JPH02170308A - thin film superconductor - Google Patents
thin film superconductorInfo
- Publication number
- JPH02170308A JPH02170308A JP63324132A JP32413288A JPH02170308A JP H02170308 A JPH02170308 A JP H02170308A JP 63324132 A JP63324132 A JP 63324132A JP 32413288 A JP32413288 A JP 32413288A JP H02170308 A JPH02170308 A JP H02170308A
- Authority
- JP
- Japan
- Prior art keywords
- thin film
- superconductor
- substrate
- superconducting
- temperature
- Prior art date
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Classifications
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E40/00—Technologies for an efficient electrical power generation, transmission or distribution
- Y02E40/60—Superconducting electric elements or equipment; Power systems integrating superconducting elements or equipment
Landscapes
- Inorganic Compounds Of Heavy Metals (AREA)
- Containers, Films, And Cooling For Superconductive Devices (AREA)
- Superconductors And Manufacturing Methods Therefor (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
産業上の利用分野
本発明は超電導体に関するものである。特にBi層状構
造複合酸化物により形成された薄膜超電導体に関するも
のである。DETAILED DESCRIPTION OF THE INVENTION Field of Industrial Application The present invention relates to superconductors. In particular, it relates to a thin film superconductor formed from a Bi layered composite oxide.
従来の技術
超電導体として、A15型2元化合物である窒化ニオブ
(NbN)やゲルマニウムニオブ(Nb3Ge)などが
知られていたが、これらの材料の超電導転移温度はたか
だか24にであった。一方、ペロブスカイト系3元化合
物は、さらに高い転移温度が期待され、Ba−La−C
u−0系の高温超電導体が提案された[J、G、Den
dorz andK、A、MulIer、ファイト シ
ュリフト フユア フィシ′−ヶ(Zeltshrlf
t fur physik B)−Condens
ed Matter B4.189−193(198B
)]。Niobium nitride (NbN) and germanium niobium (Nb3Ge), which are A15 type binary compounds, have been known as conventional superconductors, but the superconducting transition temperature of these materials was at most 24°C. On the other hand, perovskite-based ternary compounds are expected to have even higher transition temperatures, and Ba-La-C
A u-0-based high-temperature superconductor has been proposed [J, G, Den
dorz and K, A, Mulier
t fur physik B)-Condens
ed Matter B4.189-193 (198B
)].
さらに、近年発見された酸化物超電導体の中には、その
超電導遷移温度が液体窒素温度(77,3ケルビン)を
越えるものがあり、超電導体の応用分野を大きく広げる
ものと思われる。特にBi層状構造複合酸化物により形
成されたBi−8r−Ca−Cu−0系の超電導体は、
100に以上の超電導転移温度を示すことも発見された
。[H、Maeda、 Y、Tanaka、 M、
Fukutoml and T、Asano、ジャ
ム0二−ス゛ ・シ゛ヤーナル・オフ゛ ・アフ゛ライ
ド ・フィシ゛フクス(Japanese Jour
nal of AppHed Physlcs)
Vol、27.L209−210(1988)コこの種
の材料の超電導機構の詳細は明らかではないが、転移温
度が室温以上に高くなる可能性があり、高温超電導体と
して従来の2元化合物より、より有望な特性が期待され
る。この材料を薄膜化できれば超電導デバイスの実現の
可能性が大きくなると考えられ、現在種々の方法でこの
種の材料の薄膜化が試みられているが、超電導特性を得
るために薄膜形成後850度以上の高温熱処理が必要と
なる。Furthermore, some of the oxide superconductors discovered in recent years have superconducting transition temperatures exceeding the liquid nitrogen temperature (77.3 Kelvin), which is expected to greatly expand the field of application of superconductors. In particular, a Bi-8r-Ca-Cu-0 superconductor formed from a Bi layered composite oxide,
It was also discovered that they exhibit superconducting transition temperatures above 100°C. [H, Maeda, Y, Tanaka, M.
Japanese Jour
nal of Applied Physlcs)
Vol, 27. L209-210 (1988) The details of the superconducting mechanism of this type of material are not clear, but the transition temperature may be higher than room temperature, making it a more promising property than conventional binary compounds as a high-temperature superconductor. There is expected. It is thought that if this material can be made into a thin film, there will be a greater possibility of realizing superconducting devices, and various methods are currently being attempted to make this kind of material into a thin film. High-temperature heat treatment is required.
