JPH0222462A - Crucible and production of metallic thin film using said crucible - Google Patents

Crucible and production of metallic thin film using said crucible

Info

Publication number
JPH0222462A
JPH0222462A JP63173304A JP17330488A JPH0222462A JP H0222462 A JPH0222462 A JP H0222462A JP 63173304 A JP63173304 A JP 63173304A JP 17330488 A JP17330488 A JP 17330488A JP H0222462 A JPH0222462 A JP H0222462A
Authority
JP
Japan
Prior art keywords
crucible
substrate
thin film
vapor pressure
alloy
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63173304A
Other languages
Japanese (ja)
Inventor
Shigeo Suzuki
茂夫 鈴木
Tomoaki Ando
智朗 安藤
Hidenobu Shintaku
秀信 新宅
Yoshiaki Yamamoto
義明 山本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP63173304A priority Critical patent/JPH0222462A/en
Publication of JPH0222462A publication Critical patent/JPH0222462A/en
Pending legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/24Vacuum evaporation
    • C23C14/246Replenishment of source material

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  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physical Vapour Deposition (AREA)

Abstract

PURPOSE:To form a metallic thin film having a uniform composition distribution in the cross direction by using a crucible provided with an opening having a longitudinal axis in the cross direction of a substrate and plural high-vapor- pressure component supply port in the longitudinal direction of the opening at the time of vacuum-depositing a thin film of an alloy of the metals having different vapor pressures on the long-sized and wide substrate. CONSTITUTION:The long-sized and wide polymeric film substrate 11 is traveled along the periphery of a rotating cylindrical can 12, and a Co-Cr alloy 15 in a crucible 14 is melted and vaporized by an electron beam 16 to form an alloy thin film on the substrate 11. At this time, the crucible 14 has a slender opening in the cross direction of the substrate 11, plural high-vapor-pressure component supply ports 18 are provided in the longitudinal direction, high-vapor-pressure Cr grains 20 are supplied from a feeder 17, the crucible is widened by the width W in the vicinity of the supply port 18, and a shield plate 19 is provided. By this method, the composition distribution of the Co-Cr alloy thin film to be formed on the substrate 11 is uniformized, and bumping is controlled.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は、真空蒸着によって金属薄膜を安定して形成す
るための製造法に関するものであり、特に金属薄膜表面
における異物と金属薄膜の組成が、その機能に重要な影
響を及ぼす例えば高密度記録特性に優れた垂直磁気記録
媒体等の製造法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION Field of Industrial Application The present invention relates to a manufacturing method for stably forming a metal thin film by vacuum evaporation. The present invention relates to a method for manufacturing perpendicular magnetic recording media, which have an important effect on functions, such as perpendicular magnetic recording media with excellent high-density recording characteristics.

従来の技術 一般に真空蒸着法はその高堆積速度の故に大面積、量産
用の薄膜形成法として用いられ、例えば金属薄膜形磁気
記録媒体の製造法としても適している。金属薄膜形の媒
体としてばCO基磁性薄膜媒体、特にCo−Cr媒体が
短波長記録特性の優れた垂直磁化型媒体として最適であ
る事がわかっている。Co−Cr媒体においては、媒体
膜中におけるCOとCrのwt%が約80:2oである
場合にその磁気的特性が優れておシ、それ故蒸着法によ
って上記媒体を製膜する場合、膜中てこの濃度割合とな
る様に、蒸発坩堝中でその組成を制御する必要がある。
2. Description of the Related Art Vacuum deposition is generally used as a method for forming thin films over large areas and for mass production because of its high deposition rate, and is also suitable as a method for manufacturing, for example, metal thin film magnetic recording media. As a metal thin film type medium, it has been found that a CO-based magnetic thin film medium, particularly a Co--Cr medium, is most suitable as a perpendicular magnetization type medium with excellent short wavelength recording characteristics. Co--Cr media has excellent magnetic properties when the wt% of CO and Cr in the media film is approximately 80:2o. It is necessary to control the composition in the evaporation crucible so as to maintain the concentration ratio in the evaporation crucible.

