JPH021224B2 - - Google Patents

Info

Publication number
JPH021224B2
JPH021224B2 JP5404881A JP5404881A JPH021224B2 JP H021224 B2 JPH021224 B2 JP H021224B2 JP 5404881 A JP5404881 A JP 5404881A JP 5404881 A JP5404881 A JP 5404881A JP H021224 B2 JPH021224 B2 JP H021224B2
Authority
JP
Japan
Prior art keywords
crystal
evaporation
vapor deposition
hole
adjustment
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP5404881A
Other languages
Japanese (ja)
Other versions
JPS57169085A (en
Inventor
Yasuo Nomura
Toshio Hayashi
Toshiki Suganuma
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nihon Dempa Kogyo Co Ltd
Original Assignee
Nihon Dempa Kogyo Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Dempa Kogyo Co Ltd filed Critical Nihon Dempa Kogyo Co Ltd
Priority to JP5404881A priority Critical patent/JPS57169085A/en
Publication of JPS57169085A publication Critical patent/JPS57169085A/en
Publication of JPH021224B2 publication Critical patent/JPH021224B2/ja
Granted legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/54Controlling or regulating the coating process
    • C23C14/542Controlling the film thickness or evaporation rate
    • C23C14/545Controlling the film thickness or evaporation rate using measurement on deposited material
    • C23C14/546Controlling the film thickness or evaporation rate using measurement on deposited material using crystal oscillators

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physical Vapour Deposition (AREA)
  • Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)

Description

【発明の詳細な説明】 本発明は水晶振動子の真空蒸着装置、特に、複
数個の水晶片に同時に励振電極を設け、次いで、
1つ1つの水晶片に順次周波数調整を可能とした
真空蒸着装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a vacuum evaporation apparatus for a crystal resonator, in particular, to provide excitation electrodes on a plurality of crystal pieces at the same time, and then
The present invention relates to a vacuum evaporation device that allows frequency adjustment to be performed sequentially on each crystal piece.

一般に水晶振動子1は第1図に示すうに所定の
角度に切り出した水晶片2の両面にクロム、金、
銀、アルミニユーム等の金属物質を真空蒸着によ
り2層、3層等の複数層に蒸着して、励振電極
3,(一方は図示せず)および端子4,4を形成
し、この水晶片2を基台5に植設した導出端子
6,6と接続された保持部材7,7に挾持させた
後、保持部材7,7と端子4,4とを導電性の接
着剤により接着し、水晶片2の振動エネルギーを
端子4,4、保持部材7,7、導出端子6,6を
介して外部へ取出すものである。
In general, a crystal resonator 1 has a crystal piece 2 cut out at a predetermined angle, as shown in FIG.
A metal material such as silver or aluminum is deposited in multiple layers such as two or three layers by vacuum deposition to form excitation electrodes 3 (one not shown) and terminals 4, and this crystal piece 2 is After holding the holding members 7, 7 connected to the lead-out terminals 6, 6 implanted in the base 5, the holding members 7, 7 and the terminals 4, 4 are bonded with a conductive adhesive, and the crystal piece is The vibration energy of 2 is taken out to the outside via the terminals 4, 4, the holding members 7, 7, and the lead-out terminals 6, 6.

ところで、前記した水晶振動子1の振動周波数
は水晶片2の厚み、大きさあるいは励振電極3,
3、端子4,4の質、量により決定するものであ
るが、水晶片2の厚みを正確に切り出すことが困
難なことから単に所定形状の水晶片2に、所定の
物質(クロム、金、銀、アルミニユーム)を所定
量、真空蒸着装置内で蒸着しただけでは予め定め
られた正確な周波数f0にて振動する水晶振動子を
得ることは困難なことであり、そのため、従来の
水晶振動子1は、一旦水晶片2に真空蒸着装置内
で励振電極3,3を2層ないし3層等に蒸着した
後、真空蒸着装置より取出し、前記したように保
持部材7,7に挾持させ、該水晶振動子1を第2
図あるいは第3図に示すように保管の都合上トレ
ー8,8′にその複数個(10〜15個)を収納し、
その後、以下に説明する方法により、水晶片2の
励振電極3,3上に更に微少量の物質を数回に分
けて蒸着し続け、蒸着により変化していく周波数
f1があらかじめ定められた周波数f0と等しくなる
点を求め、その蒸着を停止し、基準周波数f0を備
えた水晶振動子1を得るものである。
By the way, the vibration frequency of the crystal resonator 1 described above depends on the thickness and size of the crystal piece 2 or the excitation electrode 3,
3. This is determined by the quality and quantity of the terminals 4, 4, but since it is difficult to accurately cut out the thickness of the crystal piece 2, the crystal piece 2 of a predetermined shape is simply coated with a predetermined material (chromium, gold, gold, etc.). It is difficult to obtain a crystal resonator that vibrates at a predetermined accurate frequency f 0 by simply depositing a predetermined amount of silver (silver, aluminum) in a vacuum evaporation device. 1, once the excitation electrodes 3, 3 are deposited in two or three layers on the crystal piece 2 in a vacuum evaporation apparatus, and then taken out from the vacuum evaporation apparatus, held between the holding members 7, 7 as described above, and crystal oscillator 1
As shown in the figure or FIG.
After that, by the method described below, a minute amount of material is continued to be deposited on the excitation electrodes 3, 3 of the crystal piece 2 in several steps, and the frequency changes as a result of the deposition.
A point where f 1 becomes equal to a predetermined frequency f 0 is determined, and the vapor deposition is stopped to obtain a crystal resonator 1 having a reference frequency f 0 .

