JPH0220363U - - Google Patents
Info
- Publication number
- JPH0220363U JPH0220363U JP2694888U JP2694888U JPH0220363U JP H0220363 U JPH0220363 U JP H0220363U JP 2694888 U JP2694888 U JP 2694888U JP 2694888 U JP2694888 U JP 2694888U JP H0220363 U JPH0220363 U JP H0220363U
- Authority
- JP
- Japan
- Prior art keywords
- light source
- light
- output
- input
- photodetector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 5
- BJQHLKABXJIVAM-UHFFFAOYSA-N bis(2-ethylhexyl) phthalate Chemical compound CCCCC(CC)COC(=O)C1=CC=CC=C1C(=O)OCC(CC)CCCC BJQHLKABXJIVAM-UHFFFAOYSA-N 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Landscapes
- Lasers (AREA)
Description
第１図は本考案に係る波長安定化光源の一実施
例を示す構成図、第２図は透過光の光強度曲線を
示す特性曲線図、第３図は本考案の他の実施例を
示す構成図、第４図は従来の波長安定化光源を示
す構成図、第５図は透過光の強度曲線の特性曲線
図である。
１……半導体レーザー、３，１０１，１０２…
…ハーフミラー、６，１２，１３……光検出器、
７，１９……制御手段、１０……光学手段、１１
……フアブリペローエタロン、１４……補正手段
、１５……ヒータ、１８……演算手段。
Fig. 1 is a configuration diagram showing one embodiment of a wavelength stabilized light source according to the present invention, Fig. 2 is a characteristic curve diagram showing a light intensity curve of transmitted light, and Fig. 3 is a diagram showing another embodiment of the present invention. FIG. 4 is a configuration diagram showing a conventional wavelength-stabilized light source, and FIG. 5 is a characteristic curve diagram of an intensity curve of transmitted light. 1... Semiconductor laser, 3,101,102...
...Half mirror, 6, 12, 13...Photodetector,
7, 19...control means, 10...optical means, 11
... Fabry-Perot etalon, 14 ... correction means, 15 ... heater, 18 ... calculation means.
Claims (1)
別特性がある素子に入力し、この素子の出力光強
度に関連する値が一定になるように前記光源を制
御する波長安定化光源において、 前記素子に異なる２つの角度から前記光源の出
力光を入力する光学手段と、これら異なつた角度
で入力された光に対応する前記素子の透過光の強
度を測定する第１及び第２の光検出器と、この第
１の光検出器の出力が入力され前記光源を制御す
る第１の制御手段と、前記第２の光検出器の出力
が入力され前記素子の基準スペースの間隔の変化
に起因する誤差を補正する補正手段とを有するこ
とを特徴とする波長安定化光源。[Claims for Utility Model Registration] Output light from a light source is input to an element having a reference space and wavelength discrimination characteristics, and the light source is controlled so that a value related to the output light intensity of this element is constant. In the wavelength-stabilized light source, the optical means inputs the output light of the light source into the element from two different angles, and the first optical means measures the intensity of the transmitted light of the element corresponding to the light input at these different angles. and a second photodetector; a first control means to which the output of the first photodetector is input and which controls the light source; and a first control means to which the output of the second photodetector is input and which controls the reference space of the element. and a correction means for correcting an error caused by a change in the interval between.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2694888U JPH0427178Y2 (en) | 1988-03-02 | 1988-03-02 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2694888U JPH0427178Y2 (en) | 1988-03-02 | 1988-03-02 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0220363U true JPH0220363U (en) | 1990-02-09 |
| JPH0427178Y2 JPH0427178Y2 (en) | 1992-06-30 |
Family
ID=31249028
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2694888U Expired JPH0427178Y2 (en) | 1988-03-02 | 1988-03-02 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0427178Y2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012037479A (en) * | 2010-08-11 | 2012-02-23 | Ihi Inspection & Instrumentation Co Ltd | Ae measurement method and device for the same |
-
1988
- 1988-03-02 JP JP2694888U patent/JPH0427178Y2/ja not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012037479A (en) * | 2010-08-11 | 2012-02-23 | Ihi Inspection & Instrumentation Co Ltd | Ae measurement method and device for the same |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0427178Y2 (en) | 1992-06-30 |
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