JPH0216245Y2 - - Google Patents

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Publication number
JPH0216245Y2
JPH0216245Y2 JP12977983U JP12977983U JPH0216245Y2 JP H0216245 Y2 JPH0216245 Y2 JP H0216245Y2 JP 12977983 U JP12977983 U JP 12977983U JP 12977983 U JP12977983 U JP 12977983U JP H0216245 Y2 JPH0216245 Y2 JP H0216245Y2
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JP
Japan
Prior art keywords
light
measured
pit
measurement
measuring
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Expired
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Japanese (ja)
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JPS6037807U (en
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Description

【考案の詳細な説明】 〔産業上の利用分野〕 この考案は、特に、光学式デイスクの信号溝で
ある信号ピツト(以下、単にピツトという。)の
深さの測定に最適な測定器に関するものである。
[Detailed description of the invention] [Industrial field of application] This invention particularly relates to a measuring instrument most suitable for measuring the depth of a signal pit (hereinafter simply referred to as a pit), which is a signal groove of an optical disk. It is.

〔従来の技術〕[Conventional technology]

ビデイオ・デイスク、D.A.D(デイジタル・オ
ーデイオ・デイスク)などの光学式デイスクは、
ガラス板の表面にフオト・レジスト液を塗布した
フオト・レジスト原盤にレーザ光を照射して渦巻
状の凹部からなるピツトを形成してマスタ原盤を
形成し、次いで、このマスタ原盤にニツケル電鋳
を行なつてニツケル・スタンパを形成する。
Optical disks such as video disks and DAD (digital audio disks)
A master master disc is formed by irradiating a photo resist master disc with a photo resist liquid applied to the surface of a glass plate to form pits consisting of spiral recesses, and then nickel electroforming is applied to this master master master disc. to form a nickel stamper.

そして、このニツケル・スタンパに樹脂モール
ドすることによつてプラスチツク・モールド盤を
形成し、さらに、このプラスチツク・モールド盤
の表面にアルミニウムを蒸着して反射膜を形成す
るとともに、この反射膜の上面にアクリル樹脂な
どの透明度の高いプラスチツクを接着することに
より、市販されている光学式デイスクを形成す
る。
Then, a plastic mold disk is formed by resin-molding this nickel stamper, and a reflective film is formed by vapor-depositing aluminum on the surface of this plastic mold disk, and a reflective film is formed on the top surface of this reflective film. A commercially available optical disk is formed by gluing a highly transparent plastic such as acrylic resin.

上述のような工程を経て光学式デイスクは製造
されるが、マスタ原盤からのニツケル・スタンパ
の転写、また、ニツケル・スタンパからプラスチ
ツク・モールド盤への転写がそれぞれ精密に行な
われないと、再生時における忠実度が劣化するこ
とになる。
Optical discs are manufactured through the processes described above, but if the transfer of the nickel stamper from the master disc and the transfer from the nickel stamper to the plastic mold disc are not performed accurately, problems may occur during playback. fidelity will be degraded.

そこで、従来、これらデイスクの半製品毎の転
写における忠実度を測定する方法として、ピツト
の深さを測定することで忠実度を測定できること
が知られている。
Conventionally, it has been known to measure the fidelity of transfer for each semi-finished disk by measuring the depth of the pits.

すなわち、この方法は、第1図に示すように、
ニツケル・スタンパ、プラスチツク・モールド盤
などの半製品としてのデイスク1のピツト1a面
に、例えばレーザ光を照射して生ずる回折現象に
より、レーザ光の強さを測定してピツト1aの深
さを間接的に知る方法である。
That is, this method, as shown in Figure 1,
The depth of the pits 1a can be indirectly determined by measuring the intensity of the laser light using a diffraction phenomenon that occurs when, for example, a laser beam is irradiated onto the pit 1a surface of the disk 1 as a semi-finished product such as a nickel stamper or a plastic mold board. This is a method of knowing.

