JPH0221248A - Appearance inspection of soldered part for electronic component - Google Patents
Appearance inspection of soldered part for electronic componentInfo
- Publication number
- JPH0221248A JPH0221248A JP63171211A JP17121188A JPH0221248A JP H0221248 A JPH0221248 A JP H0221248A JP 63171211 A JP63171211 A JP 63171211A JP 17121188 A JP17121188 A JP 17121188A JP H0221248 A JPH0221248 A JP H0221248A
- Authority
- JP
- Japan
- Prior art keywords
- solder
- brightness
- electronic component
- check area
- pixels
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
- G01N21/95684—Patterns showing highly reflecting parts, e.g. metallic elements
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
(産業上の利用分野)
本発明は、基板に実装された電子部品の半田部の外観検
査方法に関する。DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a method for visually inspecting a solder portion of an electronic component mounted on a board.
(従来の技術)
基板に実装された電子部品の電極には一般に半田付がな
されるが、その中には半田過多、半田過少、半田無、生
溶けなどの半田状態が不良のものが含まれている。した
がって電子部品を基板に実装した後で半田部の外観検査
を行われるが、従来、かかる半田部の外観検査は、作業
者が目視により行っていた。(Prior art) The electrodes of electronic components mounted on a board are generally soldered, but some solder may be in poor condition, such as too much solder, too little solder, no solder, or half-melted solder. ing. Therefore, the appearance of the solder portion is inspected after the electronic component is mounted on the board, but conventionally, the appearance inspection of the solder portion has been visually inspected by an operator.
(発明が解決しようとする課題)
しかしながら作業者の目視検査では作業能率があがらず
、また個人誤差により判定にばらつきを生じやすい問題
があった。(Problems to be Solved by the Invention) However, visual inspection by workers does not improve work efficiency, and there are problems in that judgments tend to vary due to individual errors.
したがって本発明は、基板に実装された電子部品の半田
部の外観・を迅速にかつ精度よく検査できる方法を提供
することを目的とする。Therefore, an object of the present invention is to provide a method that can quickly and accurately inspect the appearance of the soldered portion of an electronic component mounted on a board.
(課題を解決するための手段)
このために本発明は、基板に実装された電子部品の側部
の電極の端面を輝度の切り換わりを検出する光学手段に
より検出した後、この端面の外方に半田部のチェックエ
リアを設定し、このチェックエリアに光を照射してカメ
ラによりこのチェックエリアを観察し、設定輝度を有す
る画素数を求めることにより、半田部の外観を検査する
ようにしたものである。(Means for Solving the Problems) For this purpose, the present invention detects the end face of an electrode on the side of an electronic component mounted on a board using an optical means that detects a change in brightness, and then The appearance of the solder part is inspected by setting a check area for the solder part, shining light on the check area, observing the check area with a camera, and finding the number of pixels with the set brightness. It is.
(作用)
上記構成において、基板に実装された電子部品の端面を
検出した後、この端面の外方にチェックエリアを設定し
、このチェックエリアをカメラにより観察して、チェッ
クエリア内で設定輝度を有する画素数を求めて、半田部
の外観を検査する。(Function) In the above configuration, after detecting the end face of the electronic component mounted on the board, a check area is set outside this end face, this check area is observed with a camera, and the set brightness is adjusted within the check area. The appearance of the solder part is inspected by determining the number of pixels it has.
(実施例) 以下、図面を参照しながら本発明の詳細な説明する。(Example) Hereinafter, the present invention will be described in detail with reference to the drawings.