なお、第3図示では水晶振動子1が個々の収納
台9を介してトレー8′に収納されている。
In addition, in the third illustration, the crystal resonators 1 are stored in a tray 8' via individual storage stands 9.

そして、周波数を調整する場合、トレー8,
8′上の水晶振動子1を1つづつ周波数を調整す
るための真空蒸着室(図示せず)内のターンテー
ブル10,10′に設けた端子挿入部11,11
あるいは収納台9の収納孔11′に入れ替え、そ
の後、ターンテーブル10,10′を間欠的に回
転し、蒸発源12,12′よりクロム、金、銀、
アルミニユーム等の物質を微少量、対向する水晶
振動子1の励振電極3上に蒸着し、その水晶振動
子1の周波数f1が基準周波数f0になるまで、数回
に分けて蒸着を行うものである。数回に分けて蒸
着を行うのは1度に蒸着を行うと、その途中で基
準周波数f0を越えてしまうのを防止するためで、
一般には2回目の蒸着は前記第1回目よりさらに
微少量で、また、3回目はさらに微少量の蒸着を
行うもので、この3回目の蒸着中に基準周波数f0
に到達するものが多いものである。
When adjusting the frequency, tray 8,
Terminal insertion parts 11, 11 provided on turntables 10, 10' in a vacuum deposition chamber (not shown) for adjusting the frequency of the crystal oscillators 1 on 8' one by one.
Alternatively, it is replaced with the storage hole 11' of the storage stand 9, and then the turntables 10, 10' are rotated intermittently to remove chromium, gold, silver, etc. from the evaporation sources 12, 12'.
A method in which a minute amount of a substance such as aluminum is deposited on the excitation electrode 3 of the opposing crystal oscillator 1, and the deposition is performed in several steps until the frequency f 1 of the crystal oscillator 1 becomes the reference frequency f 0 . It is. The reason why the evaporation is performed in several steps is to prevent the reference frequency f 0 from being exceeded in the middle of the evaporation if the evaporation is performed at once.
Generally, the second evaporation is performed in an even smaller amount than the first, and the third evaporation is performed in an even smaller amount, and during this third evaporation, the reference frequency f 0
Many of them reach this point.

また、基準周波数f0に到達したか否かは調整し
ようとする水晶振動子1の導出端子6,6を発振
回路(図示せず)に接続して発振させ、該発振回
路からの信号と別に基準周波数f0で発振する発振
器からの信号とのゼロビートを検出させればよい
ものである。
In addition, whether or not the reference frequency f 0 has been reached can be determined by connecting the lead-out terminals 6, 6 of the crystal resonator 1 to be adjusted to an oscillation circuit (not shown) and oscillating it, separately from the signal from the oscillation circuit. It is sufficient to detect the zero beat with respect to the signal from the oscillator that oscillates at the reference frequency f 0 .

そして、調整後、真空蒸着室の真空状態を解除
し、水晶振動子1を再びトレー8,8′に収納し、
再び、他のトレー8,8′から他の水晶振動子1
を取出し、同様の作業を行うものである。
After the adjustment, the vacuum state in the vacuum deposition chamber is released, and the crystal resonator 1 is stored in the trays 8 and 8' again.
Again, from other trays 8, 8', other crystal units 1
, and perform the same work.

ところで、前記した従来の水晶振動子は、真空
蒸着室内に先ず、水晶片2に励振電極3,3を蒸
着するため収納および取出し、また、周波数調整
のため再び真空蒸着室(同一もしくは他の真空蒸
着室)内に収納し、取出す必要があるため、その
工程が複雑で、また、トレー8,8′に収納され
た水晶振動子を1つづつ取出し、真空蒸着室内の
ターンテーブル10,10′に装置し、調整後、
再びトレー8,8′に収納するものであるため、
作業能率が悪く、水晶振動子1の出入が多く、そ
の途中で水晶片2が破損してしまう等の欠点があ
つた。
By the way, the above-mentioned conventional crystal resonator is first stored and taken out in a vacuum deposition chamber in order to deposit the excitation electrodes 3, 3 on the crystal piece 2, and then returned to the vacuum deposition chamber (in the same or another vacuum chamber) for frequency adjustment. The process is complicated because the crystal resonators stored in the trays 8, 8' must be taken out one by one, and the turntables 10, 10' inside the vacuum deposition chamber must be taken out one by one. After adjusting the device,
Since it is to be stored in trays 8 and 8' again,
There were disadvantages such as poor working efficiency, the crystal resonator 1 being moved in and out a lot, and the crystal piece 2 being damaged during the movement.

本発明は叙上の点に鑑み、同一の真空蒸着室内
に複数個の水晶片を収納し、各水晶片に同時に励
振電極用の基礎蒸着を施すと共に、次いで、その
真空状態を保つたまま順次1つ1つの周波数調整
を行うことにより前記欠点を解消し、作業能率の
向上および水晶片の破損がないものを提供するこ
とを目的とする。
In view of the above points, the present invention stores a plurality of crystal pieces in the same vacuum deposition chamber, simultaneously applies basic vapor deposition for excitation electrodes to each crystal piece, and then sequentially applies the basic vapor deposition for the excitation electrode to each crystal piece while maintaining the vacuum state. It is an object of the present invention to eliminate the above-mentioned drawbacks by adjusting each frequency one by one, and to provide a device that improves work efficiency and does not cause damage to the crystal piece.

