JPH02150028A - Centrifugal drying apparatus - Google Patents

Centrifugal drying apparatus

Info

Publication number
JPH02150028A
JPH02150028A JP30360488A JP30360488A JPH02150028A JP H02150028 A JPH02150028 A JP H02150028A JP 30360488 A JP30360488 A JP 30360488A JP 30360488 A JP30360488 A JP 30360488A JP H02150028 A JPH02150028 A JP H02150028A
Authority
JP
Japan
Prior art keywords
substrate
semiconductor substrate
chamber
centrifugal force
drying chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP30360488A
Other languages
Japanese (ja)
Inventor
Atsuji Matsuwaka
松若 敦二
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP30360488A priority Critical patent/JPH02150028A/en
Publication of JPH02150028A publication Critical patent/JPH02150028A/en
Pending legal-status Critical Current

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  • Drying Of Solid Materials (AREA)
  • Cleaning Or Drying Semiconductors (AREA)

Abstract

PURPOSE:To decompose and gasify organic materials remaining on the surface of a semiconductor substrate and to discharge it together with water content from a chamber by providing an ultraviolet ray generator in the chamber, and irradiating the surface of the substrate to which a centrifugal force is applied by centrifugal force applying means with ultraviolet rays. CONSTITUTION:A containing vessel 2 and a semiconductor substrate 1 are rotated by a drive source 6 to apply a centrifugal force thereto. A voltage is applied from a power source 11 to an ultraviolet lamp 10a to generate ultraviolet rays from the lamp 10a, thereby irradiating the substrate 1 with the ultraviolet rays. Thus, an organic material remaining on the surface of the substrate 1 is decomposed to be gasified. The gas is discharged on an air flow 13 from an air intake port 8 to a discharge tube 9 together with water content out of a drying chamber 5. Since the ultraviolet lamp is provided in the drying chamber, the substrate is irradiated with the ultraviolet rays at the time of drying to gasify the organic material remaining on the substrate to thereby remove it and to improve the yield of the substrate.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は半導体デバイスの製造工程にてウェット処理さ
れた後の半導体基板の乾燥に使用する遠心乾燥装置に関
する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a centrifugal drying apparatus used for drying a semiconductor substrate after wet processing in a semiconductor device manufacturing process.

[従来の技術] 第3図は従来の遠心乾燥装置をを示す縦断面図である。[Conventional technology] FIG. 3 is a longitudinal sectional view showing a conventional centrifugal drying device.

収納容器2内にはウェット処理後の多数の半導体基板1
がその面を水平にして収納されており、この収納容器2
は乾燥室5内にその回転中心を鉛直にして回転可能に設
置されるようになっている。乾燥室らの頭部に設けられ
たN7は脱着可能になっており、蓋7を収り外すことに
より乾燥室5内に対する半導体基板1の装入及び収出を
行う。蓋7には多数の空気取入口8が設けられていて、
蓋7が乾燥室5の頭部に設置された場合には、この空気
取入口8を介して空気が乾燥室5内に供給される。乾燥
室5の底部5aには、その周縁部に排気管9が設けられ
ており、前述の空気取入口8を介して乾燥室5内に導入
された空気は図中矢印にて示す空気流13となって乾燥
室5内を通流し、排気管9から外部に排出される。
Inside the storage container 2 are a large number of semiconductor substrates 1 after wet processing.
is stored with its surface horizontal, and this storage container 2
is rotatably installed in the drying chamber 5 with its center of rotation being vertical. The N7 provided at the head of the drying chamber is removable, and by removing the lid 7, the semiconductor substrates 1 can be loaded into and taken out of the drying chamber 5. The lid 7 is provided with a large number of air intake ports 8,
When the lid 7 is installed at the head of the drying chamber 5, air is supplied into the drying chamber 5 through the air intake port 8. An exhaust pipe 9 is provided at the periphery of the bottom 5a of the drying chamber 5, and the air introduced into the drying chamber 5 through the air intake port 8 described above flows through an air flow 13 indicated by an arrow in the figure. This flows through the drying chamber 5 and is discharged from the exhaust pipe 9 to the outside.