第1図は電子部品の外観検査装置の斜視図であって、1
はXY子テーブル、3から成る位置決め部4上にセット
された基板であり、その上面に電子部品5が実装されて
いる。なお基板1上には一般に多数の電子部品が実装さ
れているが、本図においては電子部品は1個のみ示して
いる。6は基板1の上方に配設されたカメラ、7はハロ
ゲンランプのようなリング状光源部、14はカメラ6に
接続されたコンピュータから成る演算装置である。第2
図は上記カメラ6に撮像された画像装置の画面を示すも
のであって、電子部品5の両側部の電極P、Qは、基板
1に印刷された印刷パターン10.11に接地している
。電極P、Qは、半田メツキされた金属のような印刷パ
ターン10.11よりも輝度の大きい素材にて形成され
ている。12.13は電極P、Qとパターン10.11
を接続する半田部である。Aは半田部12.13に設定
された枠状のチェックエリアであって、電極P、Qの外
方に設定されており上記カメラ6によりこのチェックエ
リアA内を観察し、チェックエリアA内の各画素a、a
・・・の輝度が検出される。FIG. 1 is a perspective view of an external appearance inspection device for electronic components,
is a board set on a positioning unit 4 consisting of an XY child table 3, and an electronic component 5 is mounted on its upper surface. Although many electronic components are generally mounted on the substrate 1, only one electronic component is shown in this figure. 6 is a camera disposed above the substrate 1; 7 is a ring-shaped light source such as a halogen lamp; and 14 is an arithmetic unit consisting of a computer connected to the camera 6. Second
The figure shows the screen of the image device taken by the camera 6, and the electrodes P and Q on both sides of the electronic component 5 are grounded to the printed pattern 10.11 printed on the substrate 1. The electrodes P and Q are made of a material with higher brightness than the printed pattern 10.11, such as solder-plated metal. 12.13 is electrode P, Q and pattern 10.11
This is the solder part that connects. A is a frame-shaped check area set in the solder part 12.13, and is set outside the electrodes P and Q. The inside of this check area A is observed with the camera 6, and the inside of the check area A is Each pixel a, a
The brightness of ... is detected.
電極P、Qの端面Pa、Qbは、例えば次のような光学
手段により検出される。すなわち第5図に示すように電
極Qの実装が予想される位置の内方に光学走査のスター
トラインm1nlを、また外方にゴールラインm2n2
を設定し、スタートラインm l n lから走査線1
1で示すようにゴールラインm2n2へ向って光学走査
し、輝度が明から暗に切り換わる位置を検出することに
より、端面Qbを検出する。この場合、走査線12で示
すように、明から暗に切り換わる点を検出して端面Qb
を検出する。あるいは又、更にそのまま一定画素数(例
えば4画素)暗を検出することにより半田部13の存在
を確認し、そこで4画素逆戻りして暗から明に切り換わ
る位置を検出することにより、端面Qbを再度確認して
もよい。なおこの種電極の輝度は一般にかなり高いが、
これに対し上方のカメラ6で観察される半田部12.1
3の輝度は、第3図(a)を参照しながら後述するよう
にかなり低いため、上記光学的手段により端面Qbは簡
単に検出できる。なおチェックエリアを設定する手段と
して、上記手段によらずに、半田部の予想位置に予め設
定することが考えられる。しかしながらかかる手段によ
っては、電子部品が位置ずれしていると誤って半田部以
外の部分をカメラで観察することとなる。これに対し、
本発明のように、先ず電極の端面を検出したうえで、そ
の外方にチェックエリアを設定すれば、確実に半田部を
観察できる。The end faces Pa and Qb of the electrodes P and Q are detected, for example, by the following optical means. That is, as shown in FIG. 5, the start line m1nl of optical scanning is placed inward of the position where the electrode Q is expected to be mounted, and the goal line m2n2 is placed outward.
and scan line 1 from the start line m l n l
The end face Qb is detected by optically scanning toward the goal line m2n2 and detecting the position where the brightness switches from bright to dark, as shown by 1. In this case, as shown by the scanning line 12, a point where the light changes from bright to dark is detected and the end surface Qb is
Detect. Alternatively, the existence of the solder portion 13 is confirmed by detecting a certain number of pixels (for example, 4 pixels) dark, and then the edge surface Qb is detected by going back 4 pixels and detecting the position where the dark changes to the bright. You may check again. Although the brightness of this type of electrode is generally quite high,
In contrast, the solder portion 12.1 observed by the upper camera 6
Since the brightness of No. 3 is quite low as will be described later with reference to FIG. 3(a), the end surface Qb can be easily detected by the optical means described above. Note that as a means for setting the check area, it is conceivable to set the check area in advance at an expected position of the solder portion, instead of using the above-mentioned means. However, with such means, if the electronic component is misaligned, parts other than the solder part may be mistakenly observed with the camera. On the other hand,
As in the present invention, by first detecting the end face of the electrode and then setting a check area outside of it, the solder portion can be observed reliably.
