JPH0213939Y2 - - Google Patents

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Publication number
JPH0213939Y2
JPH0213939Y2 JP1980140164U JP14016480U JPH0213939Y2 JP H0213939 Y2 JPH0213939 Y2 JP H0213939Y2 JP 1980140164 U JP1980140164 U JP 1980140164U JP 14016480 U JP14016480 U JP 14016480U JP H0213939 Y2 JPH0213939 Y2 JP H0213939Y2
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JP
Japan
Prior art keywords
temperature coefficient
converter
temperature
output
magnet
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1980140164U
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Japanese (ja)
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JPS5763233U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
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Priority to JP1980140164U priority Critical patent/JPH0213939Y2/ja
Publication of JPS5763233U publication Critical patent/JPS5763233U/ja
Application granted granted Critical
Publication of JPH0213939Y2 publication Critical patent/JPH0213939Y2/ja
Expired legal-status Critical Current

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Description

【考案の詳細な説明】 〈産業上の利用分野〉 この考案は電子天びんに関する。[Detailed explanation of the idea] <Industrial application field> This invention relates to electronic balances.

〈従来の技術とその問題点〉 従来の電磁力平衡式電子天びんは荷重と平衡す
る電磁力を発生する電磁力平衡部からなるセンサ
ーユニツト部と天びん出力を表示するためのA−
D変換部からなるプリント回路基板から形成され
ている。ところが、修理等のため上記センサユニ
ツト部及び上記プリント回路基板のいずれか一方
を変換すると、それらの温度係数の違いにより天
びんの特性が悪くなることがあつた。また、上記
A−D変換部の温度係数は小さくなるよう設定さ
れているが、無視できない程度の大きさをもつて
おり、さらに上記センサユニツト部にはマグネツ
トなどの大きい温度係数をもつているので、上記
A−D変換部による誤差も含めて天びんの温度係
数を修正あるいは調整しなければならなかつた。
特に上記A−D変換部に互換性をよくするために
温度係数のより小さい部品を使用することは、そ
の部品が高価でありコストダウンの面で不適当で
ある。
<Conventional technology and its problems> Conventional electromagnetic force balance electronic balances have a sensor unit consisting of an electromagnetic force balance section that generates an electromagnetic force that balances the load, and an A- for displaying the balance output.
It is formed from a printed circuit board consisting of a D conversion section. However, when either the sensor unit section or the printed circuit board is replaced for repair or the like, the characteristics of the balance sometimes deteriorate due to the difference in temperature coefficient between them. Furthermore, although the temperature coefficient of the A-D converter is set to be small, it is still large enough to not be ignored, and the sensor unit has a large temperature coefficient such as a magnet. , it was necessary to correct or adjust the temperature coefficient of the balance, including the error caused by the A-D converter.
In particular, using components with a smaller temperature coefficient in the A-D converter to improve compatibility is expensive and inappropriate in terms of cost reduction.

この考案は上記従来の欠点を解消して、簡単な
回路構成のもとに、センサユニツト部とプリント
回路基板それぞれの温度係数を個別に調整するこ
とができ、もつて両部品間相互の互換性を有する
電子天びんの提供を目的としている。
This invention eliminates the above-mentioned conventional drawbacks and allows the temperature coefficients of the sensor unit and printed circuit board to be adjusted individually based on a simple circuit configuration, thereby ensuring mutual compatibility between the two parts. The aim is to provide electronic balances with

〈問題点を解決するための手段〉 上記の目的を達するため、本考案では、永久磁
石とフオースコイル等によつて荷重に平衡する電
磁力を発生するセンサユニツト側に、磁石の温度
を計測するための温度センサと、その温度センサ
の出力を入力して磁石の温度係数と同等の温度係
数のもとに温度によつて変化する電圧を発生する
よう調整可能な基準電圧発生器を設ける。
<Means for solving the problem> In order to achieve the above purpose, the present invention includes a sensor unit that generates an electromagnetic force that balances the load using a permanent magnet and a force coil, etc., to measure the temperature of the magnet. and a reference voltage generator which is adjustable to input the output of the temperature sensor and generate a voltage that varies with temperature under a temperature coefficient equivalent to the temperature coefficient of the magnet.

