JPH0222982Y2 - - Google Patents
Info
- Publication number
- JPH0222982Y2 JPH0222982Y2 JP1983180782U JP18078283U JPH0222982Y2 JP H0222982 Y2 JPH0222982 Y2 JP H0222982Y2 JP 1983180782 U JP1983180782 U JP 1983180782U JP 18078283 U JP18078283 U JP 18078283U JP H0222982 Y2 JPH0222982 Y2 JP H0222982Y2
- Authority
- JP
- Japan
- Prior art keywords
- synthetic resin
- capacitor element
- interior
- glass transition
- temperature
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Description
【考案の詳細な説明】
この考案は、モールド型コンデンサの温度変化
に伴うクラツクの発生防止に関するものである。[Detailed Description of the Invention] This invention relates to the prevention of cracks caused by temperature changes in a molded capacitor.
従来、この種コンデンサは第1図に示すように
構成され、図中1は誘電体と電極などで形成した
コンデンサ素子、2は前記コンデンサ素子1をモ
ールドした合成樹脂であり、ここに用いられる合
成樹脂2のガラス転移温度は、外部周囲温度並び
にコンデンサ素子1の内部発熱温度などを考慮し
て90℃以上程度のものを用いていた。 Conventionally, this type of capacitor has been constructed as shown in Figure 1, in which 1 is a capacitor element formed of a dielectric and electrodes, 2 is a synthetic resin in which the capacitor element 1 is molded, and the synthetic resin used here is The glass transition temperature of the resin 2 was approximately 90° C. or higher, taking into account the external ambient temperature and the internal heat generation temperature of the capacitor element 1.
このような構成では、上記コンデンサ素子1を
形成する誘電体および金属電極などの熱膨張率
と、前記コンデンサ素子1をモールドする合成樹
脂2の熱膨張率が異なるため、この種コンデンサ
使用時の温度変化によつて上述の熱膨張率の差に
伴う膨張応力又は収縮応力がコンデンサ素子1並
びに合成樹脂2に加わり、これが繰り返されると
遂には合成樹脂2にクラツクが発生すると言つた
欠点があつた。 In such a configuration, the coefficient of thermal expansion of the dielectric material, metal electrode, etc. forming the capacitor element 1 is different from that of the synthetic resin 2 for molding the capacitor element 1, so that the temperature when using this type of capacitor is different. Due to the change, expansion stress or contraction stress due to the above-mentioned difference in coefficient of thermal expansion is applied to the capacitor element 1 and the synthetic resin 2, and if this is repeated, cracks will eventually occur in the synthetic resin 2, which is a drawback.
この考案は上述の点に鑑み、コンデンサ素子を
モールドする合成樹脂にガラス転移温度の異なる
二種の内装及び外装合成樹脂を用いて、温度変化
に伴うクラツクの発生を防止したモールド型コン
デンサを提供するものである。 In view of the above-mentioned points, this invention provides a molded capacitor that prevents the occurrence of cracks due to temperature changes by using two types of interior and exterior synthetic resins with different glass transition temperatures as the synthetic resins used to mold the capacitor element. It is something.
以下、第2図にこの考案の一実施例を示し詳述
する。なお、同図において第1図と同符号を附し
た部分は同一又は対応する部分である。図示例で
はコンデンサ素子1は、内装合成樹脂3と、この
内装合成樹脂3の周囲を更にモールドする外装合
成樹脂4でモールド成形されている。上記コンデ
ンサ素子1をモールドする内装合成樹脂3はガラ
ス転移温度が10℃〜30℃程度のものを用い、又外
装合成樹脂4はガラス転移温度が90℃以上のもの
を用いた。 An embodiment of this invention is shown in FIG. 2 and will be described in detail below. In addition, in this figure, parts with the same reference numerals as those in FIG. 1 are the same or corresponding parts. In the illustrated example, the capacitor element 1 is molded with an interior synthetic resin 3 and an exterior synthetic resin 4 that is further molded around the interior synthetic resin 3. The interior synthetic resin 3 used to mold the capacitor element 1 has a glass transition temperature of about 10 DEG C. to 30 DEG C., and the exterior synthetic resin 4 has a glass transition temperature of 90 DEG C. or higher.
この構成において内装合成樹脂3にガラス転移
温度が10℃〜30℃程度のものを用いた理由は、室
温である程度の弾性を示すようにしたものであ
り、又外装合成樹脂4は前述の従来例で説明した
理由によりガラス転移温度が90℃以上のものを用
いたものである。 In this configuration, the interior synthetic resin 3 is made of a material with a glass transition temperature of about 10°C to 30°C because it exhibits a certain degree of elasticity at room temperature, and the exterior synthetic resin 4 is made of a material with a glass transition temperature of about 10°C to 30°C. For the reason explained above, a material with a glass transition temperature of 90°C or higher is used.
