for applications such as quantum magnetic interference devices using Josephson junctions, superconducting LSI wiring, and superconducting active devices. In recent years, starting with the Y-based oxide superconductor with a critical temperature of 90 degrees discovered by Chu et al. of Hughston University in the United States in February 1982, and the critical temperature of 110 degrees discovered by the aforementioned researchers of the Inorganic Materials Research Institute. Bi-based oxide superconductors, as well as TI-based oxide superconductors with critical temperatures of 12O and oxides with critical temperatures exceeding liquid nitrogen temperatures, developed by Z, Z, Cheng et al. of the University of Arkansas in the United States. Superconductors were discovered one after another. As a result, superconducting application devices that conventionally had to use liquid He can now be realized using liquid nitrogen, and in particular, the thinning of these oxide superconductors is due to quantum magnetism due to Josephson junctions that operate above the liquid nitrogen temperature. Interference elements, superconducting LSI wiring, superconducting active elements, etc. have been realized, and their applications can be widely used. Now, Bi-based superconductor thin films have conventionally been produced basically by the following three methods.
第一の方法は、例えばアプライドフィジックスレター(
Appl、 Phys、 Lett、)巻53.427
頁のようにマグネトロンスパッタ法を用い、Bi、 S
r、 Ca、 Cuの組成からなる単一ターゲットを用
いて成膜を行い、この膜を後から酸素中880°C熱処
理を加えることにより83にでゼロ抵抗を示すC軸配向
膜が得られている。The first method is, for example, Applied Physics Letter (
Appl, Phys, Lett,) Volume 53.427
Using the magnetron sputtering method as shown in
By forming a film using a single target consisting of R, Ca, and Cu, and then heat-treating this film at 880°C in oxygen, a C-axis oriented film exhibiting zero resistance was obtained in 83. There is.
また第二の方法としては例えばアプライドフィジックス
レター(Appl、 Phys、 Lett、)巻53
.337頁のようにパルスレーザ−を用い、第一の方法
と同様単一ターゲットを用いて成膜を行い、後に875
°Cの酸素中熱処理を行うことで80にの超伝導薄膜を
得ている。The second method is, for example, Applied Physics Letters (Appl, Phys, Lett,) Vol. 53.
.. As shown on page 337, film formation was performed using a pulsed laser and a single target as in the first method, and later on 875
A superconducting thin film of 80 °C was obtained by heat treatment in oxygen at 80 °C.
さらに第三の方法としては、例えば、アプライドフィジ
ックスレター(Appl、 Phys、 Lett、)
巻53.624頁のようにBi、 Sr、 Ca、 C
uをそれぞれ独立した蒸着源から同時に蒸発させ、成膜
後860°Cの酸素中熱処理をおこなうことで、35に
でゼロ抵抗超伝導膜を得ている。Furthermore, as a third method, for example, Applied Physics Letter (Appl, Phys, Lett,)
Bi, Sr, Ca, C as in Volume 53, page 624
A zero-resistance superconducting film was obtained in 35 by simultaneously evaporating u from independent vapor deposition sources and performing heat treatment in oxygen at 860°C after film formation.
(発明が解決しようとした課題)
しかし、いずれの場合も従来の超伝導膜製造法では超伝
導膜を作るために850°C以上の高温熱処理が必要な
こと、また、膜はC軸配向しているものの表面が荒れて
いること、及び超伝導のオンセットは110Kに見えて
いるものの、最終的なゼロ抵抗温度が低いこと等の理由
により、デバイス応用を困難にしている。また、ジョセ
フソンジャンクションの均質性を高めるためには単結晶
膜であることが望ましい。(Problem that the invention sought to solve) However, in both cases, the conventional superconducting film manufacturing method requires high-temperature heat treatment of 850°C or higher to create a superconducting film, and the film is C-axis oriented. The surface of the material is rough, and although the onset of superconductivity appears to be 110 K, the final zero resistance temperature is low, making device application difficult. Further, in order to improve the homogeneity of the Josephson junction, it is desirable to use a single crystal film.