なお、ξはピツト1aの短辺の中点を通つてピ
ツト列に沿つて伸びるトラツク(タンジエンシヤ
ル)方向の座標軸を、ηは座標軸ξと直交してピ
ツト1aの長辺の中点を通つて伸びるラジアル
(トラツキング)方向の座標軸を、Zは2つの座
標軸ξ,ηが形成する面に対して直交方向に伸び
る座標軸を、pはピツト1aの波長を、βはピツ
ト1aの長さを、rはピツト1aの幅を、qはピ
ツト1aのトラツク・ピツチをそれぞれ表わす。
Note that ξ is a coordinate axis in the track (tangential) direction that extends along the pit row through the midpoint of the short side of pit 1a, and η is a coordinate axis that is perpendicular to the coordinate axis ξ and extends through the midpoint of the long side of pit 1a. Z is the coordinate axis in the radial (tracking) direction, Z is the coordinate axis extending perpendicular to the plane formed by the two coordinate axes ξ and η, p is the wavelength of pit 1a, β is the length of pit 1a, and r is q represents the width of the pit 1a, and q represents the track pitch of the pit 1a, respectively.

そして、光線の強さを測定してピツト1aの深
さを間接的に知る方法としては、第2図に示すよ
うに、デイスク1に照射した透過光のうち、屈曲
度の異なる0次光2a、1次光2b、2次光2c
…の強度をそれぞれ測定することによつてピツト
1aの深さを間接的に知る透過式測定法と、第3
図に示すように、デイスク1に照射した反射光の
うち、反射率の異なる0次光2a、1次光2b、
2次光2cの強度をそれぞれ測定することによつ
てピツト1aの深さを間接的に知る反射式測定法
がある。
As shown in FIG. 2, as a method for indirectly knowing the depth of the pit 1a by measuring the intensity of the light beam, among the transmitted light irradiated onto the disk 1, zero-order light 2a having a different degree of curvature is used. , primary light 2b, secondary light 2c
The depth of pit 1a can be indirectly determined by measuring the intensity of...
As shown in the figure, among the reflected lights irradiated onto the disk 1, zero-order light 2a, first-order light 2b, and
There is a reflection measurement method that indirectly determines the depth of the pit 1a by measuring the intensity of the secondary light 2c.

このうち、第4図に基づいて透過式測定法にお
ける装置の詳細を説明すると、発光器3から、
1mW、λ=6328Åのレーザ光(He−Neレーザ
光)4をチヨツパ5を介して変調することによ
り、外来光の影響を受けないようにしてデイスク
1に照射し、ピツト1aの有無によつて生ずる回
折現象で透過度が異なる±1次光2b,2′bの
強度を受光素子などの受光器6で光−電気変換し
た後、アンプ7で増幅し、これをシンクロ・スコ
ープ8に表われる波形によつてレベル表示させ、
その波高からピツト1aの深さを測定する。
Of these, the details of the apparatus in the transmission measurement method will be explained based on FIG. 4. From the light emitter 3,
A laser beam (He-Ne laser beam) 4 of 1 mW, λ = 6328 Å is modulated via a chopper 5 to irradiate the disk 1 without being affected by external light, and depending on the presence or absence of the pit 1a, The intensity of the ±1st-order lights 2b and 2'b, which have different transmittances due to the diffraction phenomenon that occurs, is subjected to optical-to-electrical conversion by a light receiver 6 such as a light receiving element, then amplified by an amplifier 7 and displayed on a synchroscope 8. The level is displayed by the waveform,
The depth of pit 1a is measured from the wave height.

これを式で示すと、 1次回折効率=1次回折光強度/0次光強度 =1次光光電流/0次光光電流 =f(d,a,h) となる。 Expressing this in the formula, 1st order diffraction efficiency = 1st order diffraction light intensity / 0th order light intensity =1st order photocurrent/0th order photocurrent =f(d,a,h) becomes.

ここで、fは関数、dはデユーテイ、aはピツ
ト1aの幅、hはピツト1aの深さを示し、デユ
ーテイd、幅aが分かれば、ピツト1aの深さh
を知ることができる。
Here, f is the function, d is the duty, a is the width of the pit 1a, h is the depth of the pit 1a, and if the duty d and width a are known, the depth h of the pit 1a is
can be known.

