JPH02234191A - Liquid crystal panel inspecting device - Google Patents
Liquid crystal panel inspecting deviceInfo
- Publication number
- JPH02234191A JPH02234191A JP5535789A JP5535789A JPH02234191A JP H02234191 A JPH02234191 A JP H02234191A JP 5535789 A JP5535789 A JP 5535789A JP 5535789 A JP5535789 A JP 5535789A JP H02234191 A JPH02234191 A JP H02234191A
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- image data
- liquid crystal
- defect
- inspection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004973 liquid crystal related substance Substances 0.000 title claims abstract description 17
- 238000007689 inspection Methods 0.000 claims abstract description 21
- 238000005259 measurement Methods 0.000 claims description 9
- 239000003086 colorant Substances 0.000 claims description 3
- 238000002834 transmittance Methods 0.000 claims description 3
- 230000007547 defect Effects 0.000 abstract description 13
- 238000000034 method Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- SHXWCVYOXRDMCX-UHFFFAOYSA-N 3,4-methylenedioxymethamphetamine Chemical compound CNC(C)CC1=CC=C2OCOC2=C1 SHXWCVYOXRDMCX-UHFFFAOYSA-N 0.000 description 1
- 241000110847 Kochia Species 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
Landscapes
- Liquid Crystal Display Device Control (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は液晶パネル(以下rLCDパネル」という)検
査装置に関し、特にLCDパネルを櫛状の点灯を検出す
るLCDバネル検査装置に関する.
〔従来の技術〕
従来のLCDパネルを櫛状に点灯(LCDパネルの両面
のドレイン線を1本おきに駆動信号を与えた状態で以後
半点灯という)させたとき表われる欠陥(以後D−D欠
陥という)の検査は、駆動回路と、バックライトと、L
CDパネル固定治具を含んで楕成される.
次に、図面を参照して、詳細に説明する.第4図は従来
の検査方法を示す説明図である。LCDバネル41を、
LCDバネル固定治具42にセットし、バックライト4
4の上に置き、駆動回路43をマニュアルで半点灯駆動
信号値にセットし、バックライト44の光をLCDバネ
ル41の液晶層に透過させ、LCDパネル41の表示状
態を肉舞で検査していた.
〔発明が解決しようとする課題〕
上述した従来のLCDパネルの検査方法は、肉眼で検査
するため、正確性に欠け、検査する人間により、検査結
果が異なる。また、人手により検査するなめ、検査工数
がかかるという欠点があった。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a liquid crystal panel (hereinafter referred to as rLCD panel) inspection device, and particularly to an LCD panel inspection device for detecting comb-shaped lighting on an LCD panel. [Prior Art] A defect (hereinafter referred to as D-D) that appears when a conventional LCD panel is lit in a comb pattern (hereinafter referred to as half-lighting with a driving signal applied to every other drain line on both sides of the LCD panel). (referred to as defects) are inspected for drive circuits, backlights, and
It is made into an oval shape including a CD panel fixing jig. Next, a detailed explanation will be given with reference to the drawings. FIG. 4 is an explanatory diagram showing a conventional inspection method. LCD panel 41,
Set it on the LCD panel fixing jig 42, and attach the backlight 4.
4, the drive circuit 43 is manually set to a half-lighting drive signal value, the light from the backlight 44 is transmitted through the liquid crystal layer of the LCD panel 41, and the display state of the LCD panel 41 is inspected by performing a physical inspection. Ta. [Problems to be Solved by the Invention] The conventional LCD panel inspection method described above lacks accuracy because it is inspected with the naked eye, and the inspection results vary depending on the person conducting the inspection. In addition, there was a drawback that the inspection was performed manually, which required a lot of inspection man-hours.
本発明のLCDパネル検査装置は、画像を入力するため
のカラーカメラと、入力されたカラー画像情報をデジタ
ル信号に変換する入力回路と、デジタル信号に変換され
たカラー画像情報を赤・緑青の三色に分けて記憶する画
像メモリーと、あらかじめ指定したしきい値で二値化す
る二値化回路と、二値化された画像データに対してあら
かじめ指定したビット数だけ付加または削除するマスク
回路と、前記マスク回路で付加・削除された画像データ
の面積及びX方向(横方向)の座標の最小値.最大値,
y方向《縦方向》の座標の最小値.M大値を計測する計
測回路と、液晶パネルの液晶層に透過する光を照射する
バックライトと、液晶パネルの液晶層に対して光の透過
率の決定及び液晶パネルの上下にあるドレイン線に1本
ごとに駆動信号を与えることのできる駆動回路と、前記
人力回路と前記二値化回路と前記マスク回路と前記計測
回路と前記駆動回路とを制御する制御部と、検査結果を
表示する表示部とを含んで構成される.