本発明の目的は、この酸化物超伝導薄膜を、基板上に単
結晶膜として低温で合成する方法を提供することにある
。An object of the present invention is to provide a method for synthesizing this oxide superconducting thin film as a single crystal film on a substrate at a low temperature.
(課題を解決するための手段)
本発明は、ターゲットとしてBi2O3,SrO,Ca
b。(Means for Solving the Problems) The present invention uses Bi2O3, SrO, and Ca as targets.
b.
CuOの4種類のターゲットをもちい、イオンビームス
パッタ法により酸化物超伝導薄膜を製造する方法であっ
て、前記ターゲットをB12O3r SrOとCub。A method of manufacturing an oxide superconducting thin film by ion beam sputtering using four types of CuO targets, the targets being B12O3r SrO and Cub.
CaOとCuO、 CaOとCuO、 SrOとCuO
+ B12O3の順に用いてイオンビームスパッタする
ことにより周期的に層状成長させることを特徴とした酸
化物超伝導薄膜の製造方法と、ターゲットとして酸化ビ
スマスの代りに(Bi2O3)1−x(PbO)x(た
だし0<x≦0.1)の組成を用いる前記酸化物超伝導
薄膜の製造方法と、成膜プロセス中に真空中容器内に高
周波(RF)を導入する前記酸化物超伝導薄膜の製造方
法である。CaO and CuO, CaO and CuO, SrO and CuO
A method for manufacturing an oxide superconducting thin film characterized by periodic layered growth by ion beam sputtering using +B12O3 in this order, and (Bi2O3)1-x(PbO)x instead of bismuth oxide as a target. (However, 0<x≦0.1) A method for producing the oxide superconducting thin film, and a method for producing the oxide superconducting thin film by introducing radio frequency (RF) into a vacuum container during the film formation process. It's a method.
本方法では、Bi系酸化物超伝導体の結晶構造に特有の
C軸方向に(Bi−0)2原子層/(Sr−Ca−Cu
−0)ペロブスカイト型層/(Bi−0)2原子層・・
・の周期構造を人工的に積層成長させるもので、例えば
Bii110に超伝導相を(Bi−0層→(Sr−Cu
−01m −+(Ca−Cu−0翔−(Ca−Cu−0
)層−+(SrCu・O)層−+(Bi−0)層→順に
、また80に超伝導相の場合は(Bi−0)層、 (S
r−Cu・O)層、(Ca−Cu−O)層。In this method, two atomic layers of (Bi-0)/(Sr-Ca-Cu
-0) Perovskite type layer/(Bi-0) two atomic layer...
・A periodic structure is artificially layered and grown, for example, a superconducting phase (Bi-0 layer → (Sr-Cu
-01m -+(Ca-Cu-0 sho-(Ca-Cu-0
) layer - + (SrCu.O) layer - + (Bi-0) layer → in order, and in the case of superconducting phase at 80, (Bi-0) layer, (S
r-Cu.O) layer, (Ca-Cu-O) layer.
(Sr−Cu・0)層、 (Bi・0)層の順に4種類
のターゲットを順次組み合せて周期的にスパッタするこ
とでBi系超伝導体単結晶薄膜を積層成長させる方法で
ある。This is a method for growing a Bi-based superconductor single crystal thin film in a layered manner by sequentially combining four types of targets in the order of (Sr-Cu.0) layer and (Bi.0) layer and sputtering them periodically.