ところで、デユーテイd、幅aはマスタリング
などの条件でほぼ一定しているので、1次回折効
率を被測定物としての各々のデイスク1について
比較することにより、インジエクシヨン法によつ
て成型されるピツト1aの深さhの相対比較が可
能となる。
By the way, since the duty d and the width a are almost constant under conditions such as mastering, by comparing the first-order diffraction efficiency of each disk 1 as the object to be measured, it is possible to determine the diameter of the pit 1a formed by the injection extrusion method. It becomes possible to perform a relative comparison of the depth h.

〔考案が解決しようとする課題〕[The problem that the idea attempts to solve]

しかしながら、上記のような従来の装置ではデ
イスク1の測定場所が一定しないため、再現性に
乏ぼしく、しかも測定を行なうには、例えば0次
光2aと1次光2bの2種類のレーザ光を測定す
る必要があるが、受光器6は1つしか装備されて
いない。
However, in the conventional device as described above, the measurement location on the disk 1 is not constant, resulting in poor reproducibility.Moreover, in order to perform the measurement, for example, two types of laser beams, the zero-order light 2a and the first-order light 2b, are required. However, only one light receiver 6 is equipped.

従つて、測定の都度、受光器6を移動させて個
別に測定を繰り返さなければならないので、安定
した測定値を得ることができずに測定精度が低下
する。
Therefore, each time a measurement is made, it is necessary to move the light receiver 6 and repeat the measurement individually, making it impossible to obtain a stable measurement value, resulting in a decrease in measurement accuracy.

これは、測定距離が一定しないと、光レベルは
距離の2乗で変わつて精度が低下すること、測定
者間による測定値の読取り誤差が大きいことに起
因する。
This is because if the measurement distance is not constant, the light level changes as the square of the distance, resulting in a decrease in accuracy, and there is a large error in reading the measurement value between operators.

そして、受光器6を移動させて個別に測定を繰
り返すため、測定時間が長くなり、また、繰り返
し測定中に光源光量レベルが変化すれば、前記1
次回折効率の値はその精度が低下する。
Since the light receiver 6 is moved and measurements are repeated individually, the measurement time becomes longer, and if the light source light intensity level changes during repeated measurements,
The accuracy of the value of the diffraction efficiency decreases.

さらに、上述した欠点を解消するために、複数
の受光器を透過式測定法、反射式測定法、および
複数種デイスク(被測定物)、回折光に対応させ
て設けると、装置が大型化する欠点がある。
Furthermore, in order to eliminate the above-mentioned drawbacks, if multiple light receivers are provided for transmission measurement method, reflection measurement method, multiple types of disks (objects to be measured), and diffracted light, the device becomes larger. There are drawbacks.

この考案は、上述の如き欠点に鑑みてなされた
ものであり、短時間で安定して光線の強さが測定
でき、被測定物の被測定場所を一定した再現性で
測定読取誤差を少なくして測定でき、透過式測定
法、反射式測定法にも使用でき、複数種の被測定
物を測定するものに対応させても小型化が容易な
光学式デイスクのピツト測定器を提供するもので
ある。
This idea was created in view of the above-mentioned shortcomings, and it is possible to stably measure the intensity of the light beam in a short time, and to reduce the measurement reading error with constant reproducibility of the measurement location of the object to be measured. The purpose of the present invention is to provide an optical disk pit measuring instrument that can be used for both transmission measurement and reflection measurement, and can be easily miniaturized even when adapted to measure multiple types of objects. be.

〔課題を解決するための手段〕[Means to solve the problem]

この考案にかかる光学式デイスクのピツト測定
器は、測定台の中心軸を中心とした円上を回動す
るとともに、円上の任意な位置に固定可能な2つ
の支持体と、この2つの支持体にそれぞれ取り付
けられ、被測定物を透過した、または被測定物で
反射された光を受光するための2つの受光器を備
えたものである。
The optical disk pit measuring device according to this invention rotates on a circle around the central axis of the measuring table, and has two supports that can be fixed at arbitrary positions on the circle, and these two supports. The device is equipped with two light receivers each attached to the body to receive light transmitted through or reflected by the object to be measured.

