JPH02242521A - Dielectric porcelain composition - Google Patents
Dielectric porcelain compositionInfo
- Publication number
- JPH02242521A JPH02242521A JP1062414A JP6241489A JPH02242521A JP H02242521 A JPH02242521 A JP H02242521A JP 1062414 A JP1062414 A JP 1062414A JP 6241489 A JP6241489 A JP 6241489A JP H02242521 A JPH02242521 A JP H02242521A
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- dielectric
- composition
- capacitance
- rare earth
- temperature coefficient
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Abstract
Description
【発明の詳細な説明】
産業上の利用分野
本発明は誘電率、絶縁抵抗、絶縁破壊電圧が高く、良好
塵Qを大幅に改善し、静電容量温度係数が小さく、かつ
積層セラミックコンデンザへの利用においては、内部電
極の厚みを薄くしたときの静電容量と良好塵Qの低下を
防ぎ、静電容量と良好塵Qのバラツキを小さくできる誘
電体磁器組成物に関するものである。[Detailed description of the invention] Industrial application field The present invention has high dielectric constant, insulation resistance, and dielectric breakdown voltage, greatly improves good dust Q, and has a small capacitance temperature coefficient, and is applicable to multilayer ceramic capacitors. The present invention relates to a dielectric ceramic composition that can prevent a decrease in capacitance and good dust Q when the thickness of the internal electrode is made thin, and can reduce variations in capacitance and good dust Q.
従来の技術
従来から誘電率、絶縁抵抗が高く、良好塵Qに3ヶ−7
すぐれ、静電容量温度係数が小さい誘電体磁器組成物と
して下記のような系が知られている。BACKGROUND OF THE INVENTION Conventionally, the following systems have been known as dielectric ceramic compositions that have high dielectric constants and insulation resistances, are excellent in dust Q by 3-7, and have small temperature coefficients of capacitance.
Ba0−TiO2−Nd2o3系
BaO−TiO2−8m203系
発明が解決しようとする課題
しかし、これらの組成は、例えば0.09 Ba0O,
56TiO20,35N d O3/2の組成比からな
る誘電体材料を使用し、パラジウムの内部電極厚み4μ
m、誘電体厚み12μm、内部電極の重なり寸法1.2
麗X 0.7 rmn、誘電体層数19の積層構造をも
つ積層セラミックコンデンサを作製すると、静電容量の
平均値ニア42pF、良好度Qの平均値:8700、静
電容量温度係数の平均値:NN35pp/℃、絶縁抵抗
の平均値:6.0X10 Ω、絶縁破壊強度の平均値
:11アkv/m+++であり、絶縁抵抗と絶縁破壊強
度において満足のできる値ではない。Problems to be solved by the Ba0-TiO2-Nd2o3 system BaO-TiO2-8m203 system However, these compositions, for example, 0.09 Ba0O,
A dielectric material with a composition ratio of 56TiO20, 35N d O3/2 is used, and the thickness of the palladium internal electrode is 4μ.
m, dielectric thickness 12 μm, internal electrode overlap dimension 1.2
When a multilayer ceramic capacitor with a laminated structure of 0.7 rmn and 19 dielectric layers is manufactured, the average value of capacitance is near 42 pF, the average value of quality Q is 8700, and the average value of temperature coefficient of capacitance is :NN35pp/°C, average value of insulation resistance: 6.0×10 Ω, average value of dielectric breakdown strength: 11 kv/m+++, which are not satisfactory values for insulation resistance and dielectric breakdown strength.
捷た、積層セラミックコンデンサのコスI−ダウンを行
うため、および素体内部の構造欠陥であるデラミネーシ
ョンの発生を防ぐため、ノくラジウムの内部電極厚みを
474 mから2μmに薄Xすると、上記の組成比の誘
電体材料を使用し、上記の誘電体厚み、内部電極型なり
寸法、誘電体層数の積層構造をもつ積層セラミックコン
デンサの静電容量の平均値が610pFと小さく々ると
ともに静電容量のバラツキが256〜713pFと大き
くなる。さらに、良好度Qの平均値も4000と低くな
るとともに良好度Qのバラツキが600〜8800と大
きくなるという課題があった。In order to reduce the cost of the spun multilayer ceramic capacitor and to prevent the occurrence of delamination, which is a structural defect inside the element body, the thickness of the radium internal electrode was reduced from 474 m to 2 μm. The average capacitance of a multilayer ceramic capacitor using a dielectric material with a composition ratio of The variation in capacitance becomes large, ranging from 256 to 713 pF. Furthermore, there was a problem in that the average value of the quality level Q was as low as 4,000, and the variation in the quality level Q was large, ranging from 600 to 8,800.