各層の積層膜圧は(Bi−0)層5人、(Sr−Ca、
Cu、O)層は総計でBi系の80に相の場合で10人
、110に相の場合には13人積層する。望ましい条件
として基板温度を500°C〜800°C1基板上の酸
素ガス分圧を2×10’Torr以上に保つと、エピタ
キシャル成長したBi系酸化物超伝導薄膜が合成される
。この時各積層プロセスの間に10秒以上の緩和時間を
設けることが望ましく、この間に表面のスパッタ粒子の
マイグレーションと積層膜の結晶性の改質が起こる。さ
らに、酸化ビスマス、またはストロンチウム、カルシウ
ム・銅酸化物は基板上にヘテロエピタキシャル成長させ
ることができ、エピタキシャル層を初期に約10〜10
0人程度成長させることによりその後の膜成長プロセス
により単結晶のBi系酸化物超伝導薄膜が成長する。さ
らに真空チャンバー内にRFを導入することでスパッタ
粒子を活性化し膜の結晶化温度を下げることができると
共に酸素もイオン化されることにより各構成元素の酸化
が促進される。さらにRFもしくは酸素イオン源より生
成された酸素イオンをIOV〜80vに加速して膜成長
面に照射することにより膜成長面での酸化とマイグレー
ションが促進され膜の結晶性の改善と膜表面の平脂性化
がよくなる。さらにBiの一部をpbで置換することに
より超伝導特性が改善され転移がシャープになる。これ
らのエピタキシャル膜は酸化マグネシウム(MgO)単
結晶、チタン酸ストロンチウム(SrTiO3)単結晶
、イツトリウム安定化ジルコニア(ysz)単結晶、ジ
ルコニア(Zr02)単結晶いずれの基板上にも合成す
ることができる。The laminated film thickness of each layer is (Bi-0) 5 layers, (Sr-Ca,
Cu, O) layers are laminated by a total of 10 people in the case of Bi-based 80 phase, and 13 people in the case of 110 phase. As desirable conditions, if the substrate temperature is maintained at 500° C. to 800° C. and the oxygen gas partial pressure on the substrate is maintained at 2×10’ Torr or more, an epitaxially grown Bi-based oxide superconducting thin film is synthesized. At this time, it is desirable to provide a relaxation time of 10 seconds or more between each lamination process, during which time migration of sputtered particles on the surface and modification of the crystallinity of the laminated film occur. Additionally, bismuth oxide, or strontium, calcium and copper oxides can be grown heteroepitaxially on the substrate, forming an initial epitaxial layer of about 10 to 10
By growing about 0, a single-crystal Bi-based oxide superconducting thin film is grown in the subsequent film growth process. Furthermore, by introducing RF into the vacuum chamber, sputtered particles can be activated and the crystallization temperature of the film can be lowered, and oxygen is also ionized, thereby promoting oxidation of each constituent element. Furthermore, by accelerating oxygen ions generated from RF or an oxygen ion source to IOV ~ 80v and irradiating the film growth surface, oxidation and migration on the film growth surface are promoted, improving the crystallinity of the film and flattening the film surface. Improves oiliness. Furthermore, by substituting part of Bi with Pb, the superconducting properties are improved and the transition becomes sharper. These epitaxial films can be synthesized on any substrate of magnesium oxide (MgO) single crystal, strontium titanate (SrTiO3) single crystal, yttrium stabilized zirconia (ysz) single crystal, or zirconia (Zr02) single crystal.
(実施例)
多層周期構造薄膜を製造するために用いたイオンビーム
スパッタ装置を第1図に示す。第1図(a)は装置の正
面図であり、真空チャンバー12には4基のカウフマン
型イオン源1.2.16.17を装備し、それぞれBi
2O3ターゲット3、SrOターゲット4、CaOター
ゲット18、CuOターゲット19をスパッタする。ス
パッタされた粒子3’、 4’は天板5で発散視野が制
限され、4基の水晶振動子膜厚計(第1図(a)では1
5)により膜厚をモニターしながら、真空チャンバー外
部から駆動される4基のシャッター(第1図(a)では
6,7)の交互開閉により多層周期構造が形成される。(Example) FIG. 1 shows an ion beam sputtering apparatus used to manufacture a multilayer periodic structure thin film. FIG. 1(a) is a front view of the apparatus, in which the vacuum chamber 12 is equipped with four Kaufmann type ion sources 1, 2, 16, and 17, each with Bi
A 2O3 target 3, a SrO target 4, a CaO target 18, and a CuO target 19 are sputtered. The sputtered particles 3', 4' have a divergent field of view restricted by the top plate 5, and are measured by four crystal oscillator film thickness gauges (1 in Fig. 1(a)).
While monitoring the film thickness using step 5), a multilayer periodic structure is formed by alternately opening and closing four shutters (6 and 7 in FIG. 1(a)) driven from outside the vacuum chamber.