このような構成において、前記内装合成樹脂3
はガラス転移温度が10℃〜30℃程度であるので、
例えば、この種コンデンサが内装合成樹脂3のガ
ラス転移温度以上の高温(但し前述の外部周囲温
度並びにコンデンサ素子1の内部発熱温度を考慮
すれば80℃程度までと考えられる)にさらされた
場合、コンデンサ素子1を形成する誘電体および
金属電極と外装合成樹脂4の熱膨張率の差に伴う
膨張応力を内装合成樹脂3の弾性によつて吸収緩
和できる。 In such a configuration, the interior synthetic resin 3
has a glass transition temperature of about 10°C to 30°C, so
For example, if this type of capacitor is exposed to a high temperature higher than the glass transition temperature of the interior synthetic resin 3 (however, considering the external ambient temperature and the internal heat generation temperature of the capacitor element 1, it is thought to be up to about 80°C), Expansion stress due to the difference in thermal expansion coefficient between the dielectric and metal electrodes forming the capacitor element 1 and the exterior synthetic resin 4 can be absorbed and relaxed by the elasticity of the interior synthetic resin 3.
一方、逆に内装合成樹脂3のガラス転移温度以
下の低温にさらされた場合は、内装合成樹脂3自
体が硬化し弾性は失うことになるが、外装合成樹
脂4に比べガラス転移温度が低いので、その温度
差分の収縮応力が緩和され、外装合成樹脂4に加
わる収縮応力を緩和することができる。 On the other hand, if it is exposed to a low temperature below the glass transition temperature of the interior synthetic resin 3, the interior synthetic resin 3 itself will harden and lose its elasticity, but its glass transition temperature is lower than that of the exterior synthetic resin 4. , the shrinkage stress due to the temperature difference is relaxed, and the shrinkage stress applied to the exterior synthetic resin 4 can be relaxed.
なお、この考案に用いられるコンデンサ素子と
しては、例えば、薄葉誘電体と電極箔あるいは誘
電体に蒸着電極を施こしたものを巻回したような
巻回タイプ、又は誘電体にセラミツクなどを用い
た積層タイプ、さらにはこれらを未含浸としたも
の、あるいは一度含浸したものであつてもよく、
要はコンデンサ素子を合成樹脂によつてモールド
成形するものであれば適用できるのは勿論であ
る。 The capacitor element used in this invention is, for example, a wound type in which a thin dielectric material and electrode foil or a dielectric material with a vapor-deposited electrode is wound, or a capacitor element in which a ceramic material is used as the dielectric material. It may be a laminated type, or it may be unimpregnated, or it may be impregnated once.
In short, it is of course applicable to any device in which the capacitor element is molded from synthetic resin.
以上説明したように、この考案によればコンデ
ンサ素子の周囲をガラス転移温度の異なる二種の
合成樹脂を用いて構成したので、この種コンデン
サの温度変化に基づく膨張、収縮の応力を緩和す
ることができ、クラツク発生が防止できると言つ
た効果を奏する。 As explained above, according to this invention, the periphery of the capacitor element is constructed using two types of synthetic resins with different glass transition temperatures, so that the stress caused by expansion and contraction due to temperature changes in this type of capacitor can be alleviated. This has the effect of preventing cracks from occurring.
第1図は従来例を示す正面断面図、第2図は本
考案の一実施例を示す正面断面図である。
1:コンデンサ素子、3:内装合成樹脂、4:
外装合成樹脂。
FIG. 1 is a front sectional view showing a conventional example, and FIG. 2 is a front sectional view showing an embodiment of the present invention. 1: Capacitor element, 3: Interior synthetic resin, 4:
Exterior synthetic resin.
Claims (1)
前記内装合成樹脂の周囲を前記内装合成樹脂より
高いガラス転移温度を有した外装合成樹脂でモー
ルド成形してなるモールド型コンデンサ。 The capacitor element is molded with interior synthetic resin,
A molded capacitor formed by molding the interior synthetic resin around the interior synthetic resin with an exterior synthetic resin having a glass transition temperature higher than that of the interior synthetic resin.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18078283U JPS6088522U (en) | 1983-11-21 | 1983-11-21 | Molded capacitor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18078283U JPS6088522U (en) | 1983-11-21 | 1983-11-21 | Molded capacitor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6088522U JPS6088522U (en) | 1985-06-18 |
| JPH0222982Y2 true JPH0222982Y2 (en) | 1990-06-21 |
Family
ID=30391898
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18078283U Granted JPS6088522U (en) | 1983-11-21 | 1983-11-21 | Molded capacitor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6088522U (en) |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5025944B2 (en) * | 1971-10-04 | 1975-08-27 |
-
1983
- 1983-11-21 JP JP18078283U patent/JPS6088522U/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6088522U (en) | 1985-06-18 |
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