課題を解決するだめの手段
これらの課題を解決するために本発明は、一般式x B
a Oy T 102 z (Re (1−c)
M ec ) 0s72と表した時、(ただし、x+y
+z=1.oo。Means for Solving the Problems In order to solve these problems, the present invention provides the general formula x B
a Oy T 102 z (Re (1-c)
M ec ) When expressed as 0s72, (however, x+y
+z=1. oo.
0.01≦C≦0.20、Reは、La 、 Pr 、
Nd。0.01≦C≦0.20, Re is La, Pr,
Nd.
Smから選ばれる少なくとも一種以上の希土類元素。M
eは、La、Pr、Nd、Smを除く希土類元素から選
ばれる少々くとも一種以上の希土類元素)。At least one rare earth element selected from Sm. M
e is at least one rare earth element selected from rare earth elements excluding La, Pr, Nd, and Sm).
x+ Y * zが以下に表す各点a、b、c、d。Each point a, b, c, d where x+Y*z is represented below.
e、fで囲まれるモル比の範囲からなる主成分5/、−
7
100重量部に対し、副成分としてニオブ酸化物をNb
2o5に換算して0.3〜8.0重量部含有したことを
特徴とする誘電体磁器組成物を提案するものである。The main component consists of the molar ratio range surrounded by e, f, 5/, -
7 100 parts by weight, add niobium oxide as a subcomponent to Nb
The present invention proposes a dielectric ceramic composition characterized by containing 0.3 to 8.0 parts by weight in terms of 2o5.
作用
第1図は本発明にかかる組成物の主成分の組成範囲を示
す三元図であp、主成分の組成範囲を限定した理由を第
1図を参照し力から説明する。す々わち、大領域では焼
結が著しく困難である。また、B領域では良好度Qが低
下し実用的でなくなる。さらに、JD領領域は静電容量
温度係数が6、−7
マイナス側に犬きくなシすぎて実用的でなくなる。Effects FIG. 1 is a ternary diagram showing the composition range of the main components of the composition according to the present invention.The reason for limiting the composition range of the main components will be explained from the viewpoint of force with reference to FIG. In short, sintering is extremely difficult in large areas. Furthermore, in region B, the quality Q decreases, making it impractical. Furthermore, the temperature coefficient of capacitance in the JD region is too steep on the negative side (6, -7), making it impractical.
そして、E領域では静電容量温度係数がプラス方向に移
行するが、誘電率が小さく実用的で々くなる。また、R
eをLa、Pr、Nd、Smから選ぶことにより、La
、Pr 、Nd 、Smの順で誘電率を大きく下げる
ことなく、静電容量温度係数をプラス方向に移行するこ
とが可能であり、La。In region E, the temperature coefficient of capacitance shifts to the positive direction, but the dielectric constant is small and it becomes difficult to use for practical use. Also, R
By selecting e from La, Pr, Nd, and Sm, La
, Pr , Nd , and Sm in that order, it is possible to shift the capacitance temperature coefficient in the positive direction without significantly lowering the dielectric constant, and La.
Pr 、Nd 、Smの1種あるいは組合せにより静電
容量温度係数の調節が可能である。The temperature coefficient of capacitance can be adjusted by using one type or a combination of Pr, Nd, and Sm.
また、後述する第1表と第2表から明らかなように、L
a、Pr、Nd、Smから選ばれる少なくとも一種以上
の希土類元素の一部を、La。Furthermore, as is clear from Tables 1 and 2, which will be described later, L
a, Pr, Nd, and Sm.
Pr、N+i、Smを除く希土類元素から選ばれる少な
くとも一種以上の希土類元素で置換することにより、良
好度Qを大幅に改善する効果を有し、その置換量が0.
