JPH02227630A - Extensometer mounting structure - Google Patents
Extensometer mounting structureInfo
- Publication number
- JPH02227630A JPH02227630A JP4686989A JP4686989A JPH02227630A JP H02227630 A JPH02227630 A JP H02227630A JP 4686989 A JP4686989 A JP 4686989A JP 4686989 A JP4686989 A JP 4686989A JP H02227630 A JPH02227630 A JP H02227630A
- Authority
- JP
- Japan
- Prior art keywords
- extensometer
- spring
- elongation
- center
- levers
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- A Measuring Device Byusing Mechanical Method (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Abstract
Description
【発明の詳細な説明】
A、産業上の利用分野
本発明は試験片の伸びを検出する伸び計の取付構造に関
する。DETAILED DESCRIPTION OF THE INVENTION A. Field of Industrial Application The present invention relates to a mounting structure for an extensometer for detecting elongation of a test piece.
B、従来の技術
第3図は従来の伸び計の取付構造を示す、伸び計50は
吊持ばね55により固定壁に吊持されている。そして、
一対の石英レバー51をコイルばね52にて試験片TP
に抱き付け、試験片TPの変位に追動する石英レバー5
1の変位をその後端部に設けた差動トランス53にて検
出して試験片TPの伸びを検出する。両レバー51は板
ばね54にて互いに接続され5両者がいつも平行となる
ように付勢されている。B. Prior art FIG. 3 shows a conventional extensometer mounting structure. The extensometer 50 is suspended from a fixed wall by a suspension spring 55. and,
A pair of quartz levers 51 are connected to a test piece TP by a coil spring 52.
A quartz lever 5 that follows the displacement of the test piece TP
1 displacement is detected by a differential transformer 53 provided at the rear end, and elongation of the test piece TP is detected. Both levers 51 are connected to each other by a leaf spring 54 and biased so that both levers 5 are always parallel to each other.
C1発明が解決しようとする課題
第4図は伸び計の取付構造を模式的に示し、(a)が無
負荷時、(b)が負荷時である。負荷により試験片TP
が伸びると一対のレバー51がそれに追動する。このと
き、伸び計50は、はね55で吊持されているので、下
側のレバー51Lが試験片TPの伸びに追動して下がっ
た分だけは下方に変位できず、第4図(b)のように傾
斜する。そのため、微小変位時は問題は少ないが、大き
な変位では標点間の中心と伸び計の中心とがずれてレバ
ー51Lや51Uが標点部から外れることがある。C1 Problems to be Solved by the Invention Figure 4 schematically shows the mounting structure of the extensometer, with (a) showing the state under no load and (b) showing the state under load. Test piece TP depending on the load
When the lever 51 is extended, the pair of levers 51 follow it. At this time, since the extensometer 50 is suspended by the springs 55, it cannot be displaced downward by the amount that the lower lever 51L follows the elongation of the test piece TP, and as shown in FIG. Incline as in b). Therefore, there are few problems during minute displacements, but when there are large displacements, the center between the gauge points and the center of the extensometer may shift, causing the levers 51L and 51U to come off the gauge points.
本発明の技術的課題は、試験片の伸びにほぼ連動して伸
び計の中心位置を変位させることにある。The technical problem of the present invention is to displace the center position of the extensometer in substantially synchronized with the elongation of the test piece.
08課題を解決するための手段
本発明に係る伸び計の取付構造は、上方つかみ具から第
1のばねで伸び計を吊持するとともに、下方つかみ具と
伸び計との間に第1のばねと同一または略等しいはね定
数を有する第2のばねを張設するようにして上述の技術
的課題を解決するものである。08 Means for Solving the Problems The extensometer mounting structure according to the present invention suspends the extensometer from the upper grip with a first spring, and also includes a first spring between the lower grip and the extensometer. The above-mentioned technical problem is solved by tensioning a second spring having a spring constant that is the same or approximately the same as the spring constant.
E0作用
試験片が伸びると第2のばねにより伸び計が連動して変
位する。したがって、標点間の中心の変位と伸び計の中
心の変位とが一致し、伸び量が大きくなってもレバー先
端が試験片の標点部から外れなくなる。When the E0 action test piece stretches, the extensometer is displaced in conjunction with the second spring. Therefore, the displacement of the center between the gauge points matches the displacement of the center of the extensometer, and even if the amount of elongation becomes large, the tip of the lever will not come off from the gauge part of the test piece.