一般にCoおよびCr金属は高融点材料であり、蒸着の
場合その溶融蒸発手段としては電子線加熱法を用いるの
が一般的であυ、その例を第5図および第6図に示す。
In general, Co and Cr metals are high melting point materials, and in the case of vapor deposition, electron beam heating is generally used as the means for melting and evaporating them, examples of which are shown in FIGS. 5 and 6.

第5図に示す従来例1は単一坩堝の蒸発源を用いた方法
であり、あらかじめCo−Crの合金、この場合Co割
合の多い合金を坩堝1に装填しておき、電子線2により
加熱溶融させるものである。
Conventional Example 1 shown in FIG. 5 is a method using a single crucible evaporation source, in which a Co-Cr alloy, in this case an alloy with a high Co content, is loaded in advance into a crucible 1 and heated with an electron beam 2. It is something that melts.

この時、坩堝1内の合金は、その蒸気圧差が大きいため
に、蒸気圧の高いCr成分が先に蒸発し、膜中のCr濃
度が蒸着時間と共に減少し、例えば初期合金割合をCo
93:Cr7としても蒸着初期ではCr濃度が40%と
高く、蒸着時間の経過と共に膜中のCr濃度が徐々に減
少してゆく。そのために第5図においては、Cr粒3を
補給しながらその組成を制御するものである。
At this time, since the alloy in the crucible 1 has a large vapor pressure difference, the Cr component with a high vapor pressure evaporates first, and the Cr concentration in the film decreases with the evaporation time, for example, the initial alloy proportion is changed to Co
Even in the case of 93:Cr7, the Cr concentration is as high as 40% at the initial stage of vapor deposition, and the Cr concentration in the film gradually decreases as the vapor deposition time progresses. For this purpose, in FIG. 5, the composition is controlled while replenishing the Cr grains 3.

また第6図に示す従来例2は、CoとCrの2元蒸着源
を用いた方法であり、CoおよびCrを別々の坩堝4.
5より蒸発させ、キャン6上を走行する高分子フィルレ
ム基板了に堆積させるものである。
Conventional Example 2 shown in FIG. 6 is a method using a binary vapor deposition source of Co and Cr, and Co and Cr are deposited in separate crucibles 4.
5 and deposited on a polymer film substrate running on a can 6.

8は防着板であυ、9は巻出しローラ、1oは巻取υロ
ーラである。なお、従来例1においても、従来例2と同
じく、防着板、キャン、巻出しローラ、巻取りローラを
備えて薄膜を連続的に形成している。
8 is an adhesion prevention plate υ, 9 is an unwinding roller, and 1o is a winding υ roller. In addition, in Conventional Example 1, as in Conventional Example 2, a thin film is continuously formed using an anti-adhesive plate, a can, an unwinding roller, and a winding roller.

この様な真空蒸着法によ)製膜する場合、いづれも高分
子フィルム上に磁気記録媒体を構成し、磁気ヘッドと接
触して記録再生するため、媒体の平滑性、特にヘッドと
の間でスペーシング損失となるような異物のない事、あ
るいは磁気的特性が長尺に亘って維持されている事が必
要となり、その長尺の程度は生産的規模に見合う長さで
ある事が必要とされる。
When forming a film using such a vacuum evaporation method, a magnetic recording medium is constructed on a polymer film, and recording and reproduction is performed by contacting a magnetic head, so the smoothness of the medium, especially the relationship between the magnetic head and the head, is It is necessary that there are no foreign substances that cause spacing loss, or that the magnetic properties are maintained over a long length, and the length needs to be commensurate with the production scale. be done.