ここで、第3図(a)に示すように半田部12の上方か
ら光を照射して上方のカメラ6により半田部12を観察
した場合、大部分の光は半田部12の表面で斜め方向に
鏡面反射されるため、カメラ6には反射光は殆ど入射せ
す、したがって半田部12の輝度は低い。また同図(b
)に示すように半田部が無い場合は、光は印刷パターン
10で乱反射されてその一部がカメラ6に入射するため
、輝度は中程度である。なお半田部が生溶けの場合も、
この場合と同様にその輝度は中程度である。また同図(
C)。Here, when light is irradiated from above the solder part 12 and the solder part 12 is observed with the camera 6 above, as shown in FIG. Since the reflected light is mirror-reflected, most of the reflected light is incident on the camera 6, and therefore the brightness of the solder portion 12 is low. Also in the same figure (b
), when there is no solder part, the light is diffusely reflected by the printed pattern 10 and a part of it enters the camera 6, so the brightness is medium. In addition, even if the solder part is raw,
As in this case, the brightness is medium. Also, the same figure (
C).
(d)に示すように、半田部が過多又は過少の場合は、
大部分の光は半田部表面で上方へ鏡面反射されるため、
輝度はきわめて大きい。このように、上方から光を照射
して上方のカメラにより半田部を観察すれば、その反射
特性により半田部の外観を検査できる。As shown in (d), if there is too much or too little solder,
Most of the light is specularly reflected upwards on the solder surface, so
The brightness is extremely high. In this way, by irradiating light from above and observing the solder part with the camera above, the appearance of the solder part can be inspected based on its reflection characteristics.
第4図はこのような半田部の状態による輝度と画素数の
ヒストグラムであって、第3図(a)に示す正常な半田
部の輝度はに1以下、また半田部無及び生溶けの場合の
輝度はに2〜に3、半田部過多又は過少の場合の輝度は
に4以上である。したがって、カメラ6により半田部の
輝度を検出することにより、半田部の外観を判断するこ
とができる。すなわち、チェックエリアAの全画素数S
に占める正常半田部の画素数S1の割合31/Sを演算
装置14により算出し、これが設定割合以上の場合は、
半田部は正常と判断する。この設定割合は、要求される
精度から任意に設定される。また同様にして半田部無及
び生溶け、あるいは半田部過多又は過少の場合の画素数
32.S3.S4をそれぞれ求め、次にこれらが全画素
数Sに占める割合S2/S、S3/S、S4/Sを求め
て、4つの割合SL/5−34/Sから総合的に半田部
の外観を判断してもよい、この場合、例えばS1/Sが
50%以上、S2/Sが30%以下、S3/S及びS4
/Sがそれぞれ10%以下であればOKというように、
実装要求に応じて、合否の判断基準を自由に設定するこ
とができる。Figure 4 is a histogram of the brightness and number of pixels depending on the condition of the solder part, and the brightness of the normal solder part shown in Figure 3 (a) is less than 1, and in the case of no solder part and raw melting. The brightness is about 2 to about 3, and the brightness when there is too much or too little solder is about 4 or more. Therefore, by detecting the brightness of the solder part with the camera 6, the appearance of the solder part can be determined. In other words, the total number of pixels S in check area A
The calculation device 14 calculates the ratio 31/S of the number of pixels S1 of the normal solder part to the total number of pixels, and if this is greater than the set ratio,
The solder part is judged to be normal. This setting ratio is arbitrarily set based on the required accuracy. In the same way, the number of pixels is 32 when there is no solder, raw melting, or too much or too little solder. S3. S4, respectively, and then find the proportions S2/S, S3/S, and S4/S that these account for in the total number of pixels S, and comprehensively evaluate the appearance of the solder part from the four proportions SL/5-34/S. In this case, for example, S1/S is 50% or more, S2/S is 30% or less, S3/S and S4
If /S is 10% or less, it is OK.
Criteria for determining pass/fail can be freely set according to implementation requirements.
因みに、正常な半田部の場合は、チェックエリアA内の
各画素a、a・・・の輝度は大部分かに1以下であり、
したがって31/Sはほぼ100%、S2/S、33/
5SS4/Sはほぼ0%になる。また勿論チェックエリ
アA内の画素数Sは既知であるので、上記のような各割
合Sl/S〜S 4/Sを特に求めなくとも、各画素数
81〜S4の多寡から単純に合否を判断することもでき
るものであり、このようにカメラで検出されたチェック
エリアの輝度から、半田部の合否を判断する方法は種々
考えられる。Incidentally, in the case of a normal solder part, the brightness of each pixel a, a, etc. in the check area A is mostly 1 or less,
Therefore, 31/S is almost 100%, S2/S, 33/
5SS4/S is almost 0%. Also, of course, since the number S of pixels in the check area A is known, pass/fail can be determined simply from the number of pixels 81 to S4, without having to specifically find each ratio Sl/S to S4/S as described above. Various methods can be considered for determining pass/fail of the solder portion from the brightness of the check area detected by the camera in this way.