9はヒータ、13はRHEED用電子銃、14はRHE
EDスクリーンである。この時チャンバー内の真空度は
4X10 torr、基板付近は酸化促進のために酸
素ガスを吹き付は局部的に2X10 torrの酸素
分圧とした。基板温度は62O°Cとし、基板面内の膜
厚分布を極力避けるように60rpmの回転を与えてい
る。チャンバー内は、ニュートラライザでイオン源から
でるArを中和している。イオン源1の出力を600v
、30mAとした時にBi2O3の成膜速度は0.2A
/5ee−cあり、イオン源2.16 (7)出力を6
00V 。9 is a heater, 13 is an electron gun for RHEED, 14 is RHE
This is the ED screen. At this time, the degree of vacuum in the chamber was 4×10 torr, and oxygen gas was blown locally near the substrate to promote oxidation at an oxygen partial pressure of 2×10 torr. The substrate temperature was 620° C., and the substrate was rotated at 60 rpm to avoid film thickness distribution within the substrate surface as much as possible. Inside the chamber, a neutralizer neutralizes Ar emitted from the ion source. Ion source 1 output 600v
, the film formation rate of Bi2O3 is 0.2A when it is 30mA.
/5ee-c available, ion source 2.16 (7) Output 6
00V.
40mAとした時のSrO,CaOの成膜速度はともに
0.181/sec テあった。イオン源17ノ出力を
600V、30mAとした時にCuOの成膜速度は0.
2A/secであった。The film formation rates of both SrO and CaO at 40 mA were 0.181/sec. When the output of the ion source 17 was 600V and 30mA, the CuO film formation rate was 0.
It was 2A/sec.
次にMg0(100)基板を用いたBi系110に超伝
導相の成膜例を示す。基板温度62O’C1基板付近の
酸素ガス分圧I X 10 Torrの条件で周期長
36人の膜を成膜中RHEEDパターンで確認しながら
形成した。MgO基板上に例えば5rCuOを成長させ
るとMgOの基板方位と一致させてバッファー層として
の5uCuOがヘテロエピタキシャルする。この場合の
5rCuO層は10人である。ヘテロエピタキシャル層
成膜後4分間の緩衝時間の後BiOを6人エピタキシャ
ル成長させる。さらに2分間の緩衝時間を経て、SrO
,CuOをそれぞれ同時に2人ずつ、緩衝時間2分、C
ab、 CuOをそれぞれ同時に4人、2人ずつ、緩衝
時間2分、SrOCuOをそれぞれ同時に2人ずつSr
Oを2人、緩衝時間2分、BiOを6人、緩衝時間2分
、の設定で周期的積層成膜を繰り返す。Next, an example of film formation of a superconducting phase in Bi-based 110 using an Mg0 (100) substrate will be shown. A film with a period length of 36 was formed under conditions of a substrate temperature of 62 O'C1 and an oxygen gas partial pressure of I.times.10 Torr while checking the RHEED pattern during film formation. For example, when 5rCuO is grown on an MgO substrate, the 5uCuO as a buffer layer is heteroepitaxially aligned with the orientation of the MgO substrate. In this case, there are 10 5rCuO layers. After a buffer time of 4 minutes after the formation of the heteroepitaxial layer, BiO is epitaxially grown by 6 people. After an additional 2 minutes of buffering time, SrO
, CuO by two people at the same time, buffer time 2 minutes, C
ab, CuO was treated by 4 people at the same time, 2 people at a time for 2 minutes, and SrOCuO was treated by 2 people at the same time.
Periodic layered film formation was repeated under the following settings: 2 people using O, 2 minutes of buffer time, 6 people using BiO, 2 minutes of buffer time.
ここで、同時スパッタを実行するときはそれぞれのイオ
ンソースの出力を調整してスパッタ終了時間が同時にな
るように調整している。また、設定値をBi系110に
超伝導相の周期長よりも長くしているのはスパッタ粒子
の膜面への付着確率を考慮しているからである。Here, when performing simultaneous sputtering, the output of each ion source is adjusted so that the sputtering end times are the same. Furthermore, the reason why the set value is set longer than the periodic length of the superconducting phase in the Bi system 110 is to take into account the probability of adhesion of sputtered particles to the film surface.