しかるに第6図に示す従来例1では以下の様な問題点を
生じるものであった。すなわち、この方法においては、
蒸気圧の高いCrはCr濃度の高い状態では金属状態と
してその線材化等が難しく、それ故金属粒としての補給
となる。この時、Cr金属は昇華性であるために加熱溶
融して坩堝に補給する事ができず、それ敗因に示す様な
粒状の供給となる。しかしながらこの場合、Cr粒は粒
状であるために種々の不凝縮ガスを吸着し易く、その状
態で溶湯内に供給されると所謂突沸現象が発生し、蒸着
膜中に比較的径の大きな溶湯と同一成分の異物が発生し
、磁気ヘッドとの接触において記録抜は等の大きな問題
を生じさせるものであった。
However, the conventional example 1 shown in FIG. 6 has the following problems. That is, in this method,
Cr, which has a high vapor pressure, is in a metallic state in a state where the Cr concentration is high and it is difficult to make it into a wire, so it is supplied as metal particles. At this time, since the Cr metal is sublimable, it cannot be heated and melted to be supplied to the crucible, and the Cr metal is supplied in the form of particles as shown in the explanation below. However, in this case, since the Cr grains are granular, they tend to adsorb various non-condensable gases, and if they are supplied into the molten metal in that state, a so-called bumping phenomenon occurs, causing molten metal with a relatively large diameter to form in the deposited film. Foreign matter of the same composition is generated, which causes major problems such as recording failure when it comes into contact with a magnetic head.

また、上記従来例1において、第7図、第8図に示すよ
うに、CO材料を供給しなから長尺基板に対応する方法
もあるが、基本的に上記問題点を有しているものである
。実際に巾広の基板フィルムに製膜する場合、基板巾方
向においてその組成割合の均一な事が要求され、第7図
に示す様な方法でCr粒を供給した場合、基板巾方向で
第8図に示す様な組成分布ができるものである。従って
Cr金属を供給しなから突沸現象を抑え、且つ巾広に亘
って組成分布を均一化する事が必要となる。
In addition, in the conventional example 1, as shown in FIGS. 7 and 8, there is a method that can handle long substrates without supplying CO material, but this method basically has the above problems. It is. When actually forming a film on a wide substrate film, it is required that the composition ratio be uniform in the width direction of the substrate. The composition distribution shown in the figure can be obtained. Therefore, it is necessary to suppress the bumping phenomenon without supplying Cr metal and to make the composition distribution uniform over a wide area.

−力筒6図に示す従来例2においては、基本的に従来例
1の様な異物発生に対する問題はないが、次の様な問題
を有しているものである。すなわち、この様な磁気記録
媒体を真空蒸着法によって作製するメリットはその高速
量産性にあり、蒸着速度は数千へ/気程度である。この
様な高蒸着速度の場合、2元蒸着法に於てはその組成制
御がうまくいかず、すなわち両者の蒸発粒子の混合が不
均一となり、フィルム基板の上流側と下流側すなわち膜
厚方向に濃度不均一を生じ特性を確保できないという問
題があった。
- Force cylinder 6 In the conventional example 2 shown in FIG. 6, there is basically no problem with the generation of foreign matter as in the conventional example 1, but it has the following problems. That is, the advantage of producing such a magnetic recording medium by the vacuum evaporation method is its high-speed mass production, and the evaporation rate is on the order of several thousand micrometers. In the case of such a high evaporation rate, the composition control is not successful in the binary evaporation method, which means that the evaporated particles of both types become unevenly mixed, and the evaporated particles become uneven on the upstream and downstream sides of the film substrate, that is, in the film thickness direction. There was a problem in that concentration non-uniformity occurred and characteristics could not be ensured.