01未満では置換効果はなく、0.20を越えると誘電
率が低下し実用的でなくなる。Substitution with at least one rare earth element selected from rare earth elements other than Pr, N+i, and Sm has the effect of significantly improving the quality Q, and the amount of substitution is 0.
If it is less than 0.01, there will be no substitution effect, and if it exceeds 0.20, the dielectric constant will decrease and become impractical.
第2図は本発明にかかる組成物の主成分に対し、副成分
Nb2O5の含有効果を積層セラミソクコンγへ−7
デンザの特性で示すグラフであり、Nb2O5の含有範
囲を限定した理由をグラフを参照しながら説明する。第
2図に示すようにNb2O5を含有することにより、絶
縁抵抗、絶縁破壊強度が向上し、また静電容量と良好塵
Qを高め、静電容量と良好塵Qのバラツキを小さくする
効果を有する。そして、Nb2O5の含有により、絶縁
抵抗、絶縁破壊強度は向上するが、Nb2O5の含有量
が主成分100重量部に対し、0.3重量部未満はそれ
ほど絶縁破壊強度が大きくなく、静電容量と良好塵Qが
低く、才だ静電容量と良好塵Qのバラツキが太きいため
、この発明の範囲から除外した。一方、Nb2O5の含
有量が主成分に対し、8.0重量部を越えると良好塵Q
、絶縁抵抗が低下し、静電容量温度係数がマイナス側に
大きくなシ、さらに静電容量の温度変化の直線性が失わ
れ実用的でなくなる。Figure 2 is a graph showing the effect of the inclusion of the subcomponent Nb2O5 on the main component of the composition according to the present invention in terms of the properties of laminated ceramic material γ-7.See the graph for the reason for limiting the content range of Nb2O5. I will explain while doing so. As shown in Figure 2, the inclusion of Nb2O5 improves insulation resistance and dielectric breakdown strength, increases capacitance and good dust Q, and has the effect of reducing variations in capacitance and good dust Q. . Insulation resistance and dielectric breakdown strength are improved by the inclusion of Nb2O5, but if the content of Nb2O5 is less than 0.3 parts by weight per 100 parts by weight of the main component, the dielectric breakdown strength is not so high, and the capacitance and Since the good dust Q was low and the variation between the capacitance and the good dust Q was wide, it was excluded from the scope of this invention. On the other hand, if the content of Nb2O5 exceeds 8.0 parts by weight based on the main component, the good dust Q
, the insulation resistance decreases, the temperature coefficient of capacitance becomes large on the negative side, and the linearity of temperature change in capacitance is lost, making it impractical.
実施例 以下に、本発明を具体的実施例によシ説明する。Example The present invention will be explained below using specific examples.
(実施例1)
出発原料には化学的に高純度のBaCO3,TiO2゜
La2O3、Pr6O11,Ha203 、Sm2O3
、CaO2゜Gd2O3,Dy、、03およびNb2O
5粉末を下記の第1表に示す組成比になるように秤量し
、めのうボールを備えたゴム内張シのボールミルに純水
とともに入れ、湿式混合後、脱水乾燥した。この乾燥粉
末を高アルミナ質のルツボに入れ、空気中で1100℃
にて2時間仮焼した。この仮焼粉末を、めのうボールを
備えたゴム内張りのボールミルに純水とともに入れ、湿
式粉砕後、脱水乾燥した。(Example 1) Starting materials include chemically high-purity BaCO3, TiO2゜La2O3, Pr6O11, Ha203, Sm2O3
, CaO2゜Gd2O3, Dy, , 03 and Nb2O
5 powder was weighed so as to have the composition ratio shown in Table 1 below, put into a rubber-lined ball mill equipped with agate balls together with pure water, wet-mixed, and then dehydrated and dried. This dry powder was placed in a high alumina crucible and heated to 1100℃ in air.
It was calcined for 2 hours. This calcined powder was put into a rubber-lined ball mill equipped with agate balls together with pure water, wet-pulverized, and then dehydrated and dried.