一方、A−D変換器等を備えてなる基板側に
は、上記の基準電圧発生器の出力を入力してその
入力電圧が所定の一定値の状態下でA−D変換器
の温度係数が零となるよう、その入力電圧を変化
させてA−D変換器に供給する基板温度係数調整
部を設ける。
On the other hand, the output of the reference voltage generator mentioned above is input to the board side which is equipped with an A-D converter, etc., and the temperature coefficient of the A-D converter is calculated under the condition that the input voltage is a predetermined constant value. A substrate temperature coefficient adjustment section is provided that changes the input voltage so that the input voltage becomes zero and supplies the input voltage to the AD converter.

〈作用〉 センサユニツト側からの天びん出力は基板側の
A−D変換器に入力されるとともに、このA−D
変換器の基準電圧信号もセンサユニツト側に設け
られた基準電圧発生器から供給される。そしてこ
の基準電圧信号は、温度センサの出力を用いて天
びん出力と等しい温度係数を持つよう調整され
る。つまり、センサユニツトからの二つの信号
は、相互に等しい温度係数に調整された状態で基
板側に出力される。
<Function> The balance output from the sensor unit side is input to the A-D converter on the board side, and this A-D
The reference voltage signal for the converter is also supplied from a reference voltage generator located on the sensor unit side. This reference voltage signal is then adjusted to have a temperature coefficient equal to the balance output using the output of the temperature sensor. In other words, the two signals from the sensor unit are output to the substrate side in a state where they are adjusted to have equal temperature coefficients.

すなわち、センサユニツトは単体で温度補償が
なされることになる。
In other words, temperature compensation is performed on the sensor unit alone.

一方、基板側では、センサユニツトから供給さ
れる基準電圧信号を基板側の温度係数調整部に導
き、ここでその基準電圧信号が一定の状態下でA
−D変換器の温度係数が零となるよう調整され
る。すなわち、A−D変換器の基準電圧信号は、
センサユニツト側で一旦天びん出力と等しい温度
係数に調整された後に基板に導かれ、ここでA−
D変換器と等しい温度係数を持つ信号に再調整さ
れる。
On the other hand, on the board side, the reference voltage signal supplied from the sensor unit is guided to the temperature coefficient adjustment section on the board side, where the reference voltage signal is adjusted to A
- The temperature coefficient of the D converter is adjusted to zero. That is, the reference voltage signal of the A-D converter is
Once adjusted to a temperature coefficient equal to the balance output on the sensor unit side, it is guided to the board, where A-
The signal is readjusted to have a temperature coefficient equal to that of the D converter.

従つて、以上のように調整されたセンサユニツ
トおよび基板は、相互に接続した状態で全体的な
調整をすることなく、直ちに、天びんとしての温
度係数が零となる。
Therefore, the sensor unit and the substrate adjusted as described above immediately have a temperature coefficient of zero as a balance without having to perform overall adjustment while connected to each other.

〈実施例〉 本考案の実施例を、以下、図面に基づいて説明
する。
<Example> An example of the present invention will be described below based on the drawings.

第1図は本考案実施例の構成を示すブロツク図
である。
FIG. 1 is a block diagram showing the configuration of an embodiment of the present invention.

この実施例は試料載台1上の試料の荷重による
ビームの変位を変位センサ2によつて検出し、フ
オースコイル3に電流を通じて磁石4を介して上
記荷重と平衡する電磁力を発生する電磁力平衡部
を構成してなるセンサユニツト5と、変位センサ
2出力を導入してフオースコイル3への供給電流
制御を行うサーボアンプ6や、フオースコイル3
に流れる電流の電圧変換値、、すなわち天びん出
力FをA−D変換部7によりデイジタル信号化
し、そのデイジタル信号出力を演算部8を経て表
示器9においてデイジタル表示する回路群を実装
してなる基板10からなり、磁石4に取り付けた
温度センサ11と、温度センサ11の出力を導入
して磁石4の温度係数と同等の温度係数のもとに
変化する電圧信号を発生するよう調整可能な電圧
発生部12がセンサユニツト5内に設けられ、A
−D変換部7と接続してこのA−D変換部7の温
度係数を調整する基板側温度係数調整部13が制
御基板10内に設けられ、電圧発生部12の出力
が基板側温度係数調整部13の入力に導入されて
いる。
In this embodiment, a displacement sensor 2 detects the displacement of the beam due to the load of the sample on the sample stage 1, and an electromagnetic force balance is used to generate an electromagnetic force that balances the load by passing a current through a force coil 3 and a magnet 4. a servo amplifier 6 which introduces the output of the displacement sensor 2 and controls the supply current to the force coil 3;
A board mounted with a circuit group that converts the voltage conversion value of the current flowing through the balance, that is, the balance output F, into a digital signal by an A-D converter 7, and digitally displays the digital signal output on a display 9 via an arithmetic unit 8. 10, a temperature sensor 11 attached to the magnet 4, and a voltage generator adjustable so as to introduce the output of the temperature sensor 11 to generate a voltage signal that changes with a temperature coefficient equivalent to that of the magnet 4. A section 12 is provided within the sensor unit 5, and A
- A board-side temperature coefficient adjustment unit 13 that is connected to the D conversion unit 7 and adjusts the temperature coefficient of the A-D conversion unit 7 is provided in the control board 10, and the output of the voltage generation unit 12 is adjusted to adjust the temperature coefficient of the A-D conversion unit 7. 13 is introduced into the input section 13.