発明が解決しようとしている課題
たとえばBi25gターゲットを用いて5r2Ca2C
uiターゲツトとともにアルゴンと酸素の混合ガス中で
交互にスパッタリングし、Mg0(100)基体上に周
期的に積層させることにより、Bi層状構造複合酸化物
として代表的なり1−5r−Ca−Cu−0系の薄膜を
得ることができるが、転移温度が100K以上を示す相
の出現のためには、薄膜形成時の基体温度を700℃以
上としなければならず、高温のため、拡散が影響し再現
性に問題があった。さらにB i −8r−Ca−Cu
−〇薄膜を形成した後で超電導特性を得るために高温の
熱処理を行った場合、その組成比が熱処理前とは異なっ
てくることがわかった。そこで熱処理後に最適な組成比
となるように薄膜形成時の組成比を調整する必要があっ
た。しかしながらこのような方法で組成を最適化するの
は困難である。Problems to be solved by the invention For example, 5r2Ca2C using Bi25g target
By alternately sputtering with a ui target in a mixed gas of argon and oxygen and periodically layering on a Mg0 (100) substrate, a typical Bi layered structure composite oxide, 1-5r-Ca-Cu-0, is produced. However, for the appearance of a phase with a transition temperature of 100 K or higher, the substrate temperature during thin film formation must be 700°C or higher, and due to the high temperature, diffusion is affected and reproduction is difficult. There was a problem with sexuality. Furthermore, B i -8r-Ca-Cu
-〇It was found that when a high temperature heat treatment is performed to obtain superconducting properties after forming a thin film, the composition ratio becomes different from that before the heat treatment. Therefore, it was necessary to adjust the composition ratio during thin film formation so that the composition ratio would be optimal after heat treatment. However, it is difficult to optimize the composition using such a method.
なぜなら、高温の熱処理において組成の変化が温度に対
して非常に敏感であるからである。This is because changes in composition are very sensitive to temperature during high-temperature heat treatment.
本発明者らはこの種の材料を薄膜化する場合に、基板と
の界面及び薄膜超電導体の表面に他の種類の薄膜を形感
することにより、このような困難を避けることができる
ことを見いだした。The present inventors have discovered that such difficulties can be avoided when making this type of material into a thin film by forming other types of thin films on the interface with the substrate and on the surface of the thin film superconductor. Ta.
課題を解決するための手段
基体上に形成された、少なくとも2層のBi−0層と、
前記2層のBi−0層の間に複数のCu−0層を持つ層
状構造を打するBi層状構造複合酸化物薄膜からなる薄
膜超電導体において、前記Bi−0層が基体表面に平行
となるように前記Bi層状構造複合酸化物薄膜を形成し
、さらにこのBi層状構造複合酸化物薄膜の2つの表面
に接してBi酸化物薄膜を形成することにより前記課題
を解決しようとするものである。特に、第1図に示すよ
うにBi層状構造複合酸化物薄膜の2つの表面、つまり
薄膜超電導体を形成した基板との界面と薄膜超電導体の
表面にBizOa、 BI4TfsO+z。Means for Solving the Problems At least two Bi-0 layers formed on a substrate;
In a thin film superconductor made of a Bi layered composite oxide thin film having a layered structure having a plurality of Cu-0 layers between the two Bi-0 layers, the Bi-0 layer is parallel to the substrate surface. The present invention attempts to solve the above problem by forming the Bi layered composite oxide thin film and further forming Bi oxide thin films in contact with two surfaces of the Bi layered composite oxide thin film. In particular, as shown in FIG. 1, BizOa and BI4TfsO+z are applied to two surfaces of the Bi layered composite oxide thin film, namely, the interface with the substrate on which the thin film superconductor is formed and the surface of the thin film superconductor.
あるいはBi2Ti40++のような、超電導材料では
ないBi酸化物材料の薄膜を形成することにより課題を
解決しようとするものである。Alternatively, the problem is attempted to be solved by forming a thin film of Bi oxide material, which is not a superconducting material, such as Bi2Ti40++.