この粉砕粉末に、有機バインダーを加え、均質とした後
、32メツシユのふるいを通して整粒し、金型と油圧プ
レスを用いて成形圧力1 ton /c4で直径15m
m、厚み0.4mnに成形した。次いで成形円板をジル
コニア粉末を敷いたアルミナ質のサヤに入れ、空気中に
て下記の第1表に示す組成比の誘電体磁器を得た。After adding an organic binder to this pulverized powder and making it homogeneous, the powder was sized through a 32-mesh sieve, and then molded using a mold and hydraulic press at a molding pressure of 1 ton/c4 to a diameter of 15 m.
m, thickness 0.4 mm. Next, the molded disk was placed in an alumina pod covered with zirconia powder, and dielectric porcelain having the composition ratio shown in Table 1 below was obtained in air.
このようにして得られた誘電体磁器円板は、厚みと直径
を測定し、誘電率、良好塵Q、静電容量温度係数測定用
試料は、誘電体磁器円板の両面全体に銀電極を焼き付け
、絶縁抵抗、絶縁破壊強度9ベー。The thickness and diameter of the dielectric ceramic disc thus obtained were measured, and the samples for measuring the dielectric constant, good dust Q, and capacitance temperature coefficient were prepared using silver electrodes on both sides of the dielectric ceramic disc. Baking, insulation resistance, and dielectric breakdown strength of 9 bases.
測定用試料は、誘電体磁器円板の外周よシ内側に1mm
の幅で銀電極の無い部分を設け、銀電極を焼き付けた。The measurement sample was placed 1 mm inside the outer periphery of the dielectric ceramic disk.
A part without a silver electrode was provided with a width of , and a silver electrode was baked onto it.
そして、誘電率、良好塵Q、静電容量温度係数は、YH
P社製デジタルLCRメータのモデル4275Aを使用
し、測定温度20℃、測定電圧1.○Vrms 、測定
周波数1MHzでの測定より求めた。なお、静電容量の
温度変化は、−55℃、−25℃、20℃、85℃、1
25℃の静電容量を測定し、直線性を確認するとともに
、静電容量温度係数は、20°Cと85°Cの静電容量
を用いて、次式により求めた。Then, the dielectric constant, good dust Q, and capacitance temperature coefficient are YH
Using a digital LCR meter model 4275A manufactured by Company P, the measurement temperature was 20°C and the measurement voltage was 1. ○Vrms was determined by measurement at a measurement frequency of 1 MHz. The temperature change in capacitance is -55℃, -25℃, 20℃, 85℃, 1
The capacitance at 25°C was measured to confirm linearity, and the temperature coefficient of capacitance was determined by the following equation using capacitances at 20°C and 85°C.
T O= (C−Go) /Go x 1 /65 X
106TC:静電容量温度係数(ppm/T;)Go
:20°Cでの静電容量(pF)
C:85℃での静電容量(pF)
捷だ、誘電率は次式よシ求めた。T O = (C-Go) /Go x 1 /65
106TC: Capacitance temperature coefficient (ppm/T;) Go
: Capacitance at 20°C (pF) C: Capacitance at 85°C (pF) The dielectric constant was calculated using the following formula.
K −= 143.8 X Go X t/D2K :
誘電率
CO:2Q0Cでの静電容量(pF)
D =誘電体磁器の直径(rLrIn )1oへ一/
l :誘電体磁器の厚み(mm )
さらに、絶縁抵抗は、YHP社製HRメータのモデル4
329Aを使用し、測定電圧50v、Il、c測定時間
1分間による測定より求めた。K −= 143.8 X Go X t/D2K:
Dielectric constant CO: Capacitance (pF) at 2Q0C D = Diameter of dielectric porcelain (rLrIn) to 1/l: Thickness of dielectric porcelain (mm) Furthermore, the insulation resistance is determined by the model of HR meter manufactured by YHP. 4
329A, the measurement voltage was 50V, and the measurement time was 1 minute.
そして、絶縁破壊強度は、菊水電子工業(株)堰高電圧
電源PH335に一3形を使用し、試料をシリコンオイ
ル中に入れ、昇圧速度50V/secによシ求めた絶縁
破壊電圧を誘電体厚みで除算し、1配当たシの絶縁破壊
強度とした。The dielectric breakdown strength was determined by using a PH335 type 13 high voltage power supply made by Kikusui Electronics Co., Ltd., placing the sample in silicone oil, and calculating the dielectric breakdown voltage at a boost rate of 50 V/sec. Divided by the thickness to obtain the dielectric breakdown strength of 1 division.