電圧発生部12は基準電圧発生器を有し、温度
センサ11の出力を導入して磁石4の温度係数に
この基準電圧発生器の発生電圧の温度係数を調整
するための回路手段である。すなわち、電圧発生
部12は、磁石4の温度係数に起因して周囲温度
変化によつて変化する天びん出力Fと、同等の割
合で変化する電圧信号が発生するよう、その出力
の調整を行うことができる。
The voltage generator 12 has a reference voltage generator, and is circuit means for introducing the output of the temperature sensor 11 and adjusting the temperature coefficient of the voltage generated by the reference voltage generator to the temperature coefficient of the magnet 4. That is, the voltage generator 12 should adjust its output so that a voltage signal that changes at the same rate as the balance output F, which changes with changes in ambient temperature due to the temperature coefficient of the magnet 4, is generated. Can be done.

基板側温度係数調整部13はA−D変換部7の
基準電圧入力端子の前段に挿入され、例えば第2
図あるいは第3図のような回路によつて構成され
る。第2図の回路は正の温度係数をもつ抵抗R1
と負の温度係数をもつ抵抗R2の間に可変抵抗R3
を設けた回路であり、一定の基準電圧に対して基
板10すなわちA−D変換部7の温度係数が零と
なるよう、可変抵抗器R3によつて調節すること
ができる。第3図の回路は第2図の回路の抵抗
R2をダイオードDによつて構成した回路である。
The substrate-side temperature coefficient adjustment section 13 is inserted before the reference voltage input terminal of the A-D conversion section 7, and is inserted, for example, at the second
It is constructed by a circuit as shown in FIG. The circuit in Figure 2 uses a resistor R 1 with a positive temperature coefficient.
A variable resistor R 3 between and a resistor R 2 with a negative temperature coefficient
The temperature coefficient of the substrate 10, that is, the A-D converter 7, can be adjusted by a variable resistor R3 so that the temperature coefficient of the substrate 10, that is, the A-D converter 7, becomes zero with respect to a constant reference voltage. The circuit in Figure 3 is the resistance of the circuit in Figure 2.
This is a circuit in which R 2 is configured by a diode D.

次に作用と実際の調整手順について述べる。 Next, the effect and actual adjustment procedure will be described.

天びんの感度に対応する温度係数は磁石4とA
−D変換部7のそれぞれの温度係数の和である。
そこで、A−D変換部7の温度係数をあらかじめ
基板10側で補正し、基板10単体で温度係数が
零となるよう調整しておく。この作業は、基板1
0製造時のエージング工程において、一定の基準
電圧を基板側温度係数調整部13を介してA−D
変換部7の基準電圧入力端子に供給した状態で、
基板側温度係数調整部13の可変抵抗R3(もしく
はR8)を調整することによつて実施することが
できる。
The temperature coefficient corresponding to the sensitivity of the balance is magnet 4 and A.
- It is the sum of the respective temperature coefficients of the D converter 7.
Therefore, the temperature coefficient of the A-D converter 7 is corrected in advance on the substrate 10 side, and adjusted so that the temperature coefficient of the substrate 10 alone becomes zero. This work is done on board 1
In the aging process during 0 manufacturing, a constant reference voltage is applied to A-D through the substrate side temperature coefficient adjustment section 13.
While being supplied to the reference voltage input terminal of the converter 7,
This can be implemented by adjusting the variable resistance R 3 (or R 8 ) of the substrate side temperature coefficient adjustment section 13.