以下、本発明の1実施例を図面に基づいて詳細
に説明する。第7図は水晶片2を基台5に取付け
た状態を示す正面図である。図から明らかなよう
に、この状態では水晶片2の両面には励振電極
3,3および端子4,4は設けてなく、単に保持
部材7,7に仮止めされた状態である。同図にお
いて20はマスクで、該マスクは基台5に嵌合さ
れており、また、その正面および裏面には蒸着を
許容するための孔21,21が設けてある。な
お、6,6は導出端子である。なお、この状態を
試料と称す。第8図は真空蒸着室22の部分断側
面図である。23は真空蒸着室22の定盤で、該
定盤23上には複数本の支持柱24…が設けてあ
る。支持柱24…には後述する上板および下板の
位置決め用の段部24a……,24b…が設けて
ある。26は上板で、前記支持柱24…の段部2
4b…に位置し、ナツト25…により支持柱24
に取付けられている。27は上板26の中心下部
に保持されたモータ、28はモータ27の回転
軸、29は回転軸28に取付けられた伝達軸で、
該伝達軸29は太径部29aと細径部29bとを
備え、細径部29bの先端はナツト30と噛合で
きるようにネジ部が設けてある。31は前記伝達
軸29の細径部29bに取付けられた第1の蒸着
物遮蔽板で、該蒸着物遮蔽板31は特に第9図示
の平面図から明らかなようにその中心部に取付孔
31aが設けてあり、該取付孔31aから等距離
に且つ、等間隔に蒸着を許容するための孔32a
〜32fが複数個(実施例では6個)が設けてあ
り、さらに、孔32aと孔32fとの中間には周
波数調整用の調整孔33が設けてある。なお、調
整孔33も取付孔31aから等距離の位置に設け
てある。34は蒸着物遮蔽板31に設けた係止片
である。35は第2の蒸着物遮蔽板で、該蒸着物
遮蔽板35は特に第10図示の平面図から明らか
なように、伝達軸29の細径部29bに強嵌合に
より取付けられるべき取付孔35aが設けてあ
り、前記第1の蒸着物遮蔽板31に設けた孔32
a〜32fに対応する位置に孔36a〜36fが
設けてあるも、調整孔33と対応する孔は設けて
ない。そして、前記第1の蒸着物遮蔽板31は伝
達軸29に対し回転可能に、また、第2の蒸着物
遮蔽板35は伝達軸29に対し、回転不能に取付
けられるものであるが、その取付けについて、第
8図で説明すると、先ず、細径部29bにコイル
バネ37を挿入し、次に、第1の蒸着物遮蔽板3
1を挿入する。この時、取付孔31aは細径部2
9bより大径としてあるため遊嵌された状態とな
つている。次に、フエルト等より成る摩擦板38
を挿入し、その後、第2の蒸着物遮蔽板35を細
径部29bに強嵌合し、ナツト30を噛合すれ
ば、第1の蒸着物遮蔽板31はコイルバネ37の
弾力により摩擦板38を介して適度に第2の蒸着
物遮蔽板35に弾圧されているため、第1の蒸着
物遮蔽板31は一定以上のトルクが加わらない限
り空転することなく伝達軸29の回転に伴なつて
回転することができるものである。39は上板2
6の下部に設けた試料(水晶片2等)取付部材
で、該試料取付部材39は特に第11図示の平面
図より明らかなように円筒形を成し、前記第2の
蒸着物遮蔽板35に設けた孔36a〜36fと同
等数の取付部40a〜40fか等間隔に且つ先端
部が下方に傾斜して設けてある。そして、取付部
40a〜40fに前記第7図に示した試料を取付
けるものである。その詳細を第12図を用いて説
明すると、同図に示すように取付部40aには導
出端子挿入孔41aが設けてあり、該挿入孔41
aに試料の導出端子6,6を挿入すると、導出端
子6,6に取付部40aに設けた孔42aより挿
入孔41a内に進出する検知片43が導出端子
6,6と接触するものである。44は下板で、該
下板44は支持柱24の段部24a…上に位置決
め固定されている。45は定盤23上に設けたモ
ータで、モータ45の回転軸45aは前記下板4
4の孔44aより上方へ突出し、その先端には回
転式テーブル46が取付けてある。また、回転式
テーブル46の回転中心は前記伝達軸29の回転
中心より偏心した位置になるようにしてある。そ
して、回転式テーブル46上には第8図、第13
図に示すように蒸発源となるべき複数個の受皿4
7,48(実施例では2種類)が積置してあり、
回転式テーブル46を回転させ、受皿47あるい
は48を所定位置に定位した時、その定位位置が
第8図に示すように伝達軸29の真下に定位する
ようにしてある。従つて、第8図に1点鎖線に示
したように各試料(水晶片2)に対する入射角α
は伝達軸より等角度、すなわち、蒸着すべき金属
を収納した受皿は各試料に対して等位置に定位す
ることになるものである。受皿47,48はタン
グステン、モリブデン等より成り、一方の受皿4
7は金属物質としてクロム49が、また、他方の
受皿48には金50が収納してある。従つて、本
実施例における水晶片2の表面にはクロム49と
金50の2層蒸着となるようにセツトされてい
る。51は電極で、該電極51は上下動可能に設
けられ、回転式テーブル46が回転し、所定位置
に定位した時、上昇し、所定の受皿を通電させ、
受皿内の金属例えばクロム49を蒸発させるもの
である。52は電極51を上昇あるいは下降する
ためのソレノイドプランジヤーで、該ソレノイド
プランジヤー52に設けたプランジヤー53の往
復運動により電極51を上下動させる。すなわ
ち、プランジヤー53の先端にはカム面53aが
設けてあり、該カム面53aが電極51に設けた
ピン51aを押圧するためである。54は第1の
蒸着物遮蔽板31に設けた係止片34と係合して
第1の蒸着物遮蔽板31をコイルバネ37の弾力
に抗して回転させるための可動部材で、該可動部
材54は下板44の下面に設けたソレノイドプラ
ンジヤー55により可動するものである。なお、
56…は検知片43…と接続したリード線であ
る。57は取外しが可能なカバーである。
Hereinafter, one embodiment of the present invention will be described in detail based on the drawings. FIG. 7 is a front view showing the state in which the crystal piece 2 is attached to the base 5. As shown in FIG. As is clear from the figure, in this state, the excitation electrodes 3, 3 and terminals 4, 4 are not provided on both surfaces of the crystal piece 2, and are merely temporarily fixed to the holding members 7, 7. In the figure, 20 is a mask, which is fitted onto the base 5, and holes 21, 21 are provided on the front and back surfaces of the mask to allow vapor deposition. Note that 6 and 6 are lead-out terminals. Note that this state is referred to as a sample. FIG. 8 is a partially sectional side view of the vacuum deposition chamber 22. 23 is a surface plate of the vacuum deposition chamber 22, and a plurality of support columns 24 are provided on the surface plate 23. The support columns 24 are provided with stepped portions 24a, 24b, for positioning the upper and lower plates, which will be described later. 26 is an upper plate, and the step part 2 of the support column 24...
4b..., and the support column 24 is located at the nut 25...
installed on. 27 is a motor held at the lower center of the upper plate 26, 28 is a rotating shaft of the motor 27, 29 is a transmission shaft attached to the rotating shaft 28,
The transmission shaft 29 has a large diameter portion 29a and a small diameter portion 29b, and the tip of the small diameter portion 29b is provided with a threaded portion so as to be able to engage with a nut 30. Reference numeral 31 denotes a first deposit shielding plate attached to the narrow diameter portion 29b of the transmission shaft 29, and the deposit shielding plate 31 has a mounting hole 31a in its center, as is particularly clear from the plan view shown in FIG. Holes 32a for allowing vapor deposition are provided at equal distances from the mounting hole 31a and at regular intervals.
A plurality of holes 32f (six in the embodiment) are provided, and an adjustment hole 33 for frequency adjustment is provided between the holes 32a and 32f. Note that the adjustment hole 33 is also provided at a position equidistant from the attachment hole 31a. 34 is a locking piece provided on the deposit shielding plate 31. Reference numeral 35 designates a second deposit shielding plate, and as is particularly clear from the plan view shown in FIG. A hole 32 provided in the first vapor deposit shielding plate 31 is provided.
Although holes 36a to 36f are provided at positions corresponding to holes a to 32f, no hole corresponding to adjustment hole 33 is provided. The first vapor deposit shielding plate 31 is rotatably mounted to the transmission shaft 29, and the second vapor deposit shielding plate 35 is non-rotatably mounted to the transmission shaft 29. To explain this with reference to FIG. 8, first, the coil spring 37 is inserted into the narrow diameter portion 29b, and then the first vapor deposit shielding plate 3 is inserted.
Insert 1. At this time, the mounting hole 31a is
Since it has a larger diameter than 9b, it is loosely fitted. Next, a friction plate 38 made of felt or the like
is inserted, and then the second vapor deposit shielding plate 35 is tightly fitted into the narrow diameter portion 29b, and the nut 30 is engaged. Since the first vapor deposit shielding plate 31 is appropriately compressed by the second vapor deposition shielding plate 35 through the media, the first vapor deposition shielding plate 31 rotates with the rotation of the transmission shaft 29 without idling unless a certain torque or more is applied. It is something that can be done. 39 is the upper plate 2
6, the sample mounting member 39 has a cylindrical shape as clearly seen from the plan view shown in FIG. Attachment portions 40a to 40f, the number of which is equivalent to the number of holes 36a to 36f, are provided at equal intervals and with their tips slanted downward. Then, the sample shown in FIG. 7 is attached to the attachment parts 40a to 40f. The details will be explained using FIG. 12. As shown in the figure, the mounting portion 40a is provided with a lead-out terminal insertion hole 41a.
When the sample lead-out terminals 6, 6 are inserted into the lead-out terminals 6, 6, the detection piece 43 that advances into the insertion hole 41a from the hole 42a provided in the mounting portion 40a of the lead-out terminals 6, 6 comes into contact with the lead-out terminals 6, 6. . Reference numeral 44 denotes a lower plate, and the lower plate 44 is positioned and fixed on the step portion 24a of the support column 24. 45 is a motor provided on the surface plate 23, and the rotating shaft 45a of the motor 45 is connected to the lower plate 4.
It protrudes upward from the hole 44a of No. 4, and a rotary table 46 is attached to its tip. Further, the center of rotation of the rotary table 46 is arranged eccentrically from the center of rotation of the transmission shaft 29. 8 and 13 on the rotary table 46.
As shown in the figure, a plurality of saucers 4 are provided as evaporation sources.
7, 48 (two types in the example) are stacked,
When the rotary table 46 is rotated and the saucer 47 or 48 is positioned at a predetermined position, the position is directly below the transmission shaft 29 as shown in FIG. Therefore, as shown by the dashed line in FIG. 8, the incident angle α for each sample (crystal piece 2) is
are at equal angles from the transmission axis, that is, the saucers containing the metal to be deposited are positioned at the same position with respect to each sample. The saucers 47 and 48 are made of tungsten, molybdenum, etc.
7 contains chromium 49 as a metal substance, and the other saucer 48 contains gold 50. Therefore, two layers of chromium 49 and gold 50 are deposited on the surface of the crystal blank 2 in this embodiment. Reference numeral 51 denotes an electrode, and the electrode 51 is provided to be movable up and down, and when the rotary table 46 rotates and is positioned at a predetermined position, it rises and energizes a predetermined saucer.
This evaporates metal such as chromium 49 in the saucer. 52 is a solenoid plunger for raising or lowering the electrode 51, and the electrode 51 is moved up and down by the reciprocating motion of a plunger 53 provided on the solenoid plunger 52. That is, a cam surface 53a is provided at the tip of the plunger 53, and the cam surface 53a presses the pin 51a provided on the electrode 51. Reference numeral 54 denotes a movable member that engages with the locking piece 34 provided on the first vapor deposit shielding plate 31 to rotate the first vapor deposit shielding plate 31 against the elasticity of the coil spring 37; 54 is movable by a solenoid plunger 55 provided on the lower surface of the lower plate 44. In addition,
56... are lead wires connected to the detection pieces 43... 57 is a removable cover.

