JPH02210237A - Surface inclination measuring instrument for optical deflector - Google Patents

Surface inclination measuring instrument for optical deflector

Info

Publication number
JPH02210237A
JPH02210237A JP2974889A JP2974889A JPH02210237A JP H02210237 A JPH02210237 A JP H02210237A JP 2974889 A JP2974889 A JP 2974889A JP 2974889 A JP2974889 A JP 2974889A JP H02210237 A JPH02210237 A JP H02210237A
Authority
JP
Japan
Prior art keywords
light
optical deflector
beam splitter
made incident
surface inclination
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2974889A
Other languages
Japanese (ja)
Inventor
Katsu Tashiro
克 田代
Yasushige Yamagishi
山岸 康重
Iwao Sugizaki
杉崎 巖
Hiroshi Horikawa
宏 堀川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nidec Copal Electronics Corp
Original Assignee
Copal Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Copal Electronics Co Ltd filed Critical Copal Electronics Co Ltd
Priority to JP2974889A priority Critical patent/JPH02210237A/en
Publication of JPH02210237A publication Critical patent/JPH02210237A/en
Pending legal-status Critical Current

Links

Landscapes

  • Mechanical Optical Scanning Systems (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

PURPOSE:To realize high accuracy and size reduction by calculating the difference between the outputs of two beam position detectors and finding the quantity of surface inclination. CONSTITUTION:The laser beam L1 emitted by a light source 1 is split by a polarization beam splitter(BS) 2 into a horizontal and a vertical component. The vertical polarized laser beam L2 is made incident on the BS 4 as a beam L2a through the optical deflector 3. Further, the horizontal polarized laser light L3 is made incident on the BS 4 as a beam L3a through a mirror M1. Then the composite light L4 projected from the BS 4 is made incident on a BS 5 through mirrors M2 and M3. Then the vertical polarized light L5A transmitted through the BS 5 is made incident on a sensor 6 and the horizontal polarized light L5b which is reflected by the BS 5 is made incident on a sensor 7. Then the sensors 6 and 7 detects the positions of the laser beams and output electric signals A and B. Further, the signals A and B are inputted to a differential output circuit C and the difference between the signals A and B is outputted as a final surface inclination signal.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は偏向光線の位置ずれを利用して光偏向器の面倒
れ角の測定を行う面倒れ測定装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a surface inclination measuring device that measures the surface inclination angle of an optical deflector using positional deviation of a deflected light beam.

(従来の技術) 従来の面倒れ測定では第2図のごとく光源lより出射し
た光りは光偏向器3に入射し、光偏向器3からでた光は
直接ビーム位置センサ10に入射する構成で計測してい
た。
(Prior art) In conventional surface tilt measurement, as shown in FIG. I was measuring.

(発明が解決しようとする課m> しかし近来走査装置の高密度化が進みそれに伴い光偏向
器の面倒れ測定においても高精度化が求められるように
なってきた。
(Issues to be Solved by the Invention) However, in recent years, the density of scanning devices has increased, and as a result, higher accuracy has been required in measuring the surface inclination of an optical deflector.

面倒れ測定装置の高精度化の方法としてはビーム位置検
出センサの高精度化と、光偏向器からセンサまでの距離
を伸ばす方法が考えられる。距離を伸ばせば面倒れ角に
よるビーム位置ずれ量が大きくなり測定が容易になるの
で従来はこの方法で高精度化が行われてきた。
Possible methods for increasing the accuracy of the surface tilt measuring device include increasing the accuracy of the beam position detection sensor and increasing the distance from the optical deflector to the sensor. Conventionally, this method has been used to improve accuracy because increasing the distance increases the amount of beam position deviation due to the surface tilt angle, making measurement easier.

ところが高精度化が進むと振動、温度変化などの影響が
問題となり、これまでのように高精度化するために更に
距離を伸ばすと、光源、光偏向器、ビーム位置検出セン
サ間の振動等のノイズが大きくなり、かえって高精度化
出来なくなる。これを解決するためにミラーにより光偏
向器、ビーム位置検出センサ間の光線を途中で折り返し
、光源、光偏向器、ビーム位置検出センサ間の距離を抑
えてノイズの影響を少なくすることも考えられるが、途
中の折り返しミラーに振動、温度変化等で誤差が生じた
場合、出射ビームにはミラーの誤差の2倍の誤差が発生
するので、やはり精度を確保するのが難しくなる。
However, as precision increases, the effects of vibrations, temperature changes, etc. become a problem, and as we have done in the past, increasing the distance further to achieve higher precision causes problems such as vibrations between the light source, optical deflector, and beam position detection sensor. The noise increases, making it impossible to achieve high accuracy. To solve this problem, it may be possible to use a mirror to return the light beam between the optical deflector and the beam position detection sensor, thereby reducing the distance between the light source, the optical deflector, and the beam position detection sensor, thereby reducing the influence of noise. However, if an error occurs in the midway folding mirror due to vibration, temperature change, etc., an error twice as large as the mirror error will occur in the output beam, making it difficult to ensure accuracy.