RHEEDの回折スポットはストリーク状になり膜表面
の平坦性が良好であること、さらにエピタキシャル成長
が持続していることがわかる。この人工的周期長18人
を15回繰り返し総膜厚300人の時の膜のX線回折パ
ターンを第2図に示す。このX線回折パターンより、設
計値通りに36人(18人×2)のBi系超伝導体の1
10に層がきれいにC軸配向してできていることが分か
る。この膜の電気抵抗は、110Kにオンセットを持ち
107にで超伝導となることが確認された。以上はBi
系110に相の極薄エピタキシャル超伝導性薄膜の合成
方法の1例であるが、第1表にこれ以外の成膜結果を示
す。同様の手段において、(Bi−0)層を6人、(S
r−CaCu−0)層を10人と設定することによりB
i系80に超伝導相の膜も容易に作製できた。また、バ
ッファー層としてBiOを用いることも可能であり、前
述のプロセスを行うことで単結晶膜を合成することがで
きた。The RHEED diffraction spots are streak-like, indicating that the film surface has good flatness and that epitaxial growth continues. FIG. 2 shows the X-ray diffraction pattern of the film when this artificial period length of 18 people was repeated 15 times and the total film thickness was 300 people. From this X-ray diffraction pattern, 36 people (18 people x 2) Bi-based superconductor
It can be seen that the layer in Figure 10 is clearly oriented along the C axis. It was confirmed that the electrical resistance of this film had an onset at 110K and became superconducting at 107K. The above is Bi
This is one example of a method for synthesizing an ultra-thin epitaxial superconducting thin film having the phase 110, and Table 1 shows other film formation results. In the same way, 6 people (Bi-0) and (S
By setting the r-CaCu-0) layer to 10 people, B
A superconducting phase film was also easily produced in i-based 80. It is also possible to use BiO as a buffer layer, and a single crystal film could be synthesized by performing the above-described process.
第1表
これらのプロセスにおいて、膜特性と基板温度及び基板
付近の酸素ガス分圧基板温度は500〜800°Cが適
当であり、5006C以下では結晶性が悪く超伝導特性
が得られなくなり、800°C以上では膜の組成ずれ及
び銅が還元されて非超伝導相が成長してしまう。酸素分
圧は結晶成長させるためには最低でも2X10 to
rr必要である。また真空チャンバー内にRFを導入す
ることにより、RFコイル内でスパッタ粒子が活性化さ
れ同時に酸素プラズマが発生する。この環境での上記同
様の成長をおこなうことにより膜の超伝導臨界温度の向
上が確認され、さらにRFプラズマにバイアス電位をか
けて酸素イオンを10v〜80vに加速して基板に照射
することにより膜表面の平坦性の改善が見られた。また
加速酸素イオンの発生源として別に酸素イオンガンを真
空チャンバー内に設置することによっても同様の平坦性
の改善効果がみられた。Table 1 In these processes, the appropriate temperature for the film properties, substrate temperature, and oxygen gas partial pressure near the substrate is 500 to 800°C; below 5006°C, crystallinity is poor and superconducting properties cannot be obtained; At temperatures above .degree. C., a non-superconducting phase grows due to a composition shift in the film and copper being reduced. Oxygen partial pressure should be at least 2X10 to grow crystals.
rr is necessary. Furthermore, by introducing RF into the vacuum chamber, sputtered particles are activated within the RF coil and at the same time oxygen plasma is generated. By performing the same growth as above in this environment, it was confirmed that the superconducting critical temperature of the film was improved. Furthermore, by applying a bias potential to the RF plasma and accelerating oxygen ions to 10V to 80V and irradiating the substrate with the oxygen ions, the film could be grown. Improvement in surface flatness was observed. A similar flatness improvement effect was also observed by separately installing an oxygen ion gun in the vacuum chamber as a source of accelerated oxygen ions.