次に、本発明の動作について説明すると、先
ず、カバー57を取外し、試料取付部材39の取
付部40a〜40fに試料を取付けると共に、回
転式テーブル46上の受皿47,48に蒸着用金
属であるクロム49と金50とをそれぞれの受皿
47,48に収納すると共に可動部材54を可動
させて第1の蒸着物遮蔽板31に設けた孔32a
〜32fが第14図に示すように第2の蒸着物遮
蔽板35に設けた孔36a〜36fと対応するよ
うに操作すると共にモータ27を若干回転させ、
各孔32a〜32fが取付部40a〜40fに取
付けられた試料と対応する位置に定位させる。ま
た、回転式テーブル46も回転させてクロム49
を収納した受皿47が伝達軸29の真下に定位す
るようにセツトし、その後、カバー57を被せ
て、真空蒸着室内部を真空状態にする。そして、
ソレノイドプランジヤー52を操作して、電極5
1を上昇させ、受皿47を通電すると、クロム4
9が蒸発し、孔32a〜32f(36a〜36f)
および各試料に設けたマスク20の孔21より各
試料(各水晶片2)が同時に金属蒸着(クロム蒸
着)される。所定量のクロム蒸着が終了すると、
再びソレノイドプランジヤー52を操作して、電
極51を降下させる。そして、モータ45を回転
させ、回転式テーブル46を半回転し、今度は金
50を収納した受皿48が伝達軸29の真下に定
位するようにセツトし、再び、電極51を上昇さ
せて、受皿48を通電すると、受皿48内の金5
0が蒸発し、各試料の前記クロム蒸着上にさらに
金が蒸着する。そして、この全蒸着が終了した
後、特に図示してないが取付部40a〜40fを
半回転させるか、一旦、真空状態を解除して、カ
バー57を取外し、試料を半回転して取付け、再
びカバー57を被せ、真空状態と成し、また、回
転式テーブル46を再び半回転し、クロム49を
収納した受皿47を再び伝達軸29の真下に定位
するようにセツトし、前記同様先ずクロム蒸着
を、次いで、回転式テーブル46を半回転して金
蒸着を行うことにより、収納された各試料は同時
に励振電極3,3となるべく基礎蒸着が終了す
る。蒸着すべき金属を収納した受皿47,48を
常に伝達軸29の真下に定位するようにセツトし
たのは蒸着源(受皿)と各試料とが等位置になる
ようにしたもので、これにより複数層に金属を蒸
着する際の蒸着ムラが防止できるものである。
Next, to explain the operation of the present invention, first, the cover 57 is removed, the sample is attached to the attachment parts 40a to 40f of the sample attachment member 39, and the metal for evaporation is placed on the saucers 47 and 48 on the rotary table 46. A hole 32a is formed in the first vapor deposit shielding plate 31 by storing chromium 49 and gold 50 in respective trays 47 and 48 and moving the movable member 54.
32f correspond to the holes 36a to 36f provided in the second vapor deposit shielding plate 35 as shown in FIG. 14, and the motor 27 is slightly rotated.
Each of the holes 32a to 32f is positioned at a position corresponding to the sample attached to the attachment parts 40a to 40f. In addition, the rotary table 46 is also rotated so that the chrome 49
The tray 47 containing the evaporation chamber is set so as to be positioned directly below the transmission shaft 29, and then the cover 57 is placed on the chamber to evacuate the inside of the vacuum evaporation chamber. and,
By operating the solenoid plunger 52, the electrode 5
1 is raised and the saucer 47 is energized, chromium 4
9 evaporates, holes 32a to 32f (36a to 36f)
Each sample (each crystal piece 2) is simultaneously metal-deposited (chromium-deposited) through the hole 21 of the mask 20 provided in each sample. When the specified amount of chromium deposition is completed,
The solenoid plunger 52 is operated again to lower the electrode 51. Then, the motor 45 is rotated, the rotary table 46 is rotated half a turn, this time the saucer 48 containing the gold 50 is set so as to be positioned directly below the transmission shaft 29, the electrode 51 is raised again, and the saucer is set. When 48 is energized, the gold 5 in the saucer 48
0 evaporates and more gold is deposited on top of the chromium deposit on each sample. After the entire vapor deposition is completed, although not particularly shown, the mounting parts 40a to 40f are rotated half a turn, or the vacuum state is once released, the cover 57 is removed, the sample is rotated half a turn, and then mounted again. The cover 57 is put on to create a vacuum state, and the rotary table 46 is rotated half a turn again to set the tray 47 containing the chromium 49 directly below the transmission shaft 29, and as before, first chromium vapor deposition is performed. Next, the rotary table 46 is turned half a turn to perform gold vapor deposition, so that the basic vapor deposition is completed so that each of the stored samples becomes the excitation electrodes 3, 3 at the same time. The saucers 47 and 48 containing the metal to be evaporated are always positioned directly below the transmission shaft 29 so that the evaporation source (the saucer) and each sample are at the same position. It is possible to prevent uneven deposition when metal is deposited on a layer.

