JPH02135804U - - Google Patents

Info

Publication number
JPH02135804U
JPH02135804U JP4528689U JP4528689U JPH02135804U JP H02135804 U JPH02135804 U JP H02135804U JP 4528689 U JP4528689 U JP 4528689U JP 4528689 U JP4528689 U JP 4528689U JP H02135804 U JPH02135804 U JP H02135804U
Authority
JP
Japan
Prior art keywords
needle
diameter
screw
explanatory diagram
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4528689U
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP4528689U priority Critical patent/JPH02135804U/ja
Publication of JPH02135804U publication Critical patent/JPH02135804U/ja
Pending legal-status Critical Current

Links

Landscapes

  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)

Description

【図面の簡単な説明】
第１図は、本考案による、ねじ有効径測定プロ
ーブの形状図。第２図は、従来のねじ有効径測定
の三針法で使われる三針の構成図。第３図は、従
来の三針法による、三本の針の吊り下げと、ねじ
のリード角度だけ、三本の針が傾いた説明図。第
４図は、従来のねじ有効径測定法の説明図。第５
図は、ねじ有効径を求める計算式の説明図。第６
図は、三次元測定機のプローブヘツドに、本考案
のプローブを装着した説明図。第７図は、本考案
のねじ有効径測定法の説明図。第８図は、プロー
ブ球最外径寸法を示す説明図。 １……シヤンク、２……球Ｓ……球径直径寸法
、３……針、４……針、５……針、６……くさり
、７……リング、８……ねじ、Ｏ……ねじの中心
線、Ｌ……ねじのリード角、９……測定端子、１
０……測定端子、Ａ……ねじ有効径、Ｍ……針の
外側距離、ｄ……針の円筒形直径寸法、Ｆ……フ
ランク、１１……三次元測定機プローブヘツド、
１２……三次元測定機のテーブル、１３……プロ
ーブ取付具、１４……固定具、１５…固定具Ｐ１
……測定位置、Ｐ２……測定位置、Ｐ３……測定
位置。

Claims (1)

    【実用新案登録請求の範囲】
  1. 三針法の針の円筒形直径寸法を、球形直径寸法
    にしたことを特徴とする、ねじ有効径測定プロー
    ブ。
JP4528689U 1989-04-18 1989-04-18 Pending JPH02135804U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4528689U JPH02135804U (ja) 1989-04-18 1989-04-18

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4528689U JPH02135804U (ja) 1989-04-18 1989-04-18

Publications (1)

Publication Number Publication Date
JPH02135804U true JPH02135804U (ja) 1990-11-13

Family

ID=31559325

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4528689U Pending JPH02135804U (ja) 1989-04-18 1989-04-18

Country Status (1)

Country Link
JP (1) JPH02135804U (ja)

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7304488B2 (en) 2002-05-23 2007-12-04 Cascade Microtech, Inc. Shielded probe for high-frequency testing of a device under test
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7417446B2 (en) 2002-11-13 2008-08-26 Cascade Microtech, Inc. Probe for combined signals
US7420381B2 (en) 2004-09-13 2008-09-02 Cascade Microtech, Inc. Double sided probing structures
US7427868B2 (en) 2003-12-24 2008-09-23 Cascade Microtech, Inc. Active wafer probe
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
US7456646B2 (en) 2000-12-04 2008-11-25 Cascade Microtech, Inc. Wafer probe
US7498829B2 (en) 2003-05-23 2009-03-03 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7504842B2 (en) 1997-05-28 2009-03-17 Cascade Microtech, Inc. Probe holder for testing of a test device
US7609077B2 (en) 2006-06-09 2009-10-27 Cascade Microtech, Inc. Differential signal probe with integral balun
US7619419B2 (en) 2005-06-13 2009-11-17 Cascade Microtech, Inc. Wideband active-passive differential signal probe
JP2010101700A (ja) * 2008-10-22 2010-05-06 Toyota Motor Corp ねじ有効径測定用保持治具
JP5846514B1 (ja) * 2014-12-15 2016-01-20 茂夫 五十嵐 三針ゲージ

Cited By (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7504842B2 (en) 1997-05-28 2009-03-17 Cascade Microtech, Inc. Probe holder for testing of a test device
US7456646B2 (en) 2000-12-04 2008-11-25 Cascade Microtech, Inc. Wafer probe
US7495461B2 (en) 2000-12-04 2009-02-24 Cascade Microtech, Inc. Wafer probe
US7436194B2 (en) 2002-05-23 2008-10-14 Cascade Microtech, Inc. Shielded probe with low contact resistance for testing a device under test
US7304488B2 (en) 2002-05-23 2007-12-04 Cascade Microtech, Inc. Shielded probe for high-frequency testing of a device under test
US7518387B2 (en) 2002-05-23 2009-04-14 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7482823B2 (en) 2002-05-23 2009-01-27 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7417446B2 (en) 2002-11-13 2008-08-26 Cascade Microtech, Inc. Probe for combined signals
US7498829B2 (en) 2003-05-23 2009-03-03 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7501842B2 (en) 2003-05-23 2009-03-10 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7427868B2 (en) 2003-12-24 2008-09-23 Cascade Microtech, Inc. Active wafer probe
US7420381B2 (en) 2004-09-13 2008-09-02 Cascade Microtech, Inc. Double sided probing structures
US8013623B2 (en) 2004-09-13 2011-09-06 Cascade Microtech, Inc. Double sided probing structures
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
US7619419B2 (en) 2005-06-13 2009-11-17 Cascade Microtech, Inc. Wideband active-passive differential signal probe
US7609077B2 (en) 2006-06-09 2009-10-27 Cascade Microtech, Inc. Differential signal probe with integral balun
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
JP2010101700A (ja) * 2008-10-22 2010-05-06 Toyota Motor Corp ねじ有効径測定用保持治具
JP5846514B1 (ja) * 2014-12-15 2016-01-20 茂夫 五十嵐 三針ゲージ

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