次にターゲットとして酸化ビスマスの代りに(Bi2O
3)1−x(PbO)x(0<x<0.1)を用いてエ
ピタキシャル膜を作製した。成膜中の酸素ガス分圧はl
Xl0−2Torrと固定しである。x = 0.1程
度まで超伝導特性は改善される(Tcが5〜15にの上
昇した)が、これ以上では膜中に異相が発生することに
より単結晶膜としての品質が落ちるのであまり実用的で
なくなる。Next, instead of bismuth oxide as a target (Bi2O
3) An epitaxial film was produced using 1-x(PbO)x (0<x<0.1). The oxygen gas partial pressure during film formation is l
It is fixed at Xl0-2 Torr. The superconducting properties are improved up to x = 0.1 (Tc increases to 5 to 15), but above this the quality of the single crystal film deteriorates due to the generation of different phases in the film, so it is not practical. It becomes irrelevant.
以上は酸化マグネシウム(MgO)単結晶基板上に合成
されたエピタキシャル膜について述べたが、チタン酸ス
トロンチウム(SrTiOa)単結晶、イツトリウム安
定化ジルコニア(ysz)単結晶、ジルコニア(ZrO
2)単結晶いずれの基板上にも同様に合成することがで
きた。The above has described an epitaxial film synthesized on a magnesium oxide (MgO) single crystal substrate;
2) Single crystals could be similarly synthesized on any substrate.
(発明の効果)
以上のように本発明を適応することにより、約107に
での超伝導を示し、かつ単一相のエピタキシャル膜を低
温で容易に合成され、デバイス等への応用上非常に有効
である。(Effects of the Invention) As described above, by applying the present invention, it is possible to easily synthesize a single-phase epitaxial film that exhibits superconductivity at about 107°C at a low temperature, which is extremely useful for applications to devices, etc. It is valid.
第1図(a)、 (b)は、本発明を実施したイオンビ
ームスパッタ装置の構造概略図である。第2図はX線回
折図である。
図において、1.2.16.17はイオン源、3はBi
2O3ターゲット、4は5rCaCuO酸化物ターゲツ
ト、5は天板、6,7はシャッター、8は基板ホルダー
、9はヒーター、10はゲートバルブ、11は真空排気
ポンプ、12は真空チャンバー、13は反射高エネルギ
ー電子線回折(RHEED)用電子銃、14はRHEE
Dスクリーン、15は水晶振動子膜厚モニタ、18はC
aOターゲ・ット、19はCuOターゲットである。FIGS. 1(a) and 1(b) are schematic structural diagrams of an ion beam sputtering apparatus in which the present invention is implemented. FIG. 2 is an X-ray diffraction diagram. In the figure, 1.2.16.17 is an ion source, 3 is a Bi
2O3 target, 4 is 5rCaCuO oxide target, 5 is top plate, 6 and 7 are shutters, 8 is substrate holder, 9 is heater, 10 is gate valve, 11 is vacuum pump, 12 is vacuum chamber, 13 is reflection height Electron gun for energy electron diffraction (RHEED), 14 is RHEE
D screen, 15 is crystal resonator film thickness monitor, 18 is C
aO target, 19 is a CuO target.
Claims (3)
O、CuOの4種類のターゲットを所定の順にもちいて
イオンビームスパッタを行なう酸化物超伝導薄膜の製造
方法であって、前記ターゲットをBi_2O_3、Sr
OとCuO、CaOとCuO、CaOとCuO、SrO
とCuO、Bi_2O_3の順に用いてイオンビームス
パッタすることにより基板上に周期的に層状成長させる
ことを特徴とした酸化物超伝導薄膜の製造方法。(1) Bi_2O_3, SrO, Ca as targets
A method for producing an oxide superconducting thin film in which ion beam sputtering is performed using four types of targets, O and CuO, in a predetermined order, the targets being Bi_2O_3 and Sr.
O and CuO, CaO and CuO, CaO and CuO, SrO
A method for manufacturing an oxide superconducting thin film, which comprises periodically growing layers on a substrate by ion beam sputtering using CuO and Bi_2O_3 in this order.