試験条件を第1表に併せて示し、試験結果を下記の第2
表に示す。The test conditions are also shown in Table 1, and the test results are shown in Table 2 below.
Shown in the table.
(以下余白)
11ノ\−7
13・\−7
(実施例2)
出発原料には化学的に高純度のBaCO3,Tie2N
d203.CeO2およびNb2O5粉末を使用し、主
成分0.09 BaO−0,56T102−0.35C
(Nd03/2 )0.95 (”02)o、o51に
対し・Nb2O5を0 、0.1 、0.3 、 O,
E5 、1.0 、5.0’、 8.0 。(Left below) 11\-7 13\-7 (Example 2) Chemically high-purity BaCO3, Tie2N are used as starting materials.
d203. Using CeO2 and Nb2O5 powder, main component 0.09 BaO-0,56T102-0.35C
(Nd03/2) 0.95 ("02) o, for o51 ・Nb2O5 0, 0.1, 0.3, O,
E5, 1.0, 5.0', 8.0.
1o、owtq6含有した仮焼粉砕粉を実施例1と同様
の方法で作製する。ただし、Nb2O、含有量0゜0.
1,10.c)wt%は、この発明の範囲外であり、0
.3 、0.5 、1.0 、5.0 、8.Owt%
は、コノ発明の範囲内である。A calcined pulverized powder containing 1o, owtq6 is prepared in the same manner as in Example 1. However, Nb2O content is 0°0.
1,10. c) wt% is outside the scope of this invention and 0
.. 3, 0.5, 1.0, 5.0, 8. Owt%
is within the scope of this invention.
この仮焼粉砕粉末に、有機バインダー、可塑剤−分散剤
、有機溶剤を加え、アルミナボールを備えたポリエチレ
ン製ポットで混合し、スラリーを作製した。混合後、3
00メツシユのナイロン布を使用し、ろ過した。ろ過後
のスラリーは、ドクターブレードによシ、焼結後の誘電
体厚みが12μmとなるように、離型処理をしたポリエ
ステルフィルム上にシートを成形した。An organic binder, a plasticizer/dispersant, and an organic solvent were added to this calcined and pulverized powder, and mixed in a polyethylene pot equipped with alumina balls to prepare a slurry. After mixing, 3
It was filtered using a 00 mesh nylon cloth. The filtered slurry was passed through a doctor blade, and a sheet was formed on a polyester film that had been subjected to mold release treatment so that the dielectric thickness after sintering was 12 μm.
次に、ポリエステルフィルムから剥したシート14/、
1o枚を支持台の上に積層した。この上に、昭栄化学(
株)表内部電極パラジウムペース)ML3724を焼結
後の内部電極厚みが2μmとなるようにスクリーン印刷
し、乾燥した。この上にポリエステルフィルムから剥し
たシー1−1枚を積層した。この上に、焼結後の内部電
極型なり寸法が1.2 am X O,7閣となるよう
に印刷位置をずらして内部電極パラジウムペーストを印
刷し、乾燥後、ポリエステルフィルムから剥したシート
1枚を積層した。これらの操作を、誘電体層数が19と
なるまで繰シ返した。この上に、ポリエステルフィルム
から剥したシー1−10枚を積層した。この積層体を焼
結後、内部電極型なり寸法が1.2mmX0.7m、誘
電体厚みが12μm、誘電体層数が19の積層構造をも
つ積層セラミソクコンデンザとなるように切断した。こ
の切断した試料は、ジルコニア粉末を敷いたアルミナ質
のサヤニ入れ、空気中にて室温から350’ctでを5
°C/hrで昇温し、350℃より100℃/ h r
で昇温し、1270℃で2時間焼成後、100℃/hr
で室15 ヶ−7
温まで降温した。次いで、焼成後の試料は、耐水サント
/< −バー ヲ内側に貼ったポリエチレンボットに純
水とともに入れ、ポリエチレンボットを回転させ焼成後
の試料面を研磨し、外部電極と接合する内部電極部分を
充分露出させた。この試料はポリエチレンボットよシ取
り出し乾燥後、内部電極露出部分に銀の外部電極を焼き
付け、内部電極と導通させ、積層セラミックコンデンサ
を作製した。Next, 10 sheets of 14 sheets peeled from the polyester film were laminated on a support stand. On top of this, Shoei Chemical (