(課題を解決するための手段) 本発明は前記課題点を解決するためになされたもので、
本実施例に対応する第1図を用いてて説明すると、本発
明による光偏向器面倒れ測定装置は、光源1よりでた光
L1が第1の偏光ビームスプリッタ2に入射し。
(Means for Solving the Problems) The present invention has been made to solve the above problems,
To explain using FIG. 1 corresponding to this embodiment, in the optical deflector surface tilt measurement device according to the present invention, light L1 emitted from a light source 1 enters a first polarizing beam splitter 2.

分割された一方の光L2が光偏向器3に入射し、残る一
方の光L3は光偏向器3を介さずにミラーM1を介して
第2の偏光ビームスプリッタ4により光偏向器3からの
出射光L2aと再び合成され、1枚、又は複数のミラー
M2.M3を介して第3の偏光ビームスプリッタ5に入
射し、再び分割され、分割された各々の光L5a、L5
bが2個のビーム位置検出センサ6.7にそれぞれ入射
する構成とし、それぞれのセンサ出力の差を取って面倒
れ量を求めるようにしたものである。
One of the split lights L2 enters the optical deflector 3, and the remaining light L3 is output from the optical deflector 3 by the second polarizing beam splitter 4 via the mirror M1 without going through the optical deflector 3. It is combined with the emitted light L2a again, and is passed through one or more mirrors M2. The light enters the third polarizing beam splitter 5 via M3, is split again, and each of the split lights L5a, L5
The beam b is incident on two beam position detection sensors 6 and 7, respectively, and the amount of surface tilt is determined by taking the difference between the outputs of the respective sensors.

(作用) 本発明によれば光源1より発した光L1は第1の偏光ビ
ームスプリッタ2により縦の偏光成分をもつ光L2と横
の偏光成分をもつ光L3にわけられる。このうち片方の
光L2がスキャナ3に入射され面倒れの影響を受ける。
(Operation) According to the present invention, the light L1 emitted from the light source 1 is split by the first polarizing beam splitter 2 into light L2 having a vertical polarization component and light L3 having a horizontal polarization component. One of the lights L2 enters the scanner 3 and is affected by the surface tilt.

走査装置を出た光L2aは面倒れの影響を受けない光L
3aと合成され、進行する0合成された際二つの光L2
a、L3aは互いに偏光方向が直行しているため互いに
干渉せず、光路は一致していても面倒れの影響を受けた
光と受けない光は明確に分離している。この合成光L4
はセンサ6に入る直前で再び偏光ビームスプリッタ5に
より、偏光方向の違う二本の光に分割される。この偏光
ビームスプリッタ5の分割する偏光方向と最初の偏光ビ
ームスプリッタ2の分割する偏光方向が同じであるなら
ば面倒れ成分を持つ光と持たない光はきれいにわけられ
る。その後、各々の光がそれぞれビーム位置検出センサ
6.7に入射し、位置ずれ量が測定されるがこのとき面
倒れ成分を持つ光が途中のミラーの誤差の影響を受けて
いた−とじても、もう一方の光も受けているわけである
から、それぞれの出力の差をとることにより面倒れの影
響のみを切りわけて高精度な測定を行うととが出来る。
The light L2a that exits the scanning device is light L that is not affected by surface tilt.
Combined with 3a and proceeding 0 When combined, two lights L2
Since the polarization directions of a and L3a are perpendicular to each other, they do not interfere with each other, and even though their optical paths coincide, the light affected by the surface tilt and the light not affected are clearly separated. This synthetic light L4
Immediately before entering the sensor 6, the light is split again by the polarizing beam splitter 5 into two beams with different polarization directions. If the polarization direction split by this polarization beam splitter 5 is the same as the polarization direction split by the first polarization beam splitter 2, light with and without a tilt component can be clearly separated. After that, each beam of light enters the beam position detection sensor 6.7, and the amount of positional deviation is measured, but at this time, the light with the tilt component is affected by the error of the mirror in the middle. , the other light is also being received, so by taking the difference in their respective outputs, it is possible to isolate only the influence of the surface tilt and perform highly accurate measurements.