次に、以上の調整が完了した基板10を、セン
サユニツト5に接続する。そして、電圧発生部1
2の調整により電子天びん全体としての温度係数
が零となるよう設定する。この作業は、例えば試
料載台1への負荷を一定に保つた状態で、周囲温
度を変化させ、これによる天びん出力Fの変化に
も拘らず基板10における表示値が一定となるよ
う、電圧発生部12の調整によりA−D変換部7
に供給される基準電圧の周囲温度に対する変化の
割合、つまり温度係数を調節することによつて実
施される。すなわち、この電圧発生部12による
調整は、センサユニツト5に内蔵する磁石4の温
度係数に起因する天びん出力Fの変化を、別途単
体で温度補償されたA−D変換部7を用いてその
基準電圧を磁石4の特性に応じて変化させること
によつて相殺し、、これによつて実質的にセンサ
ユニツト5の温度補償を行うものである。
Next, the substrate 10 that has undergone the above adjustment is connected to the sensor unit 5. Then, voltage generating section 1
By adjusting step 2, the temperature coefficient of the electronic balance as a whole is set to zero. This work involves, for example, changing the ambient temperature while keeping the load on the sample stage 1 constant, and generating a voltage so that the displayed value on the board 10 remains constant despite the resulting change in the balance output F. By adjusting the section 12, the A-D converting section 7
This is done by adjusting the rate of change, or temperature coefficient, of the reference voltage supplied to the ambient temperature relative to the ambient temperature. That is, the adjustment by the voltage generator 12 uses the A-D converter 7, which is separately temperature-compensated, to convert the change in the balance output F caused by the temperature coefficient of the magnet 4 built into the sensor unit 5 into a standard. By changing the voltage according to the characteristics of the magnet 4, the voltage is offset, and thereby the temperature of the sensor unit 5 is substantially compensated.

A−D変換部7では、一般に、基準電圧の変化
に起因する変換出力の変化は一義的に決まるの
で、以上の調整がそれぞれ行われた任意のセンサ
ユニツト5と任意の基板10を接続しても、電子
天びん全体としての温度係数は零となる。
In the A-D converter 7, changes in the conversion output due to changes in the reference voltage are generally uniquely determined, so any sensor unit 5 and any board 10, each of which has been adjusted as described above, may be connected. Also, the temperature coefficient of the electronic balance as a whole is zero.

〈考案の効果〉 以上説明したように、本考案によれば、センサ
ユニツト側に、内蔵する磁石の温度係数と同じ温
度係数を持つ電圧を発生するよう調整可能な基準
電圧発生器を設け、基板側には、この基板内のA
−D変換器に供給される基準電圧が所定の一定値
の状態下でこのA−D変換器の温度係数が零とな
るよう調整し得る温度係数調整部を設けて、、セ
ンサユニツト側で天びん出力と等しい温度係数を
持つよう調整された基準電圧を、基板側の温度係
数調整部に導入してここで更にA−D変換器の温
度係数と一致するよう調整した後に、A−D変換
器に供給するよう構成したから、センサユニツト
および基板はそれぞれ単独で温度補償の調整が行
われることになり、組合せ後の調整が不要とな
る。
<Effects of the invention> As explained above, according to the invention, a reference voltage generator that can be adjusted to generate a voltage having the same temperature coefficient as the temperature coefficient of the built-in magnet is provided on the sensor unit side, and On the side, A in this board
- A temperature coefficient adjustment section that can adjust the temperature coefficient of the A-D converter to zero when the reference voltage supplied to the A-D converter is at a predetermined constant value is provided, and the balance is adjusted on the sensor unit side. A reference voltage adjusted to have a temperature coefficient equal to the output is introduced into the temperature coefficient adjustment section on the board side, where it is further adjusted to match the temperature coefficient of the A-D converter. Since the sensor unit and the substrate are configured to be supplied with temperature, the temperature compensation adjustment is performed independently for each of the sensor unit and the substrate, and there is no need for adjustment after the sensor unit and the board are combined.

