JPH02236276A - Magnetic target for magnetron sputtering and its manufacturing method - Google Patents
Magnetic target for magnetron sputtering and its manufacturing methodInfo
- Publication number
- JPH02236276A JPH02236276A JP5603489A JP5603489A JPH02236276A JP H02236276 A JPH02236276 A JP H02236276A JP 5603489 A JP5603489 A JP 5603489A JP 5603489 A JP5603489 A JP 5603489A JP H02236276 A JPH02236276 A JP H02236276A
- Authority
- JP
- Japan
- Prior art keywords
- target
- magnetron sputtering
- manufacturing
- magnetic
- magnetic field
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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- Physical Vapour Deposition (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
[産業上の利用分野コ
本発明は、マグネトロン・スパタリング法により磁性体
薄膜を作製するのに用いて好適なターゲットおよびその
製造方法に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a target suitable for use in producing a magnetic thin film by magnetron sputtering and a method for producing the same.
[従来の技術コ
マグネトロン・スパタリング法は、ターゲソトの片面に
配置した磁石によって、ターゲットの他面に漏洩磁界を
発生させ、その漏洩磁界によりつくり出された多くのイ
オンをターゲットに衝突させることによって、ターゲッ
ト近くの基板上に速い成膜速度で薄膜を作製するもので
、近年、その利用が急速に伸びてきている。[Conventional technology The comagnetron sputtering method uses a magnet placed on one side of the target to generate a leakage magnetic field on the other side of the target, and causes many ions created by the leakage magnetic field to collide with the target. This method produces thin films at a high deposition rate on a substrate near a target, and its use has been rapidly increasing in recent years.
その反面、このマグネトロン・スパタリング法を用いて
、TbFeCoなどの光磁気記録媒体薄膜、CoNi,
CoCrなどの磁気記録媒体薄膜などの磁性体薄膜を
作製する際には、上記漏洩磁界が弱いために、スパタ効
率やターゲット利用効率が悪いという問題点を抱えてい
る。On the other hand, using this magnetron sputtering method, magneto-optical recording medium thin films such as TbFeCo, CoNi, etc.
When producing a magnetic thin film such as a magnetic recording medium thin film made of CoCr or the like, there is a problem in that the sputtering efficiency and target utilization efficiency are poor due to the weak leakage magnetic field.
このような問題点を解消するために、従来、上記ターゲ
ットの片面に配置した磁石に希土類磁石のような強力な
磁石が用いられている。In order to solve these problems, a strong magnet such as a rare earth magnet has conventionally been used as the magnet disposed on one side of the target.
[発明が解決しようとする課題]
しかしながら、このような方法によっても充分強い漏洩
磁界は得られない。[Problems to be Solved by the Invention] However, even with such a method, a sufficiently strong leakage magnetic field cannot be obtained.
そこで、本発明は、以上の事情に鑑み、可及的に強い漏
洩磁界を発生させ、スバタ効率やターゲット利用効率が
良好なターゲットおよびその製造方法を提供することを
目的とする。Therefore, in view of the above circumstances, an object of the present invention is to provide a target that generates as strong a leakage magnetic field as possible and has good sputtering efficiency and target utilization efficiency, and a method for manufacturing the same.
[課題を解決するための千段]
本発明は、上記目的を達成するものとして、磁化容易異
方性を有してなるマグネトロン・スパタリング用磁性体
ターゲットである。[A Thousand Steps to Solve the Problems] In order to achieve the above object, the present invention provides a magnetic target for magnetron sputtering having easy magnetization anisotropy.
また、他の本発明は、原料粉末を加圧成形、焼結する方
法において、該加圧成形を磁界をかけながら行なうこと
を特徴とするマグネトロン・スパタリング用磁性体ター
ゲットの製造方法である。Another aspect of the present invention is a method for manufacturing a magnetic target for magnetron sputtering, characterized in that in a method of press-forming and sintering raw material powder, the press-forming is performed while applying a magnetic field.