F、実施例
第1図は一実施例の全体構成を示す、第3図と同様の箇
所には・同一の符号を付して相違点を中心に説明する。F. Embodiment FIG. 1 shows the overall configuration of an embodiment. The same parts as in FIG. 3 are given the same reference numerals, and the explanation will focus on the differences.
固定壁11にはロードセル12を介してつかみ具13が
取付けられている。14は、図示しない負荷機構に連結
される下方つかみ具であり、つかみ具13.14間に試
験片TPが把持される。上方つかみ具13および下方つ
かみ具14からそれぞれパー21.22が水平に延設さ
れ、先端部にボルト23.24が螺合されナツト25.
26でそれぞれロックされている。上側のボルト23と
伸び計50との間に吊持ばね27を、下側のボルト24
と伸び計50との間に連結ばね28がそれぞれ配設され
ている。一方、レバー51の先端は。A grip 13 is attached to the fixed wall 11 via a load cell 12. Reference numeral 14 denotes a lower gripping tool connected to a loading mechanism (not shown), and the test piece TP is gripped between the gripping tools 13 and 14. Pars 21.22 extend horizontally from the upper grip 13 and the lower grip 14, respectively, and bolts 23.24 are screwed into the tips of the holes 25.22.
26 and locked respectively. A suspension spring 27 is installed between the upper bolt 23 and the extensometer 50, and a suspension spring 27 is installed between the upper bolt 23 and the extensometer 50.
A connecting spring 28 is disposed between the extensometer 50 and the extensometer 50, respectively. On the other hand, the tip of the lever 51.
抱き込み金具31をばね32で引張ることにより試験片
TPの標点に位置決めされる。By pulling the holding fitting 31 with a spring 32, it is positioned at the gauge point of the test piece TP.
このような伸び計の取付構造による動作を第2図により
説明する。(a)は無負荷時、(b)は負荷時である。The operation of such an extensometer mounting structure will be explained with reference to FIG. (a) is when there is no load, and (b) is when there is a load.
ボルト23.24の位置調整により、伸び計50の中心
SMを標点の中心Ω闘に合わせる。その状態が(a)の
図である。試験片TPを負荷したときに試験片TPの全
長にわたる伸びを(b)のグラフのように均一とすると
、標点の中心QMは全伸び量の50%だけ下方に移動す
る。このとき、レバー22とばね28との連結点S1も
試験片TPの伸びの100%だけ下方に移動し、ばね2
8により伸び計50を下方に付勢する。今。Adjust the position of bolts 23 and 24 to align the center SM of the extensometer 50 with the center Ω of the gauge. This state is shown in figure (a). When the test piece TP is loaded and the elongation over the entire length of the test piece TP is made uniform as shown in the graph (b), the center QM of the gauge point moves downward by 50% of the total elongation. At this time, the connection point S1 between the lever 22 and the spring 28 also moves downward by 100% of the elongation of the test piece TP, and the spring 28
8 urges the extensometer 50 downward. now.
ばね27と28のばね定数は等しいので、ばね28.2
7.伸び計50の系の伸びは(b)のグラフに示すよう
に試験片TPの伸びと同じ挙動を示す、したがって、伸
び計50の中心SMは、試験片TPの伸び量のほぼ50
%だけ下方に移動する。つまり、標点の中心11Mと伸
び計50の中心SNは共に同一距離だけ下方に移動する
。Since the spring constants of springs 27 and 28 are equal, spring 28.2
7. The elongation of the extensometer 50 system exhibits the same behavior as the elongation of the test piece TP, as shown in the graph (b). Therefore, the center SM of the extensometer 50 is approximately 50% of the elongation of the test piece TP.
Move down by %. That is, both the center 11M of the gauge point and the center SN of the extensometer 50 move downward by the same distance.
その結果、上下のレバー51U、51Lは第2図(b)
のように伸び計50の中心線に対して対称にへの字状に
開き、レバー51の先端が標点から外れるおそれもなく
、また精度の高い伸び計測が可能となる。As a result, the upper and lower levers 51U and 51L are as shown in Fig. 2(b).
As shown in FIG. 5, the extensometer 50 opens symmetrically to the center line of the extensometer 50 in a V-shape, so that there is no fear that the tip of the lever 51 will come off the reference point, and highly accurate elongation measurement is possible.
なお、下方つかみ具を負荷機構と接続するようにしたが
、上方つかみ具あるいは上下つかみ具を負荷機構と接続
するものにも本発明を適用できる。Although the lower grip is connected to the load mechanism, the present invention can also be applied to a configuration in which the upper grip or the upper and lower grips are connected to the load mechanism.