乾燥室5の底部5aの下方には、モータ等の駆動源6が
その駆動軸3を鉛直にし、先端を上方に向けて設けられ
ている。この駆動軸3は乾燥室5の底部5aの中央に設
けられた軸受部4により支持されており、その先端部が
軸受部4を挿通して乾燥室5内に挿入されている。そし
て、駆動軸3の先端部は乾燥室5内の収納容器2に連結
されており、駆動源6が起動されて駆動軸3が回転する
ことにより、゛収納容器2は所定の回転速度で鉛直軸の
周りに回転駆動される。
Below the bottom 5a of the drying chamber 5, a drive source 6 such as a motor is provided with its drive shaft 3 vertical and its tip facing upward. This drive shaft 3 is supported by a bearing section 4 provided at the center of the bottom 5a of the drying chamber 5, and its tip end is inserted into the drying chamber 5 through the bearing section 4. The tip of the drive shaft 3 is connected to the storage container 2 in the drying chamber 5, and when the drive source 6 is activated and the drive shaft 3 rotates, the storage container 2 is vertically moved at a predetermined rotational speed. Driven to rotate around an axis.

このように構成された従来装置においては、ウェット処
理後の半導体基板1を収納容器2内に収納し、この収納
容器2を乾燥室5内に設置した後、駆動源6を起動して
収納容器2をその中心の鉛直回転軸の周りに高速回転さ
せる。そうすると、収納容器2内の半導体基板1には遠
心力が作用し、半導体基板1の表面に付着していた水分
が半導体基板1の面に平行の方向に飛散する。この水分
は蓋7の空気取入口8から乾燥室5内に導入された空気
流13にのって乾燥室5の外部に排出される。
In the conventional apparatus configured as described above, the semiconductor substrate 1 after wet processing is stored in the storage container 2, and after this storage container 2 is installed in the drying chamber 5, the drive source 6 is activated to move the storage container 2 is rotated at high speed around its central vertical axis of rotation. Then, a centrifugal force acts on the semiconductor substrate 1 in the storage container 2, and the moisture adhering to the surface of the semiconductor substrate 1 is scattered in a direction parallel to the surface of the semiconductor substrate 1. This moisture is discharged to the outside of the drying chamber 5 along with the air flow 13 introduced into the drying chamber 5 through the air intake port 8 of the lid 7.

[発明が解決しようとする課題] しかしながら、上述した従来の遠心乾燥装置においては
、半導体基板1に付着していた水分は除去することかで
きるものの、半導体基板1の表面に付着していた有機物
は除去することができず、そのまま半導体基板1の表面
に残留してしまうという欠点がある。
[Problems to be Solved by the Invention] However, in the above-described conventional centrifugal drying apparatus, although moisture adhering to the semiconductor substrate 1 can be removed, organic substances adhering to the surface of the semiconductor substrate 1 can be removed. The disadvantage is that it cannot be removed and remains on the surface of the semiconductor substrate 1 as it is.

本発明はかかる問題点に鑑みてなされたものであって、
水分に加えて有機物も半導体基板の表面から除去するこ
とができる遠心乾燥装置を提供することを目的とする。
The present invention has been made in view of such problems, and includes:
It is an object of the present invention to provide a centrifugal drying device that can remove not only moisture but also organic matter from the surface of a semiconductor substrate.

し課題を解決するための手段] 本発明に係る遠心乾燥装置は、半導体基板が装入される
チャンバと、このチャンバ内で前記半導体基板に遠心力
を付与して脱水乾燥させる遠心力付与手段と、前記チャ
ンバ内に設けられ前記半導体基板に紫外線を照射する紫
外線発生器とを有することを特徴とする。
[Means for Solving the Problems] A centrifugal drying apparatus according to the present invention includes a chamber into which a semiconductor substrate is charged, and a centrifugal force applying means for applying centrifugal force to the semiconductor substrate to dehydrate and dry the semiconductor substrate within the chamber. , further comprising an ultraviolet generator provided in the chamber and irradiating the semiconductor substrate with ultraviolet rays.