〔実施例〕
次に、本発明の実施例について、図面を参照して詳細に
説明する。The LCD panel inspection device of the present invention includes a color camera for inputting an image, an input circuit for converting the input color image information into a digital signal, and an input circuit for converting the color image information converted into a digital signal into three colors of red, green, and blue. An image memory that stores images by color, a binarization circuit that binarizes using a pre-specified threshold, and a mask circuit that adds or deletes a pre-specified number of bits to the binarized image data. , the minimum value of the area and coordinates in the X direction (horizontal direction) of the image data added/deleted by the mask circuit. Maximum value,
Minimum value of the coordinate in the y direction (vertical direction). A measurement circuit that measures the maximum value of M, a backlight that irradiates light that passes through the liquid crystal layer of the liquid crystal panel, a device that determines the transmittance of light to the liquid crystal layer of the liquid crystal panel, and a drain line that is located above and below the liquid crystal panel. A drive circuit that can give a drive signal to each wire, a control section that controls the human power circuit, the binarization circuit, the mask circuit, the measurement circuit, and the drive circuit, and a display that displays test results. It consists of the following parts. [Example] Next, an example of the present invention will be described in detail with reference to the drawings.
第1図は本発明の一実施例を示すブロック図である.
第1図に示すLCDパネル検査装置は、画像を入力する
ためのカラーカメラ1と、入力されたカラー画像情報を
デジタル信号に変換する入力回路2と、デジタル信号に
変換されたカラー画像情報をR−G−Hの三色に分けて
記憶する画像メモリー3と、ある適当なしきい値で二値
化する二値化回路4と、二値化された画像データの画像
に対してあらかじめ定められたビット数だけ付加または
削除するマスク回路5と、拡大・縮小された画像データ
の面積及びX方向(横方向)の座標の最小値・最大値と
y方向(縦方向)の座標の最小値・最大値とを計測する
計測回路6と、LCDバネル12を固定するILcDパ
ネル固定治具11と、LCDパネル12の液晶層に光を
透過させるバックライト9と、LCDパネルの液晶層に
対してバックライト9の光の透過率を決める駆動回路1
0と、入力回路2と、二値化回路4と、計測回路6と、
駆動回路10とを制御する制御部7と、検査結果を表示
する表示部8を含んで構成される.ここで、LCDバネ
ル12では、制御部7でLCDパネル12に対して、半
点灯状態になる信号aが駆動回路10を通して送られ、
半点灯状βになった個所が表示させられる.LCDバネ
ル12の表示状態の画像はカラーカメラ1で撮像され、
その出力信号は入力回路2でR−G−Bのデジタル信号
に変換され、画像メモリー3に画像データとして記憶さ
れる.二値化回路4で、制御部7で決められた値を基に
二値化される.
第2図は、半点灯状態で二値化されたLCDバネルの二
値化画像である.この二値化画像データを制御部7で決
められたビット数で、マスク回路5において、画像に付
加又は削除するとD−D欠陥のある画像データは、第3
図に示す通り、縦方向に画像データがつながった状態に
なる。FIG. 1 is a block diagram showing one embodiment of the present invention. The LCD panel inspection apparatus shown in FIG. 1 includes a color camera 1 for inputting an image, an input circuit 2 for converting the input color image information into a digital signal, and a R - An image memory 3 that stores the three colors of G and H, a binarization circuit 4 that binarizes the binarized image data using a certain appropriate threshold value, and a predetermined memory for the binarized image data. A mask circuit 5 that adds or deletes the number of bits, the area of the enlarged/reduced image data, the minimum and maximum values of the coordinates in the X direction (horizontal direction), and the minimum and maximum values of the coordinates in the y direction (vertical direction) A measurement circuit 6 for measuring the value, an ILcD panel fixing jig 11 for fixing the LCD panel 12, a backlight 9 for transmitting light to the liquid crystal layer of the LCD panel 12, and a backlight for the liquid crystal layer of the LCD panel. Drive circuit 1 that determines the light transmittance of step 9
0, the input circuit 2, the binarization circuit 4, the measurement circuit 6,
It is configured to include a control section 7 that controls the drive circuit 10, and a display section 8 that displays the test results. Here, in the LCD panel 12, the control unit 7 sends a signal a to the LCD panel 12 through the drive circuit 10, which causes the LCD panel 12 to be in a half-lighted state.
The part where the half-lit β is displayed will be displayed. An image of the display state of the LCD panel 12 is captured by a color camera 1,
The output signal is converted into an RGB digital signal by an input circuit 2 and stored in an image memory 3 as image data. In the binarization circuit 4, the data is binarized based on the value determined by the control unit 7. Figure 2 is a binarized image of the LCD panel in a half-lit state. When this binary image data is added to or deleted from the image in the mask circuit 5 using the number of bits determined by the control unit 7, the image data with the D-D defect is removed from the third
As shown in the figure, the image data is connected in the vertical direction.
ここで、計測回路6で、画像データの面積及びX方向の
座標の最小値,最大値,y方向の座標の最小値.最大値
を計測し、面積がある一定以上でかつy方向の長さく最
大値一最小値)が一定以上あるものの画像データを制御
部7で抽出することにより、D−D欠陥の検出ができる
.そして表示部8で制御部7の抽出結果を表示する.以
上でy方向欠陥が見付けられたがX方向の欠陥はXとy
の座標を入替えて同様な方法を実施すればよい.