そして、この製造方法において、磁界をかける方向が加
圧方向であると、使用する装置が簡単になる。In this manufacturing method, if the direction in which the magnetic field is applied is the pressing direction, the device to be used becomes simple.
[作 用]
本発明のマグネトロン・スパタリング用磁性体ターゲッ
トは、磁化容易方向が、ターゲット面に平行であっても
、平行でなくてもよい。そして、ターゲット中の磁化容
易方向を有する、即ち磁化容易異方性を有する所は、タ
ーゲット全体に均一に分布していてもよいが、主として
スバタリングが進行して損耗していくエロージョン部に
分布していてもよい。[Function] In the magnetic target for magnetron sputtering of the present invention, the direction of easy magnetization may or may not be parallel to the target surface. The locations in the target that have an easy magnetization direction, that is, the locations that have easy magnetization anisotropy, may be distributed uniformly throughout the target, but are mainly distributed in the erosion areas where sputtering progresses and wears out. You can leave it there.
ターゲットの成分、組成や形状などは通常用いられてい
るものでよく、特に制限はない。The components, composition, shape, etc. of the target may be those commonly used and are not particularly limited.
このようなターゲットを使用してマグネトロン・スパタ
リング法を行えば充分強い漏洩磁界が得られる。これは
、発生した磁束が、従来のターゲフトを使用したときの
ようにターゲット内部でそのループを閉じることなく、
ターゲソト反対面まで漏洩するためであると推察される
。If the magnetron sputtering method is performed using such a target, a sufficiently strong leakage magnetic field can be obtained. This means that the generated magnetic flux does not close its loop inside the target as it does when using traditional targetfts.
It is presumed that this is because it leaks to the other side of the target.
次に、他の本発明である、上記マグネトロン・スパタリ
ング用磁性体ターゲットの製造方法において、原料粉末
を磁界をかけながら加圧成形する。Next, in the method for manufacturing a magnetic target for magnetron sputtering, which is another aspect of the present invention, the raw material powder is pressure-molded while applying a magnetic field.
この磁界をかける方向が、得られるターゲットの磁化容
易方向となる。磁界は任意の方向にかけることができる
ので、本発明の目的を達成するために必要な磁化容易方
向を容易に定めることができる。The direction in which this magnetic field is applied becomes the easy magnetization direction of the obtained target. Since the magnetic field can be applied in any direction, the direction of easy magnetization necessary to achieve the object of the present invention can be easily determined.
[実施例] 以下、本発明を実施例と比較例により更に説明する。[Example] The present invention will be further explained below with reference to Examples and Comparative Examples.
実施例1〜3
Tb−Fe. Tb−Fe−CoおよびGd − Tb
− Fe合金ターゲットの製造を目的として、それぞ
れ純度が99.9重量%以上の、Tb40t粉末(平均
粒径3μ隅以下)Gd.03粉末(平均粒径3pm以下
) 、Fe粉末(粒度200メッシュ(Tyler 、
以下、同様)以下)、Co粉末(粒度200メソシュ以
下)、金属Ca (粒度4メッシュ以下)および無水C
aCj!,(粒度100メッシュ以下)を第1表に示し
た量配合し、十分に混合した。Examples 1-3 Tb-Fe. Tb-Fe-Co and Gd-Tb
- For the purpose of manufacturing Fe alloy targets, Tb40t powder (average grain size 3 μm corner or less), each having a purity of 99.9% by weight or more, Gd. 03 powder (average particle size 3pm or less), Fe powder (particle size 200 mesh (Tyler,
The same applies hereafter), Co powder (particle size 200 mesh or less), metallic Ca (particle size 4 mesh or less), and anhydrous C
aCj! , (particle size of 100 mesh or less) were blended in the amounts shown in Table 1 and thoroughly mixed.