[作用] 本発明においては、チャンバ内に紫外線発生器を設け、
遠心力付与手段により遠心力を付与されている半導体基
板の表面に紫外線を照射する。これにより、半導体基板
の表面に残留している有機物が分解してガス化し、水分
と共にチャンバ内から排出される。
[Function] In the present invention, an ultraviolet ray generator is provided in the chamber,
Ultraviolet rays are irradiated onto the surface of the semiconductor substrate to which centrifugal force is applied by centrifugal force applying means. As a result, the organic matter remaining on the surface of the semiconductor substrate is decomposed and gasified, and is discharged from the chamber together with the moisture.

[実施例] 次に、本発明の実施例について添付の図面を参照して説
明する。
[Example] Next, an example of the present invention will be described with reference to the accompanying drawings.

第1図は本発明の第1の実施例を示す縦断面図である。FIG. 1 is a longitudinal sectional view showing a first embodiment of the present invention.

第1図において、第3図と同一物は同一符号を付してそ
の詳しい説明を省略する。
In FIG. 1, the same parts as in FIG. 3 are given the same reference numerals, and detailed explanation thereof will be omitted.

乾燥室5の蓋7には、その中央に棒状の紫外線ランプ1
0aが乾燥室5の中心に位置するようにその長手方向を
鉛直にして垂架されている。紫外線ランプ10aには電
源11がケーブル12により接続されている。
A rod-shaped ultraviolet lamp 1 is installed in the center of the lid 7 of the drying chamber 5.
The drying chamber 5 is suspended vertically with its longitudinal direction being vertical so that 0a is located at the center of the drying chamber 5. A power source 11 is connected to the ultraviolet lamp 10a via a cable 12.

このように構成された遠心乾燥装置においては、駆動源
6の駆動により収納容器2及び半導体基板1を回転させ
て遠心力を付与するときに、電源11から紫外線ランプ
10aに給電し、このランプ10aから紫外線を発光さ
せ、この紫外線で半導体基板1を照射する。これにより
、半導体基板1の表面に残留している有機物が分解し、
ガス化される。このガスは空気取入口8から排気管9へ
至る空気流13にのって、水分と共に乾燥室5外へ排出
される。
In the centrifugal drying apparatus configured in this way, when the storage container 2 and the semiconductor substrate 1 are rotated by driving the drive source 6 to apply centrifugal force, power is supplied from the power source 11 to the ultraviolet lamp 10a, and the ultraviolet lamp 10a is The semiconductor substrate 1 is irradiated with ultraviolet rays. As a result, the organic substances remaining on the surface of the semiconductor substrate 1 are decomposed, and
gasified. This gas is carried by an air flow 13 extending from the air intake port 8 to the exhaust pipe 9, and is discharged to the outside of the drying chamber 5 together with moisture.

第2図は本発明の第2の実施例を示す縦断面図である。FIG. 2 is a longitudinal sectional view showing a second embodiment of the invention.

第2図において、第1図と同一物には同一符号を付して
説明を省略する。本実施例においては、紫外線ランプ1
0bが乾燥室5の側壁内面に取付られている。
In FIG. 2, the same parts as in FIG. 1 are given the same reference numerals, and their explanations will be omitted. In this embodiment, the ultraviolet lamp 1
0b is attached to the inner surface of the side wall of the drying chamber 5.

この実施例では、ランプ10bを第1の実施例の場合よ
りも多数設けることができるという利点を有するため、
有機物の分解ガス化がより一層迅速化される。
This embodiment has the advantage that a larger number of lamps 10b can be provided than in the first embodiment.
The decomposition and gasification of organic matter is further accelerated.

