JPH0222995Y2 - - Google Patents

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Publication number
JPH0222995Y2
JPH0222995Y2 JP1984120337U JP12033784U JPH0222995Y2 JP H0222995 Y2 JPH0222995 Y2 JP H0222995Y2 JP 1984120337 U JP1984120337 U JP 1984120337U JP 12033784 U JP12033784 U JP 12033784U JP H0222995 Y2 JPH0222995 Y2 JP H0222995Y2
Authority
JP
Japan
Prior art keywords
heat sink
substrate
resin material
semiconductor pellet
molded
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1984120337U
Other languages
Japanese (ja)
Other versions
JPS6134737U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP12033784U priority Critical patent/JPS6134737U/en
Publication of JPS6134737U publication Critical patent/JPS6134737U/en
Application granted granted Critical
Publication of JPH0222995Y2 publication Critical patent/JPH0222995Y2/ja
Granted legal-status Critical Current

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Description

【考案の詳細な説明】 産業上の利用分野 この考案はトランジスタ等の樹脂モールド型半
導体装置に関する。
[Detailed Description of the Invention] Industrial Application Field This invention relates to resin molded semiconductor devices such as transistors.

従来の技術 樹脂モールド型半導体装置は基板(放熱板)の
主面上に半導体ペレツトを固着し、基板の近傍に
配されたリードと半導体ペレツトの表面電極とを
Al線などのワイヤで電気的に接続して、基板の
ペレツト固着部分周辺を含む要部を樹脂材でモー
ルド被覆した構造が一般的である。この樹脂モー
ルド型半導体装置の耐湿性は外装樹脂材と基板及
びリードの金属面との密着性によつてほぼ決定さ
れ、特に外装樹脂材と基板の密着性に大きく左右
される。
Conventional technology A resin molded semiconductor device has a semiconductor pellet fixed on the main surface of a substrate (heat sink), and a lead placed near the substrate and a surface electrode of the semiconductor pellet.
The general structure is that electrical connections are made using wires such as Al wires, and the main parts of the substrate, including the area around which the pellets are fixed, are molded and covered with a resin material. The moisture resistance of this resin-molded semiconductor device is almost determined by the adhesion between the outer resin material and the metal surfaces of the substrate and leads, and is particularly greatly influenced by the adhesion between the outer resin material and the substrate.

ところで、金属の基板を部分的に樹脂封止する
場合、樹脂と金属の熱膨張係数に差があるためモ
ールド形成された外装樹脂材が体積収縮を起して
基板との密着性が悪くなることや、基板は表面酸
化を防止するため表面がニツケルメツキなどでメ
ツキ処理されているが、この表面のメツキ層に樹
脂が密着し難くて基板と外装樹脂材の密着性が悪
くなることがあり、これが樹脂モールド型半導体
装置の耐湿性向上を難しいものにしていた。
By the way, when partially sealing a metal substrate with resin, the molded exterior resin material shrinks in volume due to the difference in thermal expansion coefficient between the resin and the metal, resulting in poor adhesion to the substrate. In order to prevent surface oxidation, the surface of the board is plated with nickel plating, etc., but it is difficult for the resin to adhere to the plating layer on the surface, resulting in poor adhesion between the board and the exterior resin material. This has made it difficult to improve the moisture resistance of resin-molded semiconductor devices.

そこで、外装樹脂材と基板の界面に侵入する外
部湿気が半導体ペレツトまで到達する時間を少し
でも長くして耐湿的な寿命を長くし実質的な耐湿
性改善を図る工夫として、基板に外部湿気の侵入
路を少しでも長くする溝を形成することがトラン
ジスタなどにおいて実施されている。その具体的
一例を第7図及び第8図のトランジスタに基づき
以下説明する。
Therefore, in order to extend the time for external moisture that enters the interface between the exterior resin material and the substrate to reach the semiconductor pellet, the moisture-resistant life can be extended and the moisture resistance can be substantially improved. Forming a groove to lengthen the entry path as much as possible is practiced in transistors and the like. A specific example thereof will be explained below based on the transistors shown in FIGS. 7 and 8.