つまり、センサユニツトと基板はそれぞれ互換
性が生じることになり、製造時あるいは修理時に
おける作業能率が向上することになる。特に基板
の温度係数調整は製造時のエージング工程におい
て行うことができ、工程数を増す必要がない。ま
た、基板のA−D変換部に高価な温度係数の優れ
た部品を用いる必要がないので、コストダウンに
寄与する。
In other words, the sensor unit and the board are compatible with each other, improving work efficiency during manufacturing or repair. In particular, the temperature coefficient adjustment of the substrate can be performed during the aging process during manufacturing, and there is no need to increase the number of processes. Further, since there is no need to use expensive components with excellent temperature coefficients in the A-D converter section of the board, it contributes to cost reduction.

更に、基板とセンサユニツトで熱容量の差が大
きく、周囲温度の急激な変化を生じたときに両者
の温度が異なつたものとなるが、このような場合
でも、十分な温度補償がなされる。
Further, there is a large difference in heat capacity between the substrate and the sensor unit, so that when a sudden change in ambient temperature occurs, the temperatures of the two become different. Even in such a case, sufficient temperature compensation can be performed.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、本考案実施例の構成を示すブロツク
図、第2図および第3図はその基板側温度係数調
整部の回路構成例を示す図である。 1……試料載台、2……変位センサ、3……フ
オースコイル、4……磁石、5……センサユニツ
ト、7……A−D変換部、10……基板、11…
…温度センサ、12……電圧発生部、13……基
板側温度係数調整部。
FIG. 1 is a block diagram showing the structure of an embodiment of the present invention, and FIGS. 2 and 3 are diagrams showing examples of the circuit structure of the substrate side temperature coefficient adjustment section. DESCRIPTION OF SYMBOLS 1... Sample mounting stage, 2... Displacement sensor, 3... Force coil, 4... Magnet, 5... Sensor unit, 7... A-D converter, 10... Substrate, 11...
...Temperature sensor, 12... Voltage generation section, 13... Board side temperature coefficient adjustment section.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 荷重と平衡する電磁力を発生するフオースコイ
ル及び磁石を備えた電磁力平衡部からなるユニツ
トと、上記フオースコイルへの供給電流を制御
し、上記電磁力平衡部出力をA−D変換器により
デジタル化して表示する回路手段からなる基板を
設けた装置において、上記ユニツト側に、上記磁
石に取り付けた温度センサと、その温度センサの
出力を入力して上記磁石の温度係数と同等の温度
係数のものとに温度によつて変化する電圧を発生
するよう調整可能な基準電圧発生器とを設け、上
記基板側には、上記基準電圧発生器の出力を入力
してその入力電圧値が所定の一定値の状態下で上
記A−D変換器の温度係数が零となるよう、その
入力電圧を変化させて上記A−D変換器に供給す
る基板側温度係数調整部を設けたことを特徴とす
る電子天びん。
A unit consisting of an electromagnetic force balance section including a force coil and a magnet that generates an electromagnetic force that balances the load, and a unit that controls the supply current to the force coil and digitizes the output of the electromagnetic force balance section using an A-D converter. In a device equipped with a board consisting of a display circuit means, on the side of the unit, a temperature sensor attached to the magnet and the output of the temperature sensor are inputted to obtain a temperature coefficient equivalent to that of the magnet. A reference voltage generator that can be adjusted to generate a voltage that changes depending on the temperature is provided, and the output of the reference voltage generator is input to the board side so that the input voltage value is kept at a predetermined constant value. 1. An electronic balance, characterized in that a substrate-side temperature coefficient adjustment section is provided for changing the input voltage and supplying the input voltage to the A-D converter so that the temperature coefficient of the A-D converter becomes zero.
JP1980140164U 1980-09-30 1980-09-30 Expired JPH0213939Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1980140164U JPH0213939Y2 (en) 1980-09-30 1980-09-30

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1980140164U JPH0213939Y2 (en) 1980-09-30 1980-09-30

Publications (2)

Publication Number Publication Date
JPS5763233U JPS5763233U (en) 1982-04-15
JPH0213939Y2 true JPH0213939Y2 (en) 1990-04-17

Family

ID=29500084

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1980140164U Expired JPH0213939Y2 (en) 1980-09-30 1980-09-30

Country Status (1)

Country Link
JP (1) JPH0213939Y2 (en)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4830664U (en) * 1971-08-19 1973-04-14
JPS52151052A (en) * 1976-06-10 1977-12-15 Kubota Ltd Weight indicator

Also Published As

Publication number Publication date
JPS5763233U (en) 1982-04-15

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