作用
本発明者らはこのBiを含む酸化物超電導体に対して、
例えば、マグネトロンスパッタリングにより得られる薄
膜の組成、及び結晶性と超電導特性との関係を詳細に調
べた。その結果、薄膜超電導体材料としてBi酸化物超
電導体を用い、界面、あるいは表面に本発明の構造を適
用することにより、高温処理による界面、あるいは表面
での拡散を防ぐことができ、薄膜形成後の組成変化がな
く、100に以上の臨界温度が安定して得られることが
判明し、また結晶性も改善され再現性もすぐれており、
また処理条件の裕度も増すことを見いだした。このよう
に本発明により良質で高性能な薄膜超電導体を再現性良
く得ることが可能となる。Effects The present inventors have developed the following for this Bi-containing oxide superconductor:
For example, we investigated in detail the composition of thin films obtained by magnetron sputtering and the relationship between crystallinity and superconducting properties. As a result, by using Bi oxide superconductor as a thin film superconductor material and applying the structure of the present invention to the interface or surface, it is possible to prevent diffusion at the interface or surface due to high temperature treatment, and after forming the thin film. It was found that a critical temperature of 100 or higher was stably obtained without any change in composition, and the crystallinity was improved and reproducibility was excellent.
It was also found that the latitude in processing conditions increases. As described above, the present invention makes it possible to obtain a high-quality, high-performance thin film superconductor with good reproducibility.
実施例
Bi層状構造複合酸化物において、Bi−8r−Ca−
Cu−0、B i−8r−Ba−Cu−OzB 1−C
a−Ba−Cu−0、またはB i −Pb−8r−C
a−Cu−01Bi−Pb−8r−Ba−OlBi−P
b−Ca−Ba−0などが超電導体として考えられてい
るが、ここでは−例としてBi −8r−Ca−Cu−
0系についての検討例を述べる。第1図において、12
A、12BはBi酸化物薄膜を示す。Example Bi layered structure composite oxide, Bi-8r-Ca-
Cu-0, B i-8r-Ba-Cu-OzB 1-C
a-Ba-Cu-0, or B i -Pb-8r-C
a-Cu-01Bi-Pb-8r-Ba-OlBi-P
b-Ca-Ba-0 etc. are considered as superconductors, but here - as an example, Bi -8r-Ca-Cu-
An example of consideration for the 0 series will be described. In Figure 1, 12
A and 12B indicate Bi oxide thin films.
現在のところ、第1図中に示されるBin状構造複合酸
化物薄膜13は、通常は基体温度400−900°Cで
Bi2O3と5r−Ca−Cu化合物をターゲットとし
て、アルゴンと酸素の混合ガス中で交互にスパッタリン
グし、5rTiOa(100)基体11上に積層させる
ことにより得られる。At present, the Bin-like structure composite oxide thin film 13 shown in FIG. It is obtained by alternately sputtering the 5rTiOa (100) and laminating it on the 5rTiOa (100) substrate 11.
このスパッタリングにおいてBiQssと5r−Ca−
Cu化合物ターゲットのスパッタレートを調整し、シャ
ッタによりスパッタ粒子を選択することにより積層構造
を有する薄膜を形成すると、積層周期に対応して臨界温
度100に以上の相が出現することがわかった。また積
層を周期的ではなく同時に行なった場合には80にの臨
界温度を持つ相しか形成できなかった。特に基体への薄
膜形成をBi2C)3ターゲツトからの原子を付着させ
ることから始めるか、あるいは薄膜形成の最後をBi2
O3ターゲットからの原子の付着で終了したとき、良好
な超電導特性を示す薄膜が得られることを見いだした。In this sputtering, BiQss and 5r-Ca-
It was found that when a thin film having a layered structure is formed by adjusting the sputtering rate of the Cu compound target and selecting sputtered particles using a shutter, a phase of 100 or higher appears at a critical temperature corresponding to the layering period. Moreover, when the lamination was carried out simultaneously rather than periodically, only a phase having a critical temperature of 80°C could be formed. In particular, one can start the thin film formation on the substrate by depositing atoms from the Bi2C)3 target or end the thin film formation with the Bi2C)3 target.
It has been found that when the attachment of atoms from the O3 target ends, thin films exhibiting good superconducting properties are obtained.