第7図及び第8図において、1は半導体ペレツ
ト固着基板である放熱板、2は放熱板1の近傍か
ら延びる3本一組のリードで、中央の1本の先端
は放熱板1にかしめ等で一体化されている。3は
放熱板1の主面上に半田4にて固着されたトラン
ジスタの半導体ペレツト、5は半導体ペレツト3
の表面電極をリード2の両側2本の先端部とを電
気的接続するAl線等のワイヤ、6は放熱板1の
ペレツト固着部分周辺を含む要部に樹脂モールド
成形された外装樹脂材である。7は放熱板1の外
装樹脂材6から突出する部分mに形成した取付穴
である。
In FIGS. 7 and 8, 1 is a heat sink which is a semiconductor pellet fixed substrate, 2 is a set of three leads extending from the vicinity of the heat sink 1, and the tip of the central one is caulked to the heat sink 1. It is integrated with. 3 is a semiconductor pellet of a transistor fixed on the main surface of the heat sink 1 with solder 4; 5 is a semiconductor pellet 3;
A wire such as an Al wire electrically connects the surface electrode with the two tips on both sides of the lead 2, and 6 is an exterior resin material that is resin-molded on the main part of the heat sink 1, including the area around the pellet fixing part. . Reference numeral 7 denotes a mounting hole formed in a portion m of the heat sink 1 that protrudes from the exterior resin material 6.

このトランジスタの特徴は放熱板1のペレツト
固着側主面の被樹脂モールド部分n上の放熱板突
出部分mに近い箇所に放熱板1を横切る一条の溝
8を形成したことである。このように溝8を形成
すると、外装樹脂材6と放熱板突出部分mの界面
から侵入する外部湿気は溝8まで到達してから溝
8の側面、底面、側面へと屈曲した経路を通つて
半導体ペレツト3へと向わねばならず、溝8を横
断する時間だけ半導体ペレツト3に到達する時間
が遅れて、その分耐湿的の寿命が長くなる。また
溝8への外装樹脂材6の食い付きにて外装樹脂材
6の固着強度が増し、これにて外装樹脂材6と放
熱板1の密着性が安定に保たれて耐湿性が良くな
る。
A feature of this transistor is that a groove 8 is formed across the heat sink 1 at a location close to the heat sink protruding portion m on the resin molded portion n of the main surface of the heat sink 1 on the pellet-fixing side. When the groove 8 is formed in this way, external moisture that enters from the interface between the exterior resin material 6 and the heat sink protruding portion m reaches the groove 8 and then passes through a curved path toward the side, bottom, and side surfaces of the groove 8. The semiconductor pellet 3 has to be directed toward the semiconductor pellet 3, and the time it takes to reach the semiconductor pellet 3 is delayed by the time it takes to cross the groove 8, which lengthens the moisture-resistant life. Furthermore, the adhesion strength of the exterior resin material 6 increases as the exterior resin material 6 bites into the groove 8, thereby stably maintaining the adhesion between the exterior resin material 6 and the heat sink 1, and improving moisture resistance.

考案が解決しようとする問題点 上記溝8は外部湿気の侵入を妨げて半導体ペレ
ツト3に到達する時間を遅らせるが、外部湿気の
溝8を横断するに要する時間は溝8が無くてこの
溝8の幅相当分に外部湿気が進出するに要する時
間と大差が無く、そのため溝8の外部湿気の侵入
を妨げる効果はあまり期待できなかつた。また溝
8に外装樹脂材6が食い込むが、この食い込み力
は放熱板1の板厚方向に対して弱くて外装樹脂材
6を放熱板1の主面上に強固に密着させておく効
果に薄く、このような食い付き構造による耐湿性
改善効果はほとんど期待できず、尚更の改善策が
要望されていた。
Problems to be Solved by the Invention The groove 8 prevents external moisture from entering and delays the time for it to reach the semiconductor pellet 3, but the time required for the external moisture to cross the groove 8 is longer than the groove 8. There was no significant difference in the time required for external moisture to penetrate a width corresponding to the width of the groove 8, and therefore, the groove 8 could not be expected to have much of an effect in preventing intrusion of external moisture. Furthermore, the exterior resin material 6 bites into the groove 8, but this biting force is weak in the thickness direction of the heat sink 1 and is not effective in keeping the exterior resin material 6 tightly attached to the main surface of the heat sink 1. However, little improvement in moisture resistance can be expected from such a biting structure, and further improvement measures have been desired.