(実施例) 第1図に回転ポリゴンミラーの面倒れ測定装置の構成を
示す、光源1のHe N aレーザより出射されたレー
ザービームL1はまず、偏光ビームスプリッタ2に入射
する。He N eレーザの偏光方向は水平方向から4
5°傾いた方向にしておき、偏光ビームスプリッタ2は
水平方向の成分と垂直方向の成分とにわけるように設置
されているのでレーザよりきた光L1は偏光ビームスプ
リッタ2によりほぼ均等に分割される。垂直偏光のレー
ザビームL2は回転ポリゴンミラーに入射し、走査され
ると同時に面倒れの影響を受はビームL2aとして図の
右方向に出射する。一方、水平偏光のレーザビームは偏
光ビームスプリッタ2からビームL3として図の右方向
に出射され、ミラーM1を介しL3aは図の右方向に出
射され、ここでスキャナを介した垂直偏光の光と合成さ
れる1合成光L4は、ミラーM2、ミラーM3を介し、
偏光ビームスプリッタ5に入射する。ここでも偏光ビー
ムスプリッタ5は水平偏光のみ反射するよう設置されて
いるのでスキャナの面倒れ成分をもつ垂直偏光の光L5
aは、偏光ビームスプリッタ5を透過し、センサ6に入
射し、面倒れ成分をもたない水平偏光の光L5bは偏光
ビームスプリッタ5で反射されセンサ7に入射する。セ
ンサ6、及びセンサ7はレーザビームの位置を検出し、
電気信号A、電気信号Bとして出力する。出力された電
気信号A及び電気信号Bは差動出力回路Cに入力され電
気信号Aと電気信号Bの差が最終的な面倒れ信号として
出力される。ここで途中の折返しミラーM2及び折返し
ミラーM3が振動や温度変化により所定の折返し角より
誤差を持った場合、合成光はその誤差成分により所定の
位置をずれて偏光ビームスプリッタ5及びセンサ6、セ
ンサ7に入力される。このとき合成光L4のうける誤差
の影響は水平偏光、垂直偏光ともに同じであるのでミラ
ーM2及びM3の誤差の影響はセンサ6゜7ともに同じ
量だけ検出される。ところがその後の差動出力回路によ
りセンサ6の出力信号Aとセンサ7の出力信号Bとの差
がとられるのでこのときミラーによって生じた垂直偏光
水平偏光ともに同量の誤差成分は差引0となるので出力
されず、垂直偏光と水平偏光で違う成分だけ出力される
。このように途中におかれた折返しミラーM2、M3の
誤差は、出力信号に影響しないのでこのような構成とす
ることにより高精度かつ小型な面倒れ測定装置が実現で
きることになる。
(Example) FIG. 1 shows the configuration of a rotating polygon mirror surface tilt measurement device. A laser beam L1 emitted from a He Na laser of a light source 1 first enters a polarizing beam splitter 2. The polarization direction of the HeNe laser is 4 degrees from the horizontal direction.
The direction is tilted by 5 degrees, and the polarizing beam splitter 2 is installed so that it can be divided into a horizontal component and a vertical component, so the light L1 coming from the laser is split almost equally by the polarizing beam splitter 2. . The vertically polarized laser beam L2 is incident on the rotating polygon mirror, is scanned, and at the same time is affected by the surface inclination and is emitted as a beam L2a in the right direction in the figure. On the other hand, the horizontally polarized laser beam is emitted from the polarization beam splitter 2 as beam L3 in the right direction in the figure, and L3a is emitted in the right direction in the figure via the mirror M1, where it is combined with the vertically polarized light that has passed through the scanner. One combined light L4 is transmitted through mirror M2 and mirror M3,
The light is incident on the polarizing beam splitter 5. Here, too, the polarizing beam splitter 5 is installed so as to reflect only horizontally polarized light, so the vertically polarized light L5 has a tilt component of the scanner surface.
The light a passes through the polarizing beam splitter 5 and enters the sensor 6, and the horizontally polarized light L5b, which does not have a tilt component, is reflected by the polarizing beam splitter 5 and enters the sensor 7. Sensor 6 and sensor 7 detect the position of the laser beam,
Output as electrical signal A and electrical signal B. The output electrical signals A and B are input to a differential output circuit C, and the difference between the electrical signals A and B is output as a final signal. If the folding mirror M2 and the folding mirror M3 on the way have an error from the predetermined folding angle due to vibration or temperature change, the combined light will deviate from the predetermined position due to the error component, and the polarizing beam splitter 5, sensor 6, and sensor 7 is input. At this time, since the influence of the error on the composite light L4 is the same for both the horizontally polarized light and the vertically polarized light, the same amount of the influence of the error on the mirrors M2 and M3 is detected by both the sensors 6 and 7. However, since the differential output circuit then calculates the difference between the output signal A of sensor 6 and the output signal B of sensor 7, the error component of the same amount for both vertically polarized and horizontally polarized light generated by the mirror becomes 0. Instead, only the different components of vertically polarized light and horizontally polarized light are output. Errors in the folding mirrors M2 and M3 placed in the middle do not affect the output signal, so with this configuration, a highly accurate and compact surface tilt measuring device can be realized.

