JPH02216005A - Method for inspecting soldering of mounting part - Google Patents
Method for inspecting soldering of mounting partInfo
- Publication number
- JPH02216005A JPH02216005A JP3715289A JP3715289A JPH02216005A JP H02216005 A JPH02216005 A JP H02216005A JP 3715289 A JP3715289 A JP 3715289A JP 3715289 A JP3715289 A JP 3715289A JP H02216005 A JPH02216005 A JP H02216005A
- Authority
- JP
- Japan
- Prior art keywords
- soldering
- light
- image
- solder
- height
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
Description
本発明は、プリント基板の表面に実装された電子部品の
はんだ付状態を検査する方法に関する。The present invention relates to a method for inspecting the soldering state of electronic components mounted on the surface of a printed circuit board.
従来、プリント基板に実装された電子部品のはんだ付状
態を検査する方法としては、主に人手による目視検査が
行われてきた。この種の実装部品の外観検査を自動化す
る方式としては、実装された部品の位置を光学的に検査
する装置があるが、未はんだ等のはんだ付状態は検査で
きないという欠点があった。さらに、電気的導通試験に
より間接的に検査する方法もある。Conventionally, manual visual inspection has been mainly used as a method for inspecting the soldering state of electronic components mounted on printed circuit boards. As a system for automating the appearance inspection of this type of mounted components, there is a device that optically inspects the position of the mounted components, but it has the drawback that it cannot inspect the soldered state such as unsoldered. Furthermore, there is also a method of indirect inspection using an electrical continuity test.
電気的導通試験ははんだ付部の導通を検査する試験であ
り、確実にはんだ付されていなくともプリント基板のパ
ターンと電子部品の電極部が接触等により、電気的に導
通すれば、検査には合格してしまう。従って、はんだ付
検査は目視検査に依存するのが現状であり、目視検査に
整合する形ではまだ自動化されておらず、自動化が要望
されている。The electrical continuity test is a test to check the continuity of the soldered parts. Even if the soldering is not secure, if there is electrical continuity due to contact between the printed circuit board pattern and the electrode part of the electronic component, the test can be carried out. I passed the exam. Therefore, soldering inspection currently relies on visual inspection and has not yet been automated in a manner consistent with visual inspection, and automation is desired.
この課題を解決するため、電子部品の電極部とはんだ付
部に上部からスリット光線を照射するための光源または
レーザ光源を上部に配置し、照射された部分の拡散光を
受光するための受光エリアセンサ(CCDやホトダイオ
ード等)を上部に配置することにより、三角測量方式に
より光学的に測定し、受光エリアセンサで得られた像は
プリン上基板からの電子部品電極部およびはんだ何部の
高さ情報すなわち形状情報を提供する。In order to solve this problem, a light source or a laser light source is placed at the top to irradiate the electrodes and soldered parts of electronic components with a slit beam from above, and a light-receiving area is created to receive the diffused light from the irradiated area. By placing a sensor (CCD, photodiode, etc.) on the top, optical measurement is performed using a triangulation method, and the image obtained by the light receiving area sensor shows the height of the electronic component electrodes and solder parts from the printed circuit board. information, that is, shape information.
本方式は三角測量方式を利用することにより、照射され
た面での乱反射による拡散光を撮影した受光エリアセン
サの像が照射面のプリント基板からの高さ情報を表わす
ことに着目し、電極端部およびはんだ何部のその像に関
して電極端部近傍にはんだが無い場合はそのはんだ部の
高さは低い値を示し、はんだが付いていてフィレットが
形成されている場合はそのはんだ部の高さはフィレット
の形状の高さが示されるので、電極端部およびはんだ何
部の像を抽出し、高さ情報の波形形状の差からはんだ付
状態を検査するものである。This method uses a triangulation method to focus on the fact that the image of the light-receiving area sensor, which captures the diffused light due to diffuse reflection on the irradiated surface, represents the height information of the irradiated surface from the printed circuit board. Regarding the image of the part and solder part, if there is no solder near the end of the electrode, the height of the solder part will be low; if there is solder and a fillet is formed, the height of the solder part will be low. Since the height of the fillet shape is shown, images of the electrode end and solder parts are extracted, and the soldering state is inspected from the difference in the waveform shape of the height information.