発明が解決しようとする課題 このように蒸気圧差の大きい合金薄膜を製膜する場合に
は、蒸発源側で組成を制御する様に、例えば蒸気圧の高
い金属成分を補給したり、2元蒸着源でそれぞれ組成を
制御する方法があるが、補給に際し、突沸現象を生じた
り、長尺あるいは巾広に亘って膜組成が均一でなかった
シ、組成ムラが発生するといった課題がある。
Problems to be Solved by the Invention When forming an alloy thin film with such a large vapor pressure difference, it is necessary to control the composition on the evaporation source side, for example by replenishing a metal component with a high vapor pressure, or by using binary evaporation. Although there is a method of controlling the composition at each source, there are problems such as bumping phenomenon occurring during replenishment, non-uniform film composition over a long length or wide width, and compositional unevenness.

課題を解決するだめの手段 基板巾方向に長手軸を有して開口した坩堝の、その長平
方向に複数の高蒸気圧成分補給ボートを設け、補給ポー
ト近傍においては坩堝11〕を広げてその上部を閉そく
し、更に坩堝長手方向に電子線をスキャンさせながら坩
堝内金属を加熱溶融させる際、補給ポート近傍のスキャ
ン速度を周囲のスキャン速度よりも遅くするものである
Means to Solve the Problem A plurality of high vapor pressure component replenishment boats are provided in the longitudinal direction of a crucible that has an opening with a longitudinal axis in the width direction of the substrate, and in the vicinity of the replenishment port, the crucible 11] is expanded and the upper part of the crucible is expanded. When heating and melting the metal in the crucible while scanning the electron beam in the longitudinal direction of the crucible, the scan speed near the supply port is made slower than the scan speed around the crucible.

作   用 坩堝長手方向に複数の高蒸気圧成分補給ポートを設ける
事によって坩堝長手方向つまり巾広の基板巾方向に合金
薄膜の組成を均一化できる。更に高蒸気圧成分補給ボー
ト近傍の坩堝巾を広げてその上部を閉そくする事で、高
蒸気圧成分補給時の坩堝内突沸現象を抑えることができ
る。また、補給ポート近傍の電子線スキャン速度を周囲
でのスキャン速度よりも遅くする事で対流効果を助長さ
せて坩堝内での組成均一化と、高パワー密度域への高蒸
気圧成分の流入を防止して突沸の発生を抑制することが
できる。
By providing a plurality of high vapor pressure component supply ports in the longitudinal direction of the crucible, the composition of the alloy thin film can be made uniform in the longitudinal direction of the crucible, that is, in the width direction of the wide substrate. Furthermore, by widening the width of the crucible near the high vapor pressure component replenishment boat and closing off its upper part, it is possible to suppress the bumping phenomenon inside the crucible during replenishment of the high vapor pressure component. In addition, by making the electron beam scan speed near the supply port slower than the scan speed in the surrounding area, the convection effect is promoted, making the composition uniform within the crucible and allowing high vapor pressure components to flow into the high power density area. It is possible to prevent the occurrence of bumping.

実施例 本発明の一実施例を、第1図〜第4図を用いて説明する
Embodiment An embodiment of the present invention will be described with reference to FIGS. 1 to 4.