〔作用〕[Effect]

この考案における光学式デイスクのピツト測定
器は、2つの支持体を回動させて所定の位置に固
定させることにより、被測定物から光を2つの受
光器で受光することができる。
The optical disc pit measuring device according to this invention can receive light from an object to be measured using two light receivers by rotating two supports and fixing them at predetermined positions.

従つて、測定距離を一定とした測定ができ、2
つの支持体を回動させて固定することにより、透
過式測定法、反射式測定法にも対応させることが
できる。
Therefore, measurements can be made with a constant measurement distance, and 2
By rotating and fixing the two supports, it is also possible to correspond to transmission measurement method and reflection measurement method.

〔実施例〕〔Example〕

以下、この考案の一実施例を第5図および第6
図に基づいて説明する。
An example of this invention is shown below in Figures 5 and 6.
This will be explained based on the diagram.

なお、第5図、第6図において、第1図〜第4
図と同一部分には同一符号が付してある。
In addition, in Figures 5 and 6, Figures 1 to 4
The same parts as those in the figure are given the same reference numerals.

この実施例では基本的に、ビデイオ・デイス
ク、D.A.Dなどの光デイスクの半製品としてのニ
ツケル・スタンパ、またはプラスチツク・モール
ド盤などの被測定物10と、この被測定物10を
測定に供するためにセツトする測定台11と、被
測定物10を一定速度で回転させるためのモータ
12と、被測定物10を、測定台11上を往復移
動させるための送り機構13と、被測定物10に
レーザ光4を照射させるための発光器3と、被測
定物10の中心を中心とした円上を移動自在で、
被測定物10に照射されたレーザ光4を検知する
ために受光素子で形成された受光器14,15
と、この受光器14,15を測定台11の周囲の
任意な位置に固定するための位置決め手段16か
ら形成される。
This embodiment basically includes an object to be measured 10 such as a nickel stamper as a semi-finished product of an optical disk such as a video disk or a DAD, or a plastic mold disk, and a device to be measured. A measuring table 11 to be set, a motor 12 for rotating the object to be measured 10 at a constant speed, a feeding mechanism 13 for reciprocating the object to be measured 10 on the measuring table 11, and a laser beam to the object to be measured 10. a light emitter 3 for irradiating light 4;
Light receivers 14 and 15 formed of light receiving elements to detect the laser beam 4 irradiated onto the object to be measured 10
and a positioning means 16 for fixing the light receivers 14 and 15 at arbitrary positions around the measuring table 11.

測定台11は基本ベース17に嵌入固定された
固定ボス18を介して基本ベース17上に間隙1
9を存して固定される。
The measuring table 11 is mounted on the basic base 17 through a fixed boss 18 that is fitted into and fixed to the basic base 17.
9 and is fixed.

20は固定ボス18にボルト21により固定さ
れた取付枠である。
Reference numeral 20 denotes a mounting frame fixed to the fixed boss 18 with bolts 21.

また、送り機構13は取付枠20の側面に設け
たモータ22のモータ・シヤフト22aにジヨイ
ント22bを介して同軸に取り付けられたスクリ
ユ・シヤフト23と、このスクリユ・シヤフト2
3に螺合されてモータ12が固定されたスクリユ
筒24と、スクリユ・シヤフト23を回転自在に
支持するために取付基板25上に立設された支柱
26,27から形成される。
The feed mechanism 13 also includes a screw shaft 23 coaxially attached to a motor shaft 22a of a motor 22 provided on the side surface of the mounting frame 20 via a joint 22b,
3 and to which the motor 12 is fixed, and pillars 26 and 27 erected on a mounting board 25 to rotatably support the screw shaft 23.

28はスクリユ筒24を一定距離移動させるた
めのストツパ機構であり、このストツパ機構28
はスクリユ筒24の下端に突設された突片24a
と、この突片24aから間隔をあけるように取付
基板25上に対設された位置規制スイツチ29,
30から形成される。
28 is a stopper mechanism for moving the screw cylinder 24 a certain distance;
is a protrusion 24a protruding from the lower end of the screw tube 24.
and a position regulating switch 29, which is disposed oppositely on the mounting board 25 so as to be spaced apart from the protruding piece 24a.
Formed from 30.