第1図は本発明による検査方法を説明する図であり、1
はプリント基板3上にはんだ付された電子部品の電極部
、2ははんだ何部、3はプリント基板でありプリント基
板3の鉛直上方に配置された半導体レーザ等の光源4に
より下向きにスリット光5を照射する。照射されたスリ
ット光5は部品電極部1、はんだ何部2およびプリント
基板部3の表面で乱射して拡散光7となり、その斜め上
方に配置した(電荷結合素子や撮像素子などから成る)
受光エリアセンサ6によりまたはカメラ6により像とし
て検出される。
第2図はチップ部品等の別部品のはんだ付状態を検査す
るための構成図で、第1図と同じ参照数字は同じ構成部
分を示している。第3図゛は第1′図および第2図とは
別の構成図であるが、第1図および第2図と同様に拡散
光7の像を検出することができる。
第4図はさらに別の構成例で、光源4から発せられたレ
ーザ光線等のスボ、ット8を多面鏡9を介して部品電極
部1およびはんだ何部2を反復的に走査して照射する例
である。第1図と相違する点は照射する光線をスポット
光にすることにより、さらに絞った光線を照射すること
ができる点である。
第5図は第1図〜第4図に示した構成のカメラまたは受
光エリアセンサ6により得られる像である。
プリント基板部3と部品電極部1とが正常にはんだ付さ
れている瑞谷は、第5図(イ)に示すような部□晶型極
部の像10と、はんだ何部の像11と、プリント基板の
像12とが得られる。これらに対してプリント基板部3
と部品電極部1との間のはんだ何部のはんだが少ない場
合は、第5図(I+)に示すように、はんだ何部11の
像がプリン1基板部の像12の側に寄っている。さらに
部品電極部1にはんだがぬれていない場合ば、第5図(
ハ)に示すように、はんだ何部の像11が部品電極部の
像10と連続しない像となる。従って、部品電極部1と
はんだ何部2のプリント基板3に対する高さ位置が把握
でき、各々のはんだ付状態に対し゛てはんだ何部の像1
1が第5図(イ)、(+1)+(ハ)のように異なるの
で、逆にはんだ何部の像11の虚いからはんだ付状態の
検査を行うことができる。
第7図(イ)および(0)は、第6図に示すようなJ型
リードを有するフラットパッケージ部品13を検査する
ための構成図であり、第1図および第2図における光源
4およびカメラまたは受光エリアセンサ6の配置を変更
し、部品電極(リード)部1、はんだ何部2、プリント
基板部3の斜め上方に光源4を設定し、光源4の横に受
光エリアセンサまたはカメラ6を設置したものである。
第8図(イ)、(u)、(ハ)は第7図(イ)、’(T
I)、’(ハ)の構成によるカメラまたは受光エリアセ
ンサ6によって得られた像であり、第5図(イ)、 (
El’)、’(ハ)と同様に、第8図(イ)に示す正常
にはんだが付いている場合の像、第8図(D)に示すは
んだ量が少ない像、第8図(ハ)に示す部品電極部(J
す□−ド)13にはんだがぬれていない像の様に各はん
だ付状態により異なる像が得られ、従って得ら糺た像の
相違によりはんだ付状態を検査することができる。FIG. 1 is a diagram illustrating the inspection method according to the present invention, 1
is an electrode part of an electronic component soldered on a printed circuit board 3, 2 is a solder part, 3 is a printed circuit board, and a slit light 5 is directed downward by a light source 4 such as a semiconductor laser placed vertically above the printed circuit board 3. irradiate. The irradiated slit light 5 is scattered on the surfaces of the component electrode section 1, the solder section 2, and the printed circuit board section 3 to become diffused light 7, which is disposed diagonally above (consisting of a charge-coupled device, an image sensor, etc.)
It is detected as an image by the light receiving area sensor 6 or by the camera 6. FIG. 2 is a block diagram for inspecting the soldering state of other components such as chip components, and the same reference numerals as in FIG. 1 indicate the same components. Although FIG. 3 is a different configuration diagram from FIGS. 1' and 2, it is possible to detect the image of the diffused light 7 in the same way as in FIGS. 1 and 2. FIG. 4 shows yet another configuration example, in which the component electrode portion 1 and the solder portion 2 are repeatedly scanned and irradiated with a laser beam etc. emitted from a light source 4 via a polygon mirror 9. This is an example. The difference from FIG. 1 is that by converting the irradiated light beam into a spot light, a more focused light beam can be irradiated. FIG. 5 shows an image obtained by the camera or light-receiving area sensor 6 having the configuration shown in FIGS. 1-4. Mizutani, in which the printed circuit board part 3 and the component electrode part 1 are normally soldered, has a part as shown in FIG. , an image 12 of the printed circuit board are obtained. For these, the printed circuit board section 3
If there is less solder between the solder part 1 and the component electrode part 1, the image of the solder part 11 is closer to the image 12 of the printed circuit board part 1, as shown in FIG. 5 (I+). . Furthermore, if the component electrode part 1 is not wetted with solder, as shown in Fig. 5 (
As shown in c), the image 11 of the solder portion is not continuous with the image 10 of the component electrode portion. Therefore, the height positions of the component electrode part 1 and the solder part 2 relative to the printed circuit board 3 can be grasped, and the image 1 of the solder part can be determined for each soldering state.