第1図は実施例に用いる真空蒸着装置の内部溝造である
。図において、11は長尺巾広の高分子フィルム基板で
あシ、回転する円筒状キャン12の周囲に沿って走行し
ながらその下部で合金薄膜を形成する。13は防着板兼
マスクであり、前記高分子フィルム基板11への合金薄
膜の付着領域を限定している。この下方には、耐熱性材
料よシなる坩堝14が設置されており、この坩堝14は
高分子フィルム基板11の巾方向に細長い形状としてい
る。坩堝14内には蒸気圧の低い金属とそれよりも蒸気
圧の高い金属とが溶融した状態で存在し、この溶融金属
15は上方からの電子線16で加熱されて蒸発し、前記
高分子フィルム11上に堆積する。この時、耐熱性材料
よシなる坩堝14内には蒸着すべき合金金属15が装填
され、電子線16により加熱溶融されている。又、この
時蒸着材料としてはCOとOrの合金であシ、高蒸気圧
成分のCrが先に蒸発する。そこで図に示す様にCr供
給装置17より複数の高蒸気圧成分補給ポート18を経
由してCrが坩堝14内に供給される。又この供給口1
8の部分は坩堝14と同一材料の遮蔽板19にて上部が
閉そくされており、その領域から上部方向へ蒸着物質が
蒸発しない構成となっている。
FIG. 1 shows the internal groove structure of the vacuum evaporation apparatus used in the example. In the figure, reference numeral 11 denotes a long and wide polymer film substrate, which runs along the periphery of a rotating cylindrical can 12 and forms an alloy thin film under it. Reference numeral 13 denotes an adhesion prevention plate and mask, which limits the area to which the alloy thin film is adhered to the polymer film substrate 11. A crucible 14 made of a heat-resistant material is installed below this, and this crucible 14 has an elongated shape in the width direction of the polymer film substrate 11. In the crucible 14, a metal with a low vapor pressure and a metal with a higher vapor pressure exist in a molten state, and this molten metal 15 is heated by an electron beam 16 from above and evaporated, forming the polymer film. 11. At this time, an alloy metal 15 to be vapor-deposited is loaded into a crucible 14 made of a heat-resistant material, and is heated and melted by an electron beam 16. Further, at this time, the evaporation material is an alloy of CO and Or, and Cr, which is a high vapor pressure component, evaporates first. Therefore, as shown in the figure, Cr is supplied into the crucible 14 from a Cr supply device 17 via a plurality of high vapor pressure component replenishment ports 18. Also, this supply port 1
The upper part of the part 8 is closed with a shielding plate 19 made of the same material as the crucible 14, so that the deposited substance does not evaporate upward from that region.

第2図には坩堝14部分を上面より見た図を示している
。坩堝14本体は基板巾方向に長い形状となっており、
その投手力向に複数の高蒸気圧成分補給ポート18が設
けられておシ、更に補給ポート18近傍では坩堝巾がW
だけ広げられており、第1図に示す如く遮蔽板19が設
けられている。
FIG. 2 shows a top view of the crucible 14 portion. The crucible 14 body has a long shape in the width direction of the substrate,
A plurality of high vapor pressure component replenishment ports 18 are provided in the direction of the pitcher force, and furthermore, near the replenishment port 18, the crucible width is W.
As shown in FIG. 1, a shielding plate 19 is provided.

また第3図は第2図に示す坩堝14を長手方向中心線よ
り断面にした図であシ、補給ポート18は遮蔽板19に
より囲まれている。
3 is a cross-sectional view of the crucible 14 shown in FIG. 2 taken along the longitudinal centerline, and the supply port 18 is surrounded by a shielding plate 19.

また第4図は坩堝長手方向にスキャンする電子線16の
スキャン速度を縦軸にとり、横軸に坩堝長手方向位置を
示したものであり、補給ポート18に対応する領域では
スキャン速度をその周囲のスキャン速度よりも遅くする
様にするものである。
Furthermore, in FIG. 4, the vertical axis shows the scanning speed of the electron beam 16 scanning in the crucible longitudinal direction, and the horizontal axis shows the crucible longitudinal position. In the area corresponding to the supply port 18, the scanning speed is plotted against the surrounding This is to make it slower than the scan speed.

このように構成された実施例での作用様態は次の如くで
ある。すなわち、坩堝14長手方向にスキャンされる電
子線16によってCo −Crの溶融合金15が電子線
16の強度に応じた所定の蒸発速度で基板11方向に飛
来し、防着板13を通過して連続走行している高分子フ
ィルム11上に堆積される。この時、高蒸気圧成分のO
rが先に蒸発し、Or組成が減少してくる。そこで、坩
堝14長手方向、すなわち基板巾方向に複数設けられた
補給ポート18よ901粒20が補給される。
The mode of operation of the embodiment configured in this way is as follows. That is, by the electron beam 16 scanned in the longitudinal direction of the crucible 14, the Co-Cr molten alloy 15 flies toward the substrate 11 at a predetermined evaporation rate depending on the intensity of the electron beam 16, passes through the adhesion prevention plate 13, and It is deposited on the continuously running polymer film 11. At this time, the high vapor pressure component O
r evaporates first, and the Or composition decreases. Therefore, 901 grains 20 are supplied through a plurality of supply ports 18 provided in the longitudinal direction of the crucible 14, that is, in the width direction of the substrate.