第1図に示した本発明の構造の薄膜超伝導体はこのよう
な結果に基づいて考案されたものである。また基体温度
が特に500−900℃の場合には100に以上の臨界
温度の相の結晶性が非常に良好なものが形成し得ること
も併せて発見した。形成した薄膜はそのままの状態でも
超電導転移を示すが、酸素中850″C程度で熱処理を
行なうとより確実に100に以上の臨界温度を示した。The thin film superconductor having the structure of the present invention shown in FIG. 1 was devised based on these results. It has also been discovered that when the substrate temperature is particularly between 500 and 900[deg.] C., a phase with a critical temperature of 100 or higher and having very good crystallinity can be formed. Although the formed thin film showed superconducting transition even in its original state, it more reliably showed a critical temperature of 100 or more when heat treated in oxygen at about 850''C.
Bi−0層と、lla族およびCu元素を含む層とが周
期的に配列したBi層状構造複合酸化物薄膜13の形成
法はい(つか考えられる。一般に、MBE装置あるいは
多源のEB蒸着装置で蒸発源の前を開閉シャッターで制
御したり、気相成長法で形成する際にガスの種類を切り
替えたりすることにより、周期的積層を達成することが
できる。There is a method for forming the Bi layered composite oxide thin film 13 in which a Bi-0 layer and a layer containing the lla group and Cu elements are arranged periodically. Periodic stacking can be achieved by controlling the opening/closing shutter in front of the evaporation source or by switching the type of gas during formation by vapor phase growth.
スパッタリング法によっても良好な積層膜形成が可能で
あるが、この場合、スパッタ中の高い酸素ガス圧および
スパッタ放電が、Bi系の100K以上の臨界温度を持
つ相の形成に都合がよいと考えられる。It is also possible to form a good laminated film by the sputtering method, but in this case, the high oxygen gas pressure and sputter discharge during sputtering are considered to be convenient for the formation of a Bi-based phase with a critical temperature of 100 K or higher. .
(実施例1)
以下に図面を用いて本発明を説明する。上述の薄膜形成
法において、第2図のように1個のターゲット21をB
i253としスパッタリングをBi2O3より開始する
。まず真空装置内にArガスを導入し放電させてスパッ
タリングを開始する。シャッタ24により5r−Ca−
Cu化合物ターゲット22からのスパッタ原子の飛来を
阻止し200℃に設定した基板表面にBi化合物薄膜と
してBi25s薄膜12Aを形成した後、基板11をヒ
ータ25により700″Cに昇温し酸素を導入してスパ
ッタ条件を設定する。そしてBi25sと5r−Ca−
Cu化合物ターゲットをスパッタし、Bi、 lla
族およびCu元素を表面に付着させる。(Example 1) The present invention will be described below using the drawings. In the above-mentioned thin film forming method, one target 21 is set to B as shown in FIG.
i253 and sputtering is started from Bi2O3. First, Ar gas is introduced into a vacuum apparatus and discharged to start sputtering. 5r-Ca- by the shutter 24
After blocking sputtered atoms from the Cu compound target 22 and forming a Bi25s thin film 12A as a Bi compound thin film on the substrate surface set at 200°C, the substrate 11 was heated to 700″C with a heater 25 and oxygen was introduced. Then, Bi25s and 5r-Ca-
Sputter a Cu compound target, Bi, lla
Group and Cu elements are deposited on the surface.
この場合スパッタ条件の設定、およびシャッタの使用に
より薄膜の組成をBi系酸化物超電導体の化学量論比に
合わせて薄膜を形成する。つまりシャッタの回転時間を
調整してこれを実現する。この薄膜形成後最後に酸素ガ
スの導入をやめ、Arのみでスパッタを行ってBi系酸
化物超電導薄膜13の表面に再びBi20i薄膜12B
を形成する。In this case, a thin film is formed by adjusting the composition of the thin film to the stoichiometric ratio of the Bi-based oxide superconductor by setting sputtering conditions and using a shutter. In other words, this is achieved by adjusting the shutter rotation time. After this thin film is formed, the introduction of oxygen gas is finally stopped, and sputtering is performed using only Ar to coat the surface of the Bi-based oxide superconducting thin film 13 again with the Bi20i thin film 12B.
form.