32は発光器3を被うシールド函である。 32 is a shield box that covers the light emitter 3.

また、受光器14,15は測定台11の外周に
回動自在に立設された支柱33,34に取り付け
られ、支柱33,34を測定台11に回転自在に
取り付ける手段としては、測定台11と基本ベー
ス17の間隙19内に支柱33,34の下端に直
角に固着した取付片33a,34aを移動自在に
差し込むとともに、取付片33a,34aにコイ
ルばね35を介して装設した突起36を測定台1
1の下面外周に設けた環状溝37内に挿入してい
る。
Further, the light receivers 14 and 15 are attached to columns 33 and 34 that are rotatably erected on the outer periphery of the measurement table 11, and as means for rotatably attaching the columns 33 and 34 to the measurement table 11, The mounting pieces 33a, 34a fixed at right angles to the lower ends of the columns 33, 34 are movably inserted into the gap 19 of the basic base 17, and the protrusions 36 attached to the mounting pieces 33a, 34a via coil springs 35 are inserted. Measuring table 1
It is inserted into an annular groove 37 provided on the outer periphery of the lower surface of 1.

さらに、受光器14,15を測定台11の周囲
の任意な位置に固定するための位置決め手段16
としては、環状溝37に、コイルばね35によつ
てばね附勢された突起36が落ち込む凹陥部37
aを設ける。
Further, a positioning means 16 for fixing the light receivers 14 and 15 at arbitrary positions around the measuring table 11.
, a recessed portion 37 into which a projection 36 biased by a coil spring 35 falls into an annular groove 37.
Provide a.

受光器14,15は支柱33,34に対する取
付高さを調整するために、支柱33,34に設け
たスリツト38内に移動自在にしたビス39によ
つて固定されている。
The light receivers 14 and 15 are fixed by movable screws 39 within slits 38 provided in the supports 33 and 34 in order to adjust the mounting height relative to the supports 33 and 34.

40は発光器3から照射されるレーザ光4の光
路を変更するためのミラー、5はミラー40と被
測定物10の間に配置されたチヨツパであり、こ
のチヨツパ5は多数設けたスリツト内にレーザ光
4が投射されると、レーザ光4を変調光として被
測定物10に供給し、周囲からの外来光の影響を
受けないようにして測定を精密にするためのもの
である。
40 is a mirror for changing the optical path of the laser beam 4 emitted from the light emitter 3; 5 is a chopper placed between the mirror 40 and the object to be measured 10; When the laser beam 4 is projected, the laser beam 4 is supplied as modulated light to the object to be measured 10, thereby making the measurement more precise without being influenced by extraneous light from the surroundings.

41は電源およびコンピユータなどが内蔵され
ている操作部である。
Reference numeral 41 denotes an operation section in which a power supply, a computer, etc. are built-in.

この考案の一実施例は上述のように構成され、
測定を行なうにはビデイオ・デイスク、D.A.Dな
どの光デイスクの半製品としてのニツケル・スタ
ンパ、またはプラスチツク・モールド盤などから
なる被測定物10をクランパによつてモータ12
のモータ・シヤフト12aにクランプする。
One embodiment of this invention is constructed as described above,
To perform measurements, the object to be measured 10, which is a nickel stamper as a semi-finished product of an optical disk such as a video disk or DAD, or a plastic mold disk, is moved by a motor 12 using a clamper.
clamp to the motor shaft 12a.

そして、発光器3からレーザ光4を放出してミ
ラー40によつて光路を変えた後、チヨツパ5の
スリツト内に投射して変調光とし、外来光の影響
を受けないようにしてから被測定物10に照射
し、測定を行なうが、以下に測定方法を詳述す
る。
Then, the laser beam 4 is emitted from the light emitter 3, the optical path is changed by the mirror 40, and then it is projected into the slit of the chopper 5 to become modulated light.Then, the laser beam 4 is made to be a modulated light so as not to be affected by external light. The object 10 is irradiated and measured, and the measuring method will be described in detail below.