また、差動トランス式に代え、磁気式、光学式の伸び計
にも適用できる。さらに、高温用伸び計について説明し
たが、一般の伸び計にも適用できる。It can also be applied to magnetic or optical extensometers instead of differential transformer types. Further, although the explanation has been made regarding a high temperature extensometer, the present invention can also be applied to a general extensometer.
G0発明の効果
本発明は以上のように構成したので、比較的大きな伸び
であってもレバー先端が試験片から外れるおそれがなく
、精度の高い測定が可能となる。G0 Effects of the Invention Since the present invention is configured as described above, there is no fear that the tip of the lever will come off the test piece even if the elongation is relatively large, and highly accurate measurement is possible.
第1図(a)は伸び計の取付構造の一実施例の正面図、
第1図(b)はその部分上面図、第2図はその動作を説
明するもので、(a)が無負荷時、(b)が負荷時を示
す図である。
第3図は従来の伸び計の取付構造を示す正面図。
第4図はその動作を説明するもので、(a)が無負荷時
、(b)が負荷時を示す図である。
13:上方つかみ具
14:下方つかみ具
21、j!:バー 27.18:ばね31:抱き込
み金具
32:ばね
50:伸び計
51 ニ
レバー
53:差動トランスFIG. 1(a) is a front view of an embodiment of the extensometer mounting structure;
FIG. 1(b) is a partial top view of the same, and FIG. 2 is a diagram for explaining its operation, with FIG. 1(a) showing the state under no load and FIG. 2(b) showing the state under load. FIG. 3 is a front view showing the mounting structure of a conventional extensometer. FIG. 4 is a diagram for explaining the operation, in which (a) shows the state when there is no load and (b) shows the state when there is a load. 13: Upper grip 14: Lower grip 21, j! : Bar 27.18: Spring 31: Holding bracket 32: Spring 50: Extensometer 51 Nilever 53: Differential transformer
Claims (1)
変位に追動する一対のレバーと、両レバー間に介装され
て両レバーが平行になるように付勢する板ばねと、両レ
バーの変位を検出する検出部とを具備する伸び計の取付
構造において、上方つかみ具から第1のばねで伸び計を
吊持するとともに、下方つかみ具と伸び計との間に第1
のばねと同一または略等しいばね定数を有する第2のば
ねを張設することを特徴とする伸び計の取付構造。A pair of levers that are arranged parallel to each other and whose tips contact the test specimen and follow the relative displacement thereof, a leaf spring that is interposed between both levers and urges both levers to become parallel, and both levers. In this extensometer mounting structure, the extensometer is suspended from an upper grip by a first spring, and a first spring is provided between the lower grip and the extensometer.
A mounting structure for an extensometer, characterized in that a second spring having the same or substantially the same spring constant as the spring is provided.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4686989A JPH02227630A (en) | 1989-02-28 | 1989-02-28 | Extensometer mounting structure |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4686989A JPH02227630A (en) | 1989-02-28 | 1989-02-28 | Extensometer mounting structure |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH02227630A true JPH02227630A (en) | 1990-09-10 |
Family
ID=12759354
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4686989A Pending JPH02227630A (en) | 1989-02-28 | 1989-02-28 | Extensometer mounting structure |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH02227630A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014500483A (en) * | 2011-09-28 | 2014-01-09 | ▲華▼▲東▼理工大学 | Extensometer for deformation expansion measurement of high temperature structures |
| WO2016156277A1 (en) * | 2015-03-31 | 2016-10-06 | Sck.Cen | Mechanical strain extensometer |
| FR3092909A1 (en) * | 2019-02-14 | 2020-08-21 | Safran Aircraft Engines | INSTALLATION FOR AN EXTENSOMETER FOR MEASURING A DEFORMATION OF A MATERIAL |
-
1989
- 1989-02-28 JP JP4686989A patent/JPH02227630A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014500483A (en) * | 2011-09-28 | 2014-01-09 | ▲華▼▲東▼理工大学 | Extensometer for deformation expansion measurement of high temperature structures |
| WO2016156277A1 (en) * | 2015-03-31 | 2016-10-06 | Sck.Cen | Mechanical strain extensometer |
| FR3092909A1 (en) * | 2019-02-14 | 2020-08-21 | Safran Aircraft Engines | INSTALLATION FOR AN EXTENSOMETER FOR MEASURING A DEFORMATION OF A MATERIAL |
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