_2O_3)_1_−_x(PbO)_x(ただし0<
x≦0.1)を用いることを特徴とした特許請求の範囲
第1項記載の酸化物超伝導薄膜の製造方法。(2) Instead of bismuth oxide as a target (Bi
_2O_3)_1_-_x(PbO)_x (0<
The method for producing an oxide superconducting thin film according to claim 1, characterized in that x≦0.1).
を導入することを特徴とした特許請求の範囲第1項又は
第2項記載の酸化物超伝導薄膜の製造方法。(3) Radio frequency (RF) is applied inside the vacuum container during the film formation process.
3. A method for producing an oxide superconducting thin film according to claim 1 or 2, characterized in that:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63272209A JPH02120231A (en) | 1988-10-27 | 1988-10-27 | Production of superconducting thin film of oxide |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63272209A JPH02120231A (en) | 1988-10-27 | 1988-10-27 | Production of superconducting thin film of oxide |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH02120231A true JPH02120231A (en) | 1990-05-08 |
Family
ID=17510629
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63272209A Pending JPH02120231A (en) | 1988-10-27 | 1988-10-27 | Production of superconducting thin film of oxide |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH02120231A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2005029512A1 (en) * | 2003-09-17 | 2005-03-31 | Sumitomo Electric Industries, Ltd. | Superconductor and process for producing the same |
-
1988
- 1988-10-27 JP JP63272209A patent/JPH02120231A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2005029512A1 (en) * | 2003-09-17 | 2005-03-31 | Sumitomo Electric Industries, Ltd. | Superconductor and process for producing the same |
| JP2005093205A (en) * | 2003-09-17 | 2005-04-07 | Sumitomo Electric Ind Ltd | Superconductor and manufacturing method thereof |
| US7371586B2 (en) | 2003-09-17 | 2008-05-13 | Sumitomo Electric Industries, Ltd. | Superconductor and process for producing the same |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6159610A (en) | Buffer layers on metal surfaces having biaxial texture as superconductor substrates | |
| US4874741A (en) | Non-enhanced laser evaporation of oxide superconductors | |
| US5885939A (en) | Process for forming a-axis-on-c-axis double-layer oxide superconductor films | |
| CA1322514C (en) | Thin film of single crystal of lna_cu_o___ having three-layered perovskite structure and process for producing the same | |
| JPH0297427A (en) | Production of oxide superconducting thin film | |
| JPH02120229A (en) | Production of superconducting thin film of oxide | |
| JPH02120231A (en) | Production of superconducting thin film of oxide | |
| JPH02120232A (en) | Production of superconducting thin film of oxide | |
| JP2561303B2 (en) | Method for producing single crystal oxide superconducting thin film | |
| JPH02120230A (en) | Production of superconducting thin film of oxide | |
| JPH02175613A (en) | Production of oxide superconducting thin film | |
| JP2704625B2 (en) | Method for producing LnA lower 2 Cu lower 3 O-low 7-x single crystal thin film and LnA lower 2 Cu lower 3 O lower 7-x thin film having three-layer perovskite structure | |
| US20090036313A1 (en) | Coated superconducting materials | |
| JP2639544B2 (en) | Single crystal thin film of LaA Lower 2 Cu 3 Lower O 7 Lower 3 x with three-layer perovskite structure and LaA Lower 2 Cu Lower 3 O Lower 7 Lower 7 x thin film manufacturing method | |
| KR970009739B1 (en) | Method of manufacture for superconductor thin film | |
| JPH03275504A (en) | Oxide superconductor thin film and its production | |
| JP2844207B2 (en) | Oxide superconductor element and method for producing oxide superconductor thin film | |
| JPH0244029A (en) | Method for manufacturing oxide superconducting thin film | |
| JPH02170311A (en) | Oxide superconducting thin film fabrication method | |
| JPH05170448A (en) | Method for manufacturing ceramic thin film | |
| JP3188912B2 (en) | Method for producing oxide superconducting thin film | |
| JP2835235B2 (en) | Method of forming oxide superconductor thin film | |
| JP2781331B2 (en) | Manufacturing method of thin film superconductor | |
| JPH0244024A (en) | Production of thin oxide superconducting film | |
| JPH06196760A (en) | Superconductive lamination thin film |