ML3724 (Table Internal Electrode Palladium Pace Co., Ltd.) was screen printed so that the internal electrode thickness after sintering was 2 μm, and dried. On top of this, a sheet 1-1 peeled from a polyester film was laminated. On top of this, internal electrode palladium paste was printed with the printing position shifted so that the internal electrode shape dimensions after sintering were 1.2 am x O, 7 mm, and after drying, sheet 1 was peeled off from the polyester film. The sheets were stacked. These operations were repeated until the number of dielectric layers reached 19. On top of this, 1 to 10 sheets of sheets peeled from the polyester film were laminated. After sintering this laminate, it was cut into a laminate ceramic capacitor having a laminate structure with internal electrode dimensions of 1.2 mm x 0.7 m, dielectric thickness of 12 μm, and 19 dielectric layers. This cut sample was placed in an alumina case covered with zirconia powder and heated at 350'ct from room temperature in air for 55 minutes.
Increase temperature at °C/hr, from 350 °C to 100 °C/hr
After heating at 1270℃ for 2 hours, 100℃/hr
The temperature in the room was lowered to 15 months. Next, the fired sample is placed in a polyethylene bot attached to the inside of a water-resistant sundry bar with pure water, and the polyethylene bot is rotated to polish the surface of the fired sample to remove the internal electrode portion that will be connected to the external electrode. It was fully exposed. This sample was taken out of the polyethylene bottle and dried, and a silver external electrode was baked onto the exposed part of the internal electrode to make it conductive with the internal electrode, producing a multilayer ceramic capacitor.
これらの試料の静電容量、良好度Q、静電容量温度係数
、絶縁抵抗、絶縁破壊強度は、実施例1と同様の条件で
の測定により求めた。また、積層構造の確認は、積層セ
ラミックコンデンサの長さ方向および幅方向の約≠の研
磨断面を、内部電極重なり寸法は倍率100、誘電体厚
みと内部電極厚みは倍率400での光学顕微鏡観察より
求めた。The capacitance, quality Q, temperature coefficient of capacitance, insulation resistance, and dielectric breakdown strength of these samples were determined by measurements under the same conditions as in Example 1. In addition, the laminated structure can be confirmed by optical microscopic observation of a polished cross section of the multilayer ceramic capacitor in the length and width directions at a magnification of 100 for internal electrode overlap dimensions, and at a magnification of 400 for the dielectric thickness and internal electrode thickness. I asked for it.
この測定結果を第2図に示す。The measurement results are shown in FIG.
なお、実施例における誘電体磁器の作製方法では、Ba
CO3,TiO2,La2O5,Pr6Cm +Nd2
06. S+n205. CeO2,Gd2O3,D
y、、O。In addition, in the method for manufacturing dielectric ceramic in the example, Ba
CO3, TiO2, La2O5, Pr6Cm +Nd2
06. S+n205. CeO2, Gd2O3, D
y,,O.
およびNb2O5を使用したが、この方法に限定される
ものではなく、所望の組成比になるように、BaT10
3などの化合物、あるいは炭酸塩、水酸化物など空気中
での加熱により、BaO、TiO□・La2O3,Pr
6O11,Nd2O5,Sm、、05. CeO2゜G
c1206. ”7205およびNb2O5となる化合
物を使用しても実施例と同程度の特性を得ることができ
る。Although BaT10 and Nb2O5 were used, it is not limited to this method, and BaT10
By heating in air, compounds such as 3, carbonates, hydroxides, etc., BaO, TiO□・La2O3, Pr
6O11,Nd2O5,Sm,,05. CeO2゜G
c1206. 7205 and Nb2O5, properties comparable to those of the examples can be obtained.