まず、被測定物10はモータ12によつて定速
回転され、送り機構13のスクリユ・シヤフト2
3がモータ22によつて回転され、スクリユ・シ
ヤフト23に螺合しているスクリユ筒24が移動
することにより、レーザ光4は被測定物10の半
径方向に照射される。
First, the object to be measured 10 is rotated at a constant speed by the motor 12, and the screw shaft 2 of the feed mechanism 13 is rotated at a constant speed by the motor 12.
3 is rotated by a motor 22, and a screw tube 24 screwed into a screw shaft 23 moves, whereby the laser beam 4 is radiated onto the object 10 to be measured in the radial direction.

そして、送り機構13は被測定物10の半径方
向に往復移動可能であるが、スクリユ筒24の下
端に突設された突片24aが位置規制スイツチ2
9,30をオンさせる距離だけ移動自在である。
The feed mechanism 13 is capable of reciprocating in the radial direction of the object to be measured 10, but a protrusion 24a protruding from the lower end of the screw tube 24 controls the position regulation switch 2.
It is movable by the distance that turns on 9 and 30.

さらに、円形状の測定台11の外周には支柱3
3,34に取り付けられた受光器14,15が移
動自在に取り付けられているので、受光器14,
15を、被測定物10を境に発光器3と反対側に
移動させた場合には透過式測定器として使用で
き、被測定物10を境として発光器3と同じ側に
受光器14,15を移動させた場合には反射式測
定器として使用できる。
Further, a support 3 is provided on the outer periphery of the circular measuring table 11.
Since the light receivers 14 and 15 attached to 3 and 34 are movably attached, the light receivers 14 and
15 can be used as a transmission type measuring device if it is moved to the opposite side of the object to be measured 10 from the emitter 3, and the receivers 14 and 15 are placed on the same side of the object to be measured 10 as the emitter 3. When moved, it can be used as a reflective measuring device.

また、測定にあたつて発光器3から放出され、
ミラー40によつて光路を変えられたレーザ光4
の光軸は、常に、測定台11の中心を通るように
してその延長線上に1つの受光器14を移動、セ
ツトさせて透過式測定器として使用した場合、受
光器14によつて検知される光が0次光となり、
受光器14から任意の角度でセツトされた受光器
15によつて検知される光が1次光となる。
Also, during measurement, the light emitted from the light emitter 3,
Laser light 4 whose optical path is changed by mirror 40
When used as a transmission type measuring instrument by moving and setting one optical receiver 14 on the extension line so that the optical axis always passes through the center of the measuring table 11, the optical axis is detected by the optical receiver 14. Light becomes 0th order light,
The light detected by the light receiver 15 set at an arbitrary angle from the light receiver 14 becomes primary light.

この場合、2つの受光器14,15のセツト位
置は、コイルばね35によつて附勢された突起3
6が環状溝37内の所定位置、例えば光軸の延長
線上と任意の角度に設けられた凹陥部37a,3
7aに落ち込むので、受光器14,15を取り付
けた支柱33,34を所定の位置に位置決めさせ
てセツトできる。
In this case, the set position of the two light receivers 14 and 15 is set by the protrusion 3 which is energized by the coil spring 35.
6 is a recessed portion 37a, 3 provided at a predetermined position within the annular groove 37, for example, at an arbitrary angle with respect to the extension line of the optical axis.
7a, the supports 33 and 34 to which the light receivers 14 and 15 are attached can be positioned and set at predetermined positions.

また、反射式測定器の場合にも同様に所定位置
に設けた突起36が凹陥部37a,37aに落ち
込むことにより、支柱33,34の位置が簡単に
位置決めできる。
Further, in the case of a reflection type measuring instrument, the positions of the pillars 33 and 34 can be easily determined by similarly lowering the protrusions 36 provided at predetermined positions into the recesses 37a and 37a.

そして、受光器14,15の取付高さはビス3
9を緩めてスリツト38内で移動させた後、ビス
39を締め付けることにより、簡単に調整でき
る。
The mounting height of the receivers 14 and 15 is determined by screw 3.
Adjustment can be easily made by loosening the screw 9 and moving it within the slit 38, and then tightening the screw 39.

なお、受光器14,15で検知される被測定物
10に対する透過光、または被測定物10からの
反射光の処理は公知のものと同様に行なう。
Note that the processing of the light transmitted through the object to be measured 10 or the light reflected from the object to be measured 10 detected by the light receivers 14 and 15 is performed in the same manner as known methods.