問題点を解決するための手段 本考案は上記要望に鑑みてなされたもので、半
導体ペレツトを固着する基板主面の被樹脂モール
ド部分に、基板に対して微小間隙を形成する条体
を固定配置することによつて上記従来問題点を解
決したものである。
Means for Solving the Problems The present invention was developed in view of the above-mentioned needs, and consists of a strip that forms a minute gap with the substrate and is fixedly arranged on the resin molded part of the main surface of the substrate to which the semiconductor pellet is fixed. By doing so, the above-mentioned conventional problems are solved.

作 用 この本考案のように基板上に微小間隙で条体を
固定配置すると、固着基板とモールド成形された
外装樹脂材の界面から条体に向けて侵入してくる
外部湿気は条体と固着基板間の微小空間に入り、
この空間には毛細管現象で条体の端まで移行して
から再び外装樹脂材と基板の界面に侵入して一部
が半導体ペレツトへと向うことになり、侵入した
湿気が半導体ペレツトに到達するまでの時間が大
幅に長くなつて実質上の耐湿改善が図れる。また
条体と基板間の空間に樹脂が少し食い込むため
に、外装樹脂材の基板板厚方向での固着強度も十
分に大きくでき、外装樹脂材の密着性が安定して
尚更に耐湿性の良いものが提供できるようにな
る。
Effect When the strip is fixedly arranged on the substrate with a minute gap as in the present invention, external moisture that enters toward the strip from the interface between the fixed substrate and the molded exterior resin material is fixed to the strip. Enters the micro space between the substrates,
In this space, moisture migrates to the end of the strip due to capillary action, then enters the interface between the exterior resin material and the substrate again, and a portion of it heads toward the semiconductor pellet, until the invading moisture reaches the semiconductor pellet. This significantly increases the moisture resistance, resulting in a substantial improvement in moisture resistance. In addition, since the resin slightly bites into the space between the strip and the board, the adhesion strength of the exterior resin material in the board thickness direction can be sufficiently increased, and the adhesion of the exterior resin material is stable and moisture resistance is further improved. things can be provided.

実施例 第7図の樹脂モールド型トランジスタに本考案
を適用した一実施例を第1図乃至第4図を参照し
て以下説明すると、第7図と同一部分には同一参
照符号を付して説明は省略する。相違点は放熱板
9の半導体ペレツト固着側主面の被樹脂モールド
部分n上の定箇所に条体、例えば金属やセラミツ
ク等の耐熱硬質の長尺な帯板10を放熱板9と微
小間隙gでもつて固定配置したことである。
Embodiment An embodiment in which the present invention is applied to the resin-molded transistor shown in FIG. 7 will be described below with reference to FIGS. 1 to 4. The same parts as in FIG. Explanation will be omitted. The difference is that a strip, e.g., a long strip 10 made of heat-resistant hard material such as metal or ceramic, is placed at a fixed point on the resin-molded portion n of the main surface of the heat sink 9 on the side where the semiconductor pellets are fixed, and a small gap g is placed between the heat sink 9 and the heat sink 9. However, it was placed in a fixed position.

帯板10は放熱板9の主面の被樹脂モールド部
分n上の放熱板突出部分mに近い箇所に放熱板9
を横切る長さのものが配置され、これの放熱板9
との間隙gは樹脂モールド時に溶融樹脂が帯板1
0下に少し食い込む程度で樹脂モールド後に帯板
10と放熱板9の間に微小空間11が作成される
大きさ(例えば20μm以下)に設定される。また
放熱板9の帯板10と対向する部分に従来同様な
一条の溝12を形成して外部湿気の流れ方向の規
制をより確実ならしめるが、この溝12は必ずし
も必要で無い。また帯板10の取付けは例えば第
3図に示すように放熱板9上に部分的に段付エン
ボス13を突設し、一方帯板10に部分的に取付
穴14を穿設しておいて、エンボス13を取付穴
14に嵌め取付穴14から突出するエンボス13
の先端部を帯板10上に圧潰して行う。
The strip plate 10 is attached to the heat sink 9 at a location close to the heat sink protruding portion m on the resin molded portion n of the main surface of the heat sink 9.
A heat dissipation plate 9 of this length is arranged to cross the
The gap g between the molten resin and the strip plate 1 during resin molding is
The size is set so that a minute space 11 is created between the strip plate 10 and the heat sink plate 9 after resin molding by biting in slightly below zero (for example, 20 μm or less). Furthermore, a single groove 12 similar to the conventional one is formed in the portion of the heat dissipation plate 9 facing the strip plate 10 to more reliably regulate the flow direction of external moisture, but this groove 12 is not necessarily required. The strip plate 10 can be attached by, for example, partially protruding stepped embossing 13 on the heat dissipation plate 9 and drilling mounting holes 14 partially in the strip plate 10, as shown in FIG. , the emboss 13 is fitted into the mounting hole 14 and the emboss 13 protrudes from the mounting hole 14.
This is done by crushing the tip of the holder onto the band plate 10.

