JPH0217646U - - Google Patents
Info
- Publication number
- JPH0217646U JPH0217646U JP9767988U JP9767988U JPH0217646U JP H0217646 U JPH0217646 U JP H0217646U JP 9767988 U JP9767988 U JP 9767988U JP 9767988 U JP9767988 U JP 9767988U JP H0217646 U JPH0217646 U JP H0217646U
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- contour line
- pattern
- binary
- signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000006243 chemical reaction Methods 0.000 claims description 3
- 238000000605 extraction Methods 0.000 claims description 2
- 230000007547 defect Effects 0.000 claims 1
- 230000002950 deficient Effects 0.000 claims 1
- 238000001514 detection method Methods 0.000 claims 1
- 239000000284 extract Substances 0.000 claims 1
- 230000003287 optical effect Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 4
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Description
第1図は本考案の一実施例を示すブロツク図、
第2図a〜cは第1図に示す実施例の動作説明図
、第3図は従来の一例を示すブロツク図、第4図
a〜fは第3図に示す従来例の動作説明図である
。
A…ピンホール、B…黒点、1…2値画像記憶
部、2…輪郭線算出部、3,10…比較回路、4
…光電変換回路、5…2値化回路、6…記憶回路
、7…輪郭線抽出回路、8…算出回路、9…準正
常パターン作成部、11…拡大縮小回路、12…
縮小拡大回路。
FIG. 1 is a block diagram showing an embodiment of the present invention.
Figures 2 a to c are explanatory diagrams of the operation of the embodiment shown in Figure 1, Figure 3 is a block diagram showing a conventional example, and Figures 4 a to f are explanatory diagrams of the operation of the conventional example shown in Figure 3. be. A... Pinhole, B... Black dot, 1... Binary image storage section, 2... Contour calculation section, 3, 10... Comparison circuit, 4
...Photoelectric conversion circuit, 5...Binarization circuit, 6...Storage circuit, 7...Outline extraction circuit, 8...Calculation circuit, 9...Semi-normal pattern creation section, 11...Enlargement/reduction circuit, 12...
Reduction/enlargement circuit.
補正 昭63.10.20
図面の簡単な説明を次のように補正する。
明細書第8頁第14行目の「第2図a〜cは」
を「第2図は」と訂正します。
明細書第8頁第15行目の「第4図a〜fは」
を「第4図は」と訂正します。Amendment October 20, 1981 The brief description of the drawing is amended as follows. "Figure 2 a to c" on page 8, line 14 of the specification
Correct it to "Figure 2 is". "Figures 4 a to f" on page 8, line 15 of the specification
Correct it to "Figure 4 is".
Claims (1)
信号に変換する光電変換回路と前記電気信号を2
値化信号に変化する2値化回路と前記2値化信号
を2値化データとして記憶する記憶回路からなる
2値画像記憶部と、前記2値化データから前記パ
ターンの輪郭線を抽出して輪郭線信号を出力する
輪郭線抽出回路と前記輪郭線信号から前記パター
ンの輪郭線の長さを算出して算出データを出力す
る算出回路からなる輪郭線算出部と、前記算出デ
ータと予め正常パターンの輪郭線の長さの最小値
を算出して求められた基準値を比較してこの基準
値より小さいパターンを欠陥パターンとして検出
する比較回路とを含むことを特徴とするパターン
欠陥検出装置。 A photoelectric conversion circuit that inputs an optical image of a pattern to be inspected and converts it into an electrical signal, and a photoelectric conversion circuit that converts the electrical signal into an electrical signal.
a binary image storage unit comprising a binary circuit that converts into a digital signal and a storage circuit that stores the binary signal as binary data; and a binary image storage unit that extracts the outline of the pattern from the binary data. a contour line calculation section including a contour line extraction circuit that outputs a contour line signal; a calculation circuit that calculates the length of the contour line of the pattern from the contour line signal and outputs calculated data; 1. A pattern defect detection device comprising: a comparison circuit that calculates a minimum value of the length of a contour line, compares the obtained reference value, and detects a pattern smaller than the reference value as a defective pattern.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9767988U JPH0217646U (en) | 1988-07-22 | 1988-07-22 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9767988U JPH0217646U (en) | 1988-07-22 | 1988-07-22 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0217646U true JPH0217646U (en) | 1990-02-05 |
Family
ID=31323310
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9767988U Pending JPH0217646U (en) | 1988-07-22 | 1988-07-22 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0217646U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006047078A (en) * | 2004-08-04 | 2006-02-16 | Central Glass Co Ltd | Method for inspecting printing defect and/or printing contamination of transparent plate body |
-
1988
- 1988-07-22 JP JP9767988U patent/JPH0217646U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006047078A (en) * | 2004-08-04 | 2006-02-16 | Central Glass Co Ltd | Method for inspecting printing defect and/or printing contamination of transparent plate body |
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