混合物をステンレススチール製の反応容器に入れ、高純
度Arガスの気流中で1000℃まで約1時間で昇温し
、その温度で5時間保持した後室温まで冷却した。生成
した塊状の混合物を5lの水に投入した。塊状の混合物
が崩壊した後、生じたスラリーから上層のCa (OH
) z懸濁物をデカンテーションによって分離した。こ
の操作を繰り返して得られた合金粉末をpH4.5の希
酢酸と接触させた後、水洗、エタノール洗浄を経て、5
0℃、IXIO−2Torrで真空乾燥した。The mixture was placed in a stainless steel reaction vessel, heated to 1000° C. in about 1 hour in a stream of high-purity Ar gas, maintained at that temperature for 5 hours, and then cooled to room temperature. The resulting lumpy mixture was poured into 5 liters of water. After the lumpy mixture disintegrates, the upper layer of Ca (OH
) The suspension was separated by decantation. The alloy powder obtained by repeating this operation was brought into contact with dilute acetic acid of pH 4.5, and then washed with water and ethanol.
Vacuum drying was performed at 0° C. and IXIO-2 Torr.
次に、この合金粉末(平均粒径60μm)それぞれ60
gを内径100mmの黒鉛製の成形器に装入し、加圧方
向に2 0 0kA/mの磁界をかけながらこれに1
5 0kg/cdの圧力を加えた。Next, each of these alloy powders (average particle size 60 μm)
g was charged into a graphite molding machine with an inner diameter of 100 mm, and was heated to
A pressure of 50 kg/cd was applied.
更に、真空度を5 X 1 0−’Torrとし、圧力
を加えたまま1000℃まで昇温し、昇温後は、圧力を
250kg/一とし、その温度を1時間保持した後、室
温まで冷却した。Furthermore, the degree of vacuum was set to 5 x 10-' Torr, and the temperature was raised to 1000 °C while applying pressure. After the temperature was raised, the pressure was set to 250 kg/1, and after maintaining that temperature for 1 hour, it was cooled to room temperature. did.
得られた焼結体(直径100fi、厚さ4。5fl)の
組成は第2表の通りであった。そして、これらの焼結体
の一部(10fl角)を切り取り、加圧方向とそれに垂
直な方向の初磁化透磁率を試料振動型磁力計により測定
した結果、いずれの焼結体も加圧方向が4.0、それに
垂直な方向が2.5であった。従って、いずれの焼結体
も加圧方向に磁化容易方向を有していることが判った。The composition of the obtained sintered body (diameter 100 fi, thickness 4.5 fl) was as shown in Table 2. Then, we cut out a part (10 fl square) of these sintered bodies and measured the initial magnetization permeability in the pressing direction and the direction perpendicular to it using a sample vibrating magnetometer. was 4.0, and the direction perpendicular to it was 2.5. Therefore, it was found that all the sintered bodies had an easy magnetization direction in the pressing direction.
次に、これらの焼結体を使用して、マグネトロン・スパ
タリング法(Arガス圧: 5 X 1 0 −”To
rr放電電力500W)でソーダガラス基板に薄膜(膜
厚3000人)を作製した。Next, using these sintered bodies, magnetron sputtering method (Ar gas pressure: 5
A thin film (film thickness: 3000 mm) was produced on a soda glass substrate using a discharge power of 500 W).
薄膜作製後、各々の試験における、ターゲット表面の磁
束密度比、スバタリング効率、膜組成の経時変化を測定
した。これらの測定方法は次の通りである.
ターゲット表面の磁束密度比:スバタ時間が5および6
0時間経過した時点で得られたターゲット表面の最大磁
束密度の比を測定する。After producing the thin film, the magnetic flux density ratio on the target surface, sputtering efficiency, and changes in film composition over time were measured in each test. These measurement methods are as follows. Magnetic flux density ratio on target surface: Subata time is 5 and 6
The ratio of the maximum magnetic flux density on the target surface obtained after 0 hours has passed is measured.
スバタリング効率:スパタ時間が5時間経過した時点の
成膜速度を測定する。Sputtering efficiency: Measure the film formation rate after 5 hours of sputtering time has elapsed.
膜組成の経時変化:スバタ時間が5.20.40および
60時間経過した時点で得られた薄膜中の全希土類元素
量のバラツキ(範囲)を求める。Change in film composition over time: The variation (range) of the total amount of rare earth elements in the thin film obtained at the time of 5, 20, 40 and 60 hours of Subata time is determined.