次に、試料(水晶片2)の両面に基礎メツキ後
の周波数調整について説明する。先ず、基礎メツ
キが終了したら、ソレノイドプランジヤー55に
より可動部材54を可動させ、第1の蒸着物遮蔽
板31をコイルバネ37の弾力に抗して若干回転
させ、第1の蒸着物遮蔽板31に設けた調整孔3
3が第15図に示すように第2の蒸着物遮蔽板3
5に設けた孔の1つ例えば36fと対応させる。
従つて、第2の蒸着物遮蔽板35に設けた他の孔
36a〜36eは第1の蒸着物遮蔽板31により
閉鎖状態となり、また、第1の蒸着物遮蔽板31
に設けた孔32a〜32fは第2の蒸着物遮蔽板
35により閉鎖状態となる。従つて、両蒸着物遮
蔽板31,35には調整孔33(36f)の部分
のみが開孔した状態となり、この調整孔33を順
次1つ1つの試料に対応させ周波数調整を行うも
のである。
Next, frequency adjustment after basic plating on both sides of the sample (crystal blank 2) will be explained. First, when the basic plating is completed, the movable member 54 is moved by the solenoid plunger 55, and the first deposit shielding plate 31 is slightly rotated against the elasticity of the coil spring 37. Adjustment hole 3 provided
3 is a second deposit shielding plate 3 as shown in FIG.
5, for example, 36f.
Therefore, the other holes 36a to 36e provided in the second vapor deposit shielding plate 35 are closed by the first vapor deposit shielding plate 31, and the first vapor deposit shielding plate 31
The holes 32a to 32f provided in are closed by the second vapor deposit shielding plate 35. Therefore, only the adjustment hole 33 (36f) is opened in both the deposit shielding plates 31 and 35, and the frequency adjustment is performed by sequentially corresponding to each sample with this adjustment hole 33. .