〔考案の効果〕[Effect of idea]

以上のように、この考案によれば、測定台の中
心軸を中心とした円上を回動するととももに、円
上の任意な位置に固定可能な2つの支持体に被測
定物を透過した、または被測定物で反射された光
を受光するための受光器をそれぞれ取り付けたの
で、同一条件の下で、短時間で安定して光線の強
さが測定できるとともに、被測定物の被測定場所
を一定した再現性で測定読取誤差を少なくして測
定できる。
As described above, according to this invention, the measurement table rotates on a circle around the central axis, and the object to be measured is transmitted through two supports that can be fixed at any position on the circle. Since each light receiver is attached to receive the light reflected by the object to be measured, the intensity of the light beam can be measured stably in a short time under the same conditions. The measurement location can be measured with constant reproducibility and measurement reading errors can be reduced.

また、透過式測定法、反射式測定法にも使用で
き、複数種の被測定物を測定するものに対応させ
ても小型化が容易になるという効果がある。
Furthermore, it can be used for transmission measurement methods and reflection measurement methods, and has the effect of facilitating miniaturization even when adapted to measuring multiple types of objects to be measured.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はデイスク表面を拡大した状態の説明
図、第2図は従来の透過式測定法を示す説明図、
第3図は同じく反射式測定法を示す説明図、第4
図は透過式測定法を採用した従来装置の概略図、
第5図はこの考案の光学式デイスクのピツト測定
器の一実施例を示す平面図、第6図は同じく側面
図である。 3…発光器、4…レーザ光、10…被測定物、
11…測定台、14,15…受光器、16…位置
決め手段、33,34…支柱。
Fig. 1 is an explanatory diagram of the disk surface in an enlarged state, Fig. 2 is an explanatory diagram showing the conventional transmission measurement method,
Figure 3 is an explanatory diagram also showing the reflection measurement method, and Figure 4.
The figure is a schematic diagram of a conventional device that uses the transmission measurement method.
FIG. 5 is a plan view showing an embodiment of the optical disk pit measuring device of this invention, and FIG. 6 is a side view of the same. 3... Light emitter, 4... Laser light, 10... Measured object,
DESCRIPTION OF SYMBOLS 11... Measuring stand, 14, 15... Light receiver, 16... Positioning means, 33, 34... Support column.

Claims (1)

【実用新案登録請求の範囲】 光デイスクなどの被測定物をセツトするための
測定台と、 この測定台の中心軸上に載置された前記被測定
物に光を照射するための光源と、 前記測定台の中心軸を中心とした円上を回動す
るとともに、前記円上の任意な位置に固定可能な
2つの支持体と、 この2つの支持体にそれぞれ取り付けられ、前
記被測定物を透過した、または前記被測定物で反
射された光を受光するための2つの受光器と、 を備えた光学式デイスクのピツト測定器。
[Claims for Utility Model Registration] A measuring table for setting an object to be measured such as an optical disk; a light source for irradiating light to the object placed on the central axis of the measuring table; two supports that can be rotated on a circle around the central axis of the measuring table and fixed at arbitrary positions on the circle; An optical disk pit measuring instrument comprising: two light receivers for receiving light transmitted or reflected by the object to be measured.
JP12977983U 1983-08-24 1983-08-24 Optical disc pit measuring device Granted JPS6037807U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12977983U JPS6037807U (en) 1983-08-24 1983-08-24 Optical disc pit measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12977983U JPS6037807U (en) 1983-08-24 1983-08-24 Optical disc pit measuring device

Publications (2)

Publication Number Publication Date
JPS6037807U JPS6037807U (en) 1985-03-15
JPH0216245Y2 true JPH0216245Y2 (en) 1990-05-02

Family

ID=30293946

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12977983U Granted JPS6037807U (en) 1983-08-24 1983-08-24 Optical disc pit measuring device

Country Status (1)

Country Link
JP (1) JPS6037807U (en)

Also Published As

Publication number Publication date
JPS6037807U (en) 1985-03-15

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