これを酸素雰囲気中で850°C5時間の高温熱処理を
することにより、安定な超電導特性を示す薄膜が得られ
た。この薄膜超伝導体の層状構造は第1図(b)のよう
になっている。つまり、BI−0層130と5r−Ca
−Cu層131によりBi系酸化物超電導薄膜13が形
成されている。By subjecting this to high-temperature heat treatment at 850° C. for 5 hours in an oxygen atmosphere, a thin film exhibiting stable superconducting properties was obtained. The layered structure of this thin film superconductor is as shown in FIG. 1(b). In other words, BI-0 layer 130 and 5r-Ca
-Cu layer 131 forms Bi-based oxide superconducting thin film 13 .
この薄膜の結晶性をX線回折法により調べた。The crystallinity of this thin film was examined by X-ray diffraction.
100ケルビン以上の超電導転移を示す超電導相により
示される回折パターンはB 120sのない場合には、
薄膜形成行程がまったく同じであっても、BizO3薄
膜が基板表面に形成されている場合に比較して結晶性が
劣っていることを示すものとなった。更にBi層状構造
複合酸化物の組成においてBi2O3薄膜のない場合に
はCaが異常に少なくなっていることがわかった。In the absence of B120s, the diffraction pattern exhibited by a superconducting phase exhibiting a superconducting transition above 100 Kelvin is
Even though the thin film forming process was exactly the same, the results showed that the crystallinity was inferior to that in the case where the BizO3 thin film was formed on the substrate surface. Furthermore, it was found that in the composition of the Bi layered composite oxide, Ca was abnormally reduced in the absence of the Bi2O3 thin film.
(実施例2)
実施例1の2つのターゲットに更にもう1つのターゲッ
ト23を加えることにより、実施例1と同様の構成Q薄
膜超電導対を形成することが可能となった。つまり第2
図に示すようにもう1つのターゲット23としてB i
JT 130121 あるいはBi2Ti−40目
のようなTiを含むB i −T t −0化合物を用
いた。このときまずArガス及び酸素ガスを真空装置内
に導入して放電させ、シャッタの開口部をTiを含むB
i酸化物ターゲット23からの原子の飛来を基板11上
に導くように配置した。20−30オングストロームの
膜厚のBi−Ti−0薄膜12Aを形成したのち、シャ
ッタ24の開口部をBi25s及び5r−Ca−Cu化
合物ターゲット22からの原子の飛来を交互に基板上に
導くように往復させた。このようにして500オングス
トロ一ム程度の膜厚の薄膜13を形成した後最後に再び
Tiを含むBi酸化物からの原子の飛来を基板上に導く
ようにシャツタ開口部の位置を制御して薄膜12Bを形
成した。以上のようにして得られた薄膜を熱処理炉に入
れ酸素を流しながら850℃、5時間加熱して100ケ
ルビン以上で超電導転移を示すものが得られた。(Example 2) By adding one more target 23 to the two targets of Example 1, it became possible to form a Q thin film superconducting pair having the same configuration as in Example 1. In other words, the second
As shown in the figure, B i is another target 23.
A Ti-containing B i -T t -0 compound such as JT 130121 or Bi2Ti-40 was used. At this time, Ar gas and oxygen gas are first introduced into the vacuum apparatus to cause discharge, and the opening of the shutter is
It was arranged so that flying atoms from the i-oxide target 23 were guided onto the substrate 11. After forming the Bi-Ti-0 thin film 12A with a film thickness of 20-30 angstroms, the opening of the shutter 24 was opened so as to alternately guide atoms from the Bi25s and 5r-Ca-Cu compound targets 22 onto the substrate. I made it back and forth. After forming the thin film 13 with a thickness of about 500 angstroms in this way, the position of the shutter opening is controlled again to guide the flying atoms from the Bi oxide containing Ti onto the substrate. 12B was formed. The thin film obtained as described above was placed in a heat treatment furnace and heated at 850° C. for 5 hours while oxygen was flowing, resulting in a film exhibiting superconducting transition at temperatures of 100 Kelvin or more.
この薄膜は800℃で加熱しても同様の特性を示し、ア
ニールに対する裕度の大きいことが確認された。しかし
臨界電流は小さくなっており、全体積に対する超電導部
分はアニール温度により影響された。This thin film exhibited similar characteristics even when heated at 800° C., confirming that it has a large tolerance to annealing. However, the critical current was smaller and the superconducting portion relative to the total volume was influenced by the annealing temperature.