この時電子線16のスキャン速度は補給ポート18近傍
の速度をその周囲より遅くしており、そのために補給ポ
ート18近傍の溶湯温度がその周囲の溶湯温度よシも上
昇し、それぞれ表面張力差に起因する第2図、第3図の
矢印で示す様な対流現象が生じる。この対流は、坩堝1
4長手方向でのCr濃度の均一化を促進すると共に、補
給ポート18から実際に蒸発する坩堝表面側への溶融C
rの拡散を促す事ができる。
At this time, the scanning speed of the electron beam 16 is slower in the vicinity of the replenishment port 18 than in the surrounding area, and as a result, the temperature of the molten metal in the vicinity of the replenishment port 18 increases as compared to the temperature of the surrounding molten metal, and due to the difference in surface tension, This causes a convection phenomenon as shown by the arrows in FIGS. 2 and 3. This convection is caused by crucible 1
4. Promote uniformity of Cr concentration in the longitudinal direction, and direct molten Cr from the supply port 18 to the crucible surface side where it actually evaporates.
It can promote the diffusion of r.

また、補給ポート18近傍ではその坩堝巾が広げられ、
且つその上部が閉そくされているために、補給ポート1
8は坩堝に供給された昇華性Cr粒の突沸により発生す
る液滴発生を防止する事ができる。
In addition, the width of the crucible is expanded near the supply port 18,
Moreover, because the upper part is closed, supply port 1
No. 8 can prevent the generation of droplets caused by bumping of the sublimable Cr particles supplied to the crucible.

発明の効果 本発明によれば、巾広の基板に蒸気圧の異なる合金薄膜
を製膜する場合、その巾方向の組成分布分肉−にでき、
かつ、高蒸気圧成分の補給にする突沸現象を抑制でき、
ひいては表面性の優れた合金薄膜が、巾広の基板に対し
て得られるものである。
Effects of the Invention According to the present invention, when forming alloy thin films with different vapor pressures on a wide substrate, the composition distribution in the width direction can be made thinner.
In addition, it is possible to suppress the bumping phenomenon that replenishes high vapor pressure components,
As a result, an alloy thin film with excellent surface properties can be obtained on a wide substrate.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例に用いられる真空蒸着装置の
構成図、第2図は第1図の坩堝部分の上面図、第3図は
第2図の中心断面図、第4図は坩堝長手方向での電子線
のスキャン速度分布図、第6図は従来例1による金属薄
膜製造装置の構成図、第6図は従来例2による金属薄膜
製造装置の構成図、第7図は従来例1の長尺基板に対応
する金属薄膜製造装置の構成図、第8図は第7図の方法
で高蒸気圧成分を供給した場合の基板巾方向の高蒸気圧
成分(Cr)の組成分布図である。 11・・・・・・高分子フィルム基板、14・・・・・
・坩堝、16・・・・・・電子線、18・・・・・・高
蒸気圧成分補給ポート、19・・・・・・遮蔽板。 代理人の氏名 弁理士 粟 野 重 孝 ほか1名//
−−高皐7フィルムX版 14−−−すiit雇う 第4図 第 図 第 図 第 図 第 図
Fig. 1 is a block diagram of a vacuum evaporation apparatus used in an embodiment of the present invention, Fig. 2 is a top view of the crucible portion in Fig. 1, Fig. 3 is a central cross-sectional view of Fig. 2, and Fig. 4 is a top view of the crucible portion in Fig. 1. A scanning velocity distribution diagram of the electron beam in the longitudinal direction of the crucible, FIG. 6 is a configuration diagram of the metal thin film manufacturing apparatus according to conventional example 1, FIG. 6 is a configuration diagram of the metal thin film manufacturing apparatus according to conventional example 2, and FIG. 7 is the conventional example. A configuration diagram of a metal thin film manufacturing apparatus corresponding to a long substrate in Example 1. FIG. 8 shows the composition distribution of high vapor pressure components (Cr) in the width direction of the substrate when the high vapor pressure components are supplied by the method shown in FIG. 7. It is a diagram. 11... Polymer film substrate, 14...
- Crucible, 16... Electron beam, 18... High vapor pressure component supply port, 19... Shielding plate. Name of agent: Patent attorney Shigetaka Awano and 1 other person//
--Takago 7 Film