〔発明の効果〕
本発明のLCDパネル検査装置は、二碩化回路と、二値
化回路で二値化された画像データを拡大・縮小するマス
ク回路と、画像データの面積及びX,Yの座標値を計測
する計測回路を設けることにより、LCDバネルのD−
D欠陥の検査が自動にできるため、人手による検査の不
正確や、検査工数の削減ができるという効果がある。Here, the measurement circuit 6 calculates the area of the image data, the minimum value and maximum value of the coordinate in the X direction, and the minimum value of the coordinate in the y direction. A D-D defect can be detected by measuring the maximum value and extracting image data of a defect having an area of a certain value or more and a length in the y direction (maximum value - minimum value) of a certain value or more by the control unit 7. The extraction results of the control unit 7 are then displayed on the display unit 8. In the above, a defect in the y direction was found, but a defect in the X direction is X and y
You can perform the same method by replacing the coordinates of . [Effects of the Invention] The LCD panel inspection device of the present invention includes a binarization circuit, a mask circuit for enlarging/reducing the image data binarized by the binarization circuit, and a mask circuit for enlarging and reducing the image data area and X, Y. By providing a measurement circuit that measures coordinate values, the LCD panel's D-
Since the inspection for D defects can be done automatically, it has the effect of reducing the inaccuracy of manual inspection and reducing the number of inspection man-hours.
モリー、4・・・二値化回路、5・・・マスク回路、6
・・・計測回路、7・・・制御部、8・・・表示部、9
・・・バックライト、10・・・駆動回路、11・・・
LCDパネル固定治具、12・・・LCDパネル.Molly, 4... Binarization circuit, 5... Mask circuit, 6
...Measuring circuit, 7...Control section, 8...Display section, 9
...Backlight, 10...Drive circuit, 11...
LCD panel fixing jig, 12...LCD panel.
Claims (1)
ラー画像情報をデジタル信号に変換する入力回路と、デ
ジタル信号に変換されたカラー画像情報を赤・緑・青の
三色に分けて記憶する画像メモリーと、あらかじめ指定
したしきい値で二値化する二値化回路と、二値化された
画像データに対してあらかじめ指定したビット数だけ付
加または削除するマスク回路と、前記マスク回路で付加
削除された画像データの面積及びx方向(横方向)の座
標の最小値、最大値、y方向(縦方向)の座標の最小値
、最大値を計測する計測回路と、液晶パネルの液晶層に
透過する光を照射するバックライトと、液晶パネルの液
晶層に対して光の透過率の決定及び液晶パネルの上下に
あるドレイン線に1本ごとに駆動信号を与えることので
きる駆動回路と、前記入力回路と前記二値化回路と前記
マスク回路と前記計測回路と前記駆動回路とを制御する
制御部と、検査結果を表示する表示部とを含んで成るこ
とを特徴とする液晶パネル検査装置。A color camera for inputting images, an input circuit that converts the input color image information into digital signals, and an image that stores the color image information converted to digital signals in three colors: red, green, and blue. A memory, a binarization circuit that binarizes with a pre-specified threshold, a mask circuit that adds or deletes a pre-specified number of bits to the binarized image data, and the mask circuit adds or deletes bits. A measurement circuit that measures the area of the image data, the minimum and maximum values of the x-direction (horizontal direction) coordinates, and the minimum and maximum values of the y-direction (vertical direction) coordinates, and the measurement circuit that measures the area of the image data transmitted through the liquid crystal layer of the liquid crystal panel. a backlight that irradiates light, a drive circuit that can determine the transmittance of light to the liquid crystal layer of the liquid crystal panel and apply a drive signal to each drain line above and below the liquid crystal panel, and the input A liquid crystal panel inspection device comprising: a control section that controls a circuit, the binarization circuit, the mask circuit, the measurement circuit, and the drive circuit; and a display section that displays inspection results.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5535789A JPH02234191A (en) | 1989-03-07 | 1989-03-07 | Liquid crystal panel inspecting device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5535789A JPH02234191A (en) | 1989-03-07 | 1989-03-07 | Liquid crystal panel inspecting device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH02234191A true JPH02234191A (en) | 1990-09-17 |
Family
ID=12996245
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5535789A Pending JPH02234191A (en) | 1989-03-07 | 1989-03-07 | Liquid crystal panel inspecting device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH02234191A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6683974B1 (en) * | 2000-01-12 | 2004-01-27 | Sharp Kabushiki Kaisha | Image defect detection apparatus and image defect detection method |
-
1989
- 1989-03-07 JP JP5535789A patent/JPH02234191A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6683974B1 (en) * | 2000-01-12 | 2004-01-27 | Sharp Kabushiki Kaisha | Image defect detection apparatus and image defect detection method |
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