発明の効果
以上のように本発明の薄膜超電導体は100ケルビン以
上での超電導転移を示すBi層状構造複合化合物薄膜の
再現性のよい構造を提供するものである。本発明によれ
ば、安定な組成と処理条件に対する大きな裕度を実現す
ることが可能となり、その工業的な価値は大きい。Effects of the Invention As described above, the thin film superconductor of the present invention provides a structure with good reproducibility of a Bi layered composite compound thin film exhibiting a superconducting transition at 100 Kelvin or higher. According to the present invention, it is possible to realize a stable composition and a large margin for processing conditions, which has great industrial value.
第1図は本発明の一実施例の薄膜超電導体の構造を示す
断面図、第2図は本発明の超電導体を形成するために使
用される複数のターゲットとシャッタにより構成される
薄膜形成装置の模式図である。
11・・・・・・基体、12・・・・・・Bi酸化物薄
膜、13・・・・・・Bi層状構造複合酸化物薄膜、2
3・・・・・・Bi酸化物ターゲット、24・・・・・
・シャッタ、25・・・・・・ヒータ。
代理人の氏名 弁理士 粟野重孝 はか1名1 図
(α)
12図
どl Biz03ターゲットFIG. 1 is a cross-sectional view showing the structure of a thin film superconductor according to an embodiment of the present invention, and FIG. 2 is a thin film forming apparatus composed of a plurality of targets and shutters used to form the superconductor of the present invention. FIG. 11...Base, 12...Bi oxide thin film, 13...Bi layered structure composite oxide thin film, 2
3...Bi oxide target, 24...
・Shutter, 25... Heater. Name of agent Patent attorney Shigetaka Awano 1 person 1 Figure (α) Figure 12 Biz03 target
Claims (3)
層と、前記2層のBi−O層の間に複数のCu−O層を
持つ層状構造を有するBi層状構造複合酸化物薄膜から
なる薄膜超電導体において、前記Bi−O層が基体表面
に平行となるように前記Bi層状構造複合酸化物薄膜を
形成し、さらにこのBi層状構造複合酸化物薄膜の2つ
の表面に接してBi酸化物薄膜を形成したことを特徴と
する薄膜超電導体(1) At least two layers of Bi-O formed on the substrate
In the thin film superconductor, the Bi-O layer is parallel to the substrate surface. A thin film superconductor characterized in that the Bi layered composite oxide thin film is formed as follows, and further Bi oxide thin films are formed in contact with two surfaces of the Bi layered composite oxide thin film.
2O_3層、またはBi−Ti−O層であることを特徴
とする特許請求の範囲第1項記載の薄膜超電導体。(2) The surface of the thin film superconductor is a Bi-O layer or Bi_
The thin film superconductor according to claim 1, which is a 2O_3 layer or a Bi-Ti-O layer.
−O層、またはBi_2O_3層、またはBi−Ti−
O層であることを特徴とする特許請求の範囲第1項記載
の薄膜超電導体。(3) Bi layered structure The interface between the composite oxide thin film and the substrate is made of Bi
-O layer, or Bi_2O_3 layer, or Bi-Ti-
The thin film superconductor according to claim 1, which is an O layer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63324132A JPH02170308A (en) | 1988-12-22 | 1988-12-22 | thin film superconductor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63324132A JPH02170308A (en) | 1988-12-22 | 1988-12-22 | thin film superconductor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH02170308A true JPH02170308A (en) | 1990-07-02 |
Family
ID=18162499
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63324132A Pending JPH02170308A (en) | 1988-12-22 | 1988-12-22 | thin film superconductor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH02170308A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0590560A3 (en) * | 1992-09-29 | 1994-08-10 | Matsushita Electric Industrial Co Ltd | Thin-film superconductor and method of fabricating the same |
-
1988
- 1988-12-22 JP JP63324132A patent/JPH02170308A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0590560A3 (en) * | 1992-09-29 | 1994-08-10 | Matsushita Electric Industrial Co Ltd | Thin-film superconductor and method of fabricating the same |
| US5434126A (en) * | 1992-09-29 | 1995-07-18 | Matsushita Electric Industrial Co., Ltd. | Thin-film high Tc superconductor comprising a ferroelectric buffer layer |
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