また、主成分をあらかじめ仮焼し、副成分を添加しても
実施例と同程度の特性を得ることができる。Further, even if the main component is calcined in advance and the subcomponents are added, properties comparable to those of the examples can be obtained.
また、誘電体磁器用として一般に使用される工業用原料
の二酸化チタン、例えばチタン工業(株)製二酸化チタ
ンK A −10、古河鉱業(株)製二酸化チタンFA
−65Wには最大0.45重量係のNb2o5が含まれ
るが、これらの二酸化チタンを使用して主成分の誘電体
磁器を作製しても、主成分100重量部に対してNb2
O5の含有量は最大0.23重量部であシ、この発明の
範囲外であるが、工業用原料の二酸化チタン中のNb2
O,量を考慮し、不17ページ
足労のNb2O,を含有させることにょp、実施例と同
程度の特性を得ることができる。In addition, titanium dioxide, an industrial raw material commonly used for dielectric ceramics, such as titanium dioxide K A-10 manufactured by Titan Industries Co., Ltd. and titanium dioxide FA manufactured by Furukawa Mining Co., Ltd.
-65W contains up to 0.45 parts by weight of Nb2o5, but even if these titanium dioxides are used to make dielectric porcelain as the main component, Nb2o5 is contained per 100 parts by weight of the main component.
The content of O5 is at most 0.23 parts by weight, which is outside the scope of this invention, but the content of Nb2 in titanium dioxide, an industrial raw material, is
By considering the amount of O and incorporating Nb2O, which is less than 17 pages, it is possible to obtain properties comparable to those of the examples.
また、実施例ではLa、Pr、Nd、Smを除く希土類
元素Meとして、Ce、Dy、Gdについて説明したが
、その他の希土類元素を使用しても実施例と同程度の特
性を得ることができる。In addition, in the examples, Ce, Dy, and Gd were explained as rare earth elements Me other than La, Pr, Nd, and Sm, but characteristics comparable to those in the examples can be obtained even if other rare earth elements are used. .
捷だ、上述の基本組成のほかに、Sin、、 、 Mn
O2゜Fe2o3.ZnOなど、一般にフラツクスと考
えられている塩類、酸化物などを、特性を損なわない範
囲で加えることもできる。In addition to the basic composition mentioned above, Sin, , Mn
O2°Fe2o3. Salts, oxides, etc., which are generally considered to be fluxes, such as ZnO, can also be added to the extent that they do not impair the properties.
発明の効果
以上のように本発明によれば、誘電率、絶縁抵抗、絶縁
破壊電圧が高く、良好度Qを大幅に改善し、静電容量温
度係数が小さく、かつ積層セラミックコンデンサへの利
用においては、内部電極の厚みを薄くしたときの静電容
量と良好度Qの低下を防き、静電容量と良好度Qのバラ
ツキを小さくできるため、内部電極の厚みを薄くして、
積層セラミックコンデンサのコストダウンが行えるとと
もに内部構造欠陥であるデラミネーションの発生18ノ
\−7
を防ぐことができる。寸だ、絶縁破壊電圧が高いため、
誘電体層の厚みを薄くし、製品の小型化、大容量化が可
能である。Effects of the Invention As described above, according to the present invention, the dielectric constant, insulation resistance, and dielectric breakdown voltage are high, the quality Q is greatly improved, the temperature coefficient of capacitance is small, and it is suitable for use in multilayer ceramic capacitors. By reducing the thickness of the internal electrode, it is possible to prevent the capacitance and quality Q from decreasing when the thickness of the internal electrode is made thinner, and to reduce variations in the capacitance and quality Q.
The cost of multilayer ceramic capacitors can be reduced, and the occurrence of delamination, which is an internal structural defect, can be prevented. Because the dielectric breakdown voltage is high,
By reducing the thickness of the dielectric layer, it is possible to miniaturize products and increase capacity.