上記実施例において、モールド形成された外装
樹脂材6と放熱板9の主面の界面に放熱板突出部
分mから侵入する外部湿気は第4図の破線矢印の
方向に進出する。即ち、先ず帯板10下に到達し
て帯板10の下に形成された微小空間11に入
る。微小空間11に侵入した湿気は毛細管現象で
帯板10の長手方向に流れて帯板10両端下に達
し、ここから放熱板9の側面と外装樹脂材6の界
面に侵入して一部のものが放熱板9の主面上へと
進出し、やがて半導体ペレツト固着部分へと到達
する。この湿気の半導体ペレツト固着部分に達す
るまでの経路は帯板10下の微小空間11のため
第7図の従来品に比べ大幅に長くなり、従つて外
部湿気が侵入してから半導体ペレツト固着部分に
達するまでの時間が数倍にも長くなり、それだけ
耐湿性が良くなる。
In the above embodiment, external moisture entering the interface between the molded exterior resin material 6 and the main surface of the heat sink 9 from the heat sink protruding portion m advances in the direction of the broken line arrow in FIG. That is, it first reaches below the strip plate 10 and enters the minute space 11 formed under the strip plate 10. Moisture that has entered the microspace 11 flows in the longitudinal direction of the strip 10 due to capillary action, reaches below both ends of the strip 10, and from there enters the interface between the side surface of the heat sink 9 and the exterior resin material 6, and some moisture advances onto the main surface of the heat sink 9 and eventually reaches the portion where the semiconductor pellet is fixed. The path for this moisture to reach the part where the semiconductor pellet is fixed is much longer than that of the conventional product shown in FIG. The time it takes to reach the desired temperature is several times longer, and the moisture resistance is improved accordingly.

また外装樹脂材6は帯板10の下面周縁下に少
し食み出して食い込んだ形で成形されるため、放
熱板9の非半導体ペレツト側裏面を露出させてモ
ールド成形しても外装樹脂材6と放熱板9の固着
強度が強く安定して良好な密度性が維持され、尚
更に耐湿性の良いものが提供できる。
Furthermore, since the exterior resin material 6 is molded in such a way that it slightly protrudes below the periphery of the lower surface of the band plate 10, the exterior resin material 6 can be molded with the back surface of the heat sink 9 exposed on the non-semiconductor pellet side. The fixing strength of the heat dissipating plate 9 is strong and stable, good density is maintained, and even better moisture resistance can be provided.

尚、本考案は上記実施例に限らず、例えば第5
図及び第6図に示すように、放熱板9′の主面の
被樹脂モールド部分n周辺部上に半導体ペレツト
固着部分を三方より囲むコ字状帯板10′を微小
間隙gでもつて固定配置してもよい。このように
コ字状帯板10′を使用すると外部湿気の半導体
ペレツト固着部分に達するまでの侵入経路、時間
が更に長くなる。
It should be noted that the present invention is not limited to the above-mentioned embodiment, but also includes, for example, the fifth embodiment.
As shown in FIG. 6 and FIG. 6, a U-shaped band plate 10' surrounding the semiconductor pellet fixed part from three sides is fixedly arranged on the peripheral part of the resin molded part n of the main surface of the heat dissipation plate 9' with a small gap g. You may. When the U-shaped band plate 10' is used in this way, the path and time taken by external moisture to reach the part where the semiconductor pellet is fixed becomes longer.