(発明の効果)
以上説明したように本発明は、基板に実装された電子部
品の側部の電極の端面を輝度の切り換わりを検出する光
学手段により検出した後、この端面の外方に半田部のチ
ェックエリアを設定し、このチェックエリアに光を照射
してカメラによりこのチェックエリアを観察し、設定輝
度を有する画素数を求めることにより、半田部の外観を
検査するようにしているので、半田部が正常であるか否
かを、簡単にかつ精度よく検査することができるもので
あり、殊に正常半田部だけでなく、半田熱、半田生溶け
、過少、過多などの異常半田部も併せて検出して、実装
要求に応じた合否の判断をすることができる。(Effects of the Invention) As explained above, the present invention detects the end face of the electrode on the side of an electronic component mounted on a board using an optical means that detects a change in brightness, and then solders the end face to the outside of this end face. The appearance of the solder part is inspected by setting a check area for the solder part, shining light on the check area, observing the check area with a camera, and finding the number of pixels with the set brightness. It is possible to easily and accurately inspect whether or not the solder area is normal.It is especially capable of inspecting not only normal solder areas, but also abnormal solder areas such as solder heat, unmelted solder, too little solder, and too much solder. It is also possible to detect them and make a pass/fail judgment according to the implementation request.
図は本発明の実施例を示すものであって、第1図は外観
検査装置の斜視図、第2図は検査中の正面図、第3図(
a)、(b)、 (c)。
(d)は検査中の部分側面図、第4図はヒストグラム図
、第5図は検査中の正面図である。
1・・・基板
5・・・電子部品
6・・・カメラ
12.13・・・半田部
14・・・演算装置
A・・・チェックエリア
P、Q・・・電極
S・・・全画素数
Sl・・・正常半田部の画素数
代理人の氏名弁理士 粟 野 重 孝ほか1名(c)半
田部過多(輝度大)
(d)半田部過少(輝度大)The drawings show an embodiment of the present invention, in which Fig. 1 is a perspective view of the external appearance inspection device, Fig. 2 is a front view during inspection, and Fig. 3 (
a), (b), (c). (d) is a partial side view during inspection, FIG. 4 is a histogram diagram, and FIG. 5 is a front view during inspection. 1... Board 5... Electronic component 6... Camera 12. 13... Solder section 14... Arithmetic device A... Check area P, Q... Electrode S... Total number of pixels Sl...Number of pixels of normal solder area Name of agent: Patent attorney Shige Takashi Awano and one other person (c) Too much solder area (high brightness) (d) Too little solder area (high brightness)
Claims (1)
切り換わりを検出する光学手段により検出した後、この
端面の外方に半田部のチェックエリアを設定し、このチ
ェックエリアに光を照射してカメラによりこのチェック
エリアを観察し、設定輝度を有する画素数を求めること
により、半田部の外観を検査するようにしたことを特徴
とする電子部品の半田部の外観検査方法。After the end face of the electrode on the side of the electronic component mounted on the board is detected by an optical means that detects a change in brightness, a check area of the solder part is set outside of this end face, and light is shined into this check area. A method for inspecting the appearance of a soldered part of an electronic component, characterized in that the appearance of the soldered part is inspected by irradiating the area, observing the check area with a camera, and determining the number of pixels having a set brightness.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63171211A JP2629280B2 (en) | 1988-07-08 | 1988-07-08 | Appearance inspection method of solder part of electronic parts |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63171211A JP2629280B2 (en) | 1988-07-08 | 1988-07-08 | Appearance inspection method of solder part of electronic parts |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0221248A true JPH0221248A (en) | 1990-01-24 |
| JP2629280B2 JP2629280B2 (en) | 1997-07-09 |
Family
ID=15919096
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63171211A Expired - Lifetime JP2629280B2 (en) | 1988-07-08 | 1988-07-08 | Appearance inspection method of solder part of electronic parts |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2629280B2 (en) |
-
1988
- 1988-07-08 JP JP63171211A patent/JP2629280B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JP2629280B2 (en) | 1997-07-09 |
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