すなわち、調整孔33を先ず取付部40fに取
付けられた試料と対応させ、回転式テーブル46
の金50に収納した受皿48を通電させ、金50
を微少量蒸発させると、金は調整孔33、マスク
20の孔21を通過して、前記基礎メツキ(励振
電極)上に蒸着する。この時、水晶片2の励振電
極は保持部材7,7、導出端子6,6より検知片
43を介してリード線56に導出され、該リード
線56を発振回路(図示せず)に接続して発振さ
せ、該発振回路からの信号と別に基準周波数f0
発振する発振器からの信号とにより、従来例と同
様、数回の微調整を行い、ゼロビートを検出させ
1つの試料の調整を終了させる。1つの試料の調
整が終了したら、モータ27を所定量回転し、2
つの蒸着物遮蔽板31,35を同時に回転させ、
調整孔33が次の試料と対応するようにし、前記
同様の調整を行う。そして、モータ27を略1回
転させることにより全部の試料の周波数調整が終
了する。終了後、真空状態を解除し、カバー57
を取外し、各試料を取外せば、水晶片2には励振
電極3,3と周波数調整が終了したものが誕生す
ることになる。
That is, first, the adjustment hole 33 is made to correspond to the sample attached to the attachment part 40f, and then the rotary table 46
The saucer 48 housed in the gold 50 is energized, and the gold 50 is energized.
When a small amount of gold is evaporated, the gold passes through the adjustment hole 33 and the hole 21 of the mask 20 and is deposited on the base plating (excitation electrode). At this time, the excitation electrode of the crystal piece 2 is led out from the holding members 7, 7 and the lead-out terminals 6, 6 via the detection piece 43 to a lead wire 56, and the lead wire 56 is connected to an oscillation circuit (not shown). Using the signal from the oscillation circuit and a separate signal from an oscillator that oscillates the reference frequency f 0 , fine adjustments are made several times as in the conventional example, and the zero beat is detected to complete the adjustment of one sample. let After completing the adjustment of one sample, rotate the motor 27 by a predetermined amount, and
Rotating the two vapor deposition shielding plates 31 and 35 at the same time,
The adjustment hole 33 is made to correspond to the next sample, and the same adjustment as described above is performed. Then, by rotating the motor 27 approximately once, frequency adjustment for all samples is completed. After finishing, release the vacuum state and close the cover 57.
When the crystal blank 2 is removed and each sample is removed, a crystal piece 2 with excitation electrodes 3 and frequency adjustment completed will be created.

