JPH02189047A - Data converter inspection system - Google Patents

Abstract

PURPOSE:To attain an efficient inspection by receiving a serial data for inspection, converting it into a parallel data, collating the data with a preset reference parallel data and checking the propriety of the conversion operation of an inspection object data converter. CONSTITUTION:The inspection object data converter 1 converts a check serial data for inspection inputted from a transmission section 8 into a prescribed data string and sends it into a reception detection section 9. The reception detection section 9 converts the conversion inspection serial data sent from the inspection object data converter 1 into a parallel data and collates it with a preset reference parallel data. The constitution of the transmission section 8 and the reception detection section 9 used therein is comparatively simple and inexpensive. Thus, plural systems are built up to inspect plural inspection object data converters, thereby shortening the entire inspection time.

Description

[Detailed description of the invention] [8! E Required] Concerning the testing system for data converting devices used in data communications, the purpose is to provide a data converting device testing system that can perform efficient testing with a relatively inexpensive configuration, and converts received serial data into specified serial data. In a system that inspects a data conversion device that transmits
a transmitter that converts parallel data for inspection into serial data and outputs it to a data-to-be-inspected converter; and a transmitter that receives the serial data for inspection converted and output from the data-to-be-inspected converter, converts it to parallel data, and outputs the converted data to the data-to-be-inspected converter. The apparatus is configured to include a reception detecting section that checks the quality of the conversion operation of the data conversion apparatus to be inspected by comparing the parallel data set in advance with reference parallel data set in advance.

[Industrial Field of Application] The present invention relates to a testing system for data converting devices used in data communications, and more particularly to a system that can efficiently test data converting devices with a simple circuit configuration.

In data communication, a data conversion device is used that converts received serial data into predetermined serial data and transmits the data.

By the way, when using such a data conversion device, it is checked as necessary whether or not the data conversion device is performing a normal conversion operation.

[Prior Art] FIG. 3 is a block diagram showing an example of testing of a conventional data conversion device. In the figure, reference numeral 1 denotes a data conversion device to be inspected, and a bypass line 2 is provided for selectively returning and outputting input data as it is without converting it. 3 is an 11-1 constant. The measuring device 3 includes an inspection data pattern generating section 4 that outputs an inspection data pattern consisting of a binary data string to the data conversion device 1;
A data pattern detection section 5 that detects the data pattern converted and output from the data conversion device 1, a reference data pattern generation section 6 that generates a reference data pattern when the inspection data pattern is correctly converted, and a data pattern detection section 5 A data pattern comparing section 7 is provided for comparing the output data pattern of the reference data pattern generating section 6 with the output data pattern of the reference data pattern generating section 6.

In such a configuration, the l]llI determiner 3 determines whether the conversion operation of the data conversion device 1 to be inspected is good or bad according to the comparison result of the data pattern comparison section 7.

[Problem to be solved by the invention] However, the measuring instruments 3 used in such conventional inspections are relatively expensive, and it is not economical to prepare a large number of measuring instruments only for inspection. Therefore, the number of measuring instruments is limited. For this reason, the number of target data conversion apparatuses 1 that can be tested simultaneously is also limited, and there is a problem that efficient testing cannot be performed.

The present invention has been made in view of such problems, and an object of the present invention is to provide a data conversion device testing system that can perform testing efficiently with a relatively simple configuration.

[Means for Solving the Problems] FIG. 1 is a block diagram of the principle of a data conversion device inspection system of the present invention. In the figure, reference numeral 8 denotes a transmitter, which converts the parallel data for inspection into serial data and outputs it to the data conversion device 1 to be inspected. 9 is a reception detection section;
The test serial data converted and output from the test target data converter 1 is received and converted into parallel data, and the converted parallel data is compared with preset reference parallel data to perform the conversion by the test target data converter 1. Check the operation quality.

[Operation] The test target data conversion device 1 converts the test serial data input from the transmitter 8 into a predetermined data string and sends it to the reception detector 9. The reception detection unit 9 converts the conversion test serial data sent from the test target data conversion device 1 into parallel data and compares it with preset reference parallel data.

Transmitter 8 and reception detector 9 used in such a system
The configuration is relatively simple and inexpensive compared to the configuration of the conventional measuring instrument 3, and it is possible to construct a multiple system system at the same time to test multiple data conversion devices to be inspected, reducing the overall inspection time. can be shortened.

[Example] Hereinafter, an example of the present invention will be described in detail with reference to the drawings.

FIG. 2 is a block diagram showing an embodiment of the present invention, and the same parts as in FIG. 1 are designated by the same reference numerals.

In the figure, the transmitter 8 includes a data pattern generator 10 that generates a binary test signal of multiple bits (for example, 8 bits) by turning on and off a plurality of dip switches, and the data pattern generator A parallel-to-serial converter 11 that converts test parallel data outputted from 10 into a serial data string, a transmission switch 12, and a plurality of converters for driving the parallel-to-serial converter 11 when the transmission switch 12 is turned on. clock (
A clock generator 13 that generates 8 clocks in the case of 8 bits)
It is made up of.

Note that the first bit of data DO output from the data pattern generator 10 is always fixed at the L level, and the other bits of data D1 to D7 are set to arbitrary levels. Further, a reference pulse is input to the clock generator 13 from a reference oscillator 14 . This causes the clock generator 13 to turn on by turning on the transmission switch 12.
Eight pulses are input to the parallel-to-serial converter 11, and the test parallel data output from the data pattern generator 10 is converted into a serial data string and sent to the data converter 1 to be tested.

The reception detection unit 9 includes a reference parallel data generator 15 that outputs reference parallel data when the test data sent from the transmitter 8 is correctly converted by the data to be tested converter 1, and a data to be tested converter 1. A serial-parallel converter 16 that converts the serial data string converted and output from the serial-parallel converter 16 into parallel data, a comparator 17 that compares these reference parallel data and the parallel data that is converted and output from the serial-parallel converter 16, and a match between the comparator 17. Consists of a light-emitting display element 18 such as a light-emitting diode that is driven to turn on by a detection signal, and a clock generator 19 that generates a plurality of clocks (8 clocks in the case of 8 bits) for driving the serial-parallel converter 16. has been done. The clock generator 19 receives a serial data string converted and outputted from the data conversion device 1 under test and a reference pulse from the reference oscillator 14 . This results in
The clock generator 19 generates the first bit D of the serial data string.
By detecting the L level of O, eight pulses are sent to the serial-parallel converter 16, and the comparator 17
compares the reference parallel data as described above with the parallel data converted and output from the serial-parallel converter 16, and drives the light-emitting display element 18 to turn on based on the coincidence detection signal.

In the above embodiment, an example of 8 bits as parallel data was explained, but the number of bits may be increased or decreased depending on the system.

In addition, if the inspection target data conversion device 1 is set to output the input data by wrapping it as it is,
As reference pattern data input to one side of the comparator 17, the parallel data sent from the data pattern generator 10 of the transmitter 8 may be branched and input as is.

FIG.

In Figures 1 and 2, 1 is a data conversion device, 8 is a transmitter, 9 is a reception detection section.

Claims (1)

[Claims] A system for testing a data conversion device (1) that converts received serial data into predetermined serial data and transmits the data, comprising: ); and a transmitter (8) that receives the test serial data converted and output from the test target data converter (1), converts it into parallel data, and converts the converted parallel data and a preset standard. The parallel data is collated and the inspection target data conversion device (
1) Reception detection unit (9) that checks the quality of the conversion operation.
A data conversion device inspection system characterized by being provided with.