また本考案はトランジスタに限らず、SCR、
ICなどの樹脂モールド型半導体装置にも同様に
適用し得る。
In addition, this invention is not limited to transistors, but also SCR,
The present invention can be similarly applied to resin molded semiconductor devices such as ICs.

考案の効果 本考案によれば、基板とモールド成形された外
装樹脂材の密着性が多少悪くても両者界面に侵入
した外部湿気が半導体ペレツトまで到達する時間
が条体の付設で長くなるので、実質的な耐湿性が
向上し、また条体の付設で外装樹脂材の基板への
固着強度が増大し、尚更に安定した耐湿性の良い
ものが提供できる。
Effects of the invention According to the invention, even if the adhesion between the substrate and the molded exterior resin material is somewhat poor, the time it takes for external moisture that has entered the interface between the two to reach the semiconductor pellet is lengthened by the addition of the strips. Moisture resistance is substantially improved, and the adhesion strength of the exterior resin material to the substrate is increased by the addition of the stripes, making it possible to provide a product with even more stable moisture resistance.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例を示す平面図、第2
図及び第3図は第1図のA−A線拡大断面図及び
B−B線拡大断面図、第4図は第1図の半導体装
置の部分拡大斜視図、第5図は本考案の他の実施
例を示す平面図、第6図は第5図のC−C線拡大
断面図である。第7図は従来の樹脂モールド型半
導体装置の平面図、第8図は第7図のD−D線断
面図である。 3……半導体ペレツト、6……外装樹脂材、n
……被樹脂モールド部分、9,9′……基板(放
熱板)、10,10′……条体(帯板)、11……
微小空間、g……微小間隙。
Figure 1 is a plan view showing one embodiment of the present invention;
3 and 3 are an enlarged sectional view taken along the lines AA and BB in FIG. 1, FIG. 4 is a partially enlarged perspective view of the semiconductor device shown in FIG. 1, and FIG. FIG. 6 is an enlarged sectional view taken along the line C--C in FIG. 5. FIG. 7 is a plan view of a conventional resin molded semiconductor device, and FIG. 8 is a sectional view taken along the line DD in FIG. 7. 3... Semiconductor pellet, 6... Exterior resin material, n
... Resin molded part, 9, 9'... Substrate (heat sink), 10, 10'... Strip (band plate), 11...
Microspace, g...microgap.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 基板に半導体ペレツトを固着すると共に、それ
の電極とリードとをワイヤにて接続し、かつ半導
体ペレツトを含む要部を樹脂材にてモールド被覆
したものにおいて、上記基板の半導体ペレツト固
着側主面でかつ樹脂材による被覆部分に、基板に
対して微小間隙を形成する条体を固定配置したこ
とを特徴とする樹脂封止モールド型半導体装置。
A semiconductor pellet is fixed to a substrate, its electrodes and leads are connected with a wire, and the main part including the semiconductor pellet is molded and covered with a resin material, in which the main surface of the substrate on the side to which the semiconductor pellet is fixed is A resin-sealed mold type semiconductor device, characterized in that a striped body forming a minute gap with respect to the substrate is fixedly arranged in the resin-covered portion.
JP12033784U 1984-08-03 1984-08-03 Resin molded semiconductor device Granted JPS6134737U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12033784U JPS6134737U (en) 1984-08-03 1984-08-03 Resin molded semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12033784U JPS6134737U (en) 1984-08-03 1984-08-03 Resin molded semiconductor device

Publications (2)

Publication Number Publication Date
JPS6134737U JPS6134737U (en) 1986-03-03
JPH0222995Y2 true JPH0222995Y2 (en) 1990-06-21

Family

ID=30679161

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12033784U Granted JPS6134737U (en) 1984-08-03 1984-08-03 Resin molded semiconductor device

Country Status (1)

Country Link
JP (1) JPS6134737U (en)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4424916Y1 (en) * 1966-10-28 1969-10-20
JPS5429974A (en) * 1977-08-10 1979-03-06 Hitachi Ltd Semiconductor device of resin sealing type

Also Published As

Publication number Publication date
JPS6134737U (en) 1986-03-03

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