第1図は本発明にかかる組成物の主成分の組成範囲を説
明する三元図、第2図は本発明にかかる主成分0.09
BaO−0,56TiO2−0,35〔(NdOs/
2)o95 (Ce02)0.05 〕に対する副成分
Nb2O5の含有効果を、誘電体厚み:12μm、内部
電極重なり寸法:1.2m+nX0.7咽、誘電体層数
=19の積層構造をもつ積層セラミックコンデンサの電
気特性で示すグラフである。
代理人の氏名 弁理士 粟 野 重 孝 ほか1名(7
Σノ
■璋栢W
(櫂ψ/ハ巧)
喫廟白町堅覧FIG. 1 is a ternary diagram explaining the composition range of the main components of the composition according to the present invention, and FIG. 2 is a ternary diagram illustrating the composition range of the main components according to the present invention.
BaO-0,56TiO2-0,35 [(NdOs/
2) The effect of the addition of the subcomponent Nb2O5 on o95 (Ce02)0.05] was evaluated using a multilayer ceramic having a laminated structure with dielectric thickness: 12 μm, internal electrode overlap dimension: 1.2 m + nX0.7 mm, and number of dielectric layers = 19. It is a graph showing the electrical characteristics of a capacitor. Name of agent: Patent attorney Shigetaka Awano and 1 other person (7
Σノ■Shang Pak W (悂ψ/Ha Takumi) Kibyo Shiromachi Kenran
Claims (1)
)Me_C)O_3_/_2と表した時、(ただし、x
+y+z=1.00,0.01≦C≦0.20,Reは
、La,Pr,Nd,Smから選ばれる少なくとも一種
以上の希土類元素。Meは、La,Pr,Nd,Smを
除く希土類元素から選ばれる少なくとも一種以上の希土
類元素)。 x,y,zが以下に表す各点a,b,c,d,e,fで
囲まれるモル比の範囲からなる主成分100重量部に対
し、副成分としてニオブ酸化物をNb_2O_5に換算
して0.3〜8.0重量部含有したことを特徴とする誘
電体磁器組成物。 ▲数式、化学式、表等があります▼[Claims] General formula xBaO-yTiO_2-z(Re_(_1_-_C_
)Me_C)O_3_/_2, (where x
+y+z=1.00, 0.01≦C≦0.20, Re is at least one rare earth element selected from La, Pr, Nd, and Sm. Me is at least one rare earth element selected from rare earth elements excluding La, Pr, Nd, and Sm). For 100 parts by weight of the main component consisting of the range of molar ratios where x, y, z are surrounded by each point a, b, c, d, e, f shown below, niobium oxide is converted to Nb_2O_5 as a subcomponent. A dielectric ceramic composition characterized in that it contains 0.3 to 8.0 parts by weight. ▲Contains mathematical formulas, chemical formulas, tables, etc.▼
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1062414A JP2928260B2 (en) | 1989-03-15 | 1989-03-15 | Multilayer ceramic capacitors |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1062414A JP2928260B2 (en) | 1989-03-15 | 1989-03-15 | Multilayer ceramic capacitors |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH02242521A true JPH02242521A (en) | 1990-09-26 |
| JP2928260B2 JP2928260B2 (en) | 1999-08-03 |
Family
ID=13199469
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1062414A Expired - Fee Related JP2928260B2 (en) | 1989-03-15 | 1989-03-15 | Multilayer ceramic capacitors |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2928260B2 (en) |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59154703A (en) * | 1983-02-20 | 1984-09-03 | 株式会社村田製作所 | High dielectric constant porcelain composition |
| JPS61173408A (en) * | 1985-01-28 | 1986-08-05 | 沖電気工業株式会社 | Dielectric ceramics composition for microwave |
| JPS61291457A (en) * | 1985-06-14 | 1986-12-22 | タム・セラミックス・インコーポレイテッド | Dielectric composition |
-
1989
- 1989-03-15 JP JP1062414A patent/JP2928260B2/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59154703A (en) * | 1983-02-20 | 1984-09-03 | 株式会社村田製作所 | High dielectric constant porcelain composition |
| JPS61173408A (en) * | 1985-01-28 | 1986-08-05 | 沖電気工業株式会社 | Dielectric ceramics composition for microwave |
| JPS61291457A (en) * | 1985-06-14 | 1986-12-22 | タム・セラミックス・インコーポレイテッド | Dielectric composition |
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| Publication number | Publication date |
|---|---|
| JP2928260B2 (en) | 1999-08-03 |
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