比較例
1 5 0kg/cdの圧力を加えて成形する際、磁界
を全くかけなかった以外は、実施例1と同様に試験した
。初磁化透磁率の測定結果は、いずれの方向も3.0で
あった。Comparative Example 1 A test was conducted in the same manner as in Example 1 except that no magnetic field was applied during molding under a pressure of 50 kg/cd. The measurement results of the initial magnetic permeability were 3.0 in all directions.
以上の実施例および比較例で得られた結果を第2表に示
す.
[発明の効果〕
以上から明らかなように、本発明により、ターゲット表
面の磁束密度の変化や膜組成の経時変化が少なく、かつ
スバタリング効率が高い、マグネトロン・スパタリング
用に好適なターゲットを提供することができる。Table 2 shows the results obtained in the above examples and comparative examples. [Effects of the Invention] As is clear from the above, the present invention provides a target suitable for magnetron sputtering, which has little change in magnetic flux density on the target surface or change in film composition over time, and has high sputtering efficiency. I can do it.
また、本発明の磁性体ターゲットを使用すれば、ターゲ
ットの表面近傍でプラズマの閉じ込め効果が充分となる
ため、装置内に存在する不純物のイオンや電子が効率的
に捕捉され、浮遊しなくなるので、得られる薄膜の膜質
を改善することもできる。Furthermore, if the magnetic target of the present invention is used, the plasma confinement effect will be sufficient near the surface of the target, so impurity ions and electrons present in the device will be efficiently captured and will no longer float. It is also possible to improve the film quality of the obtained thin film.
特許出願人住友金属鉱山株式会社Patent applicant Sumitomo Metal Mining Co., Ltd.
Claims (1)
リング用磁性体ターゲット。 2、原料粉末を加圧成形、焼結する方法において、該加
圧成形を磁界をかけながら行なうことを特徴とするマグ
ネトロン・スパタリング用磁性体ターゲットの製造方法
。 3、磁界をかける方向が加圧方向である請求項2記載の
マグネトロン・スパタリング用磁性体ターゲットの製造
方法。[Claims] 1. A magnetic target for magnetron sputtering having easy magnetization anisotropy. 2. A method for producing a magnetic target for magnetron sputtering, in which raw material powder is press-molded and sintered, the press-forming being performed while applying a magnetic field. 3. The method for manufacturing a magnetic target for magnetron sputtering according to claim 2, wherein the direction in which the magnetic field is applied is the pressing direction.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5603489A JPH02236276A (en) | 1989-03-10 | 1989-03-10 | Magnetic target for magnetron sputtering and its manufacturing method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5603489A JPH02236276A (en) | 1989-03-10 | 1989-03-10 | Magnetic target for magnetron sputtering and its manufacturing method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH02236276A true JPH02236276A (en) | 1990-09-19 |
Family
ID=13015793
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5603489A Pending JPH02236276A (en) | 1989-03-10 | 1989-03-10 | Magnetic target for magnetron sputtering and its manufacturing method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH02236276A (en) |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS583978A (en) * | 1981-06-29 | 1983-01-10 | Fujitsu Ltd | Target material for high-speed sputtering |
| JPS6453507A (en) * | 1987-08-25 | 1989-03-01 | Shinetsu Chemical Co | Manufacture of rare-earth permanent magnet |
| JPH02200775A (en) * | 1989-01-31 | 1990-08-09 | Daido Steel Co Ltd | Sputtering target and its production |
-
1989
- 1989-03-10 JP JP5603489A patent/JPH02236276A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS583978A (en) * | 1981-06-29 | 1983-01-10 | Fujitsu Ltd | Target material for high-speed sputtering |
| JPS6453507A (en) * | 1987-08-25 | 1989-03-01 | Shinetsu Chemical Co | Manufacture of rare-earth permanent magnet |
| JPH02200775A (en) * | 1989-01-31 | 1990-08-09 | Daido Steel Co Ltd | Sputtering target and its production |
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