[発明の効果] 以上説明したように本発明は、紫外線ランプを遠心乾燥
用チャンバ内へ設けたから、乾燥時に半導体基板に紫外
線を照射することにより、半導体基板に残留する有機物
をガス化して除去することができ、半導体基板の歩留り
を著しく向上させることができるという効果を奏する。
[Effects of the Invention] As explained above, in the present invention, since the ultraviolet lamp is provided in the centrifugal drying chamber, organic matter remaining on the semiconductor substrate is gasified and removed by irradiating the semiconductor substrate with ultraviolet rays during drying. This has the effect that the yield of semiconductor substrates can be significantly improved.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の第1の実施例に係る遠心乾燥装置を示
す縦断面図、第2図は本発明の第2の実施例に係る遠心
乾燥装置を示す縦断面図、第3図は従来の遠心乾燥装置
を示す縦断面図である。 1;半導体基板、2;収納容器、3;駆動軸、4;軸受
部、5;乾燥室、6;駆動源、7;蓋、8;空気収入口
、9;排気管、10a、10b;紫外線ランプ、11;
電源、12;ケーブル、13;空気流 8; 9に〃スD
FIG. 1 is a longitudinal cross-sectional view showing a centrifugal drying apparatus according to a first embodiment of the present invention, FIG. 2 is a longitudinal cross-sectional view showing a centrifugal drying apparatus according to a second embodiment of the present invention, and FIG. FIG. 2 is a longitudinal cross-sectional view showing a conventional centrifugal drying device. 1; Semiconductor substrate, 2; Storage container, 3; Drive shaft, 4; Bearing part, 5; Drying chamber, 6; Drive source, 7; Lid, 8; Air intake port, 9; Exhaust pipe, 10a, 10b; Ultraviolet rays Lamp, 11;
Power supply, 12; Cable, 13; Air flow 8;

Claims (1)

【特許請求の範囲】[Claims] (1)半導体基板が装入されるチャンバと、このチャン
バ内で前記半導体基板に遠心力を付与して脱水乾燥させ
る遠心力付与手段と、前記チャンバ内に設けられ前記半
導体基板に紫外線を照射する紫外線発生器とを有するこ
とを特徴とする遠心乾燥装置。
(1) A chamber into which a semiconductor substrate is loaded; a centrifugal force applying means for dehydrating and drying the semiconductor substrate by applying centrifugal force to the semiconductor substrate within the chamber; and a centrifugal force applying means provided within the chamber for irradiating the semiconductor substrate with ultraviolet rays. A centrifugal drying device characterized by having an ultraviolet ray generator.
JP30360488A 1988-11-30 1988-11-30 Centrifugal drying apparatus Pending JPH02150028A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP30360488A JPH02150028A (en) 1988-11-30 1988-11-30 Centrifugal drying apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP30360488A JPH02150028A (en) 1988-11-30 1988-11-30 Centrifugal drying apparatus

Publications (1)

Publication Number Publication Date
JPH02150028A true JPH02150028A (en) 1990-06-08

Family

ID=17922998

Family Applications (1)

Application Number Title Priority Date Filing Date
JP30360488A Pending JPH02150028A (en) 1988-11-30 1988-11-30 Centrifugal drying apparatus

Country Status (1)

Country Link
JP (1) JPH02150028A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7282098B2 (en) * 2002-03-15 2007-10-16 Seiko Epson Corporation Processing-subject cleaning method and apparatus, and device manufacturing method and device
JP2010225936A (en) * 2009-03-24 2010-10-07 Dainippon Screen Mfg Co Ltd Method and device for processing substrate
CN111238177A (en) * 2019-11-19 2020-06-05 耒阳市刘燕酿制生物科技有限公司 Dewatering device for food processing

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7282098B2 (en) * 2002-03-15 2007-10-16 Seiko Epson Corporation Processing-subject cleaning method and apparatus, and device manufacturing method and device
JP2010225936A (en) * 2009-03-24 2010-10-07 Dainippon Screen Mfg Co Ltd Method and device for processing substrate
CN111238177A (en) * 2019-11-19 2020-06-05 耒阳市刘燕酿制生物科技有限公司 Dewatering device for food processing

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