なお、前記両蒸着物遮蔽板31,35には6つ
の孔32a〜32f、36a〜36fを、また、
試料取付部材39には6つの取付部40a〜40
fを設けたが、必ずしも6つに限定されることな
く、個数については設計上の任意のことである。
In addition, six holes 32a to 32f, 36a to 36f are provided in both the deposit shielding plates 31 and 35, and
The sample mounting member 39 has six mounting parts 40a to 40.
f is provided, but the number is not necessarily limited to six, and the number is arbitrary in terms of design.

また、回転式テーブル46上には2つの受皿4
7,48を積置したが必ずしも2つに限定される
ことなく、3,4〜10種類と積置することにより
2〜10層あるいはそれ以上に蒸着することができ
るものである。
In addition, two saucers 4 are placed on the rotary table 46.
Although 7 and 48 types are stacked, the number is not necessarily limited to two, and by stacking 3, 4 to 10 types, it is possible to deposit 2 to 10 layers or more.

さらに、調整孔33は第1の蒸着物遮蔽板31
に設けたが、反対に第2の蒸着物遮蔽板35に設
けてもよいものである。
Further, the adjustment hole 33 is connected to the first vapor deposit shielding plate 31.
However, on the contrary, it may be provided on the second vapor deposit shielding plate 35.

以上、詳細に説明したように、本発明によれ
ば、真空蒸着室22内に2枚の蒸着物遮蔽板3
1,35を水晶片2と蒸発源(受皿47,48)
との間に回転可能に設け、該2枚の蒸着物遮蔽板
には各々対応する位置に複数個の孔32a〜32
fおよび36a〜36fを設けると共に、2枚の
蒸着物遮蔽板のうちどちらか一方には前記孔より
1つ余分に調整孔33を設け、基礎メツキ時には
調整孔を除く各孔を対応させて、各水晶片に同時
に金属蒸着を可能と成すも、周波数調整時には前
記各孔の対向を解除し、調整孔と他方の蒸着物遮
蔽板に設けた孔の1つと対応し、順次周波数調整
の金属蒸着を可能としたので、同一の真空蒸着室
内で、水晶片への基礎蒸着(励振電極)を行なう
工程と、周波数調整の工程とを連続的に行えるの
で、作業能率がよく、しかも水晶片の出入が少な
くてすむので、水晶片を破損させることがなく、
また、試料の取付部40a〜40fを自動半転可
能にすれば、基礎蒸着の工程と周波数調整の工程
において、真空状態を破壊することなく、作業が
単純化され安価に水晶振動子を提供できる等の効
果がある。
As described above in detail, according to the present invention, two deposit shielding plates 3 are provided in the vacuum deposition chamber 22.
1, 35 as crystal piece 2 and evaporation source (saucers 47, 48)
The two vapor deposition shielding plates each have a plurality of holes 32a to 32 at corresponding positions.
f and 36a to 36f are provided, and one adjustment hole 33 is provided in one of the two deposit shielding plates in addition to the hole, and each hole except the adjustment hole is made to correspond to each other during base plating, Although it is possible to deposit metal on each crystal piece at the same time, when adjusting the frequency, the facing of each hole is released, and the adjustment hole corresponds to one of the holes provided in the other vapor deposition shielding plate, and the metal deposition for frequency adjustment is sequentially performed. As a result, the basic vapor deposition process (excitation electrode) on the crystal blank and the frequency adjustment process can be performed continuously in the same vacuum deposition chamber, improving work efficiency and making it possible to easily move the crystal blank in and out. Because less is required, there is no damage to the crystal piece.
Furthermore, if the sample attachment parts 40a to 40f can be automatically rotated in half, the vacuum state will not be destroyed in the basic vapor deposition process and the frequency adjustment process, and the work will be simplified and the crystal resonator can be provided at low cost. There are other effects.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は水晶振動子1の正面図、第2図〜第6
図は周波数調整の従来例を示し、第2図は第1の
トレー8を示し、イ図は正面図、ロ図は側面図、
第3図は第2のトレー8′を示し、イ図は正面図、
ロ図は側面図、第4図は調整装置の正面図、第5
図は同平面図、第6図は他形状の調整装置の平面
図、第7図〜第15図は本発明の実施例を示し、
第7図は試料の正面図、第8図は真空蒸着室22
の部分断側面図、第9図は第1の蒸着物遮蔽板3
1の平面図、第10図は第2の蒸着物遮蔽板35
の平面図、第11図は試料取付部材39の平面
図、第12図は取付部40aに試料を取付けた状
態を示す部分断側面図、第13図は回転式テーブ
ル46の平面図、第14図は基礎蒸着状態を示す
蒸着物遮蔽板31,35の平面図、第15図は周
波数調整状態を示す蒸着物遮蔽板31,35の平
面図である。 1…水晶振動子、2…水晶片、3,3…励振電
極、22…真空蒸着室、31…蒸着物遮蔽板、3
2a〜32f…孔、33…調整孔、35…蒸着物
遮蔽板、36a〜36f…孔、39…試料取付部
材、40a〜40f…取付部、46…回転式テー
ブル、47,48…受皿(蒸発源)。
Figure 1 is a front view of the crystal resonator 1, Figures 2 to 6
The figure shows a conventional example of frequency adjustment, Figure 2 shows the first tray 8, Figure A is a front view, Figure B is a side view,
Figure 3 shows the second tray 8', Figure A is a front view;
Figure B is a side view, Figure 4 is a front view of the adjustment device, Figure 5 is a front view of the adjustment device,
The figure is a plan view of the same, FIG. 6 is a plan view of an adjusting device of other shapes, and FIGS. 7 to 15 show embodiments of the present invention.
Figure 7 is a front view of the sample, Figure 8 is the vacuum deposition chamber 22.
FIG. 9 is a partially sectional side view of the first vapor deposit shielding plate 3.
1, and FIG. 10 is a plan view of the second vapor deposit shielding plate 35.
11 is a plan view of the sample attachment member 39, FIG. 12 is a partially sectional side view showing a state in which a sample is attached to the attachment part 40a, FIG. 13 is a plan view of the rotary table 46, and FIG. 15 is a plan view of the deposit shielding plates 31, 35 showing the basic vapor deposition state, and FIG. 15 is a plan view of the deposit shielding plates 31, 35 showing the frequency adjustment state. DESCRIPTION OF SYMBOLS 1...Crystal resonator, 2...Crystal piece, 3, 3...Excitation electrode, 22...Vacuum deposition chamber, 31...Deposit shielding plate, 3
2a to 32f...hole, 33...adjustment hole, 35...evaporation shielding plate, 36a to 36f...hole, 39...sample mounting member, 40a to 40f...attachment part, 46...rotary table, 47, 48...receptacle (evaporation source).