(発明の効果) 以上詳細に説明したように、本発明によれば、光源より
でた光が第1の偏光ビームスプリッタに入射し。
(Effects of the Invention) As described above in detail, according to the present invention, light emitted from the light source enters the first polarizing beam splitter.

分割された一方の光が光偏向器に入射し、残る一方の光
は光偏向器を介さずに第2の偏光ビームスプリッタによ
り光偏向器からの出射光と再び合成され、1枚、又は複
数のミラーを介して第3の偏光ビームスプリッタに入射
し、再び分割され、分割された各々の光がそれぞれ2個
のビーム位置検出センサに入射する構成とし、それぞれ
のセンサ出力の差を取って面倒れ量を求めるようにとし
たのでノイズの影響を受けにくい高精度、かつ小型な面
倒れ測定装置を構成できる。又レーザビーム位置誤差を
出力とするような他の測定システムにも適用可能である
という利点を有する。
One of the split lights enters the optical deflector, and the remaining light is combined with the output light from the optical deflector by a second polarizing beam splitter without going through the optical deflector, and is combined with the output light from the optical deflector into one or more beams. The beam enters a third polarizing beam splitter via a mirror, is split again, and each split beam enters two beam position detection sensors. Since the amount of tilt is determined, it is possible to construct a highly accurate and compact surface tilt measurement device that is not easily affected by noise. It also has the advantage of being applicable to other measurement systems that output laser beam position errors.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例を示す面倒れ測定装置の構成
図、第2図は従来例を示す面倒れ測定装置の構成図であ
る。 1・・・・・・光源 2.4.5・・・・・・偏向ビームスプリッタ3・・・
・・・光偏向器 6.7・・・・・・センサ Ml、M2.M3・・・・・・ミラー A、B・・・・・・電気信号 C・・・・・・差動出力回路 Ll、L2.L3.L2a、L3a、L4.L5a。 L5b・・・・・・ビーム 特許出願人 コパル電子株式会社 第2図
FIG. 1 is a configuration diagram of a surface inclination measuring device showing an embodiment of the present invention, and FIG. 2 is a configuration diagram of a surface inclination measuring device showing a conventional example. 1... Light source 2.4.5... Deflection beam splitter 3...
. . . Light deflector 6.7 . . . Sensors Ml, M2. M3...Mirror A, B...Electric signal C...Differential output circuit Ll, L2. L3. L2a, L3a, L4. L5a. L5b... Beam patent applicant Copal Electronics Co., Ltd. Figure 2

Claims (1)

【特許請求の範囲】[Claims] 光源より出た光が第1の偏光ビームスプリッタに入射し
、分割された一方の光を光偏向器に入射し、他の光は光
偏向器を介さずに第2の偏光ビームスプリッタにより光
偏向器からの出射光と再び合成して、1枚、又は複数の
ミラーを介して第3の偏光ビームスプリッタに入射し、
再び分割され、分割された各々の光が2個のビーム位置
検出センサにそれぞれ入射する構成とし、それぞれのセ
ンサ出力の差を取って面倒れ量を求めるようにしたこと
を特徴とする光偏向器の面倒れ測定装置。
The light emitted from the light source enters the first polarizing beam splitter, one of the split lights enters the optical deflector, and the other light is optically deflected by the second polarizing beam splitter without going through the optical deflector. recombining with the light emitted from the device and entering the third polarizing beam splitter via one or more mirrors,
An optical deflector characterized in that the light is split again, each of the split lights is incident on two beam position detection sensors, and the amount of surface tilt is determined by taking the difference between the sensor outputs. A device for measuring surface inclination.
JP2974889A 1989-02-10 1989-02-10 Surface inclination measuring instrument for optical deflector Pending JPH02210237A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2974889A JPH02210237A (en) 1989-02-10 1989-02-10 Surface inclination measuring instrument for optical deflector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2974889A JPH02210237A (en) 1989-02-10 1989-02-10 Surface inclination measuring instrument for optical deflector

Publications (1)

Publication Number Publication Date
JPH02210237A true JPH02210237A (en) 1990-08-21

Family

ID=12284720

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2974889A Pending JPH02210237A (en) 1989-02-10 1989-02-10 Surface inclination measuring instrument for optical deflector

Country Status (1)

Country Link
JP (1) JPH02210237A (en)

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