1 is different as shown in FIG. 5(a) and (+1)+(c), so the soldering state can be inspected from the vacancy of the image 11 of which part of the solder. 7(a) and 7(0) are configuration diagrams for inspecting the flat package component 13 having a J-type lead as shown in FIG. 6, and show the light source 4 and camera in FIGS. 1 and 2. Alternatively, change the arrangement of the light receiving area sensor 6, set the light source 4 diagonally above the component electrode (lead) part 1, the solder part 2, and the printed circuit board part 3, and place the light receiving area sensor or camera 6 next to the light source 4. It was installed. Figure 8 (a), (u), (c) are shown in Figure 7 (a), '(T
These are images obtained by the camera or light receiving area sensor 6 with the configurations of I) and '(C), and are shown in Figures 5(A) and (C).
El'), '(C), the image shown in Figure 8 (A) with normal solder, the image with a small amount of solder shown in Figure 8 (D), and the image shown in Figure 8 (H). ) The component electrode part (J
Different images are obtained depending on each soldering state, such as the image in which the solder is not wet on screen 13, and therefore the soldering state can be inspected based on the difference in the obtained glued images.
以上の様に、本発明によれば、□力□メラま元は受光エ
リアセンサにより得られた像ははんだ付状態および番j
んだ形状を反映するも゛のであり、この像に基づいて確
実にはんだ付状態の合否を判定できAs described above, according to the present invention, the image obtained by the light-receiving area sensor is based on the soldering state and number j.
It reflects the solder shape, and based on this image, it is possible to reliably judge whether the soldering condition is acceptable or not.
第1図は本発明によるはんだ付検査方法を実施する構成
の斜視図、第2図は第1図と異なる部品を検査する構成
の斜視図、第3図および第4図は第1図、第2図とは別
の構成の斜視図、第5図(イ)〜(ハ)は第1図〜第4
図の構成で得られた像を示す図、第6図はJ型リートを
有した部品の側面図、第7図(イ)および(U)は第6
図に示した部品を本発明方法により検査する構成の斜視
図と立面図、第8図(イ)〜(ハ)は第7図(イ)およ
び(D)の構成より得られた像を示す図である。
■一部品の電極部、2−はんだ付部、3−プリント基板
、4−光源、6−受光エリアセンサまたはカメラ、10
一部品電極部の像、11−はんだ付部の像、12−プリ
ント基板の像。FIG. 1 is a perspective view of a configuration for implementing the soldering inspection method according to the present invention, FIG. 2 is a perspective view of a configuration for inspecting parts different from that in FIG. 1, and FIGS. 3 and 4 are similar to those in FIGS. A perspective view of a configuration different from that shown in Figure 2, and Figures 5 (A) to (C) are the same as Figures 1 to 4.
Figure 6 shows the image obtained with the configuration shown in the figure. Figure 6 is a side view of the part with a J-type reed. Figures 7 (A) and (U) are the 6th
A perspective view and an elevation view of the configuration for inspecting the parts shown in the figure by the method of the present invention, and Figures 8 (A) to (C) are images obtained from the configuration of Figures 7 (A) and (D). FIG. ■Electrode part of one part, 2-Soldering part, 3-Printed circuit board, 4-Light source, 6-Light receiving area sensor or camera, 10
1 - Image of part electrode part, 11 - Image of soldering part, 12 - Image of printed circuit board.
Claims (1)
のはんだ付部にスリット光を照射し、該はんだ付部で反
射する散乱光を用いて映像を形成し、該映像に基づいて
判断した前記部品およびはんだ付部の高さ情報から実装
部品のはんだ付状態を検査することを特徴とする実装部
品のはんだ付検査方法。1) A slit light is irradiated on the electrode part or the soldered part at the end of a component mounted on a printed circuit board, an image is formed using the scattered light reflected by the soldered part, and judgments are made based on the image. A soldering inspection method for a mounted component, characterized in that the soldering state of the mounted component is inspected based on height information of the component and the soldered portion.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3715289A JPH02216005A (en) | 1989-02-16 | 1989-02-16 | Method for inspecting soldering of mounting part |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3715289A JPH02216005A (en) | 1989-02-16 | 1989-02-16 | Method for inspecting soldering of mounting part |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH02216005A true JPH02216005A (en) | 1990-08-28 |
Family
ID=12489636
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3715289A Pending JPH02216005A (en) | 1989-02-16 | 1989-02-16 | Method for inspecting soldering of mounting part |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH02216005A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03189506A (en) * | 1989-12-19 | 1991-08-19 | Matsushita Electric Ind Co Ltd | Device and method for inspecting outward appearance of soldering state |
| JPH0592698U (en) * | 1992-05-19 | 1993-12-17 | 前田建設工業株式会社 | Flow characteristic detector for concrete |
-
1989
- 1989-02-16 JP JP3715289A patent/JPH02216005A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03189506A (en) * | 1989-12-19 | 1991-08-19 | Matsushita Electric Ind Co Ltd | Device and method for inspecting outward appearance of soldering state |
| JPH0592698U (en) * | 1992-05-19 | 1993-12-17 | 前田建設工業株式会社 | Flow characteristic detector for concrete |
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