Claims (4)

【特許請求の範囲】[Claims] (1)長尺で巾広の基板に蒸気圧の異なる金属の合金薄
膜を真空蒸着法により連続的に製膜する際に用いられる
坩堝であって、基板巾方向に長手軸を有する開口と、開
口の長手方向に沿って設けられた複数の高蒸気圧成分補
給ポートとを備えた事を特徴とする坩堝。
(1) A crucible used when continuously forming alloy thin films of metals with different vapor pressures on a long and wide substrate by vacuum evaporation, and having an opening having a longitudinal axis in the width direction of the substrate; A crucible comprising a plurality of high vapor pressure component replenishment ports provided along the longitudinal direction of the opening.
(2)補給ポート近傍において開口巾を広げ、その上部
を閉そくした事を特徴とする請求項1記載の坩堝。
(2) The crucible according to claim 1, characterized in that the opening width is widened near the supply port and the upper part thereof is closed.
(3)坩堝長手方向に電子線をスキャンさせながら坩堝
内金属を加熱溶融させ、補給ポート近傍のスキャン速度
を周囲のスキャン速度よりも遅くした事を特徴とした請
求項1記載の坩堝を用いた金属薄膜の製造法。
(3) The crucible according to claim 1, characterized in that the metal in the crucible is heated and melted while scanning the electron beam in the longitudinal direction of the crucible, and the scanning speed near the supply port is made slower than the scanning speed of the surrounding area. Method for manufacturing thin metal films.
(4)高蒸気圧成分としてはCrであり、低蒸気圧成分
としてはCoである事を特徴とする請求項3記載の金属
薄膜の製造法。
(4) The method for producing a metal thin film according to claim 3, wherein the high vapor pressure component is Cr and the low vapor pressure component is Co.
JP63173304A 1988-07-12 1988-07-12 Crucible and production of metallic thin film using said crucible Pending JPH0222462A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63173304A JPH0222462A (en) 1988-07-12 1988-07-12 Crucible and production of metallic thin film using said crucible

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63173304A JPH0222462A (en) 1988-07-12 1988-07-12 Crucible and production of metallic thin film using said crucible

Publications (1)

Publication Number Publication Date
JPH0222462A true JPH0222462A (en) 1990-01-25

Family

ID=15957964

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63173304A Pending JPH0222462A (en) 1988-07-12 1988-07-12 Crucible and production of metallic thin film using said crucible

Country Status (1)

Country Link
JP (1) JPH0222462A (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5454929A (en) * 1977-10-07 1979-05-01 Matsushita Electric Ind Co Ltd Metal wire feeding device in vacuum metallizer
JPS60116769A (en) * 1983-11-30 1985-06-24 Shinko Electric Ind Co Ltd Vapor deposition device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5454929A (en) * 1977-10-07 1979-05-01 Matsushita Electric Ind Co Ltd Metal wire feeding device in vacuum metallizer
JPS60116769A (en) * 1983-11-30 1985-06-24 Shinko Electric Ind Co Ltd Vapor deposition device

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