Claims (1)

【特許請求の範囲】 1 真空蒸着室内に複数個の水晶片を収納し、該
複数個の水晶片に同時に励振電極となるべき金属
の基礎蒸着を施こし、次いで、1つ1つの水晶片
に順次周波数の調整を行い得るようにした水晶振
動子の真空蒸着装置において、真空蒸着室内に2
枚の蒸着物遮蔽板を前記水晶片と蒸発源との間に
回転可能に設け、該2枚の蒸着物遮蔽板には各々
対応する位置に複数個の孔を設けると共に、該2
枚の蒸着物遮蔽板のうちどちらか一方には前記孔
より1つ余分に調整孔を設け、基礎蒸着時には前
記調整孔を除く各孔を対応させて、各水晶片に同
時に金属蒸着を可能と成すも、周波数調整時には
前記各孔の対向を解除し、調整孔と他方の蒸着物
遮蔽板に設けた孔の1つと対応し、順次周波数調
整の金属蒸着を可能としたことを特徴とする水晶
振動子の真空蒸着装置。 2 基礎蒸着時には2枚の蒸着物遮蔽板は回転す
ることなく、周波数調整時のみ回転し得るように
したことを特徴とする特許請求の範囲第1項記載
の水晶振動子の真空蒸着装置。 3 2枚の蒸着物遮蔽板は摩擦結合していること
を特徴とする特許請求の範囲第1項記載の水晶振
動子の真空蒸着装置。
[Scope of Claims] 1. A plurality of crystal pieces are housed in a vacuum deposition chamber, a basic vapor deposition of a metal to be an excitation electrode is simultaneously applied to the plurality of crystal pieces, and then, a basic vapor deposition is applied to each crystal piece one by one. In a vacuum evaporation device for crystal oscillators that allows for sequential frequency adjustment, there are two
Two vapor deposition shielding plates are rotatably provided between the crystal piece and the evaporation source, and each of the two vapor deposition shielding plates is provided with a plurality of holes at corresponding positions.
One adjustment hole is provided in one of the two evaporation material shielding plates in addition to the above-mentioned hole, and during basic evaporation, each hole except the adjustment hole is made to correspond to each other, so that metal evaporation can be performed on each crystal piece at the same time. However, when adjusting the frequency, the opposed holes are released, and the adjustment hole corresponds to one of the holes provided in the other vapor deposition shielding plate, thereby making it possible to sequentially perform metal vapor deposition for frequency adjustment. Vacuum deposition equipment for vibrators. 2. The vacuum evaporation apparatus for a crystal oscillator according to claim 1, wherein the two evaporated material shielding plates do not rotate during basic evaporation but can rotate only during frequency adjustment. 3. The vacuum evaporation apparatus for a crystal resonator according to claim 1, wherein the two evaporated material shielding plates are frictionally coupled.
JP5404881A 1981-04-10 1981-04-10 Vacuum vapor-depositing device of crystal resonator Granted JPS57169085A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5404881A JPS57169085A (en) 1981-04-10 1981-04-10 Vacuum vapor-depositing device of crystal resonator

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5404881A JPS57169085A (en) 1981-04-10 1981-04-10 Vacuum vapor-depositing device of crystal resonator

Publications (2)

Publication Number Publication Date
JPS57169085A JPS57169085A (en) 1982-10-18
JPH021224B2 true JPH021224B2 (en) 1990-01-10

Family

ID=12959715

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5404881A Granted JPS57169085A (en) 1981-04-10 1981-04-10 Vacuum vapor-depositing device of crystal resonator

Country Status (1)

Country Link
JP (1) JPS57169085A (en)

Also Published As

Publication number Publication date
JPS57169085A (en) 1982-10-18

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